CN116312728A - TF card aging test method, device and system - Google Patents
TF card aging test method, device and system Download PDFInfo
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Abstract
The invention relates to the technical field of chip testing and discloses a method, a device and a system for testing the aging of a TF card.
Description
Technical Field
The invention relates to the technical field of chip testing, in particular to a method, a device and a system for testing TF card aging.
Background
The TF card is a storage device, and can write and read files, and the performance of the TF card is reduced along with the aging of the TF card, and the performance is particularly expressed in the reduction of the actual read-write speed and the actual capacity.
In order to find the aging problem of the TF card in time, the aging test can be used for detecting the TF card, in the current aging test, the TF card is usually required to be detected manually, the manual operation steps are complex, a plurality of test files are required to be prepared, the aging test of the TF card cannot be successfully carried out by ordinary people, and the skilled person also needs to consume considerable time and energy to carry out the aging test of the TF card, so that the efficiency is low.
Disclosure of Invention
The invention aims to provide a TF card aging test method, a TF card aging test device and a TF card aging test system, and aims to solve the problems that in the prior art, TF card aging detection needs to be carried out manually, steps are complex, and common people cannot operate smoothly.
The invention is realized in this way, the invention provides a TF card aging test method, which comprises the following steps:
image acquisition and image analysis are carried out on the surface of the TF card so as to obtain standard attribute information of the TF card; the standard attribute information comprises standard capacity and standard read-write speed of the TF card;
opening an attribute panel of the TF card to obtain the actual capacity of the TF card, and formatting the TF card;
selecting a test file A for testing according to the actual capacity of the TF card; the capacity of the test file A is 1-10% of the actual capacity of the TF card, and the capacity of the test file A is 5-25G;
continuously writing the test file A into the TF card, recording the writing speed A of the TF card in real time, and formatting the TF card after the test is finished; the capacity of the test file A is 5-25G;
writing a test file B into the TF card according to the actual capacity, continuously writing the test file A into the TF card, and recording the writing speed B of the TF card in real time; the capacity of the test file B is 50% -90% of the actual capacity;
continuously writing the test file C into the TF card according to the actual capacity, and recording the writing speed C of the TF card in real time; the capacity of the test file C is 5-25M;
reading a test file A in the TF card, and recording the reading speed D of the TF card in real time;
and comparing the writing speed A, the writing speed B, the writing speed C and the reading speed D of the TF card with the standard reading and writing speed of the TF card, and comparing the actual capacity of the TF card with the standard capacity of the TF card to judge the aging degree of the TF card.
In some embodiments, writing the test file B into the TF card according to the actual capacity, and then continuously writing the test file a into the TF card, and recording the writing speed B of the TF card in real time includes:
writing a test file B into the TF card; the capacity of the test file B1 is 50% of the actual capacity;
continuously writing a test file A into the TF card, and recording the writing speed B1 of the TF card in real time;
formatting the TF card;
writing a test file B into the TF card; the capacity of the test file B2 is 70% of the actual capacity;
continuously writing a test file A into the TF card, and recording the writing speed B2 of the TF card in real time;
formatting the TF card;
writing a test file B into the TF card; the capacity of the test file B3 is 90% of the actual capacity;
continuously writing the test file A into the TF card, and recording the writing speed B3 of the TF card in real time;
integrating the writing speed B1, the writing speed B2 and the writing speed B3 to obtain a writing speed B.
In some embodiments, writing the test file B into the TF card according to the actual capacity, and then continuously writing the test file a into the TF card, and recording the writing speed B of the TF card in real time includes:
writing a test file B into the TF card; the capacity of the test file B is 50% of the actual capacity;
continuously writing the test file A into the TF card until the residual capacity of the TF card is 30% of the actual capacity, and recording the writing speed B1 of the TF card in real time;
continuously writing the test file A into the TF card until the residual capacity of the TF card is 10% of the actual capacity, and recording the writing speed B2 of the TF card in real time;
continuously writing the test file A into the TF card, and recording the writing speed B3 of the TF card in real time;
integrating the writing speed B1, the writing speed B2 and the writing speed B3 to obtain a writing speed B.
In some embodiments, the continuously writing the test file C to the TF card according to the actual capacity, and recording the writing speed C of the TF card in real time includes:
detecting the residual capacity of the TF card, and deleting one test file A in the TF card if the residual capacity of the TF card is smaller than 1G;
and continuously writing the test file C into the TF card, and recording the writing speed C of the TF card in real time.
In some embodiments, the reading the test file a in the TF card and recording the reading speed D of the TF card in real time includes:
and copying or cutting one test file A in the TF card, pasting the test file A outside the TF card, and recording the reading speed D of the TF card in real time.
