CN113176974A - 用于验证ip核的方法、装置及系统 - Google Patents
用于验证ip核的方法、装置及系统 Download PDFInfo
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- CN113176974A CN113176974A CN202110735623.3A CN202110735623A CN113176974A CN 113176974 A CN113176974 A CN 113176974A CN 202110735623 A CN202110735623 A CN 202110735623A CN 113176974 A CN113176974 A CN 113176974A
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- 238000000034 method Methods 0.000 title claims abstract description 61
- 238000012795 verification Methods 0.000 claims abstract description 163
- 238000012360 testing method Methods 0.000 claims abstract description 156
- 230000015654 memory Effects 0.000 claims abstract description 147
- 238000013524 data verification Methods 0.000 claims description 6
- 125000004122 cyclic group Chemical group 0.000 claims description 5
- 238000011161 development Methods 0.000 abstract description 6
- 230000007547 defect Effects 0.000 abstract description 4
- 230000008569 process Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 4
- 238000012544 monitoring process Methods 0.000 description 4
- 238000012546 transfer Methods 0.000 description 4
- 238000012937 correction Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 102100036725 Epithelial discoidin domain-containing receptor 1 Human genes 0.000 description 1
- 101710131668 Epithelial discoidin domain-containing receptor 1 Proteins 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
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CN202110735623.3A CN113176974B (zh) | 2021-06-30 | 2021-06-30 | 用于验证ip核的方法、装置及系统 |
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CN202110735623.3A CN113176974B (zh) | 2021-06-30 | 2021-06-30 | 用于验证ip核的方法、装置及系统 |
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CN113176974A true CN113176974A (zh) | 2021-07-27 |
CN113176974B CN113176974B (zh) | 2021-10-15 |
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Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6584586B1 (en) * | 2000-03-22 | 2003-06-24 | Advanced Micro Devices, Inc. | Apparatus and method for capturing and transferring internal system activity |
CN1609862A (zh) * | 2004-11-19 | 2005-04-27 | 华南理工大学 | 基于pci总线的ip核仿真验证平台及其验证方法 |
CN103713977A (zh) * | 2013-10-31 | 2014-04-09 | 中国船舶重工集团公司第七0九研究所 | 一种微处理器ip核比较验证的实现方法 |
CN106844126A (zh) * | 2016-12-23 | 2017-06-13 | 中国空间技术研究院 | 一种航天器用数字硬ip核功能及性能评测方法 |
CN109032868A (zh) * | 2018-07-26 | 2018-12-18 | 北京计算机技术及应用研究所 | 一种物理不可克隆函数ip核自动化验证装置 |
CN111832237A (zh) * | 2020-07-17 | 2020-10-27 | 北京昂瑞微电子技术有限公司 | 一种知识产权核验证方法及系统 |
CN111916140A (zh) * | 2019-05-10 | 2020-11-10 | 爱思开海力士有限公司 | 控制器及其操作方法以及包括控制器的存储器系统 |
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2021
- 2021-06-30 CN CN202110735623.3A patent/CN113176974B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6584586B1 (en) * | 2000-03-22 | 2003-06-24 | Advanced Micro Devices, Inc. | Apparatus and method for capturing and transferring internal system activity |
CN1609862A (zh) * | 2004-11-19 | 2005-04-27 | 华南理工大学 | 基于pci总线的ip核仿真验证平台及其验证方法 |
CN103713977A (zh) * | 2013-10-31 | 2014-04-09 | 中国船舶重工集团公司第七0九研究所 | 一种微处理器ip核比较验证的实现方法 |
CN106844126A (zh) * | 2016-12-23 | 2017-06-13 | 中国空间技术研究院 | 一种航天器用数字硬ip核功能及性能评测方法 |
CN109032868A (zh) * | 2018-07-26 | 2018-12-18 | 北京计算机技术及应用研究所 | 一种物理不可克隆函数ip核自动化验证装置 |
CN111916140A (zh) * | 2019-05-10 | 2020-11-10 | 爱思开海力士有限公司 | 控制器及其操作方法以及包括控制器的存储器系统 |
CN111832237A (zh) * | 2020-07-17 | 2020-10-27 | 北京昂瑞微电子技术有限公司 | 一种知识产权核验证方法及系统 |
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Address after: 100192 building 3, A District, Dongsheng science and Technology Park, Zhongguancun, 66 Haidian District West Road, Beijing. Patentee after: BEIJING SMARTCHIP MICROELECTRONICS TECHNOLOGY Co.,Ltd. Patentee after: BEIJING INSTITUTE OF TECHNOLOGY Patentee after: INFORMATION COMMUNICATION COMPANY OF STATE GRID SHANDONG ELECTRIC POWER Co. Patentee after: Qingdao Zhixin Semiconductor Technology Co.,Ltd. Patentee after: STATE GRID CORPORATION OF CHINA Patentee after: STATE GRID INFORMATION & TELECOMMUNICATION GROUP Co.,Ltd. Address before: 100192 building 3, A District, Dongsheng science and Technology Park, Zhongguancun, 66 Haidian District West Road, Beijing. Patentee before: BEIJING SMARTCHIP MICROELECTRONICS TECHNOLOGY Co.,Ltd. Patentee before: BEIJING INSTITUTE OF TECHNOLOGY Patentee before: INFORMATION COMMUNICATION COMPANY OF STATE GRID SHANDONG ELECTRIC POWER Co. Patentee before: State Grid Sigi Ziguang (Qingdao) Microelectronics Technology Co.,Ltd. Patentee before: STATE GRID CORPORATION OF CHINA Patentee before: STATE GRID INFORMATION & TELECOMMUNICATION GROUP Co.,Ltd. |
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