TWI447416B - Electronic component testing device and its application testing equipment - Google Patents

Description

Electronic component testing device and application testing device thereof

The invention provides an electronic component testing device and an application testing device thereof capable of automatically testing wireless communication electronic components and improving the quality of testing by easily isolating noise interference.

Nowadays, wireless communication electronic components (such as radio frequency ICs) have been widely used in mobile phones, base stations or wireless networks. To ensure the quality of electronic components, operators must test the functions of receiving and transmitting RF signals of wireless communication electronic components. At present, the test method is for the staff to insert the wireless communication electronic components into the test socket. Since the insertion port formed by the upper and lower rows of the test socket is oblique, the worker must first insert the wireless communication electronic component into the test portion. (ie, the golden finger) is initially inserted obliquely into the insertion port of the test socket, and then the wireless communication electronic component is swung to make a swing, so that the plug-in portion of the wireless communication electronic component is electrically connected to the upper and lower rows of the probe, and then The test machine sends test signals for wireless communication electronic components to receive, enables the wireless communication electronic components to perform test operations on the test socket, and eliminates defective wireless communication electronic components according to the test results; however, this test operation has the following defects:

1. The test method is to manually insert the wireless communication electronic component to be tested into the insertion port of the test socket, and then pull the wireless communication electronic component, so that the wireless communication electronic component can be electrically connected to the test socket. The number of wireless communication electronic components measured is numerous, and this manual operation method is not only time-consuming and labor-intensive, but also reduces production efficiency.

2. The test method is to manually pull the electronic components, so that the wireless communication electronic components can be electrically connected to the test socket. If the manual operation is improperly operated, the wireless communication electronic components are easily damaged, resulting in an increase in the damage rate and cost of the electronic components. Missing.

3.Because the staff is in the open space for wireless communication electronic component testing, the test operation is susceptible to other noise interference, which will affect the quality of the test. If an isolation room is added in the factory for the test operation, it will increase greatly. cost.

Therefore, how to design an electronic component test device that can automatically test wireless communication electronic components to improve test throughput and improve noise quality by easily isolating noise interference is the standard developed by the industry.

An object of the present invention is to provide an electronic component testing device, which is provided with a testing mechanism, a feeder and a tilting mechanism, and is provided with a through-port and can isolate a wireless signal cover. The mechanism is provided with a carrier for carrying a test circuit board with a test socket, the feeder is provided with a loading platform having at least one socket, and the electronic component is mounted by the socket, the swaying mechanism is When the plug portion of the electronic component is inserted into the test socket, the seat of the test mechanism or the socket of the loader can be driven to swing, so that the plug portion of the electronic component and the probe of the test socket are electrically connected to perform the test operation; In this way, the electronic components can be tested automatically, and the noise is disturbed by the cover to improve the test quality.

A second object of the present invention is to provide an electronic component testing device which uses a swaying mechanism to drive a seat of a test mechanism or a socket of a feeder to oscillate the socket of the test socket and the electronic component. Sexual connection, which can prevent the electronic components from being damaged due to improper human operation, and achieve the practical benefit of reducing the damage rate of the electronic components.

A third object of the present invention is to provide an electronic component testing device, wherein the feeder is provided with a loading mechanism that can drive the loading platform of the bearing holder to at least one direction to move into and out of the outer cover, so that the bearing seat is outside the outer cover. The electronic component to be tested is conveniently carried, and the plugged portion of the electronic component is inserted into the test seat by reverse displacement. After the test is completed, the electronic component to be tested is carried out of the outer cover to achieve the practical benefit of facilitating the entry and exit.

A fourth object of the present invention is to provide an electronic component testing device, wherein the outer cover is made of a spacer material, so that the electronic component to be tested can effectively prevent external noise interference when performing test operations in the outer cover, and it is unnecessary to add cost isolation. Room, to achieve practical benefits of cost savings.

A fifth aspect of the present invention provides a test apparatus for applying an electronic component testing device, comprising: a machine table, a feeding device, a receiving device, at least one testing device, a conveying device, and a central control device, wherein the feeding device is disposed in the machine a receiving device for accommodating at least one electronic component to be tested, the receiving device is disposed on the machine table for accommodating at least one electronic component to be tested, and the testing device is a probe for connecting the electronic component to the test socket It is electrically connected, and the electronic components are automatically tested, and the external noise is effectively prevented. The conveying device is provided with at least one moving mechanism of the shifting device for moving between the feeding device, the receiving device and the testing device. The electronic components to be tested/tested, the central control device is used to control and integrate the operation of each device to perform automated operations, and achieve the practical benefits of automated testing to improve test production efficiency.

