CN113272622B - 用于操作用于生产层系统的涂覆设施的方法 - Google Patents
用于操作用于生产层系统的涂覆设施的方法 Download PDFInfo
- Publication number
- CN113272622B CN113272622B CN201980086583.5A CN201980086583A CN113272622B CN 113272622 B CN113272622 B CN 113272622B CN 201980086583 A CN201980086583 A CN 201980086583A CN 113272622 B CN113272622 B CN 113272622B
- Authority
- CN
- China
- Prior art keywords
- target
- actual
- simulated
- layer
- measurement curve
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29D—PRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
- B29D11/00—Producing optical elements, e.g. lenses or prisms
- B29D11/00865—Applying coatings; tinting; colouring
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/10—Optical coatings produced by application to, or surface treatment of, optical elements
- G02B1/11—Anti-reflection coatings
- G02B1/113—Anti-reflection coatings using inorganic layer materials only
- G02B1/115—Multilayers
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0012—Optical design, e.g. procedures, algorithms, optimisation routines
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29D—PRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
- B29D11/00—Producing optical elements, e.g. lenses or prisms
- B29D11/00009—Production of simple or compound lenses
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Optics & Photonics (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Inorganic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Ophthalmology & Optometry (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Surface Treatment Of Optical Elements (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102018133187.8A DE102018133187A1 (de) | 2018-12-20 | 2018-12-20 | Verfahren zum Betreiben einer Beschichtungsanlage zur Herstellung von Schichtsystemen |
| DE102018133187.8 | 2018-12-20 | ||
| PCT/EP2019/085810 WO2020127394A1 (de) | 2018-12-20 | 2019-12-17 | Verfahren zum betreiben einer beschichtungsanlage zur herstellung von schichtsystemen |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113272622A CN113272622A (zh) | 2021-08-17 |
| CN113272622B true CN113272622B (zh) | 2023-12-26 |
Family
ID=69375310
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201980086583.5A Active CN113272622B (zh) | 2018-12-20 | 2019-12-17 | 用于操作用于生产层系统的涂覆设施的方法 |
Country Status (11)
| Country | Link |
|---|---|
| US (2) | US12234547B2 (https=) |
| EP (2) | EP4451039B1 (https=) |
| JP (1) | JP2022513882A (https=) |
| CN (1) | CN113272622B (https=) |
| CL (1) | CL2021001579A1 (https=) |
| DE (1) | DE102018133187A1 (https=) |
| ES (1) | ES2989589T3 (https=) |
| IL (1) | IL283986B2 (https=) |
| MX (1) | MX2021007133A (https=) |
| PH (1) | PH12021551399A1 (https=) |
| WO (1) | WO2020127394A1 (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115449771B (zh) * | 2022-09-21 | 2025-01-28 | 华中科技大学 | 模具涂层生成方法、装置、设备、存储介质和程序产品 |
| CN116045791B (zh) * | 2023-04-03 | 2023-07-21 | 成都飞机工业(集团)有限责任公司 | 一种金属漆涂层厚度评估方法 |
| CN120745007B (zh) * | 2025-06-23 | 2026-03-27 | 深圳市艾丽斯卡文化创意有限公司 | 多材料混色工艺数字孪生仿真平台 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016110339A1 (de) * | 2015-01-07 | 2016-07-14 | Rodenstock Gmbh | Schichtsystem und optisches element mit einem schichtsystem |
| EP3346023A1 (en) * | 2017-01-05 | 2018-07-11 | Essilor International | Method for layer by layer optimization of a thin film |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011053573A (ja) * | 2009-09-04 | 2011-03-17 | Konica Minolta Opto Inc | 薄膜形成方法 |
| EP2826883B1 (en) * | 2013-07-17 | 2018-10-03 | Applied Materials, Inc. | Inline deposition control apparatus and method of inline deposition control |
