CN113945776A - Radio frequency electronic component testing device and testing equipment applying same - Google Patents
Radio frequency electronic component testing device and testing equipment applying same Download PDFInfo
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- CN113945776A CN113945776A CN202010685619.6A CN202010685619A CN113945776A CN 113945776 A CN113945776 A CN 113945776A CN 202010685619 A CN202010685619 A CN 202010685619A CN 113945776 A CN113945776 A CN 113945776A
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- 238000003825 pressing Methods 0.000 claims abstract description 114
- 230000007246 mechanism Effects 0.000 claims abstract description 53
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- 239000000523 sample Substances 0.000 description 14
- 230000002265 prevention Effects 0.000 description 6
- 238000003466 welding Methods 0.000 description 5
- 230000008901 benefit Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 238000005086 pumping Methods 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000002788 crimping Methods 0.000 description 2
- 239000006260 foam Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
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- 229920000573 polyethylene Polymers 0.000 description 2
- 239000004964 aerogel Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
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- 238000010295 mobile communication Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/18—Screening arrangements against electric or magnetic fields, e.g. against earth's field
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention provides a radio frequency electronic component testing device, which comprises an electrical property tester, an antenna tester and a joint mechanism, wherein the joint mechanism is provided with a loader and an anti-interference pressing piece, the loader is used for assembling the anti-interference pressing piece and driving the anti-interference pressing piece to move, the anti-interference pressing piece is made of an anti-shielding material and has a low dielectric coefficient so as to allow a wireless signal to pass through, so that the loader bears the anti-interference pressing piece, the anti-interference pressing piece is positioned between the antenna tester and the radio frequency electronic component, the anti-interference pressing piece is used for exerting a pressing force on the radio frequency electronic component so as to ensure that the radio frequency electronic component is really contacted with the electrical property tester to execute testing operation, and the wireless signal transmitted between the antenna tester and the radio frequency electronic component is used for carrying out wireless signal testing operation through the anti-interference pressing piece, thereby improving the testing quality. The invention also provides a test device applying the radio frequency electronic element test device, which comprises: a machine platform; a feeding device; a material receiving device; a radio frequency electronic component testing device; a conveying device; a central control device.
Description
Technical Field
The invention provides a radio frequency electronic element testing device and testing equipment applying the same, and relates to a jointing mechanism which can be used for pressing and connecting an electronic element and transmitting a wireless signal.
Background
Referring to fig. 1, a radio frequency electronic device 10 with multiple built-in antennas is widely applied in the fields of mobile communication local area wireless network systems and wireless communication local area network systems; at present, a plurality of contacts 11 are disposed on one surface of the rf electronic device 10, and an antenna 12 is disposed on the other surface of the rf electronic device 10.
The testing device for the radio frequency electronic element is provided with a circuit board 21 and a testing seat 22 which are electrically connected on a machine platform, the testing seat 22 is provided with a plurality of probes 221 for testing the radio frequency electronic element 10, and an antenna tester 23 is arranged above the testing seat 22 for transmitting or receiving wireless signals to the radio frequency electronic element 10; when the rf electronic device 10 is placed in the test socket 22, the rf electronic device 10 contacts the probe 221 of the test socket 22 through the contact 11 to perform an electrical test operation, and sends a wireless signal towards the antenna tester 23 located at a predetermined direction to be tested through the antenna 12, and the antenna tester 23 receives the wireless signal to perform a wireless signal test operation.
The above-mentioned radio frequency electronic component 10 only uses the pressure of its own weight to make its contact 11 contact the probe 221 of the test seat 22, because there is a spring in the probe 221, this pressure of own weight can not make the contact 11 and probe 221 really contact each other, so as to influence the electrical test quality of the radio frequency electronic component 10; since the antenna 12 of the rf electronic component 10 is opposite to the antenna tester 23, how to press the rf electronic component 10 to perform a test operation without affecting the requirement of the antenna tester 23 and the rf electronic component 10 for transmitting wireless signals is a subject of research and development by manufacturers.
Disclosure of Invention
Therefore, in view of the above-mentioned shortcomings, the inventor has made various evaluations and considerations, and has made continuous trial and modification to design the rf electronic device testing apparatus and the testing equipment using the same based on years of experience accumulated in the industry.
The main objects of the present invention are: under the condition of not influencing the antenna tester and the radio frequency electronic element to transmit wireless signal signals, the radio frequency electronic element can be pressed to execute the test operation.
