TWI715220B - Test device for radio frequency electronic component with antenna and test equipment for its application - Google Patents

Abstract

A test device for radio-frequency electronic components with an antenna, comprising a test room, a carrying mechanism, a transfer mechanism, a first test unit and a second test unit. The test room is provided with a test space, and the carrying mechanism is a carrier The holding part holds the radio frequency electronic component with the antenna facing down and carries it to the test space of the test room , The transfer mechanism is assembled in the test room, and is equipped with a transfer arm for at least one direction displacement. The first test unit is assembled on the transfer arm and is equipped with a first tester with a transmission part. Drive displacement and electrically connect the contacts of the radio frequency electronic components. The second test unit is located in the test space of the test room and is equipped with a second tester with a signal transmission part to receive the wireless communication from the antenna of the radio frequency electronic components Signal ; By using the first test unit to perform electrical test operations on the radio frequency electronic components, and the second test unit to perform antenna signal test operations on the radio frequency electronic components, to achieve the practical benefits of improving test production efficiency.

Description

Test device for radio frequency electronic component with antenna and test equipment for its application

The present invention provides a testing device that can perform antenna signal testing and electrical testing operations on radio frequency electronic components with antennas.

Nowadays, in order to increase the data transmission speed of mobile communication area wireless network system, wireless communication area network system or Bluetooth wireless personal network system, etc., a radio frequency electronic component with multiple antennas is built-in. Important application of the aforementioned communication system. At present, radio frequency electronic components are provided with a plurality of electrical contacts on one side, and a plurality of antennas arranged in an array on the other side. The electrical contacts of radio frequency electronic components are used to transmit power or electrical signals and adjust each antenna The phase and beamforming technology of the antenna array makes the transmit/receive signals of the antenna array at a specific angle to be superimposed uniformly to form a directional beam, while the signals in other directions cancel each other out, thereby generating the best transmit/receive directional beam. In other words, radio frequency electronic components produce the best directional beam and transmit the strongest signal at different radiation angles such as 0° or 30° according to the requirements of use; therefore, whether it is electrical transmission or antenna signal transmission, if one of them has a defect, that is It will affect the quality of radio frequency electronic components. How to conduct electrical test operations and antenna signal test operations on radio frequency electronic components is very important.

The first objective of the present invention is to provide a test device for radio frequency electronic components with antenna , Including the test room, the carrying mechanism, the transfer mechanism, the first test unit and the second test unit. The test room is equipped with a test space, and the carrying mechanism is the carrier's supporting part with the antenna facing down The radio frequency electronic components are transported to the test space of the test room. The transfer mechanism is assembled in the test room and is equipped with a transfer arm for at least one direction displacement. The first test unit is assembled on the transfer arm and is equipped with The first tester with a transmission component is moved by the transfer arm to electrically connect the contacts of the radio frequency electronic components. The second test unit is located in the test space of the test room and is equipped with a second tester with a signal transmission part , To receive the wireless communication signal emitted by the antenna of the radio frequency electronic component; so as to enable the second test unit to perform the antenna signal test operation on the radio frequency electronic component while the first test unit performs the electrical test operation on the radio frequency electronic component to achieve Practical benefits of improving test production efficiency.

The second objective of the present invention is to provide a test device for radio frequency electronic components with antenna , Wherein, the second test unit is provided with at least one adjuster for assembling the second tester, and can adjust the placement angle of the second tester according to the different radiation angles of the radio frequency electronic components to be tested. , In order to facilitate testing of different radiation angles to be tested, and achieve the practical benefit of effectively reducing the number of second testers and saving costs.

The third objective of the present invention is to provide a test device for radio frequency electronic components with antenna , It also includes at least one material shifter to transfer radio frequency electronic components on the carrier to achieve the practical benefit of improving test production efficiency.

The fourth object of the present invention is to provide a test device for radio frequency electronic components with antenna , Among them, the test room is provided with at least one port communicating with the test space, and at least one shielding member is provided at the port to prevent external noise.

The fifth objective of the present invention is to provide a test device for radio frequency electronic components with antenna , Among them, the carrying path of the supporting component of the carrier is located between the first test unit and the second test unit, so as to shorten the action sequence of carrying the radio frequency electronic components and achieve the practical benefit of improving the test production efficiency.

The sixth object of the present invention is to provide a test device for radio frequency electronic components with antenna , Wherein, the carrying mechanism is provided with a plurality of supporting parts for holding radio frequency electronic components in a carrier, or a plurality of supporting parts are provided on a plurality of carriers, so as to facilitate one of the supporting parts When testing the radio frequency electronic components, and make other supporting parts perform the feeding, receiving or inspection of the radio frequency electronic components simultaneously to achieve the practical benefits of improving production efficiency.

The seventh objective of the present invention is to provide a test device for radio frequency electronic components with antenna , It also includes at least one thermostat provided in the carrying mechanism, the transfer mechanism or the first test unit for the radio frequency electronic components to perform the test operation in the preset test temperature range, so as to achieve the practical benefit of improving the test quality.

The eighth object of the present invention is to provide a radio frequency electronic component test equipment, including a machine , Feeding device, receiving device, the test device and central control device of the present invention; the feeding device is arranged on the machine table, and is provided with at least one feeding holder for containing the radio frequency electronic component to be tested; receiving device It is arranged on the machine platform, and is provided with at least one receiving holder for accommodating the tested radio frequency electronic components; the test device of the present invention is arranged on the machine platform, including a test room, a carrying mechanism, a transfer mechanism, and A test unit and a second test unit are used to perform antenna signal test and electrical test operations on radio frequency electronic components with antennas; the central control device is used to control and integrate the actions of various devices to perform automated operations and improve operational performance The practical benefits.

In order to enable your reviewer to have a better understanding of the present invention, a preferred embodiment is given with the drawings, and the details are as follows.

Please refer to Figure 1. The first embodiment of the test device 10 of the present invention includes a test chamber 11, a carrying mechanism, a transfer mechanism, a first test unit and a second test unit; the test chamber 11 is provided with at least one test Space 111, with at least one port 112 connected to the test space 111 In this embodiment, the test chamber 11 is a hollow box, and a test space 111 is formed inside. The test chamber 11 can be made of anti-noise materials, or anti-noise components can be pasted on the outside of the test chamber 11. In addition, the test chamber 11 is equipped with at least one shielding element 113 at the opening 112 to prevent external noise. The shielding element 113 can be made of anti-noise material, or the shielding element 113 can be pasted with an anti-noise element, and the shielding element 113 can be a door panel or a flexible element. For example, the shielding member 113 is a door panel to control the opening and closing of the opening 112. In this embodiment, the test chamber 11 is provided above and below the opening 112 to prevent noise The shield 113 is made of material and is a flexible element.

The carrying mechanism is provided with at least one carrier, the carrier is equipped with at least one supporting component to hold the radio frequency electronic component with the antenna, and the carrier carries the radio frequency electronic component into/out of the test room 11. The carrier can be a turntable, a stage, or a turret. The carrier can be angularly rotated, linearly displaced in at least one direction, or angularly rotated and linearly displaced in at least one direction. For example, the turntable can be rotated horizontally or rotated horizontally. And displacement in the Z direction, for example, the stage can be displaced in the X direction or in the X-Z direction Furthermore, the carrying mechanism is provided with a first driving source to drive the carrier for angular rotation, linear displacement in at least one direction, or angular rotation and linear displacement in at least one direction. The first driving source may include a motor and a rotating shaft, The rotating shaft is connected to drive the carrier for angular rotation. The first driving source can also be a linear motor, a pressure cylinder, or include a motor and a transmission group to drive the carrier for linear displacement in at least one direction; in this embodiment , The carrier is a turntable 121, and the turntable 121 is provided with a plurality of supporting parts for the bearing groove 1211. Each bearing groove 1211 is provided with a perforation 1212 that penetrates the top and bottom surfaces of the turntable 121. The turntable 121 is connected with the first drive source The first driving source is provided with a rotating shaft 122 driven and rotated by a motor (not shown in the figure), and the rotating shaft 122 is connected to the driving turntable 121 to rotate at a horizontal angle, so that each bearing groove 1211 of the turntable 121 can be displaced to different operating positions. And make each bearing groove 1211 move into and out of the test space 11 of the test room 11 from the opening 112 of the test room 11.

The transfer mechanism is provided with a transfer arm 131 for displacement in at least one direction. Further, the transfer arm 131 can be located outside the test chamber 11, and the test chamber 11 has a channel (not shown) for the transfer arm 131 Enter the test space 111 from the channel, or the transfer arm 131 can be assembled in the test room 11, and move in the test space 111; in this embodiment, the transfer mechanism is assembled in the test room 11 and uses the second driving source (Not shown in the figure) The transfer arm 131 is driven to move in the Z direction, and one end of the transfer arm 131 is provided with a connecting part 132.

The first test unit is assembled on the transfer arm 131 of the transfer mechanism, and is provided with at least one first tester with a transmission element to connect the contacts of the radio frequency electronic components with power supply. Furthermore, the first tester includes electrical The circuit board and the test base with transmission components are connected with each other. The circuit board and the test base are assembled on the transfer arm 131, and the circuit board is electrically connected to a test machine (not shown in the figure), or the first tester includes the first A circuit board, a test socket with a first transmission component, a second transmission component and a second circuit board. The first circuit board, the test socket and the second transmission component are assembled on the transfer arm 131, and the second circuit board is assembled on Carrier , And the second circuit board is electrically connected to a tester (not shown in the figure); in this embodiment, the first tester includes an electrically connected circuit board 141 and a test base 142 with a plurality of transmission elements 143, The transmission element 143 is a probe, the first end of which is electrically connected to a circuit board 141 above the test base 142, and the second end is electrically connected to the contacts of radio frequency electronic components, and the circuit board 141 is electrically connected to a testing machine (Not shown in the figure), the circuit board 141 and the test base 142 are assembled on the connecting part 132 of the transfer arm 131, and are located in the test space 111 of the test room 11, and the test base 142 is located in the carrying part of the turntable 121 Above the path, the transfer arm 131 drives the test base 142 to move in the Z direction, so that the transmission member 143 of the test base 142 electrically contacts the contacts of the radio frequency electronic components.

The second test unit is located inside the test room 11 and is equipped with at least one second tester 151 with a signal transmission part 1511 for performing antenna signal test operations on the antenna of the radio frequency electronic component. The second tester 151 can be Receiver or transmitter, or transceiver with transmitting and receiving functions, the second tester 151 can be connected to an independent processor to transmit the wireless communication signals of the received radio frequency electronic components to the processor, or to process The test signal of the device is transmitted to the radio frequency electronic component to be tested, and the processor can also be the processor of the central control device (not shown). The axial X angle of the signal transmission part 1511 of the second tester 151 is the same Or close to the direction angle of the radio frequency electronic component to be measured (such as 0°, 30° or 45°, etc.), so that the signal transmission part 1511 receives the main beam signal emitted by the antenna of the radio frequency electronic component toward the direction angle of the radiation to be measured. Or make the second tester 151 send a test signal toward the radio frequency electronic component. In this embodiment, the second tester 151 is a receiver and is installed in the test space 111 of the test room 11. The signal transmission of the second tester 151 The axial X angle of the part 1511 is 0°, which is the same as the 0° radiation direction angle of the antenna of the radio frequency electronic component. The second tester 151 is also located under the carrying path of the supporting part of the turntable 121 to receive The main beam signal emitted by the antenna of the radio frequency electronic component facing the 0° radiation direction angle to be measured, and the received main beam signal is transmitted to the processor of the central control device for an analysis by the processor of the central control device and judgment Whether the main beam signal emitted by the antenna of the radio frequency electronic component towards the direction of radiation to be measured meets the standard. Furthermore, the second test unit can be equipped with a plurality of second testers 151 in a plurality of positions in the test chamber 11. The second tester 151 of the second test unit can be fixed in the test room 11, or the second tester 151 can be equipped with at least one adjuster 152. The adjuster 152 is used to adjust the angle or position of the second tester 151 Position, or adjust the placement angle and position of the second tester 151 to make the second tester 151 relative to the radio frequency electronic component’s antenna to be measured radiation pointing angle. The adjuster 152 can be a robotic arm, a rotating shaft, a linear drive source or Contains a plurality of adjustment rods, or a combination of at least any two of the foregoing, to drive and adjust the placement of the second tester 151 to the angle (such as 0°, 30° or 45°, etc.) or placement position required for the test operation, or Drive and adjust the placement position and placement angle of the second tester 151. For example, a plurality of adjustment rods can be moved in different heights to drive the second tester 151 to swing. The linear driving source can be a linear motor, a pressure cylinder, or a motor and a transmission group, so that the second tester 151 can be displaced in at least one direction; in this embodiment, the second tester 151 is assembled on the adjuster 152, The adjuster 152 is a mechanical arm and is installed in the testing room 11 for adjusting the placement angle of the second tester 151.

The testing device 10 is equipped with at least one material shifter on the peripheral side of the carrier to move the radio frequency electronic components of the antenna on the supporting part of the carrier. In this embodiment, the peripheral side of the turntable 121 is set as X －The first shifter 161 with displacement in the Z direction is used to transfer the radio frequency electronic components to the bearing groove 1211 of the turntable 121; furthermore, if multiple workstations (not shown in the figure) are installed on the side of the turntable 121 of the test device 10 Multiple shifters can be set up to coordinate with different workstations to transfer radio frequency electronic components.

The test device 10 is provided with at least one thermostat 17 in the carrying mechanism, the transfer mechanism or the first test unit for the radio frequency electronic components to perform the test operation in the preset test temperature range. Furthermore, the thermostat 17 can be For refrigerating chips, heating elements or carriers with fluids, in this embodiment, the test device 10 is equipped with a thermostat 17 which is a refrigerating chip on the connecting part 132 of the transfer mechanism.

Please refer to Figure 2. The test device 10 is used to test the radio frequency electronic component 20 with the antenna 21 and the contact 22. The radio frequency electronic component 20 is equipped with a plurality of antennas 21 arranged in an array on one side and on the other side. A plurality of contacts 22; the test device 10 is adsorbed on the peripheral side of the contact 22 of the radio frequency electronic component 20 to be tested with the first shifter 161, and the antenna 21 faces downwards, due to the part of the support groove 1211 of the turntable 121 It is located outside the test room 11, and can be used for the first shifter 161 to carry out the feeding operation of the radio frequency electronic component 20, and the first shifter 161 moves the radio frequency electronic component 20 to be tested into the supporting groove of the turntable 121 by displacement in the X-Z direction 1211.

Please refer to Figure 3, the carrying mechanism is driven by the rotating shaft 122 to drive the turntable 121 to rotate at a horizontal angle. The turntable 121 drives the socket 1211 and the RF electronic component 20 to rotate synchronously, and makes a socket 1211 with the RF electronic component 20 under test. Enter the test space 111 through the shielding member 113 and the opening 112 of the test chamber 11. Since the shielding member 113 is a flexible element, it can pass through the turntable 121, and elastically press against the top and bottom surfaces of the turntable 121 for proper shielding The gap between the turntable 121 and the port 112 helps prevent external noise; the turntable 121 carries the radio frequency electronic component 20 to be tested under the test base 142, and is located above the second tester 151, in other words, the socket of the turntable 121 The 1211 transport path is located between the test base 142 and the second tester 151. The transfer mechanism uses the second drive source to drive the transfer arm 131 to move downward in the Z direction. The transfer arm 131 drives the circuit board 141 and tests. The base 142 is synchronously moved downward in the Z direction. The transmission member 143 of the test base 142 electrically contacts the contact 22 of the radio frequency electronic component 20 to perform electrical testing. However, depending on the operation requirements, the transfer arm 131 drives the test base 142 and The transmission element 143 exerts a proper downward pressure on the contact 22 of the radio frequency electronic component 20, so that the transmission element 143 does contact the contact 22. Since the thermostat 17 is located above the test base 142, the radio frequency electronic element 20 is preset Perform electrical testing in the test temperature range; however, while the first test unit is performing electrical testing on the radio frequency electronic component 20, and the antenna 21 of the radio frequency electronic component 20 is directed toward the second tester 151 and the radiation to be tested is 0° The pointing angle emits the main beam signal. Since the axial X angle of the signal transmission part 1511 of the second tester 151 is 0°, which is the same as the 0° radiation pointing angle of the antenna 21 of the radio frequency electronic component 20, the second tester The signal transmission part 1511 of 151 can receive the main beam signal emitted by the antenna 21 of the radio frequency electronic component 20 towards 0° of the radiation direction to be measured. , And transmit the received main beam signal to the processor of the central control device (not shown in the figure) for an analysis by the processor, and determine whether the antenna 21 of the radio frequency electronic component 20 is directed toward the 0° radiation direction angle to be measured. Whether the main beam signal meets the standard; therefore, while the first test unit performs electrical test operations on the radio frequency electronic component 20, and the second test unit performs antenna signal test operations on the radio frequency electronic component 20 to improve test production Practical benefits of performance; Moreover, when the turntable 121 drives a socket 1211 for holding radio frequency electronic components 20 to be located in the test room 11 for testing operations, it can also make other sockets with radio frequency electronic components to be tested or empty The supporting troughs can perform different preset operations (such as inspection operations or feeding operations) outside the test room 11, that is, the first shifter 161 moves in the X-Z direction to the top of the empty supporting trough 1211A of the turntable 121, and Move the next RF electronic component 20A to be tested into the trough 1211A to perform the feeding operation.

Please refer to Figure 4. After the test is completed, the transfer mechanism uses the second drive source to drive the transfer arm 131 to move upward in the Z direction. The transfer arm 131 drives the circuit board 141 and the test seat 142 to move upward in the Z direction. The transmission element 143 of 142 is separated from the contact 22 of the radio frequency electronic component 20; then the transport mechanism is driven by the rotating shaft 122 to drive the turntable 121 to rotate at a horizontal angle. The socket 1211 of the test radio frequency electronic component 20 leaves the test space 111 through the opening 112 of the test room 11, and simultaneously drives the next radio frequency electronic component 20A to be tested. The other socket 1211A is located on the test base 142 and the second tester 151 Electrical test operations and antenna signal test operations are performed in succession; the first shifter 161 moves in the X-Z direction to the top of the socket 1211 of the turntable 121, so that the socket 1211 can take out the tested radio frequency electronic component 20.

Please refer to Figure 5. The difference between the second embodiment of the test device 10 of the present invention and the first embodiment is that the test chamber 11 is provided with a first port 114 and a second port 115 opposite to each other, and the first port 114 is provided with a first shielding member 116 that can be a door panel, and a second shielding member 117 that can be a door panel is provided at the second port 115. The carrier of the carrier mechanism is a carrier and is equipped with a first drive The source drives the carrier to move linearly in at least one direction. In this embodiment, the carrier mechanism is provided with a first carrier 123 with a first supporting member and a second carrier 124 with a second supporting member. One supporting part is the first supporting groove 1231. The first supporting groove 1231 is provided with a first through hole 1232 that communicates with the top and bottom surfaces of the first carrier 123. The second supporting part is the second supporting groove 1241, the second The bearing groove 1241 is provided with a second perforation 1242 that communicates with the top and bottom surfaces of the second carrier 124. The first driving source is a linear motor 125, and the linear motor 125 drives the first carrier 123 and the second carrier 124 in the X direction. Displacement is based on the displacement of the first port 114 and the second port 115 of the test chamber 11 in the same axial direction of the transport path, the first bearing groove 1231 of the first carrier 123 and the second bearing groove of the second carrier 124 1241 respectively hold the radio frequency electronic components and load them into the test room 11 in sequence, so that the radio frequency electronic components are located between the test base 142 and the second tester 151 to perform electrical test operations and antenna signal test operations, and load them after the test is completed Exit the test room 11.

Please refer to Figures 1 and 6, which are schematic diagrams of the testing device 10 of the present invention applied to testing equipment, including machine 30, feeding device 40, receiving device 50, testing device 10 of the present invention, and central control device (not shown) Out), it also includes at least one operating device, which can be a detection device, a cover opening device, a cover closing device, a printing device, etc., to perform the appearance inspection of radio frequency electronic components , Test base cover opening and closing operations or radio frequency electronic component printing operations and other preset operations, in this embodiment, the test equipment further includes a detection device 60 working device; the feeding device 40 is arranged on the machine 30 It is equipped with at least one feeding holder 41 for accommodating radio frequency electronic components to be tested; the receiving device 50 is arranged on the machine 30, and is equipped with at least one receiving holder for accommodating radio frequency electronic components under test 51; The test device 10 of the present invention is configured on the machine 30, and includes a test chamber 11, a carrying mechanism, a transfer mechanism, a first test unit and a second test unit, whereby the first test unit is used to perform radio frequency electronic components Electrical test operations, and the second test unit is used to perform antenna signal test operations on the radio frequency electronic components, thereby improving the test production performance. In this embodiment, the test device 10 is the first shifter 161 on the side of the turntable 121. Displacement in the XY-Z direction. Take out the RF electronic component to be tested from the feeding holder 41 of the feeding device 40, and move it into the receiving groove 1211 of the turntable 121. The turntable 121 drives the RF electronic component to be tested to move to the inspection The detection device 60 is installed on the machine 30, and is located on the side of the turntable 121. At least one detector 61 is provided to detect the appearance of the radio frequency electronic components. After the detection is completed, the turntable 121 then drives the radio frequency electronic components to be tested into the test room 11, and then performs antenna signal test and electrical test operations. After the test is completed, the turntable 121 drives the tested radio frequency electronic components out of the test room 11, and the test device 10 is set There is a second shifter 162 for displacement in the X-Y-Z direction. The second shifter 162 takes out the tested radio frequency electronic components on the turntable 121 and transfers the tested radio frequency electronic components to The receiving holder 51 of the receiving device 50 is sorted and stored; the central control device is used to control and integrate the actions of each device to perform automated operations and achieve practical benefits of improving operating efficiency.

10: Test device １１: Test room 111: Test space 112: Port 113: Shield 114: The first port 115: The second port 116: The first shield 117: The second shield 121: Turntable 1211, 1211A: Socket 1212: Piercing 122: Shaft 123: The first stage 1231: The first groove 1232: The first perforation 124: The second stage 1241: The second trough 1242: second perforation 125: Linear motor 131: Transfer arm 132: Connecting parts 141: circuit board 142: Test Block 143: Transmission parts 151: The second tester 1511: Signal Transmission Department 152: Adjuster 161: The first shifter 162: The second shifter 17: Thermostat 20, 20A: RF electronic components 21: Antenna 22: Contact 30: Machine 40: Feeding device 41: Feeder holder 50: Receiving device 51: Receiving holder 60: Detection device 61: Detector

Figure 1: Schematic diagram of the test device of the present invention. Figure 2: A schematic diagram of the use of the first embodiment of the testing device of the present invention (1). Figure 3: A schematic diagram of the use of the first embodiment of the testing device of the present invention (2). Figure 4: A schematic diagram of the use of the first embodiment of the test device of the present invention (3). Figure 5: A schematic diagram of the second embodiment of the test device of the present invention. Figure 6: A schematic diagram of the first embodiment of the testing device of the present invention applied to testing equipment.

11: Test room

111: test space

112: Port

113: Shading

121: turntable

1211, 1211A: Socket

122: shaft

131: Transfer Arm

141: circuit board

142: Test Block

143: Transmission

151: second tester

1511: Signal Transmission Department

161: first shifter

17: Thermostat

20, 20A: RF electronic components

21: Antenna

22: Contact

Claims (10)

A test device for radio frequency electronic components with antennas, comprising: a test room: a test space is provided, and at least one port communicating with the test space; a carrier mechanism: at least one carrier is provided, the carrier The transmitter is provided with a plurality of supporting parts, the supporting parts have perforations, and the carrier is configured to carry the plurality of supporting parts to hold the radio frequency electronic component with the antenna outside the test chamber according to the action sequence, and For carrying the radio frequency electronic component to the test space of the test room; transfer mechanism: is provided with a transfer arm for displacement in at least one direction; the first test unit: is assembled on the transfer arm, and is provided with A first tester with at least one transmission element is electrically connected to the contacts of the radio frequency electronic component to perform electrical test operations; the second test unit is arranged in the test space of the test room and is provided with at least one A second tester with a signal transmission part is used to perform antenna signal testing operations on the antenna of the radio frequency electronic component through the perforation of the supporting component. According to the first item of the scope of patent application, the test device for radio frequency electronic components with antenna, wherein the test chamber is provided with at least one shielding member at the opening. According to the first item of the scope of patent application, the test device for radio frequency electronic components with antenna, wherein the carrier is a turntable, a carrier or a turret. According to the test device for radio-frequency electronic components with antenna described in claim 1, wherein the carrying path of the supporting component of the carrier is located between the first test unit and the second test unit . According to the test device for radio-frequency electronic components with antenna described in the first item of the patent application, the second tester is a receiver or a transmitter, or a transceiver with transmitting and receiving functions. According to the first item of the scope of patent application, the test device for radio frequency electronic components with antennas, wherein the axial angle of the signal transmission part of the second tester is the same or close to the radio frequency electronic components to be measured Pointing angle. According to the test device for radio-frequency electronic components with antenna described in item 1 of the scope of patent application, the second test unit is provided with at least one adjuster for adjusting the placement angle and placement of the second tester Position or placement angle and position. According to the first item of the scope of patent application, the test device for radio-frequency electronic components with antennas further includes a shifter that is displaced in at least one direction on the peripheral side of the carrier for moving the supporting member Carry the radio frequency electronic components. According to the first item of the scope of patent application, the testing device for radio-frequency electronic components with antennas further includes the carrying mechanism, the transferring mechanism or the first testing unit provided with at least one thermostat. A radio frequency electronic component test equipment, including: a machine; Feeding device: it is arranged on the machine, and is provided with at least one feeding holder for accommodating the radio frequency electronic component to be tested; The receiver for testing the radio frequency electronic component; at least one test device for the radio frequency electronic component with an antenna as described in item 1 of the scope of the patent application: it is arranged on the machine for performing the radio frequency electronic component Electrical test operations and antenna signal test operations; central control device: used to control and integrate the actions of various devices to perform automated operations.

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