CN113841040B - 灵敏度调整板以及传感器装置的制造方法 - Google Patents

灵敏度调整板以及传感器装置的制造方法 Download PDF

Info

Publication number
CN113841040B
CN113841040B CN202080035945.0A CN202080035945A CN113841040B CN 113841040 B CN113841040 B CN 113841040B CN 202080035945 A CN202080035945 A CN 202080035945A CN 113841040 B CN113841040 B CN 113841040B
Authority
CN
China
Prior art keywords
light
sensitivity adjustment
band
adjustment plate
moisture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202080035945.0A
Other languages
English (en)
Chinese (zh)
Other versions
CN113841040A (zh
Inventor
渡部祥文
马场徹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Intellectual Property Management Co Ltd
Original Assignee
Panasonic Intellectual Property Management Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Intellectual Property Management Co Ltd filed Critical Panasonic Intellectual Property Management Co Ltd
Publication of CN113841040A publication Critical patent/CN113841040A/zh
Application granted granted Critical
Publication of CN113841040B publication Critical patent/CN113841040B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3554—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN202080035945.0A 2019-06-20 2020-06-09 灵敏度调整板以及传感器装置的制造方法 Active CN113841040B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019-114299 2019-06-20
JP2019114299 2019-06-20
PCT/JP2020/022700 WO2020255797A1 (ja) 2019-06-20 2020-06-09 感度調整プレート、及び、センサ装置の製造方法

Publications (2)

Publication Number Publication Date
CN113841040A CN113841040A (zh) 2021-12-24
CN113841040B true CN113841040B (zh) 2024-03-22

Family

ID=74040751

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202080035945.0A Active CN113841040B (zh) 2019-06-20 2020-06-09 灵敏度调整板以及传感器装置的制造方法

Country Status (3)

Country Link
JP (1) JP7170237B2 (https=)
CN (1) CN113841040B (https=)
WO (1) WO2020255797A1 (https=)

Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4465929A (en) * 1982-06-18 1984-08-14 Infrared Engineering Limited Calibration standard for infrared absorption gauge
JPH0510874A (ja) * 1991-07-02 1993-01-19 Fuji Electric Co Ltd 吸光式ガス分析計
JPH08136452A (ja) * 1994-11-04 1996-05-31 Chino Corp 水分計
JPH0961351A (ja) * 1995-04-18 1997-03-07 Ricoh Co Ltd 含水分検知装置・含水分測定方法および含水分測定装置
JPH1090171A (ja) * 1996-09-17 1998-04-10 Matsushita Electric Ind Co Ltd 衣類乾燥機用乾燥検知センサ
JP2010054457A (ja) * 2008-08-29 2010-03-11 Sumitomo Electric Ind Ltd 水分検出装置、生体中水分検出装置、自然産物中水分検出装置、および製品・材料中水分検出装置
CN104114997A (zh) * 2012-02-29 2014-10-22 株式会社村田制作所 用于测定被测定物的特性的测定装置
JP2017203741A (ja) * 2016-05-13 2017-11-16 住友電気工業株式会社 感度補正方法及び定量測定方法
CN107923844A (zh) * 2015-08-27 2018-04-17 霍尼韦尔有限公司 氧化钬玻璃作为用于近红外湿度传感器的校准用标准
JP2018077301A (ja) * 2016-11-08 2018-05-17 住友金属鉱山株式会社 近赤外線吸収性光学部材、およびこれを用いた画像表示デバイス
WO2018155289A1 (ja) * 2017-02-24 2018-08-30 パナソニックＩｐマネジメント株式会社 乾燥度センサ
JP2018141632A (ja) * 2017-02-24 2018-09-13 パナソニックＩｐマネジメント株式会社 水分量センサ

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3478210A (en) * 1967-08-23 1969-11-11 Gen Electric Extended range infrared moisture gage standards
JPS5663242A (en) * 1979-10-30 1981-05-29 Yokogawa Hokushin Electric Corp Standard sample for moisture meter by infrared ray

