CN113949654A - Test fixture for M.2 interface and use method thereof - Google Patents

Test fixture for M.2 interface and use method thereof Download PDF

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Publication number
CN113949654A
CN113949654A CN202111227075.XA CN202111227075A CN113949654A CN 113949654 A CN113949654 A CN 113949654A CN 202111227075 A CN202111227075 A CN 202111227075A CN 113949654 A CN113949654 A CN 113949654A
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China
Prior art keywords
connector
interface
test
test fixture
connectors
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CN202111227075.XA
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Chinese (zh)
Inventor
明慧
李少昆
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Nanchang Huaqin Electronic Technology Co ltd
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Nanchang Huaqin Electronic Technology Co ltd
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Priority to CN202111227075.XA priority Critical patent/CN113949654A/en
Publication of CN113949654A publication Critical patent/CN113949654A/en
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00Arrangements for monitoring or testing data switching networks
    • H04L43/18Protocol analysers

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  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention discloses a test fixture for an M.2 interface and a using method thereof, wherein the test fixture comprises: the device comprises a first connector, a second connector and a third connector, wherein the first connector is used for connecting an M.2 interface on a tested device, and the M.2 interface supports at least two communication protocols; at least two second connectors, wherein the at least two second connectors are respectively connected with the first connectors, and different second connectors correspond to different communication protocols; the second connector is used for transmitting the corresponding communication protocol signal to the test equipment for signal test; and the first connector and the second connector are respectively connected with the online detection module. The invention not only can lead out various communication protocol signals to the test equipment for testing so as to improve the test efficiency, but also can insert the electronic equipment into the test fixture for use so as to reduce the use cost and ensure the signal integrity and the universality of the M.2 interface.

Description

Test fixture for M.2 interface and use method thereof
Technical Field
The invention belongs to the technical field of physical layer high-speed signal testing, and particularly relates to a testing jig for an M.2 interface and a using method thereof.
Background
The M.2 interface is a new host interface scheme and can be compatible with various communication protocols, such as sata, PCIE, USB, HSIC, UART, SMBus and the like. Before the m.2 interface is used, signal testing needs to be performed on the m.2 interface. In the prior art, an m.2 interface applied to a device generally supports more than one communication protocol, for example, supports two communication protocols of USB and PCIE simultaneously. However, the conventional test fixture can only lead out a communication protocol signal to the test equipment, so that the USB and PCIE signal tests of the m.2 interface cannot be completed simultaneously, which reduces the test efficiency.
Disclosure of Invention
The invention provides a test fixture for an M.2 interface and a using method thereof, which can solve or at least partially solve the technical problems.
Therefore, the invention adopts the following technical scheme:
in a first aspect, a test fixture for an m.2 interface is provided, including:
the device comprises a first connector, a second connector and a third connector, wherein the first connector is used for connecting an M.2 interface on a tested device, and the M.2 interface supports at least two communication protocols;
at least two second connectors, wherein the at least two second connectors are respectively connected with the first connectors, and different second connectors correspond to different communication protocols; the second connector is used for transmitting the corresponding communication protocol signal to the test equipment for signal test.
Optionally, the system further comprises an online detection module, and the first connector and the second connector are respectively connected to the online detection module;
the online detection module is used for detecting whether the second connector is connected with the electronic equipment or not, transmitting a detection result to the tested equipment through the first connector, and configuring the M.2 interface by the tested equipment according to the detection result; the electronic device supports the communication protocol corresponding to the second connector.
Optionally, the first connector is an m.2 connector male, and the m.2 interface is an m.2 connector female.
Optionally, the first connector is connected to the m.2 interface through a gold finger.
Optionally, the test apparatus includes at least two groups of test devices, different ones of the test devices corresponding to different ones of the communication protocols;
the testing device comprises a third connector connected with the second connector and a tester connected with the third connector, and the tester is used for carrying out signal testing on communication protocol signals corresponding to the testing device.
Optionally, the at least two communication protocols include two communication protocols, USB and PCIE.
Optionally, the at least two second connectors include a USB connector female and a PCIE connector female.
In a second aspect, there is provided a method for using the test fixture for m.2 interface as described above, including:
the first connector of the test fixture is connected with an M.2 interface on the tested device;
at least two second connectors of the test fixture are respectively connected with test equipment;
and the test equipment respectively carries out signal test on at least two communication protocol signals of the M.2 interface.
Optionally, the test apparatus includes at least two groups of test devices, different ones of the test devices corresponding to different ones of the communication protocols; the testing device comprises a third connector connected with the second connector and a tester connected with the third connector;
the test equipment respectively carries out signal test on at least two communication protocol signals of the M.2 interface, and the signal test equipment comprises the following steps:
the tester carries out de-embedding operation according to the S parameter model of the third connector;
and the tester performs signal test on the communication protocol signal corresponding to the test device.
In a third aspect, there is provided a method for using the test fixture for m.2 interface as described above, including:
the online detection module of the test fixture detects whether the second connector is connected with electronic equipment, and the electronic equipment supports the communication protocol corresponding to the second connector;
the online detection module transmits a detection result to the tested equipment through the first connector;
and the tested device configures an M.2 interface according to the detection result.
Compared with the prior art, the embodiment of the invention has the following beneficial effects:
the test fixture for the M.2 interface and the use method thereof provided by the embodiment of the invention have the advantages that the test fixture is integrated with at least two second connectors, and when the test fixture is used, the test equipment can simultaneously carry out signal test on at least two communication protocol signals, so that the test efficiency is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
The structures, ratios, sizes, and the like shown in the present specification are only used for matching with the contents disclosed in the specification, so that those skilled in the art can understand and read the present invention, and do not limit the conditions for implementing the present invention, so that the present invention has no technical significance, and any structural modifications, changes in the ratio relationship, or adjustments of the sizes, without affecting the functions and purposes of the present invention, should still fall within the scope covered by the contents disclosed in the present invention.
Fig. 1 is a schematic structural diagram of a test fixture for an m.2 interface according to an embodiment of the present invention;
fig. 2 is a schematic diagram illustrating an embodiment of a test fixture for an m.2 interface;
fig. 3 is another schematic usage diagram of a test fixture for an m.2 interface according to an embodiment of the present invention.
Detailed Description
In order to make the objects, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the embodiments described below are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example one
Referring to fig. 1 and 2, the test fixture for the m.2 interface provided in the present embodiment can perform signal testing on multiple communication protocol signals of the m.2 interface at the same time, so as to improve the testing efficiency, thereby solving the background problem.
The test fixture comprises a first connector and at least two second connectors. The first connector is used for connecting an M.2 interface on the tested device, and the M.2 interface supports at least two communication protocols.
As an optional implementation manner of this embodiment, the m.2 interface supports two communication protocols, namely USB and PCIE. Correspondingly, the test fixture comprises two second connectors, and the two second connectors correspond to the USB and the PCIE communication protocols respectively.
The two second connectors are respectively connected with the first connector and used for receiving the USB signal and the PCIE signal output by the M.2 interface, and the two second connectors respectively send the USB signal and the PCIE signal to the test equipment for testing.
The use method of the test fixture comprises the following steps:
the first connector of the test fixture is connected with an M.2 interface on the tested device;
the two second connectors of the test fixture are respectively connected with the test equipment;
and the test equipment respectively tests the USB signal and the PCIE signal of the M.2 interface.
Compared with the prior art, the test fixture integration that this embodiment provided has two second connectors, and during the use, test equipment can carry out signal test to two kinds of communication protocol signals simultaneously to improve efficiency of software testing.
As an alternative to this embodiment, the m.2 interface is an m.2 connector female. Accordingly, the first connector is an m.2 connector male.
As an optional implementation manner of this embodiment, the two second connectors are a USB connector female and a PCIE connector female, respectively.
As an optional implementation manner of this embodiment, the first connector is connected to the m.2 interface through a gold finger.
Therefore, in use, the first connector and the m.2 interface are connected by a golden finger, and the USB _ DP, USB _ DN and 3V3 power signals of the first connector are connected to a second connector. The PCIE _ TX _ P, PCIE _ TX _ N, PCIE _ RX _ P, PCIE _ RX _ N, CLK _100M _ P, CLK _100M _ N and 3V3 power signals of the first connector are connected to the other second connector. The test equipment respectively tests the signals transmitted by the two connectors.
As an optional implementation manner of this embodiment, the test apparatus includes two sets of test devices, and different test devices correspond to different communication protocols. The testing device comprises a third connector connected with the second connector and a tester connected with the third connector, and the tester is used for carrying out signal testing on communication protocol signals corresponding to the testing device.
It should be understood that a group of test devices tests a communication protocol signal, and belongs to the conventional technical means. Therefore, in this embodiment, the third connectors may be standard test fixtures in the prior art, that is, the two third connectors are a standard USB test fixture and a standard PCIE test fixture, respectively. And transmitting the communication protocol signal transmitted by the second connector to the tester for signal testing through the standard test fixture.
Further, in order to improve the accuracy of the test result, de-embedding is required. Specifically, an S parameter model of a standard test fixture is extracted, then a tester performs de-embedding operation through the S parameter model before testing, and then performs a preset signal test. In this embodiment, the tester is an oscilloscope.
Therefore, in the above steps, the method for testing signals of at least two communication protocol signals of the m.2 interface by the testing device includes the following steps:
the tester carries out de-embedding operation according to the S parameter model of the third connector;
the tester performs signal testing on the communication protocol signal corresponding to the testing device.
Example two
Further, the test fixture provided in the first embodiment has a single function, and is only used for leading out a communication protocol signal to the test equipment to assist in testing. Therefore, the embodiment provides a test fixture for an m.2 interface, which can insert a USB or PCIE device into the test fixture for use, so as to reduce the use cost and ensure the signal integrity and the universality of the m.2 interface.
Specifically, as shown in fig. 1 and 3, the test fixture further includes an online detection module, and the first connector and the two second connectors are respectively connected to the online detection module.
The online detection module is used for detecting whether the second connector is connected with the electronic equipment or not, transmitting a detection result to the tested equipment through the first connector, and configuring the M.2 interface for the tested equipment according to the detection result. The electronic device supports a communication protocol corresponding to the second connector.
Specifically, in this embodiment, the first connector is a male connector of the m.2 connector, and the m.2 interface is a female connector of the m.2 connector. The two second connectors are respectively a USB connector female head and a PCIE connector female head. Therefore, the two electronic devices correspond to a USB device and a PCIE device, respectively.
The use method of the test fixture for the m.2 interface provided by the embodiment includes the following steps:
the online detection module of the test fixture detects whether the second connector is connected with the electronic equipment; for example, whether a USB device or a PCIE device is connected is detected;
the online detection module transmits a detection result to the tested equipment through the first connector;
the tested device configures an M.2 interface according to the detection result; for example, the detection result is that the USB device is connected, and the device under test correctly configures the setting parameters related to the USB signal in the m.2 interface, so that the USB signal is more stable, and the USB device can be normally used.
In summary, the test fixture for the m.2 interface provided in this embodiment can not only lead out various communication protocol signals for testing the test equipment to improve the test efficiency, but also can insert the electronic equipment into the test fixture for use, so as to reduce the use cost and ensure the signal integrity and the universality of the m.2 interface.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.

Claims (10)

1. A test fixture for an M.2 interface, comprising:
the device comprises a first connector, a second connector and a third connector, wherein the first connector is used for connecting an M.2 interface on a tested device, and the M.2 interface supports at least two communication protocols;
at least two second connectors, wherein the at least two second connectors are respectively connected with the first connectors, and different second connectors correspond to different communication protocols; the second connector is used for transmitting the corresponding communication protocol signal to the test equipment for signal test.
2. The test fixture for the M.2 interface of claim 1, further comprising an online detection module, wherein the first connector and the second connector are respectively connected to the online detection module;
the online detection module is used for detecting whether the second connector is connected with the electronic equipment or not, transmitting a detection result to the tested equipment through the first connector, and configuring the M.2 interface by the tested equipment according to the detection result; the electronic device supports the communication protocol corresponding to the second connector.
3. The test fixture for the m.2 interface of claim 1 or 2, wherein the first connector is a male m.2 connector, and the m.2 interface is a female m.2 connector.
4. The test fixture for the M.2 interface of claim 1 or 2, wherein the first connector is connected to the M.2 interface through a gold finger.
5. The test fixture for the m.2 interface of claim 1 or 2, wherein the test equipment comprises at least two groups of test devices, different ones of the test devices corresponding to different ones of the communication protocols;
the testing device comprises a third connector connected with the second connector and a tester connected with the third connector, and the tester is used for carrying out signal testing on communication protocol signals corresponding to the testing device.
6. The test fixture for the m.2 interface of claim 1 or 2, wherein the at least two communication protocols comprise two communication protocols, USB and PCIE.
7. The test fixture for the m.2 interface of claim 1 or 2, wherein the at least two second connectors comprise a USB connector female and a PCIE connector female.
8. A method for using the test fixture for m.2 interface according to claim 1, comprising:
the first connector of the test fixture is connected with an M.2 interface on the tested device;
at least two second connectors of the test fixture are respectively connected with test equipment;
and the test equipment respectively carries out signal test on at least two communication protocol signals of the M.2 interface.
9. The use of the method of claim 8, wherein the test equipment comprises at least two sets of test devices, different ones of the test devices corresponding to different ones of the communication protocols; the testing device comprises a third connector connected with the second connector and a tester connected with the third connector;
the test equipment respectively carries out signal test on at least two communication protocol signals of the M.2 interface, and the signal test equipment comprises the following steps:
the tester carries out de-embedding operation according to the S parameter model of the third connector;
and the tester performs signal test on the communication protocol signal corresponding to the test device.
10. A method for using the test fixture for m.2 interface according to claim 2, comprising:
the online detection module of the test fixture detects whether the second connector is connected with electronic equipment, and the electronic equipment supports the communication protocol corresponding to the second connector;
the online detection module transmits a detection result to the tested equipment through the first connector;
and the tested device configures an M.2 interface according to the detection result.
CN202111227075.XA 2021-10-21 2021-10-21 Test fixture for M.2 interface and use method thereof Pending CN113949654A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115543893A (en) * 2022-11-30 2022-12-30 苏州浪潮智能科技有限公司 Server and interface extension method, device, system and storage medium thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180299485A1 (en) * 2017-04-17 2018-10-18 Western Digital Technologies, Inc. Methods, systems and devices for testing circuit modules using a microbackplane interface
CN109188145A (en) * 2018-09-21 2019-01-11 郑州云海信息技术有限公司 A kind of test fixture for M.2 interface
CN211062033U (en) * 2020-02-13 2020-07-21 上海闻泰信息技术有限公司 Test adapter and test equipment

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180299485A1 (en) * 2017-04-17 2018-10-18 Western Digital Technologies, Inc. Methods, systems and devices for testing circuit modules using a microbackplane interface
CN109188145A (en) * 2018-09-21 2019-01-11 郑州云海信息技术有限公司 A kind of test fixture for M.2 interface
CN211062033U (en) * 2020-02-13 2020-07-21 上海闻泰信息技术有限公司 Test adapter and test equipment

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115543893A (en) * 2022-11-30 2022-12-30 苏州浪潮智能科技有限公司 Server and interface extension method, device, system and storage medium thereof
CN115543893B (en) * 2022-11-30 2023-03-10 苏州浪潮智能科技有限公司 Server and interface expansion method, device and system thereof, and storage medium

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Application publication date: 20220118

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