CN114062900A - Operational amplifier circuit offset voltage testing method - Google Patents
Operational amplifier circuit offset voltage testing method Download PDFInfo
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- CN114062900A CN114062900A CN202111515436.0A CN202111515436A CN114062900A CN 114062900 A CN114062900 A CN 114062900A CN 202111515436 A CN202111515436 A CN 202111515436A CN 114062900 A CN114062900 A CN 114062900A
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- operational amplifier
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Abstract
The invention relates to a method for testing offset voltage of an operational amplifier circuit, wherein the operational amplifier circuit is provided with two input ends, two power supply ends and an output end, and the overall level of a device can be increased or reduced by the same voltage at the same time as long as the conditions are met, and nothing is changed for the operational amplifier. The offset voltage test can be carried out on the operational amplifier under different common-mode voltage conditions under the mutual conversion test conditions, or the accuracy of the test result of the offset voltage can be verified under different conditions. The test method is not only suitable for the operational amplifier, but also suitable for the comparator circuit. The invention adopts the auxiliary operational amplifier ring to test the offset voltage, and the auxiliary operational amplifier is connected with the rear end of the tested circuit to amplify the test result of the tested circuit, thereby ensuring the accuracy and reliability of the test result.
Description
Technical Field
The invention belongs to the field of analog circuit testing in integrated circuit testing, and particularly relates to a method for testing offset voltage of an operational amplifier circuit. The method is suitable for the operational amplifier with double power supply voltages and single power supply voltage and is not limited by offset voltage test conditions.
Background
Operational amplifiers are widely used in our daily life, and the offset voltage is one of the key indicators for measuring the performance of the operational amplifiers. Therefore, the offset voltage determines the drift of the output voltage of the operational amplifier in the using process, thereby influencing the stability of the operational amplifier in the whole using process.
The existing offset voltage debugging method is shown in fig. 3, a tested operational amplifier is adopted to form a closed loop to test the offset voltage, so that the test has the defects that the stability of the operational amplifier loop is poor, the test result is out of tolerance in batch test, the circuit is misjudged, and the production cost is increased. The other method is to directly measure at the output end of the circuit to be measured, which is simple and easy to understand, but the measured result is influenced by the offset voltage of the circuit, which is very critical, if the offset voltage of the circuit is below microvolt level, the measuring equipment used at the output end of the circuit to be measured must have an accuracy higher than the offset voltage by an order of magnitude, otherwise the test result is inaccurate.
Disclosure of Invention
The invention provides a method for testing offset voltage of an operational amplifier circuit, which is not limited by offset voltage testing conditions, can directly convert different testing conditions and then test on any testing machine, is suitable for testing the offset voltage of the operational amplifier circuit, and can be extended to a voltage comparator circuit for measuring the offset voltage or a circuit similar to an operational amplifier structure for measuring the offset voltage.
The technical scheme adopted by the invention for realizing the purpose is as follows: an operational amplifier circuit offset voltage test method comprises the following steps:
for the tested operational amplifier with input common-mode voltage of a certain voltage value, the input common-mode voltage is controlled to be zero, and the common-mode voltage variation V is obtained0；
Controlling the voltage drop V of the power supply terminal of the tested operational amplifier0；
Controlling the output voltage of the operational amplifier under test to decrease V0；
And measuring voltage at the output end of the auxiliary operational amplifier loop, and obtaining the offset voltage of the operational amplifier to be measured through operation.
The operational amplifier is provided with two input ends, two power supply ends and an output end.
The operational amplifier is any one of four operational amplifiers, a double operational amplifier and a single operational amplifier.
The power supply ends of the tested operational amplifier comprise a positive power supply end and a negative power supply end, and the variation of the positive power supply end is the same as that of the negative power supply end.
And measuring the output end voltage of the auxiliary operational amplifier through a testing machine.
The auxiliary ring comprises a tested operational amplifier and an auxiliary operational amplifier connected with the tested operational amplifier;
the two input ends of the operational amplifier to be tested are respectively connected with a common-mode voltage through resistors; the reverse input end of the tested operational amplifier is connected with the output end of the auxiliary operational amplifier through a resistor RF;
the output end of the operational amplifier to be tested is connected with the positive input end of the auxiliary operational amplifier through a resistor R2, the reverse input end of the auxiliary operational amplifier is grounded, the positive input end of the auxiliary operational amplifier is connected to the source of the testing machine after passing through a resistor R3, the positive input end voltage is provided for the auxiliary operational amplifier through the source of the testing machine, and the voltage is finally used as the output end voltage of the operational amplifier to be tested through the auxiliary loop.
The obtaining of the offset voltage through operation specifically includes: the measured output voltage VM of the auxiliary operational amplifier is divided by a resistor RF and a resistor R1 to obtain the voltage of an input end
The voltage value calculated by the formula is the offset voltage of the input end of the operational amplifier to be tested.
