CN113702710A - Resistance test circuit and resistance test method - Google Patents
Resistance test circuit and resistance test method Download PDFInfo
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- CN113702710A CN113702710A CN202010434821.1A CN202010434821A CN113702710A CN 113702710 A CN113702710 A CN 113702710A CN 202010434821 A CN202010434821 A CN 202010434821A CN 113702710 A CN113702710 A CN 113702710A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/30—Structural combination of electric measuring instruments with basic electronic circuits, e.g. with amplifier
Abstract
The invention relates to the technical field of resistance measurement, and provides a resistance test circuit and a resistance test method, wherein the resistance test circuit comprises: the voltage division module comprises a current source, a standard resistor and a resistor to be tested, wherein the current source, the standard resistor and the resistor to be tested are connected between a power supply end and the ground in series; the first test module generates a first test voltage according to voltages at two ends of the standard resistor; the second test module generates a second test voltage according to the voltages at the two ends of the resistor to be tested; and the input end of the third test module is respectively connected with the output end of the first test module and the output end of the second test module, and a third test voltage is generated according to the first test voltage and the second test voltage, wherein the resistance test circuit obtains the resistance value of the tested resistor according to the resistance value of the standard resistor, the first test voltage and the third test voltage. Therefore, the test precision of the resistance test circuit can be improved and the reliability requirement can be met.
Description
Technical Field
The invention relates to the field of resistance measurement, in particular to a resistance test circuit and a resistance test method.
Background
The resistance is one of basic electrical parameters, and the measuring method is various, and in order to accurately and practically measure the resistance value, the measuring method adopted by different resistances is different from the used instrument.
One prior art solution is to measure the resistance R between two nodes of MN according to a resistance test circuit as shown in fig. 1, and this measurement method is called four-wire method resistance measurement. The end A is connected with a current source I, the end B is grounded, and the end C and the end D are respectively connected with nodes M and N of the resistor R. And a voltmeter V is connected between the C terminal and the D terminal. The measuring mode can avoid the influence of parasitic resistance between the connecting line AM and the connecting line BN on the test result. The measured resistance value is the ratio of the voltage value measured by a voltmeter V connected with the C end and the D end to the current value flowing through the resistor R.
However, in the Final Test (Final Test) process, the Test accuracy of the resistor is directly limited by the accuracy of the voltmeter and the accuracy of the current source. Generally, the accuracy of a voltmeter with higher accuracy configured on a test machine is 0.05%, and the accuracy of a current source is 0.05%. That is, when measuring voltage and measuring current through a resistor, a random error of five parts per million occurs. According to the existing scheme, the superposition of the two errors brings about a testing error which is close to one in a thousand for the testing result, the requirement of high-precision resistance value measurement cannot be met, and the reliability is poor.
Disclosure of Invention
In order to solve the technical problems, the invention provides a resistance test circuit and a resistance test method, which can improve the measurement precision of the resistance value of a resistor and improve the reliability of a test system.
In one aspect, the present invention provides a resistance test circuit for measuring a resistance value of a resistor to be tested, the resistance test circuit comprising:
the voltage division module comprises a current source, a standard resistor and a resistor to be tested, wherein the current source, the standard resistor and the resistor to be tested are connected between a power supply end and the ground in series;
the input end of the first test module is connected with two ends of the standard resistor to form a first path, and a first test voltage is generated according to voltages at two ends of the standard resistor;
the input end of the second test module is connected with two ends of the resistor to be tested to form a second path, and a second test voltage is generated according to the voltage at the two ends of the resistor to be tested;
a third test module, the input end of which is connected with the output end of the first test module and the output end of the second test module respectively, and generates a third test voltage according to the first test voltage and the second test voltage,
the resistance test circuit obtains the resistance value of the tested resistor according to the resistance value of the standard resistor, the first test voltage and the third test voltage.
Preferably, the first test module comprises a first amplifier, and the second test module comprises a second amplifier.
Preferably, the amplification gain values of the first amplifier and the second amplifier are the same or different.
Preferably, the aforementioned third test module comprises a third amplifier.
Preferably, the first and second amplifiers, and/or the third amplifier are instrumentation amplifiers.
Preferably, the standard resistor is a precision resistor.
