CN114877840B - Calibration device and calibration method for electric trigger type soft probe - Google Patents

Calibration device and calibration method for electric trigger type soft probe Download PDF

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CN114877840B
CN114877840B CN202210630754.XA CN202210630754A CN114877840B CN 114877840 B CN114877840 B CN 114877840B CN 202210630754 A CN202210630754 A CN 202210630754A CN 114877840 B CN114877840 B CN 114877840B
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probe
test
measuring head
type soft
displacement
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CN114877840A (en
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卢红
代家舜
刘琪
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Wuhan University of Technology WUT
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042Calibration or calibration artifacts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045Correction of measurements
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00Energy generation of nuclear origin
    • Y02E30/30Nuclear fission reactors

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  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

The invention relates to an electric trigger type soft measuring head calibration device and a calibration method, wherein the device comprises a fixing component, a simulation test component and two displacement sensors, wherein the electric trigger type soft measuring head to be measured is fixed through the fixing component, the electric trigger type soft measuring head is tested by using the test simulation component, the motion of a measured object is simulated through a pushing part, two test positions which move together with the pushing part are arranged on the pushing part, the displacement of the two test positions is detected through the displacement sensors, and the calibration of the electric trigger type soft measuring head can be completed by calculating the test results of the two displacement sensors. Compared with the prior art, the test bit can reflect the rotation condition of the pushing part, and the two test bits are respectively arranged on two sides of the probe to maximally eliminate errors generated by rotation of the pushing part, so that the influence of Abbe errors on a calibration result is maximally eliminated, and the calibration result is more accurate.

Description

一种电触发式软测头标定装置及标定方法Calibration device and calibration method for electric trigger type soft probe

技术领域technical field

本发明涉及精密测量技术领域,尤其涉及一种电触发式软测头标定装置及标定方法。The invention relates to the technical field of precision measurement, in particular to an electric trigger type soft probe calibration device and a calibration method.

背景技术Background technique

高效率高精度的机械加工技术已逐渐成为评判一个国家现代化工业技术水平的重要因素,建立在位测量系统,实现数字化设计加工测量一体化是提高复杂精密零件制造精度和效率的有效途径。相比于非接触式测量方法,接触式测量具备精度高、稳定性强以及对测量环境适应性强等优点,目前,接触式测量技术已广泛应用于在位测量系统中。High-efficiency and high-precision machining technology has gradually become an important factor in judging the level of a country's modern industrial technology. Establishing an in-situ measurement system and realizing the integration of digital design, processing and measurement is an effective way to improve the precision and efficiency of complex precision parts manufacturing. Compared with non-contact measurement methods, contact measurement has the advantages of high precision, strong stability, and strong adaptability to the measurement environment. At present, contact measurement technology has been widely used in on-site measurement systems.

电触发式软测头为一种常见的接触式测量一起,其从测球碰触被测工件表面开始到传感器产生电信号的过程中,测头与被测工件间有一定的相对位移,由此产生的测量误差被称作“预行程误差”,电触发式软测头最主要的误差来源即不同触发角度下的预行程量。因此,对电触发式软测头各触发角度下的预行程量进行标定测试,确定一种电触发式软测头在位测量误差补偿方法,对于提升其测量精度和测量结果可靠性具有重要意义。The electric trigger soft probe is a common contact measurement. From the time when the ball touches the surface of the workpiece to be measured to when the sensor generates an electrical signal, there is a certain relative displacement between the probe and the workpiece to be measured. The resulting measurement error is called "pre-travel error". The main error source of the electric trigger soft probe is the pre-travel amount under different trigger angles. Therefore, it is of great significance to improve the measurement accuracy and reliability of the measurement results by performing a calibration test on the pre-travel amount of the electric trigger soft probe at each trigger angle and determining a compensation method for the in-position measurement error of the electric trigger soft probe. .

如今已经有很多学者对电触发式软测头的标定做出了很多研究,例如:2019年陈伟琪等人设计了一套基于三维微宏移动平台和测力传感器的标定系统,模拟了接触式测头的触发变形过程,对不同型号的测头触发力及其实际变形量展开了研究。2021年,杨艳玲等人设计了一种接触式测头结构尺寸优化方案,利用坐标变换理论和最小二乘法原理建立接触式测头标定模型并进行了标定实验。然而,现有研究中均未考虑在标定过程中产生的阿贝误差对标定结果的影响。Nowadays, many scholars have done a lot of research on the calibration of electric trigger soft probe. The trigger deformation process of the probe is studied, and the trigger force and actual deformation of different types of probes are studied. In 2021, Yang Yanling and others designed an optimization scheme for the structure and size of the touch probe, and established a calibration model of the touch probe by using the coordinate transformation theory and the least square method principle, and carried out calibration experiments. However, none of the existing studies considered the influence of the Abbe error generated during the calibration process on the calibration results.

发明内容Contents of the invention

有鉴于此,有必要提供一种电触发式软测头标定装置及标定方法,用以解决现有的标定方法没有考虑到阿贝误差的影响的问题。In view of this, it is necessary to provide an electric trigger type soft probe calibration device and a calibration method to solve the problem that the existing calibration methods do not take into account the influence of the Abbe error.