The invention has the following beneficial effects and advantages:
1. the invention utilizes the operational amplifier circuit with two input ends, two power supply ends and one output end, and can simultaneously increase or reduce the whole level of the device by the same voltage as long as the conditions are met, and no change is caused to the operational amplifier. The offset voltage test can be carried out on the operational amplifier under different common-mode voltage conditions under the mutual conversion test conditions, or the accuracy of the test result of the offset voltage can be verified under different conditions. The test method is not only suitable for the operational amplifier, but also suitable for the comparator circuit.
2. The invention is suitable for the tested circuit to test the offset voltage by adopting the self closed loop, the offset voltage value of the current operational amplifier circuit is converted from mV to muV level, and the self closed loop is adopted to test the offset voltage, which may cause the influence of inaccurate test result, large error and the like, as shown in figure 2. The auxiliary operational amplifier ring is adopted to test the offset voltage, the auxiliary operational amplifier is connected to the rear end of the tested circuit, and the test result of the tested circuit is amplified, so that the accuracy and the reliability of the test result are ensured.
Drawings
FIG. 1 is a schematic diagram of the testing principle of the present invention;
FIG. 2 is a schematic diagram of an auxiliary operational amplifier loop test of the present invention;
FIG. 3 is a schematic diagram of the self closed loop test of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples.
A method for testing offset voltage of an operational amplifier circuit is suitable for the operational amplifier circuit with two input ends, one output end and two power supply voltages and without GND.
The method is suitable for providing input common-mode voltage of zero or a certain voltage value in operational amplifier circuit data, for example, common OP37 and OP27 are single operational amplifiers with dual power supply voltage, the input common-mode voltage is zero, AD8628 is the single operational amplifier with a single power supply, and the input common-mode voltage is 2.5V.
A method for testing offset voltage of an operational amplifier circuit comprises the following steps: the method comprises the following steps:
for the offset voltage test condition, the double operational amplifier, the single operational amplifier and the four operational amplifier circuits with the common-mode voltage of zero can change the common-mode voltage of the circuits from zero to a voltage value within the allowable range of the common-mode voltage, and can also convert the input common-mode voltage into the input common-mode voltage of zero.
The power supply end of the operational amplifier comprises a positive power supply and a negative power supply which have the same variation as the common-mode voltage,
the output end of the operational amplifier is applied with the same variable quantity as the common-mode voltage, and then the offset voltage can be tested according to the test principle of the circuit.
Fig. 1 is a flow chart of a test of an offset voltage of an operational amplifier used in the present patent.
Figure 2 is a schematic diagram of a test of the offset voltage of an operational amplifier used in this patent,
the embodiment can be applied to the test condition of the offset voltage of the operational amplifier circuit, and specifically comprises the following steps:
1. the test conditions for testing offset voltage given by circuit data are generally two, namely, common-mode voltage is zero, and the other common-mode voltage is a certain voltage value. For example, for a single power supply operational amplifier, the positive power supply is 5V, the negative power supply is 0V, the input common mode voltage is 2.5V, and the output voltage is 2.5V; the second is dual-power supply voltage operational amplifier, the positive power supply voltage is 15V, the negative power supply voltage is-15V, the input common mode voltage is 0V, and the output voltage is 0V.
2. On the basis of 1, two test conditions can be converted, for an operational amplifier with an input common-mode voltage of a certain voltage value, the input common-mode voltage can be changed into zero according to the structure of the operational amplifier, meanwhile, the power supply voltage of the operational amplifier is also correspondingly changed, the single-power operational amplifier is also the same in time, the positive power supply is changed, the negative power supply is also changed, and meanwhile, the output end is also correspondingly changed. The input common mode voltage in 1 is 2.5V, the power supply is 5V, and the test conditions can be changed into the input common mode voltage of 0V, the positive power supply of 2.5V, the negative power supply of-2.5V and the output terminal of 0 by the method.
3. On the basis of 2, the testing condition of the offset voltage is changed, a new testing condition in 2 is generated, the input end, the power end and the output end of the operational amplifier are subjected to voltage value input on a testing machine, the voltage is measured at the output end of the auxiliary operational amplifier ring, the offset voltage is obtained through an offset voltage calculation formula, and the influence on the offset voltage of the circuit is avoided after the testing condition is changed.
4. For the operational amplifier with the input common-mode voltage being zero, the input common-mode voltage, the power supply voltage and the output terminal voltage can be changed by adopting the method 2, so that the offset voltage measurement is completed. For example, the dual-power operational amplifier test condition in 1 is changed into that the input common-mode voltage is 2.5V, the positive power supply is 17.5V, the negative power supply is-12.5V, and the output end is 2.5. And then testing on a testing machine by adopting the mode 3.
Claims (7)
1. The method for testing the offset voltage of the operational amplifier circuit is characterized by comprising the following steps of:
for the tested operational amplifier with input common-mode voltage of a certain voltage value, the input common-mode voltage is controlled to be zero, and the common-mode voltage variation V is obtained0；
Controlling the voltage drop V of the power supply terminal of the tested operational amplifier0；
Controlling the output voltage of the operational amplifier under test to decrease V0；
And measuring voltage at the output end of the auxiliary operational amplifier loop, and obtaining the offset voltage of the operational amplifier to be measured through operation.
