CN113805033B - Trimming method for chip voltage - Google Patents
Trimming method for chip voltage Download PDFInfo
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- CN113805033B CN113805033B CN202010534704.2A CN202010534704A CN113805033B CN 113805033 B CN113805033 B CN 113805033B CN 202010534704 A CN202010534704 A CN 202010534704A CN 113805033 B CN113805033 B CN 113805033B
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- 238000009966 trimming Methods 0.000 title claims abstract description 408
- 238000000034 method Methods 0.000 title claims abstract description 39
- 238000012360 testing method Methods 0.000 claims abstract description 19
- 230000003247 decreasing effect Effects 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 10
- 230000008439 repair process Effects 0.000 description 16
- 238000004364 calculation method Methods 0.000 description 9
- 230000008569 process Effects 0.000 description 6
- 238000009826 distribution Methods 0.000 description 4
- 230000002427 irreversible effect Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16576—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold
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Abstract
The invention discloses a trimming method of chip voltage, which comprises the following steps: determining the assignment of all trimming bits when the initial value of the voltage to be trimmed is between a first threshold value and a second threshold value, or determining the assignment of the highest trimming bit based on the voltage range in which the initial value is located when the initial value is smaller than the first threshold value or larger than the second threshold value; executing the iteration step until the preset trimming value is greater than or equal to a first threshold value and less than or equal to a second threshold value, ending executing the iteration step, so as to sequentially determine the assignment of all trimming bits after the highest trimming bit; testing to obtain a final value of the voltage to be trimmed, the iterative steps comprising: performing pre-assignment on the next trimming bit, writing the determined trimming bit assignment and the pre-assignment into a chip, and testing to obtain a pre-trimming value of the voltage to be trimmed; and judging the voltage range of the pre-trimming value, and further determining the assignment of the current trimming bit of the chip. The invention can ensure that the trimming precision still meets the requirement during the mass production operation, and improves the product yield.
Description
Technical Field
The invention relates to the technical field of integrated circuit testing, in particular to a method for trimming chip voltage.
Background
In the field of integrated circuits, due to the influence of process self distribution, the parameters of the produced chips have certain deviation, and in the application with requirements on parameter precision, the influence of parameter distribution is reduced by using a trimming method, so that the consistency of the parameter precision is improved, and the application requirements are met.
Currently known trimming means mainly comprise electric trimming, laser trimming, eFuse or EEROM code writing trimming, in the code writing trimming, trimming codes are generally obtained through a calculation method or a table look-up method, and then trimming is carried out on fuses through the obtained trimming codes.
As shown in fig. 1, fig. 1 shows a flow chart of a trimming method according to the existing chip voltage, and first, an initial value of the chip voltage to be trimmed is obtained by testing (step S01); then the initial value is brought into a formula of a table look-up method to obtain trimming codes corresponding to a plurality of trimming bits (step S02); and correspondingly writing the obtained trimming code into a chip, and retesting to obtain the final value of the voltage to be trimmed (step S03). An existing table look-up formula is as follows:
wherein LSB (Least Significant Bit) is the trimming weight (i.e. minimum step size) corresponding to the least significant trimming bit, V ref For the initial value of the voltage to be repaired, V ref0 A is a positive number for the target value of the voltage to be modified. And obtaining the corresponding trimming code by obtaining the trimming step number range of the trimming proportion of the voltage to be trimmed and further looking up a table.
The table lookup formula calculation method is simple and feasible, but the method has high requirement on the consistency of the trimming weight LSB corresponding to the least effective trimming bit, namely the condition that the formula is established is that the value of the trimming weight LSB corresponding to the least effective trimming bit is kept consistent as much as possible when trimming is performed each time, so that the accurate trimming step number is obtained. When the chip is tested in batches, the trimming weight of the chip can change along with the change of the mass production batch, so that the value of the trimming weight LSB corresponding to the least effective trimming bit can be different when trimming is performed each time, and if the table look-up formula calculation method is still adopted at the moment, the trimming precision can not reach the expectations (positive and negative half LSBs), and even the product yield of the chip is not high.
Accordingly, there is a need to provide an improved solution to overcome the above technical problems in the prior art.