A sixth object of the present invention is to provide a testing device for applying an electronic component testing device, wherein a feeder of the testing device can control the loading mechanism of the carrier to carry the electronic component of the housing to be tested outside the housing. The material is fed, and the shifting device of the conveying device is reduced to take the displacement stroke of the electronic component to be tested/tested at the bearing seat, thereby shortening the materializing time and achieving the practical benefit of improving the production efficiency.

In order to make the reviewer further understand the present invention, a preferred embodiment will be described in conjunction with the drawings, as follows:

Referring to Figures 1, 2 and 3, the test device 10 of the present invention can be applied to test wireless communication electronic components, including an organic seat 11, a cover 12, a test mechanism 13, a feeder 14 and a tilting mechanism 15, which is 11 The stand can be a stand-alone body or a test machine. In this embodiment, the stand 11 is a separate seat and can be covered with a spacer made of a spacer material (not shown) for The noise is disturbed; the outer cover 12 is mounted on the base 11 and has a through opening 121. In the embodiment, the outer cover 12 is made of a spacer material for isolating external noise interference; the testing mechanism 13 The base 11 is provided with a carrier 131 for carrying the test circuit board 132 with the test socket 133, and the test socket 133 for testing the wireless communication electronic components. Further, the carrier 131 can be fixedly mounted on the base. 11 or a support frame is pivoted on at least one side, and the support frame is fixed to the base 11. In the embodiment, the test mechanism 13 is pivotally fixed on both sides of the carrier 131. The support frame 134 and the tilting mechanism 15 on the base 11 enable the carrier 131 to carry the test circuit board 132 with the test seat 133 The test mechanism 13 is further provided with at least one test piece which can be the test antenna 135 for electrically connecting the contact portion of the wireless communication electronic component to test the transmission and reception signals. Further, the test antenna 135 can be independently driven by a pressure cylinder. In at least one direction of displacement, or mounted on the swaying mechanism 15, in the present embodiment, the test antenna 135 is mounted on the swaying mechanism 15, and is driven by the swaying mechanism 15 for Z-axis displacement, so that the test antenna The 135 is electrically connected to the contact portion of the wireless communication electronic component to test whether the receiving/transmitting signal function of the wireless communication electronic component is abnormal, etc.; the feeder 14 is mounted on the base 11 and is provided with at least one The loading platform 141 of the socket 1411, the socket 1411 is for receiving wireless communication electronic components, and further, the loading platform 141 can be fixed on the base 11, or driven by a carrier mechanism, the feeder 14 The mounting table 141 can be provided with a fixed bearing or a movable bearing. The bearing 1411 can be a different type of groove or through hole for inserting wireless communication electronic components. In this embodiment, The feeder 14 is connected to the corresponding cover 12 121 is provided with a loading table 141 having a socket 1411, and at least one positioning member capable of positioning the wireless communication electronic component to be tested is disposed on the loading table 141, and the positioning member can be a positioning pin, a pressing block or a spring piece. In this embodiment, at least one positioning member for positioning pins 1412 is disposed on the socket 1411 for positioning the wireless communication electronic component to be tested, and a sealing plate 142 is disposed on the loading platform 141. The sealing plate 142 can close the opening 121 when the loading table 141 is displaced into the interior of the outer cover 12. Further, the sealing plate 142 can be covered with a spacer made of a spacer material (not shown) for isolating the noise. The carrier 14 is provided with a carrier mechanism for driving the loading table 141 to at least one direction. The carrier mechanism drives the loading table 141 to drive the loading table 141 into the housing 12 at least in one direction. Further, The power source is disposed on the base 11 and has a plurality of pressure cylinders 143. The piston rods of the pressure cylinders 143 are connected to the loading platform 141 for driving the loading table 141 to reciprocate at least one direction. The feeder 14 is further At least one side of the socket 1411 is provided with a positioning member which can be a pressing block 144 for pressing against the wireless communication electronic And a control mechanism for controlling the telescopic displacement of the pressing block 144. In the embodiment, the feeder 14 is provided with a through hole 1413 and a sliding slot 1414 on both sides of the socket 1411 of the loading table 141. The sliding slot 1414 is configured to slide a pressing block 144 having a pressing portion 1441. The pressing portion 1441 can be flexibly displaced by the through hole 1413 of the loading table 141 for pressing or releasing the wireless communication electronic component on the socket 1411. The component and the control mechanism