| JP6869648B2 (ja) * | 2016-06-07 | 2021-05-12 | 日東電工株式会社 | 多層膜の成膜方法 |
-
2018
- 2018-12-20 DE DE102018133187.8A patent/DE102018133187A1/de active Pending
-
2019
- 2019-12-17 MX MX2021007133A patent/MX2021007133A/es unknown
- 2019-12-17 EP EP24192101.4A patent/EP4451039B1/de active Active
- 2019-12-17 PH PH1/2021/551399A patent/PH12021551399A1/en unknown
- 2019-12-17 US US17/414,652 patent/US12234547B2/en active Active
- 2019-12-17 EP EP19845695.6A patent/EP3899422B1/de active Active
- 2019-12-17 WO PCT/EP2019/085810 patent/WO2020127394A1/de not_active Ceased
- 2019-12-17 JP JP2021534251A patent/JP2022513882A/ja active Pending
- 2019-12-17 IL IL283986A patent/IL283986B2/en unknown
- 2019-12-17 ES ES19845695T patent/ES2989589T3/es active Active
- 2019-12-17 CN CN201980086583.5A patent/CN113272622B/zh active Active
-
2021
- 2021-06-16 CL CL2021001579A patent/CL2021001579A1/es unknown
-
2025
- 2025-01-17 US US19/029,478 patent/US20250163567A1/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2016110339A1 (de) * | 2015-01-07 | 2016-07-14 | Rodenstock Gmbh | Schichtsystem und optisches element mit einem schichtsystem |
| EP3346023A1 (en) * | 2017-01-05 | 2018-07-11 | Essilor International | Method for layer by layer optimization of a thin film |
Non-Patent Citations (1)
| Title |
|---|
| Simulation of reflectivity spectrum for non-absorbing multilayer optical thin films;V A KHERAJ等;《PRAMANA-journal of physics》;20090630;第72卷(第6期);第1011-1022段 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113272622A (zh) | 2021-08-17 |
| US20250163567A1 (en) | 2025-05-22 |
| IL283986A (en) | 2021-07-29 |
| IL283986B2 (en) | 2025-11-01 |
| EP3899422A1 (de) | 2021-10-27 |
| ES2989589T3 (es) | 2024-11-27 |
| BR112021011616A2 (pt) | 2021-08-31 |
| CL2021001579A1 (es) | 2022-02-04 |
| EP4451039A3 (de) | 2024-12-25 |
| EP4451039B1 (de) | 2026-03-25 |
| MX2021007133A (es) | 2021-11-03 |
| IL283986B1 (en) | 2025-07-01 |
| EP3899422B1 (de) | 2024-08-07 |
| US20220049347A1 (en) | 2022-02-17 |
| WO2020127394A1 (de) | 2020-06-25 |
| DE102018133187A1 (de) | 2020-06-25 |
| PH12021551399A1 (en) | 2022-05-11 |
| EP4451039A2 (de) | 2024-10-23 |
| JP2022513882A (ja) | 2022-02-09 |
| EP3899422C0 (de) | 2024-08-07 |
| US12234547B2 (en) | 2025-02-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20250163567A1 (en) | Method for operating a coating installation for producing layer systems | |
| US20190383972A1 (en) | Layer system and optical element comprising a layer system | |
| CN1795284B (zh) | 超低残留反射的低应力透镜涂层 | |
| JP7252324B2 (ja) | 層パケットのスタックを備えた光学素子、および当該光学素子を製造するための方法 | |
| CN106443841B (zh) | 一种超低剩余反射率ZnS基底长波减反射薄膜 | |
| EP3605202B1 (en) | Method and system for determining a lens of customized color | |
| JP7565353B2 (ja) | 層システムを製造するためのコーティングシステムを動作させる方法 | |
| CN110168133A (zh) | 薄膜的逐层优化方法 | |
| JP4622564B2 (ja) | 膜厚測定方法 | |
| JP2022513882A5 (https=) | ||
| RU2133049C1 (ru) | Способ нанесения просветляющего многослойного покрытия на поверхность оптического элемента и установка для осуществления способа | |
| Johnson | Bandpass filters: Past and present | |
| BR112021004390B1 (pt) | Elemento óptico com uma pilha de pacotes de camada e método para produzir o elemento óptico | |
| CN1173645A (zh) | 绿色薄膜的膜系结构 | |
| Yao et al. | New methods for determining optical constants of thin films from single measurements | |
| CN120762207A (zh) | 一种光学薄膜多波段响应特性协同调控方法 | |
| Vignaux et al. | Optimized procedure for in-situ optical monitoring of multilayer structures | |
| CN121159150A (zh) | 光学玻璃镀膜方法及光学玻璃 | |
| CN102542107A (zh) | 一种用于实现氟掺杂氧化锡镀膜玻璃表面色彩控制的方法 | |
| JPH10245673A (ja) | 光学薄膜設計システムおよび光学薄膜製造システム |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |