CN115135976A - 精确拉曼光谱法 - Google Patents

精确拉曼光谱法 Download PDF

Info

Publication number
CN115135976A
CN115135976A CN202080093252.7A CN202080093252A CN115135976A CN 115135976 A CN115135976 A CN 115135976A CN 202080093252 A CN202080093252 A CN 202080093252A CN 115135976 A CN115135976 A CN 115135976A
Authority
CN
China
Prior art keywords
region
impinging beam
measurement system
raman
optical measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202080093252.7A
Other languages
English (en)
Chinese (zh)
Inventor
埃拉德·施莱费尔
约纳坦·奥伦
阿米尔·沙亚里
埃亚尔·霍兰德
瓦莱里·戴希
希蒙·亚洛夫
吉拉德·巴拉克
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Novell Ltd
Original Assignee
Novell Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Novell Ltd filed Critical Novell Ltd
Publication of CN115135976A publication Critical patent/CN115135976A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/44Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • G01J3/4412Scattering spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/027Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0286Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer, e.g. vacuum
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/44Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06113Coherent sources; lasers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/063Illuminating optical parts
    • G01N2201/0636Reflectors

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Spectrometry And Color Measurement (AREA)
CN202080093252.7A 2020-01-16 2020-11-24 精确拉曼光谱法 Pending CN115135976A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202062961721P 2020-01-16 2020-01-16
US62/961,721 2020-01-16
PCT/IB2020/061066 WO2021144634A1 (en) 2020-01-16 2020-11-24 Accurate raman spectroscopy

Publications (1)

Publication Number Publication Date
CN115135976A true CN115135976A (zh) 2022-09-30

Family

ID=76857753

Family Applications (2)

Application Number Title Priority Date Filing Date
CN202080093252.7A Pending CN115135976A (zh) 2020-01-16 2020-11-24 精确拉曼光谱法
CN202180076642.8A Pending CN116507905A (zh) 2020-01-16 2021-09-14 准确拉曼光谱

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN202180076642.8A Pending CN116507905A (zh) 2020-01-16 2021-09-14 准确拉曼光谱

Country Status (7)

Country Link
US (7) US11415519B2 (https=)
JP (1) JP7773470B2 (https=)
KR (3) KR102818270B1 (https=)
CN (2) CN115135976A (https=)
IL (1) IL301321A (https=)
TW (2) TWI780554B (https=)
WO (2) WO2021144634A1 (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7241663B2 (ja) * 2019-11-01 2023-03-17 東京エレクトロン株式会社 情報処理装置、情報処理方法、情報処理プログラム及び半導体製造装置
US11415519B2 (en) 2020-01-16 2022-08-16 Nova Ltd Accurate Raman spectroscopy
CN115128056B (zh) * 2022-05-25 2025-05-23 南京大学 一种时空分辨多模态拉曼高光谱显微成像系统及方法
CN116678866B (zh) * 2023-05-30 2026-03-27 哈尔滨工业大学 一种多偏振态入射显微拉曼光谱应力检测方法
WO2025230247A1 (ko) * 2024-04-30 2025-11-06 주식회사 아큐옵토텍 분석 장치 및 이를 이용한 분석 방법
GB2641380A (en) * 2024-05-29 2025-12-03 Rsp Systems As A device for non-invasive analyte measurement

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1536390A (zh) * 2003-03-28 2004-10-13 ���ǵ�����ʽ���� 形成彩色图像的投影系统和方法
CN101010575A (zh) * 2004-08-26 2007-08-01 皇家飞利浦电子股份有限公司 光学分析系统的自动校准
CN101718589A (zh) * 2009-11-14 2010-06-02 张青川 一种用于红外热像成像仪的光学读出方法
US8014427B1 (en) * 2010-05-11 2011-09-06 Ultratech, Inc. Line imaging systems and methods for laser annealing
CN104749156A (zh) * 2013-12-27 2015-07-01 同方威视技术股份有限公司 拉曼光谱检测方法
US20170276610A1 (en) * 2014-08-18 2017-09-28 Nanophoton Corporation Raman spectroscopic microscope and raman scattered light observation method
WO2018140602A1 (en) * 2017-01-27 2018-08-02 University Of Maryland, College Park Methods and devices for reducing spectral noise and spectrometry systems employing such devices
CN108700465A (zh) * 2015-12-15 2018-10-23 诺威量测设备股份有限公司 混合计量方法与系统
US20190094130A1 (en) * 2017-09-26 2019-03-28 Kla-Tencor Corporation Systems And Methods For Metrology Beam Stabilization

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5211070A (en) * 1975-07-17 1977-01-27 Ckd Corp Digital type automatic balanced circuit for ac bridge
JPS617629Y2 (https=) 1978-07-20 1986-03-08
US4957367A (en) * 1988-05-31 1990-09-18 Lev Dulman Inteferometric imaging system
US5455673A (en) * 1994-05-27 1995-10-03 Eastman Chemical Company Apparatus and method for measuring and applying a convolution function to produce a standard Raman spectrum
JPH07333508A (ja) * 1994-06-13 1995-12-22 Olympus Optical Co Ltd 共焦点光学顕微鏡
US5713364A (en) * 1995-08-01 1998-02-03 Medispectra, Inc. Spectral volume microprobe analysis of materials
US6151522A (en) * 1998-03-16 2000-11-21 The Research Foundation Of Cuny Method and system for examining biological materials using low power CW excitation raman spectroscopy
JP4286351B2 (ja) * 1998-11-13 2009-06-24 富士通株式会社 光アッド/ドロップ回路
US6661509B2 (en) * 2001-02-07 2003-12-09 Thermo Electron Scientific Instruments Corporation Method and apparatus for alignment of multiple beam paths in spectroscopy
US6750968B2 (en) * 2000-10-03 2004-06-15 Accent Optical Technologies, Inc. Differential numerical aperture methods and device
GB0106342D0 (en) * 2001-03-15 2001-05-02 Renishaw Plc Spectroscopy apparatus and method
IL146924A (en) * 2001-12-04 2007-03-08 Nova Measuring Instr Ltd Metal cmp process monitoring
WO2006005022A2 (en) * 2004-06-30 2006-01-12 Chemimage Corporation Dynamic chemical imaging of biological cells and other subjects
US7532314B1 (en) * 2005-07-14 2009-05-12 Battelle Memorial Institute Systems and methods for biological and chemical detection
WO2007040589A1 (en) * 2005-09-16 2007-04-12 The Regents Of The University Of Michigan Method and system for measuring sub-surface composition of a sample
FR2898992A1 (fr) * 2006-03-21 2007-09-28 Sc Spim Soc Civ Ile Dispositif de formation de spectre sur un capteur optique a rejet spatial.
JP4852439B2 (ja) * 2006-07-06 2012-01-11 株式会社リコー ラマン分光測定装置、及びこれを用いたラマン分光測定法
US7508524B2 (en) * 2007-07-20 2009-03-24 Vanderbilt University Combined raman spectroscopy-optical coherence tomography (RS-OCT) system and applications of the same
FR2930031A1 (fr) * 2008-04-14 2009-10-16 Centre Nat Rech Scient Dispositif et procede d'analyse exaltee d'un echantillon de particules.
JP5352111B2 (ja) * 2008-04-16 2013-11-27 株式会社日立ハイテクノロジーズ 欠陥検査方法及びこれを用いた欠陥検査装置
WO2010016267A1 (ja) * 2008-08-08 2010-02-11 独立行政法人科学技術振興機構 粒子プローブ近傍に存在する物質の分布を検出する方法、粒子プローブを用いた画像化方法およびその利用
US20170234728A1 (en) * 2010-12-01 2017-08-17 Mks Technology (D/B/A Snowy Range Instruments) Spectrometer
JP5703907B2 (ja) * 2011-03-31 2015-04-22 ソニー株式会社 非線形ラマン分光装置、非線形ラマン分光システム及び非線形ラマン分光方法
JP2012237714A (ja) * 2011-05-13 2012-12-06 Sony Corp 非線形ラマン分光装置、顕微分光装置及び顕微分光イメージング装置
US20160178439A1 (en) * 2013-06-17 2016-06-23 Invenio Imaging Inc. Methods and systems for coherent raman scattering
KR101643357B1 (ko) * 2013-08-26 2016-07-27 가부시키가이샤 뉴플레어 테크놀로지 촬상 장치, 검사 장치 및 검사 방법
KR102381930B1 (ko) * 2014-03-13 2022-04-04 내셔널 유니버시티 오브 싱가포르 광학 간섭 장치
DE102014206576B4 (de) * 2014-04-04 2015-12-03 Celltool Gmbh Vorrichtung und Verfahren zum Erkennen eines Prostatatumors
JP6379212B2 (ja) * 2014-10-16 2018-08-22 株式会社日立ハイテクノロジーズ 定位置制御装置、及び方法
US10620124B2 (en) * 2014-10-20 2020-04-14 Hitachi, Ltd. Optical analysis device and biomolecular analysis device
EP3218669B1 (en) * 2014-11-16 2024-02-28 ABDULHALIM, Ibrahim Multi-spectral polarimetric variable optical device and imager
US10337983B2 (en) * 2015-04-12 2019-07-02 Taiwan Biophotonic Corporation Module, device and method for optical measurement
US10295342B2 (en) * 2015-08-14 2019-05-21 Kla-Tencor Corporation System, method and computer program product for calibration of metrology tools
US11092494B1 (en) * 2016-05-31 2021-08-17 MKS Technology Spectrometer
EP4645615A3 (en) * 2016-06-03 2026-01-28 The General Hospital Corporation System and method for micro laser particles
JP7089719B2 (ja) * 2017-02-07 2022-06-23 ナノフォトン株式会社 分光顕微鏡、及び分光観察方法
GB201815207D0 (en) * 2018-09-18 2018-10-31 Univ Nottingham Raman spectroscopy method and apparatus
CN110231092B (zh) * 2019-07-15 2024-04-12 天津大学 角度分辨显微拉曼光谱探测装置及探测方法
US11415519B2 (en) 2020-01-16 2022-08-16 Nova Ltd Accurate Raman spectroscopy
CN111175282A (zh) * 2020-02-24 2020-05-19 江苏师范大学 一种基于物镜信号采集的拉曼光谱仪

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1536390A (zh) * 2003-03-28 2004-10-13 ���ǵ�����ʽ���� 形成彩色图像的投影系统和方法
CN101010575A (zh) * 2004-08-26 2007-08-01 皇家飞利浦电子股份有限公司 光学分析系统的自动校准
CN101718589A (zh) * 2009-11-14 2010-06-02 张青川 一种用于红外热像成像仪的光学读出方法
US8014427B1 (en) * 2010-05-11 2011-09-06 Ultratech, Inc. Line imaging systems and methods for laser annealing
CN104749156A (zh) * 2013-12-27 2015-07-01 同方威视技术股份有限公司 拉曼光谱检测方法
US20170276610A1 (en) * 2014-08-18 2017-09-28 Nanophoton Corporation Raman spectroscopic microscope and raman scattered light observation method
CN108700465A (zh) * 2015-12-15 2018-10-23 诺威量测设备股份有限公司 混合计量方法与系统
WO2018140602A1 (en) * 2017-01-27 2018-08-02 University Of Maryland, College Park Methods and devices for reducing spectral noise and spectrometry systems employing such devices
US20190094130A1 (en) * 2017-09-26 2019-03-28 Kla-Tencor Corporation Systems And Methods For Metrology Beam Stabilization

Also Published As

Publication number Publication date
TW202129258A (zh) 2021-08-01
US20240085333A1 (en) 2024-03-14
TWI780554B (zh) 2022-10-11
TW202530669A (zh) 2025-08-01
US12163892B2 (en) 2024-12-10
KR20220126768A (ko) 2022-09-16
KR20230069194A (ko) 2023-05-18
WO2022054021A1 (en) 2022-03-17
WO2021144634A1 (en) 2021-07-22
KR20250088647A (ko) 2025-06-17
JP2023510413A (ja) 2023-03-13
US11740183B2 (en) 2023-08-29
US12372473B2 (en) 2025-07-29
US20240210322A1 (en) 2024-06-27
US20240019375A1 (en) 2024-01-18
US20230168200A1 (en) 2023-06-01
KR102818270B1 (ko) 2025-06-16
JP7773470B2 (ja) 2025-11-19
TWI862978B (zh) 2024-11-21
US20250130172A1 (en) 2025-04-24
US11415519B2 (en) 2022-08-16
CN116507905A (zh) 2023-07-28
IL301321A (en) 2023-05-01
US11860104B2 (en) 2024-01-02
TW202323799A (zh) 2023-06-16
US20210223179A1 (en) 2021-07-22
US12152993B2 (en) 2024-11-26
US20230044886A1 (en) 2023-02-09

Similar Documents

Publication Publication Date Title
US11740183B2 (en) Accurate Raman spectroscopy
US7327444B2 (en) Substrate inspection apparatus and method
TWI673487B (zh) 度量系統、度量設備及度量方法
US20060285111A1 (en) Apparatuses and methods for enhanced critical dimension scatterometry
US7623223B2 (en) Stress measurement method
JP2012104586A (ja) 半導体計測装置
KR102580561B1 (ko) 가변 애퍼처 마스크
TWI798614B (zh) 光學臨界尺寸與光反射組合裝置、系統及方法
TWI918194B (zh) 光學量測系統、光學量測方法及非暫時性電腦可讀媒體
CN114902035A (zh) 用于进行偏振分辨拉曼光谱法的设备
CN216247130U (zh) 一种检测设备
US20210239464A1 (en) Scatterometry with High Harmonic Generation (HHG) Sources
US20250116605A1 (en) Accurate raman spectroscopy
KR20200053714A (ko) 반도체 소자의 패턴 불량 검출 시스템 및 방법

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination