KR20090030914A - Plunger contact bios probe - Google Patents

Plunger contact bios probe Download PDF

Info

Publication number
KR20090030914A
KR20090030914A KR1020070096600A KR20070096600A KR20090030914A KR 20090030914 A KR20090030914 A KR 20090030914A KR 1020070096600 A KR1020070096600 A KR 1020070096600A KR 20070096600 A KR20070096600 A KR 20070096600A KR 20090030914 A KR20090030914 A KR 20090030914A
Authority
KR
South Korea
Prior art keywords
contact
plunger
probe
contact means
spring
Prior art date
Application number
KR1020070096600A
Other languages
Korean (ko)
Inventor
김홍섭
Original Assignee
주식회사 메가터치
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 메가터치 filed Critical 주식회사 메가터치
Priority to KR1020070096600A priority Critical patent/KR20090030914A/en
Publication of KR20090030914A publication Critical patent/KR20090030914A/en

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H05K1/0268—Marks, test patterns or identification means for electrical inspection or testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a parabolic plunger contact bias probe that is supplemented and improved to improve the contact resistance of a probe that is used for functional test of a product in a printed circuit board and a semiconductor (I, C) tester.

The present invention for this purpose, the body 10 is built in the spring 20 is a micro-assembly structure of the left rod end of the plunger 30 that is the primary contact has a shape suitable for the characteristics of the inspection. In the spring contact bias probe for measuring the energization of the electrical element in contact with the tip by the electrical signal passing through the probe body (10), the right rod of the plunger in the body to the inner fastening portion of the contact means as a secondary contact It is installed by tight fastening, and the elasticity of the expanded parts in the contact means fastened internally through the right rod of the plunger is forcibly contacted with the inner wall of the body, thereby minimizing the electrical resistance of the probe. do.

Description

Plunger Contact Bias Probe {PLUNGER CONTACT BIOS PROBE}

The present invention relates to a parabola type plunger contact bias probe which can achieve smooth conduction because a plurality of enlarged portions of contact means coupled with the right rod of the plunger are forced to contact the inner wall of the body during measurement.

SPRIN CONTACT PROBE is a medium that checks whether the product is good or bad by receiving signals from test equipment on PCB and semiconductor. It is an ultra-small pin-type structure as a core component that determines whether a printed circuit board and a semiconductor are good or bad by receiving electrical signals between the printed circuit board and the semiconductor tester.

At this time, the moving part is supported by a spring and can be moved. To minimize the electric resistance, all parts are plated with expensive precious metals such as gold or rhodium which have very low electric resistance and high surface strength. It is a test part that maintains the operating pressure and the minimum electric resistance value and the tip of the plunger, which is a contactor, is sharp or keeps the tip to match the characteristics of the product.

Conventional probes have a disadvantage in that contact between the plunger and the body is unstable due to the presence of a minute gap for operating the inner portion of the body and the plunger pressing the spring. In order to reduce the internal contact resistance, when the plunger is moved by moving from one side to the inside of the body, one side is always in a completely metal contact state and is used in the form of reducing contact electrical resistance.

For example, the bias probe of the inclined cross-sectional structure type may be effective due to its low contact resistance due to its initial contact with one side, but when the probe is operated thousands of times, the one-sided wear phenomenon may occur due to its strong contact with only one side. As the frictional resistance of the marked part becomes very high, the mechanical operating resistance and the electrical resistance are greatly increased, and even if the tip of the plunger is in contact with the measurement product, the measured value cannot be properly delivered. This causes a problem of signal transmission that is not normal for the inspection of printed circuit boards and semiconductors that require high-precision measurement, and thus a problem of frequent malfunctions and errors in measurement occurs.

In order to solve this problem, the bias probe has been developed to improve the performance of the bias probe that directly contacts the ball or the spring to the inclined cross section, but it has not solved the problem of shortened life due to the one-sided wear problem. The technical method has been applied to increase the thickness of the gold plating or to make the surface smoother to reduce the mechanical resistance. However, these methods increase the manufacturing cost significantly, lowers the price competitiveness, and gradually causes manufacturers to evade product inspection or to increase product cost.

