CN114690022A - Universal automatic testing device for radio frequency probe - Google Patents

Universal automatic testing device for radio frequency probe Download PDF

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Publication number
CN114690022A
CN114690022A CN202210157599.4A CN202210157599A CN114690022A CN 114690022 A CN114690022 A CN 114690022A CN 202210157599 A CN202210157599 A CN 202210157599A CN 114690022 A CN114690022 A CN 114690022A
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CN
China
Prior art keywords
probe
testing
plate
radio frequency
jacking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202210157599.4A
Other languages
Chinese (zh)
Inventor
韩静文
吴立丰
孙磊磊
庞克俭
常青松
张恒晨
冯涛
孙佳林
刘侃
赵华
张卫青
杨阳阳
杨庆团
张立康
高燕
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CETC 13 Research Institute
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CETC 13 Research Institute
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CETC 13 Research Institute filed Critical CETC 13 Research Institute
Priority to CN202210157599.4A priority Critical patent/CN114690022A/en
Publication of CN114690022A publication Critical patent/CN114690022A/en
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G15/00—Conveyors having endless load-conveying surfaces, i.e. belts and like continuous members, to which tractive effort is transmitted by means other than endless driving elements of similar configuration
    • B65G15/10—Conveyors having endless load-conveying surfaces, i.e. belts and like continuous members, to which tractive effort is transmitted by means other than endless driving elements of similar configuration comprising two or more co-operating endless surfaces with parallel longitudinal axes, or a multiplicity of parallel elements, e.g. ropes defining an endless surface
    • B65G15/12—Conveyors having endless load-conveying surfaces, i.e. belts and like continuous members, to which tractive effort is transmitted by means other than endless driving elements of similar configuration comprising two or more co-operating endless surfaces with parallel longitudinal axes, or a multiplicity of parallel elements, e.g. ropes defining an endless surface with two or more endless belts
    • B65G15/20—Conveyors having endless load-conveying surfaces, i.e. belts and like continuous members, to which tractive effort is transmitted by means other than endless driving elements of similar configuration comprising two or more co-operating endless surfaces with parallel longitudinal axes, or a multiplicity of parallel elements, e.g. ropes defining an endless surface with two or more endless belts arranged side by side, e.g. for conveyance of flat articles in vertical position
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G23/00—Driving gear for endless conveyors; Belt- or chain-tensioning arrangements
    • B65G23/24—Gearing between driving motor and belt- or chain-engaging elements
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G41/00—Supporting frames or bases for conveyors as a whole, e.g. transportable conveyor frames
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors

Abstract

The invention provides a universal automatic testing device for radio frequency probes, which belongs to the technical field of automatic testing of microwave TR (transmitter-receiver) components and comprises a fixed substrate, a direct-drive module, a conveying mechanism, a testing clamp, a lifting mechanism and a probe testing mechanism. The direct-drive module is arranged above the fixed substrate and used for driving the conveying mechanism arranged on the direct-drive module to perform linear motion; the conveying mechanism can drive the test fixture to carry out linear transportation, and the microwave TR component to be tested and the PCB test board for conversion are arranged in the test fixture; the fixed base plate is also provided with a lifting mechanism which is used for driving the probe testing mechanism to carry out vertical lifting movement; the probe testing mechanism is provided with a plurality of groups of radio frequency probes and signal probes. The universal automatic testing device for the radio frequency probe can realize the testing of various microwave TR components, replaces manual work to realize automatic testing, and has strong universality and high efficiency.

Description

Universal automatic testing device for radio frequency probe
Technical Field
The invention belongs to the technical field of automatic testing of microwave TR (transmitter-receiver) components, and particularly relates to a universal automatic testing device for a radio frequency probe.
Background
And the microwave TR component is the core of the active phased array radar. In the field of microwave TR component testing, a testing device and the like are mostly adopted as a tool for assisting in controlling position or action in the current testing means, and a radio frequency output end is connected with a testing instrument through a special high-frequency testing shielding wire; the transmission of high frequency signal needs good cable contact and signal shielding, and because the changeable appearance of microwave TR subassembly, the connection of test wire is mostly manual operation completion in its test procedure.
The existing microwave TR component is wide in radio frequency coverage range due to various types, the testing process is mostly completed through manual operation, in the manual testing process, testing instruments are required to be replaced according to different types of the microwave TR component, testing connecting lines are frequently detached, the operation process is complex, and the testing efficiency is low.
Disclosure of Invention
The invention aims to provide a universal automatic testing device for radio frequency probes, and aims to solve the problems of complicated process, low testing efficiency, various testing types and the like of the conventional manual testing mode.
In order to achieve the purpose, the invention adopts the technical scheme that: the universal automatic testing device for the radio frequency probe comprises a fixed base plate, a direct-drive module, a conveying mechanism, a testing fixture, a lifting mechanism and a probe testing mechanism, wherein the direct-drive module is installed on the fixed base plate and used for driving the conveying mechanism to do linear motion; the probe testing mechanism is provided with a plurality of groups of radio frequency probes and signal probes, and the radio frequency probes are driven by the lifting mechanism to be in contact with the signal probes and the PCB testing board in the testing fixture.
In one possible implementation manner, the direct drive module comprises a mounting plate and a single-shaft module, the mounting plate is fixedly connected to the upper end face of the fixed substrate, and the single-shaft module is fixedly mounted on the upper end face of the mounting plate.
In a possible implementation mode, the conveying mechanism comprises a mechanism base and supporting plates fixedly connected to two sides of the mechanism base, the supporting plates extend to the upper portion of the mechanism base, conveying belts are installed on the supporting plates, a jacking mechanism is connected between the two conveying belts, the test fixture is installed on the jacking mechanism, a rotating motor is arranged on the mechanism base and used for driving the two conveying belts to run.
In a possible implementation manner, an inductive switch is installed above the supporting plate, and the inductive switch is electrically connected with the rotating motor through a controller.
In a possible implementation, climbing mechanism includes fixed mounting and is in the jacking electric jar of mechanism base up end with fix and connect the jacking of the upper end of jacking electric jar is dull and stereotyped, inductive switch passes through the controller electricity and connects the jacking electric jar, the anchor clamps stopper is installed to one side of the jacking flat board, just the anchor clamps stopper is arranged in the dull and stereotyped top of jacking, die clamping cylinder is installed to the dull and stereotyped opposite side of jacking, just die clamping cylinder arranges in the dull and stereotyped below of jacking.
In a possible implementation manner, the lifting mechanism comprises a motor support and a motor fixing plate, the motor support and the motor fixing plate are fixedly connected to the upper end face of the fixing base plate, the motor fixing plate is arranged above the motor support, the lifting motor is arranged on the upper end face of the motor fixing plate, the output end of the lifting motor penetrates through the fixing plate downwards and is connected with the probe testing mechanism, and the probe testing mechanism is used for driving to lift.
In a possible implementation mode, the probe testing mechanism comprises a mechanism fixing plate fixedly connected to the motor support, the mechanism fixing plate is located below the motor fixing plate, a probe fixing block is arranged below the mechanism fixing plate, the output end of the lifting motor is connected with the probe fixing block, and a signal probe and a radio frequency probe are arranged on the lower end face of the probe fixing block.
In a possible implementation manner, two sliding supports are respectively installed on two sides of the upper end surface of the probe fixing block, two fixing supports which are in sliding fit with the corresponding sliding supports are fixedly installed on the lower end surface of the mechanism fixing plate, and the upper ends of the two sliding supports are connected with nut connecting plates; the output end of the lifting motor is connected with a screw rod nut, and the screw rod nut is connected with the nut connecting plate.
In a possible implementation manner, the test fixture comprises a fixture mounting plate, a mounting groove with an upward opening is formed in the fixture mounting plate, and the mounting groove is internally provided with a positioning plate for positioning the PCB test plate and a clamping piece for positioning the microwave TR component.
In a possible implementation manner, a positioning structure is arranged between the probe fixing block and the positioning plate.
The universal automatic testing device for the radio frequency probe provided by the invention has the beneficial effects that: compared with the prior art, the direct-drive module is arranged above the fixed substrate and used for driving the conveying mechanism arranged on the direct-drive module to perform linear motion; the conveying mechanism can drive the test fixture to carry out linear transportation, and the microwave TR component to be tested and the PCB test board for conversion are arranged in the test fixture; the fixed base plate is also provided with a lifting mechanism which is used for driving the probe testing mechanism to carry out vertical lifting movement; the probe testing mechanism is provided with a plurality of groups of radio frequency probes and signal probes, and the probe testing mechanism drives the radio frequency probes and the signal probes to contact with contacts of a PCB testing board in the testing fixture under the driving of the lifting mechanism so as to complete testing connection and further test. The universal automatic testing device for the radio frequency probe can realize the testing of various microwave TR components, replaces manual work to realize automatic testing, and has strong universality and high efficiency.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed for the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a universal automatic test apparatus for RF probes according to the present invention;
FIG. 2 is a schematic structural diagram of a conveying mechanism provided in the present invention;
FIG. 3 is a schematic structural diagram of a jacking mechanism provided by the present invention;
FIG. 4 is a schematic structural diagram of a lifting mechanism provided in the present invention;
FIG. 5 is a schematic structural diagram of a probe testing mechanism provided in the present invention;
FIG. 6 is a schematic structural diagram of a test fixture provided by the present invention;
FIG. 7 is a schematic view of a PCB test board according to the present invention;
fig. 8 is a schematic structural view of the ball guide sleeve according to the present invention.
Description of reference numerals:
100. fixing the substrate; 200. a transport mechanism; 210. a mechanism base; 220. a support plate; 230. a conveyor belt; 240. a pulley set; 250. a rotating electric machine; 260. a rotating shaft; 270. a synchronous wheel set; 280. an inductive switch; 300. a direct drive module; 410. jacking an electric cylinder; 420. jacking the flat plate; 421. a clamp limiting block; 422. a clamping cylinder; 500. a lifting mechanism; 510. a motor bracket; 520. connecting a bracket; 530. a motor fixing plate; 540. a lifting motor; 550. a feed screw nut; 600. a probe testing mechanism; 610. a mechanism fixing plate; 620. a probe fixing block; 621. a signal probe; 622. a radio frequency probe; 623. aligning the pins; 630. a slipping bracket; 640. fixing a bracket; 650. a nut connecting plate; 660. a guide sliding table; 700. testing the clamp; 710. mounting a plate; 720. positioning a plate; 730. a retainer; 731. a liner plate; 732. a PCB locating pin; 740. a ball guide sleeve; 741. a guide sleeve; 742. a spherical ball; 750. a cover plate; 800. a PCB test board.
Detailed Description
In order to make the technical problems, technical solutions and advantageous effects of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, are not to be construed as limiting the present invention. Further, in the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
Referring to fig. 1, a general automatic testing apparatus for an rf probe 622 according to the present invention will now be described. A universal automatic testing device for radio frequency probes 622 comprises a fixed substrate 100, a direct-drive module 300, a conveying mechanism 200, a testing fixture 700, a lifting mechanism 500 and a probe testing mechanism 600, wherein the direct-drive module 300 is installed on the fixed substrate 100, the direct-drive module 300 is used for driving the conveying mechanism 200 to move linearly, the testing fixture 700 is installed on the conveying mechanism 200 and used for positioning a microwave TR component to be detected and a PCB testing board 800 for conversion, the conveying mechanism 200 is used for driving the testing fixture 700 to move linearly, and the lifting mechanism 500 is installed on the fixed substrate 100 and used for driving the probe testing mechanism 600 to move vertically; the probe testing mechanism 600 is installed with a plurality of sets of rf probes 622 and signal probes 621, and the rf probes 622 and the signal probes 621 are driven by the lifting mechanism 500 to contact the PCB test board 800 in the test fixture 700.
Compared with the prior art, the universal automatic testing device for the radio frequency probe 622 provided by the invention has the advantages that the direct drive module 300 is arranged above the fixed substrate 100 and is used for driving the conveying mechanism 200 arranged on the direct drive module to perform linear motion; the transmission mechanism 200 can drive the test fixture 700 to carry out linear transportation, and the microwave TR component to be tested and the PCB test board 800 for conversion are arranged in the test fixture 700; the fixed substrate 100 is further provided with a lifting mechanism 500 for driving the probe testing mechanism 600 to perform vertical lifting movement; the probe testing mechanism 600 is provided with a plurality of sets of rf probes 622 and signal probes 621, and the probe testing mechanism 600 is driven by the lifting mechanism 500 to drive the rf probes 622 and the signal probes 621 to contact with the contacts of the PCB test board 800 in the test fixture 700, so as to complete the test connection and further perform the test. The universal automatic testing device for the radio frequency probe 622 can realize the testing of various microwave TR components, replaces manual work to realize automatic testing, and has strong universality and high efficiency.
In some embodiments, referring to fig. 1, the direct drive module 300 includes a mounting plate 710 and a single-axis module, the mounting plate 710 is fixedly connected to the upper surface of the fixed substrate 100, and the single-axis module is fixedly mounted on the upper surface of the mounting plate 710.
In this embodiment, the mounting plate 710 is connected to the upper end surface of the fixed substrate 100 by a plurality of screws, and the single-axis module is an electric linear driving module, which enables the transport mechanism 200 mounted thereon to move in a linear direction.
In some embodiments, referring to fig. 2, the conveying mechanism 200 includes a mechanism base 210 and supporting plates 220 fixedly connected to two sides of the mechanism base 210, the supporting plates 220 extend above the mechanism base 210, conveying belts 230 are installed on the supporting plates 220, a jacking mechanism is connected between the two conveying belts 230, a test fixture 700 is installed on the jacking mechanism, a rotating motor 250 is installed on the mechanism base 210, and the rotating motor 250 is used for driving the two conveying belts 230 to operate.
In this embodiment, the mechanism base 210 is connected to the single-axis module, and moves along the length direction of the single-axis module in an electromagnetic manner, so that the entire movement of the conveying mechanism 200 is realized. Two support plates 220 are connected in parallel to both sides of the mechanism base 210 and extend upward, respectively. The upper end of the supporting plate 220 is provided with a pulley set 240, the conveying belt 230 winds on the pulley set 240, a rotating shaft 260 linked with the pulley set 240 is connected between the two supporting plates 220, a synchronous pulley set 270 is installed in the middle of the rotating shaft 260, and the output end of the rotating motor 250 drives the rotating shaft 260 to rotate through the synchronous pulley set 270, so that the operation of the conveying belt 230 is finally realized.
In some embodiments, referring to fig. 2, an inductive switch 280 is installed above the supporting plate 220, and the inductive switch 280 is electrically connected to the rotating motor 250 through a controller.
In this embodiment, the inductive switches 280 are of a correlation identification type, and each group of the inductive switches 280 includes a transmitting unit and a receiving unit, the two groups of inductive switches 280 are respectively installed above the supporting plates 220, that is, the transmitting unit is installed above one supporting plate 220, and the receiving unit is correspondingly installed above the other supporting plate 220. The inductive switches 280 can sense the position of the test fixture 700, the position between the two groups of inductive switches 280 is the reasonable position of the test fixture 700, when the test fixture 700 further reaches the position between the two groups of inductive switches 280, the inductive switches 280 send inductive signals to the corresponding controllers, and the controllers send control signals to the rotating electrical machines 250 after receiving the inductive signals, so as to control the rotating electrical machines 250 to stop operating. Instead, the controller controls the rotating electrical machine 250 to continue to operate.
In some embodiments, referring to fig. 2 and 3, the jacking mechanism includes a jacking electric cylinder 410 fixedly installed on the upper end surface of the mechanism base 210 and a jacking flat plate 420 fixedly connected to the upper end of the jacking electric cylinder 410, the inductive switch 280 is electrically connected to the jacking electric cylinder 410 through a controller, a clamp stopper 421 is installed on one side of the jacking flat plate 420, the clamp stopper 421 is disposed above the jacking flat plate 420, a clamping cylinder 422 is installed on the other side of the jacking flat plate 420, and the clamping cylinder 422 is disposed below the jacking flat plate 420.
In this embodiment, the jacking cylinder 410 is mounted on the upper end surface of the mechanism base 210 by screws and located between the two supporting plates 220. The jacking flat plate 420 is horizontally connected to the output end of the upper part of the jacking electric pole and is lifted through the output end of the jacking electric cylinder 410. A clamp stop block 421 and a clamping cylinder 422 are respectively installed on two sides of the jacking flat plate 420.
Specifically, after the inductive switch 280 receives the information that the test fixture 700 is in place, the inductive switch 280 sends a control signal to the jacking electric cylinder 410 through the controller, the jacking electric cylinder 410 drives the jacking flat plate 420 to vertically ascend, the fixture limiting block 421 fixed on the upper side of the jacking flat plate 420 limits the test fixture 700, and the clamping cylinder 422 fixed on the lower side of the jacking flat plate 420 performs clamping action; the test fixture 700 is limited in position under the coaction of the fixture stop 421 and the clamping cylinder 422 to ensure accurate positioning for subsequent actions.
In some embodiments, referring to fig. 4, the lifting mechanism 500 includes a motor bracket 510 fixedly mounted on the upper end surface of the fixed substrate 100 and a motor fixing plate 530 fixedly connected above the motor bracket 510, wherein a lifting motor 540 is mounted on the upper end surface of the motor fixing plate 530, and an output end of the lifting motor 540 penetrates the fixing plate downward and is connected to the probe testing mechanism 600 for driving the probe testing mechanism 600 to lift.
In this embodiment, the motor bracket 510 is screwed to the fixing substrate 100 and straddles the outside of the transfer mechanism 200. Be connected with linking bridge 520 in the upper end of motor support 510, motor fixed plate 530 is connected on linking bridge 520's upper portion, and elevator motor 540 fixed connection is in the middle part of motor fixed plate 530 up end, and elevator motor 540's output is installed down, runs through motor fixed plate 530 with connection probe accredited testing organization 600, thereby elevator motor 540's output goes up and down to drive probe accredited testing organization 600 and goes up and down.
In some embodiments, referring to fig. 5, the probe testing mechanism 600 includes a mechanism fixing plate 610 fixedly connected to the motor bracket 510, the mechanism fixing plate 610 is located below the motor fixing plate 530, a probe fixing block 620 is located below the mechanism fixing plate 610, an output end of the lifting motor 540 is connected to the probe fixing block 620, and a signal probe 621 and an rf probe 622 are located on a lower end surface of the probe fixing block 620.
In this embodiment, two ends of the mechanism fixing plate 610 are respectively connected to the motor bracket 510, the probe fixing plate is located below the mechanism fixing plate 610, a signal probe 621 and a radio frequency probe 622 are disposed on a lower end surface of the probe fixing block 620, and an output end of the lifting motor 540 is connected to the probe fixing block 620, so that the signal probe 621 and the radio frequency probe 622 are lifted to reach a proper position and are in contact with the PCB test board 800 in the test fixture 700.
In some embodiments, referring to fig. 5, two sliding brackets 630 are respectively mounted on two sides of an upper end surface of the probe fixing block 620, two fixing brackets 640 slidably engaged with the corresponding sliding brackets 630 are fixedly mounted on a lower end surface of the mechanism fixing plate 610, and upper ends of the two sliding brackets 630 are connected with nut connecting plates 650; the output end of the lifting motor 540 is connected with a lead screw nut 550, and the lead screw nut 550 is connected with a nut connecting plate 650.
In this embodiment, the number of the sliding supports 630 is two, the two sliding supports are oppositely arranged on the lower end surface of the mechanism fixing plate 610, the inner side wall of the sliding support 630 is longitudinally provided with the guide sliding table 660, the two fixing supports 640 are located on the inner side of the sliding support 630, and the sliding supports 630 and the guide sliding table 660 are in one-to-one correspondence to each other and slide up and down.
Wherein, the probe fixing block 620 is connected to the lower ends of the two fixing brackets 640 through screws, the nut connecting plate 650 is connected to the upper ends of the two fixing brackets 640, and the middle part of the nut connecting plate 650 is provided with a connecting hole. The output end of the elevating motor 540 is processed into a trapezoidal screw and is in threaded connection with a screw nut 550, and the screw nut 550 is installed in a connection hole of the nut connection plate 650. Finally, the rotation of the output end of the lifting motor 540 forms a screw transmission structure in cooperation with the lead screw nut 550, and then drives the nut connecting plate 650 to lift, thereby realizing the lifting of the probe fixing plate provided with the radio frequency probe 622 and the signal probe 621.
In some embodiments, referring to fig. 6, the test fixture 700 includes a fixture mounting plate 710, the fixture mounting plate 710 has a mounting slot with an upward opening, and the mounting slot is respectively provided with a positioning plate 720 for positioning the PCB test board 800 and a clamping member 730 for positioning the microwave TR module.
In this embodiment, the PCB test board 800 is installed in the mounting groove through the positioning board 720, and the microwave TR component is also installed in the mounting groove through the clamping piece 730, and the two are arranged side by side. The microwave TR subassembly is placed in the mounting groove to fix a position its chucking by chucking spare 730, the microwave TR subassembly is surveyed board 800 with the PCB and is connected respectively through the shielding cable, and PCB surveys board 800 and can eliminate the influence each other between the probe point after design optimization, guarantees the accuracy of connection test between probe and the probe point.
Wherein, chucking spare 730 includes the cylinder of connecting terminal surface both sides under the mounting groove and rotates the chucking board that sets up in the upper end of cylinder, outwards rotates the chucking board, places the microwave TR subassembly in the mounting groove to be located between two cylinders, through inside counter-rotation chucking board, thereby with the chucking of microwave TR subassembly in the mounting groove.
Wherein, the positioning plate 720 is provided with a lining plate 731 of the PCB testing plate 800, a plurality of PCB positioning pins 732 are arranged in the lining plate 731, the plurality of PCB positioning pins 732 correspond to the mounting holes on the PCB testing plate 800, so that the PCB testing plate 800 is positioned on the lining plate 731 conveniently.
In some embodiments, referring to fig. 6 and 7, a positioning structure is disposed between the probe fixing block 620 and the positioning plate 720.
In this embodiment, the positioning structure includes ball guide sleeves 740 disposed on two sides of the upper end surface of the positioning plate 720, and alignment pins 623 correspondingly disposed on the lower end surface of the probe fixing plate, the ball guide sleeves 740 extend downward into the positioning plate 720, and the alignment pins 623 are inserted into the corresponding ball guide sleeves 740, so as to position the probe fixing block 620 and the positioning plate 720, so as to position the rf probe 622 and the signal probe 621, and make them accurately contact the PCB test board 800. In addition, a cover plate 750 is installed at the upper end of the ball guide sleeve 740, and a preformed hole is formed in the cover plate 750 for the alignment pin 623 to pass through.
Specifically, referring to fig. 8, the ball guide 740 includes a guide sleeve 741 extending downward into the positioning plate 720 and a spherical ball 742 embedded in a circumferential side wall of the guide sleeve 741, the spherical ball 742 can freely roll in the nesting hole, and the spherical ball 742 cooperates with the alignment pin 623, so that the alignment pin 623 can be inserted into or separated from the ball guide 740.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.

Claims (10)

1. The universal automatic testing device for the radio frequency probe (622) is characterized by comprising a fixed substrate (100), a direct-drive module (300), a conveying mechanism (200), a testing fixture (700), an elevating mechanism (500) and a probe testing mechanism (600), wherein the direct-drive module (300) is installed on the fixed substrate (100), the direct-drive module (300) is used for driving the conveying mechanism (200) to perform linear motion, the testing fixture (700) is installed on the conveying mechanism (200) and used for positioning a microwave TR component to be tested and a PCB testing board (800) for conversion, the conveying mechanism (200) is used for driving the testing fixture (700) to perform linear motion, and the elevating mechanism (500) is installed on the fixed substrate (100) and used for driving the probe testing mechanism (600) to perform vertical motion; the probe testing mechanism (600) is provided with a plurality of groups of radio frequency probes (622) and signal probes (621), and the radio frequency probes (622) and the signal probes (621) are driven by the lifting mechanism (500) to contact with the PCB testing board (800) in the testing fixture (700).
2. The universal automatic testing device for radio frequency probes (622) according to claim 1, wherein the direct drive module (300) comprises a mounting plate (710) and a single axis module, the mounting plate (710) is fixedly connected to the upper end face of the fixed substrate (100), and the single axis module is fixedly mounted on the upper end face of the mounting plate (710).
3. The universal automatic testing device for the radio frequency probe (622) as claimed in claim 1, wherein the conveying mechanism (200) comprises a mechanism base (210) and supporting plates (220) fixedly connected to two sides of the mechanism base (210), the supporting plates (220) extend to the upper side of the mechanism base (210), a conveying belt (230) is installed on the supporting plates (220), a jacking mechanism is connected between the two conveying belts (230), the testing fixture (700) is installed on the jacking mechanism, a rotating motor (250) is arranged on the mechanism base (210), and the rotating motor (250) is used for driving the two conveying belts (230) to operate.
4. The universal automatic test device for radio frequency probes (622) according to claim 3, wherein an inductive switch (280) is installed above the supporting plate (220), and the inductive switch (280) is electrically connected with the rotating motor (250) through a controller.
5. The universal automatic testing device for the radio frequency probes (622) according to claim 4, wherein the jacking mechanism comprises a jacking electric cylinder (410) fixedly installed on the upper end face of the mechanism base (210) and a jacking flat plate (420) fixedly connected with the upper end of the jacking electric cylinder (410), the inductive switch (280) is electrically connected with the jacking electric cylinder (410) through a controller, a clamp limiting block (421) is installed on one side of the jacking flat plate (420), the clamp limiting block (421) is arranged above the jacking flat plate (420), a clamping cylinder (422) is installed on the other side of the jacking flat plate (420), and the clamping cylinder (422) is arranged below the jacking flat plate (420).
6. The universal automatic testing device for the radio frequency probe (622) according to claim 1, wherein the lifting mechanism (500) includes a motor support (510) fixedly mounted on the upper end surface of the fixed substrate (100) and a motor fixing plate (530) fixedly connected above the motor support (510), a lifting motor (540) is mounted on the upper end surface of the motor fixing plate (530), and an output end of the lifting motor (540) downwardly penetrates through the fixing plate and is connected to the probe testing mechanism (600) for driving the probe testing mechanism (600) to lift.
7. The universal automatic testing device for the radio frequency probe (622) as claimed in claim 6, wherein the probe testing mechanism (600) includes a mechanism fixing plate (610) fixedly connected to the motor support (510), the mechanism fixing plate (610) is located below the motor fixing plate (530), a probe fixing block (620) is located below the mechanism fixing plate (610), the output end of the lifting motor (540) is connected to the probe fixing block (620), and the lower end surface of the probe fixing block (620) is provided with the signal probe (621) and the radio frequency probe (622).
8. The universal automatic testing device for the radio frequency probe (622) as claimed in claim 7, wherein two sides of the upper end surface of the probe fixing block (620) are respectively provided with a sliding bracket (630), the lower end surface of the mechanism fixing plate (610) is fixedly provided with two fixing brackets (640) which are in sliding fit with the corresponding sliding brackets (630), and the upper ends of the two sliding brackets (630) are connected with a nut connecting plate (650); the output end of the lifting motor (540) is connected with a lead screw nut (550), and the lead screw nut (550) is connected with the nut connecting plate (650).
9. The universal automatic test device for RF probes (622) according to claim 8, wherein said test fixture (700) comprises a fixture mounting plate (710), said fixture mounting plate (710) has an upward opening mounting slot, said mounting slot has a positioning plate (720) for positioning said PCB test board (800) and a clamping member (730) for positioning said microwave TR module.
10. The universal automatic test device for rf probes (622) as claimed in claim 9, wherein a positioning structure is provided between the probe fixing block (620) and the positioning plate (720).
CN202210157599.4A 2022-02-21 2022-02-21 Universal automatic testing device for radio frequency probe Pending CN114690022A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210157599.4A CN114690022A (en) 2022-02-21 2022-02-21 Universal automatic testing device for radio frequency probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210157599.4A CN114690022A (en) 2022-02-21 2022-02-21 Universal automatic testing device for radio frequency probe

Publications (1)

Publication Number Publication Date
CN114690022A true CN114690022A (en) 2022-07-01

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210157599.4A Pending CN114690022A (en) 2022-02-21 2022-02-21 Universal automatic testing device for radio frequency probe

Country Status (1)

Country Link
CN (1) CN114690022A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116318446A (en) * 2023-04-18 2023-06-23 成都美数科技有限公司 Radio frequency transceiver module testing arrangement

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116318446A (en) * 2023-04-18 2023-06-23 成都美数科技有限公司 Radio frequency transceiver module testing arrangement
CN116318446B (en) * 2023-04-18 2024-01-23 成都美数科技有限公司 Radio frequency transceiver module testing arrangement

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