CN114069315A - Socket, socket unit, inspection tool, and inspection tool unit - Google Patents
Socket, socket unit, inspection tool, and inspection tool unit Download PDFInfo
- Publication number
- CN114069315A CN114069315A CN202110848991.9A CN202110848991A CN114069315A CN 114069315 A CN114069315 A CN 114069315A CN 202110848991 A CN202110848991 A CN 202110848991A CN 114069315 A CN114069315 A CN 114069315A
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- China
- Prior art keywords
- wall member
- socket
- housing
- housings
- opening
- Prior art date
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- 238000007689 inspection Methods 0.000 title claims abstract description 42
- 239000000523 sample Substances 0.000 claims abstract description 52
- 230000004048 modification Effects 0.000 description 8
- 238000012986 modification Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 3
- 230000000149 penetrating effect Effects 0.000 description 2
- 230000004308 accommodation Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000005323 electroforming Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/46—Bases; Cases
- H01R13/502—Bases; Cases composed of different pieces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/46—Bases; Cases
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Environmental & Geological Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Connector Housings Or Holding Contact Members (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
Socket, socket unit, inspection tool and inspection tool unit. Provided is a socket capable of easily changing the number of housed probes. The socket includes a 1 st wall member and a 2 nd wall member arranged at a distance from each other, and a housing laminate arranged between the 1 st wall member and the 2 nd wall member. The 1 st wall part and the 2 nd wall part are each connected to the housing stack in a detachable manner. The case stacked body has a plurality of cases detachably connected to each other. Each housing has a 1 st opening provided at one end, a 2 nd opening provided at the other end, and a housing section connected to the 1 st opening and the 2 nd opening. The housing section is configured to be able to house the probe in a state where the 1 st contact is exposed to the outside from the 1 st opening and the 2 nd contact is exposed to the outside from the 2 nd opening.
Description
Technical Field
The invention relates to a socket, a socket unit, an inspection tool and an inspection tool unit.
Background
In electronic component modules such as cameras and liquid crystal panels, conduction inspection, operation characteristic inspection, and the like are generally performed in the manufacturing process thereof. These inspections are performed by connecting terminals for connection to a main body substrate provided in an electronic component module and terminals of an inspection apparatus using probes.
As a socket for housing such a probe, there is a socket described in patent document 1. The socket includes a pair of housings having a housing recess, and a positioning member for positioning the pair of housings independently of each other.
Documents of the prior art
Patent document
Patent document 1: japanese patent laid-open publication No. 2017-223630
In recent years, as inspection apparatuses and electronic component modules have diversified, the number of probes required for inspection has also diversified. In the socket of patent document 1, the number of accommodated probes is not considered to be varied.
Disclosure of Invention
The invention aims to provide a socket capable of easily changing the number of accommodated probes.
Means for solving the problems
A socket according to an aspect of the present invention is a socket capable of accommodating a probe having a 1 st contact and a 2 nd contact, the socket including: a 1 st wall member and a 2 nd wall member which are arranged at intervals in a 1 st direction; and a housing laminate disposed between the 1 st wall member and the 2 nd wall member, the 1 st wall member and the 2 nd wall member being detachably connected to the housing laminate, respectively, the case laminated body has a plurality of cases which are arranged along the 1 st direction and are separably connected to each other, the plurality of cases each have a 1 st opening provided at one end in a 2 nd direction intersecting the 1 st direction, a 2 nd opening provided at the other end in the 2 nd direction, and a receiving portion provided inside each of the plurality of cases and connected to the 1 st opening and the 2 nd opening, the housing portion is configured to be able to house the probe in a state where the 1 st contact is exposed to the outside from the 1 st opening and the 2 nd contact is exposed to the outside from the 2 nd opening.
A socket unit according to one embodiment of the present invention includes: a plurality of sockets of the above-described manner; and a base housing that positions the plurality of receptacles independently of each other and integrally holds the receptacles.
An inspection tool according to an embodiment of the present invention includes: a socket of the manner described; and a probe received in the receiving portion.
An inspection tool unit according to an embodiment of the present invention includes: the socket unit of the above-described manner; and a probe received in the receiving portion.
Effects of the invention
According to the socket, it has: a 1 st wall member and a 2 nd wall member which are arranged at intervals in a 1 st direction; and a housing stack disposed between the 1 st wall member and the 2 nd wall member. The 1 st wall part and the 2 nd wall part are each connected to the housing stack in a detachable manner. The case laminated body has a plurality of cases which are arranged along the 1 st direction and are separably connected to each other. The plurality of housings each have a housing portion capable of housing the probe. With this configuration, by changing the number of housings, it is possible to realize a socket in which the number of housed probes can be easily changed.
According to the socket unit, the socket unit in which the number of the housed probes can be easily changed can be realized.
According to the inspection tool, the socket can be used to realize an inspection tool capable of easily changing the number of contact poles.
According to the inspection tool unit, the socket unit can be used to realize an inspection tool unit capable of easily changing the number of contact poles.
Drawings
Fig. 1 is a perspective view showing an inspection tool having a socket according to an embodiment of the present invention.
Fig. 2 is a sectional view taken along line II-II of fig. 1.
Fig. 3 is a sectional view taken along the line III-III of fig. 1.
Fig. 4 is a plan view of a state in which 2 sockets of fig. 1 are arranged side by side.
Fig. 5 is a perspective view for explaining a method of removing 1 housing from the housing laminate of the socket of fig. 1.
Fig. 6 is a perspective view showing a 1 st modification of the socket of fig. 1.
Fig. 7 is a perspective view showing a 2 nd modification of the socket of fig. 1.
Fig. 8 is a perspective view showing a 3 rd modification of the socket of fig. 1.
Fig. 9 is an enlarged perspective view showing a 4 th modification of the socket of fig. 1.
Fig. 10 is a sectional view showing a 5 th modification of the socket of fig. 1.
Fig. 11 is a perspective view showing a 6 th modification of the socket of fig. 1.
Fig. 12 is an enlarged perspective view showing a 7 th modification of the socket of fig. 1.
Fig. 13 is a perspective view illustrating an inspection tool unit having a plurality of the inspection tools of fig. 1.
Description of the reference symbols
1 socket
2 socket unit
10 st 1 wall part
11 part 1
111 No. 1
112 No. 2
12 nd 2 nd part
13 through hole
14 st recess
15. 16 projection
20 nd 2 wall part
21 part 1
211 st surface 1
212 No. 2
22 nd 2 nd part
23 through hole
24 nd 2 nd recess
30 outer shell laminate
31 outer casing
32 st opening part
33 No. 2 opening part
34 receiving part
35 gap
36 cover part
361 through hole
37 projection
38 recess
40 Probe
41 st contact
42 nd contact
43 elastic part
431. 432 elastic sheet
44. 45 contact part
441. 451 Main body part
442 support part
452A projection
50 connecting part
60 basic shell
100 inspection tool
200 inspection tool unit
Detailed Description
An example of the present invention will be described below with reference to the drawings. In the following description, terms indicating specific directions or positions (for example, terms including "up", "down", "right" and "left") are used as necessary, but these terms are used for the purpose of facilitating understanding of the present invention with reference to the drawings, and the technical scope of the present invention is not limited by the meaning of these terms. The following description is merely exemplary in nature and is not intended to limit the present invention, the application of the present invention, or the use of the present invention. Further, the drawings are schematic, and the ratio of the dimensions and the like do not necessarily match the actual situation.
The socket 1 according to one embodiment of the present invention is, for example, an insulating substantially rectangular parallelepiped shape, and includes, as shown in fig. 1, a 1 st wall member 10 and a 2 nd wall member 20 arranged at an interval in a 1 st direction (for example, an X direction), and a case laminated body 30 arranged between the 1 st wall member 10 and the 2 nd wall member 20. The socket 1 has a substantially rectangular shape in which the 1 st direction X is the longitudinal direction when viewed along the 2 nd direction (for example, the Z direction) intersecting the 1 st direction. Fig. 1 shows an inspection tool 100 in which a plurality of probes 40 are accommodated in a socket 1, as an example.
The 1 st wall member 10 and the 2 nd wall member 20 are each substantially L-shaped plate-like, and are connected to the case laminated body 30 so as to be separable from each other. Specifically, the 1 st wall member 10 and the 2 nd wall member 20 are respectively constituted by the 1 st members 11 and 21 connected to the housing stack 30, and the 2 nd members 12 and 22 connected to the 1 st members 11 and 21.
The 1 st members 11 and 21 are substantially rectangular plate-shaped, are arranged so that the 1 st direction X is the plate thickness direction, and one surface (hereinafter referred to as the 1 st surface 111 and 211) facing in the 1 st direction X faces the case laminated body 30.
The 2 nd members 12 and 22 are substantially rectangular plate-shaped and are arranged so that the 2 nd direction Z is the plate thickness direction. The 2 nd members 12 and 22 extend in the 1 st direction X and in a direction away from the case laminated body 30 from the other surface (in other words, the 2 nd surface 112 and 212 on the opposite side of the 1 st surface 111 and 211 facing the case laminated body 30 in the 1 st direction X) of the 1 st members 11 and 21 facing in the 1 st direction X. The 2 nd members 12 and 22 are provided with through holes 13 and 23 as an example of attachment portions. The through holes 13 and 23 are configured to be able to receive a screw member (not shown), and the receptacle 1 can be attached to another member such as a base housing 60 (see fig. 13) via the screw member.
As shown in fig. 2, the 1 st member 11 of the 1 st wall member 10 has a 1 st recess 14 provided on the 1 st surface 111 facing the case laminate 30. The 1 st member 21 of the 2 nd wall member 20 has a 2 nd recess 24 provided on the 1 st surface 211 facing the case laminated body 30. In the present embodiment, the 1 st member 11 of the 1 st wall member 10 has 21 st recesses 14 arranged at intervals in the 2 nd direction Z, and the 1 st member 21 of the 2 nd wall member 20 has 2 nd recesses 24 arranged at intervals in the 2 nd direction Z. Each 1 st recess 14 is configured to be able to receive one end of a connecting member 50 described later, and each 2 nd recess 24 is configured to be able to receive the other end of the connecting member 50.
The housing laminate 30 includes a plurality of housings 31 arranged along the 1 st direction X and separably connected to each other.
As shown in fig. 3, each of the housings 31 has a 1 st opening 32 provided at one end in the 2 nd direction Z, a 2 nd opening 33 provided at the other end in the 2 nd direction Z, and a housing portion 34 provided inside each of the housings 31. The 1 st opening 32 is disposed at an end of each housing 31 distant from the center in the 3 rd direction Y. The width of the 1 st opening 32 in the 3 rd direction Y is smaller than the width of the receiving portion 34 in the 3 rd direction Y. The width of the 2 nd opening 33 in the 3 rd direction Y is substantially the same as the width of the housing 34 in the 3 rd direction Y. The housing portion 34 is connected to the 1 st opening 32 and the 2 nd opening 33, and is configured to be able to house the probe 40.
For example, the probe 40 is formed in an elongated thin plate shape by electroforming using a conductive material, and has contacts (hereinafter referred to as a 1 st contact 41 and a 2 nd contact 42) at both ends in the direction in which the probe 40 extends. The housing portion 34 is configured to be able to house the probe 40 such that the 1 st contact 41 is exposed from the 1 st opening 32 to the outside of the housing portion 34 and the 2 nd contact 42 is exposed from the 2 nd opening 33 to the outside of the housing portion 34. In the present embodiment, as shown in fig. 1, the 1 st contact 41 and the 2 nd contact 42 of the probe 40 stored in the storage portion 34 of each housing 31 are arranged at equal intervals on a straight line along the 1 st direction X. That is, the housing laminate 30 is configured to be able to house the plurality of probes 40 in a state in which the plurality of probes 40 are electrically independent from each other.
Each of the housings 31 has a notch 35, and the notch 35 penetrates each of the housings 31 in the 1 st direction X and opens at an end in the 2 nd direction Z in each of the housings 31. In the present embodiment, each of the housings 31 has notches 35 at both ends in the 2 nd direction Z. Each notch 35 is provided adjacent to the housing portion 34 in a 3 rd direction (for example, Y direction) intersecting the 1 st direction X and the 2 nd direction Z, and a connecting member 50 described later is disposed in each notch 35.
As shown in fig. 3, the probe 40 in the state of being accommodated in the accommodation portion 34 includes a meandering elastic portion 43 that expands and contracts in the 2 nd direction Z, and contact portions 44 and 45 provided at both ends of the elastic portion 43 in the 2 nd direction Z. The elastic portion 43 and the contact portions 44 and 45 are arranged in series along the 2 nd direction Z and are integrally configured.
The elastic portion 43 is constituted by a plurality of elastic pieces (2 elastic pieces 431 and 432 in the present embodiment). A through hole 433 is provided between the adjacent elastic pieces 431 and 432, and the through hole 433 penetrates the elastic portion 43 in the plate thickness direction (in other words, the 1 st direction X).
The one contact portion 44 includes a substantially rectangular main body portion 441 extending from the inside of the housing portion 34 toward the outside along the 2 nd direction Z, and a support portion 442 extending from the main body portion 441 toward the 3 rd direction Y inside the housing portion 34. The 1 st contact 41 is provided at an end portion of the body portion 441 located outside the housing portion 34. The support portion 442 contacts the inner surface of the housing 31 constituting the housing portion 34. The other contact portion 45 includes a main body portion 451 extending in the 3 rd direction Y inside the housing 31, and 2 protruding portions 452 extending from the main body portion 451 in the 2 nd direction Z toward the outside of the housing portion 34. A 2 nd contact 42 is provided at the end of each projection 452.
As shown in fig. 2, the socket 1 further includes a connection member 50, the connection member 50 extending in the 1 st direction X and detachably connecting each of the plurality of housings 31. For example, as shown in fig. 3, the connecting member 50 has a substantially cylindrical shape and is disposed in the notch 35 of each housing 31. In the present embodiment, the notch 35 has a substantially semicircular bottom surface along the outer surface of the connection member 50.
A distance from the 2 nd surface 112 of the 1 st wall member 10 to the housing 34 of each housing 31 in the 1 st direction X is L1N (N is the number of housings 31), and a distance from the 2 nd surface 212 of the 2 nd wall member 20 to the housing 34 of each housing 31 in the 1 st direction X is L2N (N is the number of housings 31). The socket 1 is configured to be equal to the distance L1N and the distance L2N. In the present embodiment, the thicknesses of the 1 st and 2 nd wall members 10 and 20 in the 1 st direction X are adjusted so that the distance L1N and the distance L2N are equal. Specifically, the thickness of the 1 st wall member 10 in the 1 st direction X is made larger than the thickness of the 2 nd wall member 20 in the 1 st direction X, and the receptacle 1 having the distance L1N and the distance L2N equal to each other is realized.
In addition, a distance from the 2 nd surface 112 of the 1 st wall member 10 to the center of the receiving portion 34 in the 1 st direction X in the 2 nd direction Z is set to a distance L1N. Similarly, the distance from the 2 nd surface 212 of the 2 nd wall member 20 to the center of the receiving portion 34 in the 1 st direction X when viewed along the 2 nd direction Z is set to be the distance L2N.
Fig. 4 shows a case where 2 sockets 1 are arranged so that the 1 st openings 32 are adjacent to each other in the 3 rd direction Y. As described above, the socket 1 is configured such that the distance L1N is equal to the distance L2N, and the 1 st openings 32 adjacent to each other are aligned in a straight line in the 3 rd direction Y. In fig. 4, the 1 st wall member 10 of one receptacle 1 is opposed to the 2 nd wall member 20 of the other receptacle 1, and the 2 nd surface 112 of the 1 st wall member 10 of one receptacle 1 and the 2 nd surface 212 of the 2 nd wall member 20 of the other receptacle 1 form substantially the same plane.
According to the socket 1, the following effects can be exhibited.
In the socket 1, it has: a 1 st wall member 10 and a 2 nd wall member 20 which are arranged at intervals in a 1 st direction; and a housing laminate 30 disposed between the 1 st wall member 10 and the 2 nd wall member 20. The 1 st wall part 10 and the 2 nd wall part 20 are each connected to the housing laminate 30 in a detachable manner. The case laminate 30 includes a plurality of cases 31 arranged along the 1 st direction and separably connected to each other. Each of the plurality of housings 31 has a housing portion 34 capable of housing the probe 40. With this configuration, by changing the number of the housings 31, the socket 1 in which the number of the housed probes 40 can be easily changed can be realized.
The plurality of housings 31 each have a notch 35, the notches 35 each penetrate the plurality of housings 31 in the 1 st direction and are open at the end in the 2 nd direction of each of the plurality of housings 31, and the connecting member 50 is disposed in the notch 35. According to this structure, the plurality of housings 31 can be easily detachably connected by the connecting member 50. Further, for example, as shown in fig. 5, by separating the 1 st wall member 10 from the case laminated body 30 and removing one connecting member 50, even the middle case 31 of the case 31 is disposed on both sides in the 1 st direction X, the case can be easily separated from the case laminated body 30. As a result, for example, even when one probe 40 of the plurality of probes 40 housed in the case laminate 30 fails, the case 31 housing the failed probe 40 can be separated from the case laminate 30 and replaced.
The 1 st wall member 10 has a 1 st recess 14, the 1 st recess 14 receiving one end of the connection member 50 in the 1 st direction, and the 2 nd wall member 20 has a 2 nd recess 24, the 2 nd recess 24 receiving the other end of the connection member 50 in the 1 st direction. With this configuration, the position of the connection member 50 in the 1 st direction X with respect to the 1 st wall member 10 or the 2 nd wall member 20 is determined by the bottom surface of the 1 st recess 14 or the 2 nd recess 24, and the connection member 50 can be easily attached to the 1 st wall member 10 or the 2 nd wall member 20.
The socket 1 is configured such that a distance L1N in the 1 st direction X from the 2 nd surface 112 of the 1 st wall member 10 to the housing 34 of each of the plurality of housings 31 is equal to a distance L2N in the 1 st direction X from the 2 nd surface 212 of the 2 nd wall member 20 to the housing 34 of each of the plurality of housings 31. With this configuration, the receptacle 1 having high versatility can be realized.
According to the inspection tool 100, the socket 1 can realize the inspection tool 100 in which the number of contact poles can be easily changed.
The socket 1 can also be configured as follows.
The number of the cases 31 constituting the case laminate 30 can be set arbitrarily. The case stacked body may be constituted by cases having the same shape and structure, or may include cases having different shapes and structures.
The 1 st wall part 10 and the 2 nd wall part 20 can be of any structure that can be detachably connected to the case laminate 30. For example, as shown in fig. 6, the through-hole 13 of the 1 st wall member 10 and the through-hole 23 of the 2 nd wall member 20 may be configured to be able to receive a pin instead of a screw member. For example, as shown in fig. 7 and 8, the 2 nd members 12 and 22 of the 1 st wall member 10 and the 2 nd wall member 20 may be omitted. In this case, the 1 st and 2 nd wall members 11 and 21 of the 1 st and 2 nd wall members 10 and 20 may be provided with the projection 15 as the mounting portion. In the receptacle 1 of fig. 7, the 1 st wall member 10 and the 2 nd wall member 20 each have a pair of projections 15, and the pair of projections 15 are provided on one surface in the 2 nd direction Y and arranged at an interval in the 3 rd direction Y. Each protrusion 15 has a substantially cylindrical shape, and is configured to be press-fitted into a hole or a recess provided in another member such as the base housing 60 (see fig. 13), for example. In the receptacle 1 of fig. 8, the 1 st wall member 10 and the 2 nd wall member 20 each have a projection 16, and the projections 16 are provided on the 2 nd surfaces 112 and 212 in the 1 st direction X and are arranged substantially at the center in the 3 rd direction Y. The projection 16 has a substantially rectangular parallelepiped shape, and is configured to be press-fitted into a groove or a slit provided in another member such as the base housing 60 (see fig. 13), for example.
The housing portion 34 of each housing 31 is not limited to be capable of housing one probe 40, and may be configured to be capable of housing a plurality of probes 40 as shown in fig. 9. The socket 1 of fig. 9 has the same 1 st wall member 10 as the socket 1 of fig. 7.
The number of the connecting members 50 is not limited to 2, and may be one as shown in fig. 10, for example. In the socket 1 of fig. 10, the connecting member 50 and the notch 35 each have a substantially T-shaped cross section. In the socket 1 of fig. 10, the 2 nd opening 33 is closed by the lid member 36. The lid member 36 is provided with a through hole 361 penetrating the lid member 36 in the thickness direction thereof, and the protruding portion 452 of the probe 40 is exposed to the outside of the housing portion 34 through the through hole 361. The socket 1 of fig. 10 has the same 2 nd wall members 20 as the socket 1 of fig. 7.
The connecting member 50 and the notch 35 may be omitted. In this case, as shown in fig. 11, for example, each housing 31 has a protrusion 37 provided on one surface in the 1 st direction X and a recess 38 provided on the other surface in the 1 st direction X. In the receptacle 1 of fig. 11, the projections 37 of the adjacent housings 31 are fitted into the recesses 38, whereby the housings 31 are connected to each other. As an example, the projection 37 and the recess 38 each have a substantially quadrangular shape when viewed along the 1 st direction X. The socket 1 of fig. 11 has the same 1 st wall member 10 as the socket 1 of fig. 7.
As shown in fig. 12, each housing 31 is not limited to being able to house one probe 40, and may be configured to house a plurality of probes 40. In the socket 1 of fig. 12, the shell laminate 30 includes a housing 31 in which 2 probes 40 are housed, and a housing 31 in which 3 probes 40 are housed. The socket 1 of fig. 12 has the same 2 nd wall members 20 as the socket 1 of fig. 7. The shape of the 1 st contact 41 differs between the probe pin 40 housed in the socket 1 of fig. 12 and the probe pin 40 housed in the socket 1 of fig. 1.
The outlet unit 2 can be configured by a plurality of outlets 1 and a base housing 60 that positions and integrally holds the outlets 1 independently of each other. Fig. 13 shows, as an example, an inspection tool unit 200 in which a plurality of probes 40 are housed in the socket unit 2. According to the socket unit 2, the socket 1 can realize the socket unit 2 in which the number of the probes 40 to be stored can be easily changed. Further, according to the inspection tool unit 200, the socket unit 2 can realize the inspection tool unit 200 in which the number of contact poles can be easily changed. In the inspection tool unit 200 of fig. 13, the pitch between the probes 40 in the 3 rd direction Y is adjusted, so that the inspection tool unit can be applied to various types of inspection apparatuses or terminals of inspection objects.
The 1 st recess 14 of the 1 st wall member 10 and the 2 nd recess 24 of the 2 nd wall member 20 may be through holes.
The socket 1 is not limited to the case where the distance L1N and the distance L2N are equal, and may be configured such that the distance L1N and the distance L2N are different.
The probe 40 is not limited to the above embodiment, and may have any shape and structure that can be accommodated in the accommodating portion 34 of the housing 31 and can expose the contact from the 1 st opening 32 and the 2 nd opening 33, respectively.
While various embodiments of the present invention have been described in detail with reference to the drawings, various embodiments of the present invention will be described last. In the following description, reference numerals are also added as an example.
A socket 1 according to claim 1 of the present invention is capable of housing a probe pin 40 having a 1 st contact 41 and a 2 nd contact 42, wherein the socket 1 includes: a 1 st wall member 10 and a 2 nd wall member 20 which are arranged at intervals in a 1 st direction; and a housing laminate 30 arranged between the 1 st wall member 10 and the 2 nd wall member 20, the 1 st wall part 10 and the 2 nd wall part 20 are each connected to the housing laminate 30 in a detachable manner, the case laminated body 30 has a plurality of cases 31 which are arranged along the 1 st direction and are separably connected to each other, the plurality of cases 31 each have a 1 st opening 32 provided at one end in a 2 nd direction intersecting the 1 st direction, a 2 nd opening 33 provided at the other end in the 2 nd direction, and a housing portion 34 provided inside each of the plurality of cases 31 and connected to the 1 st opening 32 and the 2 nd opening 33, the housing portion 34 is configured to be able to house the probe pin 40 in a state where the 1 st contact 41 is exposed to the outside from the 1 st opening 32 and the 2 nd contact 42 is exposed to the outside from the 2 nd opening 33.
The socket 1 according to claim 2 of the present invention further includes a connection member 50, the connection member 50 extending in the 1 st direction and detachably connecting the housings 31 of the plurality of housings 31, the housings 31 each having a notch 35, the notches 35 penetrating the housings 31 in the 1 st direction and being open at the end in the 2 nd direction of each of the housings 31, the connection member 50 being disposed in the notches 35.
In the socket 1 according to the 3 rd aspect of the present invention, the 1 st wall member 10 has the 1 st recess 14, the 1 st recess 14 receives one end of the connection member 50 in the 1 st direction, the 2 nd wall member 20 has the 2 nd recess 24, and the 2 nd recess 24 receives the other end of the connection member 50 in the 1 st direction.
In the socket 1 according to claim 4 of the present invention, each of the plurality of housings 31 is configured to be able to accommodate a plurality of probes 40.
In the socket 1 according to the 5 th aspect of the present invention, the 1 st wall member 10 and the 2 nd wall member 20 have the 1 st surfaces 111 and 211 facing the housing laminated body 30, respectively, and the 2 nd surfaces 112 and 212 arranged on the opposite side of the 1 st surfaces 111 and 211 in the 1 st direction, respectively, and the distance in the 1 st direction from the 2 nd surface 112 of the 1 st wall member 10 to the housing 34 of each of the plurality of housings 31 is equal to the distance in the 1 st direction from the 2 nd surface 212 of the 2 nd wall member 20 to the housing 34 of each of the plurality of housings 31.
The outlet unit 2 according to claim 6 of the present invention includes: a plurality of sockets 1 of the above-described manner; and a base housing 60 that positions the plurality of receptacles 1 independently of each other and integrally holds them.
In the receptacle unit 2 according to the 7 th aspect of the present invention, the plurality of receptacles 1 each have a mounting portion 13, 23, 15, 16, and the mounting portions 13, 23, 15, 16 are provided on at least one of the 1 st wall member 10 and the 2 nd wall member 20, and the plurality of receptacles 1 are mounted on the base housing 60.
An inspection tool 100 according to embodiment 8 of the present invention includes: the socket 1 of the above-described manner; and a probe 40 housed in the housing portion 34.
The inspection tool unit 200 according to the 9 th aspect of the present invention includes: the outlet unit 2 of the above-described manner; and a probe 40 housed in the housing portion 34.
In addition, any of the various embodiments and modifications described above can exhibit respective effects by being appropriately combined. Further, combinations of the embodiments or examples or combinations of the embodiments and examples can be made, and combinations of features in different embodiments or examples can also be made.
Industrial applicability
The socket of the present invention can be applied to, for example, a module having a BtoB (Business-to-Business) connector as a connection medium such as a camera module, and an inspection tool used for inspecting a semiconductor package such as sop (small Outline package), qfp (quad Flat package), and bga (ball grid array).
Claims (10)
1. A socket capable of receiving a probe having a 1 st contact and a 2 nd contact, wherein,
the socket has:
a 1 st wall member and a 2 nd wall member which are arranged at intervals in a 1 st direction; and
a housing stack disposed between the 1 st wall member and the 2 nd wall member,
the 1 st wall part and the 2 nd wall part are each connected to the housing laminate in a detachable manner,
the case laminated body has a plurality of cases which are arranged along the 1 st direction and are separably connected to each other,
the plurality of cases each have a 1 st opening provided at one end in a 2 nd direction intersecting the 1 st direction, a 2 nd opening provided at the other end in the 2 nd direction, and a receiving portion provided inside each of the plurality of cases and connected to the 1 st opening and the 2 nd opening,
the housing portion is configured to be able to house the probe in a state where the 1 st contact is exposed to the outside from the 1 st opening and the 2 nd contact is exposed to the outside from the 2 nd opening.
2. The socket according to claim 1, wherein,
the socket further having a connection member extending in the 1 st direction to detachably connect each of the plurality of housings,
the plurality of housings each have a notch that penetrates the plurality of housings in the 1 st direction and that opens at an end in the 2 nd direction of each of the plurality of housings,
the connecting part is configured on the notch.
3. The socket according to claim 2, wherein,
the 1 st wall member has a 1 st recess, the 1 st recess receiving one end of the connecting member in the 1 st direction,
the 2 nd wall member has a 2 nd recess, and the 2 nd recess receives the other end of the connecting member in the 1 st direction.
4. The socket according to any one of claims 1 to 3,
the plurality of housings are configured to be able to accommodate a plurality of probes, respectively.
5. The socket according to any one of claims 1 to 3,
the 1 st wall member and the 2 nd wall member each have a 1 st surface facing the case laminate and a 2 nd surface arranged on a side opposite to the 1 st surface in the 1 st direction,
a distance in the 1 st direction from the 2 nd surface of the 1 st wall member to the housing portion of each of the plurality of housings is equal to a distance in the 1 st direction from the 2 nd surface of the 2 nd wall member to the housing portion of each of the plurality of housings.
6. The socket according to claim 4, wherein,
the 1 st wall member and the 2 nd wall member each have a 1 st surface facing the case laminate and a 2 nd surface arranged on a side opposite to the 1 st surface in the 1 st direction,
a distance in the 1 st direction from the 2 nd surface of the 1 st wall member to the housing portion of each of the plurality of housings is equal to a distance in the 1 st direction from the 2 nd surface of the 2 nd wall member to the housing portion of each of the plurality of housings.
7. A receptacle unit, the receptacle unit having:
a plurality of sockets; and
a base housing that positions the plurality of receptacles independently of each other and integrally holds them,
the plurality of sockets are the sockets according to any one of claims 1 to 6.
8. The outlet unit of claim 7,
each of the plurality of sockets has a mounting portion provided in at least one of the 1 st wall member and the 2 nd wall member, and the plurality of sockets are mounted to the base housing.
9. An inspection tool, the inspection tool having:
the socket of any one of claims 1 to 6; and
and a probe received in the receiving portion.
10. An inspection tool unit, the inspection tool unit having:
the outlet unit of claim 7 or 8; and
and a probe received in the receiving portion.
Applications Claiming Priority (2)
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JP2020-133358 | 2020-08-05 | ||
JP2020133358A JP7452317B2 (en) | 2020-08-05 | 2020-08-05 | Sockets, socket units, inspection jigs and inspection jig units |
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CN114069315A true CN114069315A (en) | 2022-02-18 |
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CN202120462760.XU Active CN214313623U (en) | 2020-08-05 | 2021-03-03 | Socket, socket unit, inspection tool, and inspection tool unit |
CN202110848991.9A Pending CN114069315A (en) | 2020-08-05 | 2021-07-27 | Socket, socket unit, inspection tool, and inspection tool unit |
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CN202120462760.XU Active CN214313623U (en) | 2020-08-05 | 2021-03-03 | Socket, socket unit, inspection tool, and inspection tool unit |
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JP (1) | JP7452317B2 (en) |
KR (1) | KR102610514B1 (en) |
CN (2) | CN214313623U (en) |
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JP7452317B2 (en) * | 2020-08-05 | 2024-03-19 | オムロン株式会社 | Sockets, socket units, inspection jigs and inspection jig units |
KR20240025319A (en) | 2022-08-18 | 2024-02-27 | 미르텍알앤디 주식회사 | Silicon patten body for inspecting socket and manufacturing method for the same |
KR102683853B1 (en) | 2022-08-18 | 2024-07-11 | 미르텍알앤디 주식회사 | Jig for inspecting socket |
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Also Published As
Publication number | Publication date |
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TWI803913B (en) | 2023-06-01 |
JP7452317B2 (en) | 2024-03-19 |
TW202221331A (en) | 2022-06-01 |
JP2022029833A (en) | 2022-02-18 |
CN214313623U (en) | 2021-09-28 |
KR102610514B1 (en) | 2023-12-07 |
KR20220017828A (en) | 2022-02-14 |
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