Because of the above problems, the present inventors have come up with a new type of contact means by taking multiple measures so that the inner wall of the plunger and the body can be completely contacted to solve irregular resistance values during measurement.

The present invention solves the problems of the conventional probe in view of the above circumstances, a plurality of enlarged parts of the contact means in which the plunger is tightly fitted in the body is configured to always contact with the inner wall at least resistance value during measurement An object of the present invention is to provide a parabolic plunger contact probe that can provide smooth conduction.

The present invention for achieving the above object, the body (10) with a built-in spring 20 is a micro-assembly structure of the left rod end of the plunger 30, which is the primary contact is suitable for the characteristics of the test object In the spring contact bias probe for measuring the energization of the electrical element in contact with the tip by an electrical signal passing through the probe body (10), the right rod of the plunger in the body of the contact means as a secondary contact It is installed with a tight fastening to the inner fastening portion, and the elasticity of the expanded parts in the contact means fastened internally through the right rod of the plunger is forcibly contacted with the inner wall of the body to minimize the electrical resistance of the probe, including It is characterized by that.

As described above, according to the plunger contact bias probe of the present invention, the contact means is always in contact with each other to forcibly maintain the inner metal contact between the contact means coupled to the right side of the plunger and the inner wall of the body, even during operation of several hundred thousand times in the probe measurement operation. Since the multiple enlarged parts of the contacts contact in all directions, it is possible to easily prevent the increase in the operating resistance due to the wear of the conventional probe, and also to realize the metal contact as the bias probe at all times to guarantee the life of several hundred thousand times as well as the lifetime. Accurate measurements are also guaranteed.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

1 is a cross-sectional view showing a plunger contact probe according to an embodiment of the present invention, the present invention is a contact means 40 which is coupled to the inner wall of the body 10 with the right rod of the plunger 30 during measurement By being contacted by the force of the forcible spring 20, it is a parabolic plunger contact bias pin probe that can achieve smooth conduction in the body (10). That is, the contact means 40 to which the right rod of the plunger 30 is internally coupled in the body 10 is always connected to the plunger 30 and the contact means 40 by tension by the built-in spring 20. It's pushing.

The measuring probe is a core element of the semiconductor functional measuring device as well as inspecting the insertion and soldering of electronic components of the printed circuit board. The body 10 of the measuring probe is a small assembly structure of the plunger 30 which is the primary contactor. The left end of the rod is sharp or forms a tip that meets the characteristics of the object to be measured, and the presence or absence of electric current in contact with the tip is measured by the current resistance value passing through the probe body 10. As a structure for minimizing electrical resistance of the probe, the rear end of the right rod of the plunger 30 pushes the contact means 40 of the secondary contactor coupled to the inner wall of the body 10.

2 is an exploded perspective view showing in detail the plunger and the contact means shown in FIG. The plunger 30 has a central rod 32 and a front end 38 of the left rod 37 and a rear end 34 of the right rod 33 are formed, respectively, and the central rod 32 has a conical taper 35. The left rod 37 and the right rod 33 are connected to each other and integrated.

As the secondary contactor to which the right rod 33 of the plunger 30 is coupled internally, the contact means 40 has a sharp tip 42 and an inner fastening portion 43 of the cylindrical portion 41 on one side. Openings 44 are formed at the other ends, respectively, so that three outer edges 48 and enlarged portions 46 are formed outside the openings 44, respectively. In some cases, four outer edges and enlarged portions may be formed in the openings.

3 is a state diagram in which the plunger and the contact means shown in FIG. 2 are combined. The right rod 33 of the plunger 30 is forcibly tightly coupled to the inner fastening portion 43 of the contact means 40 (see section A), and each of which is larger than the diameter of the cylindrical portion 41. Since the enlarged portion 46 is formed, the enlarged portion 46 is coupled by its elasticity even if the tapered portion 35 of the plunger 30 does not contact each outer edge portion 48 when it is coupled to the inner wall of the body. It comes in contact with the inner wall.

4 is a state diagram in which a contact means of the plunger is inserted into the body in the plunger contact bias probe of the present invention, FIG. 5 is a working state diagram for caulking the plunger contact bias probe of the present invention, and FIG. The plunger contact bias probe shows the insertion process when the plunger and the contact means are operated.

The conical taper 35 of the right rod 34 in the plunger 30 is coupled to the outer edge 48 of the opening 44 in the contact means 40 (see FIG. 6A), which is The right rod 34 is tightly fastened to the inner fastening portion 43 of the cylindrical portion 41 before being coupled to the taper 35 and the outer edge portion 48.

Pressing the plunger 30 in the contact means 40 is pushed by the force of the spring 20 the contact means 40 which is internally coupled to the right rod of the plunger 30 in the body 10 during the measurement It is a structure in which the operation of pushing the enlarged portion 46 of the plurality of outer edge portions 48 forcibly to the outside is continued (see FIG. 5).

That is, the probe body 10 has a contact means 40 and a spring 20 which are internally coupled from the right rod 33 of the plunger 30 inside the pipe as shown in FIG. Then, the left rod 37 of the plunger 30 is enlarged in FIG. 5, one side of the body 10 is caulking (CALKING) the plunger 30 in the body (10) The contact means 40 and the spring 20 which are combined internally are arrange | positioned correctly. Therefore, a plurality of enlarged portions 46 in the contact means 40 in the plunger 30 are always in their own elastic contact with the inner wall of the body 10 by the force of the spring 20.

When the measurement product reaches the tip of the left rod of the plunger 30, the inner fastening portion of the contact means 40 and the plunger 30 of the right rod are pushed back simultaneously, so that the taper of the right rod is pushed by a plurality of the contact means 40. Even when the outer edge portion 48 is in contact with or away from each other, the tip portion of the contact portion 40 is pushed by the spring 20 to force the contact. This means that when the plunger 30 of the contact means 40 is operated, three or four outer edges and enlarged portions of the right rod of the plunger 30 and the contact means 40 are supported by the support parabolic. The phenomenon occurs, the contact means 40 of the plunger 30 is forcibly contacted with the inner wall of the body (10).

In this way, the contact becomes a metal contact to reduce the electrical contact resistance of the probe itself, so that the measurement is smoothly performed. When the next operation is performed, the same contact is made, and the right rod of the plunger 30 is the contact means 40 in which the spring 20 is pushed. It is engaged with the inner fastening portion of the) to have an enlarged portion 46 extending to the outer edge portion 48 has an elastic force as shown in Figure 6b to 6c to have a function to force the inner wall of the body 10 to always be in contact. . As shown in Figure 6a in the process of the parabolic contact means 40 is coupled to the plunger 30 and inserted into the body, the outer size of the contact means when inserted into the body is reduced to the body inner diameter.

Therefore, the spring contact bias probe of the present invention installs a printed circuit board, drills a plurality of holes in the measurement fixture, and installs a measurement probe in the hole, and presses the printed circuit board placed on the probe to the inner spring of the probe. This causes the sharp leading end of the plunger, which engages the contact means in the probe body, to the appropriate pressure to contact the solder or terminal line of the electronic component on the printed circuit board.

Therefore, the characteristic that the electrical resistance should be kept below a certain level becomes important, but especially inside the probe, the current must be connected to the body through the contact means at the plunger and flow directly to the measuring terminal of the measuring instrument, i.e. with the plunger The bias probe is a structure in which electrical resistance is minimized by making direct contact with the inner wall of the body at each enlarged portion of the contact means which is in secondary contact with the plunger so that no current flows through the spring in the contact means.

Although the technical concept of the plunger contact bias probe of the present invention has been described based on the exemplary drawings, this is illustrative of the best embodiment of the present invention and is not intended to limit the claims of the present invention. It will be apparent to those skilled in the art that various modifications and imitations can be made without departing from the scope of the technical idea of the present invention.

1 is a cross-sectional view showing a plunger contact bias probe according to an embodiment of the present invention;

Figure 2 is an exploded perspective view showing in detail the plunger and the contact means shown in FIG.

3 is a state in which the plunger and the contact means shown in FIG.

