CN103577293B - Composite function interface test system and method - Google Patents
Composite function interface test system and method Download PDFInfo
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- CN103577293B CN103577293B CN201210304291.4A CN201210304291A CN103577293B CN 103577293 B CN103577293 B CN 103577293B CN 201210304291 A CN201210304291 A CN 201210304291A CN 103577293 B CN103577293 B CN 103577293B
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- 238000012360 testing method Methods 0.000 title claims abstract description 69
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- 230000005540 biological transmission Effects 0.000 claims description 18
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Abstract
A composite function interface test system comprises a device to be tested and a test device. The device to be tested is provided with test software and comprises an interface to be tested, and the interface to be tested comprises a first group of pins and a second group of pins. The testing device comprises a connector, a switching module, a storage module and a control unit. The connector comprises a third group of pins and a fourth group of pins, wherein the third group of pins and the first group of pins belong to a first communication standard, and the fourth group of pins and the second group of pins belong to a second communication standard. The switching module is used for switching the third group pin and the fourth group pin. The storage module is coupled to the switching module. The control unit is used for controlling the switching module when the connector is connected to the interface to be tested, so that the interface to be tested is electrically connected to the switching module and the storage module through the first group of pins and the third group of pins or the second group of pins and the fourth group of pins to be tested for testing.
Description
Technical field
The invention relates to a kind of complex function interface test system and method.
Background technology
Modern electronic product provides multiple complex function interface usually, as external series ATA (externalserial ATA, E-SATA) interface or USB (universal serial bus) (universal serial bus, USB) 3.0 interfaces etc.Production firm must do repeated plug and carry out the checking of complex function with different devices.With E-SATA interface, manufacturer must verify the function of USB and SATA; With USB3.0 interface, manufacturer must verify the function of USB2.0 and USB3.0.Existing checking flow process is numerous and diverse and do not have efficiency.
Summary of the invention
The invention relates to a kind of complex function interface test system and method, effectively can verify the function of complex function interface.
According to a first aspect of the invention, propose a kind of complex function interface test system, comprise a test system and a proving installation.Test system is provided with a testing software and comprises an interface to be measured, and interface to be measured comprises one first group of pin position and one second group of pin position.Proving installation comprises a connector, a handover module, a storage module and a control module.Connector comprises one the 3rd group of pin position and one the 4th group of pin position, and the 3rd group of pin position and first group of pin position belong to one first communication standard, and the 4th group of pin position and second group of pin position belong to a second communication standard.Handover module is in order to switch the 3rd group of pin position and the 4th group of pin position.Storage module is coupled to handover module.Control module, in order to control handover module when connector is connected to interface to be measured, makes interface to be measured be electrically connected to handover module and storage module to test by first group of pin position and the 3rd group of pin position or second group of pin position and the 4th group of pin position.
According to a second aspect of the invention, propose a kind of complex function interface test method, be applied to a test system and a proving installation.Test system is provided with a testing software and comprises an interface to be measured, and interface to be measured comprises first group of pin position and second group of pin position.Proving installation comprises a connector, a handover module, a storage module and a control module.Complex function interface test method comprises the following steps.When connector is connected to interface to be measured, control module is utilized to control one the 3rd group of pin position or one the 4th group of pin position of handover module switching connector, 3rd group of pin position and first group of pin position belong to the first communication standard, and the 4th group of pin position and second group of pin position belong to second communication standard.Interface to be measured is utilized to be electrically connected to handover module to test storage module by first group of pin position and the 3rd group of pin position or second group of pin position and the 4th group of pin position.
In order to have better understanding, an embodiment cited below particularly to above-mentioned and other side of the present invention, and coordinating institute's accompanying drawings, being described in detail below.
Accompanying drawing explanation
Fig. 1 illustrates the schematic diagram of the complex function interface test system implementing example according to.
Fig. 2 illustrates the pin position schematic diagram of the interface/connector to be measured implementing example according to.
Fig. 3 A and Fig. 3 B illustrates the process flow diagram of the complex function interface test method implementing example according to.
[main element label declaration]
10: complex function interface test system 100: test system
110_1 ~ 110_n: interface 200 to be measured: proving installation
210_1 ~ 210_n: connector 220_1 ~ 220_n: handover module
230: storage module 240: control module
250. switch unit
Embodiment
Complex function interface test system proposed by the invention and method, utilize handover module to switch at the pin interdigit of distinct communication standards, effectively can verify the function of complex function interface, and save testing cost.
Please refer to Fig. 1, it illustrates the schematic diagram of the complex function interface test system implementing example according to.Complex function interface test system 10 comprises test system 100 and a proving installation 200.Test system 100 is provided with a testing software and comprises multiple interface 110_1 ~ 110_n to be measured.Each interface 110_1 ~ 110_n to be measured comprises one first group of pin position and one second group of pin position.Proving installation 200 comprises multiple connector 210_1 ~ 210_n, multiple handover module 220_1 ~ 220_n, storage module 230, control module 240 and a switch unit 250.Each connector 210_1 ~ 210_n comprises one the 3rd group of pin position and one the 4th group of pin position, and the 3rd group of pin position and first group of pin position belong to one first communication standard, and the 4th group of pin position and second group of pin position belong to a second communication standard.
Each handover module 220_1 ~ 220_n comprises switch 1 and a switch 2, is used for switching the 3rd group of pin position to be connected to corresponding connector 210_1 ~ 210_n with the 4th group of pin position.Storage module 230 is coupled to those handover modules 220_1 ~ 220_n by switch unit 250.Switch unit 250 is used in fact the order controlling to carry out testing, such as, sequentially test multiple interface 110_1 ~ 110_n to be measured, or test multiple interface 110_1 ~ 110_n to be measured simultaneously.When connector 210_1 ~ 210_n is connected to interface 110_1 ~ 110_n to be measured, the testing software of test system 100 controls those handover modules 220_1 ~ 220_n by control module 240, makes interface 110_1 ~ 110_n to be measured be electrically connected to corresponding handover module 220_1 ~ 220_n, switch unit 250 with storage module 230 to test with the 3rd group of pin position or second group of pin position with the 4th group of pin position by first group of pin position.Control module 240 can be an independent component of proving installation 200, can also realize its function, do not limit by one of multiple connector.
Next hereby lifting the first communication standard is universal serial bus port (universal serial bus, USB) 2.0 communication standards, and second communication standard is USB3.0 communication standard is that example is described, but is not limited to this.Implement in example at this, interface 110_1 ~ 110_n to be measured and connector 210_1 ~ 210_n is in fact USB3.0 connector, as shown in Figure 2, it comprises the first group of pin position and the 3rd group of pin position (VBUS, D-, D+ and GND) that belong to USB2.0 communication standard respectively, with the second group of pin position and the 4th group of pin position (SSRX-, SSRX+, SSTX-, SSTX+ and GND) that belong to USB3.0 communication standard.Wherein, pin position VBUS is bus voltage pin position.Storage module 230 such as comprises a serial ATA (SATA) hard disk and a USB turns SATA controller, for read-write/test transmission.
Please refer to Fig. 3 A and Fig. 3 B, it illustrates the process flow diagram of the complex function interface test method implementing example according to.Hereby handover module 220_1 is connected for switch unit 250 and connector 210_1 is described to storage module 230 in Fig. 3 A and Fig. 3 B.In step S300, utilize a cable that connector 210_1 is connected to interface 110_1 to be measured, this cable is such as a USB3.0 cable.Now, the 3rd group of pin position of first group of pin position butt connector 210_1 of interface 110_1 to be measured, the 4th group of pin position of second group of pin position butt connector 210_1 of interface 110_1 to be measured.In step S310, test system 100 is utilized to be powered to storage module 230 with the bus voltage pin position VBUS be connected in connector 210_1 by interface 110_1 to be measured.
In fact step S320 and S330 in Fig. 3 B can separately perform or continue execution, does not limit execution order.In step S322, the switch 1 utilizing controller 240 to control in handover module 220_1 is electrically connected storage module 230 with the 3rd group of pin position switching connector 210_1.In step S324, the testing software of test system 100 judges whether storage module 230 to be detected by first group of pin position and the 3rd group of pin position.If storage module 230 do not detected, then in step S340, testing software judges that the first group of pins is that pin is abnormal, that is USB2.0 pin is abnormal.When storage module 230 being detected, in step S326, testing software reads and writes/test transmission to storage module 230.In step S328, testing software judges whether read-write/test transmission passes through, and wherein namely test transmission is judge whether reach USB2.0 standard by the transfer rate of the first pin.When testing software judges the failure of read-write/test transmission, then, in step S350, testing software judges that the first group of pins is dysfunction, that is USB2.0 dysfunction.
In step S332, the switch 2 utilizing controller 240 to control in handover module 2201 is electrically connected storage module 230 with the 4th group of pin position switching connector 210_1.In step S334, testing software judges whether storage module 230 to be detected by second group of pin position and the 4th group of pin position.If storage module 230 do not detected, then in step S340, testing software judges that the second group of pins is that pin is abnormal, that is USB3.0 pin is abnormal.When storage module 230 being detected, in step S336, testing software reads and writes/test transmission to storage module 230.In step S338, testing software judges whether read-write/test transmission passes through, and wherein namely test transmission is judge whether reach USB3.0 standard by the transfer rate of the first pin.When testing software judges the failure of read-write/test transmission, then, in step S350, testing software judges that the second group of pins is dysfunction, that is USB3.0 dysfunction.
After the read-write/test transmission of corresponding USB2.0 communication standard and USB3.0 communication standard all completes, in step S360, the electric connection of bus voltage pin position VBUS and storage module 230 is disconnected.
Hereby for proving installation 200 interface 110_1 to be measured tested in above-mentioned Fig. 3 A and Fig. 3 B and explain.Further, switch unit 250 sequentially can connect handover module 220_2 ~ 220_n to storage module 230, sequentially to test interface 110_2 ~ 110_n to be measured by connector 210_2 ~ 210_n, until all interfaces to be measured are all tested complete.In addition, when storage module 230 comprises multiple SATA hard disc, switch unit 250 also can connect those handover modules 220_1 ~ 220_n to storage module 230 simultaneously, to test all interface 110_1 ~ 110_n to be measured by connector 210_1 ~ 210_n simultaneously.
Complex function interface test system disclosed by the above embodiment of the present invention and method, the handover module of proving installation is utilized to switch at the pin interdigit of the distinct communication standards of connector, the plug doing repeatability is not needed also not need different proving installations, namely effectively can verify the complex function of the interface to be measured of test system, and save testing cost.
In sum, although the present invention discloses as above with multiple embodiment, so itself and be not used to limit the present invention.Those skilled in the art, without departing from the spirit and scope of the present invention, when being used for a variety of modifications and variations.Therefore, protection scope of the present invention is when being as the criterion depending on the appended right person of defining.
Claims (12)
1. a complex function interface test system, comprising:
One test system, is provided with a testing software and comprises an interface to be measured, and this interface to be measured comprises one first group of pin position and one second group of pin position; And
One proving installation, comprising:
A connector, comprise one the 3rd group of pin position and one the 4th group of pin position, the 3rd group of pin position and this first group of pin position belong to one first communication standard, and the 4th group of pin position and this second group of pin position belong to a second communication standard;
One handover module, in order to switch the 3rd group of pin position and the 4th group of pin position;
One storage module, is coupled to this handover module; And
One control module, in order to control this handover module when this connector is connected to this interface to be measured, this interface to be measured is made to be electrically connected to this handover module and this storage module to test by this first group of pin position and the 3rd group of pin position or this second group of pin position and the 4th group of pin position.
2. complex function interface test system according to claim 1, wherein this first communication standard is universal serial bus port USB2.0 communication standard, and this second communication standard is USB3.0 communication standard.
3. complex function interface test system according to claim 1, wherein this first group of pin position comprises a bus voltage pin position, 3rd group of pin position comprises another bus voltage pin position, and when this connector is connected to this interface to be measured, this test system by be electrically connected this bus voltage pin position and this another bus voltage pin position power to this storage module.
4. complex function interface test system according to claim 3, wherein when this connector is connected to this interface to be measured by a cable, this controller controls this handover module and is electrically connected this storage module to switch the 3rd group of pin position;
When this testing software does not detect this storage module by this first group of pin position and the 3rd group of pin position, this testing software judges that this first group of pins is that pin is abnormal;
When this testing software detects this storage module, this testing software reads and writes/test transmission to this storage module;
When this testing software judges this read-write/test transmission failure, this testing software judges that this first group of pins is dysfunction.
5. complex function interface test system according to claim 3, wherein when this connector is connected to this interface to be measured by a cable, this controller controls this handover module and is electrically connected this storage module to switch the 4th group of pin position;
When this testing software does not detect this storage module by this second group of pin position and the 4th group of pin position, this testing software judges that this second group of pins is that pin is abnormal;
When this testing software detects this storage module, this testing software reads and writes/test transmission to this storage module;
When this testing software judges this read-write/test transmission failure, this testing software judges that this second group of pins is dysfunction.
6. complex function interface test system according to claim 1, wherein this test system also comprises this interface to be measured multiple, this proving installation also comprises these connectors multiple of those interfaces to be measured corresponding, this handover module multiple and a switch unit, and this switch unit is connected between those handover modules and this storage module to switch those handover modules to this storage module.
7. a complex function interface test method, for a test system and a proving installation, this test system is provided with a testing software and comprises an interface to be measured, interface to be measured comprises one first group of pin position and one second group of pin position, this proving installation comprises a connector, a handover module, a storage module and a control module, and this complex function interface test method comprises:
When this connector is connected to this interface to be measured, utilize this control module to control one the 3rd group of pin position or one the 4th group of pin position that this handover module switches this connector, 3rd group of pin position and this first group of pin position belong to one first communication standard, and the 4th group of pin position and this second group of pin position belong to a second communication standard; And
This interface to be measured is utilized to be electrically connected to this handover module to test this storage module by this first group of pin position and the 3rd group of pin position or this second group of pin position and the 4th group of pin position.
8. complex function interface test method according to claim 7, wherein this first communication standard is universal serial bus port USB 2.0 communication standard, and this second communication standard is USB 3.0 communication standard.
9. complex function interface test method according to claim 7, wherein this first group of pin position comprises a bus voltage pin position, and the 3rd group of pin position comprises another bus voltage pin position, and this complex function interface test method also comprises:
When this connector is connected to this interface to be measured, utilize this test system by be electrically connected this bus voltage pin position and this another bus voltage pin position power to this storage module.
10. complex function interface test method according to claim 9, also comprises:
Utilize a cable that this connector is connected to this interface to be measured, and utilize this controller to control this handover module to be electrically connected this storage module to switch the 3rd group of pin position;
When this testing software does not detect this storage module by this first group of pin position and the 3rd group of pin position, this testing software judges that this first group of pins is that pin is abnormal;
When this testing software detects this storage module, this testing software reads and writes/test transmission to this storage module; And
When this testing software judges this read-write/test transmission failure, this testing software judges that this first group of pins is dysfunction.
11. complex function interface test methods according to claim 9, also comprise:
Utilize a cable that this connector is connected to this interface to be measured, and utilize this controller to control this handover module to be electrically connected this storage module to switch the 4th group of pin position;
When this testing software does not detect this storage module by this second group of pin position and the 4th group of pin position, this testing software judges that this second group of pins is that pin is abnormal;
When this testing software detects this storage module, this testing software reads and writes/test transmission to this storage module; And
When this testing software judges this read-write/test transmission failure, this testing software judges that this second group of pins is dysfunction.
12. complex function interface test methods according to claim 9, wherein this test system also comprises this interface to be measured multiple, this proving installation also comprises these connectors multiple of those interfaces to be measured corresponding, this handover module multiple and a switch unit, and this complex function interface test method also comprises:
Utilize this switch unit to switch those handover modules to this storage module.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW101127610 | 2012-07-31 | ||
| TW101127610A TWI445974B (en) | 2012-07-31 | 2012-07-31 | Test system and method for ports with multi functions |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103577293A CN103577293A (en) | 2014-02-12 |
| CN103577293B true CN103577293B (en) | 2015-09-02 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201210304291.4A Expired - Fee Related CN103577293B (en) | 2012-07-31 | 2012-08-24 | Composite function interface test system and method |
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| Country | Link |
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| CN (1) | CN103577293B (en) |
| TW (1) | TWI445974B (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107783865B (en) * | 2016-08-26 | 2021-02-12 | 神讯电脑(昆山)有限公司 | USB tester |
| CN108089073B (en) * | 2016-11-22 | 2020-03-10 | 技嘉科技股份有限公司 | Measuring tool and method for switching state of device to be measured |
| CN109490673A (en) * | 2018-12-11 | 2019-03-19 | 上海闻泰信息技术有限公司 | Signal port test equipment |
| CN111541589B (en) * | 2020-05-22 | 2023-05-23 | 广东电网有限责任公司 | Method, device and equipment for testing expansion module interface of intelligent terminal |
| CN111984533B (en) * | 2020-08-04 | 2023-02-03 | 深圳市拔超科技股份有限公司 | Software automation test system and method |
| CN113010388B (en) * | 2021-03-24 | 2022-08-19 | 深圳市领德创科技有限公司 | USB flash disk detection method and system |
| CN113238904B (en) * | 2021-05-25 | 2023-04-28 | 海光信息技术股份有限公司 | Interface switching device, interface testing method and interface switching system |
| CN113254285B (en) * | 2021-05-25 | 2023-02-28 | 海光信息技术股份有限公司 | Combined type testing device, equipment interface testing method and system |
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| CN1503132A (en) * | 2002-11-21 | 2004-06-09 | ��ʢ���ӹɷ�����˾ | Apparatus for testing output and of mainboard of computer |
| TW201133234A (en) * | 2010-03-17 | 2011-10-01 | Hon Hai Prec Ind Co Ltd | Testing apparatus and testing method for universal serial bus port |
| TW201201012A (en) * | 2010-06-18 | 2012-01-01 | Hon Hai Prec Ind Co Ltd | System and method for testing hard disk ports of a motherboard |
| CN102455965A (en) * | 2010-10-27 | 2012-05-16 | 英业达股份有限公司 | Electronic device test system and method |
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2012
- 2012-07-31 TW TW101127610A patent/TWI445974B/en not_active IP Right Cessation
- 2012-08-24 CN CN201210304291.4A patent/CN103577293B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1503132A (en) * | 2002-11-21 | 2004-06-09 | ��ʢ���ӹɷ�����˾ | Apparatus for testing output and of mainboard of computer |
| TW201133234A (en) * | 2010-03-17 | 2011-10-01 | Hon Hai Prec Ind Co Ltd | Testing apparatus and testing method for universal serial bus port |
| TW201201012A (en) * | 2010-06-18 | 2012-01-01 | Hon Hai Prec Ind Co Ltd | System and method for testing hard disk ports of a motherboard |
| CN102455965A (en) * | 2010-10-27 | 2012-05-16 | 英业达股份有限公司 | Electronic device test system and method |
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| Publication number | Publication date |
|---|---|
| TWI445974B (en) | 2014-07-21 |
| CN103577293A (en) | 2014-02-12 |
| TW201405145A (en) | 2014-02-01 |
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