CN114877840B - Calibration device and calibration method for electric trigger type soft probe - Google Patents
Calibration device and calibration method for electric trigger type soft probe Download PDFInfo
- Publication number
- CN114877840B CN114877840B CN202210630754.XA CN202210630754A CN114877840B CN 114877840 B CN114877840 B CN 114877840B CN 202210630754 A CN202210630754 A CN 202210630754A CN 114877840 B CN114877840 B CN 114877840B
- Authority
- CN
- China
- Prior art keywords
- probe
- test
- measuring head
- type soft
- displacement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000000523 sample Substances 0.000 title claims abstract description 106
- 238000000034 method Methods 0.000 title claims abstract description 31
- 238000012360 testing method Methods 0.000 claims abstract description 77
- 238000006073 displacement reaction Methods 0.000 claims abstract description 73
- 238000004088 simulation Methods 0.000 claims abstract description 17
- 230000001960 triggered effect Effects 0.000 claims description 7
- 238000001514 detection method Methods 0.000 claims description 6
- 238000005259 measurement Methods 0.000 description 16
- 230000008569 process Effects 0.000 description 6
- 230000008030 elimination Effects 0.000 description 5
- 238000003379 elimination reaction Methods 0.000 description 5
- 241001422033 Thestylus Species 0.000 description 4
- 238000004364 calculation method Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000012625 in-situ measurement Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 239000011343 solid material Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
- Y02E30/30—Nuclear fission reactors
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
Description
技术领域technical field
本发明涉及精密测量技术领域,尤其涉及一种电触发式软测头标定装置及标定方法。The invention relates to the technical field of precision measurement, in particular to an electric trigger type soft probe calibration device and a calibration method.
背景技术Background technique
高效率高精度的机械加工技术已逐渐成为评判一个国家现代化工业技术水平的重要因素,建立在位测量系统,实现数字化设计加工测量一体化是提高复杂精密零件制造精度和效率的有效途径。相比于非接触式测量方法,接触式测量具备精度高、稳定性强以及对测量环境适应性强等优点,目前,接触式测量技术已广泛应用于在位测量系统中。High-efficiency and high-precision machining technology has gradually become an important factor in judging the level of a country's modern industrial technology. Establishing an in-situ measurement system and realizing the integration of digital design, processing and measurement is an effective way to improve the precision and efficiency of complex precision parts manufacturing. Compared with non-contact measurement methods, contact measurement has the advantages of high precision, strong stability, and strong adaptability to the measurement environment. At present, contact measurement technology has been widely used in on-site measurement systems.
电触发式软测头为一种常见的接触式测量一起,其从测球碰触被测工件表面开始到传感器产生电信号的过程中,测头与被测工件间有一定的相对位移,由此产生的测量误差被称作“预行程误差”,电触发式软测头最主要的误差来源即不同触发角度下的预行程量。因此,对电触发式软测头各触发角度下的预行程量进行标定测试,确定一种电触发式软测头在位测量误差补偿方法,对于提升其测量精度和测量结果可靠性具有重要意义。The electric trigger soft probe is a common contact measurement. From the time when the ball touches the surface of the workpiece to be measured to when the sensor generates an electrical signal, there is a certain relative displacement between the probe and the workpiece to be measured. The resulting measurement error is called "pre-travel error". The main error source of the electric trigger soft probe is the pre-travel amount under different trigger angles. Therefore, it is of great significance to improve the measurement accuracy and reliability of the measurement results by performing a calibration test on the pre-travel amount of the electric trigger soft probe at each trigger angle and determining a compensation method for the in-position measurement error of the electric trigger soft probe. .
如今已经有很多学者对电触发式软测头的标定做出了很多研究,例如:2019年陈伟琪等人设计了一套基于三维微宏移动平台和测力传感器的标定系统,模拟了接触式测头的触发变形过程,对不同型号的测头触发力及其实际变形量展开了研究。2021年,杨艳玲等人设计了一种接触式测头结构尺寸优化方案,利用坐标变换理论和最小二乘法原理建立接触式测头标定模型并进行了标定实验。然而,现有研究中均未考虑在标定过程中产生的阿贝误差对标定结果的影响。Nowadays, many scholars have done a lot of research on the calibration of electric trigger soft probe. The trigger deformation process of the probe is studied, and the trigger force and actual deformation of different types of probes are studied. In 2021, Yang Yanling and others designed an optimization scheme for the structure and size of the touch probe, and established a calibration model of the touch probe by using the coordinate transformation theory and the least square method principle, and carried out calibration experiments. However, none of the existing studies considered the influence of the Abbe error generated during the calibration process on the calibration results.
发明内容Contents of the invention
有鉴于此,有必要提供一种电触发式软测头标定装置及标定方法,用以解决现有的标定方法没有考虑到阿贝误差的影响的问题。In view of this, it is necessary to provide an electric trigger type soft probe calibration device and a calibration method to solve the problem that the existing calibration methods do not take into account the influence of the Abbe error.
为达到上述技术目的,本发明采取了以下技术方案:In order to achieve the above-mentioned technical purpose, the present invention has taken the following technical solutions:
第一方面,本发明提供了一种电触发式软测头标定装置,用于对电触发式软测头进行标定,所述电触发式软测头包括探针和测球,所述测球安装于所述探针末端,包括:In the first aspect, the present invention provides an electric trigger type soft probe calibration device, which is used for calibrating the electric trigger type soft probe. The electric trigger type soft probe includes a probe and a measuring ball, and the measuring ball Installed on the end of the probe, including:
固定组件,连接并固定所述电触发式软测头;Fixing components, connecting and fixing the electric trigger type soft probe;
测试模拟组件,连接于所述固定组件,所述测试模拟组件包括可移动的推动部,所述推动部抵接所述测球,所述推动部上形成有两个测试位,两个所述测试位分别位于所述探针的两侧;The test simulation component is connected to the fixed component, the test simulation component includes a movable push part, the push part abuts against the measuring ball, two test positions are formed on the push part, and the two test positions are formed on the push part. The test positions are respectively located on both sides of the probe;
两个位移传感器,两个所述位移传感器均连接于所述固定组件,分别用于检测两个所述测试位的位移。Two displacement sensors, both of which are connected to the fixing assembly, are used to detect the displacement of the two test positions respectively.
进一步的,所述测试模拟组件包括斜块式测微仪,所述斜块式测微仪的斜块为所述推动部,所述斜块式测微仪中斜块的倾斜面抵接所述测球,两个所述测试位均位于所述斜块式测微仪中斜块的倾斜面上。Further, the test simulation component includes an inclined block micrometer, the inclined block of the inclined block micrometer is the pushing part, and the inclined surface of the inclined block in the inclined block micrometer abuts against the The measuring ball, the two test positions are located on the inclined surface of the inclined block in the inclined block micrometer.
进一步的,所述位移传感器为接触式传感器,所述位移传感器的检测端抵接所述推动部,所述推动部推动所述测球时的移动方向垂直于所述探针的延伸方向,所述位移传感器的检测方向和所述推动部推动所述测球时的移动方向相同。Further, the displacement sensor is a contact sensor, the detection end of the displacement sensor abuts against the pushing part, and the moving direction of the pushing part when pushing the measuring ball is perpendicular to the extending direction of the probe, so The detecting direction of the displacement sensor is the same as the moving direction when the pushing part pushes the measuring ball.
进一步的,两个所述测试位的连线垂直于所述探针的延伸方向,两个所述测试位至所述探针的距离相同。Further, the connecting line of the two test positions is perpendicular to the extending direction of the probes, and the distances from the two test positions to the probes are the same.
进一步的,所述固定组件包括锁定部和旋转部,所述锁定部连接于所述电触发式软测头,所述旋转部连接于所述锁定部,用于驱动所述锁定部带动所述电触发式软测头旋转,所述旋转部的转动轴线和所述探针的轴线重合。Further, the fixing assembly includes a locking part and a rotating part, the locking part is connected to the electric trigger soft probe, the rotating part is connected to the locking part, and is used to drive the locking part to drive the The electric trigger type soft measuring head rotates, and the rotation axis of the rotating part coincides with the axis of the probe.
进一步的,所述固定组件还包括两个磁性表座,两个所述磁性表座分别连接两个所述位移传感器。Further, the fixing assembly further includes two magnetic watch bases, and the two magnetic watch bases are respectively connected to the two displacement sensors.
进一步的,所述固定组件还包括工作台,所述测试模拟组件、所述旋转部和所述磁性表座均连接于所述工作台上。Further, the fixed assembly further includes a workbench, and the test simulation assembly, the rotating part and the magnetic watch base are all connected to the workbench.
第二方面,本发明还提供一种电触发式软测头标定方法,使用上述任一电触发式软测头标定装置,包括:In the second aspect, the present invention also provides an electric trigger type soft probe calibration method, using any of the above electric trigger type soft probe calibration devices, including:
步骤一、使用所述推动部推动所述测球,并获取所述推动部上的两个测试位的位移量,复位所述推动部;
步骤二、重复进行多次所述步骤一,得到一组所述位移量;Step 2, repeating the
步骤三、调整所述电触发式软测头的位姿,重复进行所述步骤二,得到多组所述位移量;
步骤四、根据多组所述位移量,得到标定参数;Step 4. Obtain calibration parameters according to multiple sets of displacements;
步骤五、根据所述标定参数,对所述电触发式软测头进行标定。Step 5: Calibrate the electric trigger type soft probe according to the calibration parameters.
进一步的,所述调整所述电触发式软测头的位姿,包括:Further, the adjustment of the pose of the electric trigger soft probe includes:
沿所述探针的轴线转动所述电触发式软测头,直至所述电触发式软测头达到设定位置。Rotate the electric trigger type soft probe along the axis of the probe until the electric trigger type soft probe reaches the set position.
进一步的,所述位移量为所述测试位沿所述推动部运动方向上的位移,所述标定参数包括预行程量、触发稳定性参数和整体稳定参数。Further, the displacement is the displacement of the test position along the moving direction of the pushing part, and the calibration parameters include pre-travel, trigger stability parameters and overall stability parameters.
本发明提供的一种电触发式软测头标定装置及标定方法,其通过固定组件固定待测量的电触发式软测头,使用测试模拟组件对电触发式软测头进行测试,其通过推动部模拟出被测量物体的运动,推动部上有与其一同运动的两个测试位,通过位移传感器对两个测试位的位移进行检测,计算两个位移传感器的测试结果便可以完成对电触发式软测头的标定。相比于现有技术,本发明中的测试位可以反映出推动部的转动情况,并且两个测试位分别设置于于探针的两侧以最大化的消除推动部转动产生的误差,最大化的消除了阿贝误差对标定结果的影响,使得标定结果更加准确。The invention provides an electric trigger type soft probe calibration device and a calibration method, which fixes the electric trigger type soft probe to be measured through a fixing component, uses a test simulation component to test the electric trigger type soft probe, and pushes the The part simulates the movement of the object to be measured, and there are two test positions that move with it on the push part. The displacement of the two test positions is detected by the displacement sensor, and the electric trigger type can be completed by calculating the test results of the two displacement sensors. Calibration of soft probes. Compared with the prior art, the test position in the present invention can reflect the rotation of the pushing part, and the two test positions are respectively arranged on both sides of the probe to maximize the elimination of the error caused by the rotation of the pushing part and maximize the Eliminate the influence of Abbe error on the calibration results, making the calibration results more accurate.
附图说明Description of drawings
图1为本发明提供的电触发式软测头标定装置一实施例的结构示意图;Fig. 1 is the structural schematic diagram of an embodiment of the electric trigger type soft probe calibration device provided by the present invention;
图2为本发明提供的电触发式软测头标定方法一实施例的方法流程图;Fig. 2 is a method flow chart of an embodiment of an electric trigger type soft probe calibration method provided by the present invention;
图3为本发明提供的电触发式软测头标定装置在检测时的结构示意图。Fig. 3 is a schematic diagram of the structure of the electric trigger type soft probe calibration device provided by the present invention during detection.
具体实施方式Detailed ways
下面结合附图来具体描述本发明的优选实施例,其中,附图构成本申请一部分,并与本发明的实施例一起用于阐释本发明的原理,并非用于限定本发明的范围。Preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of the application and together with the embodiments of the present invention are used to explain the principle of the present invention and are not intended to limit the scope of the present invention.
在本申请的描述中,“多个”的含义是两个或两个以上,除非另有明确具体的限定。In the description of the present application, "plurality" means two or more, unless otherwise specifically defined.
在本文中提及“实施例”意味着,结合实施例描述的特定特征、结构或特性可以包含在本发明的至少一个实施例中。在说明书中的各个位置出现该短语并不一定均是指相同的实施例,也不是与其它实施例互斥的独立的或备选的实施例。本领域技术人员显式地和隐式地理解的是,本文所描述的实施例可以与其它实施例相结合。Reference herein to an "embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the present invention. The occurrences of this phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is understood explicitly and implicitly by those skilled in the art that the embodiments described herein can be combined with other embodiments.
触发式测头是一种用于检测机床或一些其他物品运动的装置,其工作原理大致为:在测头内部有一个闭合的有源电路,该电路与一个特殊的触发机构相连接,只要触发机构产生触发动作,就会引起电路状态变化并发出声光信号,指示测头的工作状态。触发机构产生触发动作的唯一条件是测头的探针产生微小的摆动或向测头内部移动,当测头连接在机床主轴上并随主轴移动时,只要测针上的测球在任意方向与工件(任何固体材料)表面接触,使测针产生微小的摆动或移动,都会立即导致测头产生声光信号,指明其工作状态。The trigger probe is a device used to detect the movement of machine tools or some other objects. Its working principle is roughly as follows: there is a closed active circuit inside the probe, which is connected with a special trigger mechanism. When the mechanism produces a trigger action, it will cause a change in the state of the circuit and send out an audible and visual signal to indicate the working status of the probe. The only condition for the trigger mechanism to trigger action is that the stylus of the stylus swings slightly or moves toward the inside of the stylus. The surface contact of the workpiece (any solid material) will cause the stylus to vibrate or move slightly, which will immediately cause the probe to generate sound and light signals, indicating its working status.
从测球碰触被测工件表面开始到传感器产生电信号的过程中,测头与被测工件间有一定的相对位移,由此产生的测量误差被称作“预行程误差”,电触发式软测头最主要的误差来源即不同触发角度下的预行程量。因此,对电触发式软测头各触发角度下的预行程量进行标定测试,确定一种电触发式软测头在位测量误差补偿方法。During the process from when the measuring ball touches the surface of the workpiece to be measured to when the sensor generates electrical signals, there is a certain relative displacement between the probe and the workpiece to be measured, and the resulting measurement error is called "pre-travel error". The main error source of the soft probe is the pre-travel amount under different trigger angles. Therefore, the pre-travel amount of the electric trigger soft probe under each trigger angle is calibrated and tested to determine a compensation method for the in-position measurement error of the electric trigger soft probe.
但是现有的标定方法均没有考虑阿贝误差的影响,使得标定结果不够准确,阿贝误差是指测量仪器的轴线与待测工件的轴线须在同一直线上,否则即产生误差,此误差称为阿贝误差。在电触发式软测头的标定过程中,因无法保证用于触发电触发式软测头的部件仅作直线运动,其通常会发生微小的旋转,使得在标定过程中,阿贝误差的产生不可避免。However, the existing calibration methods do not consider the influence of the Abbe error, which makes the calibration results not accurate enough. The Abbe error means that the axis of the measuring instrument and the axis of the workpiece to be measured must be on the same straight line, otherwise an error will occur. This error is called is the Abbe error. During the calibration process of the electric trigger soft probe, because it cannot be guaranteed that the parts used to trigger the electric trigger soft probe can only move in a straight line, it usually rotates slightly, so that the Abbe error occurs during the calibration process. inevitable.
本发明中采用如下方式以消除阿贝误差:Adopt following mode in the present invention to eliminate Abbe's error:
本发明提供了一种电触发式软测头标定装置及标定方法,以下分别进行说明。The present invention provides a calibration device and a calibration method for an electric trigger type soft probe, which will be described respectively below.
结合图1所示,本发明的一个具体实施例,公开了一种电触发式软测头标定装置,用于对电触发式软测头100进行标定,所述电触发式软测头100包括探针101和测球102,所述测球102安装于所述探针101末端。本电触发式软测头标定装置包括固定组件1、测试模拟组件2和位移传感器3。其中固定组件1连接并固定所述电触发式软测头100,测试模拟组件2连接于所述固定组件1,所述测试模拟组件2包括可移动的推动部21,所述推动部21抵接所述测球102,所述推动部21上形成有两个测试位,两个所述测试位分别位于所述探针101的两侧。位移传感器3的数量为两个,两个所述位移传感器3均连接于所述固定组件1,分别用于检测两个所述测试位的位移。As shown in FIG. 1 , a specific embodiment of the present invention discloses an electric trigger type soft probe calibration device for calibrating an electric trigger type
本发明提供的一种电触发式软测头标定装置及标定方法,其通过固定组件1固定待测量的电触发式软测头100,使用测试模拟组件2对电触发式软测头100进行测试,其通过推动部21模拟出被测量物体的运动,推动部21上有与其一同运动的两个测试位,通过位移传感器3对两个测试位的位移进行检测,计算两个位移传感器3的测试结果便可以完成对电触发式软测头100的标定。相比于现有技术,本发明中的测试位可以反映出推动部21的转动情况,并且两个测试位分别设置于于探针101的两侧以最大化的消除推动部21转动产生的误差,最大化的消除了阿贝误差对标定结果的影响,使得标定结果更加准确。The present invention provides an electric trigger type soft probe calibration device and calibration method, which fixes the electric trigger type
作为优选的实施例,本实施例中的电触发式软测头标定装置中的所述固定组件1包括锁定部11和旋转部12,所述锁定部11连接于所述电触发式软测头100,所述旋转部12连接于所述锁定部11,用于驱动所述锁定部11带动所述电触发式软测头100旋转,所述旋转部12的转动轴线和所述探针101的轴线重合。锁定部11用于将电触发式软测头100固定,旋转部12则用于调整电触发式软测头100的位姿,以进行全面的检测。本实施例中锁定部11为锁刀座,旋转部12为R-轴旋转平台,实际中也可以使用其他能够实现上述功能的零件替代。As a preferred embodiment, the fixing
进一步地,本实施例中的所述固定组件1还包括两个磁性表座13,两个所述磁性表座13分别连接两个所述位移传感器3。磁性表座13也称万向表座是机器制造业用途最多,广泛适用于各类机床,也是必不可少的检测工具之一,同时还应用于各种科学研究中。根据位移传感器3的种类不同,也可以采用其他零件固定位移传感器3。Further, the fixing
本实施例中的所述固定组件1还包括工作台14,所述测试模拟组件2、所述旋转部12和所述磁性表座13均连接于所述工作台14上,起到承载其他零件的作用。The fixed
作为优选的实施例,本实施例中的所述测试模拟组件2包括斜块式测微仪,所述斜块式测微仪的斜块即为所述推动部21,所述斜块式测微仪中斜块的倾斜面抵接所述测球102,两个所述测试位均位于所述斜块式测微仪中斜块的倾斜面上。斜块式测微仪可以模拟出微小的移动,即旋转其手柄时,斜块式测微仪中的斜块会沿图1中的x轴方向移动,因其与测球102接触的表面倾斜,使得测球102可以沿图1中的y轴方向移动,通过斜块表面的倾斜比例,便可以将斜块沿y轴方向的大位移转换成沿x轴方向的小位移,实现精确控制。As a preferred embodiment, the test simulation component 2 in this embodiment includes an inclined block micrometer, the inclined block of the inclined block micrometer is the pushing
测试位即位于斜块中和测球102接触的表面上,位于探针101两侧的可视为点位的两个微小区域,其跟随推动部21一同运动,当推动部21发生微小旋转时,两个测试位的位移量便会反映出推动部21的旋转情况,以及与探针101之间的阿贝误差。实际中测试位也可以为推动部21上的其他位置,仅需能够跟随推动部21一同运动,并且能够被位移传感器3检测出位移即可。The test position is located on the surface of the inclined block in contact with the measuring
作为优选的实施例,本实施例中的两个所述测试位的连线垂直于所述探针101的延伸方向,两个所述测试位至所述探针101的距离相同。因本实施例中选用斜块式测微仪作为模拟运动的工件,其主要会在图1中的yoz平面内发生转动,所以采用上述设计方式可以方便后续的计算,在消除误差的计算过程中更加简便。实际中两个测试位的具体设置位置可以根据推动部21发生偏转误差的方向进行调整。As a preferred embodiment, the connecting line of the two test positions in this embodiment is perpendicular to the extension direction of the
作为优选的实施例,本实施例中的所述位移传感器3为接触式传感器,所述位移传感器3的检测端抵接所述推动部21,所述推动部21推动所述测球102时的移动方向垂直于所述探针101的延伸方向,所述位移传感器3的检测方向和所述推动部21推动所述测球102时的移动方向相同。同样地,本实施例中位移传感器3的探测方向也能够方便后续的计算。As a preferred embodiment, the
结合图2所示,本发明还提供一种电触发式软测头标定方法,该方法使用上述实施例中的电触发式软测头标定装置,包括:As shown in Fig. 2, the present invention also provides an electric trigger type soft probe calibration method, which uses the electric trigger type soft probe calibration device in the above embodiment, including:
S201、使用所述推动部21推动所述测球102,获取所述推动部21上的两个测试位的位移量,复位所述推动部21;S201. Use the pushing
S202、重复进行多次所述步骤S201,得到一组所述位移量;S202, repeating the step S201 multiple times to obtain a set of displacements;
S203、调整所述电触发式软测头100的位姿,重复进行所述步骤S202,得到多组所述位移量;S203, adjusting the pose of the electric trigger type
S204、根据多组所述位移量,得到标定参数;S204. Obtain calibration parameters according to multiple sets of displacements;
S205、根据所述标定参数,对所述电触发式软测头100进行标定。S205. Calibrate the electric trigger type
该方法所取得的技术效果可参见上文实施例,此处将不做过多说明。The technical effects achieved by this method can be referred to the above embodiments, and will not be described too much here.
结合图3所示,作为优选的实施例,在本实施例中的步骤S201至步骤S203中,以测球102的圆心作为标定参考原点,以探针101延伸方向为x轴,以位移传感器3的探测方向为y轴建立坐标系,测球102的圆心,即标定参考原点的坐标为Op(Opx,Opy,Opz),设测球102的的球体半径为rp,测球102与斜块式测微仪的接触点的坐标为:As shown in FIG. 3 , as a preferred embodiment, in steps S201 to S203 in this embodiment, the center of the measuring
式中OTx、OTy、OTz分别为测球102与斜块式测微仪的接触点在x、y、z轴上的坐标。In the formula, O Tx , O Ty , and O Tz are the coordinates on the x, y, and z axes of the contact point between the measuring
以两个位移传感器3的测量点为其量程范围的起始点,其位移传感器3与斜块的接触点坐标分别为:Taking the measurement points of the two
式中ASx、ASy、ASz分别为一个位移传感器3与斜块的接触点在x、y、z轴上的坐标,Δz为位移传感器3的测量点与测球102中心之间沿z轴方向的距离;In the formula, A Sx , A Sy , and A Sz are the coordinates on the x, y, and z axes of the contact point between a
式中BSx、BSy、BSz分别为另一个位移传感器3与斜块的接触点在x、y、z轴上的坐标;In the formula, B Sx , B Sy , and B Sz are the coordinates on the x, y, and z axes of the contact point between the
通过调节斜块式测微仪的微分螺杆,使其斜块沿x轴方向运动,与此同时斜块在y轴方向产生一个偏置量Δy,与此同时斜块还会发生围绕x轴的旋转导致阿贝误差的产生,该旋转角度为α。此时两个位移传感器3的读数即为所期望获得的测试位的位移量,可分别表示为:By adjusting the differential screw of the inclined block micrometer, the inclined block moves along the x-axis direction, and at the same time, the inclined block generates an offset Δy in the y-axis direction, and at the same time, the inclined block also produces a movement around the x-axis The Abbe error is caused by the rotation, which is by an angle α. At this moment, the readings of the two
式中分别为两个位移传感器3的读数,具体为当R-轴旋转平台的鼓轮读数为j时,第i次重复执行步骤S202时的读数,Δztanα为测试位与斜块之间与阿贝臂长度相关的差值。In the formula are the readings of the two
具体地,在步骤S201及步骤S202中,每一次测试后均需要复位斜块式测微仪,已准备进行下一次测试,直至完成n次重复。Specifically, in step S201 and step S202, the inclined block micrometer needs to be reset after each test, and the next test is ready until n repetitions are completed.
在步骤S203中,调整位姿的具体手段为沿所述探针101的轴线转动所述电触发式软测头100,即操作R-轴旋转平台使电触发式软测头100转动,直至所述电触发式软测头100达到设定位置,将设定位置上R-轴旋转平台的鼓轮读数记为j,便可以开始执行步骤S202,执行完毕后便可以继续调整电触发式软测头100至下一个设定位置。当电触发式软测头100旋转360°后,便可以完成本步骤,其中j可以为360°内的多个离散点,其总数量为m。In step S203, the specific means of adjusting the pose is to rotate the electric trigger
进一步地,在一个优选的实施例中,步骤S204中所得到标定参数包括预行程量μj、触发稳定性参数δj和整体稳定参数δ,具体表示为:Further, in a preferred embodiment, the calibration parameters obtained in step S204 include pre-travel amount μ j , trigger stability parameter δ j and overall stability parameter δ, specifically expressed as:
其中预行程量μj表示测球102在同一测试角度j下其偏置矢量的均值,触发稳定性参数δj表示电触发式软测头100在触发角度j下的稳定能力,整体稳定参数δ表示电触发式软测头100整体的问题能力。Wherein the pre-travel amount μ j represents the mean value of the bias vector of the measuring
获取这三个参数后,便可以执行步骤S205,对电触发式软测头100进行标定,具体标定方法为现有技术,本发明中不做过多说明。值得注意的是,上述步骤是通过两个位移传感器3的读数得到了标定参数,而两个位移传感器3的读数值包括了阿贝误差的信息,两个位移传感器3的读数相结合可以最大化的消除阿贝误差对测量数据的影响,这样使得最后得到的标定参数最为准确。After obtaining these three parameters, step S205 can be executed to calibrate the electric trigger type
在一个优选的实施例中,在执行步骤S201前,先对整个电触发式软测头标定装置机型触发测试,以检测其是否能够正常运行。In a preferred embodiment, before step S201 is performed, a test is first triggered on the entire model of the electric trigger type soft probe calibration device to detect whether it can operate normally.
下面给出通过本方法得到的一组具体实验数据:A set of specific experimental data obtained by this method is given below:
当j=0°,n=6时两个位移传感器3的读数:When j=0°, the readings of the two
当j=120°,n=6时两个位移传感器3的读数:When j=120°, the readings of two
当j=240°,n=6时两个位移传感器3的读数:When j=240°, the readings of two
根据上述数据得到的标定参数:Calibration parameters obtained from the above data:
本发明提供的一种电触发式软测头标定装置及标定方法,其通过固定组件1固定待测量的电触发式软测头100,使用测试模拟组件2对电触发式软测头100进行测试,其通过推动部21模拟出被测量物体的运动,推动部21上有与其一同运动的两个测试位,通过位移传感器3对两个测试位的位移进行检测,计算两个位移传感器3的测试结果便可以完成对电触发式软测头100的标定。相比于现有技术,本发明中的测试位可以反映出推动部21的转动情况,并且两个测试位分别设置于于探针101的两侧以最大化的消除推动部21转动产生的误差,最大化的消除了阿贝误差对标定结果的影响,使得标定结果更加准确。The present invention provides an electric trigger type soft probe calibration device and calibration method, which fixes the electric trigger type
本说明书中各个实施例采用递进的方式描述,每个实施例重点说明的都是与其它实施例的不同之处,各个实施例之间相同或相似部分互相参见即可。Each embodiment in this specification is described in a progressive manner, each embodiment focuses on the difference from other embodiments, and the same or similar parts of each embodiment can be referred to each other.
以上所述,仅为本发明较佳的具体实施方式,但本发明的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本发明揭露的技术范围内,可轻易想到的变化或替换,都应涵盖在本发明的保护范围之内。The above is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed in the present invention can easily think of changes or Replacement should be covered within the protection scope of the present invention.
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210630754.XA CN114877840B (en) | 2022-06-06 | 2022-06-06 | Calibration device and calibration method for electric trigger type soft probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210630754.XA CN114877840B (en) | 2022-06-06 | 2022-06-06 | Calibration device and calibration method for electric trigger type soft probe |
Publications (2)
Publication Number | Publication Date |
---|---|
CN114877840A CN114877840A (en) | 2022-08-09 |
CN114877840B true CN114877840B (en) | 2023-07-14 |
Family
ID=82679354
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202210630754.XA Active CN114877840B (en) | 2022-06-06 | 2022-06-06 | Calibration device and calibration method for electric trigger type soft probe |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN114877840B (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103659467A (en) * | 2013-11-15 | 2014-03-26 | 西安理工大学 | Method for calibrating axial prestroke of touch-type measuring head |
CN109253710A (en) * | 2018-10-12 | 2019-01-22 | 太原理工大学 | A kind of REVO gauge head A axis error of zero scaling method |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI267622B (en) * | 2005-12-28 | 2006-12-01 | Ind Tech Res Inst | Measuring system with zero Abbe error and method thereof |
CN106771979B (en) * | 2016-12-30 | 2019-07-02 | 南京协辰电子科技有限公司 | A kind of calibration method of double probe flying probe devices |
CN107655410B (en) * | 2017-10-31 | 2023-08-22 | 合肥工业大学 | Abbe principle-based precise measurement teaching instrument |
CN111397555A (en) * | 2020-04-14 | 2020-07-10 | 中国计量科学研究院 | A method and system for measuring parameter error of touch-trigger probe |
CN112846936A (en) * | 2020-12-31 | 2021-05-28 | 广州铁路职业技术学院(广州铁路机械学校) | Method for calibrating accuracy of trigger type measuring head in on-machine detection |
-
2022
- 2022-06-06 CN CN202210630754.XA patent/CN114877840B/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103659467A (en) * | 2013-11-15 | 2014-03-26 | 西安理工大学 | Method for calibrating axial prestroke of touch-type measuring head |
CN109253710A (en) * | 2018-10-12 | 2019-01-22 | 太原理工大学 | A kind of REVO gauge head A axis error of zero scaling method |
Also Published As
Publication number | Publication date |
---|---|
CN114877840A (en) | 2022-08-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7079969B2 (en) | Dynamic artefact comparison | |
US7131207B2 (en) | Workpiece inspection method | |
US7885777B2 (en) | Probe calibration | |
CN109655023B (en) | System for determining the state of a tool positioning machine | |
US9542355B2 (en) | Method for recalibrating coordinate positioning apparatus | |
CN107588742A (en) | A kind of cylindrical gear profile bias measurement method based on line-structured light | |
JPH01503733A (en) | Workpiece inspection method and device | |
CN108317985A (en) | The measuring device and measurement method of high-precision industrial robot repetitive positioning accuracy | |
CN107900781B (en) | Calibration device and calibration method of contact online detection system for lathes | |
CN111238372B (en) | Synchronous detection method for joint position error of double-compound coordinate measurement system | |
CN113733102B (en) | Error calibration device for industrial robot | |
CN112344895B (en) | Establishment and calibration method of a multi-parameter model of an articulated arm coordinate measuring machine | |
JP2017181506A (en) | Surface shape measuring machine and calibration device | |
CN114877840B (en) | Calibration device and calibration method for electric trigger type soft probe | |
CN101166953B (en) | Probe calibration | |
Wozniak et al. | Setup for triggering force testing of touch probes for CNC machine tools and CMMs | |
CN115077458B (en) | Universal precision measuring method of lever ball type for cross-section bending eccentricity of revolving parts | |
CN110017803A (en) | A kind of REVO gauge head B axle error of zero scaling method | |
CN110030963B (en) | REVO measuring head probe length calibration method | |
JP2024157139A (en) | Calibration data acquisition method, measured value correction method, and surface property measuring machine | |
CN116592734A (en) | Measuring head radius calibration method and measuring head measurement method for on-machine measurement system | |
CN114279301A (en) | Inner wall measurement system and measurement method based on deep sagittal workpiece | |
JPS62274202A (en) | Laser measuring instrument for nc lathe | |
CN116442000A (en) | Calibration device and calibration method for probe pre-travel of in-situ detection system of CNC machine tool | |
JPH045328B2 (en) |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |