TW202202857A - Wireless communication electronic component testing device and testing equipment using the same - Google Patents

Abstract

The present invention reveals a wireless communication electronic component testing device, including a tester, an antenna, and a testing housing. The testing housing has a shade. The shade is made of low-k material, which has a small relative dielectric constant to allow wireless signal to pass therethrough. The shade can cover on a support to where the tester is disposed to define a testing room around the tester during electronic component testing process. Therefore, the low-k material shade is partitioning between the antenna and the electronic component without blocking the wireless signal. Electricity testing can be processed smoothly. The testing room can be defined for controlling testing environment.

Description

Radio frequency electronic component test equipment and test equipment for its application

The present invention provides a test chamber located between the electrical tester and the antenna tester, which not only enables the electrical tester inside the test chamber of the preset test environment for the radio frequency electronic components to perform electrical testing operations , and can conduct wireless signal test operation with external antenna tester through the first anti-interference component of the test room, thereby improving the test quality of the test device.

Please refer to FIG. 1 , a radio frequency electronic device 10 with a plurality of built-in antennas is widely used in the fields of mobile communication area wireless network system and wireless communication area network system. At present, the radio frequency electronic device 10 is provided with a plurality of contacts 11 on one side. , and an antenna 12 is arranged on the other side. Before the radio frequency electronic component 10 leaves the factory, in addition to performing the wireless signal testing operation, it also needs to perform the electrical testing operation to ensure the quality.

The radio frequency electronic component testing device is equipped with an electrical tester having an electrically connected circuit board 21 and a test seat 22 on the machine. The test seat 22 has a plurality of probes 221 for testing the radio frequency electronic components 10 , the test device is further equipped with an antenna tester 23 above the test seat 22 to transmit or receive wireless signals to the radio frequency electronic component 10; The probe 221 of the test seat 22 performs the electrical test operation, and sends out the wireless signal with the antenna 12 facing the antenna tester 23 in the predetermined direction to be tested, and the antenna tester 23 receives the wireless signal and performs the wireless signal test operation.

However, the radio frequency electronic component 10 may be used in a low temperature environment or a high temperature environment, so that the radio frequency electronic component 10 must be subjected to low temperature or high temperature or normal temperature electrical testing operations and wireless signal testing operations. The test quality of the RF electronic component 10 can be ensured , especially when the space of the test equipment is limited, the configuration of the test environment needs to be further developed; therefore, how to make the radio frequency electronic component 10 can be located in The test environment with preset temperature (such as low temperature, high temperature or anti-condensation test environment) is the target of industry research and development.

Furthermore, the above-mentioned radio frequency electronic component 10 only uses its own weight to make the contact 11 contact the probe 221 of the test seat 22. Since the probe 221 has a spring, this self-weight pressure cannot make the contact 11 and the probe 221 reliable. contact with each other, so as to affect the electrical test quality of the radio frequency electronic component 10; since the antenna 12 of the radio frequency electronic component 10 is relative to the antenna tester 23, how can the antenna tester 23 and the radio frequency electronic component 10 transmit wireless signals without affecting the requirements? The crimpable RF electronic component 10 to perform electrical testing is also the target of the industry's research and development.

The first objective of the present invention is to provide a radio frequency electronic component testing device, including an electrical tester, an antenna tester and a test chamber, wherein the test chamber is provided with a cover with a first anti-interference component, and the first anti-interference component prevents shielding It is made of material and has a low dielectric coefficient for wireless signals to pass through. The cover body closes the first holder to form a test space. The test space is used to accommodate an electrical tester with RF electronic components. The test room is located in the electrical test. Between the tester and the antenna tester, not only the electrical tester inside the test chamber of the preset test environment is used to perform the electrical test operation, but also the external antenna can be tested through the first anti-interference component of the test chamber. The device performs wireless signal test operations, thereby improving the test quality.

The second objective of the present invention is to provide a testing device for radio frequency electronic components, the test chamber is provided with an environmental controller to control the temperature of the test space and prevent condensation, so that the radio frequency electronic components can perform electrical testing operations in the test space with a preset temperature And wireless signal test operation, thereby improving the test quality.

