CN103000228A - Storage device test method and system - Google Patents
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Abstract
The invention discloses a test method of a storage device. First, a performance test platform is established by using script statements; test items are selected and configured through the performance test platform; and the storage device is tested. The test items comprise performance tests. In the performance tests, a concurrent number of threads running on the performance test platform is a half of a physical disk total number in the storage device; a read and write data amount is 110-130% of that of test storage cache; the performance tests comprise a read and write operations per second test and a throughput test. In the read and write operations per second test, data is transmitted according to a data block with a volume of 512 Byte. In the throughput test, data is transmitted according to a data block with a volume of 1024K Byte. The invention also discloses a test system of the storage device. With the test method and the test system of the storage device, various storage devices can be comprehensively tested with targets. Therefore, performance test speed and accuracy are improved.
Description
Technical field
The present invention relates to the memory device technical field, especially relate to a kind of method of testing and system of memory device.
Background technology
Memory device is the equipment for storing information, normally will be stored in order to the media of the modes such as electricity consumption, magnetic or optics behind the information digitalization again.And along with the improving constantly and the growth at full speed of data volume of the level of informatization, the importance of memory device in network is also more and more high.
The user need to test the memory device of choosing before choosing memory device, judged according to test result whether this memory device is the proper product that is fit to the own service needs.
Yet, in the testing scheme to memory device, have many weak points at present.For example, only for a kind of system environments, testing software has stronger dependence to system environments usually in a kind of testing software, and the versatility of testing scheme is lower, has improved the difficulty to the memory device test; And existing testing software only can provide the test result of product under the certain condition usually, as the test result of the product with 80 hard disks only can be provided, and for the product under other conditions, as has a product of 40 hard disks, but utilize the value of the test result that this testing software obtains very low, test speed is also slow.
The design parameter that existing each testing scheme is tested, uneven, more single, can not effectively comprehensively test and reflect the actual performance of memory device to memory device, can't satisfy user's needs.
Summary of the invention
The technical problem to be solved in the present invention is can carry out comprehensively various memory devices, test targetedly, raising performance test speed and accuracy.
For solving the problems of the technologies described above, the invention provides a kind of method of testing of memory device,
At first, utilize script sentence to make up Testing Platform;
Then, by described Testing Platform, choose, test event is set, memory device is tested.
Described test event comprises performance test, chooses, arranges the performance test project by described Testing Platform, and memory device is carried out performance test;
In performance test, the concurrent number of the thread that moves on the described Testing Platform is half of physical disks sum in the memory device; The amount of reading and writing data is 110%～130% of test storage buffer memory.
Described performance test comprises the test of per second read-write operation and testing throughput, in the test of per second read-write operation, according to the transmission of data blocks data of 512Byte size, in testing throughput, according to the transmission of data blocks data of 1024KByte size.
For solving the problems of the technologies described above, the present invention also provides a kind of test macro of memory device, and described system comprises testing server and memory device, and each described testing server is connected with at least one memory device by test network;
Operation has the Testing Platform that the script sentence utilized makes up on the described testing server;
Test event is chosen, arranged to described testing server by described Testing Platform is logical, and memory device is tested.
Described test event comprises performance test, chooses, arranges the performance test project by described Testing Platform, and memory device is carried out performance test;
In performance test, the concurrent number of the thread that moves on the described Testing Platform is half of physical disks sum in the memory device; The amount of reading and writing data is 110%～130% of test storage buffer memory.
Described performance test comprises the test of per second read-write operation and testing throughput, in the test of per second read-write operation, according to the transmission of data blocks data of 512Byte size, in testing throughput, according to the transmission of data blocks data of 1024KByte size.
The method of testing of memory device of the present invention, utilize script sentence to make up Testing Platform, because script is easy to revise and grasp, the Testing Platform that makes up can allow the tester easily and revise according to tested object fast and finished test, thereby make Testing Platform can be applicable to the multiple systems environment, reduce test to the dependence of system environments and the technical difficulty of test, greatly strengthened test dirigibility and efficient.
The method of testing of memory device of the present invention can be applicable to the test of memory device under the multiple condition, accurately reflects the performance of memory device, for the user provides professional test data reference when purchasing memory device; And, the method of testing of memory device of the present invention, choosing and arranging by test event, performance, function, stability, reliability and the compatibility that can reflect memory device comprehensively, can adjust as required the testing sequence of test event, perhaps the partial test project can be carried out comprehensively various memory devices, be tested targetedly, satisfies user's needs.
The method of testing of memory device of the present invention is come the read-write of data in the control performance test by the setting to key parameter on the Testing Platform, has improved the efficient of performance test, has accelerated test speed.
Description of drawings
Below in conjunction with the drawings and specific embodiments the present invention is further elaborated.
Fig. 1 is the schematic flow sheet of method of testing one embodiment of memory device of the present invention;
Fig. 2 is the test macro one embodiment schematic diagram of memory device of the present invention.
Embodiment
Method of testing one embodiment of memory device of the present invention as shown in Figure 1,
At first, utilize script sentence to make up Testing Platform;
Then, by described Testing Platform, choose, test event is set, memory device is tested; Described test event comprises performance test, functional test, stability test and pressure test, reliability testing, compatibility test.
The method of testing of memory device of the present invention, utilize script sentence to make up Testing Platform, because script is easy to revise and grasp, the Testing Platform that makes up can allow the tester easily and revise according to tested object fast and finished test, thereby make Testing Platform can be applicable to the multiple systems environment, reduce test to the dependence of system environments and the technical difficulty of test, greatly strengthened test dirigibility and efficient.
The method of testing of memory device of the present invention can be applicable to the test of memory device under the multiple condition, accurately reflects the performance of memory device, for the user provides professional test data reference when purchasing memory device; And, the method of testing of memory device of the present invention, choosing and arranging by test event, performance, function, stability, reliability and the compatibility that can reflect memory device comprehensively, can adjust as required the testing sequence of test event, perhaps the partial test project can be carried out comprehensively various memory devices, be tested targetedly, satisfies user's needs.
The first embodiment: carry out performance test.
In performance test, the concurrent number of the thread that moves on the described platform is half (for example when the physical disks in the memory device has 8, can move simultaneously 4 threads) of physical disks sum in the memory device;
The amount of reading and writing data of described performance test is 110%～130% (such as 110%, 120%, 130%) of test storage buffer memory;
Described performance test comprises per second read-write operation (Input Output Operations PerSecond, IOPS) test and testing throughput, in the IOPS test, transmission of data blocks data according to 512 Byte sizes, in testing throughput, according to the transmission of data blocks data of 1024K Byte size.
In IOPS test, can be 100,000 to the read-write number of times (count) of the database of 512 bytes, in testing throughput, can be 5000 to the read-write number of times of 1024K byte data piece, thereby make the amount of reading and writing data substantially be 5GB.
Exemplary, script sentence can be expressed as follows during test I/O PS:
time?dd?if＝/dev/zero?of＝/testsvct/test.io?bs＝512?count＝100k
time?dd?of＝/dev/null?if＝/testsvct/test.io?bs＝512?count＝100k
Script sentence can be expressed as follows during test throughput:
time?dd?if＝/dev/zero?of＝/testsvct/test.io?bs＝1024k?count＝5000
time?dd?of＝/dev/null?if＝/testsvct/test.io?bs＝1024k?count＝5000
By above-mentioned setting to key parameter in the amount of reading and writing data (5GB), IOPS test (512Byte) and handling capacity (1024KByte) test, can improve test speed.
The method of testing of memory device of the present invention is come the read-write of data in the control performance test by the setting to key parameter on the Testing Platform, has improved the efficient of performance test, has accelerated test speed.
Owing to being half of physical disks sum in the memory device at the concurrent number of the thread of Testing Platform described in performance test operation, practicality and the accuracy of its test have been strengthened, because the amount of reading and writing data of described performance test is 110%～130% of test storage buffer memory, thereby can obtain higher performance test speed and accuracy;
Because the data block size of the least unit sector of physical disk is 512Byte usually, therefore the method for testing of memory device of the present invention according to the transmission of data blocks data of 512Byte size, has increased popularity and the practicality of IOPS test in the IOPS test;
Because usually the read-write block size 1MB of the application such as Streaming Media and general large file software is unit, therefore the method for testing of memory device is in testing throughput, according to the transmission of data blocks data of 1024K Byte size, increase popularity and the accuracy of testing throughput.
The method of testing of memory device of the present invention is definite based on above all kinds of parameters, and is very short to each performance test test duration of memory device, is generally less than 5 minutes.
As seen, the method of testing of memory device of the present invention can be carried out performance test to polytype memory device well, such as file server (File Server), the webserver (Web Server) and online trade server (OLTP), also can carry out performance test under different condition to same memory device, the memory device when memory device with 80 hard disks or test are had 40 hard disks carries out performance test.
The second embodiment: carry out functional test.
Described functional test comprises Basic function testing and management function test,
Described Basic function testing comprises following at least one or its combination:
The maximum hard disk quantity in the high scale of main cabinet-type air conditioner case position, the high scale of extension cabinet cabinet position, system modular degree, amount controller, standard configuration/max-cache capacity, controller CPU, host channel interface specification, host channel interface quantity, disk extended channel, disk extended channel quantity, main cabinet, maximum storage capacity, extension cabinet type, largest extension cabinet quantity,
Raid-array (RAID) rank, maximum RAID quantity, the maximum hard disk quantity of single RAID, single RAID max cap., the online dilatation of RAID, RAID HotSpare disk, extension cabinet HotSpare disk, overall HotSpare disk, maximum LUN quantity, the online dilatation of LUN, gui management, CLI management, pilot lamp, system equipment monitoring capacity, performance monitoring, log management function, telemanagement ability;
Described management function test comprises following at least one or its combination:
System hardware test, disk group DG test, virtual disk VD test, host test, option test, system arrange test and failover/automatically recover FailOver/FailBack test.
Further, can also comprise mainframe box size measuring, the test of mainframe box weight, extension cabinet size measuring and the test of extension cabinet weight in the above-mentioned Basic function testing.
An example of the test event of Basic function testing and test result is as shown in table 1.
Table 1:
The test event of management function test and an example of test result are as shown in table 2.The test process part of table 2 is illustrated the concrete operations of each test event.
Table 2:
By the test event shown in table 1 and the table 2 and test process memory device is carried out functional test.Functional test mainly is system configuration, specifications parameter and index, basic memory management functions support, uses specific method of testing for each function items during test, carries out function and confirms.
The 3rd embodiment: carry out stability test and pressure test.
Referring to table 3, by in the given time memory device being kept the input and output of certain data traffic, whether the operation of investigation system is stable, and carries out the continuous test, observes memory device and abnormal occurrence whether occurs.
Table 3:
The test duration of aforementioned stable property testing is longer than the test duration of pressure test usually, for example, in stability test, can continue to read and write to memory device in the time more than a week, in pressure test, within two or three days time, memory device is continued to read and write.The data traffic of reading and writing in the pressure test can be greater than the data traffic in the stability test.
The 3rd embodiment: carry out reliability testing.
In reliability testing, by machine open/close repeatedly repeatedly, the operations such as hot plug power supply, disk, cable, can observe memory device work.An example of reliability testing is as shown in table 4.
Table 4:
The 4th embodiment: compatibility test.
In different operating system, memory device is carried out compatibility test, described operating system comprises Windows system, advanced mutual (the Advanced Interactive eXecutive of execution, AIX) system and linux system, described compatibility test comprise startup (Initiator) test and read-write capability test.
By with the virtual disk VD on the memory device, shine upon respectively (mapping) to each FC port of controller, so that memory device is carried out compatibility test.An example of compatibility test is as shown in table 5.
Table 5:
Test macro one embodiment of memory device of the present invention as shown in Figure 2, the test macro of described memory device comprises testing server 31 and memory device 32, each described testing server 31 is connected with at least one memory device 32 by test network 33;
Operation has the Testing Platform that the script sentence utilized makes up on the described testing server 31;
Described testing server 31 carries out performance test by described Testing Platform to memory device 32, is half of physical disks sum in the memory device 32 at the concurrent number of the thread that platform described in the performance test moves;
Wherein, the amount of reading and writing data of described performance test is 5GB, and described performance test comprises IOPS test and testing throughput, in the IOPS test, according to the transmission of data blocks data of 512Byte size, in testing throughput, according to the transmission of data blocks data of 1024K Byte size.