include a moving member 145 and a control member 146. The moving member 145 is provided with a receiving slot 1451 for receiving the control member 146. One end of the moving member 145 is disposed on the base 11 and the other end is coupled. In the loading table 141, between the control member 146 and each of the pressing blocks 144, guiding members and guiding members are provided to control the displacement of the pressing blocks 144, and further, the pressing blocks 144 are attached. The bottom surface is provided with a guiding member which can be a guiding rod 1442. The guiding rod 1442 protrudes from the bottom surface of the loading table 141, and the guiding member 146 is respectively provided with a guiding groove corresponding to the guiding rod 1442 of each pressing block 144. In the guide member of 1461, the two guide grooves 1461 are gradually inclined outward to guide the guide rods 1442. In the embodiment, the auxiliary sliding structure is provided with an auxiliary sliding structure. The auxiliary sliding structure is disposed between the moving member 145 and the base 11 in cooperation with the movable member 145. The sliding rail 1471 and the sliding block 1472 are further provided with a first limiting structure for limiting the displacement of the control member 146. In the embodiment, the first limiting structure is disposed between the control member 146 and the base 11. The at least one set of the engaging member and the abutting member are matched with each other. Further, the first limiting structure is provided on the two sides of the control member 146 to be abutting members of the top abutting block 1462, and is disposed on the base 11 The top abutting block 1462 of the corresponding control member 146 is provided with a blocking member which can be a stop 1463 for limiting the displacement of the control member 146, and the control mechanism is provided with a second limiting structure for restricting the displacement of the moving member 145. Further, in the embodiment, at least one set of matching limiting blocks and limiting slots are disposed between the control member 146 and the moving member 145. In the embodiment, the control member 146 is provided with a plurality of limiting slots 1464. And a limiting block 1452 is disposed at a position corresponding to each of the limiting slots 1464 of the moving member 145, and the limit is limited to The block 1452 can be displaced along the limiting slot 1464. Further, the control mechanism is provided with at least one elastic member between the moving member 145 and the control member 146 for controlling the force of the pressing block 144 against the wireless communication electronic component. In the embodiment, the elastic member is a spring 148 for controlling the pressing portion 1441 of each pressing block 144 to press against the force of the wireless communication electronic component, thereby visualizing different electronic components, and selecting a spring 148 with a suitable elastic force to Controlling the pressing force of the pressing block 144; the tilting mechanism 15 is disposed on the base 11 for controlling the carrier 131 of the testing mechanism 13 when the plug portion of the wireless communication electronic component is inserted into the test seat 133 or The socket 1411 of the feeder 14 swings, so that the plug portion of the wireless communication electronic component is electrically connected to the probe of the test socket 133. Further, the tilting mechanism 15 is provided with at least one actuator driven by the driving source. And the actuator 14 drives the bearing seat 131 of the testing mechanism 13 or the socket 1411 of the feeder 14 to swing. In this embodiment, the swaying mechanism 15 is fastened to the frame 11 to fix the frame 151 as a pressure cylinder 152. The driving source, the piston rod of the pressure cylinder 152 is connected to the transmission The frame 153 is provided with an auxiliary sliding structure between the transmission frame 153 and the fixing frame 151 for assisting the smooth displacement of the transmission frame 153. Further, the auxiliary sliding structure is provided with a mutual slip between the transmission frame 153 and the fixing frame 151. In the present embodiment, the mounting bracket 151 is provided with a sliding rail 1511, and the driving bracket 153 is provided with a sliding seat 1531 which is slidably disposed on the sliding rail 1511, and the transmission frame 153 is a shaft. The other end of the actuating member 154 is pivotally connected to the carrier 131 of the testing mechanism 13 for pivoting the carrier 13 and the carrier 153 is provided with at least one supporting component for assembly. The test antenna 135 of the testing mechanism 13 is configured to drive the test antenna 135 to be electrically connected to the contact portion of the wireless communication electronic component in at least one direction. In this embodiment, the support component includes the first support frame 155 and the plurality of second The support frame 156, the first support frame 155 is fixed to the transmission frame 153, and the first sliding slot 1551 is opened, and each of the second support frames 156 is located below the first support frame 155 for carrying the test antenna 135 and opening a second chute 1561 having a different direction from the first chute 1551 Then to pin 157 having a first opposing wear, 1551,1561 two chutes, a test antenna 135 may be adjusted in different directions of displacement.

Referring to FIGS. 1 and 4, in use, the test apparatus 10 can control the piston rod of the pressure cylinder 143 of the feeder 14 to protrude outward, and the loading table 141 of the carrier holder 1411 passes through the opening of the housing 12. 121 is slid to the outside, because the moving member 145 of the feeder 14 is coupled to the loading table 141, so that the moving member 145 can be displaced by the loading table 141 and the carrying member 146 is synchronously displaced outwardly, and the moving member 145 utilizes the sliding rail. 1471 assists the smooth displacement along the sliding seat 1472 on the base 11, and when the top abutting block 1462 of the control member 146 abuts against the stop 1463, the displacement of the control member 146 can be restricted, due to the control member 146, the moving member 145 and the The table 141 is synchronously displaced, and the guiding groove 1461 of the control member 146 does not drive the displacement of the guiding rod 1442 of the two pressing block 144, and the pressing portion 1441 of the second pressing block 144 is kept protruding from the through hole 1413 of the loading table 141. In the unopened state; please refer to Figures 5 and 6, and then the piston rod of the pressure cylinder 143 continues to protrude outward to drive the loading table 141 to be displaced, and the loading table 141, that is, the moving moving member 145, is synchronously displaced outward, the moving part 145 is a tension spring 148. Since the control member 146 is positioned, the loading table 141 can guide the guide block 144. 1442 is displaced along the guiding groove 1461 of the control member 146, so that the two guiding rods 1442 are guided by the guiding grooves 1461 to drive the two pressing blocks 144 to be respectively displaced in the sliding slots 1414 of the loading table 141, so that the two pressing blocks 144 The pressing portion 1441 is retracted into the through hole 1413 of the loading table 141 to be in an open state, and the moving member 145 is restrained from being displaced when the limiting block 1452 is abutted against the end of the limiting groove 1464 of the control member 146, thereby making the bearing seat 1411 is located outside the outer cover 12 to carry the wireless communication electronic component 20 to be tested, so as to improve the convenience of the feeding; please refer to the figures 7 and 8, after the socket 1411 of the loading platform 141 carries the wireless communication electronic component 20 to be tested. The piston rod of the control cylinder 143 drives the loading table 141 of the feeder 14 to be displaced inwardly, and the loading table 141 drives the moving member 145 to move inward synchronously, and the guiding rod 1442 of the second pressing block 144 is along the control member. The guide groove 1461 of the 146 is displaced, so that the pressing blocks 144 are reversely displaced in the sliding grooves 1414 of the loading table 141, so that the pressing portions 1441 protrude again from the through holes 1413 of the loading table 141 and the crimping is to be tested. The wireless communication electronic component 20, because the spring 148 can generate a pulling force to the loading table 141 through the moving member 145, so that the loading table 14 The guiding rods 1442 of the pressing blocks 144 of the first holding block 144 are held at one end of the guiding groove 1461 of the control member 146, so that the pressing portion 1441 of each pressing block 144 is protruded and pressed against the wireless communication electronic component 20, so that the spring can be utilized. The pressing portion 144 of each pressing block 144 is pressed against the force of the wireless communication electronic component by the elastic force of 148. At this time, the limiting block 1452 of the moving member 145 is abutted against the other end of the limiting slot 1464 of the control member 146. The displacement is restricted, and then the piston rod of the pressure cylinder 143 continues to drive the loading table 141 to be displaced inwardly. The loading table 141 is moved inwardly by the moving member 145 against the driving control member 146, and the bearing 1411 of the feeder 14 can be carried. The wireless communication electronic component 20 to be tested is slid into the inside through the opening 121 of the outer cover 12, and the sealing plate 142 closes the opening 121. The insertion port formed by the upper and lower rows of the probes of the test socket 133 is formed. The slanting portion of the wireless communication electronic component 20 to be tested is initially inserted into the insertion opening of the test socket 133, and the contact portion 202 of the wireless communication electronic component 20 to be tested is formed. Corresponding to test antenna 135; please refer to Figures 1, 9 and test device 10 The pressure cylinder 152 of the swaying mechanism 15 drives the transmission frame 153 to be displaced downward, and the transmission frame 153 drives the first and second support frames 155 and 156 and the actuating member 154 to move down synchronously, and slides along the fixed frame 151 by the sliding seat 1531. The rail 1511 slides, and the auxiliary transmission frame 153 is smoothly displaced, and the actuating member 154 interlocks one end of the lower ballast seat 131, so that the carrier 131 swings the appropriate angle downward with the shaft of the support frame 134 as a rotating shaft to adjust the test seat. The angle of the 133 is such that the probe of the test socket 133 is in contact with the plug portion 201 of the wireless communication electronic component 20 to be tested. At this time, the transmission frame 153 drives the test antenna 135 by using the first and second support frames 155 and 156. Simultaneously moving down, the test antenna 135 is in contact with the contact portion 202 of the wireless communication electronic component 20 to be tested, so that the wireless communication electronic component 20 to be tested performs a test operation inside the housing 12, for example, testing the function of receiving/transmitting signals, etc. The cover 12 is made of a spacer material to prevent external noise interference testing, and it is not necessary to add an isolation chamber at a cost to improve the test quality. Please refer to Figure 10 (with reference to Figures 4, 5 and 7) for wireless Communication electronic component 20 After the test is completed, the test device 10 can control the pressure cylinder 152 of the swaying mechanism 15 to drive the drive frame 153 to move upward, and the drive frame 153 drives the first and second support frames 155, 156 and the actuating member 154 to move up synchronously, and utilizes the actuating member. 154 pulls one end of the pull-up carrier 131, so that the carrier 131 drives the test socket 133 to swing upward and reset, so as to complete the insertion of the plug-in portion 201 of the wireless communication electronic component 20 from the test socket 133. At this time, the first of the tilting mechanism 15 The first and second support frames 155 and 156 also synchronously drive the test antenna 135 to move away from the contact portion 202 of the wireless communication electronic component 20, and then the test device 10 controls the pressure cylinder 143 of the feeder 14 to drive the loading table 141. The external displacement, since the positioning pin 1412 is worn through the tested wireless communication electronic component 20, the loading table 141 can be pulled out by the positioning pin 1412 to remove the wireless communication electronic component 20 from the test socket 133, so that the bearing 1411 is carried. The wireless communication electronic component 20 is slid to the outside through the opening 121 of the outer cover 12, and the moving member 145 is moved by the loading table 141, and the carrying control member 146 is synchronously displaced outward, and the guiding member of the second pressing block 144 is guided. 1442 along the guide groove 14 of the control member 146 The displacement of 61 causes the pressing portion 1441 of the two-pressing block 144 to be retracted into the through hole 1413 of the loading table 141 to open the released wireless communication electronic component 20 for reclaiming, thereby achieving the practical benefit of the automated test.

Please refer to FIG. 11 , which is an electronic component testing device for applying the above test device. The electronic component testing device comprises a machine table 30 , a feeding device 40 , a receiving device 50 , at least one testing device 10 , a conveying device 60 and a central control device . The apparatus 30 can be polygonal or circular, and the feeding device 40, the receiving device 50 and the at least one testing device 10 are arranged around the conveying device 60, and the feeding device 40 is disposed on the machine. The stage 30 is configured to receive at least one electronic component to be tested. Further, the feeding device 40 can be used for the feeding device 60 to directly take out the electronic component to be tested, or is configured with at least one tray for holding the electronic component to be tested. In this embodiment, the feeding device 40 is provided with at least one tray 41 for holding the electronic component to be tested, and is provided with a pick-and-place unit 42 for at least one direction for shifting the electronic device to be tested on the tray 41. The component is taken out and transferred to the feeding area 43 for taking out the material; the receiving device 50 is disposed on the machine table 30 for accommodating at least one completed electronic component, and further, the receiving device 50 is directly available to the conveying device 60. Place the measured electronic components, or In the present embodiment, the receiving device 50 is provided with at least one tray 51 for holding the electronic component, and is provided with a displacement for at least one direction. The device 52 is configured to take out the measured electronic components in at least one receiving area 53 and transfer them to the tray 51 for storage; at least one testing device 10 is the same as the above testing device (please refer to the first, second, third And configured on the machine 30 for testing at least one electronic component, such as a wireless communication electronic component, and transmitting the test result to a central control device (not shown) by a tester (not shown). The central control device controls the operation of each device. In this embodiment, a plurality of test devices 10, 10A, 10B, and 10C of the same test device are disposed on the circumferential side of the transport device 60 for testing electronic components; The device 60 is disposed on the machine 30, and is provided with at least one material moving mechanism for transferring the electronic components, the moving mechanism can be a robot arm, and further, if the conveying device 60 is configured with a plurality of Feeding mechanism with a shifter, on machine table 30 A temporary area of at least one temporary electronic component may be added to enable a plurality of shifting mechanisms with a shifter to alternately transfer electronic components between the temporary area and the devices. In this embodiment, the transport device 60 moves. The material mechanism 61 can drive the displacement of the first shifter 611 and the second shifter 612, such as horizontal displacement, lifting displacement and rotation, for feeding device 40, receiving device 50 and each testing device 10, 10A, The electronic components to be tested/tested are transferred between 10B and 10C.

Referring to FIG. 12, an embodiment of testing a wireless communication electronic component for an electronic component test equipment application, when the test operation is performed, the feeding device 40 controls the pick-and-place device 42 to take out the wireless communication electronic device to be tested on the tray 41. The component 20 is transferred to the feeding zone 43, and the moving mechanism 61 of the conveying device 60 drives the first and second feeders 611, 612 to be displaced to the feeding device 40, and the first feeder 611 is provided. The feeding area 43 of the material device 40 takes out the wireless communication electronic component 20 to be tested; referring to Fig. 13 (refer to the figures 4, 5, and 6), the feeder 14 of the testing device 10 drives the bearing 1411 to the displacement. The outer cover 12 is externally controlled to open the two pressure solid block 144 so that the socket 1411 carries the wireless communication electronic component 20 to be tested, and the material transfer mechanism 61 of the transport device 60 drives the first and second shifters 611, 612 to be displaced to The test device 10 is located, and the first loader 611 places the wireless communication electronic component 20 to be tested into the socket 1411 of the test device 10; please refer to Figure 14 (see Figures 7, 8, and 9). The feeder 14 of the testing device 10 controls the socket 1411 carrying the wireless communication electronic component 20 to be tested. The outer portion of the outer cover 12 is displaced to the inside, and the two pressing blocks 144 protrude from the through holes 1413 of the loading table 141 to press the wireless communication electronic component 20 to be tested, and the feeder 14 drives the wireless communication electronic component 20 to be tested. The insertion portion 201 is inserted into the test socket 133 of the carrier 131, and then the swaying mechanism 15 drives the carrier 131 to swing at an appropriate angle to connect the probe of the test socket 133 with the connector of the wireless communication electronic component 20 to be tested. 201 is electrically contacted, and the swaying mechanism 15 drives the test antenna 135 to contact the contact portion 202 of the wireless communication electronic component 20 to be tested, so that the wireless communication electronic component 20 to be tested performs a test operation in the outer cover 12, at this time, The socket 1411A of the test device 10A is located outside the outer cover 12A, and the material transfer mechanism 61 of the transport device 60 drives the first and second feeders 611, 612 to be displaced to the test device 10A, and the first feeder 611 is moved. The next wireless communication electronic component 21 to be tested is placed in the socket 1411A of the testing device 10A. Therefore, the conveying device 60 can insert the wireless communication electronic component to be tested in sequence with each testing device 10, 10A, 10B, and 10C. ; please refer to Figure 15 (see section 10) 13)), after the test device 10 is tested, the feeder 14 controls the displacement of the socket 1411 carrying the tested wireless communication electronic component 20 to the outside of the outer cover 12, and opens the two pressure solid block 144 for the conveying device 60. The retracting device 60 can control the first and second shifters 611, 612 to be displaced to the testing device 10, and the second feeder 612 can take out the tested wireless communication electronic component 20 on the socket 1411 of the testing device 10. And transferred to the receiving area 53 of the receiving device 50, the receiving device 50 takes the wireless communication electronic component 20 in the receiving area 53 with the pick-up device 52, and transfers it to the tray 51 for storage.

Please refer to FIG. 16 , which is another electronic component test sorting machine applying the above test device. The test sorter includes an organic table 70 , a feeding device 80 , a receiving device 90 , at least one testing device 10 , a conveying device 100 , and The central control device is disposed on the machine 70 for accommodating at least one electronic component to be tested. In this embodiment, the feeding device 80 is configured with at least one tray for the electronic component to be tested. The receiving device 90 is disposed on the machine table 70 for accommodating at least one electronic component that is inspected. In this embodiment, a plurality of trays 91 capable of holding different levels of electronic components are provided; at least A test device 10 is the same as the test device described above (please refer to Figures 1, 2, and 3) and is configured on the machine. The stage 70 is configured to test at least one electronic component, such as a wireless communication electronic component, and transmit the test result to a central control device (not shown) by a tester (not shown), and the central control device controls each device. In this embodiment, a plurality of test devices 10 of the same test device are disposed on the machine 70 for testing electronic components. The transport device 100 is disposed on the machine 70 and is provided with at least one In the present embodiment, the conveying device 100 includes a first moving mechanism 101, a carrying mechanism 102 and a second moving mechanism 103, and the first moving material is used for transferring the electronic components. The mechanism 101 is provided with at least one first feeder 1011 for transferring the electronic components to be tested/tested between the feeding device 80, the receiving device 90 and the carrying mechanism 102, and the carrying mechanism 102 is provided. At least one stage 1021 is configured to carry the electronic component to be tested/tested in the first transfer mechanism 101 and the second transfer mechanism 103. Further, the carrier mechanism 102 can adjust the angular direction of the electronic component. The second transfer mechanism 103 is provided with at least one second shifter 1031 for use In each test apparatus 10 carrying mechanism 102 and transfer the test / measurement of the finished electronic device.

10, 10A, 10B, 10C‧‧‧ test equipment

11‧‧‧After

12, 12A‧‧‧ outer cover

121‧‧‧ mouth

13‧‧‧Test institutions

131‧‧‧Seat

132‧‧‧Test circuit board

133‧‧‧ test seat

134‧‧‧Support frame

135‧‧‧Test antenna

14‧‧‧ feeder

141‧‧‧Sheeting table

1411, 1411A‧‧‧ seat

1412‧‧‧Locating pin

1413‧‧‧Perforation

1414‧‧‧Chute

142‧‧‧Closed

143‧‧‧pressure cylinder

144‧‧‧force block

1441‧‧‧ Pressing department

1442‧‧‧guides

145‧‧‧Mobile parts

1451‧‧‧ accommodating slots

1452‧‧‧Limited blocks

146‧‧‧Controls

1461‧‧‧ Guide slot

1462‧‧‧Top block

1463‧‧ ‧block

1464‧‧‧Limited slot

1471‧‧‧rails

1472‧‧‧Slide

148‧‧ ‧ spring

15‧‧‧掣动机构

151‧‧‧ Fixing frame

1511‧‧‧rails

152‧‧‧Cylinder

153‧‧‧ drive frame

1531‧‧‧Slide

154‧‧‧actuation

155‧‧‧First support frame

1551‧‧‧First chute

156‧‧‧second support frame

1561‧‧‧Second chute

157‧‧‧Equipment

20, 21‧‧‧Wireless communication electronic components

201‧‧‧Interface

202‧‧‧Contact Department

30‧‧‧ machine

40‧‧‧Feeding device

41‧‧‧Tray

42‧‧‧ picker

43‧‧‧Feeding area

50‧‧‧ receiving device

51‧‧‧Tray

52‧‧‧ picker

53‧‧‧ receiving area

60‧‧‧Conveyor

61‧‧‧Transfer mechanism

611‧‧‧first shifter

612‧‧‧Second shifter

70‧‧‧ machine

80‧‧‧Feeding device

81‧‧‧Tray

90‧‧‧ Receiving device

91‧‧‧Tray

100‧‧‧Conveyor

101‧‧‧First Transfer Mechanism

1011‧‧‧First mover

102‧‧‧ Carriers

1021‧‧‧ stage

103‧‧‧Second transfer mechanism

1031‧‧‧Second shifter

Figure 1: Schematic diagram of the appearance of the test device of the present invention.

Figure 2: Side view of the test device of the present invention.

Figure 3: Top view of the test device of the present invention.

Figure 4: Schematic diagram of the use of the test device of the present invention (I).

Figure 5: Schematic diagram of the use of the test device of the present invention (2).

Figure 6: Schematic diagram of the use of the test device of the present invention (3).

Figure 7: Schematic diagram of the use of the test device of the present invention (4).

Figure 8: Schematic diagram of the use of the test device of the present invention (5).

Figure 9: Schematic diagram of the use of the test device of the present invention (vi).

Figure 10: Schematic diagram of the use of the test device of the present invention (7).

Figure 11 is a schematic view of an electronic component testing device using the test device of the present invention.

Figure 12: Schematic diagram of the use of the electronic component testing device of the present invention (1).

Figure 13: Schematic diagram of the use of the electronic component testing device of the present invention (2).

Figure 14: Schematic diagram of the use of the electronic component testing device of the present invention (3).

Figure 15: Schematic diagram of the use of the electronic component testing device of the present invention (4).

Figure 16 is a schematic illustration of a test sorter for another application test device of the present invention.

10. . . Test device

11. . . Machine base

12. . . Cover

121. . . Port

13. . . testing agency

131. . . Carrier

132. . . Test board

133. . . Test stand

134. . . Support frame

135. . . Test antenna

14. . . Feeder

141. . . Loading station

1411. . . Seat

1412. . . Locating pin

1413. . . perforation

1414. . . Chute

142. . . Seal plate

143. . . Pressure cylinder

144. . . Press block

1441. . . Pressing part

145. . . Moving parts

1451. . . Locating slot

146. . . Control

1461. . . Guide slot

1471. . . Slide rail

1472. . . Slide

148. . . spring

15. . . Tilting mechanism

151. . . Fixing frame

1511. . . Slide rail

152. . . Pressure cylinder

153. . . Drive frame

154. . . Actuator

155. . . First support frame

1551. . . First chute

156. . . Second support frame

1561. . . Second chute

157. . . Bolt

Claims (9)

An electronic component testing device comprises: a base; an outer cover: disposed on the base and provided with a through port; the test mechanism is disposed on the base and has a carrier for carrying at least one test seat a test circuit board for testing electronic components; a feeder: a loading station having at least one socket for mounting electronic components; and a tilting mechanism: configured a drive source and at least one actuating member driven by the drive source, the actuating member driving the test seat or the feeder when the plug portion of the electronic component is inserted into the test seat of the test mechanism The socket is oscillated so that the plug portion of the electronic component is electrically connected to the test socket to perform a test operation. The electronic component testing device according to claim 1, wherein the testing mechanism is pivotally connected to the support frame provided on the base at least one side of the carrier, so that the carrier can be oscillatingly oscillated. The electronic component testing device according to claim 1, wherein the loading platform of the feeder corresponds to the opening of the outer cover, and is provided with a carrying mechanism with a power source for driving the loading platform. Displace the access cover into the cover in at least one direction. The electronic component testing device according to claim 3, wherein the feeder is provided with a sealing plate on the loading table that can close the opening of the outer cover. The electronic component testing device according to claim 1 or 3, wherein the feeder is provided with at least one positioning member for positioning the electronic component on the loading table. The electronic component testing device according to claim 5, wherein the feeder is provided with a positioning member capable of being a pressing block on at least one side of the socket of the loading table, and is provided with controllable pressing Block displacement actuation control mechanism. The electronic component testing device according to claim 6, wherein the control mechanism is provided with a perforation and a chute on at least one side of the socket, and the sliding slot is provided for sliding pressure The solid block has a pressing portion at a position corresponding to the perforation, and the control structure includes a control member and a moving member. One end of the moving member is disposed on the base and the other end is coupled to the loading platform and can be carried The control member is further provided with a guiding member and a guiding member matched with each other between the control member and the pressing block for controlling the displacement operation of the pressing block, and the control mechanism is provided with an auxiliary sliding structure below the moving member. In order to assist the displacement of the moving member, a first limiting structure capable of limiting the displacement of the control member and a second limiting structure capable of limiting the displacement of the moving member are further provided. The electronic component testing device according to claim 1, wherein the testing device further comprises at least one test piece electrically contacting the contact portion of the electronic component, the swaying mechanism being provided with at least one supporting component, To test the test piece of the test mechanism. A testing device for applying an electronic component testing device, comprising: a machine; a feeding device: configured on the machine to accommodate at least one electronic component to be tested; and a receiving device disposed on the machine to accommodate at least An electronic component that has been tested; at least one electronic component testing device according to claim 1 for testing electronic components; and a conveying device: at least one moving device for shifting Electronic components; central control unit: used to control and integrate the operation of each device to perform automated operations.