On the other hand, the invention also provides a resistance testing method for measuring the resistance value of the tested resistance, which comprises the following steps:
applying a preset test current on a series circuit of a resistor to be tested and a standard resistor;
respectively acquiring a first test voltage at two ends of a standard resistor and a second test voltage at two ends of a resistor to be tested under the preset test current;
obtaining a third test voltage according to the first test voltage and the second test voltage;
and obtaining the resistance value of the tested resistor according to the resistance value of the standard resistor, the first test voltage and the third test voltage.
Preferably, after applying a preset test current to the series circuit of the standard resistor and the resistor to be tested, the method further includes:
and acquiring an amplification gain value of a third test module generating the third test voltage.
Preferably, the amplification gain value of the first test module generating the first test voltage is the same as or different from the amplification gain value of the second test module generating the second test voltage.
Preferably, the obtaining the resistance value of the tested resistor according to the resistance value of the standard resistor, the first test voltage and the third test voltage comprises:
and obtaining the resistance value of the tested resistor according to the resistance value of the standard resistor, the first test voltage, the third test voltage and the amplification gain value of the third test module for generating the third test voltage.
The invention has the beneficial effects that: the invention provides a resistance test circuit and a resistance test method, which apply a preset test current on a series circuit of a standard resistance and a resistance to be tested; respectively acquiring a first test voltage at two ends of the standard resistor and a second test voltage at two ends of the resistor to be tested under the preset test current; then obtaining a third test voltage according to the first test voltage and the second test voltage; and obtaining the resistance value of the tested resistor according to the resistance value of the standard resistor, the first test voltage and the third test voltage. The resistance measuring precision is effectively improved, and meanwhile, the circuit is stable in output, high in response speed and high in reliability.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent from the following description of the embodiments of the present invention with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of a prior art resistance test circuit;
FIG. 2 is a schematic diagram illustrating a resistance test circuit according to an embodiment of the present invention;
FIG. 3 illustrates a circuit configuration diagram of the resistance testing circuit shown in FIG. 2;
fig. 4 is a schematic flow chart illustrating a resistance testing method according to an embodiment of the present invention.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
The present invention will be described in detail below with reference to the accompanying drawings.
Fig. 2 is a schematic diagram illustrating a structure of a resistance test circuit according to an embodiment of the present invention, and fig. 3 is a circuit structure diagram illustrating the resistance test circuit illustrated in fig. 2.
Referring to fig. 2 and 3, in one aspect, an embodiment of the present invention provides a resistance test circuit 200 for measuring the resistance of a resistor R2 to be tested, where the resistance test circuit 200 includes: the testing device comprises a voltage division module 210, a first testing module 220, a second testing module 230 and a third testing module 240, wherein the voltage division module 210 comprises a current source I1, a standard resistor R1 and a resistor R2 to be tested which are connected between a power supply terminal VDD and the ground in series; the input end of the first test module 220 is connected to two ends a and B of a standard resistor R1 to form a first path, and a first test voltage V1 is generated according to the voltage across the standard resistor R1; the input end of the second test module 230 is connected to two ends C and D of the resistor R2 to be tested to form a second path, and a second test voltage V2 is generated according to the voltage at the two ends of the resistor R2 to be tested; the input terminal of the third testing module is connected to the output terminal of the first testing module 220 and the output terminal of the second testing module 230, respectively, and generates a third testing voltage V3 according to a first testing voltage V1 and a second testing voltage V2, wherein the current source I1 is configured to provide a testing current, and the resistance testing circuit 200 obtains the resistance value of the tested resistor R2 according to the resistance value of the standard resistor R1, the first testing voltage V1, and the third testing voltage V3.
In a preferred embodiment, the first test module 220 includes, for example but not limited to, a first amplifier INA1, the second test module 230 includes a second amplifier INA2, and in the specific implementation, the amplification gain value G1 of the first amplifier INA1 and the amplification gain value G2 of the second amplifier INA2 may be the same or different, and are not limited herein, except that in the preferred embodiment of the present invention, the control and adjustment of variables during the test and the calculation of the test result are facilitated by setting the amplification gain values of the first amplifier INA1 and the second amplifier INA2 to be the same.
In a preferred embodiment, the third test module 240 includes, for example, but not limited to, a third amplifier INA 3.
In a preferred embodiment, the first and second amplifiers INA1, INA2, and/or the third amplifier INA3 may be, but are not limited to, instrumentation amplifiers, and the amplification functions of the corresponding first, second, and third test modules 220, 230, 240 may be implemented in other ways. For example, the amplifying circuits having the same amplifying function are built by one or more operational amplifiers, which are not limited herein. In this embodiment, the positive phase input of each instrumentation amplifier can greatly improve the input impedance of the circuit and reduce the attenuation of the circuit to weak input signals; the differential input can lead the circuit to only amplify differential mode signals and only play a following role for common mode input signals, thereby effectively improving the Common Mode Rejection Ratio (CMRR) in the test circuit, improving the test effect and improving the measurement accuracy.
In a preferred embodiment, the standard resistor R1 is a precision resistor, which is a resistance value obtained by testing an eight-bit and half-digital multimeter (the precision of the eight-bit and half-digital multimeter is about 0.0007%, which can meet the requirements of various instrument testing conditions, so that no error can be basically considered to exist), and has low time drift and low temperature drift, and is used in the resistance testing circuit 200 in this embodiment, so that the testing effect can be improved, and the measuring accuracy can be improved.
On the other hand, an embodiment of the present invention further provides a resistance testing method for measuring a resistance value of a tested resistor, and referring to fig. 4, the resistance testing method includes:
step S110: and applying a preset test current on a series circuit of the standard resistor and the resistor to be tested.
In step S110, a preset test current is applied to the standard resistor and the resistor to be tested on the series circuit through the current source in the voltage dividing module formed by the current source, the standard resistor and the resistor to be tested which are sequentially connected in series between the power supply terminal and the ground.
Step S120: and respectively acquiring a first test voltage at two ends of the standard resistor and a second test voltage at two ends of the resistor to be tested under the preset test current.
In step S120, a first path is formed by connecting the input terminal of the first test module to two ends of the standard resistor, and a first test voltage is generated according to the voltage at the two ends of the standard resistor, and a second path is formed by connecting the input terminal of the second test module to two ends of the resistor to be tested, and a second test voltage is generated according to the voltage at the two ends of the resistor to be tested.
Step S130: and obtaining a third test voltage according to the first test voltage and the second test voltage.
In step S130, the input terminal of the third testing module is respectively connected to the output terminal of the first testing module and the output terminal of the second testing module, and a third testing voltage is generated according to the first testing voltage and the second testing voltage in step S120.
Step S140: and acquiring a third gain value of a third detection circuit generating the third test voltage.
In this embodiment, the first test module includes, for example, a first amplifier, the second test module includes a second amplifier, and further, amplification gain values of the first amplifier and the second amplifier are the same.
It should be noted that the amplification gain values of the first amplifier and the second amplifier may be the same or different, and are not limited herein, but in the preferred embodiment of the present invention, the control and adjustment of the variables during the test process and the calculation of the test result are facilitated by setting the amplification gain values of the first amplifier and the second amplifier to be the same.
Further, the third test module for example comprises a third amplifier, in further embodiments the first and second amplifiers, and/or the third amplifier may be, but is not limited to, an instrumentation amplifier. The amplification function corresponding to the first test module 220, the second test module 230, and the third test module 240 may also be implemented in other ways. For example, the amplifying circuits having the same amplifying function are built by one or more operational amplifiers, which are not limited herein.
In step S140, a third gain value of a third amplifier (instrumentation amplifier) in a third test circuit that generates the third test voltage is acquired.
Step S150: and obtaining the resistance value of the tested resistor according to the resistance value of the standard resistor, the first test voltage, the third test voltage and the third gain value thereof.
Referring to the resistance test circuit 200 shown in fig. 3, we can obtain:
the output voltage V1 of the first amplifier INA1 in the first test module 220:
V1＝I*R1*G1 (1)
in formula (1), G1 is the amplification gain value of the first amplifier INA1, R1 is the resistance value of the standard resistor R1, I is the current value of the preset test current provided by the current source I1, and further, the standard resistor R1 is a precision resistor;
and, the output voltage V2 of the second amplifier INA2 in the second test module 230:
V2＝I*R2*G2 (2)
in the formula (2), G2 is the amplification gain value of the second amplifier, R2 is the resistance value of the resistor R2 to be tested, and in the present embodiment, the amplification gain value G1 of the first amplifier INA1 is the same as the amplification gain value G2 of the second amplifier.
And, combining the above equation (1) and equation (2) to obtain the output voltage V3 of the third amplifier INA3 in the third test module 240:
V3＝I*G1*G2*(R1-R2) (3)
in equation (3), G3 is the amplification gain value of the third amplifier.
