CN105588986A - Test device for testing radio frequency element - Google Patents
Test device for testing radio frequency element Download PDFInfo
- Publication number
- CN105588986A CN105588986A CN201410570369.6A CN201410570369A CN105588986A CN 105588986 A CN105588986 A CN 105588986A CN 201410570369 A CN201410570369 A CN 201410570369A CN 105588986 A CN105588986 A CN 105588986A
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- Prior art keywords
- testing arrangement
- test cell
- casing
- testing
- antenna
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- 238000012360 testing method Methods 0.000 title claims abstract description 105
- 230000004308 accommodation Effects 0.000 claims description 14
- 239000004020 conductor Substances 0.000 claims description 12
- 230000004888 barrier function Effects 0.000 claims description 7
- 239000000758 substrate Substances 0.000 claims description 7
- 239000004568 cement Substances 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 239000004033 plastic Substances 0.000 claims description 3
- 239000003989 dielectric material Substances 0.000 claims description 2
- 230000008054 signal transmission Effects 0.000 abstract description 2
- 238000005259 measurement Methods 0.000 description 5
- 238000005538 encapsulation Methods 0.000 description 4
- 238000004806 packaging method and process Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000037361 pathway Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000008034 disappearance Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005670 electromagnetic radiation Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- XCWPUUGSGHNIDZ-UHFFFAOYSA-N Oxypertine Chemical compound C1=2C=C(OC)C(OC)=CC=2NC(C)=C1CCN(CC1)CCN1C1=CC=CC=C1 XCWPUUGSGHNIDZ-UHFFFAOYSA-N 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000010295 mobile communication Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Abstract
A test apparatus for testing radio frequency components, comprising: the radio frequency element is arranged in the accommodating space when being tested, so that the test unit and the radio frequency element are positioned in the same closed space, and the signal transmission between the test unit and the radio frequency element can be enhanced.
Description
Technical field
The present invention is about a kind of testing arrangement, and espespecially a kind of test for testing radio frequency element fillsPut.
Background technology
Along with electronic industry to light, thin, short, little, at a high speed, high-density development, electronic productThe lightening demand of functional diversities and volume grows with each passing day, and is accompanied by manufacture of semiconductor technologyImprove, make the multichip packaging structure of interiors of products, light for meeting multichip packaging structure volumeThin short and small trend, develops multi-wafer module (Multi-chipModule then; MCM) beIrrespective of size encapsulation (SysteminPackage, SiP) encapsulating structure.
Again, wireless communication technique has been widely used in consumption electronic products miscellaneous at presentIn order to receiving or sending various wireless signals, therefore conventionally also can be by as Global System for Mobile Communication(GlobalSystemforMobileCommunications, GMS), Wireless LAN(WirelessLAN, WLAN), global positioning system (GlobalPositioningSystem, GPS) GPS, bluetooth (Bluetooth), hand-held visual radio (DigitalVideoBroadcasting-Handheld, DVB-H) etc. wireless telecommunications module and antenna etc. received orThe wireless telecommunications module that sends various wireless signals is integrated in SiP encapsulating structure.
Wherein, can receive or send radio frequency (Radiofrequency, RF) signal in being embedded withIn the processing procedure of antenna modules, for the increase of avoiding defective products affects productive rate, can be to being embedded with antennaThe electronic product of module does electric radiation test.
To being embedded with the electronic product of packaging body of antenna modules while doing electromagnetic radiation test, needUse wafer antenna (or unipole antenna) (Coupling) test that is coupled, coupling measurement is brilliantChip antenna can receive packaging body and include radiofrequency signal that antenna modules is sent.
As shown in Figure 1, use existing testing arrangement 1, comprise by socket (socket) 100a withThe bearing part 100 that mounted board (loadboard) 100b forms; Lower lock block 101, forThis bearing part 100 forms the casing 10 of an enclosed environment, and this casing 10 has for receiving one to be penetratedFrequently an accommodation space 10a of element 9; Be arranged at the test cell 11 outside this casing 10, and shouldTest cell 11 has can be launched or the crystalline substance of received RF (Radiofrequency, RF) signalChip antenna 110; And for control this test cell 11 launch RF signal with for read byThe control module 12 of the RF signal that this test cell 11 receives.
After inserting the RF component 9 that is embedded with antenna modules 901, by this lower lock block 101Make this casing 10 completely closed with the assembling of bearing part 100, and obtain an insulating space, andIn this insulating space, carry out the measurement of RF signal, and this lower lock block 101 and this RF component 9Between completely closely sealed, to avoid if the changes such as air are because causing the interference in when test.
But, in the time that the RF component 9 to being embedded with antenna modules 901 does electromagnetic radiation test,After the lower lock block 101 of this testing arrangement 1 contacts with this RF component 9, can make this antenna mouldThe RF signal decay of group 901, but these lower lock block 101 pressings are again that inevitably test is movingDo, thereby be difficult to promote signal strength.
In addition the antenna modules 901 and test cell 11 (or wafer antenna of this RF component 9,110) distant between, transmission path is long, causes disturbing becoming because increasing, so that is difficult for amountMeasure quality better and stable RF signal, thereby affect the accuracy of test result.
Therefore, how to overcome variety of problems of the prior art, real become to desire most ardently at present solutionProblem.
Summary of the invention
In view of the disappearance of above-mentioned prior art, the present invention discloses a kind of for testing radio frequency elementTesting arrangement, can strengthen the signal transmission between this test cell and this RF component.
Testing arrangement for testing radio frequency element of the present invention, comprising: casing, it has appearancePut space; Test cell, it is placed in the accommodation space of this casing, with in the time testing, shouldTest cell and this RF component are arranged in this accommodation space simultaneously; And control module, its electricityProperty connects this test cell.
In aforesaid testing arrangement, this casing comprises: bearing part, and it has opening; And lidPart, it is located on this opening to enclose and to limit out this accommodation space with this bearing part. For example, this cover pieceThere is depression, for putting this test cell. The material that forms this cover piece is conductive material, JieElectric material or plastic cement.
In aforesaid testing arrangement, in this casing, be provided with electric conductor to be electrically connected this control moduleWith this test cell. For example, this electric conductor is cable or circuit, and this casing has viaWith accommodating this electric conductor.
In aforesaid testing arrangement, this test cell is located on this casing.
In aforesaid testing arrangement, this test cell comprises the bearing substrate of being located on this casingAnd be electrically connected at the antenna of this bearing substrate, for example wafer antenna or unipole antenna.
In aforesaid testing arrangement, this test cell comprise the insulating barrier be located on this casing andBe formed at the antenna traces layer on this insulating barrier.
As from the foregoing, testing arrangement of the present invention, by this test cell storage is located to this caseDesign in body, makes this RF component and test cell can be positioned at same enclosed environment in the time of testUnder, thereby can not be subject to the isolated of this casing between the two, so can effectively overcome existing test dressThe disappearance that the isolated RF component of the lower lock block put causes RF signal to decay with test cell.
In addition this RF component and test cell are located in same enclosure space, to shorten this,Distance between RF component and test cell, can shorten the transmission path of RF signal, and haveEffect reduce disturb become because of, so can promote measurement quality, and lifting RF signal stability,Thereby can increase the accuracy of test result
Brief description of the drawings
Fig. 1 is the generalized section of existing measurement mechanism in the time using;
The generalized section of the first embodiment that Fig. 2 A and Fig. 2 B are testing arrangement of the present invention
Fig. 3 is the generalized section of the second embodiment of testing arrangement of the present invention; And
Fig. 4 is the generalized section of the 3rd embodiment of testing arrangement of the present invention.
Symbol description
1,2,3,4 testing arrangements
10,20 casings
10a, 20a accommodation space
100,200 bearing parts
100a socket
100b mounted board
101 lower lock blocks
11,21,31 test cells
110 wafer antennas
12,22 control modules
200a first surface
200b second surface
200c opening
201 cover pieces
201a the 3rd surface
201b the 4th surface
201c depression
202 pathways
210 bearing substrates
211 antennas
221,421 electric conductors
23 test bases
311 antenna traces layers
312 insulating barriers
9 RF components
901 antenna modules.
Detailed description of the invention
Below by particular specific embodiment explanation embodiments of the present invention, art technologyPersonnel can understand other advantages of the present invention and merit easily by content disclosed in the present specificationEffect.
Notice, appended graphic the illustrated structure of this description, ratio, size etc., all only useIn the content that coordinates description to disclose, for those skilled in the art's understanding and reading, andNon-for limiting the enforceable qualifications of the present invention, thus the technical essential meaning of tool not,The adjustment of the modification of any structure, the change of proportionate relationship or size, is not affecting institute of the present inventionUnder the effect that can produce and the object that can reach, all should still drop on disclosed technologyContent obtains in the scope that can contain. Meanwhile, in this description, quote as " upside ", "One ", the term such as " second ", " the 3rd ", " 4th " and " ", also only for ease ofUnderstanding of narration, but not for limiting the enforceable scope of the present invention, the change of its relativenessOr adjust, changing under technology contents, when being also considered as the enforceable category of the present invention without essence.
Fig. 2 A is the generalized section of the first embodiment of testing arrangement 2 of the present invention. As Fig. 2Shown in, described testing arrangement 2 comprises a casing 20, the storage with an accommodation space 20aA test cell 21 in this accommodation space 20a and one is electrically connected this test cell 21Control module 22.
Described casing 20 is by having one of relative first surface 200a and second surface 200bBearing part 200 with there is the 3rd relative surperficial 201a and a cover piece 201 of the 4th surperficial 201bInstitute forms, and on the first surface 200a of this bearing part 200, is formed with an opening 200c, forIt is upper to enclose limit by this bearing part 200 with this cover piece 201 that this cover piece 201 is covered on this opening 200cGo out this accommodation space 20a. In addition, the 4th surperficial 201b of this cover piece 201 has depression 201c,And this test cell 21 is located in this depression 201c, and in the 3rd surperficial 201a of this cover piece 201On be formed with the pathway 202 that is communicated with this depression 201c. Again, for forming this cover piece 201Material does not have particular restriction, can be conductive material (as metal), dielectric material or plastic cement etc.In addition, this bearing part 200 is located on a test base 23 with its second surface 200b.
Described test cell 21 comprises that a bearing substrate 210 and arranges and is electrically connected at thisThe antenna 211 of bearing substrate 210. In the present embodiment, this antenna 211 is wafer antenna or listUtmost point antenna.
Described control module 22 for control this test cell 21 launch RF signal orFor reading the RF signal being received by this test cell 21.
In the present embodiment, this control module 22 can be as signal process devices such as host computers.
In addition, between this control module 22 and test cell 21, wear this pathway 202 by oneElectric conductor 221 be electrically connected, this electric conductor 221 is as coaxial cable (coaxialcable)。
Fig. 2 B is the generalized section that uses testing arrangement 2 of the present invention. As shown in Figure 2 B,One RF component 9 is accommodated in the accommodation space 20a of this casing 20 with this test cell 21,And make this RF component 9 be coupled to this test cell 21.
In the present embodiment, this RF component 9 is embedded with the encapsulation module of antenna modules 901,In other embodiment, this RF component 9 also can be other antenna structure or other has skyThe encapsulation module of line, through the semiconductor element of encapsulation or un-encapsulated, be not limited to above-mentioned.
Can effectively shorten this RF component 9 and this test cell 21 in testing arrangement 2 of the present inventionBetween distance, and avoid outside noise or other become because of interference measurement.
In addition, this RF component 9 also can local or all contact and be connected (not with this test cell 21Diagram).
Fig. 3 be testing arrangement 3 of the present invention the second embodiment in use time generalized section.
As shown in Figure 3, the difference of described testing arrangement 3 and the first embodiment is this testThe embodiment of unit 31.
In the present embodiment, this test cell 31 is by the 4th table that is directly attached to this cover piece 201An insulating barrier 312 on face 201b and be formed at the antenna traces layer 311 on this insulating barrier 312Institute forms.
In addition, the 4th surperficial 201b of this cover piece 201 is used as this test cell 31 and carriesWith the use of support, thereby without forming depression 201c.
Fig. 4 is the generalized section of the 3rd embodiment of testing arrangement 4 of the present invention.
As shown in Figure 4, the difference of described testing arrangement 4 and the first embodiment is electric conductor421 embodiment.
In the present embodiment, this electric conductor 421 is for being embedded in the circuit in this via, alsoIn this cover piece 201, to be embedded with the line that is electrically connected this control module 22 and this test cell 21Road floor.
In sum, testing arrangement 2,3,4 of the present invention, mainly by by this test cell21,31 and RF component 9 be accommodated in same sealing accommodation space 20a, make can not between the twoBe subject to the obstruction of this casing 20, so can effectively promote 21,31 pairs of radio frequency news of this test cellNumber transmitting-receiving.
In addition, this antenna modules 901 is located to one accommodation space 20a with test cell 21,31In, to shorten the distance between this antenna modules 901 and test cell 21,31, can shorten and penetrateFrequently the transmission path of signal, and reduce suffered signal and disturb, thereby effectively reduction interference becomesCause, measures quality so can promote, and promotes the stability of RF signal, makes survey of the present inventionThe accuracy of electricity testing device 2,3,4 test results increases.
Above-described embodiment is only for illustrative principle of the present invention and effect thereof, but not forRestriction the present invention. Any those skilled in the art all can be without prejudice to spirit of the present invention and categoryUnder, above-described embodiment is modified. Therefore the scope of the present invention, should be as rightClaim is listed.
Claims (11)
1. for a testing arrangement for testing radio frequency element, comprising:
Casing, it has accommodation space;
Test cell, it is placed in the accommodation space of this casing, with in the time testing, this testUnit and this RF component are arranged in this accommodation space simultaneously; And
Control module, it is electrically connected this test cell.
2. testing arrangement as claimed in claim 1, is characterized by, and this casing comprises:
Bearing part, it has opening; And
Cover piece, it is covered on this opening to be enclosed and to be limit out this accommodating sky by this bearing part and this cover pieceBetween.
3. testing arrangement as claimed in claim 2, is characterized by, and this cover piece has depression,For putting this test cell.
4. testing arrangement as claimed in claim 2, is characterized by, and forms the material of this cover pieceFor conductive material, dielectric material or plastic cement.
5. testing arrangement as claimed in claim 1, is characterized by, and in this casing, is provided with conductionBody is to be electrically connected this control module and this test cell.
6. testing arrangement as claimed in claim 5, is characterized by, this electric conductor be cable orCircuit.
7. testing arrangement as claimed in claim 5, is characterized by, and this casing has viaWith accommodating this electric conductor.
8. testing arrangement as claimed in claim 1, is characterized by, and this test cell is located at thisOn casing.
9. testing arrangement as claimed in claim 1, is characterized by, and this test cell comprises to be establishedBearing substrate on this casing and be electrically connected at the antenna of this bearing substrate.
10. testing arrangement as claimed in claim 9, is characterized by, and this antenna is wafer antennaOr unipole antenna.
11. testing arrangements as claimed in claim 1, is characterized by, and this test cell comprises to be establishedInsulating barrier on this casing and be formed at the antenna traces layer on this insulating barrier.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW103135334 | 2014-10-13 | ||
| TW103135334A TWI513986B (en) | 2014-10-13 | 2014-10-13 | Radiofrequency testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105588986A true CN105588986A (en) | 2016-05-18 |
| CN105588986B CN105588986B (en) | 2018-12-07 |
Family
ID=55407871
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410570369.6A Active CN105588986B (en) | 2014-10-13 | 2014-10-23 | Test device for testing radio frequency element |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN105588986B (en) |
| TW (1) | TWI513986B (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107505514A (en) * | 2017-07-06 | 2017-12-22 | 安徽禄讯电子科技有限公司 | A kind of radio communication passive device test device |
| CN110879315A (en) * | 2018-09-05 | 2020-03-13 | 矽品精密工业股份有限公司 | Test fixture |
| TWI726743B (en) * | 2020-06-10 | 2021-05-01 | 佳思科技有限公司 | Yield detection device of antenna in package devices |
| CN113945776A (en) * | 2020-07-16 | 2022-01-18 | 鸿劲精密股份有限公司 | Radio frequency electronic component testing device and testing equipment applying same |
| CN114006661A (en) * | 2020-07-28 | 2022-02-01 | 矽品精密工业股份有限公司 | Detection device |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI639546B (en) * | 2018-05-04 | 2018-11-01 | 鴻勁精密股份有限公司 | Electronic component crimping mechanism and test classification device |
| US10972192B2 (en) * | 2018-05-11 | 2021-04-06 | Teradyne, Inc. | Handler change kit for a test system |
| TWI734288B (en) * | 2019-12-05 | 2021-07-21 | 鴻勁精密股份有限公司 | Radio frequency electronic component test device and test operation equipment for its application |
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| CN1387325A (en) * | 2001-05-21 | 2002-12-25 | 神达电脑股份有限公司 | Antenna device |
| WO2005052603A1 (en) * | 2003-11-26 | 2005-06-09 | Advantest Corporation | Apparatus for testing a device with a high frequency signal |
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| CN102340066A (en) * | 2010-07-28 | 2012-02-01 | 国碁电子(中山)有限公司 | Module with antenna interface and manufacturing method thereof |
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| CN1387325A (en) * | 2001-05-21 | 2002-12-25 | 神达电脑股份有限公司 | Antenna device |
| WO2005052603A1 (en) * | 2003-11-26 | 2005-06-09 | Advantest Corporation | Apparatus for testing a device with a high frequency signal |
| CN101368981A (en) * | 2007-08-14 | 2009-02-18 | 海华科技股份有限公司 | Radio frequency module testing platform |
| CN101893681A (en) * | 2009-05-20 | 2010-11-24 | 广达电脑股份有限公司 | Test system and method |
| CN102340066A (en) * | 2010-07-28 | 2012-02-01 | 国碁电子(中山)有限公司 | Module with antenna interface and manufacturing method thereof |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107505514A (en) * | 2017-07-06 | 2017-12-22 | 安徽禄讯电子科技有限公司 | A kind of radio communication passive device test device |
| CN107505514B (en) * | 2017-07-06 | 2020-03-31 | 安徽禄讯电子科技有限公司 | Radio frequency communication passive device testing arrangement |
| CN110879315A (en) * | 2018-09-05 | 2020-03-13 | 矽品精密工业股份有限公司 | Test fixture |
| TWI726743B (en) * | 2020-06-10 | 2021-05-01 | 佳思科技有限公司 | Yield detection device of antenna in package devices |
| CN113945776A (en) * | 2020-07-16 | 2022-01-18 | 鸿劲精密股份有限公司 | Radio frequency electronic component testing device and testing equipment applying same |
| CN114006661A (en) * | 2020-07-28 | 2022-02-01 | 矽品精密工业股份有限公司 | Detection device |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI513986B (en) | 2015-12-21 |
| TW201614240A (en) | 2016-04-16 |
| CN105588986B (en) | 2018-12-07 |
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