Disclosure of Invention
In order to solve the technical problems, the invention provides a trimming method for chip voltage, which can ensure that trimming precision still meets the requirements during mass production operation and improves the product yield.
The method for trimming the chip voltage provided by the invention comprises the following steps: acquiring an initial value of voltage to be repaired; acquiring a first threshold value and a second threshold value based on a trimming weight corresponding to the least effective trimming bit of the chip and a target value of voltage to be trimmed; judging a voltage range in which the initial value is based on the first threshold value and the second threshold value; when the initial value is greater than or equal to the first threshold value and less than or equal to the second threshold value, directly determining the assignment of all trimming bits of the chip, burning the determined assignment of all trimming bits of the chip to the chip, retesting to obtain the final value of the voltage to be trimmed, or
When the initial value is smaller than the first threshold value or larger than the second threshold value, the following steps are executed: determining the assignment of the highest trimming bit of the chip based on the voltage range where the initial value is located; executing the iteration step until the preset trimming value is greater than or equal to the first threshold value and less than or equal to the second threshold value, ending executing the iteration step to sequentially determine the assignment of all trimming bits after the highest trimming bit of the chip; burning the determined highest trimming bit of the chip and the assigned values of all trimming bits after the highest trimming bit to the chip, retesting to obtain the final value of the voltage to be trimmed,
wherein the iterative steps include: performing pre-assignment on the next trimming bit of the determined chip trimming bit, writing the assignment of the determined chip trimming bit and the pre-assignment into a chip, and testing to obtain a pre-trimming value of the voltage to be trimmed; and judging the voltage range of the pre-trimming value based on the first threshold value and the second threshold value, and determining the assignment of the current trimming bit of the chip based on the voltage range of the pre-trimming value.
Preferably, the assigning is to assign one of a first voltage value and a second voltage value, where when a certain trimming bit of the chip is assigned to the first voltage value, a trimming weight corresponding to the trimming bit is invalid for trimming the voltage to be trimmed; or when a certain trimming bit of the chip is given to the second voltage value, the trimming weight corresponding to the trimming bit is effective to trim the voltage to be trimmed.
Preferably, when the initial value is greater than or equal to the first threshold value and less than or equal to the second threshold value, directly determining the assignment of all trimming bits of the chip includes: and when the initial value is larger than or equal to the first threshold value and smaller than or equal to the second threshold value, all trimming bits of the chip are endowed with the first voltage value.
Preferably, determining the assignment of the highest trimming bit of the corresponding chip based on the voltage range in which the initial value is located includes: when the initial value is smaller than the first threshold value, the chip highest trimming bit is given to the first voltage value; or when the initial value is larger than the second threshold value, the chip highest trimming bit is given to the second voltage value.
Preferably, pre-assigning the next trimming bit of the determined chip trimming bit includes: and giving the second voltage value to the next trimming bit of the determined chip trimming bit.
Preferably, determining the voltage range in which the pre-trimming value is located based on the first threshold value and the second threshold value, and determining the assignment of the current trimming bit of the chip based on the voltage range in which the pre-trimming value is located includes: when the pre-trimming value is smaller than the first threshold value, the current trimming bit of the chip is endowed with the second voltage value; or when the pre-trimming value is larger than the second threshold value, the current trimming bit of the chip is given to the first voltage value.
Preferably, the step of performing an iteration is performed to sequentially determine the assignment of all trimming bits after the highest trimming bit of the chip, until the preset trimming value is greater than or equal to the first threshold and less than or equal to the second threshold, and the step of ending performing the iteration further includes: and when the pre-trimming value is greater than or equal to the first threshold value and less than or equal to the second threshold value, exiting the iteration step, assigning the pre-assigned value to the current chip trimming bit, and assigning all the undetermined chip trimming bits after the current chip trimming bit to the first voltage value.
Preferably, the first threshold value is equal to the target value minus a product of the target value and one half of a trimming weight corresponding to the least significant trimming bit of the chip; the second threshold is equal to the target value plus a product of the target value and one-half of a trimming weight corresponding to the least significant trimming bit of the chip.
Preferably, the highest trimming bit of the chip corresponds to negative trimming of the voltage to be trimmed, and all trimming bits of the chip correspond to positive trimming of the voltage to be trimmed after the highest trimming bit of the chip, wherein the absolute values of trimming weights of all trimming bits of the chip are sequentially decreased, and the absolute value of trimming weight corresponding to the highest trimming bit is larger than the absolute value of trimming weight corresponding to the lowest trimming bit.
Preferably, the trimming method further comprises: setting a key and assigning a trimming bit of the chip under the condition that the key is valid.
The beneficial effects of the invention are as follows: the invention discloses a trimming method of chip voltage, which comprises the steps of after obtaining an initial value and a target value range of the voltage to be trimmed, determining the assignment of all trimming bits of a chip directly by judging the relation between the initial value and the target value range of the voltage to be trimmed, further determining the assignment of all trimming bits of the chip in sequence by the principle of successive approximation from high bit to low bit (weight value high bit to weight value low bit) when the initial value of the voltage to be trimmed falls outside the target value range, determining the assignment of the highest trimming bit of the chip based on the boundary (corresponding to a first threshold value and a second threshold value) of the target value range, then pre-assigning the next trimming bit of the determined chip trimming bit, obtaining the pre-trimming value of the voltage to be trimmed according to the assignment of the determined trimming bit and the pre-assignment, determining the assignment of the current trimming bit of the chip according to the relation between the pre-trimming value and the target value range, and further ensuring that the trimming bit has good precision when the trimming bit is required by the high-quality adjustment of the chip is required, and further improving the product quality of the product. Meanwhile, the relation judgment of the pre-trimming value and the target value range is carried out after each iteration operation is carried out, so that the iteration operation can be stopped in time and the assignment of all bits to be trimmed can be directly determined when the pre-trimming value accords with the target value range (namely, is larger than or equal to a first threshold value and smaller than or equal to a second threshold value), the trimming processing with the least steps can be carried out on the difference value between the initial value of different voltages to be trimmed and the target value, further, the operation resource is saved, the unnecessary operation is avoided, the trimming time is shortened, and the trimming efficiency of the chip mass production test is improved.
When the next trimming bit of the determined chip trimming bit is pre-assigned, a second voltage value which is effective for trimming the voltage to be trimmed is assigned to the current trimming bit (namely the next trimming bit of the determined chip trimming bit), so that the assignment of the high trimming bit can be accurately judged under the condition that the assignment of the low trimming bit is uncertain, the fault tolerance rate caused by irreversible trimming during successive approximation is reduced, and the trimming quality during chip mass production testing is improved.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention as claimed.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent from the following description of embodiments of the present invention with reference to the accompanying drawings.
FIG. 1 is a flow chart of a trimming method according to the prior art;
fig. 2 is a flow chart illustrating a method for trimming a chip voltage according to an embodiment of the present invention;
fig. 3 shows a timing diagram of trimming a chip voltage according to an embodiment of the invention.
Detailed Description
In order that the invention may be readily understood, a more complete description of the invention will be rendered by reference to the appended drawings. Preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
The present invention will be described in detail with reference to the accompanying drawings.
Fig. 2 is a flow chart illustrating a method for trimming a chip voltage according to an embodiment of the present invention, and fig. 3 is a timing chart illustrating trimming a chip voltage according to an embodiment of the present invention.
In the field of integrated circuits, due to the influence of process self distribution, the parameters of the produced chips have certain deviation, and in the application with requirements on parameter precision, the influence of parameter distribution is reduced by using a trimming method, so that the consistency of the parameter precision is improved, and the application requirements are met. Currently known trimming means mainly include electric trimming, laser trimming, eFuse or EEROM code writing trimming.
In code-writing trimming, as an exemplary embodiment, referring to fig. 3, vin represents a power supply voltage, TM represents a key of a chip entering a trimming mode, EN represents an enable signal for trimming, and b0-b4 represent five trimming bits from the most significant bit to the least significant bit in order (it is understood that the representation of five trimming bits is merely exemplary, and the number of trimming bits may be other, which is not limited by the present invention). The enable signal EN is used to control the chip to enter a writing state or a burning state, that is, when the enable signal EN is in a first level state V1 (e.g., 2.5V), the chip can be controlled to enter the writing state, and at this time, the chip writes the assignment of the current trimming bit into the program; when the enable signal EN is in the second level state V2 (e.g., 5V), the chip can be controlled to enter a writing state, and the chip directly writes the current trimming bit, so that the trimming weight corresponding to the current trimming bit trims the chip voltage (i.e., the voltage to be trimmed of the chip), and the trimming is irreversible. Furthermore, each time a new trimming bit is written, the influence of the previous trimming weight on the voltage to be trimmed is refreshed.
