KR200317295Y1 - Improved structure composite-type test fixture - Google Patents

Abstract

Improved hybrid test fixture consisting of a flush with the stack plane positioned against the top surface of the probe substrate placed in the upper range of the base so that the holes pre-positioned to the surface of the probe substrate provide the entrance of the probe . The stack plane, consisting of an upper substrate, a substrate having a thickness, and a flexible plastic substrate, has through holes pre-arranged in a specific arrangement to insert the probe at various connection points of the circuit board under test. The tips of the probes have different ranges of diameter and size specifications and the upper end protrudes from the top surface of the stack plane and the distal end consists of a single specification insert that fits snugly into the probe. Each probe has a spring disposed inwardly. The wire is connected to the lower end of the spring and the copper pin finishes the remaining free end of the wire, allowing the copper pin to be inserted into the flat cable of the circuit tester. As such, the facility structure of the present invention can greatly reduce the production cost, improve the test accuracy and is easy for the manufacturer.

Description

IMPROVED STRUCTURE COMPOSITE-TYPE TEST FIXTURE}

The invention relates to diagnostic and survey equipment for circuit boards, in particular to complex test equipment of improved construction.

After the various electronic components are soldered to the circuit board, they must be tested to determine whether there are shorts between traces and junctions.

This field currently utilizes a circuit board test method (see FIG. 1) consisting of a plurality of probes 2 arranged on the upper surface of the installation 1, which are provided under the test 3. Position the connection point along the bottom surface of the circuit board unit. This installation 1 has a rectangular base 11 and a latch connector 12 is installed along the circumference of the base 11; Each latch connector 12 must be in electrical continuity with the probe 2 so that the latch connector 12 can be utilized following the flat cable (not shown) of the circuit board tester.

When testing the circuit board, the balanced cable of the circuit board tester is connected to the latch connector (s) 12 and the circuit board unit under the test 3 is aligned with the probe 2 of the installation 1. After the probe (2) contacts the leads of the component along the lower surface of the circuit board unit under test (3), the circuit board is short-circuited at traces and / or junctions to the circuit board unit under test (3). Indicates whether or not (short circuits) are present.

The facility 1 for providing circuit board testing is not a mass produced item but a dedicated facility for special types of circuits. The construction of the facility first involves drilling a hole in the probe substrate 13 which is aligned with the trace and connection points of the circuit board under test (3), and then in each hole (as shown in FIGS. 2 and 3). Consisting of inserting a probe barrel (5) fitting (2) into the sleeve; Of course, before the probe barrel 5 is inserted into the holes, the wire 52 of the trailing ends must be coupled to the latch connector 12 (as shown in FIG. 4) and finally the probes 2 are It is housed in the probe barrel 5.

As such, the set of test fixtures 1 of the circuit board requires manual coupling of each probe 5 end wire 52 to the latch connector 12, each complete fixture 1 being 200-300. The need to fix three or more wires consumes a lot of labor, which results in a rather high production cost for a very long period of time. Also, if the connection of the wires 52 is not performed carefully, contact between adjacent wires may cause short circuits that affect the test results. The internal structure of the probe 2 is also compressed so that when the circuit board unit under test 3 is suppressed during inspection, the probe 2 contacts the connection point of the lower surface of the circuit board unit under test 3 and It consists of a spring 4 which reduces the pressure. However, the probe 2 itself is very small, so that the inner spring 4 is not only related to a very high technology, but also difficult and difficult to manufacture, which makes the overall probe 2 and equipment 1 production costs very high. Of course, the spring 4 is also very small, short in life and very susceptible to abrasion, thus affecting the test results. Therefore, in order to ensure the accuracy of the test results, the probe 2 utilized in the installation 1 must be regularly replaced for very difficult, inconvenient and uneconomical work.

The main purpose of the present invention is to provide a complex test facility with an improved structure that improves defects and simplifies manufacturing, thereby lowering production costs and effectively increasing test accuracy.

1 is an isometric view of a conventional installation used in a test circuit board.

2 is an exploded view of a conventional probe and probe barrel.

3 is a cross-sectional view of a conventional probe and probe in the installed state.

4 is an isometric view of a cable between a conventional connector and a latched connector of a probe.

5 is an exploded view of the composite test fixture structure of the present invention.

6 is a cross-sectional view of implementing the present invention.

7 is an exploded view of the probe, the probe, the upper block, the spring, the wire and the copper pin of the present invention.

8 is an isometric view of a probe connected to a balanced cable.

9 is an exploded view of different arrangement of the probe, the upper block, the spring, the wire and the copper pin of the present invention.

10 is a cross-sectional view of the implementation of FIG.

Figure 11 is an exploded view of another arrangement of the probe, the spring and the wire of the present invention.

12 is a cross-sectional view of FIG.

13 is a partially enlarged cross-sectional view of the probe and the spring of the present invention.

* Symbol description *

1: test fixture 2: probe

4,51: spring 5: probe

6: stack plane 7: flat cable

11 base 12 latch connector

13: probe substrate 14: lower substrate

50: upper block 52: termination wire

53: copper pin 61: upper substrate

63: plastic substrate 141: through hole

With reference to FIGS. 5 and 6, the hybrid test fixture of the improved construction of the present invention consists of a probe board 13 located on the upper surface of the installation base 11, the connection of the circuit board unit under the test 3. A plurality of holes drilled in the upper surface aligned with the lower surface with the point, the stack plane 6 flatly positioned in the upper surface of the probe substrate 13 and the stack plane aligned with the holes in the probe substrate 13 It has many through-holes in (6). At that point the holes in the probe substrate 13 provide the inlet of the probe 5 (as shown in FIG. 6), the through holes in the stack plane 6 insert the probe 2, and also the probe The top of the field 2 protrudes from the top surface of the stack plane 6.