Combining the above equations (1) and (3), one can obtain:
the resistance value of the tested resistor R2 is obtained by processing the formula (4):
in the above equation (5), R1 is the precision resistor, and G3 is the voltage gain value of the third amplifier INA 3. The value of V3/V1 in this equation is the ratio of the two voltages measured by a 0.05% accuracy voltmeter with a maximum error of 0.1%. However, in the equation for calculating R2, the test error for this ratio is divided by the third gain G3. G3 can be set to 100 times higher, so that the error of test is reduced to 0.001%. That is to say, the test accuracy of R2 can reach 0.001%, greatly improves the test accuracy of the resistance value of the resistor, and the resistance test circuit in this embodiment has stable output, fast response speed, and high reliability.
It should be noted that in the description of the present invention, it is to be understood that the terms "upper", "lower", "inner", and the like, indicate orientation or positional relationship, are only for convenience of describing the present invention and simplifying the description, but do not indicate or imply that the referenced components or elements must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention.
Further, in this document, the contained terms "include", "contain" or any other variation thereof are intended to cover a non-exclusive inclusion, so that a process, a method, an article or an apparatus including a series of elements includes not only those elements but also other elements not explicitly listed or inherent to such process, method, article or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Finally, it should be noted that: it should be understood that the above examples are only for clearly illustrating the present invention and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications of the invention may be made without departing from the scope of the invention.
Claims (10)
1. A resistance test circuit for measuring the resistance of a resistor under test, the resistance test circuit comprising:
the voltage division module comprises a current source, a standard resistor and a resistor to be tested, wherein the current source, the standard resistor and the resistor to be tested are connected between a power supply end and the ground in series;
the input end of the first test module is connected with two ends of the standard resistor to form a first path, and a first test voltage is generated according to voltages at two ends of the standard resistor;
the input end of the second test module is connected with the two ends of the resistor to be tested to form a second path, and a second test voltage is generated according to the voltage at the two ends of the resistor to be tested;
a third test module, the input end of which is connected with the output end of the first test module and the output end of the second test module respectively, and generates a third test voltage according to the first test voltage and the second test voltage,
the resistance testing circuit obtains the resistance value of the tested resistor according to the resistance value of the standard resistor, the first testing voltage and the third testing voltage.
2. The resistance testing circuit of claim 1, wherein the first testing module comprises a first amplifier and the second testing module comprises a second amplifier.
3. The resistance test circuit of claim 2, wherein the amplification gain values of the first amplifier and the second amplifier are the same or different.
4. The resistance testing circuit of claim 1, wherein the third testing module comprises a third amplifier.
5. The resistance testing circuit of claim 1, wherein the first and second amplifiers, and/or the third amplifier are instrumentation amplifiers.
6. The resistance test circuit of claim 1, wherein the standard resistance is a precision resistance.
7. A resistance testing method is used for measuring the resistance of a tested resistor, and is characterized by comprising the following steps:
applying a preset test current on a series circuit of a resistor to be tested and a standard resistor;
respectively obtaining a first test voltage at two ends of the standard resistor and a second test voltage at two ends of the resistor to be tested under the preset test current;
obtaining a third test voltage according to the first test voltage and the second test voltage;
and obtaining the resistance value of the tested resistor according to the resistance value of the standard resistor, the first test voltage and the third test voltage.
8. The method for testing the resistance of the resistor, according to claim 7, further comprising the following steps after a preset test current is applied to the series circuit of the standard resistor and the resistor to be tested:
and acquiring an amplification gain value of a third test module generating the third test voltage.
9. The resistance testing method according to claim 7, wherein an amplification gain value of a first test module generating the first test voltage is the same as or different from an amplification gain value of a second test module generating the second test voltage.
10. The resistance testing method according to claim 7, wherein the obtaining of the resistance value of the tested resistance from the resistance value of the standard resistance, the first test voltage, and the third test voltage comprises:
and obtaining the resistance value of the tested resistor according to the resistance value of the standard resistor, the first test voltage, the third test voltage and the amplification gain value of a third test module generating the third test voltage.
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116125163A (en) * | 2022-12-05 | 2023-05-16 | 中国南方电网有限责任公司超高压输电公司广州局 | Resistance testing device and resistance testing method |
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