CN212872575U

CN212872575U - Low-resistance slender test probe

Info

Publication number: CN212872575U
Application number: CN202021242601.0U
Authority: CN
Inventors: 张小英; 申啸; 李红叶
Original assignee: Weinan Hi Tech Zone Wood King Technology Co Ltd
Current assignee: Weinan Muwang Intelligent Technology Co ltd
Priority date: 2020-06-30
Filing date: 2020-06-30
Publication date: 2021-04-02
Anticipated expiration: 2030-06-30

Abstract

The utility model discloses a long and thin test probe of low resistance, including a both ends open-ended needle tubing, be equipped with a spring in the needle tubing, the both ends of spring are provided with long needle axle and short needle axle respectively, and the contact surface of long needle axle and short needle axle and spring is the conical surface. The utility model discloses long and thin test probe of low resistance utilizes needle tubing and spring clearance increase, and long needle axle, short needle axle all design for the conical surface with the spring contact surface, and when long needle axle pushed down, the spring received the reaction force of compressive force and forces the conical surface and the spring in close contact with of long needle axle and short needle axle, and spring atress distortion is done S-shaped curve, drives long needle axle and short needle axle and the friction of needle tubing pipe wall, and resistance reduction solves the big problem of long and thin probe resistance.

Description

Low-resistance slender test probe

Technical Field

The utility model relates to a test probe, specifically speaking relates to a long and thin test probe of low resistance.

Background

The test probe is a high-end precise electronic element, is widely applied to testing PCB (printed circuit board), FPC (flexible printed circuit) and the like, is mainly used as a precise probe with a connection function, and is widely applied to the technical fields of mobile phones, automobiles, medical treatment, aerospace, aviation and the like at present.

Because the tested board has the size requirement, the design of the test probes is different according to different welding points of the tested board, the outer diameter is different, and the factors influencing the current are voltage and resistance, so the requirement on the resistance of the test probes is higher; resistance is related to cross-sectional area and length: (1) the larger the cross-sectional area (outer diameter), the shorter the needle the smaller the resistance; (2) the larger the friction between the needle shaft and the needle tube is, the smaller the resistance is; the larger the overcurrent capacity is, the smaller and longer the outer diameter of the slender test probe is, the larger the resistance is, the smaller the overcurrent capacity is, the spring is burned out by slightly increasing the current, the probe fails, and the tested board cannot be accurately tested.

Disclosure of Invention

The utility model aims at providing a long and thin test probe of low resistance to when solving current test probe and reducing the external diameter and extend length, lead to the problem of resistance increase.

In order to solve the technical problem, the utility model discloses a long and thin test probe of low resistance, including a both ends open-ended needle tubing, be equipped with a spring in the needle tubing, the both ends of spring are provided with long needle axle and short needle axle respectively, and the contact surface of long needle axle and short needle axle and spring is the conical surface.

Furthermore, one end of the long needle shaft is connected with the spring, and the other end of the long needle shaft extends out of the needle tube.

Further, the part of the long needle shaft positioned in the cavity of the needle tube is in clearance fit with the needle tube.

Furthermore, the surface of the long needle shaft connected with the spring is a first contact surface, and the first contact surface is a conical surface.

Furthermore, one end of the short needle shaft is connected with the spring, and the other end of the short needle shaft extends out of the needle tube.

Further, the portion of the short shaft located in the lumen of the needle cannula is a clearance fit with the needle cannula.

Furthermore, the surface of the short needle shaft connected with the spring is a second contact surface, and the second contact surface is a conical surface.

Compared with the prior art, the utility model discloses can obtain including following technological effect:

the utility model discloses long and thin test probe of low resistance utilizes needle tubing and spring clearance increase, and long needle axle, short needle axle all design for the conical surface with the spring contact surface, and when long needle axle pushed down, the spring received the reaction force of compressive force and forces the conical surface and the spring in close contact with of long needle axle and short needle axle, and spring atress distortion is done S-shaped curve, drives long needle axle and short needle axle and the friction of needle tubing pipe wall, and resistance reduction solves the big problem of long and thin probe resistance.

Drawings

The accompanying drawings, which are described herein, serve to provide a further understanding of the invention and constitute a part of this specification, and the exemplary embodiments and descriptions thereof are provided for explaining the invention without unduly limiting it. In the drawings:

FIG. 1 is a schematic diagram of a low resistance elongated test probe according to the present invention;

fig. 2 is a schematic diagram of the low resistance thin and long test probe of the present invention in operation.

Detailed Description

The following embodiments will be described in detail with reference to the accompanying drawings, so that how to implement the technical means of the present invention to solve the technical problems and achieve the technical effects can be fully understood and implemented.

The utility model discloses a long and thin test probe of low resistance, as shown in figure 1, including a both ends open-ended needle tubing 1, vacuole formation in the middle of the needle tubing 1 is equipped with a spring 2 in the needle tubing 1 cavity, and the both ends of spring 2 are provided with long needle axle 3 and short needle axle 4 respectively, and long needle axle 3 is the conical surface with short needle axle 4 and spring 2's contact surface. The long needle shaft 3, the short needle shaft 4, the spring 2 and the needle tube 1 are riveted into a whole by using a precise riveting technology.

The utility model discloses long and thin test probe of low resistance utilizes needle tubing 1 and the increase in 2 clearances of spring, long needle shaft 3, short needle shaft 4 all designs for the conical surface with 2 contact surfaces of spring, when long needle shaft 3 pushes down, spring 2 receives the reaction force of compressive force and forces the conical surface of long needle shaft 3 and short needle shaft 4 and spring 2 in close contact with, spring 2 atress distortion is done S-shaped curve, drive long needle shaft 3 and short needle shaft 4 and the friction of 1 pipe wall of needle tubing, reduce resistance, solve the big problem of long and thin probe resistance.

One end of the long needle shaft 3 is connected with the spring 2, the other end of the long needle shaft 3 extends out of the needle tube 1, the part of the long needle shaft 3, which is positioned in the cavity of the needle tube 1, is in clearance fit with the needle tube 1, the surface of the long needle shaft 3, which is connected with the spring 2, is a first contact surface 5, and the first contact surface 5 is a conical surface.

One end of the short needle shaft 4 is connected with the spring 2, the other end of the short needle shaft 4 extends out of the needle tube 1, the part of the short needle shaft 4, which is positioned in the cavity of the needle tube 1, is in clearance fit with the needle tube 1, the surface of the short needle shaft 4, which is connected with the spring 2, is a second contact surface 6, and the second contact surface 6 is a conical surface.

It should be noted that, the contact surfaces of the long needle shaft 3 and the short needle shaft 4 and the spring 2 are designed as conical surfaces, the angle of the conical surfaces is small, the spring 2 can be closely contacted with the long needle shaft 3 and the short needle shaft 4, the gap between the spring 2 and the needle tube 1 is large, and when the spring 2 receives the compression force from the needle shafts to perform S-shaped distortion deformation, the two needle shafts are driven to be in contact friction with the inside of the needle tube 1, so that the resistance is reduced, and the overcurrent capacity is increased.

During the use, will the utility model discloses the long and thin test probe of low resistance is installed on test fixture, as shown in fig. 2, contact when long needle shaft 3 with by the test interface, long needle shaft 3 is when the back and forth movement, because spring 2 is great with 1 cavity clearance of needle tubing, distortion when spring 2 receives compressive force, because spring 2 arranges inside 1 cavity of needle tubing in, event spring 2 warp to certain extent can drive long needle shaft 3 beat, with 1 inner chamber friction of needle tubing, reduce resistance, thereby increase current, current decomposes into overlength needle shaft 3 with 1 friction of needle tubing through long needle shaft 3 and needle tubing and passes to needle tubing 1 and pass to short needle shaft 4 again, current does not pass through spring 2, when avoiding too high current, burn out spring 2, cause the test probe to become invalid, thereby increase probe life.

While the foregoing description shows and describes several preferred embodiments of the invention, it is to be understood, as noted above, that the invention is not limited to the forms disclosed herein, but is not to be construed as excluding other embodiments and is capable of use in various other combinations, modifications, and environments and is capable of changes within the scope of the inventive concept as expressed herein, commensurate with the above teachings, or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.

Claims

1. The utility model provides a long and thin test probe of low resistance which characterized in that includes the open-ended needle tubing in both ends, be equipped with a spring in the needle tubing, the both ends of spring are provided with long needle axle and short needle axle respectively, long needle axle with short needle axle with the contact surface of spring is the conical surface.

2. The low resistance elongated test probe of claim 1, wherein one end of said elongated pin shaft is connected to said spring and the other end of said elongated pin shaft extends out of said pin tube.

3. The low resistance elongate test probe of claim 2, wherein the portion of said elongate needle shaft within the lumen of the needle cannula is a clearance fit with the needle cannula.

4. The low resistance elongated test probe of claim 3, wherein the surface of said elongated pin shaft that interfaces with said spring is a first contact surface, said first contact surface being a tapered surface.

5. The low resistance elongated test probe of any of claims 1-4, wherein one end of the stub shaft is connected to the spring and the other end of the stub shaft extends out of the needle tube.

6. The low resistance elongate test probe of claim 5, wherein a portion of said stub shaft within said needle lumen is a clearance fit with said needle.

7. The low resistance elongated test probe of claim 6, wherein the surface of the stub shaft that interfaces with the spring is a second contact surface, the second contact surface being a tapered surface.