In some embodiments, comparing the writing speed a, the writing speed B, the writing speed C, and the reading speed D of the TF card with the standard reading speed of the TF card, and comparing the actual capacity of the TF card with the standard capacity of the TF card to determine the aging degree of the TF card includes:
calculating the ratio of the writing speed A to the standard reading and writing speed to obtain an aging parameter A;
calculating the ratio of the writing speed B to the standard reading and writing speed to obtain an aging parameter B;
calculating the ratio of the writing speed C to the standard reading and writing speed to obtain an aging parameter C;
calculating the ratio of the reading speed D to the standard reading speed to obtain an aging parameter D;
and analyzing the aging degree of the TF card according to the aging parameter A, the aging parameter B, the aging parameter C and the aging parameter D.
In some embodiments, said analyzing the aging degree of the TF card according to the aging parameter a, the aging parameter B, the aging parameter C, and the aging parameter D comprises:
dividing the first segment, the second segment and the third segment; the first section is 90% -100%, the second section is 70% -90%, and the third section is 0% -70%;
assigning a score to the aging degree of the TF card according to the segment where the aging parameter A is located; assigning a score of 1 when the aging parameter a is in a first segment, assigning a score of 3 when the aging parameter a is in a second segment, and assigning a score of 5 when the aging parameter a is in a third segment;
assigning a score to the aging degree of the TF card according to the segment where the aging parameter B is located; assigning a score of 1 when the aging parameter B is in a first segment, assigning a score of 2 when the aging parameter B is in a second segment, and assigning a score of 3 when the aging parameter B is in a third segment;
assigning a score to the aging degree of the TF card according to the segment where the aging parameter C is located; assigning a score of 1 when the aging parameter C is in a first segment, assigning a score of 2 when the aging parameter C is in a second segment, and assigning a score of 3 when the aging parameter C is in a third segment;
assigning a score to the aging degree of the TF card according to the segment where the aging parameter D is located; assigning a score of 1 when the aging parameter D is in a first segment, assigning a score of 2 when the aging parameter D is in a second segment, and assigning a score of 3 when the aging parameter D is in a third segment;
counting the sum of the scores of the ageing parameter A, the ageing parameter B, the ageing parameter C and the ageing parameter D, wherein the ageing degree of the TF card is slight when the sum of the scores is 4, the ageing degree of the TF card is moderate when the score is integrated to 5-9, and the ageing degree of the TF card is serious when the score is integrated to 10-14.
In a second aspect, the present invention provides a TF card aging test apparatus, configured to implement the aging test method for TF cards according to any one of the first aspect, including:
an image acquisition unit: the method is used for carrying out image acquisition and image analysis on the surface of the TF card;
pretreatment unit: the attribute panel is used for opening the TF card to acquire the actual capacity of the TF card and format the TF card;
a first test unit: the method comprises the steps of continuously writing a test file A into the TF card according to the actual capacity, recording the writing speed A of the TF card in real time, and formatting the TF card after the test is finished;
a second test unit: writing a test file B into the TF card according to the actual capacity, continuously writing the test file A into the TF card, and recording the writing speed B of the TF card in real time;
third test unit: continuously writing the test file C into the TF card according to the actual capacity, and recording the writing speed C of the TF card in real time;
fourth test unit: reading a test file A in the TF card, and recording the reading speed D of the TF card in real time;
a data analysis unit: and comparing the writing speed A, the writing speed B, the writing speed C and the reading speed D of the TF card with the standard reading and writing speed of the TF card, and comparing the actual capacity of the TF card with the standard capacity of the TF card to judge the aging degree of the TF card.
In a third aspect, the present invention provides a TF card burn-in test system, comprising: computer, TF card access structure, camera;
the computer is used for realizing the TF card aging test method according to any one of the first aspect;
the TF card access structure is electrically connected with the machine, and is used for the TF card access to be tested;
the camera is electrically connected with the computer, and the camera is used for acquiring images of the TF card on the TF card access structure.
In some embodiments, the TF card access structure has a plurality of TF card interfaces for different TF card access, the top of TF card interface is open, so that the camera obtains images of TF cards accessed to TF card interfaces.
The invention provides a TF card aging test method, which has the following beneficial effects:
according to the invention, large file continuous writing test, dirty disk test, small file continuous writing test and full disk reading test are carried out on the TF card through an automatic program, so that the actual reading and writing speed of the TF card is obtained, the actual reading and writing speed of the TF card is compared with the standard reading and writing speed of the TF card, the aging parameters of the TF card are obtained, the aging degree of the TF card can be judged according to the aging parameters of the TF card, in the whole process, the work needing manual operation is just to place the TF card in a TF card access structure, the operation is easy, the steps are simple, the detection efficiency is high, and the problems that in the prior art, the TF card aging detection needs manual operation, the steps are complex, and common people cannot operate smoothly are solved.
Drawings
Fig. 1 is a schematic diagram of a TF card aging test method according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
The same or similar reference numerals in the drawings of the present embodiment correspond to the same or similar components; in the description of the present invention, it should be understood that, if there is an azimuth or positional relationship indicated by terms such as "upper", "lower", "left", "right", etc., based on the azimuth or positional relationship shown in the drawings, it is only for convenience of describing the present invention and simplifying the description, but it is not indicated or implied that the apparatus or element referred to must have a specific azimuth, be constructed and operated in a specific azimuth, and thus terms describing the positional relationship in the drawings are merely illustrative and should not be construed as limitations of the present patent, and specific meanings of the terms described above may be understood by those skilled in the art according to specific circumstances.
The implementation of the present invention will be described in detail below with reference to specific embodiments.
Referring to FIG. 1, a preferred embodiment of the present invention is provided.
In a first aspect, the present invention provides a TF card aging test method, including:
s1: image acquisition and image analysis are carried out on the surface of the TF card so as to obtain standard attribute information of the TF card; the standard attribute information includes standard capacity and standard read-write speed of the TF card.
S2: and opening an attribute panel of the TF card to obtain the actual capacity of the TF card, and formatting the TF card.
S3: selecting a test file A for testing according to the actual capacity of the TF card; the capacity of the test file A is 1-10% of the actual capacity of the TF card, and the capacity of the test file A is 5-25G;
s4: continuously writing a test file A into the TF card, recording the writing speed A of the TF card in real time, and formatting the TF card after the test is finished; the capacity of test file a is 5-25G.
S5: writing a test file B into the TF card according to the actual capacity, continuously writing a test file A into the TF card, and recording the writing speed B of the TF card in real time; the capacity of the test file B is 50% -90% of the actual capacity.
S6: continuously writing the test file C into the TF card according to the actual capacity, and recording the writing speed C of the TF card in real time; the capacity of test file C is 5-25M.
S7: and reading the test file A in the TF card, and recording the reading speed D of the TF card in real time.
S8: and comparing the writing speed A, the writing speed B, the writing speed C and the reading speed D of the TF card with the standard reading and writing speed of the TF card, and comparing the actual capacity of the TF card with the standard capacity of the TF card to judge the aging degree of the TF card.
Specifically, in S1, a camera may collect an image of the surface of the TF card, and a sticker is usually disposed on the surface of the TF card, and a model number of the TF card and various information of the TF are drawn on the surface of the TF card, where standard attribute information of the TF, that is, standard capacity and standard read-write speed of the TF card, are included.
It can be understood that the TF card is used as a storage device, the most important performance is storage capacity and read-write speed, when the TF card is shipped newly, the actual capacity and the actual read-write speed of the TF card with qualified quality can both meet the standard capacity and the standard read-write speed, and as the TF card is used and aged, the actual performance of the TF can slide down, so that the aging degree of the TF card can be detected by detecting the actual capacity and the actual read-write speed of the TF card.
More specifically, in order to detect the TF card, the TF card needs to be connected to an electronic device to check the actual capacity of the TF card and detect the read-write speed.
Preferably, the electronic device for accessing the TF card is a computer, it is easy to understand that the computer can store and run an automation program, and can implement automatic detection of the TF card, and if the TF card is detected by other electronic devices, it is necessary to manually detect the TF card by a human.
More preferably, the TF card is not directly connected to the computer, but is connected to a TF card connection structure electrically connected to the computer, and the design method has the advantages that when the TF card is arranged on the TF card connection structure, the camera can collect the surface image of the TF card so as to obtain the standard attribute information of the TF card, if the TF card is directly connected to the computer, the camera cannot directly collect the surface image of the TF card, and the camera needs to be manually operated to align the TF card for image collection.
Specifically, in S2, after the TF card is connected to the computer, the attribute panel of the TF card is automatically opened by a preset program, and the attribute panel can display a plurality of items of information of the TF card, including the actual capacity of the TF card.
More specifically, after the information of the actual capacity of the TF card is obtained, the TF card needs to be detected at the actual read-write speed, and in order for each test of the TF card to be able to run properly, the TF card needs to be formatted to empty the files stored in the TF card, so as to avoid interference with each detection.
It is easy to see that if important information is stored in the TF card, the TF card should be transferred to other storage devices before testing, so as to avoid information loss.
More specifically, the read-write speed test for the TF card in the invention comprises four tests: s3, large file continuous writing test of S4, dirty disk test of S5, small file continuous writing test of S6, full disk reading test of S7.
Specifically, the continuous writing test of the large files in S3 and S4 is to continuously write the files with larger capacity into the TF card after the formatting process, so as to check whether the TF card is slowed down due to cache exhaustion and heating caused by long-time writing.
More specifically, the file with larger capacity used in S3 and S4 is a test file a, the capacity of the test file a is 5-25G, and in the actual test, the specific capacity of the test file a is selected according to the actual capacity of the TF card, for example: when the actual capacity of the TF card is 32G, a 6G test file A is selected, and when the actual capacity of the TF card is 1T, a 25G test file A is selected.
More specifically, the capacity of the test file a is 5-25G, and the selected test file a is 1% -10% of the actual capacity of the TF card, that is, when a certain test file a is 1% -10% of the actual capacity of the TF card, the test file a is selected, when a plurality of test files a are in the TF card selection range, the test file a can be arbitrarily selected, and when no test file a is in the range, the closest test file a is selected.
It should be noted that, in order to enable the TF cards with different actual capacities to select the test files a with corresponding capacities, it is necessary to prepare test files a with various specifications in advance in the computer, and set a file selection program in the computer to select the test files a for the large file continuous writing test according to the actual capacities of the TF cards.
More specifically, when the continuous writing test of the large file in S3 and S4 is performed, the writing speed needs to be detected in the whole process to generate the writing speed a, the writing speed a can reflect whether the TF card can withstand capacity exhaustion and performance slip caused by device heating in a continuous working state, when the test file a cannot be written into the TF card any more, the continuous writing test of the large file is finished, and at the moment, formatting processing needs to be performed on the TF card for subsequent testing.
Specifically, the dirty disc test in S5 is to put a certain amount of files into the TF card, and then perform the writing speed test: this is because various types of storages have a characteristic that the writing speed is slower as the remaining capacity is smaller, and this characteristic is more remarkable when the TF card ages, so that whether the TF card ages can be detected by performing a dirty disc test on the TF card.
More specifically, in S5, the TF is filled by writing a test file B into the TF card, and in order to test the writing effect when the remaining capacity of the TF card is different, the capacity of the test file B is 50% -90% of the actual capacity of the TF card.
It will be understood that, as with the test file a, a plurality of specification test files B need to be prepared in advance to meet the requirements of TF cards of different types, and in order to be able to select the test file B of the corresponding capacity according to TF cards of different actual capacities, a plurality of specification test files B need to be prepared in advance in a computer, and a file selection program is set in the computer to select the test file B for filling TF cards according to the actual capacities of TF cards.
Specifically, the continuous writing test of the small file in S6 is to continuously write a file with smaller volume into the TF card on the basis of completing the dirty disc test, so as to perform the writing speed test: this is because the speed stability when writing small files into the storage device is lower than when writing a large file of the same volume.
More specifically, the small file used in S5 is a test file C, and the capacity of the test file C is 5-25M, and it should be noted that in S4 and S5, after the test file a is selected according to the actual capacity of the TF, the selection of the test file a may be kept unchanged, and writing of the test file a into the TF card may be repeated, and in S6, the test file C may not be selected according to the actual capacity of the TF card, but all the test files C may be cyclically written into the TF card, so that the writing speed of the TF card may be better tested.
Specifically, the full-disc reading test in S7 is to read a test file a in the TF card, and record the reading speed D of the TF card in real time: this is because the read speed of the TF card is correspondingly slowed down when the remaining capacity of the TF card is exhausted or nearly exhausted, and the read-write speed of the TF card includes the read speed and the write speed of the TF card.
Specifically, after the writing speed a, the writing speed B, the writing speed C and the reading speed D of the TF are obtained, these values can be compared with the standard reading and writing speeds, so as to determine the aging degree of the TF card.
The TF card aging test method provided by the invention has the following beneficial effects:
according to the invention, large file continuous writing test, dirty disk test, small file continuous writing test and full disk reading test are carried out on the TF card through an automatic program, so that the actual reading and writing speed of the TF card is obtained, the actual reading and writing speed of the TF card is compared with the standard reading and writing speed of the TF card, the aging parameters of the TF card are obtained, the aging degree of the TF card can be judged according to the aging parameters of the TF card, in the whole process, the work needing manual operation is just to place the TF card in a TF card access structure, the operation is easy, the steps are simple, the detection efficiency is high, and the problems that in the prior art, the TF card aging detection needs manual operation, the steps are complex, and common people cannot operate smoothly are solved.
