CN102455965A - Electronic device test system and method - Google Patents
Electronic device test system and method Download PDFInfo
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- CN102455965A CN102455965A CN2010105320436A CN201010532043A CN102455965A CN 102455965 A CN102455965 A CN 102455965A CN 2010105320436 A CN2010105320436 A CN 2010105320436A CN 201010532043 A CN201010532043 A CN 201010532043A CN 102455965 A CN102455965 A CN 102455965A
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Abstract
The invention provides an electronic device test system and method. The electronic device test system comprises a first data transmission device, an interface adapter card and a computer, wherein the first data transmission device has the function of hot removal; the interface adapter card comprise a second data transmission interface and a conversion module; the second data transmission interface is to be connected with a device to be tested; the conversion module is electrically connected with the first data transmission device and the second data transmission interface, and used for converting data transmitted between the first data transmission device and the second data transmission interface; the computer comprises a processing unit; the processing unit is connected with the interface adapter card through the first data transmission device; the processing unit enables the first data transmission device to perform a function test on the device to be tested through the interface adapter card; and after the function test is completed, the processing unit removes the first data transmission device by using the hot removal function.
Description
Technical field
The invention relates to a kind of test macro and method, and particularly relevant for a kind of testing of electronic devices system and method.
Background technology
Along with the high development of Information technology, the application of computer hardware device is also healed and is become universal.These computer hardware devices comprise the display card that makes display data on the screen, make network card of sound card that computing machine sounds etc. and connected network etc.With the network card is example, and network card is the bridge that main frame and the Internet are linked up, if there is not network card, then main frame just can't link and surfs the Internet.
When these computer hardware devices complete, need one to overlap function and the usefulness that method of testing is tested these hardware units.For example, when the test network card, can launch network card earlier, confirm then whether main frame can link to surf the Internet, and link and go up the spent time of network, verify the function and the usefulness of network card.
Wherein, when testing each hardware unit, need hardware unit to be measured to be installed up to slot corresponding on the main frame according to the interface that hardware unit to be measured adopted.For instance, when hardware unit to be measured is when adopting PCI, need hardware unit to be measured is installed up on the PCI slot of main frame, to test.Yet, when not supporting hot plug, need earlier main frame to be shut down as if the data transmission interface that hardware unit to be measured adopted, just can change next hardware unit to be measured.Such testing process is very time-consuming and inconvenient.
Summary of the invention
Therefore, a purpose of the present invention is a kind of testing of electronic devices system to be provided, in order to see through the data transmission device that tool heat removes function, device to be measured to be carried out functional test, and after functional test was accomplished, heat removed data transmission device.The testing of electronic devices system comprises one first data transmission device, an interface adapter (interface card) and a computing machine.First data transmission device has a heat and removes function.The interface adapter comprises one second data transmission interface and a modular converter.Second data transmission interface is in order to connect a device to be measured.Modular converter electrically connects first data transmission device and second data transmission interface.Modular converter is changed the data of transmitting between first data transmission device and second data transmission interface.Computing machine comprises a processing components.Processing components sees through first data transmission device, connecting interface adapter.Processing components comprises a test module and and removes module.Test module makes first data transmission device, sees through the interface adapter, and device to be measured is carried out a functional test.Remove module when functional test is accomplished, remove function, remove first data transmission device through heat.
According to one embodiment of the invention; Processing components also can comprise a detecting module, in order to removing first data transmission device, and detects the interface adapter when connecting another device to be measured; Activation first data transmission device; And trigger test module and begin to make first data transmission device, see through the interface adapter to another device to be measured, carry out functional test.
According to another embodiment of the present invention, functional test can comprise identification code verification test.Test module can comprise an identification code verification device, with so that the interface adapter sees through second data transmission interface, obtains one first identification code of device to be measured from device to be measured.The identification code verification device makes modular converter with first identification code, converts one second identification code of corresponding first data transmission device into, and carries out the identification code verification test according to second identification code.
According to another embodiment of the present invention, device wherein to be measured can comprise a storage assembly, and functional test can comprise a storage assembly access test.Test module can comprise a storage assembly access test device, with so that first data transmission device sees through the interface adapter, to the storage assembly of device to be measured, carries out the storage assembly access test.
