CN112147381A

CN112147381A - Test probe suitable for large current

Info

Publication number: CN112147381A
Application number: CN202010929378.5A
Authority: CN
Inventors: 张小英; 申啸; 李红叶
Original assignee: Weinan Hi Tech Zone Wood King Technology Co Ltd
Current assignee: Weinan Hi Tech Zone Wood King Technology Co Ltd
Priority date: 2020-09-07
Filing date: 2020-09-07
Publication date: 2020-12-29

Abstract

The invention discloses a test probe suitable for large current, which comprises: a needle tube; an elastic telescopic member, said elastic telescopic member is set up in said needle tube; the conductive piece is arranged in the elastic expansion piece; the tail parts of the two needle shafts are respectively clamped in from the two ends of the needle tube and are respectively contacted with the two ends of the elastic telescopic piece. The test probe suitable for the large current solves the problem that the existing test probe is easy to damage when the existing test probe has the overlarge current.

Description

Test probe suitable for large current

Technical Field

The invention belongs to the technical field of electronic components, and particularly relates to a test probe suitable for large current.

Background

The test probe is a high-end precision link device, is widely applied to testing PCB (printed circuit board) and FPC (flexible printed circuit), is mainly used as a precision probe with a connection function, and is widely applied to the technical fields of mobile phones, automobiles, medical treatment, aerospace, aviation and the like at present.

When the test device is used, the test probe is arranged on the test fixture, one end of the test probe is connected with the output end (the output end refers to voltage, frequency and the like), and the other end of the test probe is connected with the tested element so as to carry out testing. The requirement for the test probe in the test process is extremely high, but the existing probe design has limited overvoltage and frequency output, and the test probe is burnt out due to the increase of voltage, so that the test probe cannot accurately detect the tested element, and the tested element can be damaged in serious cases. Therefore, it is necessary to design a test probe that can adapt to the excessive current.

Disclosure of Invention

The invention aims to provide a test probe suitable for large current, which solves the problem that the existing test probe is easy to damage when the excessive current exists.

In order to solve the above problems, the present invention discloses a test probe adaptable to a large current, comprising:

a needle tube;

an elastic telescopic member, said elastic telescopic member is set up in said needle tube;

the conductive piece is arranged in the elastic expansion piece;

the tail parts of the two needle shafts are respectively clamped in from the two ends of the needle tube and are respectively contacted with the two ends of the elastic telescopic piece.

The technical scheme of the invention also has the following characteristics:

furthermore, the needle shaft is provided with steps, two ends of the needle tube are respectively inward formed with a closing opening, and when the needle shaft moves outward, the steps are blocked at the closing opening.

Further, the step is in a taper transition, and the two end closing-in of the needle tube is also in a taper arrangement.

Further, the elastic expansion and contraction is a compression spring.

Furthermore, the tails of the two needle shafts are respectively designed with a conical surface, and two ends of the compression spring are respectively sleeved on the corresponding conical surfaces.

Further, the conductive piece is a cylindrical body.

Further, the conductive piece is a conductive silica gel rod.

Further, the conductive silica gel rod is filled with metal powder.

Further, the head of the needle shaft is plum blossom-shaped.

Compared with the prior art, the test probe suitable for the large current has the following advantages: (1) according to the test probe suitable for large current, the conductive piece is additionally arranged, so that current can be transmitted through the needle tube, the spring and the conductive piece, and the problem that the test probe is damaged due to overlarge current is solved; (2) the test probe suitable for large current has the advantages of simple overall structure, easiness in manufacturing, lower manufacturing cost and better market popularization and application prospect.

Drawings

The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:

fig. 1 is a schematic structural diagram of a test probe adaptable to a large current according to the present invention.

In the figure: 1. the needle comprises a conical surface, 2 steps, 3 heads, 4 closing-in, 5 needle shafts, 6 needle tubes, 7 elastic telescopic swords and 8 conductive parts.

Detailed Description

The following embodiments are described in detail with reference to the accompanying drawings, so that how to implement the technical features of the present invention to solve the technical problems and achieve the technical effects can be fully understood and implemented.

As shown in fig. 1, a test probe adaptable to high current according to the present invention is mainly composed of the following components:

a needle tube 6;

an elastic expansion piece 7, the elastic expansion piece 7 is arranged in the needle tube 6;

a conductive member 8, the conductive member 8 is disposed in the elastic expansion member 7;

the tail parts 1 of the two needle shafts 5 and 4 are respectively clamped in from two ends of a needle tube 6 and are respectively contacted with two ends of an elastic expansion piece 7.

As shown in fig. 1, during assembly, the conductive member 8 is placed in the elastic expansion member 7, the elastic expansion member 7 is installed from one end of the needle tube 6, the elastic expansion member 7 is located at the center of the needle tube 6, then the tail portion of the needle shaft 5 extends into the needle tube 6 from two ends of the needle tube 6 respectively, the needle shaft 5 is ensured to contact with the elastic expansion member 7 and the conductive member 8 respectively, and finally two ends of the needle tube 6 are encapsulated, so that the assembly of the test probe is completed. Obviously, the test probe suitable for large current has the advantages of simple integral structure, easiness in manufacturing, lower manufacturing cost and better market popularization and application prospect.

When the test device is used, the head 3 of one needle shaft 5 is connected with an output end (the output end refers to voltage, frequency and the like), and the head 3 of the other needle shaft 5 is connected with a tested element, so that the test can be carried out. In the testing process, the current between the two needle shafts 5 can be transmitted through the needle tube 6, the elastic expansion piece 7 and the conductive piece 8, so that the problem that local components of a testing probe are easily burnt and cannot be used due to overlarge current is solved.

As shown in FIG. 1, in the testing probe adaptable to large current of the present invention, a step 2 is disposed on a needle shaft 5, two ends of a needle tube 6 are respectively inward formed with a closed end 4, and when the needle shaft 5 moves outward, the step 2 is abutted against the closed end 4.

As shown in fig. 1, in the test probe adaptable to a large current of the present invention, when a final packaging process is performed during an assembly process, a step 2 may be disposed on a needle shaft 5, after a tail portion 1 of the needle shaft 2 is installed in a needle tube 6, a port of the needle tube 6 may be compressed inward, a closed end 4 is processed, and the needle shaft 2 may be limited in the needle tube 6 by the closed end 4 matching with the step 2, thereby completing the packaging. By adopting the design mode, the needle shaft 5 can be stably limited in the needle tube 6 and is not easy to fall off in the working process.

As shown in FIG. 1, in a test probe capable of accommodating large current, a step 2 is in a tapered transition, and two end necks 4 of a needle tube 6 are also in a tapered arrangement.

As shown in figure 1, the step 2 is in conical fit with the closing-in 4 of the needle tube 6, so that the needle shaft 5 and the closing-in of the needle tube 6 can be completely attached, the needle shaft 5 is ensured not to incline in the using process, and poor contact is avoided.

In a test probe of the present invention that can accommodate large currents, as shown in fig. 1, the elastic extension 7 is a compression spring.

As shown in fig. 1, the tails 1 of the two needle shafts 5 are respectively sleeved at two ends of the compression spring, so that the two needle shafts 5 can be ensured to shrink to a certain extent when being respectively contacted with the output end and the tested element, and the contact is ensured to be better.

As shown in fig. 1, in the test probe applicable to large current of the present invention, the tail portions 1 of the two needle shafts 5 are both designed with tapered surfaces, and the two ends of the compression spring are respectively sleeved on the corresponding tapered surfaces, so as to ensure that the compression spring and the tail portions 1 of the needle shafts 5 are in stable contact, are not easy to fall off, and ensure good contact.

In a test probe of the present invention that can accommodate large currents, the conductive member 8 is preferably a cylindrical body, as shown in fig. 1.

As shown in figure 1, the outer diameter of the cylindrical body is slightly smaller than the inner diameter of the compression spring, the conductive piece 8 is placed in the compression spring and is tightly matched with the compression spring, and the design can avoid the phenomenon that the conductive piece 8 and the compression spring are easy to shake when in use to cause poor contact.

As shown in fig. 1, in the test probe applicable to large current of the present invention, the conductive component 8 is a conductive silica gel rod, and the conductive silica gel rod is filled with metal powder, so as to ensure good conductivity.

As shown in fig. 1, in a test probe adaptable to a large current of the present invention, a head portion 3 of a needle shaft 5 is in a quincunx shape.

As shown in fig. 1, the head 3 of the shaft 5 is designed to be quincunx, so that on one hand, good contact between the two needle shafts 5 and the output end and the tested element can be ensured, and on the other hand, the needle shafts 5 can be ensured to be suitable for being contacted with the output end and the tested element in different shapes.

While the foregoing description shows and describes several preferred embodiments of the invention, it is to be understood, as noted above, that the invention is not limited to the forms disclosed herein, but is not to be construed as excluding other embodiments and is capable of use in various other combinations, modifications, and environments and is capable of changes within the scope of the inventive concept as expressed herein, commensurate with the above teachings, or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.

Claims

1. A test probe adaptable to high currents, comprising:

a needle tube (6);

the elastic telescopic piece (7) is arranged in the needle tube (6);

an electrically conductive member (8), said electrically conductive member (8) being disposed within said resilient flexible member (7);

the tail parts (1) of the two needle shafts (4) are respectively clamped in from the two ends of the needle tube (6) and are respectively contacted with the two ends of the elastic telescopic piece (7).

2. A test probe capable of adapting to high current according to claim 1, wherein the needle shaft (5) is provided with a step (2), two ends of the needle tube (6) respectively form a closed opening (4) inwards, and the step (2) of the needle shaft (5) is abutted against the closed opening (4) when the needle shaft moves outwards.

3. A test probe adaptable to high currents according to claim 2, characterized in that the step (2) is tapered, and the two end necks (4) of the needle tube (6) are also tapered.

4. A test probe adaptable to high currents according to claim 1, characterized in that the elastic extension and contraction (7) is a compression spring.

5. A test probe capable of adapting to high current according to claim 4, wherein the tail parts of the two needle shafts (5) are designed with tapered surfaces, and two ends of the compression spring are respectively sleeved on the corresponding tapered surfaces.

6. A test probe adaptable to high currents according to claim 1, characterized in that said conductive member (8) is a cylindrical body.

7. A test probe adaptable to high current according to claim 6, characterized in that the conductive member (8) is a conductive silicone rod.

8. A test probe capable of adapting to high current according to claim 7, wherein the conductive silica gel rod is filled with metal powder.

9. A test probe adaptable to high currents according to claim 1, characterized in that the head (3) of the needle shaft (5) is quincunx.