The third object of the present invention is to provide a radio frequency electronic component testing device, wherein the antenna tester is assembled on the signal channel of the second holder, the second holder drives the antenna tester to synchronously displace, and presses the cover of the test chamber with the crimping part The first anti-jamming part of the body makes the first anti-jamming part press against the radio frequency electronic component and indeed contact the electrical tester, thereby improving the test quality.

The fourth object of the present invention is to provide a test device for radio frequency electronic components, wherein the antenna tester is assembled on the second holder, the test chamber is equipped with a joint unit with a second anti-interference component in the test space, and the joint unit is pressed by the second anti-interference component. The RF electronic components are indeed in contact with the electrical tester, thereby improving the test quality.

The fifth object of the present invention is to provide a testing device for radio frequency electronic components. The cover of the test chamber can be connected to a first driver, and the first driver drives the cover to open or close the first holder for electrical testing of the conveyor. The device can pick and place radio frequency electronic components, thereby improving the use efficiency.

The sixth object of the present invention is to provide a testing device for radio frequency electronic components, in which the cover of the test chamber can be assembled on a second holder, and the second holder drives the displacement of the cover to open or close the first holder, which is not only for transportation The radio frequency electronic component is picked and placed in the electrical tester, and the first anti-interference part of the cover is pressed against the radio frequency electronic component to contact the electrical tester, thereby improving the use efficiency.

The seventh object of the present invention is to provide a testing device for radio frequency electronic components. The cover body of the test chamber can be assembled on the second holder, and the cover body is provided with at least one pick-up part. efficacy.

The eighth object of the present invention is to provide a radio frequency electronic component testing device, which is equipped with an adjuster on the first holder or the second holder for adjusting the placement position or angle of the electrical tester and the test chamber or the antenna tester , to enable RF electronic components to perform wireless signal test operations with different directions to be tested, so as to reduce the number of antenna testers configured, and achieve practical benefits of saving the cost of antenna testers and improving performance.

The ninth object of the present invention is to provide a test equipment, including a machine, a feeding device, The receiving device, the testing device of the present invention, the conveying device and the central control device; the feeding device is arranged on the machine table, and is provided with at least one feeding holder for accommodating the RF electronic components to be tested; the receiving device is arranged on the machine table and at least one receiver for accommodating the tested radio frequency electronic components; the testing device of the present invention is arranged on the machine table, and includes an electrical tester, an antenna tester and a test chamber, so that the test chamber is located in the electrical tester. Between the tester and the antenna tester, not only the electrical tester inside the test chamber of the preset test environment is used to perform the electrical test operation of the radio frequency electronic components, but also through the first anti-interference component of the test chamber to communicate with the outside. The antenna tester performs wireless signal testing operations; the conveying device is arranged on the machine table, and is provided with at least one conveyor for conveying radio frequency electronic components; the central control device is used to control and integrate the actions of each device, and perform automated operations to achieve improved Practical benefits of operational efficiency.

In order to make your examiners further understand the present invention, hereby give a preferred embodiment and cooperate with the drawings, the details are as follows:

Please refer to FIG. 2 , the first embodiment of the testing apparatus 30 of the present invention includes an electrical tester 31 , an antenna tester 32 and a test chamber 33 .

The electrical tester 31 is provided with an electrically connected circuit board 311 and at least one test socket 312, and the test socket 312 is electrically connected to the radio frequency electronic components located at the test station to perform electrical test operations on the radio frequency electronic components; further, The test seat 312 has a plurality of probes 313, one end of the probes 313 is electrically connected to the circuit board 311, and the other end is electrically connected to the radio frequency electronic components. Furthermore, the test station is a predetermined position where the RF electronic components perform the test operation, for example, the test station can be located in the electrical tester 31 or a carrier, etc., depending on the requirements of different test operations, and is not limited to this embodiment; In this embodiment, the test station is located at the test seat 312 of the electrical tester 31 .

The electrical tester 31 is assembled on the first holder 34 , and further, the first holder 34 can be a platen, an end, a frame or a base, or a part for connecting the relevant components of the electrical tester 31 As the first holder 34, the shape of the first holder 34 can be used as long as the electrical tester 31 can be assembled. The panel of the test room or the bearing parts of the carrier, etc., the carrier can be a rotating tool or a linear moving tool (such as an actuator, a bearing, etc.). The first holder 34 can be a fixed type or a movable type. For example, the first holder 34 is a platen of the machine, and the electrical tester 31 can be fixed at a preset position. For example, the first holder 34 is the platen of the adjuster, which can drive the electrical tester 31 to rotate angularly to adjust the placement angle or make at least one direction displacement to change the placement position; in this embodiment, the first holder 34 is a fixed configuration and is a platen of a machine for assembling the electrical tester 31 .

The antenna tester 32 is provided with at least one signal operation part 321 for the radio frequency electronic components to perform wireless signal testing operations; Components for receiving and transmitting wireless signals . The antenna tester 32 can be connected to an independent processor (not shown in the figure), so as to transmit the wireless signal received by the radio frequency electronic component to the processor, or transmit the wireless signal for testing of the processor to the radio frequency electronic component, the processor It can also be the processor of the central control device (not shown). Furthermore, the angle of the operation axis L of the signal operating member 321 of the antenna tester 32 may be the same or different from the direction to be tested (eg, 0° or 45° or 30°) of the RF electronic component.

The testing device 30 can change the configuration quantity and configuration position of the antenna testers 32 according to the requirements of the test operation. For example, when testing wireless signals with a single direction, a single antenna tester 32 can be configured. For example, when testing wireless signals with different directions, it can be used in a plurality of A plurality of antenna testers 32 are arranged at each position; in this embodiment, the antenna tester 32 is assembled on the second holder 35 , and the operating axis L of the signal operating member 321 of the antenna tester 32 is located at 0° for receiving radio frequency electronics The wireless signal sent by the component is transmitted to the processor of the central control device for an analysis, so as to determine whether the wireless signal strength of the beam to be measured by the RF electronic component meets the standard.

The second holder 35 can be made of rigid material or anti-shielding material, or include composite materials (such as metal material and anti-shielding material). A part of the relevant components of the tester 32 is used as the second holder 35. The type of the second holder 35 can be used as long as the antenna tester 32 can be assembled. Bearing parts , The bearing member of the crimper or the bearing member of the carrier, for example, the second carrier 35 is a crimper, and can be displaced relative to the test chamber 33 . The second holder 35 can be fixed or movable. For example, the second holder 35 is a frame, which can fix the antenna tester 32 in a preset position; for example, the second holder 35 is a movable crimper, which can drive The antenna tester 32 is displaced synchronously and pressed against the test chamber 33 .

In this embodiment, the second holder 35 is a movable crimper and is made of rigid material. A signal channel 351 is opened inside. One end of the signal channel 351 is used for assembling the antenna tester 32, and the other end is connected to the second The bottom of the holder 35, the second holder 35 uses the bottom as the crimping member 352, and is driven by the actuator 353 to move in the Z direction, so that the antenna tester 32 is displaced synchronously. Of course, the bottom of the second holder 35 can also be additionally equipped with a crimping tool made of shielding material as the crimping part 352 . The angle of the operating axis L of the signal operating member 321 of the antenna tester 32 is the same as the 0° direction to be measured of the radio frequency electronic component, so as to receive the wireless signal of the beam emitted by the direction to be measured of the radio frequency electronic component.

The test chamber 33 is provided with a cover body 331 having at least one first anti-interference member 3311. The first anti-interference member 3311 is made of anti-shielding material and has a low dielectric coefficient for passing wireless signals. The test space 332 is formed by the holder 34, and the test space 332 is used for accommodating the electrical tester 31 with the radio frequency electronic components, so that the test chamber 33 is located between the electrical tester 31 and the antenna tester 32, not only the radio frequency electronic components are located in The test room 33 of the preset test environment can conduct wireless signal testing with the external antenna tester 32 through the first anti-interference component 3311 of the test room 33 .

In addition, one of the cover body 331 and the second holder 35 is pressed and displaced toward the other, so that the first anti-interference part 3311 of the cover body 331 is pressed against the radio frequency electronic element, so that the radio frequency electronic element is indeed in contact with the electrical tester. 31, and make the wireless signal transmitted between the antenna tester 32 and the radio frequency electronic components pass through the first anti-interference component 3311 to perform the wireless signal test operation. Furthermore, the cover body 331 and the second holder 35 can be displaced relative to each other, and the second holder 35 can still be used to crimp the first anti-interference member 3311 of the cover body 331 .

In this embodiment, the cover body 331 of the test chamber 33 includes a first anti-interference component 3311 and a frame 3312. The frame 3312 is made of metal material and avoids the range of the test axis, that is, the range of the non-test axis to avoid interference. For transmitting wireless signals, the frame 3312 is used to mount the first anti-interference component 3311 . However, if the strength of the first anti-interference member 3311 meets the operational requirements, the frame 3312 does not need to be configured.

The first anti-interference member 3311 is made of anti-shielding material and has a low dielectric coefficient; further, the anti-shielding material can be closed-cell polyethylene foam or aerogel, when the inside of the anti-shielding material is vacuum , its dielectric coefficient is 1, when the interior of the anti-shielding material is air, its dielectric coefficient is close to 1; the first anti-interference component 3311 has appropriate strength and elasticity, and can return to its original state after being pressed; in this embodiment , the first anti-interference component 3311 is a closed-cell polyethylene foam, and has appropriate strength and elasticity, the first anti-interference component 3311 is assembled on the frame 3312, with the first surface 3313 facing the antenna tester 32, and the second surface 3314 faces the radio frequency electronic components; the permittivity of the first anti-interference member 3311 may be 1.06~1.03, preferably, the permittivity is 1.03~1, and the permittivity of the first anti-interference member 3311 is low, especially for millimeter waves Low wireless signal interference , which can reduce the loss of wireless signal in transmission.

The test chamber 33 is provided with at least one first driver 333 for driving the cover 331 to open and close; when the first driver 333 drives the cover 331 to close on the first holder 34, a test space 332 is formed, and when the first driver 333 When the cover body 331 is driven to leave the first holder 34, the test space 332 is opened; the first driver 333 can drive the cover body 331 to perform rotational displacement or linear displacement; in this embodiment, the first driver 333 is arranged on the first holder 34, The frame 3312 of the cover body 331 is connected, and the first driver 333 drives the cover body 331 to rotate and displace to open and close. The first driver 333 drives the cover body 331 to close on the first holder 34 to form a test space 332. The electrical tester 31 is accommodated, and the antenna tester 32 is located outside the test chamber 33 .

The test chamber 33 is provided with at least one environmental controller to control the temperature of the test space or prevent condensation; the environmental controller can be a cooling chip, a heating element or a fluid pipeline for conveying pre-warmed fluid, for example, the fluid pipeline conveys low-temperature gas to The test space 332 can keep the test space 332 in a preset low temperature test environment. For example, the fluid pipeline transports dry gas at room temperature to the test space 332, which can prevent condensation in the test space 332. In this embodiment, the test chamber 33 is located on the first holder 34. The fluid pipeline 334 is configured to deliver low-temperature drying gas to the test space 332 of the cover body 331 , so that the test space 332 forms a low-temperature and dry test environment.

Please refer to FIG. 3 , a conveyor 36 adsorbs a radio frequency electronic component 40 to be tested. One side of the radio frequency electronic component 40 has a plurality of contacts 41 and the other side has an antenna 42. During the test, the first driver 333 of the test chamber 33 The cover body 331 is driven to rotate and swing to open the test space 332 , and the conveyor 36 moves the RF electronic component 40 to be tested into the test seat 312 (ie the test station) of the electrical tester 31 , and the RF electronic component 40 The contacts 41 are the probes 313 that initially electrically contact the test seat 312 .

Please refer to FIG. 4 , after the test seat 312 supports the RF electronic component 40 , the first driver 333 of the test chamber 33 drives the cover 331 to rotate and swing to close the first holder 34 to close the test space 332 and the test chamber. The fluid pipeline 334 of 33 delivers low-temperature dry air to the test space 332 to prevent condensation of the RF electronic components 40 . However, in order to make the contacts 41 of the radio frequency electronic components 40 really contact the probes 313 of the test seat 312, the first surface 3313 of the first anti-interference member 3311 of the cover body 331 is opposite to the antenna tester 32 and the second surface 3314 Relative to the antenna 42 of the radio frequency electronic component 40 , the second holder 35 is driven by the actuator 353 to move in the Z direction, the second holder 35 also drives the antenna tester 32 for synchronous displacement, and the second holder 35 is pressed against the part 352 Press down the first surface 3313 of the first anti-interference member 3311 of the cover body 331, so that the first anti-disturbance member 3311 of the cover body 331 is arc-shaped and deformed downward, so that the second surface 3314 of the first anti-disturbance member 3311 is preset The crimping force presses the RF electronic component 40 , and the contacts 41 of the RF electronic component 40 indeed contact the probes 313 of the test seat 312 .

Furthermore, the direction to be tested of the antenna 42 of the radio frequency electronic component 40 is 0°, the angle of the operating axis L of the signal operating member 321 of the antenna tester 32 is the same as the direction to be tested of the radio frequency electronic component 40 and is 0°, and the angle of the test chamber 33 is 0°. Although the cover body 331 is located between the antenna 42 of the radio frequency electronic component 40 and the antenna tester 32, since the first anti-interference component 3311 is made of an anti-shielding material, the dielectric coefficient of the first anti-interference component 3311 is 1.03~1, and the first anti-interference component 3311 can pass through wireless signal; therefore, when the antenna 42 of the RF electronic component 40 at the test station sends out a beam toward the 0° direction to be tested to transmit the wireless signal, under the conditions that the first anti-interference component 3311 has a low dielectric coefficient and low loss, The wireless signal is transmitted to the antenna tester 32 through the first anti-interference component 3311 and the signal channel 351 , the signal operation part 321 of the antenna tester 32 receives the wireless signal of the radio frequency electronic component 40, and then performs the wireless signal test operation. The antenna tester 32 transmits the received wireless signal to the processor of the central control device (not shown). , for the processor to make an analysis to determine whether the strength of the wireless signal sent by the direction to be measured of the radio frequency electronic component 40 meets the standard; if so, the radio frequency electronic component 40 is judged to be a good product; The testing device 30 can not only ensure the quality of the electrical testing operation of the radio frequency electronic components 40 , but also enable the wireless signal testing operation to be performed smoothly, thereby improving the production efficiency.

Please refer to FIG. 5 , the second embodiment of the testing device 30 of the present invention is different from the first embodiment in that the antenna tester 32 is assembled on a fixed second holder 35A, and the second holder 35A is a frame. The chamber 33 is equipped with a joint unit 335 with a second anti-interference member 3351 in the test space 332, and the joint unit 335 presses the RF electronic component with the second anti-interference member 3351, so that the RF electronic component can indeed contact the electrical tester 31; in this embodiment For example, the coupling unit 335 drives the second anti-interference member 3351 to displace in the Z direction by the second driver 3352. The second anti-interference member 3351 is made of anti-shielding material and has a low dielectric coefficient for passing wireless signals.

Please refer to FIGS. 6 and 7 , during the test, the first driver 333 of the test chamber 33 drives the cover 331 to rotate and swing to open the test space 332 , and the conveyor 36 moves the RF electronic component 40 to be tested into the electrical The test seat 312 of the tester 31 (ie, the test station), and the contact point 41 of the radio frequency electronic component 40 are electrically contacted with the probes 313 of the test seat 312 . After the test seat 312 supports the RF electronic component 40 , the first driver 333 of the test chamber 33 drives the cover 331 to rotate and swing to close the first holder 34 to close the test space 332 and the fluid pipeline of the test chamber 33 . 334 delivers low-temperature dry air to the test space 332 to prevent condensation of the RF electronic components 40 . The test chamber 33 uses the second driver 3352 of the bonding unit 335 to drive the second anti-interference member 3351 to move downward in the Z direction to crimp the RF electronic component 40 with a predetermined crimping force, so that the contact 41 of the RF electronic component 40 is indeed contacted for testing. The probes 313 of the seat 312 , the probes 313 perform electrical testing operations on the radio frequency electronic components 40 through the circuit board 311 . Since the first anti-interference part 3311 of the cover body 331 and the second anti-interference part 3351 of the joint unit 335 are made of anti-shielding material, the dielectric coefficient is 1.03~1, which can pass the wireless signal; therefore, it is located in the test station. When the antenna 42 of the radio frequency electronic component 40 is directed toward 0° to be measured and emits a beam to transmit a wireless signal, under the conditions that the first anti-interference component 3311 and the second anti-interference component 3351 have low dielectric coefficient and low loss, the wireless The signal is transmitted to the antenna tester 32 through the first anti-interference component 3311 and the second anti-interference component 3351, and the signal operation part 321 of the antenna tester 32 receives the wireless signal of the radio frequency electronic component 40, and then performs the wireless signal test operation.

Please refer to FIGS. 8 and 9 , the testing device 30 of the present invention is arranged on the first holder or the second holder Adjuster for adjusting the placement angle or position; the difference between the third embodiment and the second embodiment is that the first holder 34A is a plate, and an adjuster 37 is assembled to adjust the placement angle or position; in this In an embodiment, the bottom of the first holder 34A is equipped with the adjuster 37 , the adjuster 37 is assembled on the machine table 50 , and the first holder 34A carries the electrical tester 31 and the test chamber 33 for adjusting the pendulum of the electrical tester 31 . position or angle, so that the antenna 42 of the radio frequency electronic component 40 can perform the wireless signal test operation with different preset directions, so as to reduce the configuration quantity of the antenna tester 32 and save the cost; Or include a plurality of adjustment rods to adjust the electrical tester 31 and the radio frequency electronic components 40 on it to be placed at an angle required for the test operation (eg, 0°, 30° or 45°), such as a plurality of adjustment rods The pieces can be operated with different heights to drive and adjust the first holder 34A.

When the electrical tester 31 supports the radio frequency electronic component 40, the test chamber 33 presses the radio frequency electronic component 40 with the second anti-interference member 3351 of the bonding unit 335, so that the contact 41 of the radio frequency electronic component 40 is indeed in contact with the electrical tester The probe 313 of 31 performs the electrical test operation; the adjuster 37 drives the first holder 34A , the electrical tester 31, the test chamber 33 and the radio frequency electronic component 40 adjust the placement angle synchronously, and the anti-interference range of the first anti-interference component 3311 and the second anti-interference component 3351 is greater than the direction range of the radio frequency electronic component 40 to be measured. Under the requirement, the antenna 42 of the radio frequency electronic component 40 is directed toward the 30° direction to be tested to transmit a wireless signal, and the wireless signal is transmitted to the antenna tester 32 through the first anti-interference component 3311 and the second anti-interference component 3351, so that the antenna tester 32 can receive the wireless signal. The wireless signal of the radio frequency electronic component 40 is used to perform the wireless signal test operation.

Please refer to FIGS. 10 and 11 , the fourth embodiment of the testing device 30 of the present invention is different from the first embodiment in that the testing chamber 33A is assembled on the second holder 35 so as to close the first embodiment on the cover 331A of the testing chamber 33A. A test space is formed by the holder 34; further, the cover body 331A is provided with at least one pick-up part for picking up and placing the radio frequency electronic components; in this embodiment, the test chamber 33A is located on the first anti-interference part 3311A of the cover body 331A The first surface 3313A is provided with a connecting member 3315A extending upward in the Z direction to be assembled on the crimping member 352 of the second holder 35. not shown), the other end is connected to the second surface 3314A of the first anti-interference member 3311A However, since the test chamber 33A is assembled on the second holder 35, the actuator 353 of the second holder 35 can be used as the first drive. Therefore, the actuator 353 drives the second holder 35 to displace, so that the second holder 35 drives the test chamber 33A and the antenna tester 32 to move downward in the Z direction synchronously. displacement, and the cover body 331A closes the first holder 34 to form a test space 332A , and make the pick-up part 3316A move the radio frequency electronic component 40 to the test seat 312 of the electrical tester 31, the second holder 35 presses the connecting part 3315A of the test chamber 33A with the crimping part 352, and the first part of the cover 331A is pressed down. An anti-interference member 3311A is pressed and deformed to press against the radio frequency electronic element 40 , so that the contact 41 of the radio frequency electronic element 40 can indeed contact the probes 313 of the test seat 312 to perform the electrical test operation. Furthermore, the antenna 42 of the RF electronic component 40 located at the test station emits a beam toward the 0° direction to be tested to transmit wireless signals, under the conditions that the first anti-interference component 3311A and the connecting component 3315A have low dielectric constant and low loss , and the wireless signal is transmitted to the antenna tester 32 , and the antenna tester 32 receives the wireless signal of the radio frequency electronic component 40 , and then performs the wireless signal test operation.

Please refer to Figures 2 to 4 and 12, which are schematic diagrams of the testing device 30 of the present invention applied to testing equipment, including a machine 50, a feeding device 60, a receiving device 70, the testing device 30 of the present invention, a conveying device 80 and a central control device (not shown in the figure); the feeding device 60 is arranged on the machine 50, and is provided with at least one feeding holder 61 for accommodating the RF electronic components to be tested; the receiving device 70 is arranged on the machine 50, and is provided with There is at least one receiver 71 for accommodating the tested RF electronic components; the testing device 30 of the present invention is arranged on the machine 50 and includes an electrical tester 31, an antenna tester 32 and a test chamber 33 for the radio frequency The electronic components perform electrical testing operations and wireless signal testing operations. In this embodiment, the testing devices 30 are respectively arranged on the first side and the second side of the machine 50 ; the conveying device 80 is arranged on the machine 50 and is provided with at least A conveyor is used to convey the radio frequency electronic components. In this embodiment, the conveying device 80 is provided with a first conveyor 81 for displacement in the XYZ direction. The first conveyor 81 takes out the radio frequency electronic components to be tested from the feeding device 60. And transferred to the second conveyor 82 which is the second carrier, the third conveyor 83 of the conveying device 80 picks and places the RF electronic components to be tested and the tested radio frequency electronic components on the second conveyor 82 and the electrical tester 31 of the testing device 30. For the RF electronic components to be tested, the electrical tester 31 and the antenna tester 32 of the testing device 30 perform electrical testing operations and wireless signal testing operations on the RF electronic components to be tested; the first conveyor 81 is then taken out from the second conveyor 82 The tested RF electronic components, and according to the test results, the tested RF electronic components are transferred to the receiving device 70 for sorting and storage ; The central control device is used to control and integrate the actions of various devices to perform automated operations and achieve practical benefits of improving operational efficiency.

[acquaintance] 10: RF Electronic Components 11: Contact 12: Antenna 21: circuit board 22: Test seat 221: Probe 23: Antenna Tester [this invention] 30: Test device 31: Electrical tester 311: circuit board 312: Test seat 313: Probe 32: Antenna Tester 321: Signal operation piece L: Working axis 33, 33A: Test room 331, 331A: cover body 3311, 3311A: The first anti-interference component 3312: Frame 3313, 3313A: first side 3314, 3314A: second side 3315A: Connecting Parts 3316A: Pick up parts 332: Test Space 333: First Drive 334: Fluid Line 335: Engagement unit 3351: Second anti-interference part 3352: Second drive 34, 34A: The first bearing 35, 35A: The second bearing 351: Signal channel 352: Crimp parts 353: Actuator 36: Conveyor 37: Adjuster 40: RF Electronic Components 41: Contact 42: Antenna 50: Machine 60: Feeding device 61: Feed holder 70: Receiving device 71: Receiving holder 80: Conveying device 81: First Conveyor 82: Second conveyor 83: Third Conveyor

Figure 1: A schematic diagram of the use of a conventional test device. FIG. 2 is a schematic diagram of the first embodiment of the testing device of the present invention. FIG. 3 is a schematic diagram (1) of the use of the first embodiment of the testing device of the present invention. FIG. 4 is a schematic diagram (2) of the use of the first embodiment of the testing device of the present invention. FIG. 5 is a schematic diagram of the second embodiment of the testing device of the present invention. FIG. 6 is a schematic diagram (1) of the use of the second embodiment of the testing device of the present invention. FIG. 7 is a schematic diagram (2) of the use of the second embodiment of the testing device of the present invention. FIG. 8 is a schematic diagram of a third embodiment of the testing device of the present invention. FIG. 9 is a schematic diagram of the use of the third embodiment of the testing device of the present invention. FIG. 10 is a schematic diagram of the fourth embodiment of the testing device of the present invention. FIG. 11 is a schematic diagram of the use of the fourth embodiment of the testing device of the present invention. FIG. 12 is a schematic diagram of the application of the testing device of the present invention to testing equipment.

311: circuit board

312: Test seat

313: Probe

32: Antenna Tester

321: Signal operation piece

33: Test Room

331: cover body

3311: The first anti-interference component

332: Test Space

333: First Drive

334: Fluid Line

335: Engagement unit

3351: Second anti-interference part

3352: Second drive

34: The first bearing

40: RF Electronic Components

41: Contact

42: Antenna

Claims (11)

A radio frequency electronic component testing device, comprising: the first bearing; the second bearing; Electrical tester: configured on the first holder, for testing the RF electrical equipment at the test station Sub-components perform electrical testing operations; Antenna tester: configured on the second holder for performing wireless Signal test operation; Test room: a cover body with at least one first anti-interference component is provided, and the cover body closes the The first holder forms a test space, the test space accommodates the electrical test tester, the cover is located between the electrical tester and the antenna tester , and use the first anti-interference component for the antenna tester and the radio frequency electronics Wireless signals transmitted between components pass through. The radio frequency electronic component testing device as claimed in claim 1, wherein the second holder is provided with a signal channel, one end of the signal channel is for assembling the antenna tester, and the other end is provided with a crimping part for crimping the first an anti-interference component. The radio frequency electronic component testing device according to claim 2, wherein the cover of the testing chamber is assembled on the second holder. The radio frequency electronic component testing device as claimed in claim 3, wherein the cover of the test chamber is provided with at least one pick-up component for picking and placing the radio frequency electronic component. The radio frequency electronic component testing device according to claim 1, wherein the cover of the testing chamber includes the first anti-interference component and a frame, and the frame is equipped with the first anti-interference component. As claimed in claim 1, in the test device for radio frequency electronic components, the test chamber is provided with a first driver for driving the cover to open and close. The radio frequency electronic component testing device according to claim 1, wherein the test chamber is provided with a joint unit on the first holder, the joint unit includes a second driver and a second anti-interference component, the second driver is used for driving the The second anti-interference component is displaced, and the second anti-interference component is used for crimping the radio frequency electronic component. The radio frequency electronic component testing device as claimed in claim 1, further comprising an adjuster, the adjuster is assembled on the first holder or the second holder for adjusting the placement angle or position. The RF electronic component testing device according to any one of claims 1 to 8, wherein the testing chamber is provided with at least one environmental controller. The radio frequency electronic component testing device according to any one of claims 1 to 8, wherein the first anti-interference component in the testing chamber is made of anti-shielding material and has a low dielectric coefficient. A test device comprising: Machine; Feeding device: It is arranged on the machine and is provided with at least one accommodating radio frequency electronic component to be tested. the feed holder; Receiving device: It is arranged on the machine, and is equipped with at least one accommodating radio frequency electronic component that has been tested. the receiver; At least the radio frequency electronic component testing device as described in claim 1: disposed on the machine; Conveying device: It is arranged on the machine and has at least one conveyor for transmitting radio frequency Electronic component; Central control device: to control and integrate the actions of various devices to perform automated operations.

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