In some embodiments, S5 comprises:
s51: writing a test file B into the TF card; the capacity of test file B is 50% of the actual capacity.
S52: and continuously writing the test file A into the TF card, and recording the writing speed B1 of the TF card in real time.
S53: the TF card is formatted.
S54: writing a test file B into the TF card; the capacity of test file B was 70% of the actual capacity.
S55: and continuously writing the test file A into the TF card, and recording the writing speed B2 of the TF card in real time.
S56: the TF card is formatted.
S57: writing a test file B into the TF card; the capacity of test file B was 90% of the actual capacity.
S58: and continuously writing the test file A into the TF card, and recording the writing speed B3 of the TF card in real time.
S59: the writing speed B1, the writing speed B2, and the writing speed B3 are integrated to obtain a writing speed B.
Specifically, the test file B in S51 is referred to as a test file B1, and the test file B in S54 is referred to as a test file B2, and the test file B in S57 is referred to as a test file B3, and the capacities of the test file B1, the test file B2, and the test file B3 are sequentially increased, that is, the TF card is subjected to multiple dirty disc tests, and the pressure of each dirty disc test is sequentially increased.
An embodiment is provided below: the capacity of the test file B1 is 50% of the actual capacity of the TF card, the capacity of the test file B2 is 70% of the actual capacity of the TF card, and the capacity of the test file B3 is 90% of the actual capacity of the TF card.
The above is only an embodiment, and does not represent a limitation on the test files B, and in actual operation, when the actual capacity of the TF is inconsistent with the standard capacity, there may occur a test file B that does not meet the requirements in the prepared test files B, and then the test file B with the closest capacity may be selected from the prepared test files B.
For S59, several specific embodiments are provided:
(1) the average of the writing speed B1, the writing speed B2, and the writing speed B3 is calculated, and the writing speed B is generated.
(2) Different weights are respectively given to the writing speed B1, the writing speed B2 and the writing speed B3, and the writing speed B is calculated according to the weights; writing speed b= (writing speed b1×0.6+writing speed b2×0.3+writing speed b3×0.1)/3.
In some embodiments, S5 comprises:
s51: and writing a test file B into the TF card, wherein the capacity of the test file B is 50% of the actual capacity.
S52: and continuously writing the test file A into the TF card until the residual capacity of the TF card is 30% of the actual capacity, and recording the writing speed B1 of the TF card in real time.
S53: and continuously writing the test file A into the TF card until the residual capacity of the TF card is 10% of the actual capacity, and recording the writing speed B2 of the TF card in real time.
S54: and continuously writing the test file A into the TF card, and recording the writing speed B3 of the TF card in real time.
S55: the writing speed B1, the writing speed B2, and the writing speed B3 are integrated to obtain a writing speed B.
Specifically, the test file B may be a test file of another capacity close to 50% of the actual capacity.
It will be appreciated that the above-described dirty testing step does not require multiple formatting, and multiple selection and writing of test files B, than the previous one provided, and is more efficient.
It should be noted that if the above-mentioned dirty disc testing step is adopted, it is necessary to distinguish between different writing speeds, and recording of a section of writing speed is completed every time a section of dirty disc test is completed.
Since the writing speeds of the different sections differ, the sections should be distinguished and then detected.
In some embodiments, the small file sequential write test of S6 includes:
s61: and detecting the residual capacity of the TF card, and deleting one test file A in the TF card if the residual capacity of the TF card is smaller than 1G.
S62: and continuously writing the test file C into the TF card, and recording the writing speed C of the TF card in real time.
Specifically, the continuous writing test of the small file is performed after the dirty disk test, the TF card is in a capacity-burst state after the dirty disk test is finished, the writing speed is reduced, and the detection difficulty can be further improved.
More specifically, in order to perform continuous writing test of small files, a certain storage space is required to be reserved for the TF card, so that the TF card needs to be detected for the residual capacity and a certain space is required to be cleaned.
More specifically, in S6, the test file C is used for the small file continuous writing test, the test file C is 5-25M, and it should be noted that, unlike the use of the test file a and the test file B in the foregoing test, in S6, the test files C with different specifications are used, that is, several test files C with the capacities between 5-25M are continuously written into the TF card for the small file continuous writing test.
In some embodiments, the full disk read test of S7 includes:
and copying or cutting one test file A in the TF card, pasting the test file A outside the TF card, and recording the reading speed D of the TF card in real time.
Specifically, the read-write speed of the TF card includes a write speed, which is a speed at which an external file is transferred to the inside of the TF card, and a read speed, which is a speed at which the file inside the TF card is transferred to the outside.
More specifically, when the capacity of the TF card is near exhaustion, the reading speed of the TF card is reduced, and thus the full disc reading test of S6 is performed after the continuous writing test of the small file of S5 is completed, and the obtained reading speed D can sufficiently and reliably reflect the performance of the TF card.
In some embodiments, S8 comprises:
s81: and calculating the ratio of the writing speed A to the standard reading and writing speed to obtain an aging parameter A.
S82: and calculating the ratio of the writing speed B to the standard reading and writing speed to obtain an aging parameter B.
S83: and calculating the ratio of the writing speed C to the standard reading and writing speed to obtain an aging parameter C.
S84: and calculating the ratio of the reading speed D to the standard reading speed to obtain the ageing parameter D.
S85: and analyzing the aging degree of the TF card according to the aging parameter A, the aging parameter B, the aging parameter C, the aging parameter D and the aging parameter E.
Specifically, through the above-mentioned tests, the writing speed a, the writing speed B, the writing speed C and the reading speed D can be obtained, these values belong to the actual reading and writing speed of the TF card, and the actual reading and writing speed of the TF card is compared with the standard reading and writing speed of the TF card, so that various aging parameters of the TF card can be obtained, and the aging degree of the TF can be analyzed.
It should be noted that, the writing speed a, the writing speed B, the writing speed C, and the reading speed D are actual reading and writing speeds obtained under different working environments, so that each aging parameter cannot be evaluated by the same set of criteria.
For example: the writing speed C is the actual reading and writing speed of the continuous writing test of the small file, while the writing speed a is the actual reading and writing speed of the continuous writing test of the large file, that is, when the aging degree of the TF card is unchanged, the writing speed C is also smaller than the writing speed a, so that the judging standards used by the aging parameter a and the aging parameter C cannot be the same, for example: when the ageing parameter a is 90%, it represents that the TF card has a certain degree of ageing, and when the ageing parameter C is 90%, it represents that the TF card has a slight degree of ageing.
In some embodiments, S85 comprises:
s851: dividing a first segment, a second segment, a third segment and a fourth segment; the first section is 90% -100%, the second section is 70% -90%, and the third section is 0% -70%.
S852: assigning a score to the aging degree of the TF card according to the segment where the aging parameter A is located; score 1 when the aging parameter a is in the first segment, score 3 when the aging parameter a is in the second segment, and score 5 when the aging parameter a is in the third segment.
S853: assigning a score to the aging degree of the TF card according to the segment where the aging parameter B is located; score 1 when the aging parameter B is in the first segment, score 2 when the aging parameter B is in the second segment, and score 3 when the aging parameter B is in the third segment.
S854: assigning a score to the aging degree of the TF card according to the segment where the aging parameter C is located; score 1 when the aging parameter C is in the first segment, score 2 when the aging parameter C is in the second segment, and score 3 when the aging parameter C is in the third segment.
S855: assigning 4 to the aging degree of the TF card according to the segment where the aging parameter D is located; score 1 when the aging parameter D is in the first segment, score 2 when the aging parameter D is in the second segment, and score 3 when the aging parameter D is in the third segment.
S856: counting the total score of the ageing parameters A, B, C and D, wherein the ageing degree of the TF card is slight when the total score is 4, medium when the total score is 5-9, and serious when the total score is 10-14.
The above is only one example and is not limiting of the analysis criteria.
In a second aspect, the present invention provides a TF card aging test apparatus, configured to implement the aging test method for TF cards according to the second aspect, including:
an image acquisition unit: the method is used for carrying out image acquisition and image analysis on the surface of the TF card.
Pretreatment unit: and the attribute panel is used for opening the TF card so as to acquire the actual capacity of the TF card and format the TF card.
A first test unit: the method is used for continuously writing the test file A into the TF card according to the actual capacity, recording the writing speed A of the TF card in real time, and formatting the TF card after the test is completed.
A second test unit: and writing a test file B into the TF card according to the actual capacity, continuously writing the test file A into the TF card, and recording the writing speed B of the TF card in real time.
Third test unit: and continuously writing the test file C into the TF card according to the actual capacity, and recording the writing speed C of the TF card in real time.
Fourth test unit: and reading the test file A in the TF card, and recording the reading speed D of the TF card in real time.
A data analysis unit: and comparing the writing speed A, the writing speed B, the writing speed C and the reading speed D of the TF card with the standard reading and writing speed of the TF card, and comparing the actual capacity of the TF card with the standard capacity of the TF card to judge the aging degree of the TF card.