为达到上述技术目的,本发明采取了以下技术方案:In order to achieve the above-mentioned technical purpose, the present invention has taken the following technical solutions:

第一方面,本发明提供了一种电触发式软测头标定装置,用于对电触发式软测头进行标定,所述电触发式软测头包括探针和测球,所述测球安装于所述探针末端,包括:In the first aspect, the present invention provides an electric trigger type soft probe calibration device, which is used for calibrating the electric trigger type soft probe. The electric trigger type soft probe includes a probe and a measuring ball, and the measuring ball Installed on the end of the probe, including:

固定组件,连接并固定所述电触发式软测头;Fixing components, connecting and fixing the electric trigger type soft probe;

测试模拟组件,连接于所述固定组件,所述测试模拟组件包括可移动的推动部,所述推动部抵接所述测球,所述推动部上形成有两个测试位,两个所述测试位分别位于所述探针的两侧;The test simulation component is connected to the fixed component, the test simulation component includes a movable push part, the push part abuts against the measuring ball, two test positions are formed on the push part, and the two test positions are formed on the push part. The test positions are respectively located on both sides of the probe;

两个位移传感器,两个所述位移传感器均连接于所述固定组件,分别用于检测两个所述测试位的位移。Two displacement sensors, both of which are connected to the fixing assembly, are used to detect the displacement of the two test positions respectively.

进一步的,所述测试模拟组件包括斜块式测微仪,所述斜块式测微仪的斜块为所述推动部,所述斜块式测微仪中斜块的倾斜面抵接所述测球,两个所述测试位均位于所述斜块式测微仪中斜块的倾斜面上。Further, the test simulation component includes an inclined block micrometer, the inclined block of the inclined block micrometer is the pushing part, and the inclined surface of the inclined block in the inclined block micrometer abuts against the The measuring ball, the two test positions are located on the inclined surface of the inclined block in the inclined block micrometer.

进一步的,所述位移传感器为接触式传感器,所述位移传感器的检测端抵接所述推动部,所述推动部推动所述测球时的移动方向垂直于所述探针的延伸方向,所述位移传感器的检测方向和所述推动部推动所述测球时的移动方向相同。Further, the displacement sensor is a contact sensor, the detection end of the displacement sensor abuts against the pushing part, and the moving direction of the pushing part when pushing the measuring ball is perpendicular to the extending direction of the probe, so The detecting direction of the displacement sensor is the same as the moving direction when the pushing part pushes the measuring ball.

进一步的,两个所述测试位的连线垂直于所述探针的延伸方向,两个所述测试位至所述探针的距离相同。Further, the connecting line of the two test positions is perpendicular to the extending direction of the probes, and the distances from the two test positions to the probes are the same.

进一步的,所述固定组件包括锁定部和旋转部,所述锁定部连接于所述电触发式软测头,所述旋转部连接于所述锁定部,用于驱动所述锁定部带动所述电触发式软测头旋转,所述旋转部的转动轴线和所述探针的轴线重合。Further, the fixing assembly includes a locking part and a rotating part, the locking part is connected to the electric trigger soft probe, the rotating part is connected to the locking part, and is used to drive the locking part to drive the The electric trigger type soft measuring head rotates, and the rotation axis of the rotating part coincides with the axis of the probe.

进一步的,所述固定组件还包括两个磁性表座,两个所述磁性表座分别连接两个所述位移传感器。Further, the fixing assembly further includes two magnetic watch bases, and the two magnetic watch bases are respectively connected to the two displacement sensors.

进一步的,所述固定组件还包括工作台,所述测试模拟组件、所述旋转部和所述磁性表座均连接于所述工作台上。Further, the fixed assembly further includes a workbench, and the test simulation assembly, the rotating part and the magnetic watch base are all connected to the workbench.

第二方面,本发明还提供一种电触发式软测头标定方法,使用上述任一电触发式软测头标定装置,包括:In the second aspect, the present invention also provides an electric trigger type soft probe calibration method, using any of the above electric trigger type soft probe calibration devices, including:

步骤一、使用所述推动部推动所述测球,并获取所述推动部上的两个测试位的位移量,复位所述推动部;Step 1. Use the pushing part to push the measuring ball, obtain the displacement of the two test positions on the pushing part, and reset the pushing part;

步骤二、重复进行多次所述步骤一,得到一组所述位移量;Step 2, repeating the step 1 multiple times to obtain a set of displacements;

步骤三、调整所述电触发式软测头的位姿,重复进行所述步骤二,得到多组所述位移量;Step 3, adjusting the pose of the electric trigger type soft probe, repeating the step 2 to obtain multiple sets of displacements;

步骤四、根据多组所述位移量,得到标定参数;Step 4. Obtain calibration parameters according to multiple sets of displacements;

步骤五、根据所述标定参数,对所述电触发式软测头进行标定。Step 5: Calibrate the electric trigger type soft probe according to the calibration parameters.

进一步的,所述调整所述电触发式软测头的位姿,包括:Further, the adjustment of the pose of the electric trigger soft probe includes:

沿所述探针的轴线转动所述电触发式软测头,直至所述电触发式软测头达到设定位置。Rotate the electric trigger type soft probe along the axis of the probe until the electric trigger type soft probe reaches the set position.

进一步的,所述位移量为所述测试位沿所述推动部运动方向上的位移,所述标定参数包括预行程量、触发稳定性参数和整体稳定参数。Further, the displacement is the displacement of the test position along the moving direction of the pushing part, and the calibration parameters include pre-travel, trigger stability parameters and overall stability parameters.

本发明提供的一种电触发式软测头标定装置及标定方法,其通过固定组件固定待测量的电触发式软测头,使用测试模拟组件对电触发式软测头进行测试,其通过推动部模拟出被测量物体的运动,推动部上有与其一同运动的两个测试位,通过位移传感器对两个测试位的位移进行检测,计算两个位移传感器的测试结果便可以完成对电触发式软测头的标定。相比于现有技术,本发明中的测试位可以反映出推动部的转动情况,并且两个测试位分别设置于于探针的两侧以最大化的消除推动部转动产生的误差,最大化的消除了阿贝误差对标定结果的影响,使得标定结果更加准确。The invention provides an electric trigger type soft probe calibration device and a calibration method, which fixes the electric trigger type soft probe to be measured through a fixing component, uses a test simulation component to test the electric trigger type soft probe, and pushes the The part simulates the movement of the object to be measured, and there are two test positions that move with it on the push part. The displacement of the two test positions is detected by the displacement sensor, and the electric trigger type can be completed by calculating the test results of the two displacement sensors. Calibration of soft probes. Compared with the prior art, the test position in the present invention can reflect the rotation of the pushing part, and the two test positions are respectively arranged on both sides of the probe to maximize the elimination of the error caused by the rotation of the pushing part and maximize the Eliminate the influence of Abbe error on the calibration results, making the calibration results more accurate.

附图说明Description of drawings

图1为本发明提供的电触发式软测头标定装置一实施例的结构示意图;Fig. 1 is the structural schematic diagram of an embodiment of the electric trigger type soft probe calibration device provided by the present invention;

图2为本发明提供的电触发式软测头标定方法一实施例的方法流程图;Fig. 2 is a method flow chart of an embodiment of an electric trigger type soft probe calibration method provided by the present invention;

图3为本发明提供的电触发式软测头标定装置在检测时的结构示意图。Fig. 3 is a schematic diagram of the structure of the electric trigger type soft probe calibration device provided by the present invention during detection.

具体实施方式Detailed ways

下面结合附图来具体描述本发明的优选实施例,其中,附图构成本申请一部分,并与本发明的实施例一起用于阐释本发明的原理,并非用于限定本发明的范围。Preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of the application and together with the embodiments of the present invention are used to explain the principle of the present invention and are not intended to limit the scope of the present invention.

在本申请的描述中,“多个”的含义是两个或两个以上,除非另有明确具体的限定。In the description of the present application, "plurality" means two or more, unless otherwise specifically defined.

在本文中提及“实施例”意味着,结合实施例描述的特定特征、结构或特性可以包含在本发明的至少一个实施例中。在说明书中的各个位置出现该短语并不一定均是指相同的实施例,也不是与其它实施例互斥的独立的或备选的实施例。本领域技术人员显式地和隐式地理解的是,本文所描述的实施例可以与其它实施例相结合。Reference herein to an "embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the present invention. The occurrences of this phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is understood explicitly and implicitly by those skilled in the art that the embodiments described herein can be combined with other embodiments.

触发式测头是一种用于检测机床或一些其他物品运动的装置,其工作原理大致为:在测头内部有一个闭合的有源电路,该电路与一个特殊的触发机构相连接,只要触发机构产生触发动作,就会引起电路状态变化并发出声光信号,指示测头的工作状态。触发机构产生触发动作的唯一条件是测头的探针产生微小的摆动或向测头内部移动,当测头连接在机床主轴上并随主轴移动时,只要测针上的测球在任意方向与工件(任何固体材料)表面接触,使测针产生微小的摆动或移动,都会立即导致测头产生声光信号,指明其工作状态。The trigger probe is a device used to detect the movement of machine tools or some other objects. Its working principle is roughly as follows: there is a closed active circuit inside the probe, which is connected with a special trigger mechanism. When the mechanism produces a trigger action, it will cause a change in the state of the circuit and send out an audible and visual signal to indicate the working status of the probe. The only condition for the trigger mechanism to trigger action is that the stylus of the stylus swings slightly or moves toward the inside of the stylus. The surface contact of the workpiece (any solid material) will cause the stylus to vibrate or move slightly, which will immediately cause the probe to generate sound and light signals, indicating its working status.

从测球碰触被测工件表面开始到传感器产生电信号的过程中,测头与被测工件间有一定的相对位移,由此产生的测量误差被称作“预行程误差”,电触发式软测头最主要的误差来源即不同触发角度下的预行程量。因此,对电触发式软测头各触发角度下的预行程量进行标定测试,确定一种电触发式软测头在位测量误差补偿方法。During the process from when the measuring ball touches the surface of the workpiece to be measured to when the sensor generates electrical signals, there is a certain relative displacement between the probe and the workpiece to be measured, and the resulting measurement error is called "pre-travel error". The main error source of the soft probe is the pre-travel amount under different trigger angles. Therefore, the pre-travel amount of the electric trigger soft probe under each trigger angle is calibrated and tested to determine a compensation method for the in-position measurement error of the electric trigger soft probe.

但是现有的标定方法均没有考虑阿贝误差的影响,使得标定结果不够准确,阿贝误差是指测量仪器的轴线与待测工件的轴线须在同一直线上,否则即产生误差,此误差称为阿贝误差。在电触发式软测头的标定过程中,因无法保证用于触发电触发式软测头的部件仅作直线运动,其通常会发生微小的旋转,使得在标定过程中,阿贝误差的产生不可避免。However, the existing calibration methods do not consider the influence of the Abbe error, which makes the calibration results not accurate enough. The Abbe error means that the axis of the measuring instrument and the axis of the workpiece to be measured must be on the same straight line, otherwise an error will occur. This error is called is the Abbe error. During the calibration process of the electric trigger soft probe, because it cannot be guaranteed that the parts used to trigger the electric trigger soft probe can only move in a straight line, it usually rotates slightly, so that the Abbe error occurs during the calibration process. inevitable.

本发明中采用如下方式以消除阿贝误差:Adopt following mode in the present invention to eliminate Abbe's error:

本发明提供了一种电触发式软测头标定装置及标定方法,以下分别进行说明。The present invention provides a calibration device and a calibration method for an electric trigger type soft probe, which will be described respectively below.

结合图1所示,本发明的一个具体实施例,公开了一种电触发式软测头标定装置,用于对电触发式软测头100进行标定,所述电触发式软测头100包括探针101和测球102,所述测球102安装于所述探针101末端。本电触发式软测头标定装置包括固定组件1、测试模拟组件2和位移传感器3。其中固定组件1连接并固定所述电触发式软测头100,测试模拟组件2连接于所述固定组件1,所述测试模拟组件2包括可移动的推动部21,所述推动部21抵接所述测球102,所述推动部21上形成有两个测试位,两个所述测试位分别位于所述探针101的两侧。位移传感器3的数量为两个,两个所述位移传感器3均连接于所述固定组件1,分别用于检测两个所述测试位的位移。As shown in FIG. 1 , a specific embodiment of the present invention discloses an electric trigger type soft probe calibration device for calibrating an electric trigger type soft probe 100 . The electric trigger type soft probe 100 includes A probe 101 and a measuring ball 102 , the measuring ball 102 is installed at the end of the probe 101 . The electrical trigger type soft probe calibration device includes a fixed component 1 , a test simulation component 2 and a displacement sensor 3 . Wherein the fixed component 1 is connected and fixed to the electric trigger type soft probe 100, the test simulation component 2 is connected to the fixed component 1, and the test simulation component 2 includes a movable pushing part 21, and the pushing part 21 abuts against The measuring ball 102 and the pushing part 21 are formed with two test positions, and the two test positions are respectively located on two sides of the probe 101 . There are two displacement sensors 3, and the two displacement sensors 3 are both connected to the fixing assembly 1, and are respectively used to detect the displacement of the two test positions.

本发明提供的一种电触发式软测头标定装置及标定方法,其通过固定组件1固定待测量的电触发式软测头100,使用测试模拟组件2对电触发式软测头100进行测试,其通过推动部21模拟出被测量物体的运动,推动部21上有与其一同运动的两个测试位,通过位移传感器3对两个测试位的位移进行检测,计算两个位移传感器3的测试结果便可以完成对电触发式软测头100的标定。相比于现有技术,本发明中的测试位可以反映出推动部21的转动情况,并且两个测试位分别设置于于探针101的两侧以最大化的消除推动部21转动产生的误差,最大化的消除了阿贝误差对标定结果的影响,使得标定结果更加准确。The present invention provides an electric trigger type soft probe calibration device and calibration method, which fixes the electric trigger type soft probe 100 to be measured through the fixing component 1, and uses the test simulation component 2 to test the electric trigger type soft probe 100 , which simulates the movement of the object to be measured through the pusher 21. There are two test positions moving with it on the pusher 21. The displacement of the two test positions is detected by the displacement sensor 3, and the test of the two displacement sensors 3 is calculated. As a result, the calibration of the electric trigger soft probe 100 can be completed. Compared with the prior art, the test position in the present invention can reflect the rotation of the pushing part 21, and the two test positions are respectively arranged on both sides of the probe 101 to maximize the elimination of the error caused by the rotation of the pushing part 21 , which maximizes the elimination of the influence of the Abbe error on the calibration results, making the calibration results more accurate.

作为优选的实施例,本实施例中的电触发式软测头标定装置中的所述固定组件1包括锁定部11和旋转部12,所述锁定部11连接于所述电触发式软测头100,所述旋转部12连接于所述锁定部11,用于驱动所述锁定部11带动所述电触发式软测头100旋转,所述旋转部12的转动轴线和所述探针101的轴线重合。锁定部11用于将电触发式软测头100固定,旋转部12则用于调整电触发式软测头100的位姿,以进行全面的检测。本实施例中锁定部11为锁刀座,旋转部12为R-轴旋转平台,实际中也可以使用其他能够实现上述功能的零件替代。As a preferred embodiment, the fixing assembly 1 in the electric trigger soft probe calibration device in this embodiment includes a locking part 11 and a rotating part 12, and the locking part 11 is connected to the electric trigger soft probe 100, the rotating part 12 is connected to the locking part 11, and is used to drive the locking part 11 to drive the electric trigger soft probe 100 to rotate, the rotation axis of the rotating part 12 and the probe 101 The axes coincide. The locking part 11 is used to fix the electric trigger soft probe 100 , and the rotating part 12 is used to adjust the pose of the electric trigger soft probe 100 for comprehensive detection. In this embodiment, the locking part 11 is a knife lock seat, and the rotating part 12 is an R-axis rotating platform. In practice, other parts that can realize the above functions can also be used instead.

进一步地,本实施例中的所述固定组件1还包括两个磁性表座13,两个所述磁性表座13分别连接两个所述位移传感器3。磁性表座13也称万向表座是机器制造业用途最多,广泛适用于各类机床,也是必不可少的检测工具之一,同时还应用于各种科学研究中。根据位移传感器3的种类不同,也可以采用其他零件固定位移传感器3。Further, the fixing assembly 1 in this embodiment further includes two magnetic watch bases 13 , and the two magnetic watch bases 13 are respectively connected to the two displacement sensors 3 . Magnetic table base 13, also known as universal table base, is the most used in the machine manufacturing industry and is widely used in various machine tools. It is also one of the indispensable testing tools and is also used in various scientific researches. According to the different types of the displacement sensor 3, other parts can also be used to fix the displacement sensor 3.

本实施例中的所述固定组件1还包括工作台14,所述测试模拟组件2、所述旋转部12和所述磁性表座13均连接于所述工作台14上,起到承载其他零件的作用。The fixed assembly 1 in this embodiment also includes a workbench 14, and the test simulation assembly 2, the rotating part 12 and the magnetic table base 13 are all connected to the workbench 14 to carry other parts role.

作为优选的实施例,本实施例中的所述测试模拟组件2包括斜块式测微仪,所述斜块式测微仪的斜块即为所述推动部21,所述斜块式测微仪中斜块的倾斜面抵接所述测球102,两个所述测试位均位于所述斜块式测微仪中斜块的倾斜面上。斜块式测微仪可以模拟出微小的移动,即旋转其手柄时,斜块式测微仪中的斜块会沿图1中的x轴方向移动,因其与测球102接触的表面倾斜,使得测球102可以沿图1中的y轴方向移动,通过斜块表面的倾斜比例,便可以将斜块沿y轴方向的大位移转换成沿x轴方向的小位移,实现精确控制。As a preferred embodiment, the test simulation component 2 in this embodiment includes an inclined block micrometer, the inclined block of the inclined block micrometer is the pushing part 21, and the inclined block type micrometer The inclined surface of the inclined block in the micrometer abuts against the measuring ball 102, and the two test positions are located on the inclined surface of the inclined block in the inclined block micrometer. The inclined block micrometer can simulate a small movement, that is, when its handle is rotated, the inclined block in the inclined block micrometer will move along the x-axis direction in Figure 1, because the surface in contact with the measuring ball 102 is inclined , so that the measuring ball 102 can move along the y-axis direction in FIG. 1 , and the large displacement of the slanting block along the y-axis direction can be converted into a small displacement along the x-axis direction through the inclination ratio of the surface of the slanting block to realize precise control.

测试位即位于斜块中和测球102接触的表面上,位于探针101两侧的可视为点位的两个微小区域,其跟随推动部21一同运动,当推动部21发生微小旋转时,两个测试位的位移量便会反映出推动部21的旋转情况,以及与探针101之间的阿贝误差。实际中测试位也可以为推动部21上的其他位置,仅需能够跟随推动部21一同运动,并且能够被位移传感器3检测出位移即可。The test position is located on the surface of the inclined block in contact with the measuring ball 102, two tiny areas on both sides of the probe 101 that can be regarded as points, which move together with the pushing part 21, when the pushing part 21 rotates slightly , the displacement of the two test positions will reflect the rotation of the pushing part 21 and the Abbe error with the probe 101 . In practice, the test position can also be other positions on the pushing part 21 , it only needs to be able to move together with the pushing part 21 and be able to be detected by the displacement sensor 3 .

作为优选的实施例,本实施例中的两个所述测试位的连线垂直于所述探针101的延伸方向,两个所述测试位至所述探针101的距离相同。因本实施例中选用斜块式测微仪作为模拟运动的工件,其主要会在图1中的yoz平面内发生转动,所以采用上述设计方式可以方便后续的计算,在消除误差的计算过程中更加简便。实际中两个测试位的具体设置位置可以根据推动部21发生偏转误差的方向进行调整。As a preferred embodiment, the connecting line of the two test positions in this embodiment is perpendicular to the extension direction of the probe 101 , and the distances from the two test positions to the probe 101 are the same. Because the oblique block micrometer is selected as the workpiece for simulating movement in this embodiment, it mainly rotates in the yoz plane in Fig. 1, so adopting the above-mentioned design method can facilitate subsequent calculations, and in the calculation process of eliminating errors Easier. In practice, the specific setting positions of the two test positions can be adjusted according to the direction of the deflection error of the pushing part 21 .

作为优选的实施例,本实施例中的所述位移传感器3为接触式传感器,所述位移传感器3的检测端抵接所述推动部21,所述推动部21推动所述测球102时的移动方向垂直于所述探针101的延伸方向,所述位移传感器3的检测方向和所述推动部21推动所述测球102时的移动方向相同。同样地,本实施例中位移传感器3的探测方向也能够方便后续的计算。As a preferred embodiment, the displacement sensor 3 in this embodiment is a contact sensor, the detecting end of the displacement sensor 3 abuts against the pushing part 21, and when the pushing part 21 pushes the measuring ball 102, the The moving direction is perpendicular to the extending direction of the probe 101 , and the detecting direction of the displacement sensor 3 is the same as the moving direction when the pushing part 21 pushes the measuring ball 102 . Likewise, the detection direction of the displacement sensor 3 in this embodiment can also facilitate subsequent calculations.

结合图2所示,本发明还提供一种电触发式软测头标定方法,该方法使用上述实施例中的电触发式软测头标定装置,包括:As shown in Fig. 2, the present invention also provides an electric trigger type soft probe calibration method, which uses the electric trigger type soft probe calibration device in the above embodiment, including:

S201、使用所述推动部21推动所述测球102,获取所述推动部21上的两个测试位的位移量,复位所述推动部21;S201. Use the pushing part 21 to push the measuring ball 102, obtain the displacement of the two test positions on the pushing part 21, and reset the pushing part 21;

S202、重复进行多次所述步骤S201,得到一组所述位移量;S202, repeating the step S201 multiple times to obtain a set of displacements;

S203、调整所述电触发式软测头100的位姿,重复进行所述步骤S202,得到多组所述位移量;S203, adjusting the pose of the electric trigger type soft probe 100, repeating the step S202 to obtain multiple sets of displacements;

S204、根据多组所述位移量,得到标定参数;S204. Obtain calibration parameters according to multiple sets of displacements;

S205、根据所述标定参数,对所述电触发式软测头100进行标定。S205. Calibrate the electric trigger type soft probe 100 according to the calibration parameters.

该方法所取得的技术效果可参见上文实施例,此处将不做过多说明。The technical effects achieved by this method can be referred to the above embodiments, and will not be described too much here.

结合图3所示,作为优选的实施例,在本实施例中的步骤S201至步骤S203中,以测球102的圆心作为标定参考原点,以探针101延伸方向为x轴,以位移传感器3的探测方向为y轴建立坐标系,测球102的圆心,即标定参考原点的坐标为Op(Opx,Opy,Opz),设测球102的的球体半径为rp,测球102与斜块式测微仪的接触点的坐标为:As shown in FIG. 3 , as a preferred embodiment, in steps S201 to S203 in this embodiment, the center of the measuring ball 102 is used as the calibration reference origin, the extension direction of the probe 101 is the x-axis, and the displacement sensor 3 The detection direction is the y-axis to establish a coordinate system, the center of the measuring ball 102, that is, the coordinates of the calibration reference origin is O p (O px , O py , O pz ), the radius of the measuring ball 102 is r p , and the measuring ball The coordinates of the contact point between 102 and the inclined block micrometer are:

Figure BDA0003679533580000091
Figure BDA0003679533580000091

式中OTx、OTy、OTz分别为测球102与斜块式测微仪的接触点在x、y、z轴上的坐标。In the formula, O Tx , O Ty , and O Tz are the coordinates on the x, y, and z axes of the contact point between the measuring ball 102 and the inclined block micrometer, respectively.

以两个位移传感器3的测量点为其量程范围的起始点,其位移传感器3与斜块的接触点坐标分别为:Taking the measurement points of the two displacement sensors 3 as the starting point of the range, the coordinates of the contact points between the displacement sensors 3 and the inclined block are respectively:

Figure BDA0003679533580000092
Figure BDA0003679533580000092

式中ASx、ASy、ASz分别为一个位移传感器3与斜块的接触点在x、y、z轴上的坐标,Δz为位移传感器3的测量点与测球102中心之间沿z轴方向的距离;In the formula, A Sx , A Sy , and A Sz are the coordinates on the x, y, and z axes of the contact point between a displacement sensor 3 and the inclined block, and Δz is the distance between the measurement point of the displacement sensor 3 and the center of the measuring ball 102 along the z axis. Axis distance;

Figure BDA0003679533580000093
Figure BDA0003679533580000093

式中BSx、BSy、BSz分别为另一个位移传感器3与斜块的接触点在x、y、z轴上的坐标;In the formula, B Sx , B Sy , and B Sz are the coordinates on the x, y, and z axes of the contact point between the other displacement sensor 3 and the inclined block;

通过调节斜块式测微仪的微分螺杆,使其斜块沿x轴方向运动,与此同时斜块在y轴方向产生一个偏置量Δy,与此同时斜块还会发生围绕x轴的旋转导致阿贝误差的产生,该旋转角度为α。此时两个位移传感器3的读数即为所期望获得的测试位的位移量,可分别表示为:By adjusting the differential screw of the inclined block micrometer, the inclined block moves along the x-axis direction, and at the same time, the inclined block generates an offset Δy in the y-axis direction, and at the same time, the inclined block also produces a movement around the x-axis The Abbe error is caused by the rotation, which is by an angle α. At this moment, the readings of the two displacement sensors 3 are the expected displacement of the test position, which can be expressed as:

Figure BDA0003679533580000094
Figure BDA0003679533580000094

式中

Figure BDA0003679533580000095
分别为两个位移传感器3的读数,具体为当R-轴旋转平台的鼓轮读数为j时,第i次重复执行步骤S202时的读数,Δztanα为测试位与斜块之间与阿贝臂长度相关的差值。In the formula
Figure BDA0003679533580000095
are the readings of the two displacement sensors 3, specifically, when the reading of the drum of the R-axis rotary platform is j, the reading when step S202 is repeated for the ith time, Δztanα is the distance between the test position and the inclined block and the Abbe arm length-dependent difference.

具体地,在步骤S201及步骤S202中,每一次测试后均需要复位斜块式测微仪,已准备进行下一次测试,直至完成n次重复。Specifically, in step S201 and step S202, the inclined block micrometer needs to be reset after each test, and the next test is ready until n repetitions are completed.

在步骤S203中,调整位姿的具体手段为沿所述探针101的轴线转动所述电触发式软测头100,即操作R-轴旋转平台使电触发式软测头100转动,直至所述电触发式软测头100达到设定位置,将设定位置上R-轴旋转平台的鼓轮读数记为j,便可以开始执行步骤S202,执行完毕后便可以继续调整电触发式软测头100至下一个设定位置。当电触发式软测头100旋转360°后,便可以完成本步骤,其中j可以为360°内的多个离散点,其总数量为m。In step S203, the specific means of adjusting the pose is to rotate the electric trigger soft probe 100 along the axis of the probe 101, that is, operate the R-axis rotating platform to rotate the electric trigger soft probe 100 until the When the electric trigger soft measuring head 100 reaches the set position, record the reading of the drum wheel of the R-axis rotating platform at the set position as j, and then start to execute step S202, and continue to adjust the electric trigger soft measuring probe 100 after the execution is completed. Head 100 to the next set position. This step can be completed after the electric trigger soft probe 100 rotates 360°, where j can be a plurality of discrete points within 360°, and the total number thereof is m.

进一步地,在一个优选的实施例中,步骤S204中所得到标定参数包括预行程量μj、触发稳定性参数δj和整体稳定参数δ,具体表示为:Further, in a preferred embodiment, the calibration parameters obtained in step S204 include pre-travel amount μ j , trigger stability parameter δ j and overall stability parameter δ, specifically expressed as:

Figure BDA0003679533580000101
Figure BDA0003679533580000101

Figure BDA0003679533580000102
Figure BDA0003679533580000102

其中预行程量μj表示测球102在同一测试角度j下其偏置矢量的均值,触发稳定性参数δj表示电触发式软测头100在触发角度j下的稳定能力,整体稳定参数δ表示电触发式软测头100整体的问题能力。Wherein the pre-travel amount μ j represents the mean value of the bias vector of the measuring ball 102 under the same test angle j, the trigger stability parameter δ j represents the stability ability of the electric trigger type soft probe 100 under the trigger angle j, and the overall stability parameter δ Indicates the overall problem capability of the electric trigger soft probe 100 .

获取这三个参数后,便可以执行步骤S205,对电触发式软测头100进行标定,具体标定方法为现有技术,本发明中不做过多说明。值得注意的是,上述步骤是通过两个位移传感器3的读数得到了标定参数,而两个位移传感器3的读数值包括了阿贝误差的信息,两个位移传感器3的读数相结合可以最大化的消除阿贝误差对测量数据的影响,这样使得最后得到的标定参数最为准确。After obtaining these three parameters, step S205 can be executed to calibrate the electric trigger type soft probe 100 . The specific calibration method is the prior art, and will not be described too much in the present invention. It is worth noting that the above steps obtain the calibration parameters through the readings of the two displacement sensors 3, and the readings of the two displacement sensors 3 include the information of the Abbe error, and the combination of the readings of the two displacement sensors 3 can maximize Eliminate the influence of Abbe error on the measurement data, so that the final calibration parameters are the most accurate.

在一个优选的实施例中,在执行步骤S201前,先对整个电触发式软测头标定装置机型触发测试,以检测其是否能够正常运行。In a preferred embodiment, before step S201 is performed, a test is first triggered on the entire model of the electric trigger type soft probe calibration device to detect whether it can operate normally.

下面给出通过本方法得到的一组具体实验数据:A set of specific experimental data obtained by this method is given below:

当j=0°,n=6时两个位移传感器3的读数:When j=0°, the readings of the two displacement sensors 3 when n=6:

Figure BDA0003679533580000111
Figure BDA0003679533580000111

当j=120°,n=6时两个位移传感器3的读数:When j=120°, the readings of two displacement sensors 3 when n=6:

Figure BDA0003679533580000112
Figure BDA0003679533580000112

当j=240°,n=6时两个位移传感器3的读数:When j=240°, the readings of two displacement sensors 3 when n=6:

Figure BDA0003679533580000113
Figure BDA0003679533580000113

根据上述数据得到的标定参数:Calibration parameters obtained from the above data:

Figure BDA0003679533580000114
Figure BDA0003679533580000114

本发明提供的一种电触发式软测头标定装置及标定方法,其通过固定组件1固定待测量的电触发式软测头100,使用测试模拟组件2对电触发式软测头100进行测试,其通过推动部21模拟出被测量物体的运动,推动部21上有与其一同运动的两个测试位,通过位移传感器3对两个测试位的位移进行检测,计算两个位移传感器3的测试结果便可以完成对电触发式软测头100的标定。相比于现有技术,本发明中的测试位可以反映出推动部21的转动情况,并且两个测试位分别设置于于探针101的两侧以最大化的消除推动部21转动产生的误差,最大化的消除了阿贝误差对标定结果的影响,使得标定结果更加准确。The present invention provides an electric trigger type soft probe calibration device and calibration method, which fixes the electric trigger type soft probe 100 to be measured through the fixing component 1, and uses the test simulation component 2 to test the electric trigger type soft probe 100 , which simulates the movement of the object to be measured through the pusher 21. There are two test positions moving with it on the pusher 21. The displacement of the two test positions is detected by the displacement sensor 3, and the test of the two displacement sensors 3 is calculated. As a result, the calibration of the electric trigger soft probe 100 can be completed. Compared with the prior art, the test position in the present invention can reflect the rotation of the pushing part 21, and the two test positions are respectively arranged on both sides of the probe 101 to maximize the elimination of the error caused by the rotation of the pushing part 21 , which maximizes the elimination of the influence of the Abbe error on the calibration results, making the calibration results more accurate.

本说明书中各个实施例采用递进的方式描述,每个实施例重点说明的都是与其它实施例的不同之处,各个实施例之间相同或相似部分互相参见即可。Each embodiment in this specification is described in a progressive manner, each embodiment focuses on the difference from other embodiments, and the same or similar parts of each embodiment can be referred to each other.

以上所述,仅为本发明较佳的具体实施方式,但本发明的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本发明揭露的技术范围内,可轻易想到的变化或替换,都应涵盖在本发明的保护范围之内。The above is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any person skilled in the art within the technical scope disclosed in the present invention can easily think of changes or Replacement should be covered within the protection scope of the present invention.

Claims (7)

1. An electric trigger type soft measuring head calibration device is used for calibrating an electric trigger type soft measuring head, the electric trigger type soft measuring head comprises a probe and a measuring ball, and the measuring ball is arranged at the tail end of the probe and is characterized by comprising:
the fixing component is connected with and fixes the electric triggering type soft measuring head;
the test simulation assembly is connected to the fixed assembly and comprises a movable pushing part, the pushing part is abutted against the test ball, two test positions are formed on the pushing part, and the two test positions are respectively located on two sides of the probe; the test simulation assembly comprises a sloping block micrometer, wherein a sloping block of the sloping block micrometer is the pushing part, the inclined surface of the sloping block in the sloping block micrometer is abutted against the measuring ball, two test positions are positioned on the inclined surface of the sloping block in the sloping block micrometer, the connecting line of the two test positions is perpendicular to the extending direction of the probe, and the distances from the two test positions to the probe are the same;
the two displacement sensors are connected to the fixing assembly and are respectively used for detecting the displacement of the two test positions, the displacement sensors are contact type sensors, the detection ends of the displacement sensors are abutted to the pushing portions, the moving direction of the pushing portions when pushing the ball to be tested is perpendicular to the extending direction of the probe, and the detecting direction of the displacement sensors is the same as the moving direction of the pushing portions when pushing the ball to be tested.
2. The device for calibrating an electrically triggered soft measuring head according to claim 1, wherein the fixing assembly comprises a locking part and a rotating part, the locking part is connected to the electrically triggered soft measuring head, the rotating part is connected to the locking part, the locking part is driven to rotate the electrically triggered soft measuring head, and the rotation axis of the rotating part is coincident with the axis of the probe.
3. The device of claim 2, wherein the fixing assembly further comprises two magnetic gauges, and the two magnetic gauges are respectively connected to the two displacement sensors.
4. An electrically triggered soft gauge head calibration apparatus as claimed in claim 3, wherein the fixed assembly further comprises a table to which the test simulation assembly, the rotatable portion and the magnetic gauge stand are all connected.
5. An electric triggering type soft measuring head calibrating method, which uses the electric triggering type soft measuring head calibrating device according to any one of claims 1-4, and is characterized by comprising the following steps:
step one, pushing the ball to be tested by using the pushing part, acquiring displacement amounts of two test positions on the pushing part, and resetting the pushing part;
step two, repeating the step one for a plurality of times to obtain a group of displacement;
step three, adjusting the pose of the electric triggering type soft measuring head, and repeating the step two to obtain a plurality of groups of displacement amounts;
step four, obtaining calibration parameters according to a plurality of groups of displacement quantities;
and fifthly, calibrating the electric triggering type soft measuring head according to the calibration parameters.
6. The method for calibrating an electrically triggered soft probe according to claim 5, wherein said adjusting the pose of the electrically triggered soft probe comprises:
and rotating the electric triggering type soft measuring head along the axis of the probe until the electric triggering type soft measuring head reaches a set position.
7. The method according to claim 6, wherein the displacement is a displacement of the test site along a movement direction of the pushing portion, and the calibration parameters include a pre-stroke amount, a trigger stability parameter, and an overall stability parameter.
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