CN114487499A - Photoelectric device test conversion clamp - Google Patents
Photoelectric device test conversion clamp Download PDFInfo
- Publication number
- CN114487499A CN114487499A CN202111669582.9A CN202111669582A CN114487499A CN 114487499 A CN114487499 A CN 114487499A CN 202111669582 A CN202111669582 A CN 202111669582A CN 114487499 A CN114487499 A CN 114487499A
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- China
- Prior art keywords
- tested
- clamp
- upper cover
- cover plate
- interface board
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
Abstract
The invention discloses a photoelectric device test conversion clamp which comprises clamp pins, a lower bottom plate, an intermediate interface plate, a spring piece and an upper cover plate, wherein the clamp pins are arranged on the lower bottom plate; the middle interface board is fixedly arranged on the lower bottom plate and provided with a groove for mounting a device to be tested, the spring piece is fixed at the bottom of the groove, one end of each clamp pin is connected with the spring piece, and the other end of each clamp pin extends to the outside of the lower bottom plate; one end of the upper cover plate is rotatably connected with the middle interface board, the device to be tested is arranged in the groove arranged on the middle interface board, the upper cover plate compresses the device to be tested, the leading-out end of the device to be tested compresses the spring piece, the connection between the device to be tested and the pins of the clamp is realized through the spring piece, the cover plate is provided with an optical window corresponding to the device to be tested, and light emitted by the light source reaches the device to be tested through the optical window. The switching clamp is simple in structure, quick to install, convenient to detach and wide in applicability, can effectively improve the testing efficiency, is high in stability, and can effectively improve the testing yield.
Description
Technical Field
The invention belongs to the technical field of photoelectric device testing, and particularly relates to a photoelectric device testing conversion clamp.
Background
The electrical performance test of the components is essential important test content for component screening test and reliability test for aerospace, and the photoelectric devices have particularity in performance, so that the test in the electrical field and the test in the optical field are realized, and special photoelectric test equipment is mostly adopted in a test realization method. The special equipment has limitation in testing photoelectric special packaging devices.
With the development requirements of spacecrafts, the quality assurance task of photoelectric special packaging devices often appears, for example, a PILL packaged photoelectric device, the test is realized by adopting a mode of developing an external adapter on special equipment at present, and 3 difficulties exist in the process of testing the special packaging devices: (1) because the device is packaged slightly (about 2mm in length and about 1.50mm in diameter of the bottom surface) and the leading-out end of the device is only 0.41mm, the contact of the general adapter is difficult to control, the poor contact is caused in the test, and the test accuracy is poor; (2) the device is small in size, and the mechanical damage of the device is easily caused in the process of testing and clamping the device; (3) because of machining error exists, there is device offset in traditional adapter fixed mode, the device can not the problem of accurate positioning in the adapter.
Disclosure of Invention
The invention aims to overcome the defects and provides a photoelectric device test conversion clamp which comprises clamp pins, a lower bottom plate, a middle interface plate, a spring piece and an upper cover plate, wherein the clamp pins are arranged on the lower bottom plate; the middle interface board is fixedly arranged on the lower bottom plate and provided with a groove for mounting a device to be tested, the spring piece is fixed at the bottom of the groove, one end of each clamp pin is connected with the spring piece, and the other end of each clamp pin extends to the outside of the lower bottom plate; one end of the upper cover plate is rotatably connected with the middle interface board, the device to be tested is arranged in the groove arranged on the middle interface board, the upper cover plate compresses the device to be tested, the leading-out end of the device to be tested compresses the spring leaf, the device to be tested is connected with the pins of the clamp through the spring leaf, the cover plate is provided with an optical window corresponding to the device to be tested, and light emitted by the light source reaches the device to be tested through the optical window. The switching clamp is simple in structure, quick to install, convenient to detach and wide in applicability, can effectively improve the testing efficiency, is high in stability, and can effectively improve the testing yield.
In order to achieve the above purpose, the invention provides the following technical scheme:
a photoelectric device test conversion clamp comprises clamp pins, a lower bottom plate, a middle interface plate, a spring piece and an upper cover plate;
the middle interface board is fixedly arranged on the lower bottom plate, the middle interface board is provided with a groove for mounting a device to be tested, the groove fixes a leading-out end of the device to be tested, the spring piece is fixed at the bottom of the groove, one end of a pin of the clamp is connected with the spring piece, and the other end of the pin extends to the outside of the lower bottom plate;
one end of the upper cover plate is rotatably connected with the middle interface board, the device to be tested is arranged in the groove arranged on the middle interface board, the upper cover plate compresses the device to be tested, meanwhile, the leading-out end of the device to be tested compresses the spring piece, and the device to be tested is connected with the pins of the clamp through the spring piece;
the upper cover plate is provided with an optical window corresponding to the device to be tested, and light emitted by the light source reaches the device to be tested through the optical window.
Furthermore, the other end of the upper cover plate is provided with a buckle, and after the upper cover plate compresses the device to be tested, the middle interface board is clamped through the buckle.
Furthermore, the number of the spring pieces is 2, and the spring pieces are respectively arranged on two sides of the bottom of the groove arranged on the middle interface board.
Further, the size of the optical window is determined according to the light source requirement of the device to be tested.
Further, the middle interface board is fixedly arranged on the lower bottom plate through welding.
Further, the inner diameter of the groove arranged on the middle interface board is 0.15-0.20 mm larger than the diameter of the device to be measured.
Furthermore, one end of the upper cover plate is rotatably connected with the middle interface plate through a hinge.
Furthermore, the photoelectric device test conversion clamp is made of a material resistant to the temperature of-55-125 ℃.
Further, the outer surface of the pin of the clamp is plated with a gold plating layer.
Compared with the prior art, the invention has the following beneficial effects:
(1) according to the photoelectric device testing conversion clamp, the electric connection between the device to be tested and the conversion clamp is realized by utilizing the spring piece, so that on one hand, the stability and the reliability of the electric connection are improved, and the risk of damaging the leading-out end of the device in the assembly process of the conversion clamp is reduced, on the other hand, the spring piece and the leading-out end of the device to be tested form surface contact, the overcurrent protection capability is strong, the use type is wider, and the stability is better;
(2) the switching clamp has the advantages of simple structure, quick installation, convenient disassembly and greatly improved test efficiency; the switching clamp has strong stability and can effectively improve the test yield;
(3) the switching clamp is suitable for testing and switching of photoelectric devices of the same packaging type and different models and specifications, has wide applicability, and can be repeatedly used in different tests and different environments;
(4) the invention can customize the size and depth of the optical window according to the size of the device, is beneficial to reducing the stray light interference and improving the test accuracy;
(5) according to the invention, the upper cover plate is matched with the middle interface board, so that the device to be tested is accurately positioned in the conversion clamp, conditions are provided for automatic testing, and the labor cost is effectively reduced;
(6) the conversion clamp can realize the integration of the requirements of the conversion clamp of test tests such as normal temperature test, aging test, high and low temperature test and the like, thereby effectively reducing the test error brought by the conversion clamp and greatly reducing the cost of test consumables.
Drawings
FIG. 1 is a side view of a photovoltaic device test conversion fixture of the present invention;
FIG. 2 is a bottom view of a test conversion fixture for optoelectronic devices in accordance with the present invention;
FIG. 3 is a top view of a test converting fixture for optoelectronic devices in accordance with the present invention;
FIG. 4 is an overall structure diagram of the photoelectric device test conversion fixture of the present invention;
FIG. 5 is a schematic view of an upper cover plate in the optoelectronic device testing converting fixture of the present invention;
in the figure, 1-clamp pin, 2-lower bottom plate, 3-middle interface plate, 4-spring plate, 5-upper cover plate, 6-optical window, 7-fastener and 8-hinge.
Detailed Description
The features and advantages of the present invention will become more apparent and appreciated from the following detailed description of the invention.
The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration. Any embodiment described herein as "exemplary" is not necessarily to be construed as preferred or advantageous over other embodiments. While the various aspects of the embodiments are presented in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.
Aiming at the problems of the existing test fixture, the invention designs the PILL packaging photoelectric device test conversion fixture, solves the test requirement of the PILL packaging photoelectric device, and greatly improves the efficiency.
The structure of the photoelectric device test conversion clamp of the invention is shown in fig. 1, fig. 2, fig. 3, fig. 4 and fig. 5, and comprises clamp pins 1, a lower base plate 2, a middle interface plate 3, a spring piece 4 and an upper cover plate 5, wherein in a preferred embodiment, the upper cover plate 5 is provided with an optical window 6, one end of the upper cover plate 5 is rotatably connected with the middle interface plate 3 through a hinge 8, and the other end is provided with a buckle 7. The clamp adopts the middle interface board 3 to fix the device to be tested, the leading-out end of the device to be tested is connected with the pin 1 of the clamp through the spring leaf 4, the upper cover plate 5 presses the belt polarity positioning end through the buckle 7 to achieve the functions of fixing the device to be tested and transmitting electric signals, and the device to be tested is loaded into the conversion clamp and then receives and transmits optical signals through the reserved optical window 6. Where B, C, E in fig. 2 indicates the polarity of the device under test.
Specifically, the conversion clamp pin 1 is connected with the lower base plate 2, the middle interface plate 3, the spring piece 4, the upper cover plate 5 and the like to form an integrated conversion structure, the integrated conversion structure is used for connecting a device test clamp with test equipment, the connection is stable and reliable, the device test clamp can be plugged and pulled out at a high frequency, and the gold plating process of the conversion clamp pin 1 enhances the high connection reliability; the lower base plate 2 is a carrier fixedly assembled by the clamp pins 1 and the middle interface plate 3, and marks the state identifier of the conversion clamp to realize the information query visualization of the conversion clamp, as shown in a XXXXXX type in fig. 3. The middle interface board 3 is provided with a groove, a device to be tested is placed in the groove, the groove is used for fixing the position of a leading-out end of the device to be tested, and the size of the middle interface board 4 can be changed according to the size of different devices so as to realize the test of photoelectric devices with various specifications; the middle interface board 3 is welded and assembled with the lower base plate 2, the reliability is higher than that of the traditional screw locking fixing mode, the middle interface board 3 fixes the device to be tested in a relatively small range to ensure that the leading-out end of the device can be well electrically connected with the spring piece 4 to transmit electric signals, the spring piece 4 is arranged on two sides of the bottom of the groove and is an extrusion type spring piece, after the upper cover plate 5 presses the device to be tested, the leading-out end of the device to be tested is electrically connected with the spring piece 4 to complete the electric signal transmission, the mode of connecting the leading-out end of the device to be tested by the spring piece 4 is more stable and reliable than the traditional mode of extruding the leading-out end of the device by the metallized patches on the surfaces of a plurality of substrates with different functions, the risk of damaging the leading-out end of the device in the assembly process of the conversion clamp is reduced, and meanwhile, the spring support is in surface contact with the leading-out end of the device to be tested by the extrusion effect, compared with the traditional point needle type, the contact area is large, the overcurrent protection capability is strong, the use type is wider, and the stability is better. The upper cover plate 5 is used for pressing down a device to be tested, one end of the upper cover plate 5 is rotatably connected with the middle interface board 3 through a hinge 8, the clamping of the device is more convenient, good contact of the device is guaranteed, the other end of the upper cover plate 5 is provided with a buckle 7, the device to be tested is placed into a groove formed in the middle interface board 3, the buckle is pressed and locked to enable the upper cover plate 5 to tightly fasten the middle interface board 3, the fixed installation of the device in the conversion clamp is completed, under the action of the pressure of the upper cover plate 5, the leading-out end of the device to be tested is connected with the clamp pin 1 through the spring piece 4, and therefore the electrical connection of the device to be tested and the conversion clamp is achieved. The diameter and the depth of the optical window 6 are set according to the requirements of a device manual and the light source requirements of device testing, so that the test light source can better meet the testing requirements, and the testing accuracy is improved.
The device to be tested can be fixed only by placing the device to be tested in the groove arranged on the middle interface plate 3 of the test conversion clamp and closing the upper cover plate 5.
In a preferred embodiment, the photoelectric device test conversion clamp adopts a high-low temperature resistant (-55-125 ℃) material, so that the integration of the requirements of test conversion clamps such as a normal temperature test, a burn-in test, a high-low temperature test and the like is realized, the test errors brought by the conversion clamp are effectively reduced, and the cost of test consumables is reduced to a great extent; the whole operation process is simple and safe, good in contact, quick to install and convenient to detach, reliability and stability in the test process are effectively improved by using the conversion clamp, and test efficiency is greatly improved.
The use method of the conversion clamp comprises the following steps:
(1) assembling all parts contained in the conversion clamp in sequence;
(2) the device to be tested is loaded into the groove of the middle interface board 3 downwards according to the direction shown in figure 4;
(3) the upper cover plate 5 is buckled on the middle interface plate 3 according to the direction of an arc arrow shown in figure 4 and is locked by a buckle 7;
(4) the conversion fixture is placed in test equipment to be tested according to requirements.
The invention has been described in detail with reference to specific embodiments and illustrative examples, but the description is not intended to be construed in a limiting sense. Those skilled in the art will appreciate that various equivalent substitutions, modifications or improvements may be made to the technical solution of the present invention and its embodiments without departing from the spirit and scope of the present invention, which fall within the scope of the present invention. The scope of the invention is defined by the appended claims.
Those skilled in the art will appreciate that those matters not described in detail in the present specification are well known in the art.
Claims (9)
1. A photoelectric device test conversion clamp is characterized by comprising clamp pins (1), a lower bottom plate (2), a middle interface plate (3), a spring piece (4) and an upper cover plate (5);
the middle interface board (3) is fixedly arranged on the lower bottom plate (2), the middle interface board (3) is provided with a groove for mounting a device to be tested, the spring piece (4) is fixed at the bottom of the groove, one end of each clamp pin (1) is connected with the spring piece (4), and the other end of each clamp pin extends to the outside of the lower bottom plate (2);
one end of an upper cover plate (5) is rotatably connected with the middle interface board (3), a device to be tested is placed in a groove arranged on the middle interface board (3), the upper cover plate (5) presses the device to be tested, meanwhile, a leading-out end of the device to be tested presses a spring piece (4), and the device to be tested is connected with the clamp pins (1) through the spring piece (4);
the upper cover plate (5) is provided with an optical window (6) corresponding to the device to be tested, and light emitted by the light source reaches the device to be tested through the optical window (6).
2. The photoelectric device testing conversion clamp according to claim 1, wherein a buckle (7) is arranged at the other end of the upper cover plate (5), and after the upper cover plate (5) presses the device to be tested, the middle interface plate (3) is clamped by the buckle (7).
3. The photoelectric device testing conversion clamp according to claim 1, wherein the number of the spring pieces (4) is 2, and the spring pieces are respectively arranged on two sides of the bottom of the groove arranged on the middle interface board (3).
4. An optoelectronic device testing converting fixture according to claim 1, characterized in that said optical window (6) is dimensioned according to the light source requirements of the device under test.
5. The photoelectric device testing conversion fixture as claimed in claim 1, wherein the intermediate interface board (3) is fixedly mounted on the lower base plate (2) by welding.
6. The photoelectric device testing conversion clamp according to claim 1, wherein the inner diameter of the groove formed on the middle interface board (3) is 0.15-0.20 mm larger than the diameter of the device to be tested.
7. The photoelectric device testing conversion clamp according to claim 1, wherein one end of the upper cover plate (5) is rotatably connected with the intermediate interface plate (3) by a hinge (8).
8. The photoelectric device testing conversion clamp of claim 1, wherein the clamp is made of a material resistant to a temperature of-55 ℃ to 125 ℃.
9. The optoelectronic device test converting fixture of claim 1, wherein the fixture pins (1) are gold plated on their outer surfaces.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111669582.9A CN114487499A (en) | 2021-12-31 | 2021-12-31 | Photoelectric device test conversion clamp |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111669582.9A CN114487499A (en) | 2021-12-31 | 2021-12-31 | Photoelectric device test conversion clamp |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114487499A true CN114487499A (en) | 2022-05-13 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111669582.9A Pending CN114487499A (en) | 2021-12-31 | 2021-12-31 | Photoelectric device test conversion clamp |
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| Country | Link |
|---|---|
| CN (1) | CN114487499A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115308454A (en) * | 2022-10-10 | 2022-11-08 | 杭州三海电子有限公司 | Resistance clamp for burn-in test and resistance burn-in test system |
-
2021
- 2021-12-31 CN CN202111669582.9A patent/CN114487499A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115308454A (en) * | 2022-10-10 | 2022-11-08 | 杭州三海电子有限公司 | Resistance clamp for burn-in test and resistance burn-in test system |
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