CN113077834A - Storage device testing method and device, television and storage medium - Google Patents

Storage device testing method and device, television and storage medium Download PDF

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Publication number
CN113077834A
CN113077834A CN202110445516.7A CN202110445516A CN113077834A CN 113077834 A CN113077834 A CN 113077834A CN 202110445516 A CN202110445516 A CN 202110445516A CN 113077834 A CN113077834 A CN 113077834A
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China
Prior art keywords
test result
testing
test
detected
storage equipment
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Inventor
付华东
许福
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Shenzhen Skyworth RGB Electronics Co Ltd
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Shenzhen Skyworth RGB Electronics Co Ltd
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Priority to CN202110445516.7A priority Critical patent/CN113077834A/en
Publication of CN113077834A publication Critical patent/CN113077834A/en
Priority to PCT/CN2021/107982 priority patent/WO2022222293A1/en
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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details

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  • Techniques For Improving Reliability Of Storages (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)

Abstract

The invention discloses a storage equipment testing method used for a television, which comprises the following steps: performing stability test on the storage equipment to be detected to obtain a stability test result; performing read-write speed test on the storage equipment to be detected to obtain a performance test result; performing aging test on the storage equipment to be tested to obtain an aging test result; performing power failure reliability test on the storage equipment to be detected to obtain a reliability test result; and obtaining the test result based on the stability test result, the performance test result, the aging test result and the power failure reliability test result. The invention also discloses a storage device testing device, a television and a computer readable storage medium. By using the storage device testing method, the accuracy of the storage device testing is improved.

Description

Storage device testing method and device, television and storage medium
Technical Field
The present invention relates to the field of storage technologies, and in particular, to a method and an apparatus for testing a storage device, a television, and a computer-readable storage medium.
Background
EMMC (embedded multimedia card) is an embedded storage device, and because of its high reliability, EMMC is widely used in various smart devices.
As the supply chain changes and television sets are updated, television manufacturers often change the EMMC of the television set. Before replacing the EMMC equipment of the television, new parameters of the EMMC are required to be configured according to the specification of the EMMC device so as to comprehensively test a new EMMC chip, and the EMMC can be introduced into a trial production after the fact that the new EMMC is free of problems is verified.
At present, the EMMC compatibility test is to test the quality and timing sequence of an EMMC signal to be used with an instrument to obtain a test result, and determine whether the EMMC to be used is qualified based on the test result.
However, with the existing testing method, the accuracy of the obtained test result of the EMMC to be used is low.
Disclosure of Invention
The invention mainly aims to provide a storage device testing method, a storage device testing device, a television and a computer readable storage medium, and aims to solve the technical problem that the accuracy of an EMMC (empirical mode modulation) test result to be used is low by adopting the existing testing method in the prior art.
In order to achieve the above object, the present invention provides a storage device testing method for a television, the method comprising the following steps:
performing stability test on the storage equipment to be detected to obtain a stability test result;
performing read-write speed test on the storage equipment to be detected to obtain a performance test result;
performing aging test on the storage equipment to be tested to obtain an aging test result;
performing power failure reliability test on the storage equipment to be detected to obtain a reliability test result;
and obtaining the test result based on the stability test result, the performance test result, the aging test result and the power failure reliability test result.
Optionally, the step of performing a stability test on the storage device to be tested to obtain a stability test result includes:
when a target multimedia file is acquired, storing the target multimedia file into the storage equipment to be detected;
when the target multimedia file is in a playing state and data writing is carried out on the storage equipment to be detected by using the writing script, the playing state of the target multimedia file and the writing speed of the storage equipment to be detected are obtained;
and obtaining the stability test result based on the writing speed and the playing state.
Optionally, before the step of obtaining the playing state of the target multimedia file and the writing speed of the storage device to be detected when the target multimedia file is in the playing state and the data writing is performed on the storage device to be detected by using the writing script, the method further includes:
and turning off the infrared remote control function of the television.