Further, described testing server 31 also is used for memory device is carried out functional test, and described functional test comprises Basic function testing and management function test; And/or,
Described testing server 31 also is used for by in the given time memory device being kept the input and output of certain data traffic, and memory device is carried out stability test and pressure test; And/or,
Described testing server 31 also is used for memory device is carried out reliability testing;
And/or,
Described testing server 31 also is used at different operating system memory device being carried out compatibility test.
Further, the Basic function testing that carries out of described testing server 31 comprises following at least one or its combination:
The maximum hard disk quantity in the high scale of main cabinet-type air conditioner case position, the high scale of extension cabinet cabinet position, system modular degree, amount controller, standard configuration/max-cache capacity, controller CPU, host channel interface specification, host channel interface quantity, disk extended channel, disk extended channel quantity, main cabinet, maximum storage capacity, extension cabinet type, largest extension cabinet quantity,
RAID rank, maximum RAID quantity, the maximum hard disk quantity of single RAID, single RAID max cap., the online dilatation of RAID, RAID HotSpare disk, extension cabinet HotSpare disk, overall HotSpare disk, maximum LUN quantity, the online dilatation of LUN, gui management, CLI management, pilot lamp, system equipment monitoring capacity, performance monitoring, log management function, telemanagement ability;
The management function test that described testing server 31 carries out comprises following at least one or its combination:
System hardware test, disk group DG test, virtual disk VD test, host test, option test, system arrange test and failover/automatically recover FailOver/FailBack test;
The reliability testing that described testing server 31 carries out comprises following at least one or its combination:
Test that repeated switching test, power down test, faulty hard disk are tested and cable goes offline.
In the test macro of described memory device, the specific works mode of testing server can be referring to the associated description of the inventive method embodiment.
The above only is preferred embodiment of the present invention, and is in order to limit the present invention, within the spirit and principles in the present invention not all, any modification of making, is equal to replacement, improvement etc., all should be included within the scope of protection of the invention.
Claims (17)
1. the method for testing of a memory device is characterized in that,
At first, utilize script sentence to make up Testing Platform;
Then, by described Testing Platform, choose, test event is set, memory device is tested.
2. the method for testing of memory device according to claim 1 is characterized in that, described test event comprises performance test, chooses, arranges the performance test project by described Testing Platform, and memory device is carried out performance test;
In performance test, the concurrent number of the thread that moves on the described Testing Platform is half of physical disks sum in the memory device; The amount of reading and writing data is 110%～130% of test storage buffer memory.
3. the method for testing of memory device according to claim 2, it is characterized in that, described performance test comprises the test of per second read-write operation and testing throughput, in the test of per second read-write operation, transmission of data blocks data according to 512 Byte sizes, in testing throughput, according to the transmission of data blocks data of 1024K Byte size.
4. method according to claim 1 is characterized in that, described test event comprises and also comprise functional test, and described functional test comprises Basic function testing and management function test;
Described Basic function testing comprises following at least one or its combination:
The high scale of main cabinet-type air conditioner case position, the high scale of extension cabinet cabinet position, the system modular degree, amount controller, standard configuration/max-cache capacity, controller CPU, the host channel interface specification, host channel interface quantity, the disk extended channel, disk extended channel quantity, the maximum hard disk quantity of main cabinet, maximum storage capacity, the extension cabinet type, largest extension cabinet quantity, raid-array RAID rank, maximum RAID quantity, the maximum hard disk quantity of single RAID, single RAID max cap., the online dilatation of RAID, the RAID HotSpare disk, the extension cabinet HotSpare disk, overall situation HotSpare disk, maximum LUN quantity, the online dilatation of LUN, gui management, the CLI management, pilot lamp, the system equipment monitoring capacity, performance monitoring, log management function, the telemanagement ability;
Described management function test comprises following at least one or its combination:
System hardware test, the test of disk group, virtual disk test, host test, option test, system arrange test and failover/automatically recovery test.
5. method according to claim 4 is characterized in that,
Described system hardware test comprises hardware state test, system journal test and ALM test;
The test of described disk group comprises that disk sets up vertical deletion test, uses that different stripe size are set up the test of disk group, Disk Group Properties revises test and RAID rebuilds test;
Described virtual disk test comprises that virtual disk establishment deletion test, the test of virtual disk attribute modification, virtual disk present test, virtual disk extend testing, the test of maximum virtual disk quantity, test and the data integrity property testing greater than the virtual disk of 2TB;
Described host test comprises adds deletion host test, the test of modification Host Properties and challenge handshake authentication protocol test;
Described option test comprises password modification test, refresh option test, test is set the warning of system health situation and system upgrade is tested;
Described system arranges the test pack includes network test, jumbo frame test, system initialization test and order line test is set.
6. method according to claim 1, it is characterized in that, described test event also comprises stability test and pressure test, by in the given time memory device being kept the input and output of certain data traffic, memory device is carried out stability test and pressure test.
7. method according to claim 1 is characterized in that, described test event also comprises reliability testing, and described reliability testing comprises following at least one or its combination:
Test that repeated switching test, power down test, faulty hard disk are tested and cable goes offline.
8. method according to claim 1 is characterized in that, described test event also comprises compatibility test, and described compatibility test is used for test storage equipment in the compatibility of different operating system.
9. method according to claim 8 is characterized in that, described operating system comprises Windows system, AIX system and linux system, and described compatibility test comprises starting to be tested and the read-write capability test.
10. the test macro of a memory device is characterized in that, described system comprises testing server and memory device, and each described testing server is connected with at least one memory device by test network;
Operation has the Testing Platform that the script sentence utilized makes up on the described testing server;
Test event is chosen, arranged to described testing server by described Testing Platform is logical, and memory device is tested.
11. the test macro of memory device according to claim 10 is characterized in that, described test event comprises performance test, chooses, arranges the performance test project by described Testing Platform, and memory device is carried out performance test;
In performance test, the concurrent number of the thread that moves on the described Testing Platform is half of physical disks sum in the memory device; The amount of reading and writing data is 110%～130% of test storage buffer memory.
12. the method for testing of memory device according to claim 11, it is characterized in that, described performance test comprises the test of per second read-write operation and testing throughput, in the test of per second read-write operation, transmission of data blocks data according to 512 Byte sizes, in testing throughput, according to the transmission of data blocks data of 1024K Byte size.
13. test macro according to claim 11 is characterized in that,
Described test event comprises and also comprises functional test, and described functional test comprises Basic function testing and management function test;
Described Basic function testing comprises following at least one or its combination:
The high scale of main cabinet-type air conditioner case position, the high scale of extension cabinet cabinet position, the system modular degree, amount controller, standard configuration/max-cache capacity, controller CPU, the host channel interface specification, host channel interface quantity, the disk extended channel, disk extended channel quantity, the maximum hard disk quantity of main cabinet, maximum storage capacity, the extension cabinet type, largest extension cabinet quantity, raid-array RAID rank, maximum RAID quantity, the maximum hard disk quantity of single RAID, single RAID max cap., the online dilatation of RAID, the RAID HotSpare disk, the extension cabinet HotSpare disk, overall situation HotSpare disk, maximum LUN quantity, the online dilatation of LUN, gui management, the CLI management, pilot lamp, the system equipment monitoring capacity, performance monitoring, log management function, the telemanagement ability;
Described management function test comprises following at least one or its combination:
System hardware test, the test of disk group, virtual disk test, host test, option test, system arrange test and failover/automatically recovery test.
14. method according to claim 11, it is characterized in that, described test event also comprises stability test and pressure test, by in the given time memory device being kept the input and output of certain data traffic, memory device is carried out stability test and pressure test.
15. method according to claim 11 is characterized in that, described test event also comprises reliability testing, and described reliability testing comprises following at least one or its combination:
Test that repeated switching test, power down test, faulty hard disk are tested and cable goes offline.
16. method according to claim 11 is characterized in that, described test event also comprises compatibility test, and described compatibility test is used for test storage equipment in the compatibility of different operating system.
17. method according to claim 16 is characterized in that, described operating system comprises Windows system, AIX system and linux system, and described compatibility test comprises starting to be tested and the read-write capability test.
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