The invention provides a radio frequency electronic component testing device, which comprises an electrical property tester, an antenna tester and a joint mechanism, wherein the joint mechanism is provided with a loader and an anti-interference pressing piece, the loader is provided with the anti-interference pressing piece and drives the anti-interference pressing piece to move, the anti-interference pressing piece is made of an anti-shielding material and has a low dielectric coefficient so as to allow a wireless signal to pass through, so that the loader bears the anti-interference pressing piece, the anti-interference pressing piece is positioned between the antenna tester and the radio frequency electronic component, the anti-interference pressing piece is utilized to apply a pressing force to the radio frequency electronic component so that the radio frequency electronic component is really contacted with the electrical property tester to execute a testing operation, and the wireless signal transmitted between the antenna tester and the radio frequency electronic component is subjected to a wireless signal testing operation through the anti-interference pressing piece so as to improve the testing quality.
The second objective of the present invention is to provide a testing device for rf electronic components, wherein the carrier of the joint mechanism is used for assembling the anti-interference pressing member and the antenna tester, the anti-interference pressing member is located below the antenna tester, and the carrier drives the anti-interference pressing member and the antenna tester to synchronously move, so as to improve the testing production efficiency.
The third objective of the present invention is to provide a testing device for rf electronic components, wherein the joint mechanism has at least one picking member disposed on the anti-interference pressing member or on the periphery thereof, so that the picking member can displace the rf electronic component to the electrical tester, and the anti-interference pressing member is matched to press the rf electronic component, thereby improving the testing productivity.
The present invention provides a radio frequency electronic component testing device, further comprising a first platform, wherein the first platform is provided with an adjuster for adjusting the placing position or angle, and the first platform is provided with an electrical property tester and a jointing mechanism, so that the jointing mechanism can synchronously adjust the position or angle along with the electrical property tester, and the radio frequency electronic component can execute wireless signal testing operation of different directions to be tested, thereby reducing the configuration number of the antenna tester, and achieving the practical benefits of saving the cost of the antenna tester and improving the use efficiency.
The invention also provides a test device, which comprises a machine table, a feeding device, a receiving device, the test device, a conveying device and a central control device, wherein the feeding device is arranged on the machine table; the feeding device is arranged on the machine table and is provided with at least one feeding bearing device for accommodating the radio frequency electronic element to be detected; the material receiving device is arranged on the machine table and is provided with at least one material receiving and bearing device for accommodating the tested radio frequency electronic element; the testing device is arranged on a machine table and comprises an electrical property tester, an antenna tester and a joint mechanism for testing and crimping the radio frequency electronic element; the conveying device is arranged on the machine table and is provided with at least one conveyor for conveying the radio frequency electronic element; the central control device is used for controlling and integrating the actions of all the devices to execute automatic operation, thereby achieving the practical benefit of improving the operation efficiency.
In order to achieve the purpose, the invention adopts the technical scheme that:
the invention provides a radio frequency electronic component testing device, comprising: an electrical property tester: the testing seat is electrically connected with at least one radio frequency electronic element positioned at a testing station so as to execute electrical testing operation on the radio frequency electronic element; an antenna tester: at least one signal operation piece is arranged for executing wireless signal test operation on the radio frequency electronic element; a joining mechanism: the anti-interference pressing piece is provided with a loader and an anti-interference pressing piece, the loader is used for assembling the anti-interference pressing piece, the anti-interference pressing piece is provided with a pressing connection surface, the loader bears the anti-interference pressing piece, the anti-interference pressing piece is located between the antenna tester and the radio frequency electronic element, and the anti-interference pressing piece exerts pressing connection force on the radio frequency electronic element.
Wherein, the loader of the joint mechanism is provided with at least one picking piece on the anti-interference pressing piece or the peripheral side thereof for picking and placing the radio frequency electronic element
Wherein, the loader of the joint mechanism is used for assembling the antenna tester and the anti-interference pressing piece.
The anti-interference pressing piece of the joint mechanism is made of an anti-shielding material and has a low dielectric coefficient.
The interference prevention range of the interference prevention pressing piece of the joint mechanism is larger than the to-be-detected pointing range of the radio frequency electronic element.
One surface of the anti-interference pressing piece of the joint mechanism is used as the pressing surface for pressing and connecting the radio frequency electronic element, and the other surface is used as an assembly surface for forming a transmission channel between the pressing surface and the assembly surface relative to the antenna tester.
The electrical tester of the joint mechanism is assembled on the first platform, and the antenna tester is assembled on the second platform.
Wherein, the electrical property tester and the joint mechanism are assembled on the first platform.
The first platform or the second platform is provided with at least one adjuster for adjusting the arrangement position or angle of the electrical property tester or the antenna tester.
The testing device further comprises a testing chamber, wherein the testing chamber is used for the electrical tester, the antenna tester and the joint mechanism to be positioned in the testing chamber during testing.
The test chamber is provided with a carrying platform at one side of the electrical property tester to carry the radio frequency electronic element.