Optionally, the step of performing a read-write speed test on the storage device to be tested to obtain a performance test result includes:
acquiring a preset storage space of the data partition of the storage device to be detected;
determining the number of effective blocks based on the preset storage space;
configuring a preset writing speed test script and a preset reading speed test script based on the effective block number to obtain a writing speed test script and a reading speed test script;
testing the storage equipment to be tested by using the writing speed test script to obtain a writing speed test result;
testing the storage equipment to be tested by using the reading speed test script to obtain a reading speed test result;
and obtaining the performance test result based on the read speed test result and the write speed test result.
Optionally, the step of testing the storage device to be tested by using the read speed test script to obtain a read speed test result includes:
and after the television is restarted, testing the storage equipment to be tested by using the reading speed test script to obtain a reading speed test result.
Optionally, the step of performing an aging test on the storage device to be tested to obtain an aging test result includes:
when the television is in a low-temperature environment, testing the storage equipment to be detected for a preset time length by using an aging test script to obtain a first sub-aging test result;
when the television is in a high-temperature environment, testing the preset duration of the storage equipment to be tested by using the aging test script to obtain a second sub-aging test result;
when the television is in a temperature circulating environment, testing the preset time length on the storage equipment to be tested by using the aging test script to obtain a third sub-aging test result;
and obtaining the aging test result based on the first sub aging test result, the second sub aging test result and the third sub aging test result.
Optionally, the step of performing a power failure reliability test on the storage device to be tested to obtain a reliability test result includes:
when data are written into the storage equipment to be detected, the connection between the storage equipment to be detected and a power supply is disconnected;
reconnecting the storage device to be detected with the power supply;
detecting description information of data in the storage equipment to be detected;
and obtaining the power failure reliability test result based on the description information.
In addition, in order to achieve the above object, the present invention further provides a storage device testing apparatus for a television, the apparatus comprising:
the first test module is used for performing stability test on the storage equipment to be detected to obtain a stability test result;
the second testing module is used for testing the read-write speed of the storage equipment to be tested so as to obtain a performance testing result;
the third testing module is used for carrying out aging testing on the storage equipment to be tested so as to obtain an aging testing result;
the fourth testing module is used for carrying out power failure reliability testing on the storage equipment to be tested so as to obtain a reliability testing result;
and the obtaining module is used for obtaining the test result based on the stability test result, the performance test result, the aging test result and the power failure reliability test result.
In addition, to achieve the above object, the present invention further provides a television, including: a memory, a processor and a storage device test program stored on the memory and running on the processor, the storage device test program when executed by the processor implementing the steps of the storage device test method as claimed in any one of the above.
Furthermore, to achieve the above object, the present invention also provides a computer readable storage medium, which stores thereon a storage device testing program, which when executed by a processor implements the steps of the storage device testing method according to any one of the above.
The technical scheme of the invention provides a storage equipment testing method which is used for a television and obtains a stability testing result by testing the stability of storage equipment to be tested; performing read-write speed test on the storage equipment to be detected to obtain a performance test result; performing aging test on the storage equipment to be tested to obtain an aging test result; performing power failure reliability test on the storage equipment to be detected to obtain a reliability test result; and obtaining the test result based on the stability test result, the performance test result, the aging test result and the power failure reliability test result.
By adopting the existing testing method, the obtained testing result only comprises the signal instruction and the time sequence information of the storage equipment to be tested, the testing items in the testing process are fewer, and the information included in the testing result is incomplete, so that the accuracy of the testing result is lower. By adopting the storage equipment testing method, the testing result is obtained based on the stability testing result, the performance testing result, the aging testing result and the power failure reliability testing result, a plurality of testing items are involved in the testing process, the information reported by the testing result is relatively comprehensive, and the accuracy of the testing result is relatively high. Therefore, the storage device testing method improves the accuracy of storage device testing.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a television in a hardware operating environment according to an embodiment of the present invention;
FIG. 2 is a flow chart illustrating a first embodiment of a method for testing a memory device according to the present invention;
FIG. 3 is a block diagram of a first embodiment of a testing apparatus for a memory device according to the present invention.
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a television set in a hardware operating environment according to an embodiment of the present invention.
Generally, a television set includes: at least one processor 301, a memory 302, and a storage device test program stored on the memory and executable on the processor, the storage device test program configured to implement the steps of the storage device test method as previously described.
The processor 301 may include one or more processing cores, such as a 4-core processor, an 8-core processor, and so on. The processor 301 may be implemented in at least one hardware form of a DSP (Digital Signal Processing), an FPGA (Field-Programmable Gate Array), and a PLA (Programmable Logic Array). The processor 301 may also include a main processor and a coprocessor, where the main processor is a processor for processing data in an awake state, and is also called a Central Processing Unit (CPU); a coprocessor is a low power processor for processing data in a standby state. In some embodiments, the processor 301 may be integrated with a GPU (Graphics Processing Unit), which is responsible for rendering and drawing the content required to be displayed on the display screen. Processor 301 may also include an AI (Artificial Intelligence) processor for processing relevant storage device test method operations such that the storage device test method model may be trained autonomously, improving efficiency and accuracy.
Memory 302 may include one or more computer-readable storage media, which may be non-transitory. Memory 302 may also include high speed random access memory, as well as non-volatile memory, such as one or more magnetic disk storage devices, flash memory storage devices. In some embodiments, a non-transitory computer readable storage medium in memory 302 is used to store at least one instruction for execution by processor 301 to implement the storage device testing method provided by method embodiments herein.
In some embodiments, the terminal may further include: a communication interface 303 and at least one peripheral device. The processor 301, the memory 302 and the communication interface 303 may be connected by a bus or signal lines. Various peripheral devices may be connected to communication interface 303 via a bus, signal line, or circuit board. Specifically, the peripheral device includes: at least one of radio frequency circuitry 304, a display screen 305, and a power source 306.
The communication interface 303 may be used to connect at least one peripheral device related to I/O (Input/Output) to the processor 301 and the memory 302. In some embodiments, processor 301, memory 302, and communication interface 303 are integrated on the same chip or circuit board; in some other embodiments, any one or two of the processor 301, the memory 302 and the communication interface 303 may be implemented on a single chip or circuit board, which is not limited in this embodiment.
The Radio Frequency circuit 304 is used for receiving and transmitting RF (Radio Frequency) signals, also called electromagnetic signals. The radio frequency circuitry 304 communicates with communication networks and other communication devices via electromagnetic signals. The rf circuit 304 converts an electrical signal into an electromagnetic signal to transmit, or converts a received electromagnetic signal into an electrical signal. Optionally, the radio frequency circuit 304 comprises: an antenna system, an RF transceiver, one or more amplifiers, a tuner, an oscillator, a digital signal processor, a codec chipset, a subscriber identity module card, and so forth. The radio frequency circuitry 304 may communicate with other terminals via at least one wireless communication protocol. The wireless communication protocols include, but are not limited to: metropolitan area networks, various generation mobile communication networks (2G, 3G, 4G, and 5G), Wireless local area networks, and/or WiFi (Wireless Fidelity) networks. In some embodiments, the rf circuit 304 may further include NFC (Near Field Communication) related circuits, which are not limited in this application.
The display screen 305 is used to display a UI (User Interface). The UI may include graphics, text, icons, video, and any combination thereof. When the display screen 305 is a touch display screen, the display screen 305 also has the ability to capture touch signals on or over the surface of the display screen 305. The touch signal may be input to the processor 301 as a control signal for processing. At this point, the display screen 305 may also be used to provide virtual buttons and/or a virtual keyboard, also referred to as soft buttons and/or a soft keyboard. In some embodiments, the display screen 305 may be one, the front panel of the electronic device; in other embodiments, the display screens 305 may be at least two, respectively disposed on different surfaces of the electronic device or in a folded design; in still other embodiments, the display screen 305 may be a flexible display screen disposed on a curved surface or a folded surface of the electronic device. Even further, the display screen 305 may be arranged in a non-rectangular irregular figure, i.e. a shaped screen. The Display screen 305 may be made of LCD (liquid crystal Display), OLED (Organic Light-Emitting Diode), and the like.
The power supply 306 is used to power various components in the electronic device. The power source 306 may be alternating current, direct current, disposable or rechargeable. When the power source 306 includes a rechargeable battery, the rechargeable battery may support wired or wireless charging. The rechargeable battery may also be used to support fast charge technology.
