CN113608102A - Test probe suitable for large current - Google Patents
Test probe suitable for large current Download PDFInfo
- Publication number
- CN113608102A CN113608102A CN202110852014.6A CN202110852014A CN113608102A CN 113608102 A CN113608102 A CN 113608102A CN 202110852014 A CN202110852014 A CN 202110852014A CN 113608102 A CN113608102 A CN 113608102A
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- CN
- China
- Prior art keywords
- needle
- test probe
- plug
- shafts
- tube
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Geometry (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention relates to a test probe suitable for large current, which comprises a needle tube, wherein needle shafts are arranged at two ends of the needle tube, at least one of the two needle shafts can be arranged in a telescopic manner, a plug is arranged at one of the adjacent ends of the two needle shafts, a slot matched with the plug for insertion is arranged at the other one of the adjacent ends of the two needle shafts, when the plug is inserted into the slot, the parts of the ends of the two needle shafts, which are deviated from each other, are positioned outside the needle tube, and an elastic supporting piece for keeping the plug and the slot in a separated state is arranged between the two needle shafts; the invention has simple integral structure, avoids the defect that the traditional test probe is easy to burn out due to overlarge current, has excellent stability performance effect in the test process and greatly prolongs the service life.
Description
Technical Field
The invention relates to the technical field of electronic elements, in particular to a test probe suitable for large current.
Background
The test probe is a high-end precision link device, is widely applied to testing PCB (printed circuit board) and FPC (flexible printed circuit), is mainly used as a precision probe with a connection function, and is widely applied to the technical fields of mobile phones, automobiles, medical treatment, aerospace, aviation and the like at present.
When the test device is used, the test probe is arranged on the test fixture, one end of the test probe is connected with the output end (the output end refers to voltage, frequency and the like), and the other end of the test probe is connected with the tested element so as to carry out testing. The requirement for the test probe in the test process is extremely high, but the existing probe design has limited overvoltage and frequency output, and the internal parts of the test probe are burnt out due to the increase of voltage, so the invention provides the test probe which can adapt to overlarge current to solve the problems.
Disclosure of Invention
The present invention is directed to overcoming the disadvantages of the prior art by providing a high current compliant test probe that advantageously solves the above problems.
In order to meet the requirements, the technical scheme adopted by the invention for solving the technical problems is as follows:
the test probe suitable for the large current comprises a needle tube, wherein needle shafts are arranged at two ends of the needle tube, at least one of the two needle shafts is arranged in a telescopic mode, a plug is arranged at one of the adjacent ends of the two needle shafts, a slot matched with the plug in a plugging mode is formed in the other one of the adjacent ends of the two needle shafts, when the plug is inserted into the slot, the part, away from one end of the two needle shafts, of the probe is located outside the needle tube, and an elastic supporting piece used for keeping the plug and the slot in a separated state is arranged between the two needle shafts.
The test probe suitable for the large current is characterized in that the two needle shafts are respectively arranged at two ends of the needle tube in a telescopic mode.
The test probe suitable for the large current is characterized in that the needle shaft is provided with a stop gear, and the needle tube is provided with a stop part which is matched with the stop gear to prevent the needle shaft from slipping out of the needle tube.
The test probe suitable for the large current is characterized in that a step is circumferentially arranged at one end of the needle shaft, which is positioned in the needle tube, two ends of the needle tube are respectively folded inwards to form a narrowing opening for blocking the step, the folded section of the needle tube forms the stop part, and the step forms the stop position.
The test probe suitable for the large current is characterized in that a positioning bulge is arranged on the end face of the plug, and a positioning groove matched with the positioning bulge is arranged on the bottom surface of the slot.
The test probe suitable for the large current is characterized in that the positioning bulge is conical.
The test probe suitable for the large current is characterized in that the elastic supporting piece is a spring, and the inner diameter of the elastic supporting piece is larger than or equal to the outer diameter of the plug.
The test probe suitable for the large current is characterized in that the plug is a cylinder.
The test probe suitable for the large current is characterized in that the needle tube is a cylinder, the needle shaft is a cylinder, and the end surface of the needle shaft, which is positioned outside the needle tube, is a hemispherical surface.
According to the test probe suitable for the large current, when the test probe is assembled in place, two ends of the elastic supporting piece are respectively abutted against the two needle shafts.
The invention has the beneficial effects that: the invention discloses a test probe suitable for high current, when in use, two needle shafts are pressed and contracted into a needle tube, a plug is inserted into an insertion groove to conduct the two needle shafts, so that the high current input from the outside is divided, the current load of an elastic supporting piece is reduced, and the elastic supporting piece is prevented from being burnt out due to the overlarge current, so as to achieve the purpose of overlarge current.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the present invention will be further described with reference to the accompanying drawings and embodiments, wherein the drawings in the following description are only part of the embodiments of the present invention, and for those skilled in the art, other drawings can be obtained without inventive efforts according to the accompanying drawings:
fig. 1 is a cross-sectional view of the overall structure of a high current compliant test probe in accordance with the present invention.
Fig. 2 is an enlarged view at a in fig. 1.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the following will clearly and completely describe the technical solutions in the embodiments of the present invention, and it is obvious that the described embodiments are some embodiments of the present invention, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present invention without inventive step, are within the scope of the present invention.
The test probe suitable for large current according to the preferred embodiment of the present invention, as shown in fig. 1-2, includes a needle tube 1, two ends of the needle tube 1 are both provided with needle shafts 2, at least one of the two needle shafts 2 is telescopically arranged, one of the adjacent ends of the two needle shafts 2 is provided with a plug 3, the other one is provided with a slot 4 for inserting the plug 3, when the plug 3 is inserted into the slot 4, the part of the end of the two needle shafts 2 deviating from each other is located outside the needle tube 1, so as to ensure that the needle shafts 2 can normally contact with the external device, and an elastic supporting member 5 for keeping the plug 3 and the slot 4 separated is arranged between the two needle shafts 2; when the test device is used, the two needle shafts 2 are compressed and contracted into the needle tube 1, the plug 3 is inserted into the slot 4 to conduct the two needle shafts 2, so that large current input from the outside is split-loaded, the current load of the elastic support piece 5 is reduced, and the elastic support piece 5 is prevented from being blown off due to overlarge current, so that the purpose of overlarge current is achieved.
In addition, the probe can be used in a test environment for bearing small current, different functions can be selected according to different test requirements, and the probe is flexible and changeable and has strong adaptability.
Preferably, the two needle shafts 2 are respectively arranged at two ends of the needle tube 1 in a telescopic manner, and both the two needle shafts 2 can be used as contact ends for contacting with an external testing device so as to meet production requirements.
Preferably, the needle shaft 2 is provided with a stop 6, and the needle tube 1 is provided with a stopper 7 which is matched with the stop 6 to prevent the needle shaft 2 from sliding out of the needle tube 1.
Preferably, one end of the needle shaft 2 located in the needle tube 1 is circumferentially provided with an annular step, two ends of the needle tube 1 are respectively inwardly folded to form a narrowing opening for blocking the step, the folding section 10 of the needle tube 1 forms a stop part 7, and the step forms a stop part 6, so that the needle shaft 2 is prevented from slipping and falling.
Additionally, the inner wall 11 of the narrow opening of the needle tube is smooth and circular arc-shaped, so that the side wall of the needle shaft is prevented from being scratched by the edge prick, and the stability of the test is further influenced.
Preferably, the end face of the plug 3 is provided with a positioning protrusion 8, and the bottom surface of the slot 4 is provided with a positioning groove 9 matched with the positioning protrusion 8, so as to further ensure the stability when the plug 3 is inserted into the slot 4 and prevent the two needle shafts 2 from moving relatively.
Preferably, the positioning protrusion 8 is conical, and generally, the tip of the positioning protrusion is cut off to form a frustum shape, so that the plug 3 is prevented from moving radially in the slot 4, a better positioning effect is achieved, and meanwhile, the function of guiding and fixing the plug can be achieved, so that the plug can be conveniently inserted into the slot, and in addition, the inner wall of the slot is open, so that the plug can be further conveniently inserted; in the field of test probes, the condition that the probes are easy to burn out when the current is too large, which is the most troublesome condition for testers, often occurs, mainly because the needle shafts 2 at the two ends of the probes are connected through a spring arranged in the needle tube 1, and the spring has small cross section and large current resistance, when the current is too large, the inner part, namely the spring, can be burnt out immediately, and the diameter of a steel wire for manufacturing the spring cannot be too thick due to the special structure of the probe, so that the probe cannot have too large current, and when the production contradiction troubles a plurality of industries, the proposal provided by the invention not only solves the problem that the spring is easy to be burnt, but also has great effect on the contact yield and the stability of the two needle shafts 2, the service life of the probe is greatly prolonged compared with that of the traditional probe in the later test and use process.
Preferably, the elastic supporting member 5 is a spring, and the inner diameter of the elastic supporting member 5 is greater than or equal to the outer diameter of the plug 3, so as to be conveniently sleeved on the plug 3.
Preferably, the plug 3 is a cylinder, so that the processing is convenient, the use is also convenient, and the plug can rotate for 360 degrees.
Preferably, the needle tube 1 is a cylinder, the needle shaft 2 is a cylinder, and the end surface of the cylinder located outside the needle tube 1 is a hemispherical surface, so that the contact smoothness is improved, and other peripheral parts are prevented from being scratched.
Preferably, when the needle tube is assembled in place, two ends of the elastic supporting piece 5 are respectively abutted against the two needle shafts 2, so that the two needle shafts 2 are abutted against the inner wall of the needle tube 1 under normal conditions, and one ends of the two needle shafts which deviate from each other extend out of the needle tube 1.
It will be understood that modifications and variations can be made by persons skilled in the art in light of the above teachings and all such modifications and variations are intended to be included within the scope of the invention as defined in the appended claims.
Claims (10)
1. A test probe suitable for large current is characterized by comprising a needle tube, wherein needle shafts are arranged at two ends of the needle tube, at least one of the two needle shafts is arranged in a telescopic mode, a plug is arranged at one of the adjacent ends of the two needle shafts, a slot matched with the plug in a plugging mode is arranged in the other one of the adjacent ends of the two needle shafts, when the plug is plugged into the slot, the part of one end, away from the two needle shafts, of the other end is located outside the needle tube, and an elastic supporting piece used for keeping the plug and the slot in a separated state is arranged between the two needle shafts.
2. The high current tolerant test probe of claim 1, wherein the two pin shafts are telescopically disposed at two ends of the pin tube, respectively.
3. The high current compliant test probe of claim 1, wherein the pin shaft has a stop and the tube has a stop that engages the stop to prevent the pin shaft from sliding out of the tube.
4. The high current compliant test probe of claim 3, wherein the end of said shaft inside said needle tube is circumferentially provided with a step, the two ends of said needle tube are respectively inwardly tapered to form a narrowing for blocking said step, the tapered section of said needle tube forms said stop, and said step forms said stop.
5. The high-current adaptive test probe according to claim 1, wherein a positioning protrusion is disposed on an end surface of the plug, and a positioning groove matched with the positioning protrusion is disposed on a bottom surface of the slot.
6. The high current compliant test probe of claim 5, wherein said locating boss is conical.
7. The high current compliant test probe of claim 1, wherein the resilient support is a spring and an inner diameter of the resilient support is greater than or equal to an outer diameter of the plug.
8. The high current compliant test probe of claim 1, wherein said plug is cylindrical.
9. The high current compliant test probe of claim 1, wherein the needle tube is cylindrical, the needle shaft is cylindrical and the end surface of the needle shaft outside the needle tube is hemispherical.
10. The high current compliant test probe of claim 1, wherein when assembled in place, said resilient support has two ends that abut against said pin shafts, respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110852014.6A CN113608102A (en) | 2021-07-27 | 2021-07-27 | Test probe suitable for large current |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110852014.6A CN113608102A (en) | 2021-07-27 | 2021-07-27 | Test probe suitable for large current |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113608102A true CN113608102A (en) | 2021-11-05 |
Family
ID=78305601
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110852014.6A Withdrawn CN113608102A (en) | 2021-07-27 | 2021-07-27 | Test probe suitable for large current |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113608102A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114839408A (en) * | 2022-04-11 | 2022-08-02 | 渭南木王智能科技股份有限公司 | Spring leakage probe suitable for semiconductor heavy current test |
| CN115267277A (en) * | 2022-08-11 | 2022-11-01 | 渭南木王智能科技股份有限公司 | Double-head double-acting test probe capable of preventing needle shaft from rotating |
-
2021
- 2021-07-27 CN CN202110852014.6A patent/CN113608102A/en not_active Withdrawn
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114839408A (en) * | 2022-04-11 | 2022-08-02 | 渭南木王智能科技股份有限公司 | Spring leakage probe suitable for semiconductor heavy current test |
| CN115267277A (en) * | 2022-08-11 | 2022-11-01 | 渭南木王智能科技股份有限公司 | Double-head double-acting test probe capable of preventing needle shaft from rotating |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WW01 | Invention patent application withdrawn after publication | ||
| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20211105 |