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4465929A (en) * 1982-06-18 1984-08-14 Infrared Engineering Limited Calibration standard for infrared absorption gauge
JPH0510874A (ja) * 1991-07-02 1993-01-19 Fuji Electric Co Ltd 吸光式ガス分析計
JPH08136452A (ja) * 1994-11-04 1996-05-31 Chino Corp 水分計
JPH0961351A (ja) * 1995-04-18 1997-03-07 Ricoh Co Ltd 含水分検知装置・含水分測定方法および含水分測定装置
JPH1090171A (ja) * 1996-09-17 1998-04-10 Matsushita Electric Ind Co Ltd 衣類乾燥機用乾燥検知センサ
JP2010054457A (ja) * 2008-08-29 2010-03-11 Sumitomo Electric Ind Ltd 水分検出装置、生体中水分検出装置、自然産物中水分検出装置、および製品・材料中水分検出装置
CN104114997A (zh) * 2012-02-29 2014-10-22 株式会社村田制作所 用于测定被测定物的特性的测定装置
CN107923844A (zh) * 2015-08-27 2018-04-17 霍尼韦尔有限公司 氧化钬玻璃作为用于近红外湿度传感器的校准用标准
JP2017203741A (ja) * 2016-05-13 2017-11-16 住友電気工業株式会社 感度補正方法及び定量測定方法
JP2018077301A (ja) * 2016-11-08 2018-05-17 住友金属鉱山株式会社 近赤外線吸収性光学部材、およびこれを用いた画像表示デバイス
WO2018155289A1 (ja) * 2017-02-24 2018-08-30 パナソニックＩｐマネジメント株式会社 乾燥度センサ
JP2018141632A (ja) * 2017-02-24 2018-09-13 パナソニックＩｐマネジメント株式会社 水分量センサ

Also Published As

Publication number Publication date
CN113841040A (zh) 2021-12-24
WO2020255797A1 (ja) 2020-12-24
JP7170237B2 (ja) 2022-11-14
JPWO2020255797A1 (https=) 2020-12-24

Similar Documents

Publication Publication Date Title
KR102409960B1 (ko) 광학 측정 장치
CN207300399U (zh) 用于确定屏蔽物的污染的装置和系统、以及太阳能板
US8530819B2 (en) Direct current (DC) correction circuit for a time of flight (TOF) photodiode front end
TW202514078A (zh) 光學量測裝置以及光學裝置
WO2018155291A1 (ja) 水分量センサ及び衣類乾燥装置
CN104246477B (zh) 物质特性测定装置
JP2023551946A (ja) スペクトル感知装置及び光放射線測定方法
CN105122038A (zh) 开路式气体检测器
JP2017161424A (ja) 光学式成分センサ
CN113841040B (zh) 灵敏度调整板以及传感器装置的制造方法
US10690591B2 (en) Measurement time distribution in referencing schemes
CN110312924B (zh) 干燥度传感器
CN110291380A (zh) 光学式成分传感器
US20220200526A1 (en) Water reflection analysis of encapsulated photovoltaic modules
JP2018141632A (ja) 水分量センサ
WO2022138464A1 (ja) 漏水センサ
JP7553297B2 (ja) 光学式濃度測定装置
CN110887806B (zh) 基于超材料的无滤波片型红外热辐射气体浓度传感器
JP6975901B2 (ja) 成分検知センサ
CN209542431U (zh) 一种高精度的近程光谱仪
TW201430899A (zh) 非色散式紅外線氣體感測器及穩定一個白熾燈之紅外線輻射的方法
Wang et al. A Miniature Near-infrared Spectrometer Based on Linear Variable Filter
CN121002352A (zh) 用于获得关于至少一个对象的光谱学信息的光谱仪设备
WO2025114416A1 (en) Calibration trigger of smartphone spectrometer module using sensor fusion
JP2024161233A (ja) 光学式濃度測定装置

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant