CN113704152A - PCIe slot interface switching equipment, test equipment, system and method - Google Patents
PCIe slot interface switching equipment, test equipment, system and method Download PDFInfo
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
- G06F13/382—Information transfer, e.g. on bus using universal interface adapter
- G06F13/385—Information transfer, e.g. on bus using universal interface adapter for adaptation of a particular data processing system to different peripheral devices
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2213/00—Indexing scheme relating to interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F2213/0026—PCI express
Abstract
The embodiment of the application provides PCIe slot interface switching equipment, test equipment, a test system and a test method, wherein the switching equipment comprises a golden finger interface with a first designated bandwidth and a PCIe slot interface with a second designated bandwidth, the second designated bandwidth is not less than the first designated bandwidth, and a first end of the golden finger interface with the first designated bandwidth is connected with a first end of the PCIe slot interface with the second designated bandwidth, wherein: the second end of the golden finger interface with the first appointed bandwidth is used for being connected with a to-be-tested PCIe slot interface with the set bandwidth as the first appointed bandwidth; the second end of the PCIe slot interface with the second specified bandwidth is used for being connected with a golden finger interface of the PCIe test card; the golden finger interface of the PCIe test card has a second specified bandwidth and a specified speed, and the specified speed is not less than the set speed of the PCIe slot interface to be tested. Thus, the test cost can be reduced.
Description
Technical Field
The present application relates to the field of computer technologies, and in particular, to a PCIe slot interface adapter device, a test device, a system, and a method.
Background
With the rapid development of computer hardware technology, a server may include a plurality of boards, each board may be provided with a plurality of PCIe (Peripheral Component Interconnect Express) slot interfaces, and the PCIe slot interfaces are used to connect PCIe devices such as a video card and a network card. The PCIe slot interface generally has a fixed bandwidth and rate, the bandwidth of the PCIe slot interface may be represented by the number of lanes (Lane) of the PCIe slot interface, and the number of lanes may be 1, 2, 4, 8, 16, or 32, for example, X1 represents a bandwidth corresponding to 1 Lane, X2 represents a bandwidth corresponding to 2 lanes, and X4 represents a bandwidth corresponding to 4 lanes. The rate of the PCIe slot interface may be expressed in GEN (Generation) of PCIe protocol, which may be, for example, GEN1, GEN2, GEN3, GEN4 or GEN5, GEN1 represents a rate of 2.5GT/s for 1 channel, and GEN2 represents a rate of 5.0GT/s for 1 channel.
In addition, after the board card is manufactured, the PCIe test card including the gold finger interface having the same set bandwidth and rate as the PCIe slot interface may be used to test the PCIe slot interface in the board card. For example, for a PCIe slot interface to be tested with a set bandwidth of X4 and a set rate of GEN3, a PCIe test card including a gold finger interface with a bandwidth of X4 and a rate of GEN3 may be inserted into the PCIe slot interface to be tested, and then, after the board is powered on, the board may determine, through the PCIe slot interface to be tested and the PCIe test card, a bandwidth and a rate at which the PCIe slot interface to be tested is connected to the gold finger interface based on a PCIe protocol, the determined bandwidth and rate of connection are respectively the maximum bandwidth and the maximum rate supported by the PCIe slot interface to be tested and the gold finger interface, and then, the determined bandwidth and rate may be compared with the maximum bandwidth and the maximum rate supported by the PCIe slot interface to be tested, and if the determined bandwidth and the maximum rate are consistent, it is indicated that the PCIe slot interface to be tested is qualified.
Therefore, in the related art, when a plurality of PCIe slot interfaces of different specifications need to be tested, a plurality of corresponding PCIe test cards of different specifications are needed, and the test cost is relatively high.
Disclosure of Invention
An object of the embodiments of the present application is to provide a PCIe slot interface adapter device, a test device, a system, and a method, which can reduce test cost. The specific technical scheme is as follows:
in a first aspect, in order to achieve the above object, an embodiment of the present application discloses a PCIe slot interface switching device, where the switching device includes a gold finger interface with a first specified bandwidth and a PCIe slot interface with a second specified bandwidth, where the second specified bandwidth is not less than the first specified bandwidth, and a first end of the gold finger interface with the first specified bandwidth is connected to a first end of the PCIe slot interface with the second specified bandwidth, where:
the second end of the golden finger interface with the first appointed bandwidth is used for being connected with a PCIe slot interface to be tested, the set bandwidth of which is the first appointed bandwidth;
the second end of the PCIe slot interface with the second specified bandwidth is used for being connected with a golden finger interface of a PCIe test card; the golden finger interface of the PCIe test card has the second designated bandwidth and a designated rate, and the designated rate is not less than the set rate of the PCIe slot interface to be tested.