2. The method as claimed in claim 1, wherein the operational amplifier is an operational amplifier having two input terminals, two power terminals, and an output terminal.
3. The method as claimed in claim 1 or 2, wherein the operational amplifier is any one of a quad operational amplifier, a dual operational amplifier, and a single operational amplifier.
4. The method of claim 1, wherein the power supply terminals of the operational amplifier under test comprise a positive power supply terminal and a negative power supply terminal, and the positive power supply terminal and the negative power supply terminal have the same variation.
5. The method as claimed in claim 1, wherein the output voltage of the auxiliary operational amplifier is measured by a tester.
6. The method of claim 1, wherein the auxiliary loop comprises a tested operational amplifier and an auxiliary operational amplifier connected to the tested operational amplifier;
the two input ends of the operational amplifier to be tested are respectively connected with a common-mode voltage through resistors; the reverse input end of the tested operational amplifier is connected with the output end of the auxiliary operational amplifier through a resistor RF;
the output end of the operational amplifier to be tested is connected with the positive input end of the auxiliary operational amplifier through a resistor R2, the reverse input end of the auxiliary operational amplifier is grounded, the positive input end of the auxiliary operational amplifier is connected to the source of the testing machine after passing through a resistor R3, the positive input end voltage is provided for the auxiliary operational amplifier through the source of the testing machine, and the voltage is finally used as the output end voltage of the operational amplifier to be tested through the auxiliary loop.
7. The method of claim 1, wherein the obtaining of the offset voltage by the operation comprises: the measured output voltage VM of the auxiliary operational amplifier is divided by a resistor RF and a resistor R1 to obtain the voltage of an input end
The voltage value calculated by the formula is the offset voltage of the input end of the operational amplifier to be tested.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202111515436.0A CN114062900A (en) | 2021-12-13 | 2021-12-13 | Operational amplifier circuit offset voltage testing method |
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| CN202111515436.0A CN114062900A (en) | 2021-12-13 | 2021-12-13 | Operational amplifier circuit offset voltage testing method |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114859211A (en) * | 2022-04-29 | 2022-08-05 | 江西万年芯微电子有限公司 | Operational amplifier function test system |
| CN116577597A (en) * | 2023-07-14 | 2023-08-11 | 深圳市爱普特微电子有限公司 | Method and system for testing offset voltage of high-precision comparator |
| CN117214661A (en) * | 2023-09-11 | 2023-12-12 | 无锡市晶源微电子股份有限公司 | Input offset voltage testing device for operational amplifier |
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| CN201035102Y (en) * | 2007-01-26 | 2008-03-12 | 中控科技集团有限公司 | Device for testing op-amp offset voltage category |
| CN105372525A (en) * | 2015-11-09 | 2016-03-02 | 上海芯哲微电子科技有限公司 | Test circuit for operational amplifier |
| CN110361646A (en) * | 2019-07-12 | 2019-10-22 | 北京华峰测控技术股份有限公司 | A kind of operational amplifier test circuit and test method |
| CN212514879U (en) * | 2020-03-02 | 2021-02-09 | 北京华峰测控技术股份有限公司 | Operational amplifier test system |
| CN113114144A (en) * | 2021-05-11 | 2021-07-13 | 山东浪潮科学研究院有限公司 | Circuit for correcting input offset voltage in quantum measurement and control system |
-
2021
- 2021-12-13 CN CN202111515436.0A patent/CN114062900A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201035102Y (en) * | 2007-01-26 | 2008-03-12 | 中控科技集团有限公司 | Device for testing op-amp offset voltage category |
| CN105372525A (en) * | 2015-11-09 | 2016-03-02 | 上海芯哲微电子科技有限公司 | Test circuit for operational amplifier |
| CN110361646A (en) * | 2019-07-12 | 2019-10-22 | 北京华峰测控技术股份有限公司 | A kind of operational amplifier test circuit and test method |
| CN212514879U (en) * | 2020-03-02 | 2021-02-09 | 北京华峰测控技术股份有限公司 | Operational amplifier test system |
| CN113114144A (en) * | 2021-05-11 | 2021-07-13 | 山东浪潮科学研究院有限公司 | Circuit for correcting input offset voltage in quantum measurement and control system |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114859211A (en) * | 2022-04-29 | 2022-08-05 | 江西万年芯微电子有限公司 | Operational amplifier function test system |
| CN116577597A (en) * | 2023-07-14 | 2023-08-11 | 深圳市爱普特微电子有限公司 | Method and system for testing offset voltage of high-precision comparator |
| CN116577597B (en) * | 2023-07-14 | 2023-11-21 | 深圳市爱普特微电子有限公司 | Method and system for testing offset voltage of high-precision comparator |
| CN117214661A (en) * | 2023-09-11 | 2023-12-12 | 无锡市晶源微电子股份有限公司 | Input offset voltage testing device for operational amplifier |
| CN117214661B (en) * | 2023-09-11 | 2024-04-19 | 无锡市晶源微电子股份有限公司 | Input offset voltage testing device for operational amplifier |
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