CN113805033A - Chip voltage trimming method - Google Patents
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- CN113805033A CN113805033A CN202010534704.2A CN202010534704A CN113805033A CN 113805033 A CN113805033 A CN 113805033A CN 202010534704 A CN202010534704 A CN 202010534704A CN 113805033 A CN113805033 A CN 113805033A
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- 238000009966 trimming Methods 0.000 title claims abstract description 379
- 238000000034 method Methods 0.000 title claims abstract description 39
- 238000012360 testing method Methods 0.000 claims abstract description 21
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16576—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold
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Abstract
The invention discloses a method for trimming chip voltage, which comprises the following steps: when the initial value of the voltage to be modified is between a first threshold and a second threshold, determining the assignment of all the modifying bits, or when the initial value is smaller than the first threshold or larger than the second threshold, determining the assignment of the highest modifying bit based on the voltage range of the initial value; executing the iteration step until the pre-trimming value is greater than or equal to the first threshold and less than or equal to the second threshold, and ending the iteration step so as to sequentially determine the assignment of all trimming bits after the highest trimming bit; testing to obtain a final value of the voltage to be modified, wherein the iteration step comprises the following steps: pre-assigning a next trimming position, writing the assigned value and the pre-assigned value of the determined trimming position into a chip, and testing to obtain a pre-trimming value of the voltage to be trimmed; and judging the voltage range of the pre-trimming value, and further determining the assignment of the current trimming position of the chip. The invention can ensure that the trimming precision can still meet the requirement during mass production operation, and improves the product yield.
Description
Technical Field
The invention relates to the technical field of integrated circuit testing, in particular to a method for trimming chip voltage.
Background
In the field of integrated circuits, due to the influence of the distribution of the process, parameters of produced chips have certain deviation, and in the application with the requirement on the parameter precision, a trimming method is needed to reduce the influence of the parameter distribution and improve the consistency of the parameter precision so as to meet the application requirement.
Currently, the known trimming means mainly includes electrical trimming, laser trimming, eFuse or EEROM code writing trimming, in the code writing trimming, the trimming code is generally obtained by a table-obtaining method through a calculation method, and then the fuse is trimmed through the obtained trimming code.
As shown in fig. 1, fig. 1 is a flow chart illustrating a trimming method for a chip voltage according to the prior art, first testing to obtain an initial value of a voltage to be trimmed of a chip (step S01); then, the initial value is substituted into a formula of a table look-up method to obtain trimming codes corresponding to a plurality of trimming positions (step S02); and correspondingly writing the obtained trimming code into the chip, and retesting to obtain the final value of the voltage to be trimmed (step S03). One current look-up table formula is as follows:
wherein LSB (least Significant bit) is the modification weight (i.e. the minimum step size) corresponding to the least Significant modification bit, VrefIs an initial value of the voltage to be modified, Vref0A is a positive number as the target value of the voltage to be modified. And looking up a table to obtain a corresponding trimming code by obtaining the range of the trimming step number of the trimming proportion of the voltage to be trimmed.
Although the method for obtaining the trimming code by adopting the table look-up formula calculation method is simple and easy to implement, the method has high requirement on the consistency of the trimming weight LSB corresponding to the least effective trimming bit, namely the established condition of the formula is that the value of the trimming weight LSB corresponding to the least effective trimming bit is kept consistent as much as possible when the trimming is carried out every time so as to obtain accurate trimming step number. During the batch test of the chips, the trimming weight of the chips may change along with the batch variation, so that the LSB value of the trimming weight corresponding to the least effective trimming bit may be different during each trimming, and if the table lookup formula calculation method is still used at this time, the trimming accuracy may not be expected (positive and negative half LSBs), even the product yield of the chips may not be high.
Therefore, there is a need to provide an improved technical solution to overcome the above technical problems in the prior art.
Disclosure of Invention
In order to solve the technical problems, the invention provides a method for trimming chip voltage, which can ensure that the trimming precision can still meet the requirements during mass production operation and improve the product yield.