4 is a state in which the contact means of the plunger is inserted into the body in the plunger contact bias probe of the present invention;

5 is a working state diagram for caulking the plunger contact bias probe of the present invention;

6 is an insertion process diagram when the plunger and the contact means operate in the plunger contact bias probe of the present invention.

* Explanation of symbols for the main parts of the drawings

10: torso

20: spring

30: Plunger

33: right rod

40: contact means

46: enlarged portion

Claims (2)

The main body 10 having the spring 20 embedded therein is an ultra-small assembly structure, and the left end of the plunger 30, which is the primary contactor, has a shape suitable for the characteristics of the test object. In the spring contact bias probe for measuring the energization of the electrical signal passing through the probe body (10), the right rod of the plunger is installed in the body by a tightening of the inner fastening portion of the contact means as a secondary contact, The plunger contact bias probe, characterized in that the elasticity of the expanded portion in the contact means fastened internally through the right rod of the plunger is forced to contact the inner wall of the body to minimize the electrical resistance of the probe. The method of claim 1, In the contact means, each enlarged portion is formed larger than the diameter of the cylindrical portion, and after the contact means are coupled to the inner wall of the body, the enlarged portion is always in contact with the inner wall by its own elasticity, even if the taper of the plunger does not contact each outer edge. Plunger contact bias probe, characterized in that.
KR1020070096600A 2007-09-21 2007-09-21 Plunger contact bios probe KR20090030914A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020070096600A KR20090030914A (en) 2007-09-21 2007-09-21 Plunger contact bios probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020070096600A KR20090030914A (en) 2007-09-21 2007-09-21 Plunger contact bios probe

Publications (1)

Publication Number Publication Date
KR20090030914A true KR20090030914A (en) 2009-03-25

Family

ID=40697143

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020070096600A KR20090030914A (en) 2007-09-21 2007-09-21 Plunger contact bios probe

Country Status (1)

Country Link
KR (1) KR20090030914A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101300473B1 (en) * 2013-05-02 2013-09-02 주식회사 프로이천 Probe pin for probing solder ball
KR20230060703A (en) * 2021-10-28 2023-05-08 주식회사 메가터치 Probe for test of electronic device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101300473B1 (en) * 2013-05-02 2013-09-02 주식회사 프로이천 Probe pin for probing solder ball
KR20230060703A (en) * 2021-10-28 2023-05-08 주식회사 메가터치 Probe for test of electronic device

Similar Documents

Publication Publication Date Title
KR100769891B1 (en) Contact probe and socket
KR20070075699A (en) Contact probe
US20080054924A1 (en) Contact for interconnect system
KR102208381B1 (en) Test probe and method manufacturing for the same, and test socket supporting the same
US6255834B1 (en) Test fixture having a floating self-centering connector
KR20090030914A (en) Plunger contact bios probe
KR101827860B1 (en) Pin block assembly
US20030224650A1 (en) Semiconductor socket and replacing method of its probe of semiconductor socket
JP2010153154A (en) Connector
KR20060082594A (en) Probe device with micro-pin inserted in interface board
KR20090030912A (en) Spring contact bios pin probe
KR100309532B1 (en) IC socket for holding ICs with multiple parallel pins
US6724207B1 (en) Structure composite-type test fixture
KR20130071817A (en) Test apparatus for integrated circuit
KR200317295Y1 (en) Improved structure composite-type test fixture
KR100450976B1 (en) probe
KR200258748Y1 (en) Ball type SPRING CONTACT BIOS PIN PROBE
KR100480665B1 (en) Vertical Type Probe Device
TWI593972B (en) Interposer and vertical probe card assembly using the same
KR200307494Y1 (en) probe
KR200312403Y1 (en) probe
KR200317296Y1 (en) probe
KR200380278Y1 (en) Inserting pin for printed circuit board
KR200330168Y1 (en) Test socket for ball grid array package
KR200381448Y1 (en) Probe Device with Micro-Pin Inserted in Interface Board

Legal Events

Date Code Title Description
A201 Request for examination
A302 Request for accelerated examination
E902 Notification of reason for refusal
E701 Decision to grant or registration of patent right
N231 Notification of change of applicant
NORF Unpaid initial registration fee