In a third aspect, the present invention provides a TF card burn-in test system, comprising: computer, TF card access structure, camera.
Specifically, the computer is configured to implement a TF card aging test method according to any one of the first aspect.
More specifically, the TF card access structure is electrically connected to the computer, and the TF card access structure is used for accessing the TF card to be tested.
More specifically, the camera is electrically connected with the machine, and the camera is used for obtaining the image of TF card on the TF card access structure.
More specifically, the TF card access structure is provided with a plurality of TF card interfaces for the TF cards of different types to be accessed, and the TF card interfaces are opened above to facilitate the camera to acquire images of the TF cards accessed to the TF card interfaces.
It should be noted that, each test on the TF card needs to access the TF card into the computer, so that the program in the computer performs each operation such as writing, reading, formatting, and data recording on the TF card.
It should be noted that in the method provided by the invention, the surface image of the TF card needs to be acquired to identify the identification information on the surface of the TF card so as to acquire the standard attribute information of the TF, if the image is manually shot, the efficiency is low, so that a camera can be arranged on the TF card access structure and aligned to the TF card interface on the TF card access structure, and when the TF card is arranged on the TF card interface, the camera can acquire the surface image of the TF card.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, and alternatives falling within the spirit and principles of the invention.
Claims (10)
1. The TF card aging test method is characterized by comprising the following steps:
image acquisition and image analysis are carried out on the surface of the TF card so as to obtain standard attribute information of the TF card; the standard attribute information comprises standard capacity and standard read-write speed of the TF card;
opening an attribute panel of the TF card to obtain the actual capacity of the TF card, and formatting the TF card;
selecting a test file A for testing according to the actual capacity of the TF card; the capacity of the test file A is 1-10% of the actual capacity of the TF card, and the capacity of the test file A is 5-25G;
continuously writing the test file A into the TF card, recording the writing speed A of the TF card in real time, and formatting the TF card after the test is finished;
writing a test file B into the TF card according to the actual capacity, continuously writing the test file A into the TF card, and recording the writing speed B of the TF card in real time; the capacity of the test file B is 50% -90% of the actual capacity;
continuously writing the test file C into the TF card according to the actual capacity, and recording the writing speed C of the TF card in real time; the capacity of the test file C is 5-25M;
reading a test file A in the TF card, and recording the reading speed D of the TF card in real time;
and comparing the writing speed A, the writing speed B, the writing speed C and the reading speed D of the TF card with the standard reading and writing speed of the TF card, and comparing the actual capacity of the TF card with the standard capacity of the TF card to judge the aging degree of the TF card.
2. The method for aging test of TF cards according to claim 1, wherein said writing test file B into TF cards according to actual capacity, and then continuously writing said test file a into TF cards, and recording the writing speed B of TF cards in real time comprises:
writing a test file B into the TF card; the capacity of the test file B is 50% of the actual capacity;
continuously writing a test file A into the TF card, and recording the writing speed B1 of the TF card in real time;
formatting the TF card;
writing a test file B into the TF card; the capacity of the test file B is 70% of the actual capacity;
continuously writing a test file A into the TF card, and recording the writing speed B2 of the TF card in real time;
formatting the TF card;
writing a test file B into the TF card; the capacity of the test file B is 90% of the actual capacity;
continuously writing the test file A into the TF card, and recording the writing speed B3 of the TF card in real time;
integrating the writing speed B1, the writing speed B2 and the writing speed B3 to obtain a writing speed B.
3. The method for aging test of TF cards according to claim 1, wherein said writing test file B into TF cards according to actual capacity, and then continuously writing said test file a into TF cards, and recording the writing speed B of TF cards in real time comprises:
writing a test file B into the TF card; the capacity of the test file B is 50% of the actual capacity;
continuously writing the test file A into the TF card until the residual capacity of the TF card is 30% of the actual capacity, and recording the writing speed B1 of the TF card in real time;
continuously writing the test file A into the TF card until the residual capacity of the TF card is 10% of the actual capacity, and recording the writing speed B2 of the TF card in real time;
continuously writing the test file A into the TF card, and recording the writing speed B3 of the TF card in real time;
integrating the writing speed B1, the writing speed B2 and the writing speed B3 to obtain a writing speed B.
4. The method for aging test of TF cards according to claim 1, wherein said continuously writing test file C to TF cards according to actual capacity and recording the writing speed C of TF cards in real time comprises:
detecting the residual capacity of the TF card, and deleting one test file A in the TF card if the residual capacity of the TF card is smaller than 1G;
and continuously writing the test file C into the TF card, and recording the writing speed C of the TF card in real time.
5. The method for aging test of TF cards according to claim 1, wherein said reading the test file a in TF cards and recording the reading speed D of TF cards in real time comprises:
and copying or cutting one test file A in the TF card, pasting the test file A outside the TF card, and recording the reading speed D of the TF card in real time.
6. The method of claim 1, wherein comparing the writing speed a, the writing speed B, the writing speed C, and the reading speed D of the TF card with the standard reading speed of the TF card, and comparing the actual capacity of the TF card with the standard capacity of the TF card, to determine the aging degree of the TF card comprises:
calculating the ratio of the writing speed A to the standard reading and writing speed to obtain an aging parameter A;
calculating the ratio of the writing speed B to the standard reading and writing speed to obtain an aging parameter B;
calculating the ratio of the writing speed C to the standard reading and writing speed to obtain an aging parameter C;
calculating the ratio of the reading speed D to the standard reading speed to obtain an aging parameter D;
and analyzing the aging degree of the TF card according to the aging parameter A, the aging parameter B, the aging parameter C and the aging parameter D.
7. The method of claim 6, wherein said analyzing the aging degree of the TF card according to the aging parameter a, the aging parameter B, the aging parameter C, and the aging parameter D comprises:
dividing the first segment, the second segment and the third segment; the first section is 90% -100%, the second section is 70% -90%, and the third section is 0% -70%;
assigning a score to the aging degree of the TF card according to the segment where the aging parameter A is located; assigning a score of 1 when the aging parameter a is in a first segment, assigning a score of 3 when the aging parameter a is in a second segment, and assigning a score of 5 when the aging parameter a is in a third segment;
assigning a score to the aging degree of the TF card according to the segment where the aging parameter B is located; assigning a score of 1 when the aging parameter B is in a first segment, assigning a score of 2 when the aging parameter B is in a second segment, and assigning a score of 3 when the aging parameter B is in a third segment;
assigning a score to the aging degree of the TF card according to the segment where the aging parameter C is located; assigning a score of 1 when the aging parameter C is in a first segment, assigning a score of 2 when the aging parameter C is in a second segment, and assigning a score of 3 when the aging parameter C is in a third segment;
assigning a score to the aging degree of the TF card according to the segment where the aging parameter D is located; assigning a score of 1 when the aging parameter D is in a first segment, assigning a score of 2 when the aging parameter D is in a second segment, and assigning a score of 3 when the aging parameter D is in a third segment;
counting the sum of the scores of the ageing parameter A, the ageing parameter B, the ageing parameter C and the ageing parameter D, wherein the ageing degree of the TF card is slight when the sum of the scores is 4, the ageing degree of the TF card is moderate when the score is integrated to 5-9, and the ageing degree of the TF card is serious when the score is integrated to 10-14.
8. A TF card aging test apparatus for implementing a TF card aging test method according to any one of claims 1 to 7, comprising:
an image acquisition unit: the method is used for carrying out image acquisition and image analysis on the surface of the TF card;
pretreatment unit: the attribute panel is used for opening the TF card to acquire the actual capacity of the TF card and format the TF card;
a first test unit: the method comprises the steps of continuously writing a test file A into the TF card according to the actual capacity, recording the writing speed A of the TF card in real time, and formatting the TF card after the test is finished;
a second test unit: writing a test file B into the TF card according to the actual capacity, continuously writing the test file A into the TF card, and recording the writing speed B of the TF card in real time;
third test unit: continuously writing the test file C into the TF card according to the actual capacity, and recording the writing speed C of the TF card in real time;
fourth test unit: reading a test file A in the TF card, and recording the reading speed D of the TF card in real time;
a data analysis unit: and comparing the writing speed A, the writing speed B, the writing speed C and the reading speed D of the TF card with the standard reading and writing speed of the TF card, and comparing the actual capacity of the TF card with the standard capacity of the TF card to judge the aging degree of the TF card.
9. A TF card burn-in system, comprising: computer, TF card access structure, camera;
the computer is used for realizing the TF card aging test method according to any one of claims 1-7;
the TF card access structure is electrically connected with the machine, and is used for the TF card access to be tested;
the camera is electrically connected with the computer, and the camera is used for acquiring images of the TF card on the TF card access structure.
10. The TF card aging test system according to claim 9, wherein said TF card access structure has a plurality of TF card interfaces for different types of TF cards, and the top of said TF card interfaces is open, so that said camera can obtain images of TF cards accessing said TF card interfaces.
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