CN114557136A - 用于辐射源的设备 - Google Patents
用于辐射源的设备 Download PDFInfo
- Publication number
- CN114557136A CN114557136A CN202080072810.1A CN202080072810A CN114557136A CN 114557136 A CN114557136 A CN 114557136A CN 202080072810 A CN202080072810 A CN 202080072810A CN 114557136 A CN114557136 A CN 114557136A
- Authority
- CN
- China
- Prior art keywords
- radiation source
- tin
- containment device
- ceramic material
- collar
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—X-ray radiation generated from plasma
- H05G2/008—X-ray radiation generated from plasma involving a beam of energy, e.g. laser or electron beam in the process of exciting the plasma
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70033—Production of exposure light, i.e. light sources by plasma extreme ultraviolet [EUV] sources
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—X-ray radiation generated from plasma
- H05G2/003—X-ray radiation generated from plasma being produced from a liquid or gas
- H05G2/005—X-ray radiation generated from plasma being produced from a liquid or gas containing a metal as principal radiation generating component
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- X-Ray Techniques (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP19203471.8 | 2019-10-16 | ||
EP19203471 | 2019-10-16 | ||
PCT/EP2020/076092 WO2021073833A1 (en) | 2019-10-16 | 2020-09-18 | Apparatus for use in a radiation source |
Publications (1)
Publication Number | Publication Date |
---|---|
CN114557136A true CN114557136A (zh) | 2022-05-27 |
Family
ID=68290185
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202080072810.1A Pending CN114557136A (zh) | 2019-10-16 | 2020-09-18 | 用于辐射源的设备 |
Country Status (4)
Country | Link |
---|---|
KR (1) | KR20220078612A (ko) |
CN (1) | CN114557136A (ko) |
TW (1) | TW202130224A (ko) |
WO (1) | WO2021073833A1 (ko) |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6972421B2 (en) * | 2000-06-09 | 2005-12-06 | Cymer, Inc. | Extreme ultraviolet light source |
US6714624B2 (en) * | 2001-09-18 | 2004-03-30 | Euv Llc | Discharge source with gas curtain for protecting optics from particles |
US7449703B2 (en) * | 2005-02-25 | 2008-11-11 | Cymer, Inc. | Method and apparatus for EUV plasma source target delivery target material handling |
JP5559562B2 (ja) * | 2009-02-12 | 2014-07-23 | ギガフォトン株式会社 | 極端紫外光光源装置 |
US8748853B2 (en) * | 2011-03-24 | 2014-06-10 | Gigaphoton Inc. | Chamber apparatus |
US10143074B2 (en) * | 2013-08-01 | 2018-11-27 | Gigaphoton Inc. | Filter and target supply apparatus |
WO2017042915A1 (ja) * | 2015-09-09 | 2017-03-16 | ギガフォトン株式会社 | ターゲット収容装置 |
WO2019158492A1 (en) * | 2018-02-13 | 2019-08-22 | Asml Netherlands B.V. | Cleaning a structure surface in an euv chamber |
-
2020
- 2020-09-18 WO PCT/EP2020/076092 patent/WO2021073833A1/en active Application Filing
- 2020-09-18 KR KR1020227012637A patent/KR20220078612A/ko active Search and Examination
- 2020-09-18 CN CN202080072810.1A patent/CN114557136A/zh active Pending
- 2020-10-14 TW TW109135531A patent/TW202130224A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
KR20220078612A (ko) | 2022-06-10 |
TW202130224A (zh) | 2021-08-01 |
WO2021073833A1 (en) | 2021-04-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |