CN219737236U - Carrier for nondestructive infrared detection of chip - Google Patents
Carrier for nondestructive infrared detection of chip Download PDFInfo
- Publication number
- CN219737236U CN219737236U CN202223505951.3U CN202223505951U CN219737236U CN 219737236 U CN219737236 U CN 219737236U CN 202223505951 U CN202223505951 U CN 202223505951U CN 219737236 U CN219737236 U CN 219737236U
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- Prior art keywords
- clamping
- chip
- frame
- carrier
- nondestructive
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- 238000001514 detection method Methods 0.000 title claims abstract description 19
- 230000005540 biological transmission Effects 0.000 claims description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 5
- 239000000741 silica gel Substances 0.000 claims description 5
- 229910002027 silica gel Inorganic materials 0.000 claims description 5
- 239000000523 sample Substances 0.000 abstract description 24
- 230000001052 transient effect Effects 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000009659 non-destructive testing Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- ZZUFCTLCJUWOSV-UHFFFAOYSA-N furosemide Chemical compound C1=C(Cl)C(S(=O)(=O)N)=CC(C(O)=O)=C1NCC1=CC=CO1 ZZUFCTLCJUWOSV-UHFFFAOYSA-N 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
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- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The utility model discloses a carrier for nondestructive infrared detection of a chip, which comprises two slide rails extending in the y-axis direction and two clamping strips extending in the x-axis direction, wherein a driving device for driving the two clamping strips to complete clamping movement is arranged at the same time, a frame is arranged at the clamping strip corresponding to the clamping side, and a plurality of springs are arranged between the frame and the clamping strips. The carrier is used for fixing the chip, is convenient for accurately positioning and fixing the positive and negative electrode probes, has hollowed-out parts on the upper side and the lower side under the microscope lens of the high-frequency infrared thermal imager, can be provided with a searchlight and a microscope lens under the workbench, is used for double-sided detection of the front and the back, can be provided with probes on the lower side of the chip, and is suitable for chip detection of different specifications.
Description
Technical Field
The utility model belongs to the technical field of phase-locked infrared nondestructive testing, and particularly relates to a carrier for chip nondestructive infrared testing.
Background
The phase-locked infrared nondestructive detection technology adopts a power supply as an infrared heat wave excitation source, combines real-time transient phase-locked infrared analysis software, is innovatively applied to the fields of chips, electronics and semiconductors, and can detect the positions of leakage defects of the chips and electronic semiconductor products in a nondestructive mode under extremely low power. The phase-locked infrared nondestructive testing technology comprises a set of testing system consisting of a high-frequency infrared thermal imager, a power supply, a graphic workstation, a workbench, a sample to be tested and real-time transient phase-locked analysis software. The infrared thermal imager and the power supply are connected with the graphic workstation through data lines, and the real-time transient phase-locked analysis software is used for carrying out program control on the infrared thermal imager and the power supply program; the method comprises the steps that a sample to be tested is placed on a workbench, the anode and the cathode of a program controlled digital source meter are connected to the sample to be tested, a power supply is controlled by real-time transient phase-locked analysis software, square wave signals are applied to the sample to be tested, the sample to be tested is excited by the square wave signals to generate synchronous hot spot changes, and the real-time transient phase-locked analysis software captures hot spots of the sample to be tested through an infrared thermal imager, so that hot spot analysis is realized.
The sample to be tested is a chip, an integrated circuit and the like, a notch is formed in the center of the workbench, a probe platform is arranged at the position of the notch, a base of the probe is located on the workbench, the tail end of the probe is a lead terminal, the front end of the probe is a tip, a circuit board is placed on the probe platform, and the tip of the probe is used for connecting positive and negative interfaces of the circuit board. The current probe station commonly used is discoid, and most can only single face puncture behind the chip of placing, to some chip or the double-sided chip of inserting that need to fall the needle, current probe station hardly accomplishes the operation and realizes the positive and negative needle insertion of chip simultaneously.
According to the utility model, the probe table is replaced by the support frame, the center of the support frame is in a hollowed-out state, and the bottom of the corresponding workbench is provided with an additional infrared lens and a probe illumination lamp for inserting the chip of the needle at the same time on the front side and the back side.
Disclosure of Invention
The utility model aims to provide a carrier for nondestructive infrared detection of chips, which is characterized in that a supporting frame is prepared to replace a probe table, the center of the supporting frame is in a hollowed-out state, and the bottom of a corresponding workbench is provided with an additional infrared lens and a searchlight lamp for inserting the chips of pins on the front side and the back side simultaneously.
In order to solve the technical problems, the utility model is realized by the following technical scheme:
the carrier for nondestructive infrared detection of the chip comprises two sliding rails extending in the y-axis direction, wherein the two sliding rails are parallel to each other, and the end parts of the sliding rails are supported on a circular supporting plate;
the device comprises two clamping strips extending in the x-axis direction, wherein the end parts of the two clamping strips are arranged on a sliding rail and are in sliding fit on the sliding rail, and the two clamping strips are parallel to each other;
the clamping device comprises a driving device for simultaneously driving two clamping strips to complete clamping movement;
the clamping strip corresponds the clamping side and installs the frame, the frame cross-section is shape, blocks into clamping strip avris, install a plurality of springs between frame and the clamping strip.
Further, a sliding groove is formed in the upper side of the sliding rail along the length direction, a screw rod is arranged in the sliding groove, a screw sleeve sleeved with the screw rod is arranged at the end part of the clamping strip corresponding to the sliding groove, and the screw rod is opposite to the screw sleeve at the two sides in the screw thread direction.
Further, the end parts of the screw rods extend to the end parts of the sliding rails, the driving device comprises an adjusting knob, driving rods are arranged between the adjusting knob and the end parts of the two screw rods, the driving rods are in the x-axis direction, the adjusting knob is in transmission fit with one end of each driving rod through bevel gears, and the other end of each driving rod is in transmission fit with the corresponding end part of the screw rod through the bevel gears.
Further, a limiting rod is arranged in the clamping groove corresponding to the frame, the spring is sleeved on the limiting rod, the clamping strip is correspondingly provided with a limiting hole for the limiting rod to pass through and stretch out and draw back, and the spring is abutted between the frame and the clamping strip.
Further, one end of the limiting hole, which corresponds to the spring, is provided with a step hole for fixing the spring.
Further, the lower side of the frame corresponding to the clamping side is provided with a horizontal flattening edge, and the frame corresponding to the clamping side is further provided with a silica gel cushion layer.
The utility model has the following beneficial effects: the carrier is used for fixing the chip, is convenient for accurately positioning and fixing the positive and negative electrode probes, has hollowed-out parts on the upper side and the lower side under the microscope lens of the high-frequency infrared thermal imager, can be provided with a searchlight and a microscope lens under the workbench, is used for double-sided detection of the front and the back, can be provided with probes on the lower side of the chip, and is suitable for chip detection of different specifications.
Drawings
In order to more clearly illustrate the technical solution of the embodiments of the present utility model, the drawings used for describing the embodiments will be briefly described below.
Fig. 1: the utility model is a schematic structural diagram.
Fig. 2: the clamping strip disassembly structure of the utility model is schematically shown.
Fig. 3: the installation position structure of the utility model is schematically shown.
In the drawings, the list of components represented by the various numbers is as follows: slide rail 1, backup pad 10, grip strip 2, frame 3, spring 5, lead screw 11, swivel nut 21, adjust knob 4, actuating lever 41, gag lever post 31, spacing hole 22, step hole 23, horizontal edge 32, silica gel bed course 33.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments.
As shown in fig. 1-3: the carrier for nondestructive infrared detection of the chip comprises a high-frequency infrared thermal imager, wherein a workbench is arranged below the high-frequency infrared thermal imager, a notch is formed in the center of the workbench and corresponds to the lower part of a lens of the high-frequency infrared thermal imager, and the carrier is arranged at the position of the notch;
the device comprises two sliding rails 1 extending in the y-axis direction, wherein the two sliding rails 1 are parallel to each other, and the end part of each sliding rail 1 is supported on a circular supporting plate 10; the position of the sliding rail is relatively fixed, the supporting plate is detachably arranged at the position of the notch, and the notch corresponds to the position with the step groove for limiting the supporting plate.
The clamping device comprises two clamping strips 2 extending along the x-axis direction, wherein the end parts of the two clamping strips 2 are arranged on a sliding rail 1 and are in sliding fit on the sliding rail 1, and the two clamping strips 2 are parallel to each other;
comprises a driving device for simultaneously driving two clamping strips 2 to complete clamping movement; the clamping movement is that the two clamping strips relatively move close to or move away from each other and are used for clamping the chip to be detected.
The clamping strip 2 is corresponding to the clamping side and is provided with a frame 3, the section of the frame 3 is -shaped, the side of the clamping strip 2 is clamped in, and a plurality of springs 5 are arranged between the frame 3 and the clamping strip 2. The frame replaces the clamping strip to contact the side of the chip, and meanwhile a plurality of springs are arranged between the frame and the clamping strip and used for contacting rebound to realize elastic pressing, under the driving action, the clamping strip contacts and extrudes the side of the chip to complete clamping operation, and after clamping, the springs are compressed to prevent the damage to the edge of the chip caused by overtightening under the condition of ensuring clamping force.
The carrier is used for fixing the chip, is convenient for accurately positioning and fixing the positive and negative electrode probes, has hollowed-out parts on the upper side and the lower side under the microscope lens of the high-frequency infrared thermal imager, can be provided with a searchlight and a microscope lens under the workbench, is used for double-sided detection of the front and the back, can be provided with probes on the lower side of the chip, and is suitable for chip detection of different specifications.
As shown in fig. 1: the upper side of the sliding rail 1 is provided with a sliding groove along the length direction, a screw rod 11 is arranged in the sliding groove, the end part of the clamping strip 2 corresponding to the sliding groove is provided with a screw sleeve 21 sleeved with the screw rod 11, and the screw rod 11 corresponds to the screw sleeves 21 on the two sides and has opposite screw thread directions. The driving device drives the screw rod to rotate, and simultaneously enables the two corresponding clamping strips to be relatively close to or far away from each other.
The end parts of the screw rods 11 extend to the end parts of the slide rails 1, the driving device comprises an adjusting knob 4, a driving rod 41 is arranged between the adjusting knob 4 and the end parts of the two screw rods 11, the driving rod 41 is in the x-axis direction, the adjusting knob 4 is in transmission fit with one end of the driving rod 41 through a bevel gear, and the other end of the driving rod 41 is in transmission fit with the corresponding end part of the screw rod 11 through a bevel gear. The backup pad corresponds the pole cover that is provided with the support actuating lever, provides the actuating lever and rotates the support, through rotating adjust knob, the screw rod of transmission both sides rotates simultaneously.
As shown in fig. 2: be provided with gag lever post 31 in the draw-in groove that frame 3 corresponds, spring 5 cup joints in gag lever post 31, and clamping bar 2 corresponds and is provided with and supplies gag lever post 31 to pass and telescopic fit's spacing hole 22, and spring 5 contradicts between frame and clamping bar 2. The spring is more stable in installation, and when the frame is compressed, the spring is compressed under the action of the limiting rod, so that the structure is more stable.
The limiting hole 22 is provided with a step hole 23 at one end corresponding to the spring for fixing the spring 5.
The lower side of the frame 3 corresponding to the clamping side is provided with a horizontal flattening edge 32, and the frame 3 corresponding to the clamping side is also provided with a silica gel cushion layer 33. The silica gel cushion layer is used for soft package, reduces the rigidity and contacts the chip edge, and the exhibition limit is used for supporting the avris of chip.
The embodiments were chosen and described in order to best explain the principles of the utility model and the practical application, to thereby enable others skilled in the art to best understand and utilize the utility model.
Claims (6)
1. The utility model provides a carrier of nondestructive infrared detection of chip which characterized in that:
the device comprises two sliding rails (1) extending in the y-axis direction, wherein the two sliding rails (1) are parallel to each other, and the end parts of the sliding rails (1) are supported on a circular supporting plate (10);
the device comprises two clamping strips (2) extending along the x-axis direction, wherein the end parts of the two clamping strips (2) are arranged on a sliding rail (1) and are in sliding fit on the sliding rail (1), and the two clamping strips (2) are parallel to each other;
comprises a driving device for simultaneously driving two clamping strips (2) to complete clamping movement;
the clamping strip (2) is provided with a frame (3) corresponding to the clamping side, the section of the frame (3) is -shaped, the side of the clamping strip (2) is clamped, and a plurality of springs (5) are arranged between the frame (3) and the clamping strip (2).
2. The carrier for nondestructive infrared detection of a chip as set forth in claim 1, wherein: the sliding rail is characterized in that a sliding groove is formed in the upper side of the sliding rail (1) along the length direction, a screw rod (11) is arranged in the sliding groove, a threaded sleeve (21) sleeved with the screw rod (11) is arranged at the end part of the clamping strip (2) corresponding to the sliding groove, and the screw directions of the screw rods (11) corresponding to the threaded sleeves (21) on the two sides are opposite.
3. The carrier for nondestructive infrared detection of a chip as set forth in claim 2, wherein: the end of the screw rod (11) extends to the end of the sliding rail (1), the driving device comprises an adjusting knob (4), driving rods (41) are arranged between the adjusting knob (4) and the end of the two screw rods (11), the driving rods (41) are in the x-axis direction, the adjusting knob (4) is in transmission fit with one end of the driving rods (41) through bevel gears, and the other end of the driving rods (41) is in transmission fit with the end of the corresponding screw rod (11) through bevel gears.
4. The carrier for nondestructive infrared detection of a chip as set forth in claim 1, wherein: be provided with gag lever post (31) in frame (3) corresponding draw-in groove, spring (5) cup joint in gag lever post (31), centre gripping strip (2) correspond and are provided with and supply gag lever post (31) to pass and flexible complex spacing hole (22), spring (5) conflict between frame and centre gripping strip (2).
5. The carrier for nondestructive infrared detection of a chip as set forth in claim 4, wherein: one end of the limiting hole (22) corresponding to the spring is provided with a step hole (23) for fixing the spring (5).
6. The carrier for nondestructive infrared detection of a chip as set forth in claim 1, wherein: the lower side of the frame (3) corresponding to the clamping side is provided with a horizontal flattening edge (32), and the frame (3) corresponding to the clamping side is also provided with a silica gel cushion layer (33).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223505951.3U CN219737236U (en) | 2022-12-26 | 2022-12-26 | Carrier for nondestructive infrared detection of chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223505951.3U CN219737236U (en) | 2022-12-26 | 2022-12-26 | Carrier for nondestructive infrared detection of chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219737236U true CN219737236U (en) | 2023-09-22 |
Family
ID=88061686
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202223505951.3U Active CN219737236U (en) | 2022-12-26 | 2022-12-26 | Carrier for nondestructive infrared detection of chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219737236U (en) |
-
2022
- 2022-12-26 CN CN202223505951.3U patent/CN219737236U/en active Active
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