Referring to fig. 2 and fig. 3, it can be seen that the trimming method of the chip voltage in the present embodiment includes the following steps:
in step S11, an initial value of the voltage to be trimmed is obtained.
After the chip is electrified, testing and obtaining an initial value of the voltage to be modified of the chip through a measuring device.
In step S12, a first threshold and a second threshold are obtained based on the trimming weight corresponding to the least significant trimming bit of the chip and the target value of the voltage to be trimmed.
When the voltage to be trimmed is trimmed based on a plurality of trimming bits, the trimming weights corresponding to each trimming bit in the plurality of trimming bits are different, specifically, the highest trimming bit of the chip is used for carrying out negative trimming on the voltage to be trimmed, and all trimming bits after the highest trimming bit of the chip are used for carrying out positive trimming on the voltage to be trimmed. And the absolute values of the trimming weights of all trimming bits of the chip are sequentially decreased, and the absolute value of the trimming weight corresponding to the highest trimming bit is larger than the absolute value of the trimming weight corresponding to the lowest trimming bit. And further, accurate trimming of various voltage to be trimmed with different deviations can be realized.
Further, in the process of trimming the voltage to be trimmed, as long as the trimmed voltage value falls within the positive and negative half of the least effective trimming bit of the target value, the trimming can be approximately regarded as successful. From this, it can be derived that: the first threshold value is equal to the product of the target value of the voltage to be trimmed minus one half of the trimming weight corresponding to the least significant trimming bit of the chip, and the second threshold value is equal to the product of the target value of the voltage to be trimmed plus one half of the trimming weight corresponding to the least significant trimming bit of the chip. And the voltage range corresponding to the first threshold value or more and the second threshold value or less is the target value range of the voltage to be repaired.
In step S13, the voltage range in which the initial value is located is determined based on the first threshold value and the second threshold value.
After the first threshold value and the second threshold value are obtained, a voltage range in which an initial value of the voltage to be trimmed is located can be determined according to the obtained first threshold value and second threshold value, and subsequent steps are further selectively executed according to the voltage range in which the initial value of the voltage to be trimmed is located.
Specifically, when the initial value of the voltage to be trimmed is greater than or equal to the first threshold and less than or equal to the second threshold, step S14 is executed; and when the initial value of the voltage to be trimmed is smaller than the first threshold value or larger than the second threshold value, executing the steps S15 to S18.
In step S14, the assignment of all trimming bits of the chip is directly determined, and the determined assignment of all trimming bits of the chip is burned into the chip, and the final value of the voltage to be trimmed is obtained through retesting.
In this embodiment, the assignment is to assign one of the first voltage value and the second voltage value. The assignment of all trimming bits of the chip is determined to determine whether each trimming bit of all trimming bits of the chip is assigned the first voltage value or the second voltage value.
Further, when a certain trimming bit of the chip is given a first voltage value, trimming weight corresponding to the trimming bit is invalid for trimming the voltage to be trimmed; or when a certain trimming bit of the chip is given a second voltage value, the trimming weight corresponding to the trimming bit is effective to trim the voltage to be trimmed.
If the initial value of the voltage to be repaired is larger than or equal to the first threshold value and smaller than or equal to the second threshold value after judgment, namely the initial value of the voltage to be repaired is within the range of plus or minus half of the least effective repair bit of the target value, the current voltage to be repaired is indicated to meet the requirement, and no additional repair is needed. At this time, all trimming bits of the chip can be given a first voltage value, and trimming of the current chip voltage is finished.
In step S15, the assignment of the chip highest trim bit is determined based on the voltage range in which the initial value is located.
If the initial value of the voltage to be repaired is smaller than the first threshold value or larger than the second threshold value after judgment, namely the initial value of the voltage to be repaired is outside the positive and negative half minimum effective repair bit range of the target value, the current voltage to be repaired is not satisfied with the requirement, and additional repair is needed.
