CN114414827B - Sample analysis system and conveying method thereof - Google Patents
Sample analysis system and conveying method thereof Download PDFInfo
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- CN114414827B CN114414827B CN202210309993.5A CN202210309993A CN114414827B CN 114414827 B CN114414827 B CN 114414827B CN 202210309993 A CN202210309993 A CN 202210309993A CN 114414827 B CN114414827 B CN 114414827B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/026—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having blocks or racks of reaction cells or cuvettes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0401—Sample carriers, cuvettes or reaction vessels
- G01N2035/0418—Plate elements with several rows of samples
- G01N2035/0422—Plate elements with several rows of samples carried on a linear conveyor
- G01N2035/0424—Two or more linear conveyors
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Abstract
The present application provides a sample analysis system and a transportation method thereof, the sample analysis system including: the sample conveying device comprises a first conveying assembly, a second conveying assembly, a pushing assembly and a first bridging assembly. The first conveying assembly is used for conveying a first sample rack containing a tube to be tested to a first sample sucking position along a first conveying channel so as to be used for a first sample analyzer to perform analysis and test on a sample; the second conveying assembly is used for conveying the second sample rack provided with the tube to be tested to a second sample sucking position along a second conveying channel so as to be used for a second sample analyzer to perform analysis and test on a sample; the pushing assembly is used for pushing the first sample rack/the second sample rack to the first conveying assembly and/or the second conveying assembly. The sample analysis system can meet the requirements of at least two analyzers on the sample, and the detection speed of the sample is improved.
Description
Technical Field
The present application relates to the field of medical devices, and more particularly, to a sample analysis system and a method for transporting the same.
Background
With the increase of clinical detection amount of hospital samples, the speed requirement of in vitro diagnosis and detection instruments is higher and higher, although the existing detection equipment strives to improve the single machine detection speed, the requirement of rapidly increasing detection sample amount cannot be met, and the single machine speed is difficult to improve after being increased to a certain degree.
In order to improve the detection speed, two or more detectors can be connected together to form a detection assembly line, and in order to save the occupied space and cost, a sample conveying device in a single machine can be shared. However, the sample transport device used on the single machine is basically only provided with one sample rack conveying track, so that the sample rack is easy to block during transport, the former analyzer cannot obtain a sample to be analyzed when using the sample, the sample rack transport efficiency is low, and the due detection speed of the double-machine online cannot be exerted.
Disclosure of Invention
The application provides a sample analysis system and a conveying method thereof, which are used for solving the technical problems that in the prior art, the sample conveying efficiency is low, and the due detection speed of an analyzer in a double-machine online process cannot be exerted.
In order to solve the technical problem, the application adopts a technical scheme that: there is provided a sample analysis system comprising: at least one first sample analyzer, at least one second sample analyzer and a sample transport device connecting the first sample analyzer and the second sample analyzer, the sample transport device comprising: the first conveying assembly is used for conveying a first sample rack provided with a tube to be tested to the first sample sucking position along the first conveying channel so as to be used for the first sample analyzer to perform analysis and test on a sample; the second conveying assembly is arranged on one side of the first conveying assembly and is provided with a second conveying channel, the second sample analyzer is provided with a second sample sucking position corresponding to the second conveying channel, and the second conveying assembly is used for conveying the second sample rack to the second sample sucking position along the second conveying channel so that the second sample analyzer can analyze and test samples; the pushing assembly is positioned on one side, far away from the second conveying assembly, of the first conveying assembly and is used for pushing the first sample rack to the first conveying assembly or pushing the second sample rack to the second conveying assembly; the pushing assembly pushes the second sample rack to the second conveying assembly through the first bridging assembly.
Furthermore, the first sample analyzer is provided with a third sample sucking position corresponding to the second conveying channel, the second sample analyzer is provided with a fourth sample sucking position corresponding to the first conveying channel, the first sample rack passes through the first sample sucking position and the fourth sample sucking position in the conveying process, and the second sample rack passes through the second sample sucking position and the third sample sucking position in the conveying process.
Further, the first sample analyzer comprises a first sampling assembly, the first sampling assembly comprises a first sampling needle moving along a first sampling path, the second sample analyzer comprises a second sampling assembly, the second sampling assembly comprises a second sampling needle moving along a second sampling path, and the first sampling path and the second sampling path are arranged in parallel and are both perpendicular to the first conveying channel or the second conveying channel.
Further, a first and a third draw position are arranged along the first sampling path, the first sampling needle being movable between the first and the third draw position; the second and fourth draw sites are disposed along a second sampling path, and the second sampling needle is movable between the second and fourth draw sites.
Further, the first sample analyzer and the second sample analyzer are used for detecting the first detection item, or the first sample analyzer is used for detecting the first detection item, and the second sample analyzer is used for detecting the second detection item, or the first sample analyzer is used for detecting the first detection item, and the second sample analyzer is used for detecting the first detection item and the second detection item.
Further, the first conveying assembly comprises a first rail and a first driving member, the first rail forms a first conveying channel, and the first driving member is used for driving the first sample rack to move to the first sample sucking position along the first rail.
Further, a first bridging member is telescopically disposed at one end of the first rail, and a first driving member is used to compress/expand the first bridging member.
Furthermore, an avoiding position is arranged on the first track and arranged on one side of the first bridging component, and is used for avoiding the interference between the first sample rack on the first track and the first bridging component.
Further, the second conveying assembly comprises a second rail and a second driving member, the second rail and the first rail are arranged side by side, the second rail forms a second conveying channel, and the second driving member is used for driving the second sample rack to move to the second sample sucking position along the second rail.
Further, a blocking member is arranged between the first conveying assembly and the second conveying assembly and used for blocking the first sample rack on the first conveying assembly and the second sample rack on the second conveying assembly.
Furthermore, one side, far away from the second conveying assembly, of the first conveying assembly is provided with a sample rack loading area, the sample rack loading area is located at the head end of the first conveying assembly, the pushing assembly is located in the sample rack loading area, a first guide piece is arranged on one side of the sample rack loading area, and the first guide piece is used for fixing and guiding a first sample rack and a second sample rack in the sample rack loading area.
Further, the end of the first transporting assembly is provided with a sample rack unloading area, the sample rack unloading area is located on one side of the first transporting assembly away from the second transporting assembly, and the sample transporting device further comprises: an unloading assembly for moving the first sample rack on the first transport assembly and/or the second sample rack on the second transport assembly to the sample rack unloading zone; and the second bridging component is arranged at the tail end of the first conveying component, and the unloading component moves the second sample rack on the second conveying component to the sample rack unloading area through the second bridging component.
In order to solve the technical problem, the application adopts a technical scheme that: there is provided a transportation method of a sample analysis system, the transportation method including, based on the sample analysis system of any one of the above embodiments: the pushing assembly pushes the second sample rack containing the tube to be tested to the second conveying assembly through the first bridging assembly; the pushing assembly pushes the first sample rack to the first conveying assembly; conveying the to-be-tested tube on the second sample rack to a second sample sucking position through a second conveying assembly, and conveying the to-be-tested tube on the first sample rack to a first sample sucking position through a first conveying assembly; and carrying out analysis test on the sample of the tube to be tested on the second sample rack at the second sample sucking position through the second sample analyzer, and carrying out analysis test on the sample of the tube to be tested on the first sample rack at the first sample sucking position through the first sample analyzer.
Further, after the step of performing the analytical test of the sample on the tube to be tested on the second sample rack at the second sample suction position by the second sample analyzer, the transporting method further includes: when the sample detection result of the second sample sucking position is confirmed to be abnormal, the tube to be tested on the second sample rack is moved to the second sample sucking position through the second conveying assembly, the second sample analyzer performs sample retest on the tube to be tested on the second sample rack at the second sample sucking position, or the first sample analyzer is further provided with a third sample sucking position corresponding to the second conveying channel, and after the step of performing sample analysis test on the tube to be tested on the second sample rack at the second sample sucking position through the second sample analyzer, the conveying method further comprises the following steps: conveying the to-be-tested tube on the second sample rack to a third sample sucking position through a second conveying assembly; and rechecking the sample of the tube to be tested on the second sample rack at the third sample sucking position by the first sample analyzer.
Further, after the step of performing an analytical test of a sample by the first sample analyzer on the tube to be tested on the first sample rack at the first sample suction position, the transporting method further includes: when the sample detection result of the first sample sucking position is confirmed to be abnormal, the first conveying assembly conveys the to-be-tested tube on the first sample rack to the first sample sucking position; and then the first sample analyzer re-examines the sample of the tube to be tested on the first sample rack at the first sample suction position, or,
the second sample analyzer is also provided with a fourth sample sucking position corresponding to the first conveying channel, and after the step of carrying out the analysis test on the to-be-tested pipe on the first sample rack of the first sample sucking position through the first sample analyzer, the conveying method further comprises the following steps: conveying the to-be-tested tube on the first sample rack to a fourth sample sucking position through a first conveying assembly; and carrying out sample rechecking on the pipe to be tested on the first sample rack at the fourth sample sucking position by the second sample analyzer.
The beneficial effect of this application is: the sample analysis system of the present application includes at least a first sample analyzer, at least a second sample analyzer, and a sample transport device connecting the first sample analyzer and the second sample analyzer. The sample transport device includes a first transport assembly, a second transport assembly, a pushing assembly, and a first bridging assembly. The first conveying assembly is used for conveying the first sample rack to the first sample sucking position, the second conveying assembly is used for conveying the second sample rack to the second sample sucking position, and the pushing assembly is used for pushing the first sample rack and/or the second sample rack to the first conveying assembly and/or the second conveying assembly. The sample analysis system is simple in structure, can meet the requirements of two analyzers on samples, improves the working efficiency of double-machine online, and reduces the requirement on space occupation during online.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, it is obvious that the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without inventive efforts, wherein:
FIG. 1 is a schematic block diagram of one embodiment of a sample analysis system provided herein;
FIG. 2 is a schematic view of a portion of the sample analysis system shown in FIG. 1;
FIG. 3 is a schematic flow chart diagram of a first embodiment of a method of transporting a sample analysis system provided herein;
fig. 4 is a schematic flow chart of a second embodiment of a transportation method of the sample analysis system provided in the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that if directional indications (such as up, down, left, right, front, and back … …) are referred to in the embodiments of the present application, the directional indications are only used to explain the relative positional relationship between the components, the movement situation, and the like in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indications are changed accordingly.
In addition, if there is a description of "first", "second", etc. in the embodiments of the present application, the description of "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present application.
The application firstly provides a sample analysis system, and the sample analysis system can meet the respective requirements of at least two sample analyzers on samples, and improves the detection efficiency of the samples. The sample analysis system will be described below by taking a dual-computer online example. It is understood that the sample analysis system may be a cascaded pipeline of three or more.
As shown in fig. 1 and fig. 2, fig. 1 is a schematic structural diagram of an embodiment of a sample analysis system provided in the present application, and fig. 2 is a schematic partial structural diagram of the sample analyzer system shown in fig. 1, where the sample analysis system 100 includes: a first sample analyzer 31, a second sample analyzer 32, and a sample transport device 10 connecting the first sample analyzer 31 and the second sample analyzer 32.
The sample transport device 10 can transport samples to the first sample analyzer 31 and the second sample analyzer 32 through sample racks, for example, the sample racks are used for placing tubes to be tested, and the tubes to be tested store samples to be tested.
Specifically, as shown in fig. 1, the sample transport device 10 includes: a first transport assembly 11, a second transport assembly 12, a pushing assembly 13 and a first bridging assembly 14.
As shown in fig. 1 and 2, the first transport assembly 11 is formed with a first transport path (not labeled), the first sample analyzer 31 is provided with a first sample suction position 41 corresponding to the first transport path, and the first sample analyzer 31 can perform an analysis test on a sample at the first sample suction position 41. The first transport assembly 11 is used for transporting the tube to be tested on the first sample rack to the first sample suction position 41 along the first transport path, so that the first sample analyzer 31 can perform the analysis test of the sample.
The second transporting assembly 12 is disposed at one side of the first transporting assembly 11, a second transporting channel is formed in the second transporting assembly 12, a second sample sucking position 42 is disposed on the second sample analyzer 32 corresponding to the second transporting channel, the second sample analyzer 32 can analyze and test a sample at the second sample sucking position 42, and the second transporting assembly 12 is configured to transport a tube to be tested on the second sample rack to the second sample sucking position 42 along the second transporting channel, so that the second sample analyzer 32 can perform an analysis and test on the sample.
The pushing assembly 13 is located on a side of the first transport assembly 11 away from the second transport assembly 12, and is used for pushing the first sample rack/the second sample rack to the first transport assembly 11 and/or the second transport assembly 12. Specifically, the first bridging assembly 14 is disposed on the first transporting assembly 11, the pushing assembly 13 directly pushes the first sample rack to the first transporting assembly 11, and the pushing assembly 13 pushes the second sample rack to the second transporting assembly 12 through the first bridging assembly 14.
The sample analysis system 100 of this embodiment is simple in structure, and can transport the sample through the binary channels, improve the transport efficiency of sample, satisfy two analyzers separately to the demand of sample, improve the online work efficiency of duplex to the requirement that space occupied when reducing the online.
Further, as shown in fig. 1, a blocking member 101 is disposed between the first transport assembly 11 and the second transport assembly 12, and the blocking member 101 is used for blocking the first sample rack on the first transport assembly 11 and the second sample rack on the second transport assembly 12, so as to prevent the sample racks on the first transport assembly 11 and the second transport assembly 12 from interfering with each other, and improve the reliability of the sample analysis system 100.
Specifically, as shown in fig. 1, the first transporting assembly 11 may include a first rail 111 and a first driving member 112, the first rail 111 forms the first transporting channel, and the first driving member 112 is configured to drive the first sample rack to move on the first rail 111, that is, the first driving member 112 is configured to drive the to-be-tested tube on the first sample rack to move to the first sample sucking position 41 along the first rail 111. The first driving member 112 is a linear driving mechanism. In this embodiment, the first driving member 112 is disposed on the first rail 111 and can reciprocate along the first rail 111, and the first sample rack can be directly fixed on the first driving member 112 and driven by the first driving member 112 to move along the first rail 111. In other embodiments, the first driving member 112 may not be located on the first rail 111, and after the first sample rack is located on the first rail 111, the first driving member 112 is connected to the first sample rack and drives the first sample rack to move along the first rail 111.
In this embodiment, the second carrying assembly 12 is disposed side by side with the first carrying assembly 11. The side-by-side arrangement here includes the first transport element 11 and the second transport element 12 being arranged in parallel, and also includes the case where the first transport element 11 and the second transport element 12 are at an angle, but do not intersect. For example, the first carrying assembly 11 is located at one side of the second carrying assembly 12, and the included angle between the first carrying assembly 11 and the second carrying assembly 12 is 10 degrees.
Further, the second carriage assembly 12 includes a second rail 121 and a second drive member 122. The second track 121 forms the second transportation channel, and the second driving member 122 is configured to drive the second sample rack to move on the second track 121, that is, the second driving member 122 is configured to drive the second sample rack to move to the second sample sucking position 42 along the second track 121. The second driving member 122 is a linear driving mechanism. In this embodiment, the second driving member 122 is disposed on the second rail 121 and can reciprocate along the second rail 121, and the second sample rack can be directly fixed on the second driving member 122 and driven by the second driving member 122 to move along the second rail 121. In other embodiments, the second driving member 122 may not be located on the second rail 121, and after the second sample rack is located on the second rail 121, the second driving member 122 is connected to the second sample rack and drives the second sample rack to move along the second rail 121.
The pushing assembly 13 is located on a side of the first transporting assembly 11 away from the second transporting assembly 12, the pushing assembly 13 is configured to push the first sample rack to the first transporting assembly 11 so that the first sample rack can move to the first track 111, and the pushing assembly 13 is further configured to push the second sample rack to the second transporting assembly 12 so that the second sample rack can move to the second track 121.
As shown in fig. 1, a sample rack loading area 21 is disposed on a side of the first transport assembly 11 away from the second transport assembly 12, the sample rack loading area 21 is used for stacking a first sample rack and a second sample rack, and the pushing assembly 13 is located in the sample rack loading area 21 and is used for pushing the first sample rack in the sample rack loading area 21 to the first transport assembly 11 and pushing the second sample rack in the sample rack loading area 21 to the second transport assembly 12. A first guide 211 is provided at one side of the sample rack loading area 21, and the first guide 211 is used to fix and guide the sample rack in the sample rack loading area 21.
The first bridging assembly 14 is disposed on the first transporting assembly 11, and the pushing assembly 13 transmits the second sample rack to the second transporting assembly 12 through the first bridging assembly 14. That is, the first bridging member 14 is an intermediate member connecting the sample rack loading zone 21 and the second rail 121.
In one embodiment, the first bridging assembly 14 is telescopically disposed at one end (head end) of the first track 111, when the pushing assembly 13 pushes the first sample rack into the first transporting assembly 11, the first driving member 112 pushes the first bridging assembly 14, the first bridging assembly 14 is retracted to one side of the first track 111, the pushing assembly 13 pushes the first sample rack onto the first track 111, and when the first driving member 112 pushes the first sample rack to move along the first track 111, the first bridging assembly 14 is deployed, and the pushing assembly 13 pushes the second sample rack toward the second track 121 through the first bridging assembly 14.
In another embodiment, the first bridging unit 14 is not stretchable, the first bridging unit 14 is connected to one end (head end) of the first rail 111 through a first elastic member, that is, one end of the first elastic member is connected to the first bridging unit 14, the other end of the first elastic member is connected to one end of the first rail 111, the first driving member 112 pushes the first bridging unit 14, the first bridging unit 14 presses the first elastic member, the first elastic member deforms, so that the first bridging unit 14 can move towards one end of the first rail 111, when the acting force of the first driving member 112 on the first bridging unit 14 is cancelled, the first bridging unit 14 moves between the pushing unit 13 and the second rail 121 under the action of the first elastic member, so that the pushing unit 13 can transmit the second sample rack to the second rail 121 through the first bridging unit 14.
Further, as shown in fig. 1, the sample transport device 10 may further include an unloading assembly 15 and a second bridging assembly 16. The unloading assembly 15 is used to move the first sample rack on the first transport assembly 11 and the second sample rack on the second transport assembly 12 to predetermined positions. In this embodiment, the sample transport device 10 further comprises a sample rack unloading zone 22, and the unloading assembly 15 is used for moving the first sample rack on the first transport assembly 11 and the second sample rack on the second transport assembly 12 to the sample rack unloading zone 22.
Further, a second guide 221 may be provided at one side of the sample rack unloading zone 22, and the second guide 221 is used to fix and guide the first and second sample racks entering the sample rack unloading zone 22.
In this embodiment, the unloading assembly 15 may be located on a side of the second carrying assembly 12 away from the first carrying assembly 11. In other embodiments, the unloading assembly 15 may also be located within the sample rack unloading zone 22.
The second bridging assembly 16 is disposed at the other end (end) of the first transporting assembly 11, and the unloading assembly 15 moves the second sample rack on the second rail 121 to the sample rack unloading area 22 through the second bridging assembly 16.
In this embodiment, the second bridge member 16 is telescopically arranged at the end of the first rail 111, and the first driving member 112 can be used to retract/expand the second bridge member 16. The first driving member 112 pushes the second bridging member 16, the second bridging member 16 is retracted to the end of the first rail 111, when the first driving member 112 is removed, the second bridging member 16 is unfolded, and the pushing member 13 pushes the second sample rack on the second rail 121 to the sample rack unloading area 22 through the first bridging member 16. In other embodiments, a second elastic member is disposed between the second bridge member 16 and the end of the first rail 111, the first driving member 112 pushes the second bridge member 16, the second elastic member is contracted under force, and when the force applied by the first driving member 112 to the second bridge member 16 disappears, the second bridge member 16 returns to between the second rail 121 and the sample rack unloading area 22 under the action of the second elastic member, so that the unloading assembly 15 can move the second sample rack on the second rail 121 to the sample rack unloading area 22.
For example, in one specific embodiment, the workflow of the sample analysis system 100 is as follows: the first bridging assembly 14 is in the unfolded state, the pushing assembly 13 pushes the second sample rack in the sample rack loading area 21 onto the second rail 121 through the first bridging assembly 14, the second driving member 122 drives the second sample rack to move along the second rail 121, so as to transport the tube to be tested on the second sample rack to the second sample sucking position 42, so that the second sample analyzer 32 can perform the detection and analysis on the tube to be tested on the second sample rack at the second sample sucking position 42, the first driving member 112 pushes the first bridging member 14 to make the first bridging member 14 retract to one end of the first rail 111, the pushing member 13 pushes the first sample rack onto the first rail 111, and the first driving member 112 drives the first sample rack to move along the first rail 111, so as to convey the tube to be tested on the first sample rack to the first suction position 41, and the first sample analyzer 31 performs the detection analysis on the tube to be tested on the first sample rack of the first suction position 41. After the first and second sample analyzers 31 and 32 complete the sample testing, the first sample rack on the first rail 111 and the second sample rack on the second rail 121 are unloaded to the sample rack unloading zone 22 by the unloading assembly 15. Specifically, the unloading assembly 15 pushes the second sample rack on the second rail 121 to the sample rack unloading area 22 through the second bridging assembly 16, and when the first sample rack on the first rail 111 moves to the end of the first rail 111, the first driving member 112 pushes the second bridging assembly 16 to make the second bridging assembly 16 retract to the end of the first rail 111, and the unloading assembly 15 moves the first sample rack on the first rail 111 to the sample rack unloading area 22.
In the above-described embodiment, the first sample analyzer 31 and the second sample analyzer 32 may be used for detecting the same type of test items, and may also be used for detecting different types of test items.
In a specific embodiment, the first sample analyzer 31 and the second sample analyzer 32 may both be used to detect the first detection item. Alternatively, the first sample analyzer 31 and the second sample analyzer 32 are each a blood cell analyzer, and the first sample analyzer 31 and the second sample analyzer 32 may be both used for detecting blood routine test items. Alternatively, the first sample analyzer 31 and the second sample analyzer 32 may be both specific protein analyzers or immunoassay analyzers, and the first detection items may also be specific protein or immunoassay items.
In another embodiment, the first sample analyzer 31 is used to detect a first test item and the second sample analyzer 32 is used to detect a second test item. For example, the first sample analyzer 31 is a blood cell analyzer, the first test item is a blood routine test item, the second sample analyzer 32 is a specific protein analyzer or an immunoassay analyzer, and the second test item is a specific protein test or an immunoassay test item.
In other embodiments, the first analyzer 31 is configured to detect a first test item and the second analyzer 32 is configured to detect the first test item and a second test item. That is, the second sample analyzer 32 is set as a high-mix instrument, and the first sample analyzer 31 is set as a low-mix instrument. For example, the mode (or test item) used by the first sample analyzer 31 for testing the sample includes Blood-cell Count (CBC) and white Blood cell five classification (i.e., DIFF channel), which is generally named as CD mode; the patterns used by the second sample analyzer 32 to detect the sample include Blood-cell Count (CBC), white Blood cell five classification (i.e., DIFF channel), and reticulon red (i.e., RET channel), which are commonly designated as CDR patterns.
As shown in fig. 2, the first sample analyzer 31 may further be provided with a third sample suction position 43 corresponding to the second transport path, and the second sample analyzer 32 may further be provided with a fourth sample suction position 44 corresponding to the first transport path. The first sample rack passes through the first and fourth draw positions 41 and 44 during transport, and the second sample rack passes through the second and third draw positions 42 and 43 during transport.
Further, the first sample analyzer 31 includes a first sampling assembly (not shown) including a first sampling needle moving along a first sampling path, and the second sample analyzer 32 includes a second sampling assembly (not shown) including a second sampling needle moving along a second sampling path, the first sampling path and the second sampling path being arranged in parallel and perpendicular to the first transport path or the second transport path.
Further, a first draw position 41 and a third draw position 43 are arranged along the first sampling path, the first sampling needle being movable between the first draw position 41 and the third draw position 43; a second and a fourth draw bit 42, 44 are provided along a second sampling path, and a second sampling needle is movable between the second and the fourth draw bit 42, 44.
In the above embodiment, when the sample transport system 100 is in operation and a failure such as jamming occurs in one of the transport paths for transporting the sample rack, the transport path can be switched to another track for transporting the sample rack, and the side-by-side tracks can be used as spare tracks. Because every instrument corresponds two tracks and all is equipped with the suction appearance position respectively, consequently, uses reserve track, also can normally accomplish suction appearance and test, through this kind of mode for whole conveying system is more nimble. In addition, the sample analyzer can be flexibly selected to perform the retest on the sample, for example, the third sample sucking position 43 may be used to enable the first sample analyzer 31 to perform the retest on the sample on the second transporting path, and the fourth sample sucking position 44 may be used to enable the fourth sample analyzer 44 to perform the retest on the sample on the first transporting path. For a specific review process, please refer to the following description of the delivery method, which is not described herein.
The sample analysis system 100 is simple in structure, can meet the requirements of two analyzers on samples, and improves the working efficiency of the duplex machine.
The present application also provides a transportation method of the sample analysis system, which is applied to the sample analysis system 100 of any one of the above embodiments. The structure of the sample analysis system 100 is described in the above embodiments, and will not be described herein. As shown in fig. 3, fig. 3 is a schematic flowchart of a first embodiment of a transportation method of a sample analysis system provided in the present application, and the transportation method of the sample analysis system includes:
s21: the pushing assembly pushes the second sample rack containing the tube to be tested to the second transport assembly through the first bridging assembly.
S22: the pushing assembly pushes the first sample rack onto the first transport assembly.
S23: and the to-be-tested tube on the second sample rack is conveyed to the second sample sucking position through the second conveying assembly, and the to-be-tested tube on the first sample rack is conveyed to the first sample sucking position through the first conveying assembly.
S24: and carrying out analysis test on the sample of the tube to be tested on the second sample rack at the second sample sucking position through the second sample analyzer, and carrying out analysis test on the sample of the tube to be tested on the first sample rack at the first sample sucking position through the first sample analyzer.
In the transportation method of the sample analyzer, the pushing assembly can push the second sample rack onto the second transportation assembly through the bridging assembly, and then the pushing assembly pushes the first sample rack onto the first transportation assembly. In other embodiments, the pushing assembly may push the first sample rack onto the first transport assembly and then push the second sample rack onto the second transport assembly.
The second transports the subassembly and transports the pipe of waiting to test on the second sample frame to the second and inhale the appearance position, and the first subassembly that transports the pipe of waiting to test on the first sample frame to first and inhale the appearance position, so, can satisfy second sample analysis appearance and first sample analysis appearance demand to the sample respectively, improve sample detection's efficiency.
In summary, the transportation method of the sample analysis system provided by the application is simple in process, can meet the respective requirements of the two analyzers for the sample, improves the working efficiency of the dual-computer online, and reduces the requirement for space occupation during online.
As shown in fig. 4, fig. 4 is a schematic flow chart of a second embodiment of a transportation method of a sample analysis system provided in the present application, in this embodiment, a third sample sucking position is further disposed on the first sample analyzer corresponding to the second transportation channel, and a fourth sample sucking position is further disposed on the second sample analyzer corresponding to the first transportation channel, and the transportation method of this embodiment includes:
s31: the pushing assembly pushes the second sample rack containing the tube to be tested onto the second transport assembly through the first bridging assembly.
S32: the pushing assembly pushes the first sample rack onto the first conveying assembly.
S33: and the to-be-tested tube on the second sample rack is conveyed to the second sample sucking position through the second conveying assembly, and the to-be-tested tube on the first sample rack is conveyed to the first sample sucking position through the first conveying assembly.
S34: and carrying out analysis test on the sample of the tube to be tested on the second sample rack at the second sample sucking position through the second sample analyzer, and carrying out analysis test on the sample of the tube to be tested on the first sample rack at the first sample sucking position through the first sample analyzer.
S35: when the sample detection result of the second sample sucking position is confirmed to be abnormal, the second conveying assembly moves the tube to be tested on the second sample rack to the second sample sucking position, the second sample analyzer performs sample retest on the tube to be tested on the second sample rack at the second sample sucking position, or the second conveying assembly conveys the tube to be tested on the second sample rack to the third sample sucking position, and the first sample analyzer performs sample retest on the tube to be tested on the second sample rack at the third sample sucking position.
S36: when confirming that the sample test result of the first sample suction position is abnormal, the to-be-tested tube on the first sample rack is conveyed to the first sample suction position through the first conveying assembly, the to-be-tested tube on the first sample rack of the first sample suction position is subjected to sample reinspection through the first sample analyzer, or the to-be-tested tube on the first sample rack is conveyed to the fourth sample suction position through the first conveying assembly, and the to-be-tested tube on the first sample rack of the fourth sample suction position is subjected to sample reinspection through the second sample analyzer.
Specifically, in this embodiment, after the first sample analyzer performs an analysis test on the sample at the first sample suction position, if the test result is abnormal, the first transport assembly may also transport the tube to be tested on the first sample rack to the fourth sample suction position of the second sample analyzer, so as to perform a sample retest on the tube to be tested on the first sample rack by the second sample analyzer. Or when the sample detection result of the first sample analyzer to the first sample sucking position is confirmed to be abnormal, the to-be-tested tube on the first sample rack is conveyed to the first sample sucking position through the first conveying assembly, and then the sample is rechecked through the first sample analyzer. Thus, the reliability of sample detection can be improved.
After the second sample analyzer analyzes and tests the sample at the second sample suction position, if the test result is abnormal, the second conveying assembly can convey the pipe to be tested on the second sample rack to the third sample suction position, so that the first sample analyzer can recheck the sample of the pipe to be tested on the second sample rack. Or when the sample detection result of the second sample analyzer to the second sample sucking position is confirmed to be abnormal, the second sample rack is conveyed to the second sample sucking position through the second sample conveying assembly, so that the second sample analyzer can perform retest on the sample, and therefore the accuracy of the sample detection result can be improved.
In other embodiments, the second analyzer may be configured as a high-distribution instrument, and the first sample analyzer may be configured as a low-distribution instrument. Therefore, when the sample detection result of the first sample analyzer to the first sample suction position is abnormal, the to-be-tested tube on the first sample rack can be conveyed to the fourth sample suction position corresponding to the second analyzer through the first conveying assembly, and the second analyzer in high-matching mode can perform sample retest on the to-be-tested tube on the first sample rack.
Different from the previous embodiment, in the present embodiment, the sample can be retested by the same analyzer and different analyzers, so that the reliability of the sample detection result can be improved.
The above embodiments are merely examples and are not intended to limit the scope of the present disclosure, and all modifications, equivalents, and flow charts using the contents of the specification and drawings of the present disclosure, which are directly or indirectly applied to other related technical fields, are included in the scope of the present disclosure.
Claims (13)
1. A sample analysis system, comprising: at least a first sample analyzer, at least a second sample analyzer, and a sample transport apparatus connecting the first sample analyzer and the second sample analyzer, the sample transport apparatus comprising:
the first conveying assembly is used for conveying a first sample rack filled with a tube to be tested to the first sample sucking position along the first conveying channel so as to be used for the first sample analyzer to perform analysis and test on a sample, and comprises a first rail and a first driving piece, wherein the first rail forms the first conveying channel, and the first driving piece is used for driving the first sample rack to move to the first sample sucking position along the first rail;
the second conveying assembly is arranged on one side of the first conveying assembly, a second conveying channel is formed, a second sample sucking position is arranged on the second sample analyzer corresponding to the second conveying channel, and the second conveying assembly is used for conveying a second sample rack to the second sample sucking position along the second conveying channel so that the second sample analyzer can analyze and test samples;
the pushing assembly is positioned on one side, far away from the second conveying assembly, of the first conveying assembly and used for pushing the first sample rack to the first conveying assembly or pushing the second sample rack to the second conveying assembly;
a first bridging component disposed on the first transport component, the first bridging component being telescopically disposed at one end of the first rail, and the first driving component being configured to compress/expand the first bridging component, wherein when the pushing component pushes the first sample rack into the first transport component, the first driving component pushes the first bridging component to contract the first bridging component at one end of the first rail, and when the first driving component pushes the first sample rack to move along the first rail, the first bridging component expands to push the pushing component to push the second sample rack toward the second transport component through the first bridging component.
2. The sample analysis system of claim 1, wherein the first sample analyzer is provided with a third draw position corresponding to the second transport lane, the second sample analyzer is provided with a fourth draw position corresponding to the first transport lane, the first sample rack passes through the first draw position and the fourth draw position during transport, and the second sample rack passes through the second draw position and the third draw position during transport.
3. The sample analysis system of claim 2, wherein the first sample analyzer includes a first sampling assembly including a first sampling needle that moves along a first sampling path, and the second sample analyzer includes a second sampling assembly including a second sampling needle that moves along a second sampling path, the first sampling path being disposed parallel to the second sampling path and both being disposed perpendicular to the first transport channel or the second transport channel.
4. The sample analysis system of claim 3, wherein the first and third draw sites are disposed along the first sampling path, the first sampling needle being movable between the first and third draw sites; the second and fourth draw sites are disposed along the second sampling path, and the second sampling needle is movable between the second and fourth draw sites.
5. The sample analysis system of claim 1, wherein the first sample analyzer and the second sample analyzer are configured to detect a first detection item, or,
the first sample analyzer is for detecting the first test item, the second sample analyzer is for detecting the second test item, or,
the first sample analyzer is configured to detect the first detection item, and the second sample analyzer is configured to detect the first detection item and the second detection item.
6. The sample analysis system of claim 1, wherein an avoidance position is disposed on the first rail, the avoidance position being disposed on a side of the first bridging assembly for avoiding interference between the first sample rack on the first rail and the first bridging assembly.
7. The sample analysis system of claim 1, wherein the second transport assembly comprises a second track disposed alongside the first track, the second track forming the second transport channel, and a second drive for driving the second sample rack to move along the second track to the second draw position.
8. The sample analysis system of claim 1, wherein a barrier is disposed between the first transport assembly and the second transport assembly for blocking the first sample rack on the first transport assembly and the second sample rack on the second transport assembly.
9. The sample analysis system of claim 1, wherein a side of the first transport assembly remote from the second transport assembly is provided with a sample rack loading area, the sample rack loading area is located at a head end of the first transport assembly, the pushing assembly is located at the sample rack loading area,
and a first guide piece is arranged on one side of the sample rack loading area and used for fixing and guiding the first sample rack and the second sample rack in the sample rack loading area.
10. The sample analysis system of claim 9, wherein the end of the first transport assembly is provided with a sample rack unloading zone located on a side of the first transport assembly remote from the second transport assembly, the sample transport device further comprising:
an unloading assembly for moving the first sample rack on the first transport assembly and/or the second sample rack on the second transport assembly to the sample rack unloading zone;
a second bridging assembly disposed at an end of the first transport assembly, the unloading assembly moving the second sample rack on the second transport assembly to the sample rack unloading area through the second bridging assembly.
11. A transportation method of a sample analysis system, based on the sample analysis system according to any one of claims 1 to 10, the transportation method comprising:
the pushing assembly pushes the second sample rack containing the tube to be tested to the second conveying assembly through the first bridging assembly;
the pushing assembly pushes the first sample rack onto the first conveying assembly;
conveying the tube to be tested on the second sample rack to a second sample sucking position through the second conveying assembly, and conveying the tube to be tested on the first sample rack to a first sample sucking position through the first conveying assembly;
and carrying out analysis testing on the sample of the tube to be tested on the second sample rack at the second sample sucking position through a second sample analyzer, and carrying out analysis testing on the sample of the tube to be tested on the first sample rack at the first sample sucking position through a first sample analyzer.
12. The conveyance method according to claim 11,
after the step of performing the analytical test of the sample on the tube to be tested on the second sample rack at the second draw position by the second sample analyzer, the transporting method further includes: when the sample detection result of the second sample sucking position is confirmed to be abnormal, the tube to be tested on the second sample rack is moved to the second sample sucking position through the second conveying assembly, and the tube to be tested on the second sample rack at the second sample sucking position is subjected to sample retest through the second sample analyzer, or,
the first sample analyzer is further provided with a third sample sucking position corresponding to the second conveying channel, and after the step of performing the analysis test on the sample by the second sample analyzer on the tube to be tested on the second sample rack at the second sample sucking position, the conveying method further comprises the following steps: conveying the tube to be tested on the second sample rack to the third sample sucking position through the second conveying assembly; and carrying out sample rechecking on the pipe to be tested on the second sample rack at the third sample sucking position through the first sample analyzer.
13. The conveyance method according to claim 11,
after the step of performing the analytical test of the sample by the first sample analyzer on the tube to be tested on the first sample rack at the first sampling position, the transporting method further includes: when the sample detection result of the first sample sucking position is confirmed to be abnormal, the first conveying assembly conveys the to-be-tested tube on the first sample rack to the first sample sucking position; and then the first sample analyzer rechecks the sample of the tube to be tested on the first sample rack at the first sample sucking position, or,
the second sample analyzer is also provided with a fourth sample sucking position corresponding to the first conveying channel, and after the step of performing the analysis test on the sample to be tested on the first sample rack at the first sample sucking position through the first sample analyzer, the conveying method further comprises the following steps: conveying the tube to be tested on the first sample rack to the fourth sample sucking position through the first conveying assembly; and carrying out sample rechecking on the pipe to be tested on the first sample rack at the fourth sample sucking position through the second sample analyzer.
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| CN110398603A (en) * | 2018-04-25 | 2019-11-01 | 深圳迈瑞生物医疗电子股份有限公司 | A kind of sample analysis system and a kind of sample analysis system control method |
| CN110398605A (en) * | 2018-04-25 | 2019-11-01 | 深圳迈瑞生物医疗电子股份有限公司 | A kind of blood cell sample analysis system and analysis system control method |
| CN210604674U (en) * | 2019-05-28 | 2020-05-22 | 深圳迈瑞生物医疗电子股份有限公司 | Sample analysis system and sample on-shelf analysis system |
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