The invention also provides a test device applying the radio frequency electronic element test device, which comprises: a machine platform; a feeding device: at least one feeding holder for holding the RF electronic element to be tested; the material receiving device comprises: a receiving and placing device arranged on the machine table and provided with at least one receiving and placing device for accommodating the tested radio frequency electronic element; at least one radio frequency electronic component testing device: is configured on the machine platform; a conveying device: at least one conveyor arranged on the machine platform for conveying the radio frequency electronic elements; the central control device: so as to control and integrate the driving of each device to execute the automatic operation, thereby achieving the practical benefit of improving the operation efficiency.
Drawings
FIG. 1: schematic representation of the use of the prior art test device.
FIG. 2: a schematic diagram of a first embodiment of the testing device of the present invention.
FIG. 3: the first embodiment of the testing device of the present invention is schematically used.
FIG. 4: a schematic diagram of a second embodiment of the testing device of the present invention.
FIG. 5: the second embodiment of the testing device of the present invention is schematically used.
FIG. 6: a schematic diagram of a third embodiment of the testing device of the present invention.
FIG. 7: the third embodiment of the testing device of the present invention is schematically used.
FIG. 8: the testing device of the present invention is schematically used in a fourth embodiment.
FIG. 9: a fifth embodiment of the testing device of the present invention is schematically illustrated in use.
FIG. 10: the testing device is applied to the schematic diagram of the testing equipment.
List of reference numerals: [ Prior Art ] 10-radio frequency electronic component; 11-contact; 12-an antenna; 21-a circuit board; 22-a test seat; 221-a probe; 23-antenna tester. [ invention ] 30-test device; 31-an electrical tester; 311-a circuit board; 312-a test socket; 313-probe; 314-a suction hole; 32-an antenna tester; 321-signal workings; an axis of operation L-; 33-an engagement mechanism; 331-a carrier; 3311-locus of containment; 3312-signal path; 332-tamper proof compression element; 3321-crimping surface; 3322-mounting face; a T-transmission channel; 333-picking member; 34-a first platform; 35-a second platform; 36-a regulator; 371-case cover; 372-a door panel; 373-a test chamber; 374-a delivery pipe; 375-top plate; 381. 382-a carrier; 40-radio frequency electronics; 41-contact; 42-an antenna; 50-a machine platform; 52-a conveyor; 60-a feeding device; 61-a feed holder; 70-a material receiving device; 71-a material receiving and holding device; 80-a conveying device; 81-a first conveyor; 82-a second conveyor; 83-third conveyor.
Detailed Description
A preferred embodiment is described in detail with reference to the drawings, which are as follows:
referring to fig. 2, a testing apparatus 30 according to a first embodiment of the present invention includes an electrical tester 31, an antenna tester 32, and a bonding mechanism 33.
The electrical tester 31 has an electrically connected circuit board 311 and at least one testing seat 312, and the testing seat 312 is electrically connected to at least one rf electronic device located at a testing station to perform an electrical testing operation on the rf electronic device. Furthermore, the test socket 312 has a plurality of branch probes 313, one end of each of the branch probes 313 is electrically connected to the circuit board 311, and the other end is electrically connected to the rf electronic component. Moreover, the testing station is a position where the radio frequency electronic component is preset to perform the testing operation, and the testing station can be located on the electrical property tester 31, the carrier or the conveyor, and the like, and is determined according to different testing operation requirements and is not limited by the embodiment; in the present embodiment, the testing station is located in the testing seat 312.
The electrical property tester 31 further includes at least one limiting component disposed on the testing base 312, wherein the limiting component can be a limiting plate, a limiting post or an air suction hole; in the present embodiment, the position-limiting component is a pumping hole 314, and the pumping hole 314 is connected to a pumping device (not shown) to absorb the position-limiting rf electronic component.
The electrical tester 31 is assembled on the first platform 34, further, the first platform 34 may be a panel, an end, a frame or a base, or a part of the relevant element connected to the electrical tester 31 is used as the first platform 34, the first platform 34 may be configured to be assembled with the electrical tester 31, in other words, the first platform 34 may be a platen of a machine, a mounting component of an adjuster, a panel of a testing chamber or a mounting component of a carrier, and the carrier may be a rotating tool, a linear driving source (such as a driving arm, a sliding rail set or a screw seat set), or a driving source including a box cover and a driving box cover capable of driving the box cover to move; the first platform 34 may be fixed or movable, for example, when the first platform 34 is a platen of a machine or a panel of a testing chamber, the electrical tester 31 may be fixed at a predetermined position. The movable first platform 34 can perform at least one direction displacement or angle rotation, or perform at least one direction displacement and angle rotation; for example, when the first platform 34 is a supporting component of the adjuster, it can drive the electrical tester 31 to rotate angularly to adjust the placing angle or move in at least one direction to change the placing position; for example, when the first platform 34 is a loading component of the carrier, it can drive the electrical tester 31 to make linear displacement or rotational displacement; in the present embodiment, the first platform 34 is a fixed platform for mounting the electrical tester 31.
