Disclosure of Invention
Therefore, the invention provides a manufacturing process of a conducting circuit based on a die cutting process, and can well solve the problems of difficult waste discharge and poor precision.
In order to achieve the purpose, the technical scheme provided by the invention is as follows:
a manufacturing process of a conducting circuit comprises the following steps:
a1, providing a substrate, and planning a wiring area and a waste discharge area on the surface of the substrate;
a2, covering an isolation layer on the surface of the waste discharge area of the substrate;
a3, laminating the conductive layer on the surface of the substrate;
a4, cutting out the circuit on the surface of the wiring area and the waste material on the surface of the waste discharge area by die cutting;
and A5, removing the waste material to obtain the conductive circuit in the wiring area.
Further, in step a2, the surface of the wiring area of the substrate is exposed, and in step A3, the conductive layer is directly bonded to the surface of the wiring area of the substrate and the surface of the isolation layer in the waste discharge area.
Further, in step a2, the method further includes covering the wiring region of the substrate with a coupling agent layer, and in step A3, the conductive layer is laminated on the surface of the coupling agent layer of the wiring region and the surface of the isolation layer located in the waste discharge region.
Further, the isolation layer is an OSP layer, specifically, the OSP is an abbreviation of Organic solder resist Preservatives, and is also called a copper-protecting agent.
Furthermore, the OSP layer is made of benzotriazole.
Further, in step a2, dissolving the OSP material in an organic solvent to obtain a mixed solution, covering the mixed solution on the surface of the waste discharge area by printing or spraying, and volatilizing and drying the organic solvent to obtain the isolation layer.
Further, in the step a3, the conductive layer is a conductive film layer made of copper foil, aluminum foil or other conductive film material, and an enhancement layer is added to the bottom of the conductive film layer.
Further, in step a5, the waste material is removed by negative pressure suction.
Further, step a5 is followed by step a6 of covering a passivation layer on the conductive lines in the wiring area.
Through the technical scheme provided by the invention, the method has the following beneficial effects:
cover an isolation layer at the district surface of wasting discharge for the cohesion of conducting layer in the wasting discharge district will be less than at the cohesion of wiring district, cuts off after the cross cutting, and because of the difference of cohesion, modes such as accessible negative pressure is absorbed and is got rid of the waste material in unison, and the wasting discharge is easy, efficient, and can not influence the circuit that is located wiring district surface, and the precision obtains fine guarantee.
Detailed Description
To further illustrate the various embodiments, the invention provides the accompanying drawings. The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate embodiments of the invention and, together with the description, serve to explain the principles of the embodiments. Those skilled in the art will appreciate still other possible embodiments and advantages of the present invention with reference to these figures. Elements in the figures are not drawn to scale and like reference numerals are generally used to indicate like elements.
The invention will now be further described with reference to the accompanying drawings and detailed description.
Example one
Referring to fig. 1, the present embodiment provides a manufacturing process of a conductive circuit, including the following steps:
a1, as shown in fig. 2, providing a substrate 10, and planning a wiring area 101 and a waste area 102 on the surface of the substrate 10; in the figure, the ring position is set as a wiring area 101, and the rest positions are waste discharge areas 102.
A2, covering a separation layer 20 on the surface of the waste discharge area 102 of the substrate 10, as shown in fig. 3;
specifically, in the present embodiment, the surface of the wiring region 101 of the substrate 10 is exposed, so as to form an exposed surface;
a3, as shown in fig. 4, pressing the conductive layer 30 (specifically, the copper foil layer in this embodiment) on the surface of the substrate 10;
specifically, the conductive layer 30 is directly laminated on the surface of the wiring region 101 of the substrate 10 and the surface of the isolation layer 20 located in the waste discharge region 102.
A4, cutting the conductive layer 30 into the circuit 31 on the surface of the wiring area 101 and the waste material 32 on the surface of the waste discharge area 102 by die cutting as shown in fig. 5; specifically, the die cutting can be selected from laser cutting, knife die cutting and the like in the prior art.
Thus, since the surface of the waste discharge region 102 is covered with the isolation layer 20, the bonding force of the conductive layer 30 in the waste discharge region 102 is smaller than that in the wiring region 101.
A5, as shown in fig. 6, the waste material 32 is discharged to obtain the conductive circuit located in the wiring area 101, and the wiring 31 is the conductive circuit.
Due to the difference of the binding force, the waste 32 is easier to discharge, the circuit 31 on the surface of the wiring area 101 is not affected, and the precision is well guaranteed. Specifically, in step a5, the waste 32 is uniformly removed by negative pressure suction, which is more efficient. Of course, other means of disposal may be used.
Specifically, in the present embodiment, the substrate 10 is a structure capable of forming an adhesion with the conductive layer 30 during the lamination process, such as a PET substrate. Of course, if the substrate 10 is difficult to be directly bonded to the conductive layer 30, such as a ceramic substrate, in order to achieve bonding to the conductive layer 30, an adhesive layer may be added on the surface of the substrate 10 or at the bottom of the conductive layer 30 to facilitate pressing and bonding.
Further, in the step a3, if the conductive layer is a conductive film layer, such as a copper foil, an aluminum foil or other conductive film material with a thickness of 18 microns, the strength of the conductive layer is obviously insufficient, and the conductive layer is basically broken by pulling with hands; therefore, in this case, a reinforcing layer, such as a PET layer with a thickness of 10 μm, may be added to the bottom of the conductive film layer, i.e., the aluminum foil (or copper foil) and the PET are processed by a composite process to increase the strength.
Specifically, the isolation layer 20 is an OSP layer, specifically, in step a2, the OSP material is dissolved in an organic solvent to obtain a mixed solution, the mixed solution is covered on the surface of the waste discharge area by a printing or spraying manner, and the isolation layer is obtained after the organic solvent is volatilized and dried. The OSP layer can be formed to be nano-scale in thickness, generally 0.2-0.5 micron, and the solvent is solid after volatilization, and can not be diffused any more, and the formed circuit is clearer.
Meanwhile, after the conductive circuit is formed, the residual OSP layer can be volatilized or sublimed to be removed through the subsequent normal baking or reflow soldering heating process without adding an additional removing step; after the removal, the isolation effect is not played any more, and a resin layer can be added on the line 31 for secondary lamination or glue is applied for protection and reinforcement. More preferably, the OSP layer is made of benzotriazole which can be sublimated at 98-100 ℃, is easier to remove and has a lower removal temperature, particularly a long-term use temperature lower than that of a common material PET (polyethylene terephthalate, the long-term use temperature is below 120 ℃) of the RFID label. Of course, in other embodiments, other organic semiconductors such as alkyl imidazoles or phenyl imidazoles may be used for the OSP layer. Besides the OSP layer, other silicon oil layers made of silicon oil and the like can be adopted, and isolation can be realized; however, the effect is poor, i.e. after the step a5, an additional step of removing the isolation layer is required to remove it.
Further, step a5 is followed by step a6 of covering a passivation layer on the conductive lines in the wiring area. In this way, the line 31 can be effectively protected. Of course, in other embodiments, this is not limiting.
Example two
The manufacturing process of the conductive circuit provided in this embodiment is substantially the same as the manufacturing process provided in the first embodiment, except that: in this embodiment, step a2 further includes covering the wiring region of the substrate with a coupling agent layer, and in step A3, the conductive layer is laminated on the surface of the coupling agent layer of the wiring region and the surface of the isolation layer in the waste region. In this embodiment, a coupling agent layer is added in the wiring region, and the coupling agent can further promote the bonding between the conductive layer and the surface of the wiring region, so that the bonding is firmer.
While the invention has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.