The chip voltage trimming method provided by the invention comprises the following steps: acquiring an initial value of a voltage to be modified; obtaining a first threshold value and a second threshold value based on the trimming weight corresponding to the lowest effective trimming bit of the chip and the target value of the voltage to be trimmed; judging the voltage range of the initial value based on the first threshold value and the second threshold value; when the initial value is greater than or equal to the first threshold and less than or equal to the second threshold, directly determining the assignment of all trimming bits of the chip, burning the determined assignment of all trimming bits of the chip to the chip, and retesting to obtain the final value of the voltage to be trimmed, or
When the initial value is smaller than the first threshold or larger than the second threshold, performing the following steps: determining the assignment of the highest trimming bit of the chip based on the voltage range of the initial value; executing the iteration step until the pre-trimming value is greater than or equal to the first threshold and less than or equal to the second threshold, and ending the execution of the iteration step to sequentially determine the assignment of all trimming bits after the highest trimming bit of the chip; burning the determined highest trimming bit of the chip and the assignment of all the trimming bits after the highest trimming bit to the chip, retesting to obtain the final value of the voltage to be trimmed,
wherein the step of iterating comprises: pre-assigning the next trimming position of the determined chip trimming positions, writing the assignment of the determined chip trimming positions and the pre-assignment into a chip, and testing to obtain the pre-trimming value of the voltage to be trimmed; and judging the voltage range of the pre-trimming value based on the first threshold and the second threshold, and determining the assignment of the current trimming bit of the chip based on the voltage range of the pre-trimming value.
Preferably, the assignment is one of a first voltage value and a second voltage value, wherein when a certain trimming bit of the chip is assigned with the first voltage value, the trimming weight corresponding to the trimming bit is ineffective for trimming the voltage to be trimmed; or when a certain trimming bit of the chip is endowed with the second voltage value, the trimming weight corresponding to the trimming bit is effective to the trimming of the voltage to be trimmed.
Preferably, when the initial value is greater than or equal to the first threshold and less than or equal to the second threshold, directly determining the assignments of all trimming bits of the chip includes: and when the initial value is greater than or equal to the first threshold value and less than or equal to the second threshold value, all trimming bits of the chip are endowed with the first voltage value.
Preferably, determining the assignment of the highest trimming bit of the corresponding chip based on the voltage range in which the initial value is located comprises: when the initial value is smaller than the first threshold value, giving the highest trimming bit of the chip to the first voltage value; or when the initial value is larger than the second threshold value, giving the highest trimming bit of the chip to the second voltage value.
Preferably, the pre-assigning the next trim bit of the determined chip trim bits comprises: assigning a next trimming bit of the determined chip trimming bits to the second voltage value.
Preferably, the determining the voltage range of the preset value based on the first threshold and the second threshold, and the determining the assignment of the current trimming bit of the chip based on the voltage range of the preset value includes: when the pre-trimming value is smaller than the first threshold value, the current trimming position of the chip is endowed with the second voltage value; or when the pre-trimming value is larger than the second threshold value, the current trimming position of the chip is endowed to the first voltage value.
Preferably, the step of performing iteration to sequentially determine the assignments of all the modified bits after the highest modified bit of the chip is determined, and the step of performing iteration is ended when the pre-modified value is greater than or equal to the first threshold and less than or equal to the second threshold, further includes: and when the pre-trimming value is greater than or equal to the first threshold and less than or equal to the second threshold, exiting the iteration step, endowing the pre-assignment to the current chip trimming bit, and endowing all the undetermined chip trimming bits after the current chip trimming bit to the first voltage value.
Preferably, the first threshold is equal to the target value minus a product of the target value and one half of the trimming weight corresponding to the chip least significant trimming bit; the second threshold is equal to the target value plus a product of the target value and one-half of the trimming weight corresponding to the chip least significant trimming bit.
Preferably, the highest trimming bit of the chip performs negative trimming on the voltage to be trimmed, and all the trimming bits after the highest trimming bit of the chip perform positive trimming on the voltage to be trimmed, wherein the absolute values of the trimming weights of all the trimming bits of the chip are sequentially decreased progressively, and the absolute value of the trimming weight corresponding to the highest trimming bit is greater than the absolute value of the trimming weight corresponding to the lowest trimming bit.
Preferably, the trimming method further includes: and setting a key, and assigning values to the trimming positions of the chip under the condition that the key is effective.
The invention has the beneficial effects that: the invention discloses a method for modifying chip voltage, which comprises the steps of judging the relation between an initial value and a target value range of the voltage to be modified after obtaining the initial value and the target value range of the voltage to be modified, directly determining the assignment of all modifying positions of a chip when the initial value of the voltage to be modified falls in the target value range, determining the assignment of the highest modifying position of the chip based on the boundary (corresponding to a first threshold and a second threshold) of the target value range when the initial value of the voltage to be modified falls out of the target value range, then pre-assigning the next modifying position of the determined modifying positions of the chip, obtaining the pre-modifying value of the voltage to be modified according to the assignment and the pre-assignment of the determined modifying positions, determining the assignment of the current modifying position of the chip according to the relation between the pre-modifying value and the target value range, and iteratively executing the pre-assigning of the next modifying position, the assignment of all trimming positions of the chip is sequentially determined according to the successive approximation principle from high position to low position (weight value is from high position to low position), and then the assignment of each trimming position can be adjusted in real time according to different initial voltages of the chip and different trimming position weights, so that high-precision trimming of the voltage to be trimmed is realized, the influence on product precision caused by the change of the weight of each trimming position due to mass production test is avoided, the trimming precision can still meet the requirement during mass production operation, and the product yield is improved. Meanwhile, after each iteration operation, the relationship between the pre-trimming value and the target value range is judged, so that the iteration operation can be stopped in time and all the assignments of the trimming positions to be trimmed can be directly determined when the pre-trimming value meets the target value range (namely is greater than or equal to the first threshold and less than or equal to the second threshold), the trimming processing with the minimum steps can be carried out on the difference values of the initial values and the target values of different voltages to be trimmed, further, the operation resources are saved, the execution of unnecessary operation is avoided, the trimming time is shortened, and the trimming efficiency during the chip volume production test is improved.
When the next trimming position of the determined chip trimming position is pre-assigned, a second voltage value effective for trimming the voltage to be trimmed is given to the current trimming position (namely the next trimming position of the determined chip trimming position), the assignment of the high-position trimming position can be more accurately judged under the condition that the assignment of the low-position trimming position is uncertain, the fault tolerance rate caused by irreversible trimming during successive approximation is further reduced, and the trimming quality during the chip volume production test is improved.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention, as claimed.
Drawings
The above and other objects, features and advantages of the present invention will become more apparent from the following description of the embodiments of the present invention with reference to the accompanying drawings.
Fig. 1 is a schematic flow chart illustrating a trimming method for a chip voltage according to the related art;
fig. 2 is a schematic flow chart illustrating a method for trimming a chip voltage according to an embodiment of the present invention;
fig. 3 is a schematic diagram illustrating a trimming timing diagram of a chip voltage according to an embodiment of the invention.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. The invention may, however, be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention.
The present invention will be described in detail below with reference to the accompanying drawings.
Fig. 2 is a schematic flow chart illustrating a method for trimming a chip voltage according to an embodiment of the present invention, and fig. 3 is a schematic timing diagram illustrating a timing sequence for trimming a chip voltage according to an embodiment of the present invention.
In the field of integrated circuits, due to the influence of the distribution of the process, parameters of produced chips have certain deviation, and in the application with the requirement on the parameter precision, a trimming method is needed to reduce the influence of the parameter distribution and improve the consistency of the parameter precision so as to meet the application requirement. Currently, the known trimming means mainly include electrical trimming, laser trimming, eFuse or EEROM code writing trimming.
In code trimming, as an exemplary embodiment, referring to fig. 3, Vin represents a power voltage, TM represents a key for entering the trimming mode of the chip, EN represents an enable signal of the trimming call, and b0-b4 sequentially represent five trimming bits from the highest bit to the lowest bit (it is understood that the representation of the five trimming bits is only exemplary, and the number of the trimming bits may be other numbers, which is not limited by the present invention). The enable signal EN is used to control the chip to enter a code writing state or a burning state, that is, when the enable signal EN is in a first level state V1 (for example, 2.5V), the chip can be controlled to enter the code writing state, and at this time, the chip writes the assignment of the current trimming bit into the program; when the enable signal EN is in the second level state V2 (for example, 5V), the chip can be controlled to enter the burning state, and at this time, the chip directly burns the current trimming position, so that the trimming weight corresponding to the current trimming position trims the chip voltage (i.e., the voltage to be trimmed by the chip), and the trimming is irreversible. Furthermore, each time a new trimming bit is written, the influence of the previous trimming weight on the voltage to be trimmed is refreshed.
As shown in fig. 2 and referring to fig. 3, it can be seen that in the present embodiment, the method for trimming the chip voltage includes the following steps:
in step S11, an initial value of the voltage to be trimmed is acquired.
After the chip is powered on, the initial value of the voltage to be trimmed of the chip is obtained through testing of the measuring device.
In step S12, a first threshold and a second threshold are obtained based on the trimming weight corresponding to the least significant trimming bit of the chip and the target value of the voltage to be trimmed.
When the voltage to be repaired is repaired, the voltage to be repaired is repaired based on a plurality of repairing and adjusting positions, in the plurality of repairing and adjusting positions, the repairing and adjusting weight corresponding to each repairing and adjusting position is different, specifically, the highest repairing and adjusting position of the chip corresponds to the voltage to be repaired and is used for performing negative repairing and adjusting, and all the repairing and adjusting positions after the highest repairing and adjusting position of the chip correspond to the voltage to be repaired and are used for performing positive repairing and adjusting. And the absolute values of the modification weights of all the modification positions of the chip are sequentially decreased, and the absolute value of the modification weight corresponding to the highest modification position is greater than the absolute value of the modification weight corresponding to the lowest modification position. And then can realize the accurate adjustment to the voltage of waiting to adjust of various different deviations.
Further, in the process of trimming the voltage to be trimmed, as long as the trimmed voltage value falls within the positive and negative half of the minimum effective trimming bit of the target value, the trimming can be approximately regarded as successful. This can result in: the first threshold value is equal to the target value of the voltage to be modified minus the product of the target value and one half of the modification weight corresponding to the lowest effective modification position of the chip, and the second threshold value is equal to the product of the target value of the voltage to be modified plus the product of the target value and one half of the modification weight corresponding to the lowest effective modification position of the chip. And the voltage range corresponding to the first threshold value which is more than or equal to the first threshold value and less than or equal to the second threshold value is the target value range of the voltage to be modified.
In step S13, the voltage range in which the initial value is located is determined based on the first threshold value and the second threshold value.
After the first threshold and the second threshold are obtained, a voltage range in which an initial value of the voltage to be trimmed is located may be determined according to the obtained first threshold and the obtained second threshold, and the subsequent steps may be further selected and executed according to the voltage range in which the initial value of the voltage to be trimmed is located.
Specifically, when the initial value of the voltage to be modified is greater than or equal to the first threshold and less than or equal to the second threshold, step S14 is executed; and when the initial value of the voltage to be trimmed is smaller than the first threshold or larger than the second threshold, executing the steps S15 to S18.
In step S14, assignments of all trimming bits of the chip are directly determined, and the determined assignments of all trimming bits of the chip are burned into the chip, and a final value of the voltage to be trimmed is obtained through retesting.
In this embodiment, the value is assigned to one of the first voltage value and the second voltage value. The assignment of all of the trim bits of the chip is determined as determining whether each of the trim bits of the all of the trim bits of the chip is assigned the first voltage value or the second voltage value.
Further, when a certain trimming bit of the chip is endowed with a first voltage value, the trimming weight corresponding to the trimming bit is invalid for trimming the voltage to be trimmed; or when a certain trimming bit of the chip is endowed with a second voltage value, the trimming weight corresponding to the trimming bit is effective to trim the voltage to be trimmed.
If the initial value of the voltage to be trimmed is determined to be greater than or equal to the first threshold and less than or equal to the second threshold after the judgment, namely the initial value of the voltage to be trimmed is within the range of the positive and negative half minimum effective trimming positions of the target value, the current voltage to be trimmed meets the requirement, and no additional trimming is needed. At this time, all the trimming bits of the chip can be assigned with the first voltage value, and the trimming of the current chip voltage is finished.
In step S15, the assignment of the chip maximum trim bit is determined based on the voltage range in which the initial value is located.
If the initial value of the voltage to be trimmed is determined to be smaller than the first threshold or larger than the second threshold after judgment, namely the initial value of the voltage to be trimmed falls outside the positive and negative half minimum effective trimming position range of the target value, the current voltage to be trimmed does not meet the requirement, and additional trimming needs to be carried out.
Further, determining the assignment of the highest trim bit of the corresponding chip based on the voltage range in which the initial value is located includes: when an initial value (initial value for short) of the voltage to be modified is smaller than a first threshold value, giving the highest modification position of the chip to a first voltage value; or when the initial value is larger than the second threshold value, the highest trimming bit of the chip is endowed with a second voltage value.
When the initial value is smaller than the first threshold, the voltage to be modified is subjected to forward modification, and the highest modification bit of the chip is endowed with the first voltage value because the modification weight corresponding to the highest modification bit in all the modification bits of the chip is negative. And when the initial value is greater than the second threshold value, the negative trimming of the voltage to be trimmed is indicated, and as only the trimming weight corresponding to the highest trimming bit in all the trimming bits of the chip is negative, the highest trimming bit of the chip is assigned to the second voltage value.
In step S16, a pre-assignment is performed on the next trimming bit of the determined chip trimming bits, the assignment and the pre-assignment of the determined chip trimming bits are written into the chip, and a pre-trimming value of the voltage to be trimmed is obtained through testing.
In step S17, the voltage range in which the trimming value is located is determined based on the first threshold and the second threshold, and the assignment of the current trimming bit of the chip is determined based on the voltage range in which the trimming value is located.
In the plurality of trimming positions of the chip, when the highest trimming position or the highest trimming position and a plurality of trimming positions are assigned, pre-assigning the next trimming position of the plurality of determined trimming positions according to the sequence from the high position to the low position, writing the assigned value of the trimming position of the determined chip and the pre-assigned value into the chip, and predicting to obtain the pre-trimming value of the current voltage to be trimmed after trimming based on the determined trimming position through calculation.
Preferably, the pre-assigning the next trim bit of the determined chip trim bits comprises: assigning a next trimming bit of the determined chip trimming bits to the second voltage value. Therefore, the assignment of the high-order trimming bit can be more accurately judged under the condition that the assignment of the low-order trimming bit is uncertain, so that the fault tolerance rate caused by irreversible trimming during successive approximation is reduced, and the trimming quality during the chip volume production test is improved. For example, when a chip is tested in a batch test of a certain mass-produced chip, the trimming bits of the trimming system include five bits (corresponding to trimming weights of-20%, 10%, 5%, 2.5%, and 1.25%, respectively), and the initial value of the voltage to be trimmed of the chip is smaller than the first threshold corresponding to the target value range, so that the assignment of the highest trimming bit can be determined as the first voltage value (corresponding to binary code of 0). At this time, if the pre-assigned value assigned to the second trimming bit is the first voltage value, which is equivalent to that neither the highest trimming bit nor the second trimming bit trims the voltage to be trimmed (since the third trimming bit to the fifth trimming bit have not been turned around, the first voltage value is default to be assigned), and the pre-assigned value of the voltage to be trimmed is still smaller than the target value after the test, it should be determined that the pre-assigned value of the second trimming bit is not right at this time, the true assigned value of the second trimming bit is determined to be the second voltage value, that is, the trimming weight of the voltage to be trimmed is at least 10% at last, but if the actually required trimming weight of the voltage to be trimmed is 3% for example (the initial value is also smaller than the target value), the actual assigned value of the second trimming bit should be the first voltage value, which is contrary to the above-mentioned determination criterion, and trimming errors are easily caused, affecting the quality of the chip batch test structure. Especially, in the case that the determined trimming bit assignment is programmed into the chip after each determined one-bit trimming bit assignment (in this way, the current value of the voltage to be trimmed of the chip can be updated in real time, the subsequent calculation amount is reduced, and the influence of the subsequent trimming weight on the accuracy of the trimming result when the subsequent trimming weight changes with the batch change of the production is avoided), the influence is larger due to the irreversibility of trimming after programming. If the pre-assignment given to the second trimming bit is a second voltage value (namely, code 1), since the pre-assignment is not determined, burning is not performed, and after prediction calculation is performed according to the pre-assignment, if the pre-trimming value of the voltage to be trimmed is smaller than a first threshold corresponding to a target value range, it indicates that the trimming weight of the voltage to be trimmed is greater than or equal to 10%, and it is determined that the true assignment of the second trimming bit is the second voltage value; if the pre-trimming value of the voltage to be trimmed is larger than the second threshold corresponding to the target value range, the trimming weight of the voltage to be trimmed is less than 10%, and the true assignment of the second trimming bit can be determined to be the first voltage value.
It should be noted that, the above steps S16 and S17 are iterative steps that need to be executed circularly, and according to the same or similar principle as described above, the iterative steps are executed circularly to sequentially determine the assignments of all the trimming bits after the highest trimming bit of the chip is determined, until the obtained pre-trimming value is greater than or equal to the first threshold and less than or equal to the second threshold, the iterative steps are ended, and then step S18 is executed.
Further, when the obtained pre-trimming value is greater than or equal to the first threshold and less than or equal to the second threshold, it indicates that the trimming of the voltage to be trimmed has met the requirements, the remaining trimming positions do not need to trim the voltage to be trimmed, the iteration operation can no longer be performed, and only the pre-assignment is given to the current chip trimming position, and all the undetermined chip trimming positions after the current chip trimming position are given to the first voltage value. After each iteration operation, the relationship between the pre-trimming value and the target value range is judged, so that the iteration operation can be stopped in time and the assignment of all to-be-trimmed positions can be directly determined when the pre-trimming value meets the target value range (namely is greater than or equal to the first threshold and less than or equal to the second threshold), the trimming processing with the minimum steps can be carried out on the difference values of the initial values and the target values of different to-be-trimmed voltages, further, the operation resources are saved, the execution of unnecessary operation is avoided, the trimming time is shortened, and the trimming efficiency during the chip volume production test is improved.
In step S18, the determined highest trimming bit of the chip and the assigned values of all the trimming bits after the highest trimming bit are programmed into the chip, and the final value of the voltage to be trimmed is obtained by retesting.
After all the trimming bit assignments of the chip are determined, the highest trimming bit of the determined chip and all the assignment of the trimming bits after the highest trimming bit are burned to the chip (the burned trimming bits can not be burned again), and then the chip is tested to obtain the final value of the voltage to be trimmed. It is understood that if the chip meets the trimming requirement, the final value of the voltage to be trimmed, which is finally obtained, should be within the target value range.
Further, the trimming method further comprises the following steps: and setting a key, and assigning values to the trimming bits of the chip under the condition that the key is effective. The error trimming of the voltage to be trimmed on the chip can be effectively prevented.
For example, referring to fig. 3, when the chip needs to be test-trimmed, the power voltage Vin is set to a high voltage (power is applied to the chip), and then the secret key TM is set to a valid state. The target value of the voltage to be modified is assumed to be 25V. And the system for trimming the chip voltage comprises five trimming positions b0, b1, b2, b3 and b4, wherein the trimming position b0 is the highest trimming position, the trimming position b4 is the lowest trimming position, and the trimming weights corresponding to the five trimming positions are-20%, 10%, 5%, 2.5% and 1.25% in sequence. Further, it can be known that the target value range of the voltage to be modified is 24.84375 (corresponding to the first threshold) to 25.15625 (corresponding to the second threshold). Then, the initial value of the voltage to be trimmed obtained by the test is 22.16V. Since 22.16V is less than the first threshold 24.84375V corresponding to the target value range, the assignment of the highest trim bit b0 may be determined to be the first voltage value. And then, a second voltage value is pre-assigned to the trimming bit b1, the enable signal EN at the moment is controlled to be in a first level state V1, the assignment values of the trimming bit b0 and the trimming bit b1 are written into a chip program, and the pre-trimming value of the voltage to be trimmed at the moment is 24.376V after prediction calculation. Since 24.376V is still smaller than the first threshold 24.84375V corresponding to the target value range, the actual assignment of the trimming bit b1 can be determined as the second voltage value, and the control enable signal EN is changed to the second level state V2 to program the assignments of the trimming bits b0-b1 to the chip. And then, a second voltage value is pre-assigned to the trimming bit b2, the enable signal EN at the moment is controlled to be in a first level state V1, the assignment of the trimming bit b2 is written into a chip program, and the pre-trimming value of the voltage to be trimmed at the moment is 25.484V after prediction calculation. Since 25.484V is greater than the second threshold 25.15625V corresponding to the target value range, it can be determined that the actual value of trim bit b2 should be the first voltage value. And then, a second voltage value is pre-assigned to the trimming bit b3, the enable signal EN at the moment is controlled to be in a first level state V1, the assignment of the trimming bit b3 is written into a chip program, and the pre-trimming value of the voltage to be trimmed at the moment is 24.93V after prediction calculation. Since 24.93V falls within the target value range, the actual value of trim bit b3 may be determined to be the second voltage value, while the actual value of trim bit b4 may also be determined to be the first voltage value. At this time, the control enable signal EN is changed into a second level state V2, so that the corresponding assignments of the trimming bits b0-b4 are burned into the chip, and the final value of the voltage to be trimmed of the chip is tested again to obtain 24.93V. When the burned trimming bit is a first voltage value, the trimming weight corresponding to the trimming bit is invalid for trimming the voltage to be trimmed, when the burned trimming bit is a second voltage value, the trimming weight corresponding to the trimming bit is valid for trimming the voltage to be trimmed, and the first voltage value is smaller than the second voltage value.
In summary, the present invention determines directly the assignment of all trimming bits of the chip by judging the relationship between the initial value of the voltage to be trimmed and the target value range after obtaining the initial value and the target value range of the voltage to be trimmed, and determines the assignment of the highest trimming bit of the chip based on the boundary (corresponding to the first threshold and the second threshold) of the target value range when the initial value of the voltage to be trimmed falls outside the target value range, then pre-assigns the next trimming bit of the determined trimming bits of the chip, and obtains the pre-trimming value of the voltage to be trimmed according to the assignment and the pre-assignment of the determined trimming bits, and determines the assignment of the current trimming bit of the chip according to the relationship between the pre-trimming value and the target value range, and iteratively executes the pre-assignment of the next trimming bit, so as to sequentially determine the assignments of all trimming bits of the chip by the principle of successive approximation from high to low (high weight value to low weight value), and then the assignment of each trimming position can be adjusted in real time according to different initial voltages and different trimming position weights of the chip, so that high-precision trimming of the voltage to be trimmed is realized, the influence on the product precision due to the change of the weight of each trimming position caused by mass production test is avoided, the requirement on the trimming precision can be still met during mass production operation, and the product yield is improved. Meanwhile, after each iteration operation, the relationship between the pre-trimming value and the target value range is judged, so that the iteration operation can be stopped in time and all the assignments of the trimming positions to be trimmed can be directly determined when the pre-trimming value meets the target value range (namely is greater than or equal to the first threshold and less than or equal to the second threshold), the trimming processing with the minimum steps can be carried out on the difference values of the initial values and the target values of different voltages to be trimmed, further, the operation resources are saved, the execution of unnecessary operation is avoided, the trimming time is shortened, and the trimming efficiency during the chip volume production test is improved.
When the next trimming position of the determined chip trimming position is pre-assigned, a second voltage value effective for trimming the voltage to be trimmed is given to the current trimming position (namely the next trimming position of the determined chip trimming position), the assignment of the high-position trimming position can be more accurately judged under the condition that the assignment of the low-position trimming position is uncertain, the fault tolerance rate caused by irreversible trimming during successive approximation is further reduced, and the trimming quality during the chip volume production test is improved.
It should be noted that, in this document, the contained terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Finally, it should be noted that: it should be understood that the above examples are only for clearly illustrating the present invention and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications of the invention may be made without departing from the scope of the invention.
Claims (10)
1. A method for trimming chip voltage is characterized by comprising the following steps:
acquiring an initial value of a voltage to be modified;
obtaining a first threshold value and a second threshold value based on the trimming weight corresponding to the lowest effective trimming bit of the chip and the target value of the voltage to be trimmed;
judging the voltage range of the initial value based on the first threshold value and the second threshold value;
when the initial value is greater than or equal to the first threshold and less than or equal to the second threshold, directly determining the assignment of all trimming bits of the chip, burning the determined assignment of all trimming bits of the chip to the chip, and retesting to obtain the final value of the voltage to be trimmed, or
When the initial value is smaller than the first threshold or larger than the second threshold, performing the following steps:
determining the assignment of the highest trimming bit of the chip based on the voltage range of the initial value;
executing the iteration step until the pre-trimming value is greater than or equal to the first threshold and less than or equal to the second threshold, and ending the execution of the iteration step to sequentially determine the assignment of all trimming bits after the highest trimming bit of the chip;
burning the determined highest trimming bit of the chip and the assignment of all the trimming bits after the highest trimming bit to the chip, retesting to obtain the final value of the voltage to be trimmed,
wherein the step of iterating comprises:
pre-assigning the next trimming position of the determined chip trimming positions, writing the assignment of the determined chip trimming positions and the pre-assignment into a chip, and testing to obtain the pre-trimming value of the voltage to be trimmed;
and judging the voltage range of the pre-trimming value based on the first threshold and the second threshold, and determining the assignment of the current trimming bit of the chip based on the voltage range of the pre-trimming value.
2. The trimming method according to claim 1, wherein the assignment is to assign one of a first voltage value and a second voltage value,
when a certain trimming bit of the chip is endowed with the first voltage value, the trimming weight corresponding to the trimming bit is invalid for trimming the voltage to be trimmed; or
When a certain trimming bit of the chip is endowed with the second voltage value, the trimming weight corresponding to the trimming bit is effective to trim the voltage to be trimmed.
3. The trimming method according to claim 2, wherein when the initial value is greater than or equal to the first threshold and less than or equal to the second threshold, directly determining the assignment of all trimming bits of the chip comprises:
and when the initial value is greater than or equal to the first threshold value and less than or equal to the second threshold value, all trimming bits of the chip are endowed with the first voltage value.
4. The trimming method according to claim 2, wherein determining the assignment of the highest trimming bit of the corresponding chip based on the voltage range in which the initial value is located comprises:
when the initial value is smaller than the first threshold value, giving the highest trimming bit of the chip to the first voltage value; or
And when the initial value is larger than the second threshold value, giving the highest trimming bit of the chip to the second voltage value.
5. The trimming method according to claim 2, wherein pre-assigning a next trimming bit of the determined chip trimming bits comprises:
assigning a next trimming bit of the determined chip trimming bits to the second voltage value.
6. The trimming method according to claim 5, wherein the step of determining the voltage range of the pre-trimming value based on the first threshold and the second threshold, and the step of determining the assignment of the current trimming bit of the chip based on the voltage range of the pre-trimming value comprises:
when the pre-trimming value is smaller than the first threshold value, the current trimming position of the chip is endowed with the second voltage value; or
And when the pre-trimming value is larger than the second threshold value, giving the current trimming position of the chip to the first voltage value.
7. The trimming method according to claim 5, wherein the step of performing iteration to determine the assignments of all trimming bits after the highest trimming bit of the chip in turn, and ending the step of performing iteration when the pre-trimming value is greater than or equal to the first threshold and less than or equal to the second threshold further comprises:
and when the pre-trimming value is greater than or equal to the first threshold and less than or equal to the second threshold, exiting the iteration step, endowing the pre-assignment to the current chip trimming bit, and endowing all the undetermined chip trimming bits after the current chip trimming bit to the first voltage value.
8. The trimming method according to any one of claims 1, 3, 4, 6 and 7, wherein the first threshold value is equal to the target value minus a product of the target value and one half of the trimming weight corresponding to the chip least significant trimming bit;
the second threshold is equal to the target value plus a product of the target value and one-half of the trimming weight corresponding to the chip least significant trimming bit.
9. The trimming method according to claim 1, wherein the highest trimming bit of the chip corresponds to the negative trimming of the voltage to be trimmed, and all the trimming bits after the highest trimming bit of the chip correspond to the positive trimming of the voltage to be trimmed,
the absolute values of the modification weights of all the modification positions of the chip are sequentially decreased, and the absolute value of the modification weight corresponding to the highest modification position is larger than the absolute value of the modification weight corresponding to the lowest modification position.
10. The trimming method according to claim 1, further comprising:
and setting a key, and assigning values to the trimming positions of the chip under the condition that the key is effective.
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