Optionally, the first end of the gold finger interface with the first specified bandwidth is connected to the channel with the first specified bandwidth in the PCIe slot interface with the second specified bandwidth.
Optionally, the first specified bandwidth is a bandwidth corresponding to 8 channels, and the second specified bandwidth is a bandwidth corresponding to 16 channels; alternatively, the first and second electrodes may be,
the first specified bandwidth is a bandwidth corresponding to 4 channels, and the second specified bandwidth is a bandwidth corresponding to 16 channels.
In a second aspect, to achieve the above object, an embodiment of the present application discloses a PCIe slot interface test device, including: the switching device according to the first aspect, and a PCIe test card, where a golden finger interface of the PCIe test card has a second specified bandwidth and a specified rate, the second specified bandwidth is not less than a set bandwidth of a PCIe slot interface to be tested, and the specified rate is not less than a set rate of the PCIe slot interface to be tested;
and the second end of the PCIe slot interface with the second specified bandwidth in the switching equipment is connected with the golden finger interface of the PCIe test card.
In order to achieve the above object, an embodiment of the present application discloses a PCIe slot interface test system, including: the test equipment according to the second aspect and the board card to be tested having the PCIe slot interface to be tested, where the set bandwidth of the PCIe slot interface to be tested is the first designated bandwidth;
and the second end of the golden finger interface with the first specified bandwidth of the switching equipment in the test equipment is connected with the PCIe slot interface to be tested.
Optionally, the board card to be tested is connected with the user terminal through a serial port.
In a fourth aspect, in order to achieve the above object, an embodiment of the present application discloses a PCIe slot interface test method, where the method is applied to a board to be tested having a to-be-tested PCIe slot interface, and a set bandwidth of the to-be-tested PCIe slot interface is a first specified bandwidth; the PCIe slot interface to be tested is connected with the second end of the golden finger interface with the first appointed bandwidth in the switching equipment, the first end of the golden finger interface with the first appointed bandwidth is connected with the first end of the PCIe slot interface with the second appointed bandwidth in the switching equipment, and the second appointed bandwidth is not less than the first appointed bandwidth; the second end of the PCIe slot interface with the second specified bandwidth is connected with a golden finger interface of a PCIe test card, the golden finger interface of the PCIe test card has the second specified bandwidth and a specified rate, and the specified rate is not less than the set rate of the PCIe slot interface to be tested, and the method comprises the following steps:
determining the bandwidth and the speed of the connection of the PCIe slot interface to be tested and the golden finger interface of the PCIe test card based on a PCIe protocol and the PCIe test card;
and determining a test result of the PCIe slot interface to be tested based on the determined bandwidth and speed of the connection and a comparison result of the set bandwidth and speed of the PCIe slot interface to be tested.
Optionally, the board card to be tested is connected with the user terminal through a serial port;
after the determining the test result for the PCIe slot interface to be tested, the method further comprises:
and uploading the test result of the PCIe slot interface to be tested to the user terminal through the serial port.
Optionally, the test result includes the determined bandwidth and rate of the connection, and the set bandwidth and rate of the PCIe slot interface to be tested.
Optionally, the determining a test result of the PCIe slot interface to be tested based on the comparison result between the determined bandwidth and speed of the connection and the set bandwidth and speed of the PCIe slot interface to be tested includes:
if the determined connection bandwidth is the same as the set bandwidth of the PCIe slot interface to be tested, and the determined connection speed is the same as the set speed of the PCIe slot interface to be tested, determining that the PCIe slot interface to be tested is qualified;
and if the determined connection bandwidth is different from the set bandwidth of the PCIe slot interface to be tested, and/or the determined connection rate is different from the set rate of the PCIe slot interface to be tested, determining that the PCIe slot interface to be tested is unqualified.
The embodiment of the application provides a PCIe slot interface switching equipment, switching equipment includes the golden finger interface of first appointed bandwidth and the PCIe slot interface of second appointed bandwidth, and the second appointed bandwidth is not less than first appointed bandwidth, and the first end of the golden finger interface of first appointed bandwidth is connected with the first end of the PCIe slot interface of second appointed bandwidth, wherein: the second end of the golden finger interface with the first appointed bandwidth is used for being connected with a to-be-tested PCIe slot interface with the set bandwidth as the first appointed bandwidth; the second end of the PCIe slot interface with the second specified bandwidth is used for being connected with a golden finger interface of the PCIe test card; the golden finger interface of the PCIe test card has a second specified bandwidth and a specified speed, and the specified speed is not less than the set speed of the PCIe slot interface to be tested.
It can be seen that, based on the PCIe slot interface transfer device provided in the embodiment of the present application, the PCIe slot interface to be tested can be connected to the PCIe test card, and since the bandwidth and the speed of the gold finger interface of the PCIe test card are not less than the set bandwidth and the set speed of the PCIe slot interface to be tested, respectively, after the board card where the PCIe slot interface to be tested is located is powered on, the board card can test the PCIe slot interface to be tested through the bandwidth and the speed of the connection of the PCIe slot interface to be tested and the PCIe test card determined based on the PCIe protocol, which are the maximum bandwidth and the maximum speed actually supported by the PCIe slot interface to be tested, and based on the PCIe slot interface transfer devices of different specifications, the same PCIe test card can be connected to PCIe slot interfaces to be tested of different specifications, and then, one PCIe test card can be used to test a plurality of PCIe slot interfaces to be tested of different specifications, the test cost can be reduced.
Of course, not all advantages described above need to be achieved at the same time in the practice of any one product or method of the present application.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a structural diagram of a PCIe slot interface adapter device according to an embodiment of the present application;
fig. 2 is a structural diagram of a PCIe slot interface test device according to an embodiment of the present application;
fig. 3 is a structural diagram of a PCIe slot interface test system according to an embodiment of the present application;
fig. 4 is a flowchart of a PCIe slot interface test method according to an embodiment of the present application;
fig. 5 is a flowchart illustrating testing a PCIe slot interface according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the prior art, a PCIe test card may be used to test a PCIe slot interface to be tested, and the bandwidth and the rate of the gold finger interface in the PCIe test card are respectively consistent with the set bandwidth and the set rate of the PCIe slot interface to be tested, so that when a plurality of PCIe slot interfaces of different specifications need to be tested, a corresponding plurality of PCIe test cards of different specifications are needed, and the test cost may be increased.
In order to solve the foregoing problem, an embodiment of the present application provides a PCIe slot interface switching device, where the PCIe slot interface switching device includes a gold finger interface with a first specified bandwidth and a PCIe slot interface with a second specified bandwidth, where the second specified bandwidth is not less than the first specified bandwidth, and a first end of the gold finger interface with the first specified bandwidth is connected to a first end of the PCIe slot interface with the second specified bandwidth, where:
the second end of the golden finger interface with the first appointed bandwidth is used for being connected with a to-be-tested PCIe slot interface with the set bandwidth as the first appointed bandwidth;
the second end of the PCIe slot interface with the second specified bandwidth is used for being connected with a golden finger interface of the PCIe test card; the golden finger interface of the PCIe test card has a second specified bandwidth and a specified speed, and the specified speed is not less than the set speed of the PCIe slot interface to be tested.
As can be seen from the above, the PCIe slot interface transfer device provided in the embodiment of the present application can implement that the PCIe slot interface to be tested is connected to the PCIe test card, and since the bandwidth and the speed of the gold finger interface of the PCIe test card are not less than the set bandwidth and the set speed of the PCIe slot interface to be tested, respectively, after the board card on which the PCIe slot interface to be tested is located is powered on, the board card is connected to the PCIe test card through the PCIe slot interface to be tested and based on the bandwidth and the speed determined by the PCIe protocol, and are the maximum bandwidth and the maximum speed actually supported by the PCIe slot interface to be tested, respectively, the test on the PCIe slot interface to be tested can be implemented, and based on PCIe slot interface transfer devices of different specifications, the same PCIe test card can be connected to PCIe slot interfaces of different specifications, and then, using one PCIe test card, the PCIe slot interfaces to be tested of different specifications can be tested, the test cost can be reduced.
The PCIe slot interface adapter device provided in the embodiments of the present application will be described in detail through specific embodiments.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a PCIe slot interface switching device according to an embodiment of the present application, where the PCIe slot interface switching device includes a golden finger interface with a first specified bandwidth and a PCIe slot interface with a second specified bandwidth, where the second specified bandwidth is not less than the first specified bandwidth, and a first end of the golden finger interface with the first specified bandwidth is connected to a first end of the PCIe slot interface with the second specified bandwidth, where:
and the second end of the golden finger interface with the first appointed bandwidth is used for being connected with a PCIe slot interface to be tested, the set bandwidth of which is the first appointed bandwidth.
In this embodiment of the application, the board card where the PCIe slot interface to be tested is located may be referred to as a board card to be tested.
The first end of the gold finger interface with the first specified bandwidth may be physically one end of a channel in the gold finger interface with the first specified bandwidth, and correspondingly, the second end of the gold finger interface with the first specified bandwidth may be physically the other end of the channel in the gold finger interface with the first specified bandwidth.
The first end of the PCIe slot interface with the second specified bandwidth may be physically one end of the channel in the PCIe slot interface with the second specified bandwidth, and correspondingly, the second end of the PCIe slot interface with the second specified bandwidth may be physically the other end of the channel in the PCIe slot interface with the second specified bandwidth.
The set bandwidth and rate of the PCIe slot interface to be tested is determined by its manufacturing process. The set bandwidth of the PCIe slot interface to be tested may be X1, X2, X4, X8, X16, or X32. The set rate for the PCIe slot interface to be tested may be GEN1, GEN2, GEN3, GEN4, or GEN 5. For example, if the board to be tested is a board in the server, the set bandwidth of the PCIe slot interface to be tested may be X16 at most.
Because the bandwidth (namely the first appointed bandwidth) of the golden finger interface of the PCIe slot interface switching equipment is the same as the set bandwidth of the PCIe slot interface to be tested, namely, the number of channels contained in the golden finger interface of the PCIe slot interface switching equipment is the same as the number of channels contained in the PCIe slot interface to be tested, the PCIe slot interface switching equipment can be directly inserted into the PCIe slot interface to be tested of the board card to be tested through the second end of the golden finger interface of the PCIe slot interface switching equipment, so that the channels contained in the golden finger interface of the PCIe slot interface switching equipment are connected with the channels contained in the PCIe slot interface to be tested, and further, the second end of the golden finger interface of the PCIe slot interface switching equipment is connected with the PCIe slot interface to be tested.
And the second end of the PCIe slot interface with the second specified bandwidth is used for being connected with the golden finger interface of the PCIe test card.
The golden finger interface of the PCIe test card has a second specified bandwidth and a specified speed, and the specified speed is not less than the set speed of the PCIe slot interface to be tested.
In this embodiment of the application, since the bandwidth of the PCIe slot interface adapter device (i.e., the second specified bandwidth) is the same as the bandwidth of the golden finger interface of the PCIe test card, i.e., the number of channels included in the PCIe slot interface of the PCIe slot interface adapter device is the same as the number of channels included in the golden finger interface of the PCIe test card, the PCIe test card can be directly inserted into the PCIe slot interface of the PCIe slot interface adapter device through the golden finger interface thereof, so that the channels included in the PCIe slot interface of the PCIe slot interface adapter device are connected to the channels included in the golden finger interface of the PCIe test card, and further, the second end of the PCIe slot interface adapter device is connected to the golden finger interface of the PCIe test card.
After the board card to be tested is powered on, the board card to be tested can determine the bandwidth and the speed of connection with the PCIe test card based on a PCIe protocol through the PCIe slot interface to be tested, the determined bandwidth is the maximum bandwidth supported by both the PCIe slot interface to be tested and the golden finger interface of the PCIe test card, and the determined speed is the maximum speed supported by both the PCIe slot interface to be tested and the golden finger interface of the PCIe test card. It can be understood that, because the bandwidth and the speed of the gold finger interface of the PCIe test card are not less than the set bandwidth and speed of the PCIe slot interface to be tested, respectively, the bandwidth determined based on the PCIe protocol is the maximum bandwidth actually supported by the PCIe slot interface to be tested, and the determined speed is the maximum speed actually supported by the PCIe slot interface to be tested.
Further, a test result of the PCIe slot interface to be tested may be determined based on the determined bandwidth and rate of the connection and a comparison result of the set bandwidth and rate of the PCIe slot interface to be tested.
If the maximum bandwidth and the maximum speed actually supported by the PCIe slot interface to be tested are consistent with the set bandwidth and speed of the PCIe slot interface to be tested, the PCIe slot interface to be tested is qualified, otherwise, the PCIe slot interface to be tested is unqualified.
It can be seen that, based on the PCIe slot interface transfer device provided in the embodiment of the present application, the PCIe slot interface to be tested can be connected to the PCIe test card, and since the bandwidth and the speed of the gold finger interface of the PCIe test card are not less than the set bandwidth and the set speed of the PCIe slot interface to be tested, respectively, after the board card where the PCIe slot interface to be tested is located is powered on, the board card can test the PCIe slot interface to be tested through the bandwidth and the speed of the connection of the PCIe slot interface to be tested and the PCIe test card determined based on the PCIe protocol, which are the maximum bandwidth and the maximum speed actually supported by the PCIe slot interface to be tested, and based on the PCIe slot interface transfer devices of different specifications, the same PCIe test card can be connected to PCIe slot interfaces to be tested of different specifications, and then, one PCIe test card can be used to test a plurality of PCIe slot interfaces to be tested of different specifications, the test cost can be reduced.
Optionally, the first specified bandwidth is a bandwidth corresponding to 8 channels, that is, the first specified bandwidth is X8, and the second specified bandwidth is a bandwidth corresponding to 16 channels, that is, the second specified bandwidth is X16.
For example, the designated rate is GEN5, the set rate of the PCIe slot interface to be tested is GEN2, and accordingly, the bandwidth of the gold finger interface of the PCIe slot interface adaptor device is X8, the bandwidth of the PCIe slot interface adaptor device is X16, the bandwidth of the gold finger interface of the PCIe test card is also X16, and the rate is GEN 5.
Correspondingly, if the PCIe protocol is based on, the bandwidth of the determined connection is X8, and the rate is GEN2, which indicates that the PCIe slot interface to be tested is qualified. Accordingly, if the determined bandwidth of the connection is less than X8, and/or the determined rate of the connection is less than GEN2, it indicates that the PCIe slot interface to be tested is not eligible.
Optionally, the first specified bandwidth is a bandwidth corresponding to 4 channels, that is, the first specified bandwidth is X4, and the second specified bandwidth is a bandwidth corresponding to 16 channels, that is, the second specified bandwidth is X16.
For example, the designated rate is GEN4, the set rate of the PCIe slot interface to be tested is GEN3, and accordingly, the bandwidth of the gold finger interface of the PCIe slot interface adaptor device is X4, the bandwidth of the PCIe slot interface adaptor device is X16, the bandwidth of the gold finger interface of the PCIe test card is also X16, and the rate is GEN 4.
Correspondingly, if the PCIe protocol is based on, the bandwidth of the determined connection is X4, and the rate is GEN3, which indicates that the PCIe slot interface to be tested is qualified. Accordingly, if the determined bandwidth of the connection is less than X4, and/or the determined rate of the connection is less than GEN3, it indicates that the PCIe slot interface to be tested is not eligible.
Optionally, the first end of the gold finger interface with the first specified bandwidth is connected to the channel with the first specified bandwidth in the PCIe slot interface with the second specified bandwidth.
In this embodiment of the application, since the bandwidth (i.e., the first designated bandwidth) of the gold finger interface of the PCIe slot interface adapter device is not greater than the second designated bandwidth, i.e., the number of channels included in the gold finger interface of the PCIe slot interface adapter device is not greater than the number of channels included in the PCIe slot interface of the PCIe slot interface adapter device, the first end of the gold finger interface of the PCIe slot interface adapter device may be connected to the channel of the first designated bandwidth in the PCIe slot interface.
For example, if the bandwidth of the gold finger interface of the PCIe slot interface adapter device is X8 and the bandwidth of the PCIe slot interface adapter device is X16, the first end of the gold finger interface may be connected to 8 lanes of the 16 lanes included in the PCIe slot interface.
Referring to fig. 2, fig. 2 is a structural diagram of a PCIe slot interface test device according to an embodiment of the present application.
The PCIe slot interface test device includes the PCIe slot interface transfer device in any of the above embodiments, and a PCIe test card, where a gold finger interface of the PCIe test card has a second specified bandwidth and a specified rate, the second specified bandwidth is not less than a set bandwidth of the PCIe slot interface to be tested, and the specified rate is not less than a set rate of the PCIe slot interface to be tested;
and the second end of the PCIe slot interface with the second specified bandwidth in the PCIe slot interface switching equipment is connected with the golden finger interface of the PCIe test card.
The PCIe slot interface test equipment provided by the embodiment of the application can realize the connection of the PCIe slot interface to be tested and the PCIe test card, and because the bandwidth and the speed of the golden finger interface of the PCIe test card are not less than the set bandwidth and the set speed of the PCIe slot interface to be tested respectively, after the board card on which the PCIe slot interface to be tested is positioned is electrified, the board card can realize the test of the PCIe slot interface to be tested through the bandwidth and the speed of the connection of the PCIe slot interface to be tested and the PCIe test card determined based on the PCIe protocol, which are the maximum bandwidth and the maximum speed actually supported by the PCIe slot interface to be tested respectively, and based on the PCIe slot interface switching equipment with different specifications, the connection of the same PCIe test card and the PCIe slot interfaces to be tested with different specifications can be realized, and then, one PCIe test card is used to test a plurality of PCIe slot interfaces to be tested with different specifications, the test cost can be reduced.
Referring to fig. 3, fig. 3 is a structural diagram of a PCIe slot interface test system according to an embodiment of the present application.
The PCIe slot interface test system comprises the PCIe slot interface test equipment in any one of the embodiments and a to-be-tested board card with a to-be-tested PCIe slot interface, wherein the set bandwidth of the to-be-tested PCIe slot interface is a first appointed bandwidth;
and the second end of the golden finger interface with the first specified bandwidth of the switching equipment in the PCIe slot interface test equipment is connected with the PCIe slot interface to be tested.
The PCIe slot interface test system provided by the embodiment of the application can realize that the PCIe slot interface to be tested is connected with the PCIe test card, because the bandwidth and the speed of the golden finger interface of the PCIe test card are not less than the set bandwidth and the set speed of the PCIe slot interface to be tested respectively, after the board card on which the PCIe slot interface to be tested is positioned is electrified, the board card can realize the test of the PCIe slot interface to be tested through the bandwidth and the speed of the connection of the PCIe slot interface to be tested and the PCIe test card determined based on the PCIe protocol, which are the maximum bandwidth and the maximum speed actually supported by the PCIe slot interface to be tested respectively, and based on the PCIe slot interface switching equipment with different specifications, the connection of the same PCIe test card and the PCIe slot interfaces to be tested with different specifications can be realized, and then, one PCIe test card is used to test a plurality of PCIe slot interfaces to be tested with different specifications, the test cost can be reduced.
Optionally, the board to be tested is connected with the user terminal through a serial port.
In this application embodiment, the integrated circuit board to be tested can be provided with a serial port, and the integrated circuit board to be tested can be connected with the user terminal through this serial port, and correspondingly, after the test result of the PCIe slot interface to be tested is determined, the test result can be uploaded to the user terminal through this serial port.
Referring to fig. 4, fig. 4 is a flowchart of a PCIe slot interface test method provided in the embodiment of the present application, where the method is applied to a board to be tested having a PCIe slot interface to be tested, and a set bandwidth of the PCIe slot interface to be tested is a first specified bandwidth; the PCIe interface to be tested is connected with the second end of the golden finger interface with the first appointed bandwidth in the PCIe slot interface switching equipment, the first end of the golden finger interface with the first appointed bandwidth is connected with the first end of the PCIe slot interface with the second appointed bandwidth in the PCIe slot interface switching equipment, and the second appointed bandwidth is not less than the first appointed bandwidth; the second end of the PCIe slot interface with the second designated bandwidth is connected to the golden finger interface of the PCIe test card, the golden finger interface of the PCIe test card has the second designated bandwidth and a designated rate, and the designated rate is not less than the set rate of the PCIe slot interface to be tested, and the method may include the following steps:
s401: and determining the bandwidth and the speed of the connection of the PCIe slot interface to be tested and the golden finger interface of the PCIe test card based on the PCIe protocol and the PCIe test card.
S402: and determining the test result of the PCIe slot interface to be tested based on the comparison result of the determined bandwidth and the determined speed of the connection and the set bandwidth and speed of the PCIe slot interface to be tested.
The PCIe slot interface test method provided by the embodiment of the application can realize the connection of the PCIe slot interface to be tested and the PCIe test card, and because the bandwidth and the speed of the golden finger interface of the PCIe test card are not less than the set bandwidth and the set speed of the PCIe slot interface to be tested respectively, after the board card on which the PCIe slot interface to be tested is positioned is electrified, the board card can realize the test of the PCIe slot interface to be tested through the bandwidth and the speed of the connection of the PCIe slot interface to be tested and the PCIe test card determined based on the PCIe protocol, which are the maximum bandwidth and the maximum speed actually supported by the PCIe slot interface to be tested respectively, and based on the PCIe slot interface switching equipment with different specifications, the connection of the same PCIe test card and the PCIe slot interfaces to be tested with different specifications can be realized, and then, one PCIe test card is used to test a plurality of PCIe slot interfaces to be tested with different specifications, the test cost can be reduced.
In addition, based on the PCIe slot interface testing method provided by the embodiment of the application, automatic testing can be realized, testing time is saved, production line workers can be reduced, further, artificial subjective judgment is reduced, testing accuracy is improved, and repeated testing is avoided.
Optionally, the board card to be tested is connected to the user terminal through a serial port, and after S402, the method further includes the following steps: and uploading the test result of the PCIe slot interface to be tested to the user terminal through the serial port.
In one implementation mode, the board to be tested can be connected with the user terminal through a serial port, a test application program can be installed in the user terminal, and based on the test application program, the board to be tested can determine the connection bandwidth and speed with the PCIe test card, further determine the test result of the PCIe slot interface to be tested, and upload the test result to the user terminal through the serial port.
Optionally, the test result may include the determined bandwidth and rate of the connection, and the set bandwidth and rate of the PCIe slot interface to be tested.
Optionally, S402 may include the following steps:
step one, if the determined connection bandwidth is the same as the set bandwidth of the PCIe slot interface to be tested, and the determined connection speed is the same as the set speed of the PCIe slot interface to be tested, determining that the PCIe slot interface to be tested is qualified.
And step two, if the determined connection bandwidth is different from the set bandwidth of the PCIe slot interface to be tested, and/or the determined connection rate is different from the set rate of the PCIe slot interface to be tested, determining that the PCIe slot interface to be tested is unqualified.
In the embodiment of the application, when the determined connection bandwidth is the same as the set bandwidth of the PCIe slot interface to be tested, and the determined connection rate is the same as the set rate of the PCIe slot interface to be tested, it indicates that the PCIe slot interface to be tested can reach the set bandwidth and the set rate, that is, the PCIe slot interface to be tested is qualified, otherwise, it indicates that the PCIe slot interface to be tested is unqualified.
Referring to fig. 5, fig. 5 is a flowchart illustrating testing of a PCIe slot interface according to an embodiment of the present application.
Building a test environment may include: and connecting the board card to be tested to a user terminal through a serial port, installing a test application program in the user terminal, and inserting the PCIe slot interface switching equipment into the PCIe slot interface to be tested of the board card to be tested through the second end of the golden finger interface.
Then, the PCIe test card may be inserted into the PCIe slot interface of the PCIe slot interface adapter device through the gold finger interface thereof.
The bandwidth of the golden finger interface of the PCIe slot interface switching equipment and the set bandwidth of the PCIe slot interface to be tested are both first appointed bandwidths, the bandwidth of the golden finger interface of the PCIe test card and the bandwidth of the PCIe slot interface switching equipment are second appointed bandwidths, the second appointed bandwidths are not less than the first appointed bandwidths, and the speed of the golden finger interface of the PCIe test card is not less than the set speed of the PCIe slot interface to be tested.
After the board card to be tested is powered on, the PCIe slot interface to be tested can be tested.
The test board card can determine the bandwidth and the speed of connection with the PCIe test card based on a test application program, further determine the test result of the PCIe slot interface to be tested, and upload the test result to the user terminal through the serial port.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
All the embodiments in the present specification are described in a related manner, and the same and similar parts among the embodiments may be referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, as for the embodiments of the test device, the test system and the test method, since they are basically similar to the embodiments of the transfer device, the description is relatively simple, and the relevant points can be referred to the partial description of the embodiments of the method.
The above description is only for the preferred embodiment of the present application and is not intended to limit the scope of the present application. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application are included in the protection scope of the present application.
Claims (10)
1. The computer external device high speed interconnection interface PCIe slot interface switching device is characterized in that the switching device comprises a golden finger interface with a first designated bandwidth and a PCIe slot interface with a second designated bandwidth, wherein the second designated bandwidth is not less than the first designated bandwidth, a first end of the golden finger interface with the first designated bandwidth is connected with a first end of the PCIe slot interface with the second designated bandwidth, and the first end of the golden finger interface with the first designated bandwidth is connected with the PCIe slot interface with the second designated bandwidth, wherein:
the second end of the golden finger interface with the first appointed bandwidth is used for being connected with a PCIe slot interface to be tested, the set bandwidth of which is the first appointed bandwidth;
the second end of the PCIe slot interface with the second specified bandwidth is used for being connected with a golden finger interface of a PCIe test card; the golden finger interface of the PCIe test card has the second designated bandwidth and a designated rate, and the designated rate is not less than the set rate of the PCIe slot interface to be tested.
2. The translator device of claim 1, wherein the first end of the first bandwidth-designated gold finger interface is connected to the first bandwidth-designated channel in the second bandwidth-designated PCIe slot interface.
3. The transfer device of claim 1, wherein the first specified bandwidth is a bandwidth corresponding to 8 lanes, and the second specified bandwidth is a bandwidth corresponding to 16 lanes; alternatively, the first and second electrodes may be,
the first specified bandwidth is a bandwidth corresponding to 4 channels, and the second specified bandwidth is a bandwidth corresponding to 16 channels.
4. A computer peripheral device interconnect express interface PCIe slot interface test apparatus, the test apparatus comprising:
the translator device of any of claims 1 to 3, and a PCIe test card having a golden finger interface with a second specified bandwidth and a specified rate, the second specified bandwidth being no less than a set bandwidth of a PCIe slot interface to be tested, the specified rate being no less than a set rate of the PCIe slot interface to be tested;
and the second end of the PCIe slot interface with the second specified bandwidth in the switching equipment is connected with the golden finger interface of the PCIe test card.
5. A system for testing a PCIe slot interface of a computer peripheral device high speed interconnect interface, the system comprising:
the test equipment of claim 4, and a board under test having a PCIe slot interface under test, the set bandwidth of the PCIe slot interface under test being a first specified bandwidth;
and the second end of the golden finger interface with the first specified bandwidth of the switching equipment in the test equipment is connected with the PCIe slot interface to be tested.
6. The test system of claim 5, wherein the board to be tested is connected to the user terminal through a serial port.
7. A method for testing a PCIe slot interface of a high-speed interconnection interface of computer peripheral equipment is characterized in that the method is applied to a board card to be tested with a to-be-tested PCIe slot interface, and the set bandwidth of the to-be-tested PCIe slot interface is a first appointed bandwidth; the PCIe slot interface to be tested is connected with the second end of the golden finger interface with the first appointed bandwidth in the switching equipment, the first end of the golden finger interface with the first appointed bandwidth is connected with the first end of the PCIe slot interface with the second appointed bandwidth in the switching equipment, and the second appointed bandwidth is not less than the first appointed bandwidth; the second end of the PCIe slot interface with the second specified bandwidth is connected with a golden finger interface of a PCIe test card, the golden finger interface of the PCIe test card has the second specified bandwidth and a specified rate, and the specified rate is not less than the set rate of the PCIe slot interface to be tested, and the method comprises the following steps:
determining the bandwidth and the speed of the connection of the PCIe slot interface to be tested and the golden finger interface of the PCIe test card based on a PCIe protocol and the PCIe test card;
and determining a test result of the PCIe slot interface to be tested based on the determined bandwidth and speed of the connection and a comparison result of the set bandwidth and speed of the PCIe slot interface to be tested.
8. The method according to claim 7, characterized in that the board card to be tested is connected with the user terminal through a serial port;
after the determining the test result for the PCIe slot interface to be tested, the method further comprises:
and uploading the test result of the PCIe slot interface to be tested to the user terminal through the serial port.
9. The method of claim 8, wherein the test results include a bandwidth and rate of the determined connection and a set bandwidth and rate of the PCIe slot interface to be tested.
10. The method of claim 7, wherein determining the test results for the PCIe socket interface to be tested based on a comparison of the determined bandwidth and rate of the connection to the set bandwidth and rate of the PCIe socket interface to be tested comprises:
if the determined connection bandwidth is the same as the set bandwidth of the PCIe slot interface to be tested, and the determined connection speed is the same as the set speed of the PCIe slot interface to be tested, determining that the PCIe slot interface to be tested is qualified;
and if the determined connection bandwidth is different from the set bandwidth of the PCIe slot interface to be tested, and/or the determined connection rate is different from the set rate of the PCIe slot interface to be tested, determining that the PCIe slot interface to be tested is unqualified.
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| CN202010431285.XA CN113704152A (en) | 2020-05-20 | 2020-05-20 | PCIe slot interface switching equipment, test equipment, system and method |
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| CN202010431285.XA CN113704152A (en) | 2020-05-20 | 2020-05-20 | PCIe slot interface switching equipment, test equipment, system and method |
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