The antenna tester 32 has at least one signal operation part 321 for the rf electronic device to perform the wireless signal test operation; for example, the antenna tester 32 performs operations of receiving or transmitting wireless signals to the rf electronic device, for example, the antenna tester 32 performs operations of receiving and transmitting wireless signals to the rf electronic device. The antenna tester 32 may be connected to a separate processor (not shown) to transmit the radio signals received from the rf electronic components to the processor, or to transmit the radio signals for testing by the processor to the rf electronic components, and the processor may also be a processor of a central control device (not shown). Furthermore, the angle of the operation axis L of the signal operation element 321 of the antenna tester 32 may be the same or close to the direction to be measured (e.g., 0 ° or 45 ° or 30 ° direction) of the rf electronic component.
The testing device 30 can change the configuration number and the configuration position of the antenna tester 32 according to the requirement of the testing operation, for example, when testing a wireless signal with a single direction, a single antenna tester 32 can be configured, for example, when testing wireless signals with different directions, a plurality of antenna testers 32 can be configured at a plurality of positions; in this embodiment, the antenna tester 32 is mounted on the second platform 35, and the operation axis L of the signal operation member 321 of the antenna tester 32 is located at the 0 ° direction for receiving the wireless signal emitted by the rf electronic component and transmitting the wireless signal to the processor of the central control device for analysis to determine whether the strength of the wireless signal of the beam emitted by the direction to be tested of the rf electronic component meets the standard.
The second platform 35 may be a panel, an end, a frame, or a base, or a portion of the second platform 35 connected to the relevant components of the antenna tester 32 may be used as the second platform 35, and the second platform 35 may be of any type as long as the second platform is capable of being assembled with the antenna tester 32, for example, the second platform 35 may include a plurality of panels at different positions and may be used for assembling the antenna tester 32 at different positions, in other words, the second platform 35 may be a platen of a machine, a mounting part of an adjuster, a panel of a test chamber, a panel of a box cover, a mounting part of a carrier, or a frame plate of a bearing seat, and the carrier may be a rotating tool, a linear driving source (such as a driving arm, a slide rail set, or a screw seat set), or a driving source including a box cover and driving the box cover to be displaced. The second platform 35 may be fixed or movable, for example, when the second platform 35 is a platen of a machine, a panel of a testing chamber, or a frame plate of a cradle, the antenna tester 32 may be fixed at a predetermined position; the movable second platform 35 can perform at least one direction displacement or angle rotation, or perform at least one direction displacement and angle rotation; for example, the second platform 35 is a mounting component of the adjuster, so as to drive the antenna tester 32 to adjust the placement angle or position; for example, the second platform 35 is a carrying component of the carrier for driving the antenna tester 32 to perform linear displacement or rotational displacement.
In this embodiment, the second platform 35 is a fixedly configured frame plate for assembling the antenna tester 32, and the angle of the operation axis L of the signal operation element 321 of the antenna tester 32 is the same as the 0 ° direction to be tested of the rf electronic component, so as to receive the wireless signal of the beam emitted by the direction to be tested of the rf electronic component.
The joint mechanism 33 includes a carrier 331 and an anti-interference pressing member 332, the carrier 331 is used for assembling the anti-interference pressing member 332, the anti-interference pressing member 332 is made of shielding material and has a low dielectric coefficient, the carrier 331 carries the anti-interference pressing member 332, so that the anti-interference pressing member 332 is located between the antenna tester 32 and the radio frequency electronic component, and the anti-interference pressing member 332 and the radio frequency electronic component are used for performing an electrical test operation by performing a pressure welding displacement towards the other one, furthermore, because the radio frequency electronic components of different types have different volumes, the antenna thereof can be configured at one of a pressure welding position or a non-pressure welding position of the radio frequency electronic component, and the pressure welding position is a position preset for the pressure welding of the anti-interference pressing member 332; for example, the antenna of the bulky rf electronic component is disposed below the non-press-connection position of the rf electronic component, in other words, the non-press-connection position is not press-connected by the anti-interference press 332, and the anti-interference press 332 is not press-connected above the antenna, so that the wireless signal transmitted between the antenna tester 32 and the rf electronic component can be tested without passing through the anti-interference press 332; for example, the antenna of the rf electronic component with a small volume is disposed below the press-connection position of the rf electronic component, that is, the anti-interference press 332 is pressed above the antenna, so that the wireless signal transmitted between the antenna tester 32 and the rf electronic component can be tested by the anti-interference press 332. Moreover, the carrier 331 carries the anti-interference pressing element 332 and the rf electronic component to move relatively, and the anti-interference pressing element 332 can still be used to press the rf electronic component to perform an electrical test operation.
The carrier 331 is fixed or movable, the carrier 331 can be a fixed frame, a movable arm, a press-fit seat or a rotating shaft, for example, the carrier 331 is a fixed frame and is disposed between the antenna tester 32 and the electrical tester 31; for example, the carrier 331 is a moving arm, a press-fit seat or a rotating shaft, and can perform at least one direction displacement, which can be linear displacement or rotational displacement, or linear displacement and rotational displacement. The carrier 331 can be made of an anti-shielding material or a non-anti-shielding material (such as a metal material), and the strength of the carrier is only required to be capable of carrying the anti-interference pressing member 332; in the embodiment, the carrier 331 is a moving arm and moves in the X-Z direction, and the carrier 331 has accommodating portions 3311, and the accommodating portions 3311 penetrate the top and bottom surfaces of the carrier 331.
The anti-interference pressing member 332 is assembled on the carrier 331, is made of an anti-shielding material, and has a low dielectric coefficient; furthermore, the anti-interference element 332 may be mounted on one side of the carrier 331, or penetrate through the carrier 331, and is carried by the carrier 331 between the antenna tester 32 and the rf electronic component; the anti-interference pressing member 332 can be made of closed-cell polyethylene foam or aerogel, when the interior of the anti-interference material is vacuum, the dielectric coefficient is 1, and when the interior of the anti-interference material is air, the dielectric coefficient is close to 1; the anti-interference pressing piece 332 has appropriate strength and elasticity, and can be restored to the original shape after being pressed; in the embodiment, the anti-interference pressing member 332 is made of closed-cell polyethylene foam and has suitable strength and elasticity, the anti-interference pressing member 332 is mounted in the accommodating portion 3311 of the carrier 331, and has one surface as a pressing surface 3321, the pressing surface 3321 protrudes from the accommodating portion 3311 for pressing and connecting the rf electronic component, and the other surface as a mounting surface 3322 for forming a transmission channel T between the pressing surface 3321 and the mounting surface 3322 relative to the antenna tester 32; the dielectric coefficient of the anti-interference pressing part 332 can be 1.06-1.03, preferably 1.03-1, and the dielectric coefficient of the anti-interference pressing part 332 is low, so that the interference to millimeter wave wireless signals is small, and the loss of the wireless signals in transmission can be reduced.
The anti-interference pressing member 332 may be further provided with a frame (not shown) made of a non-shielding material according to the operation requirement, and the frame avoids the transmission channel T to ensure that the wireless signal transmission is not interfered.
However, when the joint mechanism 33 has the use requirement of pressing and transferring, at least one picking member may be disposed on the anti-interference pressing member 332 or the peripheral side thereof, and the picking member is assembled on the carrier 331 for picking and placing the rf electronic component; in other words, when the engagement mechanism 33 has the requirement of pressing, the carrier 331 does not need to be provided with a pick-up; in the embodiment, the carrier 331 is provided with a picking member 333 at the periphery of the interference preventing member 332 for picking and placing the rf electronic components.
Referring to fig. 3, the bonding mechanism 33 uses the picking member 333 to absorb a rf electronic component 40 to be tested, one surface of the rf electronic component 40 has a plurality of contacts 41, and the other surface has an antenna 42, and the antenna 42 is located below the pressing position of the rf electronic component 40; the carrier 331 of the bonding mechanism 33 moves in the X-Z direction to transfer the rf electronic component 40 to be tested to the test socket 312 (i.e., the test station) of the electrical tester 31, the contact 41 of the rf electronic component 40 initially electrically contacts the probe 313 of the test socket 312, and the test socket 312 is limited by the suction hole 314 absorbing the rf electronic component 40.
However, in order to make the contact 41 of the rf electronic component 40 actually contact the probe 313 of the test socket 312, the carrier 331 of the engaging mechanism 33 drives the anti-interference pressing member 332 to move in the Z direction, so that the pressing surface 3321 of the anti-interference pressing member 332 presses the pressing position of the rf electronic component 40 with a predetermined pressing force, so that the contact 41 of the rf electronic component 40 actually contacts the probe 313 of the test socket 312, and the probe 313 performs an electrical test operation on the rf electronic component 40 through the circuit board 311; furthermore, the direction to be tested of the antenna 42 of the rf electronic component 40 is 0 °, the angle of the operation axis L of the signal operation element 321 of the antenna tester 32 is 0 ° and the same as the direction to be tested of the rf electronic component 40, the interference preventing pressing element 332 of the bonding mechanism 33 is located between the antenna 42 of the rf electronic component 40 and the antenna tester 32, since the interference preventing pressing element 332 is made of shielding material, the dielectric coefficient thereof is 1.03 to 1, and the interference preventing pressing element 332 can pass through wireless signals, therefore, in a state that the mounting surface 3322 of the interference preventing pressing element 332 is opposite to the antenna tester 32, when the antenna 42 of the rf electronic component 40 at the test station emits a beam towards the direction to be tested of 0 ° to transmit wireless signals, the wireless signals are transmitted to the antenna tester 32 through the transmission channel T of the interference preventing pressing element 332 under the condition that the interference preventing pressing element 332 has a low dielectric coefficient and low loss, the signal operation part 321 of the antenna tester 32 receives the wireless signal of the rf electronic component 40, and then performs a wireless signal test operation, and the antenna tester 32 transmits the received wireless signal to a processor of a central control device (not shown) for the processor to perform an analysis, so as to determine whether the strength of the wireless signal emitted by the to-be-tested point of the rf electronic component 40 meets the standard; if yes, the radio frequency electronic component 40 is judged to be good, otherwise, the radio frequency electronic component 40 is judged to be defective; therefore, the joint mechanism 33 of the testing device 30 not only can press the rf electronic component 40 to ensure the quality of the electrical testing operation, but also can smoothly perform the wireless signal testing operation, thereby improving the production efficiency.
Referring to fig. 4 and 5, a second embodiment of the testing device 30 of the present invention is different from the first embodiment in that the antenna tester 32 is mounted on the carrier 331 of the engaging mechanism 33, the carrier 331 is internally provided with a signal channel 3312, one end of the signal channel 3312 is provided for mounting the antenna tester 32, the other end is provided with the anti-interference pressing member 332, the mounting surface 3322 of the anti-interference pressing member 332 is opposite to the antenna tester 32, the pressing surface 3321 is opposite to the rf electronic component 40, and the transmission channel T of the anti-interference pressing member 332 is provided for passing wireless signals; in this embodiment, after the rf electronic component 40 moves into the electrical tester 31, the carrier 331 of the engaging mechanism 33 drives the antenna tester 32 and the anti-interference pressing member 332 to move in the Z direction synchronously, so that the pressing surface 3321 of the anti-interference pressing member 332 presses the rf electronic component 40 with a predetermined pressing force, the contact 41 of the rf electronic component 40 is actually contacted with the probe 313 of the electrical tester 31 to perform the electrical testing operation, and the wireless signal emitted by the antenna 42 of the rf electronic component 40 is transmitted to the antenna tester 32 through the transmission channel T of the anti-interference pressing member 332, so that the antenna tester 32 receives the wireless signal of the rf electronic component 40, and further performs the wireless signal testing operation.
Referring to fig. 6 and 7, the testing apparatus 30 of the present invention is configured with at least one adjuster on the first platform 34 or the second platform for adjusting the position or angle of the electrical tester 31 or the antenna tester 32; in the third embodiment, the testing device 30 configures the adjuster 36 on the first platform 34, and the first platform 34 is equipped with the electrical tester 31 for adjusting the placement position or angle of the electrical tester 31, so that the antenna 42 of the rf electronic component 40 performs wireless signal testing operations with different preset directions, thereby reducing the configuration number of the antenna tester 32 and saving the cost; furthermore, the adjuster 36 may be a mechanical arm or a rotating shaft, or include a plurality of adjusting rods for adjusting the electrical tester 31 and the rf electronic device 40 thereon to be disposed at an angle (such as 0 °, 30 ° or 45 ° pointing) required by the test operation, for example, the plurality of adjusting rods may be driven at different heights to drive and adjust the first platform 34.
Furthermore, when the adjuster 36 drives the first platform 34 and the electrical tester 31 to synchronously adjust the placement angle, the engagement mechanism 33 can be independently driven, and the loader 331 adjusts the placement angle of the anti-interference pressing member 332 according to the placement angle of the electrical tester 31; however, the joint mechanism 33 may also be disposed on the first platform 34, and the adjuster 36 drives the first platform 34, the electrical property tester 31 and the joint mechanism 33 to synchronously adjust the arrangement angle; in the embodiment, the carrier 331 of the bonding mechanism 33 is disposed on the first platform 34 and moves in multiple directions, and when the material is picked and placed, the carrier 331 drives the anti-interference pressing member 332 to move linearly or rotationally to avoid the conveyor (not shown), so that the conveyor can pick and place the rf electronic component 40 from and on the electrical tester 31; during testing, the adjuster 36 drives the first platform 34, the electrical property tester 31 and the rf electronic element 40 to adjust the placement angle synchronously, and then under the condition that the interference prevention range of the interference prevention pressing member 332 is larger than the to-be-tested pointing range of the rf electronic element 40, the antenna 42 of the rf electronic element 40 emits a wireless signal towards the to-be-tested pointing direction of 30 °, and the carrier 331 drives the interference prevention pressing member 332 to press the rf electronic element 40 with a preset pressing force to perform electrical testing operation, and the wireless signal emitted by the antenna 42 of the rf electronic element 40 is transmitted to the antenna tester 32 through the interference prevention pressing member 332, so that the signal operation member 321 of the antenna tester 32 receives the wireless signal of the rf electronic element 40, and further performs wireless signal testing operation.
Referring to fig. 8, in a fourth embodiment of the testing device 30 of the present invention, the testing device 30 further includes a testing chamber, and the electrical property tester 31, the antenna tester 32 and the bonding mechanism 33 are located in the testing chamber during testing; the test chamber can be an independent box chamber with a door plate, or a box cover with a door plate is fixedly arranged on the machine table, so that the test chamber is formed between the box cover and the machine table, or an outer cover capable of moving in the Z direction is arranged above the machine table, so that the test chamber is formed between the outer cover and the machine table when the outer cover is arranged on the machine table; in this embodiment, the testing apparatus 30 has a box cover 371 with a door plate 372 fixed on the machine 50, and a testing chamber 373 is formed between the box cover 371 and the machine 50, the testing chamber 373 has at least one delivery pipe 374 capable of inputting a fluid with a predetermined temperature, so that the testing chamber 373 forms a testing environment simulating the temperature of the rf electronic component application site in the future; the electrical tester 31 and the bonding mechanism 33 are disposed on the machine 50 in the testing chamber 373, the carrier 331 of the bonding mechanism 33 is displaced in multiple directions (e.g., X-Z directions) to avoid the conveyor 52 and press-contact the rf electronic device 40, and the antenna tester 32 is disposed on the top plate 375 of the testing chamber 373; when a conveyor 52 moves the rf electronic component 40 to be tested into the testing chamber 373, the carrier 331 moves in the X-Z direction to avoid the conveyor 52, and the conveyor 52 moves the rf electronic component 40 into the testing station of the electrical tester 31, the bonding mechanism 33 drives the anti-interference pressing member 332 to press the rf electronic component 40 by the carrier 331 to perform the electrical testing operation, and the wireless signal sent by the antenna 42 of the rf electronic component 40 is transmitted to the antenna tester 32 through the anti-interference pressing member 332, so that the antenna tester 32 receives the wireless signal of the rf electronic component 40 to perform the wireless signal testing operation; therefore, the testing apparatus 30 can make the rf electronic device 40 perform the wireless signal testing operation and the electrical testing operation in the testing chamber 373.
Referring to fig. 9, in a fifth embodiment of the testing apparatus 30 of the present invention, the testing apparatus 30 further includes a testing chamber, the electrical tester 31, the antenna tester 32 and the joint mechanism 33 are located in the testing chamber during testing, the electrical tester 31 is disposed on a machine 50 in the testing chamber, the joint mechanism 33 is disposed above the electrical tester 31, the carrier 331 is capable of moving in multiple directions (e.g., X-Z directions), and a signal channel 3312 is disposed inside the testing chamber, one end of the signal channel 3312 is provided for mounting the antenna tester 32, the other end is provided with a tamper-proof component 332, a mounting surface 3322 of the tamper-proof component 332 is provided for the antenna tester 32, a press-contact surface 3321 is provided for the antenna 42 of the rf electronic component 40, and the tamper-proof component 332 is provided for passing wireless signals; the testing chamber 373 is provided with a stage on one side of the electrical tester 31 for carrying the rf electronic device 40; in the present embodiment, two stages 381 and 382 capable of moving in the Y direction are disposed at the side of the electrical property tester 31 for carrying the rf electronic component 40 to be tested and the tested rf electronic component 40; when a carrier 381 carries the rf electronic device 40 to be tested to the side of the electrical tester 31, the carrier 331 of the bonding mechanism 33 drives the picking member 333 to move in the X-Z direction, so that the picking member 333 takes out the rf electronic component 40 to be tested on a carrier 381, and then moved into the electrical tester 31, the carrier 331 drives the anti-interference pressing member 332 and the antenna tester 32 to move in the Z direction, and the anti-interference pressing member 332 is pressed against the RF electronic device 40 to perform the electrical testing operation, and the wireless signal sent by the antenna 42 of the rf electronic component 40 is transmitted to the antenna tester 32 through the anti-interference pressing element 332, so that the antenna tester 32 receives the wireless signal of the rf electronic component 40, after the wireless signal testing operation is performed, the picking member 333 of the bonding mechanism 33 transfers the tested rf electronic component 40 of the electrical tester 31 to another carrier 382 for discharging.
