CN219978468U - 30um high-order carrier plate test fixture - Google Patents
30um high-order carrier plate test fixture Download PDFInfo
- Publication number
- CN219978468U CN219978468U CN202321257407.3U CN202321257407U CN219978468U CN 219978468 U CN219978468 U CN 219978468U CN 202321257407 U CN202321257407 U CN 202321257407U CN 219978468 U CN219978468 U CN 219978468U
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- Prior art keywords
- probe
- carrier plate
- order carrier
- test fixture
- slide rail
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- 238000012360 testing method Methods 0.000 title claims abstract description 34
- 239000000523 sample Substances 0.000 claims abstract description 45
- 238000003825 pressing Methods 0.000 claims description 8
- 238000003032 molecular docking Methods 0.000 claims description 7
- 238000005259 measurement Methods 0.000 abstract description 7
- 238000009434 installation Methods 0.000 abstract description 5
- 210000001503 joint Anatomy 0.000 abstract description 5
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 230000007547 defect Effects 0.000 abstract description 2
- 238000013461 design Methods 0.000 abstract description 2
- 230000005611 electricity Effects 0.000 abstract description 2
- 238000004806 packaging method and process Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000000969 carrier Substances 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000012876 carrier material Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 239000010720 hydraulic oil Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012536 packaging technology Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a 30um high-order carrier plate test fixture, which comprises a base, wherein an operation table is arranged at the upper end of the base, and a bracket is arranged at one side of the base; this 30um high order carrier plate test fixture, the mode of traditional test fixture has been broken through in the setting of probe, the testing capability of high order carrier plate has been possessed, and electric connection between follow-up probe and the contactor, and the contactor is connected with electrical measurement equipment, the defect that high order carrier plate can't carry out the electricity measurement has been broken through, thereby the cooperation of first electronic slide rail and second electronic slide rail, can assist the probe to carry out position adjustment, make the probe can be accurate contact with the pin on the high order carrier plate, CCD counterpoint test has been realized, the erroneous test has been reduced, secondly, this product uses linear probe structural design, the manufacturing ability of traditional special test fixture has been improved, promote to 30um by original minimum probe diameter 50um, the threaded rod that sets up on the probe can assist the probe to carry out butt joint installation, the installation of giving the probe convenience.
Description
Technical Field
The utility model relates to the technical field related to a 30um high-order carrier testing jig, in particular to a 30um high-order carrier testing jig.
Background
The IC carrier board is a technology developed along with the continuous progress of semiconductor packaging technology, a novel IC high-density packaging form represented by ball grid array packaging and chip size packaging is developed in the middle of 90 th century, the IC carrier board is developed on the basis of an HDI board as a high-end PCB board, the IC carrier board is also called a packaging substrate, and in the field of high-order packaging, the IC carrier board replaces a traditional lead frame and becomes an indispensable part in chip packaging, so that the IC carrier board not only provides supporting, heat dissipation and protection functions for chips, but also provides electronic connection between the chips and a PCB motherboard, and plays a role in supporting up and down; even passive and active devices can be embedded to realize certain system functions, the ABF carrier is actually one of IC carriers, and is mainly used for high-operation performance ICs such as CPU, GPU, FPGA, ASIC, and along with the advent of the 5G age, network chip manufacturers also begin to use ABF carrier materials on a large scale for the production of routers, base stations and the like, so to speak, the demands of ABF carriers are rising.
In the existing 30um high-order carrier board test fixture, most of the current wire needle fixtures in the market have the minimum technical capability of 50um, and with the continuous development of the printed circuit board test technology, products to be tested are increasingly and more precise, and the 50um probe cannot meet the test requirement of the high-order carrier board, so that the 30um high-order carrier board test fixture is required to be provided.
Disclosure of Invention
The utility model aims to provide a 30um high-order carrier testing jig for solving the problems in the background technology.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides a 30um high order carrier plate test fixture, includes the base, the base upper end is provided with the operation panel, one side of base is provided with the support, one side of support is provided with the fine setting board, the lower extreme of fine setting board is provided with first electronic slide rail, the outer wall swing joint of first electronic slide rail has first slider, the opposite side of first slider is connected with the pneumatic cylinder, the lower extreme of pneumatic cylinder is connected with the connecting plate, the opposite side of connecting plate is provided with the electronic slide rail of second, the outer wall swing joint of second electronic slide rail has the second slider, the lower extreme of second slider is provided with the docking rod, the screw groove has been seted up on the inner wall surface of docking rod, the inner wall swing joint of screw groove has the probe, the upper end of probe is provided with the threaded rod, the upper end of fine setting board is provided with the contactor, the opposite side of base is provided with electrical measurement equipment.
Preferably, the upper end of operation panel is provided with the high order carrier plate, the both sides of operation panel all are provided with the U type frame, one side of U type frame is connected with the connecting rod, the outer wall cover of connecting rod is equipped with the pivot, one side of pivot is provided with the clamp plate.
Preferably, the pressing plate forms a rotary structure through the rotary shaft and the connecting rod, and the size of the inner wall of the rotary shaft is matched with the size of the outer wall of the connecting rod.
Preferably, the hydraulic cylinder forms a sliding structure through the first sliding block and the first electric sliding rail, and the first sliding block and the first electric sliding rail are matched for use.
Preferably, the lifting structure is formed between the connecting plate and the first sliding block through a hydraulic cylinder, and the hydraulic cylinder is symmetrically arranged by the central axis of the first electric sliding rail.
Preferably, the probe forms a sliding structure through the second sliding block and the second electric sliding rail, and the second sliding block and the second electric sliding rail are matched for use.
Preferably, the probe is in threaded connection with the thread groove through a threaded rod, and the threaded rod coincides with the central line of the thread groove.
Compared with the prior art, the utility model has the beneficial effects that:
1. this 30um high order carrier plate test fixture, through first electronic slide rail, first slider, the pneumatic cylinder, the connecting plate, the second electronic slide rail, the second slider, the butt joint pole, the thread groove, the setting of probe and threaded rod, the mode of traditional test fixture has been broken through in the setting of probe, the testing capability of high order carrier plate has been possessed, and electric connection between follow-up probe and the contactor, and the contactor is connected with electrical measurement equipment, the defect that high order carrier plate can't carry out the electricity measurement has been broken through, thereby the cooperation of first electronic slide rail and second electronic slide rail, can assist the probe to carry out position adjustment, make the probe can be accurate contact with the pin on the high order carrier plate, CCD counterpoint test has been realized, the misdetection has been reduced, secondly, the product uses linear probe structural design, traditional special test fixture's manufacturing ability has been improved, promote to 30um by original minimum probe diameter 50um, threaded rod that sets up on the probe can assist the probe carries out butt joint installation, it is convenient to bring for the installation of probe.
Drawings
FIG. 1 is a schematic diagram of the overall structure of the present utility model;
FIG. 2 is a schematic view of the structure of the threaded connection of the present utility model;
FIG. 3 is a schematic view of a rotary mechanism according to the present utility model;
FIG. 4 is a schematic view of a sliding mechanism according to the present utility model;
fig. 5 is an enlarged view of the structure of fig. 4 a in accordance with the present utility model.
In the figure: 1. a base; 2. an operation table; 3. a high-order carrier plate; 4. a U-shaped frame; 5. a connecting rod; 6. a rotating shaft; 7. a pressing plate; 8. a bracket; 9. a fine tuning plate; 10. a first electric slide rail; 11. a first slider; 12. a hydraulic cylinder; 13. a connecting plate; 14. the second electric sliding rail; 15. a second slider; 16. a butt joint rod; 17. a thread groove; 18. a probe; 19. a threaded rod; 20. a contactor; 21. and (5) an electrical measurement device.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-5, the present utility model provides the following technical solutions: the utility model provides a 30um high order carrier plate test fixture, including base 1, base 1 upper end is provided with operation panel 2, one side of base 1 is provided with support 8, one side of support 8 is provided with fine setting board 9, the lower extreme of fine setting board 9 is provided with first electronic slide rail 10, the outer wall swing joint of first electronic slide rail 10 has first slider 11, the opposite side of first slider 11 is connected with pneumatic cylinder 12, the lower extreme of pneumatic cylinder 12 is connected with connecting plate 13, the opposite side of connecting plate 13 is provided with second electronic slide rail 14, the outer wall swing joint of second electronic slide rail 14 has second slider 15, the lower extreme of second slider 15 is provided with docking rod 16, the screw groove 17 has been seted up to docking rod 16's inner wall surface, screw groove 17's inner wall swing joint has probe 18, the upper end of probe 18 is provided with threaded rod 19, the upper end of fine setting board 9 is provided with contactor 20, the opposite side of base 1 is provided with electrical measurement equipment 21.
In this embodiment, the upper end of the operation table 2 is provided with a high-order carrier plate 3, one side of the operation table 2, which is provided with a U-shaped frame 4,U type frame 4, is connected with a connecting rod 5, the outer wall of the connecting rod 5 is sleeved with a rotating shaft 6, one side of the rotating shaft 6 is provided with a pressing plate 7, and the rotating shaft 6 is matched with the setting of the connecting rod 5 to rotate.
In this embodiment, the pressing plate 7 forms a rotating structure between the rotating shaft 6 and the connecting rod 5, the inner wall size of the rotating shaft 6 is identical to the outer wall size of the connecting rod 5, and the pressing plate 7 can be driven to fix the high-order carrier plate 3 through the arrangement of the rotating shaft 6, so that the high-order carrier plate 3 is prevented from sliding in the testing process.
In this embodiment, the hydraulic cylinder 12 forms a sliding structure between the first slider 11 and the first electric sliding rail 10, and the first slider 11 and the first electric sliding rail 10 are matched for use, and the probe 18 can be driven to perform longitudinal adjustment through the arrangement of the first slider 11 and the first electric sliding rail 10, so that the probe 18 can be accurately adjusted to the pin position of the high-order carrier plate 3.
In this embodiment, the connecting plate 13 forms a lifting structure between the hydraulic cylinder 12 and the first slider 11, the hydraulic cylinder 12 is symmetrically arranged with the central axis of the first electric sliding rail 10, and the positions of the probe 18 and the pins on the high-order carrier plate 3 can be adjusted in the process of detecting the high-order carrier plate 3 through the arrangement of the hydraulic cylinder 12.
In this embodiment, the probe 18 forms a sliding structure with the second electric sliding rail 14 through the second sliding block 15, and the second sliding block 15 and the second electric sliding rail 14 are matched for use, and the probe 18 can be driven to perform lateral movement adjustment through the arrangement of the second sliding block 15 and the second electric sliding rail 14.
In this embodiment, the probe 18 is in threaded connection with the thread groove 17 through the threaded rod 19, the center lines of the threaded rod 19 and the thread groove 17 coincide, and the installation between the probe 18 and the butt joint rod 16 can be assisted through the arrangement of the threaded rod 19 and the thread groove 17, so that the use of the probe 18 in the later stage is facilitated.
Working principle: firstly, moving the whole jig to a designated position, switching on an external power supply of the jig, secondly, placing a higher-order carrier plate 3 at the upper end of an operation table 2, then fixing the higher-order carrier plate 3 by rotating a rotating shaft 6, after the higher-order carrier plate 3 is fixed, simultaneously opening a switch of a first electric slide rail 10 and a switch of a second electric slide rail 14, enabling the first electric slide rail 10 and the second electric slide rail 14 to drive a first slide block 11 and a second slide block 15 to carry out position adjustment of a probe 18 on the lower end probe 18 according to the position of a pin on the higher-order carrier plate 3, closing the switch of the first electric slide rail 10 and the second electric slide rail 14 after the four probes 18 are all adjusted to the position on the pin on the higher-order carrier plate 3, then, electrically connecting the probe 18 with the contactor 20 so as to open a switch of the contactor 20, then electrically connecting the other end of a copper wire passing through the contactor 20 with the electrical measuring equipment 21, then opening a power switch of the electrical measuring equipment 21, then opening a switch of the hydraulic cylinder 12, driving a power source of the hydraulic pump, pressing hydraulic oil into the hydraulic cylinder 12 to enable the hydraulic cylinder 12 to drive the probe 18 to descend, testing the high-order carrier plate 3 when the probe 18 contacts with a pin on the high-order carrier plate 3, transmitting tested data to the electrical measuring equipment 21, facilitating later observation, and finally cutting off the power switch of the device when the device is not used, wherein the types of the first electric sliding rail 10 and the second electric sliding rail 14 are as follows: PXC175, hydraulic cylinder 12 model: SXTL, type of contactor 20 is: CJX2, model of electrical testing equipment 21 is: RK2670AM, thus the use process of a 30um high-order carrier testing jig is completed.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (7)
1. A30 um high-order carrier board test fixture, its characterized in that: including base (1), base (1) upper end is provided with operation panel (2), one side of base (1) is provided with support (8), one side of support (8) is provided with fine setting board (9), the lower extreme of fine setting board (9) is provided with first electronic slide rail (10), the outer wall swing joint of first electronic slide rail (10) has first slider (11), the opposite side of first slider (11) is connected with pneumatic cylinder (12), the lower extreme of pneumatic cylinder (12) is connected with connecting plate (13), the opposite side of connecting plate (13) is provided with second electronic slide rail (14), the outer wall swing joint of second electronic slide rail (14) has second slider (15), the lower extreme of second slider (15) is provided with docking rod (16), thread groove (17) have been seted up to the inner wall surface of docking rod (16), the inner wall swing joint of thread groove (17) has probe (18), the opposite side of probe (18) is provided with threaded rod (19), the opposite side of docking rod (9) is provided with second electronic slide rail (20), the equipment (21) is provided with to contact.
2. The 30um high-order carrier plate test fixture according to claim 1, wherein the upper end of the operation table (2) is provided with a high-order carrier plate (3), both sides of the operation table (2) are provided with U-shaped frames (4), one side of each U-shaped frame (4) is connected with a connecting rod (5), a rotating shaft (6) is sleeved on the outer wall of each connecting rod (5), and one side of each rotating shaft (6) is provided with a pressing plate (7).
3. The 30um high-order carrier plate test fixture according to claim 2, wherein the pressing plate (7) forms a rotating structure with the connecting rod (5) through a rotating shaft (6), and the inner wall size of the rotating shaft (6) is matched with the outer wall size of the connecting rod (5).
4. The 30um high-order carrier plate testing jig according to claim 1, wherein the hydraulic cylinder (12) forms a sliding structure with the first electric sliding rail (10) through a first sliding block (11), and the first sliding block (11) is matched with the first electric sliding rail (10).
5. The 30um high-order carrier plate test fixture according to claim 1, wherein the connecting plate (13) forms a lifting structure between the hydraulic cylinder (12) and the first sliding block (11), and the hydraulic cylinder (12) is symmetrically arranged by a central axis of the first electric sliding rail (10).
6. The 30um high-order carrier board test fixture according to claim 1, wherein the probe (18) forms a sliding structure with the second electric sliding rail (14) through the second sliding block (15), and the second sliding block (15) is matched with the second electric sliding rail (14).
7. The 30um high-order carrier plate testing jig according to claim 1, wherein the probe (18) is in threaded connection with the thread groove (17) through a threaded rod (19), and the threaded rod (19) coincides with the central line of the thread groove (17).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321257407.3U CN219978468U (en) | 2023-05-23 | 2023-05-23 | 30um high-order carrier plate test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321257407.3U CN219978468U (en) | 2023-05-23 | 2023-05-23 | 30um high-order carrier plate test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219978468U true CN219978468U (en) | 2023-11-07 |
Family
ID=88587117
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321257407.3U Active CN219978468U (en) | 2023-05-23 | 2023-05-23 | 30um high-order carrier plate test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219978468U (en) |
-
2023
- 2023-05-23 CN CN202321257407.3U patent/CN219978468U/en active Active
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| Date | Code | Title | Description |
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| GR01 | Patent grant | ||
| GR01 | Patent grant |