Those skilled in the art will appreciate that the configuration shown in fig. 1 is not intended to be limiting of a television set and may include more or fewer components than those shown, or some components may be combined, or a different arrangement of components.
Furthermore, an embodiment of the present invention further provides a computer-readable storage medium, where a storage device testing program is stored on the computer-readable storage medium, and when being executed by a processor, the storage device testing program implements the steps of the storage device testing method described above. Therefore, a detailed description thereof will be omitted. In addition, the beneficial effects of the same method are not described in detail. For technical details not disclosed in embodiments of the computer-readable storage medium referred to in the present application, reference is made to the description of embodiments of the method of the present application. It is determined that the program instructions may be deployed to be executed on one television, or on multiple televisions located at one site, or on multiple television devices distributed across multiple sites and interconnected by a communication network, as examples.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by a computer program, which can be stored in a computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. The computer-readable storage medium may be a magnetic disk, an optical disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), or the like.
Based on the hardware structure, the embodiment of the storage device testing method is provided.
Referring to fig. 2, fig. 2 is a schematic flow chart of a first embodiment of a storage device testing method according to the present invention, where the method is used for a television, and the method includes the following steps:
step S11: and performing stability test on the storage equipment to be detected to obtain a stability test result.
It should be noted that the execution main body of the present invention is a television, the television is installed with a storage device test program, and when the television executes the storage device test program, the storage device test method of the present invention is implemented. The memory device to be detected in the present invention is an EMMC to be detected.
Generally, each index of the EMMC of the same brand and the same model is the same, and only a part of the EMMC needs to be taken out for sampling test. Generally, the EMMC to be detected is installed on a television, and the television executes the method for testing the storage device to realize the detection of the EMMC to be detected.
Specifically, the step of performing a stability test on the storage device to be tested to obtain a stability test result includes: when a target multimedia file is acquired, storing the target multimedia file into the storage equipment to be detected; when the target multimedia file is in a playing state and data writing is carried out on the storage equipment to be detected by using the writing script, the playing state of the target multimedia file and the writing speed of the storage equipment to be detected are obtained; and obtaining the stability test result based on the writing speed and the playing state.
It should be noted that the target multimedia file of the present invention is usually a video file, that is, when playing a video file stored in a storage device to be detected, a write-in script is used to write data into the storage device to be detected, and a playing state of the target multimedia file and a write-in speed of the storage device to be detected are obtained.
In the specific application, firstly, naming a new emmc _ write.sh script file under a data directory by touch/data/emmc _ write.sh; then, modifying the file authority by using a chmod 777/data/emmc _ write.sh command; the emmc write sh script file is then changed as follows:
count is 0 and the number of tests is 0
The "repeat" of starting an EMMC write test.
while [ $ count! 5000 when the cumulative number of tests is 5000
do
let count +1 test times +1
echo"EMMC write count>>>>>>>>>>>>$count"
Operation of clearing away/data/data 25000 from dd if/dev/zero of/data/data/1 bs 1024000count
sync
done
echo"EMMC write test pass..............."
Then copying the video file to/storage/embedded/0/directory, wherein the/storage/embedded/0/directory is a virtual SD card partition, and the embedded SD card is not really a virtual SD card partition made by a data partition of the EMMC; then, the video file is played in a local media single song circulation mode; in order to avoid interference during the test, by this command: stop android _ ir _ user, turn off the infrared function of the television, and then execute the script emmc _ write. And (4) running for 5000 times, determining whether video playing is normal (whether images and sound are normal and whether a pause phenomenon occurs) and whether the writing speed of the EMMC to be detected is greatly different in the running process, and thus obtaining a stability test result of the EMMC to be detected.
When the video is played normally and the writing speed difference of the EMMC to be detected is not large, the stability test result of the EMMC to be detected is good in stability (or qualified in stability and the like).
Step S12: and carrying out read-write speed test on the storage equipment to be detected to obtain a performance test result.
Specifically, the step of performing a read-write speed test on the storage device to be tested to obtain a performance test result includes: acquiring a preset storage space of the data partition of the storage device to be detected; determining the number of effective blocks based on the preset storage space; configuring a preset writing speed test script and a preset reading speed test script based on the effective block number to obtain a writing speed test script and a reading speed test script; testing the storage equipment to be tested by using the writing speed test script to obtain a writing speed test result; testing the storage equipment to be tested by using the reading speed test script to obtain a reading speed test result; and obtaining the performance test result based on the read speed test result and the write speed test result. The step of testing the storage device to be tested by using the read speed test script to obtain a read speed test result includes: and after the television is restarted, testing the storage equipment to be tested by using the reading speed test script to obtain a reading speed test result.
In specific application, a df command is used for checking the size (the size of a preset storage space) of a data partition (data partition) of a storage device to be detected, and then a count value of a read-write command is modified, so that the value of bs multiplied by the value of count is close to the size of the data partition, and the data partition is about 25G by taking 32G EMMC as an example. The following commands are used for performing a write speed test, and recording the write speed (the value of count changes with the size of the partition, for example, the size of a data partition is 25G, the value of count is 25000, the size of a data partition is 50G, and the value of count is 50000. the preset read speed test script and the preset write speed test script need to be configured by using the value of count, in addition, the preset read speed test script and the preset write speed test script in the present application can be replaced by test commands with general functions), and the commands are: dd if/dev/zero of/data/data/1 bs 1024000count 25000 (this command is a write operation, and clear operation of/data/data); then, the restart television performs a read speed test using the following commands, recording the read speed (the value of count varies with the partition size), as: ddof/dev/null if/data/data/1 bs 1024000count 25000. Generally, when the read-write performance test is performed, the write performance test is performed first, when the write test is performed, the read test is performed after the television is restarted, and the size of the read-write file needs to be as large as possible and is connected with the size of the data partition of the EMMC as much as possible, so that the measured data is accurate.
Step S13: and carrying out aging test on the storage equipment to be tested to obtain an aging test result.
Specifically, when the television is in a low-temperature environment, testing the storage device to be tested for a preset time length by using an aging test script to obtain a first sub-aging test result; when the television is in a high-temperature environment, testing the preset duration of the storage equipment to be tested by using the aging test script to obtain a second sub-aging test result; when the television is in a temperature circulating environment, testing the storage equipment to be detected for a preset time length by using the aging test script to obtain a third sub-aging test result; and obtaining the aging test result based on the first sub aging test result, the second sub aging test result and the third sub aging test result.
It should be noted that when the storage device to be detected is subjected to the aging test, a low-temperature environment, a high-temperature environment and a temperature cycle environment need to be involved, where the high-temperature environment may be 90 degrees celsius and the low-temperature environment may be-35 degrees celsius, and a user of the temperature cycle environment may determine the temperature cycle environment based on actual requirements, and the specific parameters are not limited in the present invention. In addition, the preset time period may be 7 days.
In specific application, a mmc.sh script is created, and the change is as follows:
sleep 10
count=1
while true
do
echo".write.............$count"
sync
dd of=/data/mmc_test if=/dev/block/mmcblk0p8
sync
count=$(($count+1))
echo"..read...........$count"
sync
dd if=/dev/block/mmcblk0p8 of=/dev/ram1
sync
count=$(($count+1))
rm/data/mmc_test
then, changing the execution authority of the mmc.sh script, chmod 777/data/mmc.sh; and then, putting the television into a temperature box with a set temperature, carrying out aging (high-temperature environment, low-temperature environment and temperature cycle environment) test, executing the above mmc.sh of the script, and storing a log file (log file) to obtain an aging test result based on the log file. If the problems of EMMC error reporting, television system abnormity and the like do not occur in the test process, the aging test result is that the storage equipment to be detected is qualified in the aging test.
Step S14: and performing power failure reliability test on the storage equipment to be detected to obtain a reliability test result.
Specifically, the step of performing a power failure reliability test on the storage device to be tested to obtain a reliability test result includes: when data are written into the storage equipment to be detected, the connection between the storage equipment to be detected and a power supply is disconnected; reconnecting the storage device to be detected with the power supply; detecting description information of data in the storage equipment to be detected; and obtaining the power failure reliability test result based on the description information.
It should be noted that the description information is a data integrity description in the storage to be detected, that is, when the description information is data integrity, the power failure reliability test result of the storage device to be detected is that the power failure reliability is better (or the power failure reliability test of the storage device to be detected is qualified); and when the description information is incomplete, the power failure reliability test result of the storage equipment to be detected is poor in power failure reliability (or the power failure reliability test of the storage equipment to be detected is unqualified).
In specific application, a macro definition is added in a device/Hisilicon/bigfish/sdk/source/boot/fastboot/include/CONFIG/s 5.h file, and the macro definition is to turn on a switch # define _ EMMC _ HW _ TEST of an EMMC power-down reliability TEST; after the modification, the boot is recompiled, the fastboot-burn is generated by burning and compiling, and the serial port of the television is connected with the computer; and after the power supply of the television is switched on and off again, the EMMC power-down reliability test which circulates for 5000 times is automatically carried out.
Log information (log information) needs to be stored in the test process, the test time is long, the power supply is not required to be switched on and off again after the test is stopped, and otherwise, the final test result cannot be seen. If the printing of the 'err: EMMC test fail' exists after the test is stopped, or the test is stopped when the test is not completed for 5000 times, the test is not qualified. After 5000 times of tests are finished, the printing of' EMMC test complete, no error.
In addition, Error conditions (unexpected, read, write, and erase operations are performed in block units) include two kinds: CRC and illegal command, if the CRC of the order sent to the apparatus of a certain address detects the mistake, will not carry out this order, will not respond to either; time-out conditions, the timeout Time for read, write and erase operations, typically 10 times the typical Time, is specified in the EMMC specification for each operation.
Step S15: and obtaining the test result based on the stability test result, the performance test result, the aging test result and the power failure reliability test result.
And integrating the plurality of test results to obtain a final test result, wherein the test result comprises test results corresponding to the four items respectively.
When the test results of the four items are all qualified, the final test result is also qualified; when at least one of the test results of the four items is not qualified, the final test result is not qualified, and the test result includes specific information of specific qualified items and specific information of non-qualified items.
The technical scheme of the invention provides a storage equipment testing method which is used for a television and obtains a stability testing result by testing the stability of storage equipment to be tested; performing read-write speed test on the storage equipment to be detected to obtain a performance test result; performing aging test on the storage equipment to be tested to obtain an aging test result; performing power failure reliability test on the storage equipment to be detected to obtain a reliability test result; and obtaining the test result based on the stability test result, the performance test result, the aging test result and the power failure reliability test result.
By adopting the existing testing method, the obtained testing result only comprises the signal instruction and the time sequence information of the storage equipment to be tested, the testing items in the testing process are fewer, and the information included in the testing result is incomplete, so that the accuracy of the testing result is lower. By adopting the storage equipment testing method, the testing result is obtained based on the stability testing result, the performance testing result, the aging testing result and the power failure reliability testing result, a plurality of testing items are involved in the testing process, the information reported by the testing result is relatively comprehensive, and the accuracy of the testing result is relatively high. Therefore, the storage device testing method improves the accuracy of storage device testing.
Referring to fig. 3, fig. 3 is a block diagram of a first embodiment of a storage device testing apparatus according to the present invention, the apparatus is used for a television, and the apparatus includes:
the first testing module 10 is configured to perform a stability test on the storage device to be tested to obtain a stability test result;
the second testing module 20 is configured to perform a read-write speed test on the storage device to be tested to obtain a performance test result;
the third testing module 30 is configured to perform an aging test on the storage device to be tested to obtain an aging test result;
the fourth testing module 40 is configured to perform a power failure reliability test on the storage device to be tested to obtain a reliability test result;
an obtaining module 50, configured to obtain the test result based on the stability test result, the performance test result, the aging test result, and the power failure reliability test result.
The above description is only an alternative embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications and equivalents of the present invention, which are made by the contents of the present specification and the accompanying drawings, or directly/indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims (10)

1. A storage device testing method, for use with a television, the method comprising the steps of:
performing stability test on the storage equipment to be detected to obtain a stability test result;
performing read-write speed test on the storage equipment to be detected to obtain a performance test result;
performing aging test on the storage equipment to be tested to obtain an aging test result;
performing power failure reliability test on the storage equipment to be detected to obtain a reliability test result;
and obtaining the test result based on the stability test result, the performance test result, the aging test result and the power failure reliability test result.
2. The method of claim 1, wherein the step of performing a stability test on the memory device to be tested to obtain a stability test result comprises:
when a target multimedia file is acquired, storing the target multimedia file into the storage equipment to be detected;
when the target multimedia file is in a playing state and data writing is carried out on the storage equipment to be detected by using the writing script, the playing state of the target multimedia file and the writing speed of the storage equipment to be detected are obtained;
and obtaining the stability test result based on the writing speed and the playing state.
3. The method as claimed in claim 2, wherein before the step of obtaining the playing status of the target multimedia file and the writing speed of the storage device to be detected when the target multimedia file is in the playing status and the data writing is performed on the storage device to be detected by using the writing script, the method further comprises:
and turning off the infrared remote control function of the television.
4. The method according to claim 3, wherein the step of performing a read-write speed test on the memory device to be tested to obtain a performance test result comprises:
acquiring a preset storage space of the data partition of the storage device to be detected;
determining the number of effective blocks based on the preset storage space;
configuring a preset writing speed test script and a preset reading speed test script based on the effective block number to obtain a writing speed test script and a reading speed test script;
testing the storage equipment to be tested by using the writing speed test script to obtain a writing speed test result;
testing the storage equipment to be tested by using the reading speed test script to obtain a reading speed test result;
and obtaining the performance test result based on the read speed test result and the write speed test result.
5. The method according to claim 4, wherein the step of testing the storage device to be tested by using the read speed test script to obtain a read speed test result comprises:
and after the television is restarted, testing the storage equipment to be tested by using the reading speed test script to obtain a reading speed test result.
6. The method of claim 5, wherein the step of performing a burn-in test on the memory device under test to obtain a burn-in test result comprises:
when the television is in a low-temperature environment, testing the storage equipment to be detected for a preset time length by using an aging test script to obtain a first sub-aging test result;
when the television is in a high-temperature environment, testing the preset duration of the storage equipment to be tested by using the aging test script to obtain a second sub-aging test result;
when the television is in a temperature circulating environment, testing the preset time length on the storage equipment to be tested by using the aging test script to obtain a third sub-aging test result;
and obtaining the aging test result based on the first sub aging test result, the second sub aging test result and the third sub aging test result.
7. The method of claim 6, wherein the step of performing a power-down reliability test on the storage device to be tested to obtain a reliability test result comprises:
when data are written into the storage equipment to be detected, the connection between the storage equipment to be detected and a power supply is disconnected;
reconnecting the storage device to be detected with the power supply;
detecting description information of data in the storage equipment to be detected;
and obtaining the power failure reliability test result based on the description information.
8. A storage device testing apparatus, for use with a television, the apparatus comprising:
the first test module is used for performing stability test on the storage equipment to be detected to obtain a stability test result;
the second testing module is used for testing the read-write speed of the storage equipment to be tested so as to obtain a performance testing result;
the third testing module is used for carrying out aging testing on the storage equipment to be tested so as to obtain an aging testing result;
the fourth testing module is used for carrying out power failure reliability testing on the storage equipment to be tested so as to obtain a reliability testing result;
and the obtaining module is used for obtaining the test result based on the stability test result, the performance test result, the aging test result and the power failure reliability test result.
9. A television set, characterized in that the television set comprises: memory, a processor and a storage device test program stored on the memory and running on the processor, the storage device test program when executed by the processor implementing the steps of the storage device testing method of any of claims 1 to 7.
10. A computer-readable storage medium, having stored thereon a storage device testing program which, when executed by a processor, implements the steps of the storage device testing method of any of claims 1 to 7.
CN202110445516.7A 2021-04-23 2021-04-23 Storage device testing method and device, television and storage medium Pending CN113077834A (en)

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CN114705973A (en) * 2022-06-01 2022-07-05 北京航空航天大学杭州创新研究院 Non-invasive complex environment integrated circuit aging monitoring method
CN114705973B (en) * 2022-06-01 2022-11-11 北京航空航天大学杭州创新研究院 Non-invasive complex environment integrated circuit aging monitoring method
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