According to another embodiment of the present invention, device wherein to be measured can comprise a temperature sensing component, and functional test comprises temperature sensing test.Test module can comprise a temperature sensing tester, with so that first data transmission device sees through the temperature sensing component of interface adapter to device to be measured, carries out the temperature sensing test.
According to another embodiment of the present invention, device wherein to be measured comprises at least one slot, and slot is in order to plug a peripheral unit, and functional test comprises slot test.Test module comprises a slot tester, with so that first data transmission device sees through the interface adapter to being inserted in the peripheral unit of slot, carries out the slot test.
Another object of the present invention is that a kind of electronic device test method is being provided, and in order to see through the data transmission interface that tool heat removes function, device to be measured is carried out functional test, and after functional test was accomplished, heat removed data transmission device.Electronic device test method comprises following steps: a computing machine is provided.Wherein, computing machine comprises one first data transmission interface, and first data transmission interface has a heat and removes function.One interface adapter is provided.Wherein, the interface adapter electrically connects first data transmission interface.The interface adapter comprises one second data transmission interface, in order to connect a device to be measured.Make first data transmission interface of computing machine see through the interface adapter, device to be measured is carried out a functional test.Wherein, the interface adapter is from first data transmission interface, at least one first test instruction of receiving function test.The interface adapter converts at least one first test instruction at least one second test instruction of corresponding second data transmission interface into.Wherein, functional test can comprise identification code verification test, a storage assembly access test, temperature sensing test or slot test.So device to be measured is carried out at least one second test instruction, to carry out functional test.When functional test is accomplished, remove function through heat, remove first data transmission interface.
According to another embodiment of the present invention, electronic device test method also comprises: whether second data transmission interface of detecting interface adapter connects another device to be measured.When detecting another device to be measured of second data transmission interface connection, activation first data transmission interface, and begin to make first data transmission interface of computing machine to see through the interface adapter, another device to be measured is carried out functional test.
Can know by the invention described above embodiment, use the present invention and have advantage.When device to test to be measured is accomplished, need not make computer circuit breaking, just replaceable another device to be measured.Do not support heat to remove the data transmission interface of function even device to be measured only can be connected in, still can under situation not, replace another device to be measured computer shutdown.Thus, can save in the test process the required consumed time of computer on/off greatly.
Description of drawings
For letting above and other objects of the present invention, characteristic, advantage and the embodiment can be more obviously understandable, the explanation of appended accompanying drawing be following:
Fig. 1 illustrates the functional block diagram according to a kind of testing of electronic devices system of an embodiment of the present invention;
Fig. 2 is the process flow diagram according to a kind of electronic device test method of another embodiment of the present invention.
[primary clustering symbol description]
200: interface adapter 316: detecting module
220: modular converter 410: slot
300: computing machine 420: storage assembly
310: processing components 430: temperature sensing component
311: test module 500: peripheral unit
312: identification code verification device 600: electronic device test method
313: storage assembly access test device 610-670: step
314: the temperature sensing tester
Embodiment
Below will clearly demonstrate spirit of the present invention with accompanying drawing and detailed description; Has common knowledge the knowledgeable under any in the technical field after understanding preferred embodiment of the present invention; When can be by the technology of teachings of the present invention, change and modification, it does not break away from spirit of the present invention and scope.
Please with reference to Fig. 1, it illustrates the functional block diagram according to a kind of testing of electronic devices system of an embodiment of the present invention.The testing of electronic devices system sees through the data transmission device that tool heat removes function, and device to be measured is carried out functional test, and after functional test was accomplished, heat removed data transmission device.
The testing of electronic devices system comprises one first data transmission device 100, an interface adapter (interface card) 200 and one computing machine 300.First data transmission device 100 has a heat and removes function.First data transmission device can adopt quick peripheral hardware interconnect standard (Peripheral Component Interconnect Express, PCI-E) or other support heat to remove the data transmission standard of function.
In addition, the testing of electronic devices system can begin to carry out functional test behind another device 400 to be measured of replacement.Therefore, processing components also can comprise a detecting module 316.Removing first data transmission device 100, and second data transmission interface 210 that detects interface adapter 200 is when connecting another device 400 to be measured, detecting module 316 activations (enable) first data transmission device 100.Next, detecting module 316 triggers test module 311 and begins to make first data transmission device 100, sees through interface adapter 200 to another device 400 to be measured, carries out functional test.
Wherein, functional test can comprise identification code verification test, in order to verify the identification code of device 400 to be measured.Therefore, test module 311 can comprise an identification code verification device 312.Identification code verification device 312 makes interface adapter 200 see through its second data transmission interface 210, obtains one first identification code of device 400 to be measured from device 400 to be measured.Identification code verification device 312 makes modular converter 220 with first identification code, converts one second identification code of corresponding first data transmission device 100 into, and carries out the identification code verification test according to second identification code.For instance; Do not have pin at first data transmission device 100 in order to the identification code of transmitting device 400 to be measured; Like general input and output (General Purpose Input/Output; GPIO) pin, the time, the identification code pin that can make modular converter 220 see through second data transmission interface 210 receives first identification code of device 400 to be measured.Next; Modular converter 220 converts first identification code into one second identification code of corresponding first data transmission device 100; As meet internal integration circuit (Inter-Integrated Circuit; I2C) identification code of form supplies first data transmission device 100 to send identification code verification device 312 to, carries out the identification code verification test.Thus,, still can pass through interface adapter 200, verify the identification code of device 400 to be measured even first data transmission interface 100 and computing machine 300 do not have the identification code pin identical with device to be measured 400.
In addition, when comprising a storage assembly 420 as if device 400 to be measured, test module 311 can carry out a storage assembly access test to storage assembly 420.Wherein, storage assembly 420 can be electronics can erase programmble read only memory PROM (Electrically Erasable Programmable Read Only Memory, EEPROM) or the storage assembly of other type.Functional test can comprise a storage assembly access test, and test module 311 can comprise a storage assembly access test device 313.Storage assembly access test device 313 makes first data transmission device 100, sees through interface adapter 200, and the storage assembly 420 to device 400 to be measured carries out the storage assembly access test.
In addition, test module 311 can carry out temperature sensing test to device 400 to be measured.Device 400 to be measured can comprise a temperature sensing component 430 (like LM75), and functional test comprises temperature sensing test.Test module 311 can comprise a temperature sensing tester 314.Temperature sensing tester 314 makes first data transmission device 100, sees through the temperature sensing component 430 of 200 pairs of devices 400 to be measured of interface adapter, carries out the temperature sensing test.
If device 400 to be measured is the device with at least one slot 410, like an expansion board (riser card), the time, test module 311 can carry out slot test to slot 410.Therefore, test module 311 can comprise a slot tester 315.Slot tester 315 makes first data transmission device 100, sees through the peripheral unit 500 that 200 pairs of interface adapters are inserted in slot 311, carries out the slot test.Wherein, slot tester 315 can send the peripheral unit 500 in a visiting demand to the slot 410.If can receive an answer from peripheral unit 500,315 decidable slots of slot tester 411 are normal.
Please with reference to Fig. 2, it is the process flow diagram according to a kind of electronic device test method of another embodiment of the present invention.In electronic device test method, see through the data transmission interface that tool heat removes function, device to be measured is carried out functional test, and after functional test was accomplished, heat removed data transmission interface.Electronic device test method 600 comprises following steps:
In step 610, a computing machine is provided.Wherein, computing machine comprises and has one first data transmission interface that heat removes function.First data transmission interface can adopt quick peripheral hardware interconnect standard or other to support heat to remove the data transmission standard of function.
In step 620, an interface adapter is provided.Wherein, the interface adapter electrically connects first data transmission interface, and comprises one second data transmission interface.Second data transmission interface is in order to connect a device to be measured.
In step 630, make first data transmission interface of computing machine see through the interface adapter, device to be measured is carried out a functional test.Wherein, the interface adapter is from first data transmission interface, at least one first test instruction of receiving function test.Next, the interface adapter converts first test instruction at least one second test instruction of corresponding second data transmission interface into.So, can make device to be measured carry out at least one second test instruction, to carry out the functional test of step 630.Wherein, functional test can comprise identification code verification test, a storage assembly access test, temperature sensing test, slot test or other functional test.The identification code verification test is in order to verify the identification code of device to be measured.The storage assembly access test is in order to the storage assembly to device to be measured, like can the erase storage assembly of programmble read only memory PROM or other type of electronics, carries out access.The temperature sensing test is in order to test the temperature sensing component of device to be measured.The slot test is in order to test at least one slot on the device to be measured.
When (step 640) accomplished in functional test, remove function through heat, remove first data transmission interface (step 650).After removing first data transmission interface, need not shut down computer and to substitute the device to be measured that test is accomplished.In other words, even device to be measured connects when not supporting second data transmission interface that heat removes, still can after removing first data transmission interface, substitute the device to be measured that test is accomplished.
In addition, can behind another device to be measured of replacement, begin to carry out functional test to another device to be measured.Therefore, can be in step 660, whether second data transmission interface of detecting interface adapter connects another device to be measured.When not detecting another device to be measured of second data transmission interface connection, whether second data transmission interface of sustainable detecting interface adapter connects another device to be measured (step 660).
In step 670, when detecting another device to be measured of second data transmission interface connection, activation first data transmission interface.Next, begin to make first data transmission interface of computing machine to see through this interface adapter, another device to be measured is carried out functional test (step 630).
Can know by the invention described above embodiment, use the present invention and have advantage.When device to test to be measured is accomplished, need not make computer circuit breaking, just replaceable another device to be measured.Do not support heat to remove the data transmission interface of function even device to be measured only can be connected in, still can under situation not, replace another device to be measured computer shutdown.Thus, can save in the test process the required consumed time of computer on/off greatly.
Though the present invention discloses as above with embodiment; Right its is not in order to limit the present invention; Anyly be familiar with this art; Do not breaking away from the spirit and scope of the present invention, when can doing various changes and retouching, so protection scope of the present invention is as the criterion when looking the scope that appending claims defines.
Claims (9)
1. a testing of electronic devices system is characterized in that, comprises:
One first data transmission device has a heat and removes function;
One interface adapter comprises:
One second data transmission interface is in order to connect a device to be measured; And
One modular converter electrically connects this first data transmission device and this second data transmission interface, and the data of transmitting between this first data transmission device and this second data transmission interface are changed; And
One computing machine comprises:
One processing components sees through this first data transmission device, connects this interface adapter, comprises:
One test module makes this first data transmission device, sees through this interface adapter, and this device to be measured is carried out a functional test; And
One removes module, when this functional test is accomplished, removes function through this heat, removes this first data transmission device.
2. testing of electronic devices according to claim 1 system is characterized in that this processing components also comprises:
One detecting module; Removing this first data transmission device; And detect this interface adapter when connecting another device to be measured, this first data transmission device of activation, and trigger this test module and begin to make this first data transmission device; See through this interface adapter to this another device to be measured, carry out this functional test.
3. testing of electronic devices according to claim 1 system is characterized in that, this functional test comprises identification code verification test, and this test module comprises:
One identification code verification device; Make this interface adapter see through this second data transmission interface; Obtain one first identification code of this device to be measured from this device to be measured; And make this modular converter with this first identification code, convert into, and carry out this identification code verification test according to second identification code to one second identification code that should first data transmission device.
4. testing of electronic devices according to claim 1 system is characterized in that this device to be measured comprises a storage assembly, and this functional test comprises a storage assembly access test, and this test module comprises:
One storage assembly access test device makes this first data transmission device, sees through this interface adapter, to this storage assembly of this device to be measured, carries out this storage assembly access test.
5. testing of electronic devices according to claim 1 system is characterized in that this device to be measured comprises a temperature sensing component, and this functional test comprises temperature sensing test, and this test module comprises:
One temperature sensing tester makes this first data transmission device, sees through this interface adapter this temperature sensing component to this device to be measured, carries out this temperature sensing test.
6. testing of electronic devices according to claim 1 system is characterized in that this device to be measured comprises at least one slot, and this slot is in order to plug a peripheral unit, and this functional test comprises slot test, and this test module comprises:
One slot tester makes this first data transmission device, sees through this interface adapter to being inserted in this peripheral unit of this slot, carries out this slot test.
7. an electronic device test method is characterized in that, comprises:
One computing machine is provided, and wherein this computing machine comprises one first data transmission interface, and this first data transmission interface has a heat and removes function;
One interface adapter is provided, and wherein this interface adapter electrically connects this first data transmission interface, and this interface adapter comprises one second data transmission interface, and this second data transmission interface is in order to connect a device to be measured;
Make this first data transmission interface of this computing machine see through this interface adapter; This device to be measured is carried out a functional test, and wherein this interface adapter receives at least one first test instruction of this functional test from this first data transmission interface; This interface adapter should at least one first test instruction; Convert at least one second test instruction that should second data transmission interface, make this device to be measured carry out this at least one second test instruction by this, to carry out this functional test; And
When this functional test is accomplished, remove function through this heat, remove this first data transmission interface.
8. electronic device test method according to claim 7 is characterized in that, also comprises:
Whether this second data transmission interface of detecting this interface adapter connects another device to be measured; And
When detecting this second data transmission interface connection this another device to be measured, this first data transmission interface of activation, and begin to make this first data transmission interface of this computing machine to see through this interface adapter, this another device to be measured is carried out this functional test.
9. electronic device test method according to claim 7 is characterized in that, this functional test comprises identification code verification test, a storage assembly access test, temperature sensing test or slot test.
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| CN2010105320436A CN102455965A (en) | 2010-10-27 | 2010-10-27 | Electronic device test system and method |
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| CN2010105320436A CN102455965A (en) | 2010-10-27 | 2010-10-27 | Electronic device test system and method |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103577293A (en) * | 2012-07-31 | 2014-02-12 | 广达电脑股份有限公司 | Composite function interface test system and method |
| CN104168260A (en) * | 2013-05-15 | 2014-11-26 | 约翰内斯·海德汉博士有限公司 | Method for transferring data between a position measuring device and an associated processing unit |
| CN106405386A (en) * | 2016-08-24 | 2017-02-15 | 硅谷数模半导体（北京）有限公司 | Method and apparatus for testing chip |
| CN108318753A (en) * | 2017-01-16 | 2018-07-24 | 研华股份有限公司 | Detecting system |
| CN110189789A (en) * | 2019-05-30 | 2019-08-30 | 苏州浪潮智能科技有限公司 | A kind of test device of hard disc switching card, method and system |
| CN111669694A (en) * | 2020-06-17 | 2020-09-15 | 江西台德智慧科技有限公司 | Artificial intelligence automatic test system and method |
-
2010
- 2010-10-27 CN CN2010105320436A patent/CN102455965A/en active Pending
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103577293A (en) * | 2012-07-31 | 2014-02-12 | 广达电脑股份有限公司 | Composite function interface test system and method |
| CN103577293B (en) * | 2012-07-31 | 2015-09-02 | 广达电脑股份有限公司 | Composite function interface test system and method |
| CN104168260A (en) * | 2013-05-15 | 2014-11-26 | 约翰内斯·海德汉博士有限公司 | Method for transferring data between a position measuring device and an associated processing unit |
| CN106405386A (en) * | 2016-08-24 | 2017-02-15 | 硅谷数模半导体（北京）有限公司 | Method and apparatus for testing chip |
| CN106405386B (en) * | 2016-08-24 | 2019-10-22 | 硅谷数模半导体（北京）有限公司 | The test method and device of chip |
| CN108318753A (en) * | 2017-01-16 | 2018-07-24 | 研华股份有限公司 | Detecting system |
| CN110189789A (en) * | 2019-05-30 | 2019-08-30 | 苏州浪潮智能科技有限公司 | A kind of test device of hard disc switching card, method and system |
| CN110189789B (en) * | 2019-05-30 | 2021-03-09 | 苏州浪潮智能科技有限公司 | Device, method and system for testing hard disk adapter card |
| CN111669694A (en) * | 2020-06-17 | 2020-09-15 | 江西台德智慧科技有限公司 | Artificial intelligence automatic test system and method |
| CN111669694B (en) * | 2020-06-17 | 2021-08-20 | 江西台德智慧科技有限公司 | Artificial intelligence automatic test system and method |
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Application publication date: 20120516 |