Further, determining the assignment of the highest trim bit of the corresponding chip based on the voltage range in which the initial value is located includes: when the initial value (initial value for short) of the voltage to be trimmed is smaller than a first threshold value, the highest trimming bit of the chip is given to a first voltage value; or when the initial value is larger than the second threshold value, the chip highest trimming bit is assigned to the second voltage value.
When the initial value is smaller than the first threshold value, the positive trimming of the voltage to be trimmed is indicated, and since the trimming weight corresponding to the highest trimming bit in all trimming bits of the chip is negative, the highest trimming bit of the chip is assigned to the first voltage value. And when the initial value is larger than the second threshold value, the negative trimming of the voltage to be trimmed is indicated, and since only the trimming weight corresponding to the highest trimming bit in all trimming bits of the chip is negative, the highest trimming bit of the chip is assigned to the second voltage value.
In step S16, the next trimming bit of the determined trimming bit of the chip is pre-assigned, the assigned value of the determined trimming bit of the chip and the pre-assigned value are written into the chip, and the pre-trimming value of the voltage to be trimmed is obtained through testing.
In step S17, a voltage range in which the pre-trimming value is located is determined based on the first threshold and the second threshold, and the assignment of the current trimming bit of the chip is determined based on the voltage range in which the pre-trimming value is located.
And when the highest trimming bit or the highest trimming bit and the next trimming bits of the plurality of trimming bits are determined, pre-assigning the next trimming bits of the plurality of trimming bits in the sequence from high to low, and then writing the determined assignments of the chip trimming bits and the pre-assigned values into the chip, and obtaining a pre-trimming value of the current voltage to be trimmed after trimming based on the determined trimming bits through calculation.
Preferably, pre-assigning the next trimming bit of the determined chip trimming bit includes: and giving the second voltage value to the next trimming bit of the determined chip trimming bit. Therefore, the assignment of the high-order trimming bit can be accurately judged under the condition that the assignment of the low-order trimming bit is uncertain, the fault tolerance rate caused by irreversible trimming during successive approximation is reduced, and the trimming quality during chip mass production testing is improved. For example, when a chip is tested in a batch test of a certain mass-produced chip, the trimming bits of the trimming system include five bits (corresponding to trimming weights of-20%, 10%, 5%, 2.5% and 1.25%, respectively), and the initial value of the voltage to be trimmed of the chip is smaller than the first threshold value corresponding to the target value range, so that the value of the highest trimming bit can be determined to be the first voltage value (corresponding to binary code of 0). At this time, if the pre-assigned value of the second trimming bit is the first voltage value, which is equivalent to that the highest trimming bit and the second trimming bit do not trim the voltage to be trimmed (the first voltage value is still smaller than the target value because the third trimming bit to the fifth trimming bit are not yet turned around), then the pre-assigned value of the second trimming bit should be determined to be not opposite at this time, then the true assigned value of the second trimming bit is determined to be the second voltage value, that is, the trimming weight of the voltage to be trimmed is at least 10% finally, but if the actually required trimming weight of the voltage to be trimmed is 3% (the initial value is also satisfied to be smaller than the target value), the actual assigned value of the second trimming bit should be the first voltage value, which is contrary to the above-mentioned determination standard, and thus the trimming error is easy to be caused, and the quality of the mass test structure of the chip is easily affected. Especially, in the case of burning the determined trimming bit assignment to the chip after each determination of the trimming bit assignment (by adopting the method, the current value of the voltage to be trimmed of the chip can be updated in real time, the subsequent calculation amount is reduced, and the influence on the accuracy of the trimming result when the subsequent trimming weight changes along with the change of the mass production batch is avoided), the influence is larger due to the irreversibility of trimming after burning. If the pre-assigned value of the second trimming bit is given as the second voltage value (i.e. code 1), since only the pre-assigned value is not yet determined, the burning is not performed, and after performing predictive calculation according to the pre-assigned value, if the pre-assigned value of the voltage to be trimmed is still smaller than the first threshold value corresponding to the target value range, the trimming weight of the voltage to be trimmed is larger than or equal to 10%, and then the true assigned value of the second trimming bit can be determined to be the second voltage value; if the pre-trimming value of the voltage to be trimmed is greater than the second threshold corresponding to the target value range, the trimming weight of the voltage to be trimmed is smaller than 10%, and the true assignment of the second trimming bit can be determined to be the first voltage value.
It should be noted that, the above steps S16 and S17 are iteration steps to be performed in a loop, and according to the same or similar principle as the above, the loop is performed to sequentially determine the assignment of all trimming bits after the highest trimming bit of the chip, until the obtained preconditioning value is greater than or equal to the first threshold and less than or equal to the second threshold, and then the iteration step is performed, and step S18 is further performed.
Further, when the obtained pre-trimming value is greater than or equal to the first threshold value and less than or equal to the second threshold value, it indicates that trimming of the voltage to be trimmed is satisfied, the remaining trimming bits do not need to trim the voltage to be trimmed, and no iterative operation can be performed any more, but only the pre-assignment is assigned to the current chip trimming bit, and all undetermined chip trimming bits after the current chip trimming bit are assigned to the first voltage value. And after each iteration operation, carrying out relation judgment on the pre-trimming value and the target value range, further stopping the iteration operation in time and directly determining the assignment of all bits to be trimmed when the pre-trimming value accords with the target value range (namely, is greater than or equal to a first threshold value and is less than or equal to a second threshold value), carrying out trimming processing with least steps on the difference value between the initial value of different voltages to be trimmed and the target value, further saving operation resources, avoiding executing unnecessary operation, shortening trimming time and improving trimming efficiency in chip mass production test.
In step S18, the determined highest trimming bit of the chip and the assigned values of all trimming bits after the highest trimming bit are burned into the chip, and the final value of the voltage to be trimmed is obtained through retesting.
After all trimming bits of the chip are assigned, the determined highest trimming bit of the chip and the assigned values of all trimming bits after the highest trimming bit are burnt to the chip (the burnt trimming bits can not be burnt again), and then the chip is tested to obtain the final value of the voltage to be trimmed. It can be understood that if the chip meets the trimming requirement, the final value of the voltage to be trimmed finally obtained should be in accordance with the target value range.
Further, the trimming method further comprises: setting a key and assigning a trimming bit of the chip under the condition that the key is valid. The error trimming of the voltage to be trimmed of the chip can be effectively prevented.
For example, referring to fig. 3, when a test trimming of the chip is required, the power supply voltage Vin is set to a high voltage (the chip is powered up), and then the key TM is set to a valid state. At this time, it is assumed that the target value of the voltage to be trimmed is 25V. And in the trimming system for the chip voltage, five trimming bits b0, b1, b2, b3 and b4 are included, wherein the trimming bit b0 is the highest trimming bit, the b4 is the lowest trimming bit, and the trimming weights corresponding to the five trimming bits are sequentially-20%, 10%, 5%, 2.5% and 1.25%. Further, the target value range of the voltage to be trimmed may be 24.84375 (corresponding to the first threshold value) to 25.15625 (corresponding to the second threshold value). Then, the initial value of the voltage to be trimmed obtained by the test is 22.16V. Since 22.16V is less than the first threshold 24.84375V corresponding to the target value range, the value of the highest trim bit b0 can be determined to be the first voltage value. And pre-giving a second voltage value to the trimming bit b1, controlling the enable signal EN at the moment to be in a first level state V1, writing the assignment of the trimming bit b0 and the trimming bit b1 into a program of a chip, and obtaining a pre-trimming value of the voltage to be trimmed at the moment as 24.376V after predictive calculation. Since 24.376V is still smaller than the first threshold 24.84375V corresponding to the target value range, it can be determined that the actual assignment of the trimming bit b1 is the second voltage value, and the control enable signal EN is changed to the second level state V2 to burn the assignments of the trimming bits b0-b1 into the chip. And pre-giving a second voltage value to the trimming bit b2, controlling the enable signal EN at the moment to be in a first level state V1, writing the assignment of the trimming bit b2 into a program of a chip, and obtaining a pre-trimming value of the voltage to be trimmed at the moment to be 25.484V after predictive calculation. Since 25.484V is greater than the second threshold 25.15625V corresponding to the target value range, it can be determined that the actual assigned value of trim bit b2 should be the first voltage value. And pre-giving a second voltage value to the trimming bit b3, controlling the enable signal EN at the moment to be in a first level state V1, writing the assignment of the trimming bit b3 into a program of a chip, and obtaining a pre-trimming value of the voltage to be trimmed at the moment to be 24.93V after predictive calculation. Since 24.93V falls within the target value range, it can be determined that the actual value of trim bit b3 is the second voltage value, while it can also be determined that the actual value of trim bit b4 should be the first voltage value. At this time, the enable signal EN is controlled to be in the second level state V2, so as to burn the corresponding assigned values of the trimming bits b0-b4 into the chip, and test again to obtain the final value of the voltage to be trimmed of the chip as 24.93V. When the burnt trimming bit is a first voltage value, the trimming weight corresponding to the trimming bit is invalid for trimming the voltage to be trimmed, and when the burnt trimming bit is a second voltage value, the trimming weight corresponding to the trimming bit is valid for trimming the voltage to be trimmed, and the first voltage value is smaller than the second voltage value.
