CN115290941B - PCB hole copper four-wire test needle and processing method thereof - Google Patents

Abstract

The invention relates to a PCB hole copper four-wire test needle and a processing method thereof, wherein the probe comprises an inner tube, a plurality of inner tubes are arranged in parallel in an insulated manner; the needle pushing device also comprises a needle pushing shaft and a needle bottom shaft which are arranged in the inner tube and positioned at the two ends of the inner tube, and a spring connected between the needle pushing shaft and the needle bottom shaft; the long needle head is provided with a plurality of needle ejecting shafts corresponding to the plurality of needle ejecting shafts, and the needle ejecting shafts are connected with the long needle head through the extension sections; the opposite side walls of the long needles are all planes, the opposite side walls are all inclined planes, the inclined planes surround to form a conical surface, and insulating plates are arranged among the planes; during the test, through being located the different positions of a plurality of long syringe needles on the conical surface contact the inner wall of via hole simultaneously respectively, further with the base needle axle access test equipment, and then the resistance value size of the cladding material between two different points of alright survey via hole inner wall, and then can indirectly derive between even whether the cladding material of the inner wall of via hole is even.

Description

PCB hole copper four-wire test needle and processing method thereof

Technical Field

The invention relates to the technical field of probe testing, in particular to a PCB hole copper four-wire testing needle and a processing method thereof.

Background

At present, in the production process of the PCB, the quality of the condition of the copper electroplating of the via holes (also called via holes) directly influences the quality of the whole circuit board, so that the four-line test of the electroplating condition of the inner wall of the via holes is needed after the electroplating is finished, and at present, the copper plating test of the inner wall of the via holes in the industry is carried out by two modes:

the first mode is that two probes are respectively clamped at the peripheral positions of two mutually conducted through holes, then the two probes are connected into test equipment to form a loop, and finally whether the loop can be conducted or not is judged, if the loop can be conducted, the copper plating on the inner wall of the through hole is qualified, otherwise, the copper plating is unqualified;

the second mode is that two pins are respectively clamped at the peripheral positions of two ends of the same via hole, then the two pins are connected into test equipment to form a loop, and finally whether the loop can be conducted is judged, if the loop can be conducted, the copper plating on the inner wall of the via hole is qualified, otherwise, the copper plating is unqualified;

no matter which all has the test defect in the testing process for above-mentioned two kinds of modes, because the via hole aperture is little and adopt and set up the probe around the orifice ring, can only test whether the via hole switches on, and then can not detect to the copper plating condition of via hole inner wall, if the copper plating has vacancies such as breach or sand hole, because these vacancies do not have the cladding material to cover, can cause the influence to the normal use of product during the circular telegram, can cause the equipment that uses this product to be damaged seriously even, for this reason, in order to solve the above-mentioned problem that exists, we propose a PCB hole copper four-wire test needle and processing method thereof specially.

Disclosure of Invention

The invention aims to provide a PCB hole copper four-wire test needle and a processing method thereof, aiming at the defects of the prior art.

In order to meet the requirements, the technical scheme adopted by the invention for solving the technical problems is as follows:

the PCB hole copper four-wire test needle comprises an inner tube, wherein a plurality of inner tubes are arranged in parallel in an insulated mode;

the needle pushing device is characterized by also comprising a needle pushing shaft and a needle bottom shaft which are arranged in the inner tube and positioned at the two ends of the inner tube, wherein a spring for connection is arranged between the needle pushing shaft and the needle bottom shaft;

the ejector pin shaft is connected with the long needle head through an extension section;

the opposite side walls of the long needles are all planes, the side walls opposite to the long needles are all inclined planes, the inclined planes are enclosed to form a conical surface, and an insulating plate is arranged between the planes.

The invention relates to a PCB hole copper four-wire test pin and a processing method thereof.

The invention relates to a PCB hole copper four-wire test needle and a processing method thereof, wherein a fixing piece is an outer tube, a plurality of inner tubes are arranged in the outer tube, and insulating layers are arranged among the inner tubes and between the inner tubes and the outer tube.

The invention relates to a PCB hole copper four-wire test pin and a processing method thereof, wherein a movable gap is arranged between an insulating plate and a plane.

The PCB hole copper four-wire test needle and the processing method thereof are characterized in that one end of the insulating plate, which is deviated from the bottom needle shaft, is positioned among the long needle heads.

The invention relates to a PCB hole copper four-wire test needle and a processing method thereof, wherein both ends of a spring are provided with narrowing parts, and one ends of a thimble shaft and a bottom needle shaft close to the spring are convexly provided with inner conical parts capable of being inserted into the narrowing parts.

The invention relates to a PCB hole copper four-wire test needle and a processing method thereof, wherein a narrowing part is in a circular truncated cone shape or a circular disc shape.

The PCB hole copper four-wire test needle and the processing method thereof are characterized in that two springs are arranged in each inner tube, a cavity is arranged between the two springs, and stop protrusions corresponding to the springs are arranged on the inner wall of the cavity.

The PCB hole copper four-wire test needle and the processing method thereof are characterized in that the radius of the bottom surface of the conical surface is larger than the diameter of the thimble shaft.

The processing method of the PCB hole copper four-wire test pin comprises the following steps:

installing the spring in the inner tube;

fixing the long needle head in place on the thimble shaft;

inserting the thimble shaft and the bottom needle shaft into the inner tube at two ends of the inner tube respectively and contacting with the spring respectively;

a limiting piece for preventing the thimble shaft and the bottom needle shaft from falling off is arranged on the inner tube;

fixing a plurality of inner pipes through the fixing piece, and performing insulation treatment among the inner pipes

The invention has the beneficial effects that: during testing, the inclined planes of the long needles on the conical surface respectively contact different test points of the inner wall of the via hole at the same time, the bottom needle shaft is further connected into the test equipment, the long needles and the short needles are conducted and connected into the test equipment to form a loop, and the resistance value of a coating between two different test points of the inner wall of the via hole is detected through the test equipment.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the present invention will be further described with reference to the accompanying drawings and embodiments, wherein the drawings in the following description are only part of the embodiments of the present invention, and for those skilled in the art, other drawings can be obtained without inventive efforts according to the accompanying drawings:

fig. 1 is a sectional view showing the overall structure of a copper four-wire test pin for PCB holes according to the present invention.

Fig. 2 is an enlarged view of a portion of a structure at a in fig. 1.

Fig. 3 is an enlarged view of a portion of the needle of fig. 1.

Fig. 4 is a flow chart of a processing method of the copper four-wire test pin of the PCB hole of the invention.

Detailed Description

The terms "first," "second," "third," and "fourth," etc. in the description and claims of the invention and in the accompanying drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the invention. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein may be combined with other embodiments.

"plurality" means two or more. "and/or" describes the association relationship of the associated object, indicating that there may be three relationships, for example, a and/or B, which may indicate: a exists alone, A and B exist simultaneously, and B exists alone. The character "/" generally indicates that the former and latter associated objects are in an "or" relationship.

Also, the terms "upper, lower, left, right, upper, lower, longitudinal" and the like, which denote orientation, are used with reference to the attitude and position of the device or apparatus in the present disclosure during normal use.

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present invention, and it is obvious that the described embodiments are some embodiments of the present invention, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present invention without inventive step, are within the scope of the present invention.

As shown in fig. 1-3, the test pin for a copper four-wire test in a PCB hole according to a preferred embodiment of the present invention includes a plurality of inner tubes 1, wherein the inner tubes 1 are arranged side by side, and each inner tube 1 is subjected to an insulation treatment;

the needle inserting device is characterized by further comprising a thimble shaft 2 and a bottom needle shaft 3 which are arranged in the inner tube 1 and located at two ends of the inner tube, wherein a spring 4 is connected between the thimble shaft 2 and the bottom needle shaft 3, when the needle inserting device is assembled in place, one end, close to the thimble shaft 2 and one end, close to the bottom needle shaft 3, of the spring 4 is tightly abutted against the thimble shaft 2 and the bottom needle shaft 3 respectively, one end, away from the spring 4, of the bottom needle shaft 3 extends out of the inner tube 1, and particularly, the end, extending out of the inner tube 1, of the bottom needle shaft 3 is a hemispherical surface;

the novel thimble structure is characterized by further comprising a long needle head 5, wherein the long needle head 5 is provided with a plurality of thimble shafts 2, in practice, two thimble shafts 2 and two long needle heads 5 are preferably arranged, the plurality of long needle heads 5 are collinear with the plurality of thimble shafts 2, and the thimble shafts 2 are connected with the long needle heads 5 through extension sections 21 extending out of the inner tubes 1, wherein narrow-diameter parts 22 are arranged on the side walls, located in the inner tubes 1, of the thimble shafts 2, so that stop parts 6 are convexly arranged on the inner tubes corresponding to the narrow-diameter parts 22, the stop parts 6 are located between two axial side walls of the narrow-diameter parts 22, the thimble shafts 2 are prevented from falling off, meanwhile, the narrow-diameter parts 22 can reduce the material consumption, and certain cost is saved;

the opposite side walls of the long needles 5 are planes 7, the planes 7 are parallel to the axis of the thimble shaft 2, the opposite side walls are inclined planes 8, the inclined planes 8 enclose to form a conical surface 9, insulating plates 10 are arranged between the planes 7, and the insulating plates 10 extend between the two inner tubes 1 to play an insulating role.

During testing, the inclined planes 8 of the long needles 5 on the conical surface can be respectively contacted with different test points of the inner wall of the via hole at the same time, the bottom needle shaft 3 is further connected into the testing equipment, so that the long needles 5 and the short needles are conducted and connected into the testing equipment to form a loop, and the resistance value of a coating between two different test points of the inner wall of the via hole is detected through the testing equipment.

Preferably, this test needle still includes the mounting of fixed a plurality of inner tubes 1 to guarantee that the relative position of a plurality of inner tubes 1 is fixed, specifically, the mounting is outer tube 11, and a plurality of inner tubes 1 all locate in outer tube 11, all are equipped with the insulating layer between a plurality of inner tubes 1 and between inner tube 1 and outer tube 11, and wherein, the insulating layer between a plurality of inner tubes 1 is formed by insulation board 10, and insulating layer 12 between inner tube 1 and the outer tube 11 is the tubular structure of urceolus internal diameter adaptation and with insulation board 10 integrated injection moulding.

Preferably, a movable gap 13 is provided between the insulating plate 10 and the plane 7, so that the long needle 5 can have a certain movable space in the radial direction, thereby facilitating the passing of the via holes with different apertures.

Preferably, the end of the insulating plate 10 away from the base pin shaft 3 is located between the plurality of long pins 5, and specifically, the width of the insulating plate 10 is generally the same as the radius of the conical portion, so as to ensure that the long pins 5 prevent the insulating plate 10 from contacting the circuit board too early when the contact test circuit board retracts.

Preferably, both ends of the spring 4 are provided with the narrowing portions 14, one ends of the thimble shaft 2 and the base needle shaft 3 close to the spring 4 are respectively convexly provided with a conical portion 15 which can be inserted into the narrowing portions 14, the conical portions 15 are inserted into the narrowing portions 14, the contact stability can be ensured, and the contact area can be increased.

Preferably, two springs 4 are arranged in each inner tube 1, a cavity 16 is arranged between the two springs 4, a stop protrusion is arranged on the inner wall of the cavity 16 corresponding to the spring 4, the two springs 4 and the cavity 16 are arranged to prolong the whole length of the probe, and meanwhile, the defect that the axial elastic force of the spring 4 is relatively weakened due to overlarge length is overcome, and the thimble shaft 2 and the bottom needle shaft 3 are guaranteed to have enough reset speed.

Preferably, the radius of the bottom surface of the conical surface is larger than the diameter of the thimble shaft 2, and particularly, the radius of the bottom surface of the conical surface is the same as the radius of the outer tube 11, so as to increase the adaptability of the long needle 5 to the through holes with different apertures.

As shown in fig. 4, the method for processing a copper four-wire test pin of a PCB hole according to a preferred embodiment of the present invention includes the following steps:

step S10: the spring 4 is arranged in the inner tube 1;

step S20: fixing the long needle head 5 in place on the thimble shaft 2;

step S30: inserting the top needle shaft 2 and the bottom needle shaft 3 into the inner tube 1 at two ends of the inner tube 1 respectively, and contacting with the spring 4 respectively;

step S40: a limiting piece for preventing the thimble shaft 2 and the bottom needle shaft 3 from falling off is arranged on the inner tube 1;

step S50: a plurality of inner pipes 1 are fixed by a fixing piece, and insulation treatment is carried out among the inner pipes 1

It will be understood that modifications and variations can be made by persons skilled in the art in light of the above teachings and all such modifications and variations are intended to be included within the scope of the invention as defined in the appended claims.

Claims (10)

1. A PCB hole copper four-wire test needle is characterized in that,

the device comprises a plurality of inner pipes which are arranged side by side in an insulated manner;

the needle pushing device is characterized by also comprising a needle pushing shaft and a needle bottom shaft which are arranged in the inner tube and positioned at the two ends of the inner tube, wherein a spring for connection is arranged between the needle pushing shaft and the needle bottom shaft;

the ejector pin shaft is connected with the long needle head through an extension section;

the opposite side walls of the long needles are all planes, the opposite side walls are all inclined planes, the inclined planes surround to form a conical surface, and insulating plates are arranged among the planes;

during testing, the inclined planes of the long needle heads on the conical surface are respectively and simultaneously contacted with different test points of the inner wall of the through hole, so that the resistance value of a plating layer between two different test points of the inner wall of the through hole is detected through test equipment, and when the resistance value displayed by the test equipment is not changed, the plating layer between two points of the test is obtained through reverse deduction.

2. The PCB hole copper four-wire test pin of claim 1, further comprising a fixture for fixing a plurality of the inner tubes.

3. The PCB hole copper four-wire test needle of claim 2, wherein the fixing member is an outer tube, a plurality of inner tubes are arranged in the outer tube, and insulating layers are arranged between the plurality of inner tubes and between the inner tubes and the outer tube.

4. The PCB hole copper four-wire test pin of claim 1, wherein a movable gap is provided between the insulation plate and the plane.

5. The PCB hole copper four-wire test pin of claim 1, wherein an end of the insulating plate facing away from the base pin shaft is located between the plurality of long pins.

6. The PCB hole copper four-wire test pin of claim 1, wherein both ends of the spring are provided with a narrowing portion, and one ends of the top pin shaft and the bottom pin shaft close to the spring are convexly provided with an inner conical portion inserted into the narrowing portions.

7. The PCB hole copper four-wire test pin of claim 6, wherein the narrowing portion is in the shape of a truncated cone or a disk.

8. The PCB hole copper four-wire test needle as in claim 1 or 6, wherein two springs are arranged in each inner tube, a cavity is arranged between the two springs, and a stop protrusion is arranged on the inner wall of the cavity corresponding to the springs.

9. The PCB hole copper four-wire test pin according to claim 1, wherein a radius of a bottom surface of the tapered surface is larger than a diameter of the thimble shaft.

10. A method of manufacturing a copper four-wire test pin for PCB holes according to any one of claims 1 to 9, comprising the steps of:

installing the spring in the inner tube;

fixing the long needle head in place on the thimble shaft;

inserting the thimble shaft and the bottom needle shaft into the inner tube at two ends of the inner tube respectively and contacting with the spring respectively;

a limiting piece for preventing the thimble shaft and the bottom needle shaft from falling off is arranged on the inner tube;

and fixing a plurality of inner pipes through fixing pieces, and performing insulation treatment among the inner pipes.

Images