Referring to fig. 2 and 10, a schematic view of the testing device 30 applied to a testing apparatus of the present invention includes a machine table 50, a feeding device 60, a receiving device 70, the testing device 30 of the present invention, a conveying device 80, and a central control device (not shown); the feeding device 60 is disposed on the machine 50 and has at least one feeding holder 61 for holding the rf electronic component to be tested; the material receiving device 70 is disposed on the machine table 50 and provided with at least one material receiving and holding device 71 for accommodating the tested radio frequency electronic component; the testing device 30 of the present invention is disposed on the machine 50, and includes an electrical property tester 31, an antenna tester 32 and a connection mechanism 33 for connecting the rf electronic component by pressure, and performing an electrical property testing operation and a wireless signal testing operation on the rf electronic component, in this embodiment, the testing device 30 is disposed on the first side and the second side of the machine 50 respectively; the conveying device 80 is disposed on the machine 50 and provided with at least one conveyor for conveying the rf electronic components, in this embodiment, the conveying device 80 is provided with a first conveyor 81 that moves in the X-Y-Z direction, the first conveyor 81 takes out the rf electronic components to be tested from the feeding device 60 and transfers the rf electronic components to a second conveyor 82 that is a carrier, a third conveyor 83 of the conveying device 80 takes out and exchanges the rf electronic components to be tested and the tested rf electronic components from the second conveyor 82 and the electrical tester 31 of the testing device 30, and the first conveyor 81 takes out the tested rf electronic components from the second conveyor 82 and transfers the tested rf electronic components to the receiving device 70 according to the test result for classified receiving; the central control device is used for controlling and integrating the drive of each device so as to execute automatic operation and achieve the practical benefit of improving the operation efficiency.
Claims (12)
1. An apparatus for testing radio frequency electronic components, comprising:
an electrical property tester: the testing seat is electrically connected with at least one radio frequency electronic element positioned at a testing station so as to execute electrical testing operation on the radio frequency electronic element;
an antenna tester: at least one signal operation piece is arranged for executing wireless signal test operation on the radio frequency electronic element;
a joining mechanism: the anti-interference pressing piece is provided with a loader and an anti-interference pressing piece, the loader is used for assembling the anti-interference pressing piece, the anti-interference pressing piece is provided with a pressing connection surface, the loader bears the anti-interference pressing piece, the anti-interference pressing piece is located between the antenna tester and the radio frequency electronic element, and the anti-interference pressing piece exerts pressing connection force on the radio frequency electronic element.
2. The apparatus as claimed in claim 1, wherein the carrier of the engaging mechanism has at least one picking member disposed at or around the anti-interference pressing member for picking and placing the RF electronic component.
3. The apparatus of claim 1, wherein the carrier of the engagement mechanism is configured to mount the antenna tester and the tamper proof member.
4. The apparatus as claimed in claim 1, wherein the anti-interference pressing member of the bonding mechanism is made of an anti-shielding material and has a low dielectric constant.
5. The device as claimed in claim 1, wherein the interference-proof pressing member of the engaging mechanism has an interference-proof range larger than a to-be-tested directional range of the rf electronic component.
6. The apparatus as claimed in claim 1, wherein one surface of the anti-interference pressing member of the engaging mechanism is used as the pressing surface for pressing the RF electronic component, and the other surface is used as a mounting surface for forming a transmission channel between the pressing surface and the mounting surface with respect to the antenna tester.
7. The apparatus of claim 1, wherein the electrical tester of the interface mechanism is mounted on a first platform and the antenna tester is mounted on a second platform.
8. The apparatus of claim 7, wherein the electrical tester and the engagement mechanism are mounted on the first platform.
9. The apparatus of claim 7, wherein the first platform or the second platform is configured with at least one adjuster for adjusting a position or an angle of the electrical tester or the antenna tester.
10. The apparatus of any one of claims 1-9, further comprising a testing chamber, wherein the electrical tester, the antenna tester and the bonding mechanism are located in the testing chamber during testing.
11. The apparatus of claim 10, wherein the testing chamber is provided with a stage on one side of the electrical tester for carrying the RF electronic components.
12. A test apparatus using the radio frequency electronic component test device according to claim 1, comprising:
a machine platform;
a feeding device: at least one feeding holder for holding the RF electronic element to be tested;
the material receiving device comprises: a receiving and placing device arranged on the machine table and provided with at least one receiving and placing device for accommodating the tested radio frequency electronic element;
at least one radio frequency electronic component testing apparatus according to claim 1: is configured on the machine platform;
a conveying device: at least one conveyor arranged on the machine platform for conveying the radio frequency electronic elements;
the central control device: to control and integrate the device drivers to perform automated operations.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010685619.6A CN113945776B (en) | 2020-07-16 | Radio frequency electronic element testing device and testing equipment using same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010685619.6A CN113945776B (en) | 2020-07-16 | Radio frequency electronic element testing device and testing equipment using same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113945776A true CN113945776A (en) | 2022-01-18 |
| CN113945776B CN113945776B (en) | 2024-10-22 |
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