In summary, after the initial value and the target value range of the voltage to be repaired are obtained, the relation between the initial value and the target value range of the voltage to be repaired is judged, then when the initial value of the voltage to be repaired is in the target value range, the assignment of all the repair bits of the chip is directly determined, when the initial value of the voltage to be repaired is out of the target value range, the assignment of the highest repair bit of the chip is determined based on the boundary (corresponding to the first threshold and the second threshold) of the target value range, then the next repair bit of the determined chip repair bit is pre-assigned, the pre-repair value of the voltage to be repaired is obtained according to the determined assignment and the pre-assignment of the repair bit, and the assignment of the current repair bit of the chip is determined according to the relation between the pre-repair value and the target value range, and the pre-assignment of the next repair bit is iteratively executed, so that the assignment of all the repair bits of the chip is sequentially determined according to the principle of successive approximation from high bits to low bits (high weight values to low weight values), further, the precision of the repair bit can be improved according to different initial voltages of the chip and the weight adjustment bit weight values, and the quality of the repair bit can be adjusted, and the quality of the product can be improved, and the quality can be adjusted. Meanwhile, the relation judgment of the pre-trimming value and the target value range is carried out after each iteration operation is carried out, so that the iteration operation can be stopped in time and the assignment of all bits to be trimmed can be directly determined when the pre-trimming value accords with the target value range (namely, is larger than or equal to a first threshold value and smaller than or equal to a second threshold value), the trimming processing with the least steps can be carried out on the difference value between the initial value of different voltages to be trimmed and the target value, further, the operation resource is saved, the unnecessary operation is avoided, the trimming time is shortened, and the trimming efficiency of the chip mass production test is improved.
When the next trimming bit of the determined chip trimming bit is pre-assigned, a second voltage value which is effective for trimming the voltage to be trimmed is assigned to the current trimming bit (namely the next trimming bit of the determined chip trimming bit), so that the assignment of the high trimming bit can be accurately judged under the condition that the assignment of the low trimming bit is uncertain, the fault tolerance rate caused by irreversible trimming during successive approximation is reduced, and the trimming quality during chip mass production testing is improved.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
Finally, it should be noted that: it is apparent that the above examples are only illustrative of the present invention and are not limiting of the embodiments. Other variations or modifications of the above teachings will be apparent to those of ordinary skill in the art. It is not necessary here nor is it exhaustive of all embodiments. And obvious variations or modifications thereof are contemplated as falling within the scope of the present invention.
Claims (9)
1. A method for trimming a chip voltage, comprising:
acquiring an initial value of voltage to be repaired;
acquiring a first threshold value and a second threshold value based on a trimming weight corresponding to the least effective trimming bit of the chip and a target value of voltage to be trimmed;
judging a voltage range in which the initial value is based on the first threshold value and the second threshold value;
when the initial value is greater than or equal to the first threshold value and less than or equal to the second threshold value, directly determining the assignment of all trimming bits of the chip, burning the determined assignment of all trimming bits of the chip to the chip, retesting to obtain the final value of the voltage to be trimmed, or
When the initial value is smaller than the first threshold value or larger than the second threshold value, the following steps are executed:
determining the assignment of the highest trimming bit of the chip based on the voltage range where the initial value is located;
executing the iteration step until the pre-trimming value is larger than or equal to the first threshold value and smaller than or equal to the second threshold value, ending executing the iteration step to sequentially determine the assignment of all trimming bits after the highest trimming bit of the chip;
burning the determined highest trimming bit of the chip and the assigned values of all trimming bits after the highest trimming bit to the chip, retesting to obtain the final value of the voltage to be trimmed,
wherein the iterative steps include:
performing pre-assignment on the next trimming bit of the determined chip trimming bit, writing the assignment and the pre-assignment of the determined chip trimming bit into a chip, and testing to obtain a pre-trimming value of the voltage to be trimmed;
judging the voltage range of the pre-trimming value based on the first threshold value and the second threshold value, determining the assignment of the current trimming bit of the chip based on the voltage range of the pre-trimming value,
the highest trimming bit of the chip correspondingly carries out negative trimming on the voltage to be trimmed, and all trimming bits after the highest trimming bit of the chip correspondingly carry out positive trimming on the voltage to be trimmed; and
the absolute values of the trimming weights of all trimming bits of the chip are sequentially decreased, and the absolute value of the trimming weight corresponding to the highest trimming bit is larger than the absolute value of the trimming weight corresponding to the lowest trimming bit.
2. The trimming method according to claim 1, wherein the assigning is to assign one of a first voltage value and a second voltage value,
when a certain trimming bit of the chip is given to the first voltage value, trimming weight corresponding to the trimming bit is invalid for trimming the voltage to be trimmed; or alternatively
When a certain trimming bit of the chip is given to the second voltage value, the trimming weight corresponding to the trimming bit is effective to trim the voltage to be trimmed.
3. The trimming method according to claim 2, wherein directly determining the assignment of all trimming bits of the chip when the initial value is greater than or equal to the first threshold and less than or equal to the second threshold comprises:
and when the initial value is larger than or equal to the first threshold value and smaller than or equal to the second threshold value, all trimming bits of the chip are endowed with the first voltage value.
4. The trimming method according to claim 2, wherein determining the assignment of the highest trimming bit of the corresponding chip based on the voltage range in which the initial value is located includes:
when the initial value is smaller than the first threshold value, the chip highest trimming bit is given to the first voltage value; or alternatively
And when the initial value is larger than the second threshold value, the chip highest trimming bit is given to the second voltage value.
5. The trimming method according to claim 2, wherein pre-assigning the next trimming bit of the determined chip trimming bit comprises:
and giving the second voltage value to the next trimming bit of the determined chip trimming bit.
6. The trimming method according to claim 5, wherein determining a voltage range in which the pre-trimming value is located based on the first threshold value and the second threshold value, and determining the assignment of the chip current trimming bit based on the voltage range in which the pre-trimming value is located includes:
when the pre-trimming value is smaller than the first threshold value, the current trimming bit of the chip is endowed with the second voltage value; or alternatively
And when the pre-trimming value is larger than the second threshold value, the current trimming bit of the chip is endowed with the first voltage value.
7. The trimming method according to claim 5, wherein performing the iterative step to sequentially determine the assignment of all trimming bits after the highest trimming bit of the chip until the pre-trimming value is greater than or equal to the first threshold and less than or equal to the second threshold, ending performing the iterative step further comprises:
and when the pre-trimming value is greater than or equal to the first threshold value and less than or equal to the second threshold value, exiting the iteration step, assigning the pre-assigned value to the current chip trimming bit, and assigning all the undetermined chip trimming bits after the current chip trimming bit to the first voltage value.
8. The trimming method according to any one of claims 1, 3, 4, 6 and 7, wherein the first threshold value is equal to the target value minus a product of the target value and one-half of a trimming weight corresponding to a chip least significant trimming bit;
the second threshold is equal to the target value plus a product of the target value and one-half of a trimming weight corresponding to the least significant trimming bit of the chip.
9. The trimming method according to claim 1, wherein the trimming method further comprises:
setting a key and assigning a trimming bit of the chip under the condition that the key is valid.
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