Referring to FIG. 7, each of the probe barrels 5 includes a spring 51 disposed therein as well as in accordance with conventional inner diameter specifications; The spring 51 has an upper block 50 at the tip and a wire 52 connected to the end thereof; The probe 5 is connected to the sleeve on the outer surface of the spring 51 and the end is fixed thereto. Moreover, the copper pin 53 is arrange | positioned at the opposite end of the wire 52 connected to the terminal of the spring 51. As shown in FIG. Each of the probes 2 is a needle-like object having tips of different diameters, sizes, specifications, and shape ranges (as shown in FIG. 6), the ends of which are fitted into the probes 5 and the upper block ( It consists of a single specification insert 23 placed directly at 50).

The stack plane 6 is a top substrate (as shown in FIGS. 5 and 6) of the top surface, with through holes in the top substrate 61 disposed at the same diameter and dimension as the tip end of the probe 2. It consists of 61. Two-thick substrates 62 lie along the bottom of the stack plane 6, with an insertion 23 in which a through-hole of the thick-walled substrates 62 constitutes the distal end of the probe 2. One flexible plastic substrate 63, which is arranged in the same manner as, and has no perforations, is inserted between the two substrates 62 in thickness. The flexible plastic substrate 63 is installed to hold the insert 23 at the distal end of the probe 2 and also slips when pressure is applied during testing to prevent the probe 2 from moving. This does not happen.

Utilizing the original design of the present invention, there is no need for separate coupling of wires 52 when assembling the equipment and no need to install a latch connector. With reference to FIG. 8, designing copper pins 53 to terminate the ends of the wires 52 in the probe barrel 5 and thereby insert them directly into the balanced cable 7 of the circuit tester greatly reduces equipment manufacturing time. It also lowers the cost of production.

The unique structure of the present invention provides the following advantages:

(1) The array of probes (2) is a class variable and the required production techniques are simple, so the production cost is low enough to reduce the cost of manufacturing the probe (2).

(2) The probe barrel 5 has a spring 51 disposed therein, which is simple to lower production costs because the diameter of the spring 51 is larger than that of the conventional probe 2 in order to prolong its life. Installed with work, the entire useful life of the spring is extended to reduce the cost of replacing the probe 5.

(3) When the ends of the probe barrel 5 wire 52 are designed with integrated copper pins 53, they can be inserted directly into the balanced cable 7 of the circuit tester and each connected as in the case of conventional arrangements. No wires 52 are required, thereby simplifying the connection procedure and likewise saving installation time to reduce equipment assembly costs.

Although the most preferred embodiment of the present invention is disclosed above, it is not to be construed as a limitation appropriate to the scope of the present invention, but in the case of modifications and shades reflected with reference to Figs. Interpreted by the present invention, the probe 5 of the present invention may be pulled out and the end of the spring 51 may be directly connected to the tip of the wire 52 so that the ends of the wire 52 connected to the spring 51 are equal. It is contained in the holes of the probe substrate 13 to effectively obtain the function. For this purpose, the probe plate 13 is also precisely drilled in position in the holes of the probe substrate 13 so as to adjust the inserted tip of the wire 52 to be precise through holes 141. It is installed directly below the lower substrate 14.

11, 12, 13, in the present invention, the spring 51 is smaller than the diameter of the holding portion 511, the wedge-shaped container (or conical container), the probe 2 insertion portion 23 at the top The lower portion gradually decreases in diameter to fit the probe 2 insert 23 and bring electrical continuity, thereby functioning as a substitute for the upper block 50 at the top of the spring 51.

Claims (4)

Comprising a base, a probe board as well as a plurality of probes and probes, the probe board is placed in the upper region of the base, and a plurality of perforations on the upper surface aligned at the connection point and the bottom surface of the circuit board unit under test Wherein the holes of the probe board are provided to the inlet of the probe and the probes, which are utilized to inspect various connection points of the circuit board unit under test, the characteristics of which are: a stack plane of the probe A flush set against an upper surface, the stack plane having a plurality of perforated through holes aligned with the probe substrate holes; The plurality of probes are each inserted into through holes in the stack plane and the tips are in a range of different diameter and size strengths, the upper end protrudes from the top surface of the stack plane, and the distal end rests against the probe. Consists of a single fitted specification insert; Each of the probe barrels has a spring disposed therein, and the springs are made of wires connected to the ends of the probes after the probes are connected to the outside of the springs by sleeves to fix the ends thereof. An improved structured composite test facility characterized in that the copper pin can be inserted directly into the balanced cable of a circuit tester by terminating the end of the wire in the probe. 2. The method of claim 1, wherein the stack plane consists of an upper substrate on the top surface, the through holes of the upper substrate being disposed with the same diameter and size as the tip end of the probe; Two thickness-thick substrates lie along the bottom of the stack plane, and through-holes of the thickness substrates arranged in the same manner as the insert constitute the distal end of the probe; And wherein the flexible plastic substrate has no holes drilled between the two thickness substrates. 2. The probe of claim 1, wherein the probe substrate is mounted directly below the lower substrate with precise through holes drilled in position corresponding to the holes of the probe substrate and sized to adjust the inserted ends of the wires; And a spring is included in the holes of the probe substrate such that the upper blocks at the top contact the probe insert and the lower end is connected to the tip of the wires. 4. An improved structure according to claim 1 or 3, wherein the spring forms a retainer at the top, which may be a wedge-shaped container or a conical container, the lower part of which is gradually reduced to a diameter smaller than the diameter of the probe insert. Complex testing equipment.