CN111638439B - Communication module testing method, device, computer equipment and storage medium - Google Patents
Communication module testing method, device, computer equipment and storage medium Download PDFInfo
- Publication number
- CN111638439B CN111638439B CN202010344895.6A CN202010344895A CN111638439B CN 111638439 B CN111638439 B CN 111638439B CN 202010344895 A CN202010344895 A CN 202010344895A CN 111638439 B CN111638439 B CN 111638439B
- Authority
- CN
- China
- Prior art keywords
- test
- sim card
- communication module
- output level
- hot plug
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 311
- 238000004891 communication Methods 0.000 title claims abstract description 130
- 238000000034 method Methods 0.000 claims abstract description 40
- 238000001514 detection method Methods 0.000 claims abstract description 35
- 230000008859 change Effects 0.000 claims description 44
- 238000004590 computer program Methods 0.000 claims description 26
- 230000004044 response Effects 0.000 claims description 22
- 238000004364 calculation method Methods 0.000 claims description 4
- 230000001960 triggered effect Effects 0.000 abstract description 8
- 230000008569 process Effects 0.000 abstract description 3
- 238000000605 extraction Methods 0.000 description 5
- 238000003780 insertion Methods 0.000 description 5
- 230000037431 insertion Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000006870 function Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000013100 final test Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000006855 networking Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
- G06F13/40—Bus structure
- G06F13/4063—Device-to-bus coupling
- G06F13/4068—Electrical coupling
- G06F13/4081—Live connection to bus, e.g. hot-plugging
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Telephone Function (AREA)
Abstract
The application relates to a communication module testing method, a device, computer equipment and a storage medium. The method comprises the following steps: the output level of the testing bottom plate is controlled through the serial port, when the output level is changed, the level of the SIM card hot plug detection pin of the communication module connected with the testing bottom plate is triggered to be changed, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin; receiving SIM card information, wherein the SIM card information comprises a hot plug state of the SIM card; and matching the hot plug state of the SIM card with the output level, and obtaining a test result of the communication module according to the matching result. The method can simulate the hot plug state of the SIM card, avoids manually inserting and extracting the SIM card, saves time and energy of testers, reduces cost, improves test efficiency, does not shake in the test process, and ensures the stability of module devices.
Description
Technical Field
The present application relates to the field of computer technologies, and in particular, to a method and apparatus for testing a communication module, a computer device, and a storage medium.
Background
With the development of computer networking and microcomputer hierarchical distributed application systems, the function of communication is increasingly important. In order to ensure the stability of the communication function, in the research and development testing stage, a pressure test is usually performed on the communication module. At present, most communication modules of intelligent mobile terminals support the function of hot plug of the SIM card, so that the pressure test of hot plug of the SIM card is required to be carried out on the communication modules.
At present, the method for testing the hot plug pressure of the SIM card of the communication module is to insert and pull out the SIM card manually, however, the hot plug pressure of the SIM card needs to be tested repeatedly for many times, thus occupying a great deal of time and effort of testers, having high labor cost and low efficiency, and being easy to shake in the process of inserting and pulling out the SIM card, resulting in short circuit of module devices.
Disclosure of Invention
In view of the foregoing, it is desirable to provide a communication module testing method, apparatus, computer device, and storage medium that can reduce costs and improve testing efficiency.
A method of testing a communication module, the method comprising:
when the output level changes, triggering the level of a SIM card hot plug detection pin of a communication module connected with the test bottom plate to change, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin;
receiving the SIM card information, wherein the SIM card information comprises a hot plug state of the SIM card;
and matching the hot plug state of the SIM card with the output level, and obtaining a test result of the communication module according to a matching result.
In one embodiment, the step of matching the hot plug state of the SIM card with the output level at the reporting time point carried by the SIM card information, and the step of obtaining the test result of the communication module according to the matching result includes:
acquiring a change time point of the output level;
calculating the reporting time point and the changing time point to obtain response time;
when the response time is smaller than a preset time interval, matching the hot plug state of the SIM card with the output level;
and when the matching is successful, obtaining the test result as the test passing.
In one embodiment, after the test result is that the test passes when the matching is successful, the method further includes:
counting the change times of the output level, and taking the change times of the output level as the test times of the communication module;
and when the test times are smaller than a preset threshold value, returning to the step of controlling the output level of the test base plate through the serial port until the test times are equal to the preset threshold value.
In one embodiment, when the number of tests is less than a preset threshold, returning to the step of controlling the output level of the test base board through the serial port until the number of tests is equal to the preset threshold, where the method further includes:
counting the test result as the passing times of the test;
and calculating to obtain the test passing rate of the communication module according to the test passing times and the test passing times of the test results.
In one embodiment, before the controlling the output level of the test backplane through the serial port, the method further includes:
acquiring a preset period and a preset frequency;
the output level of the test base plate controlled by the serial port comprises:
and changing the output level according to the preset frequency in the preset period through the serial port.
In one embodiment, the step of matching the hot plug state of the SIM card with the output level at the reporting time point carried by the SIM card information, and the step of obtaining the test result of the communication module according to the matching result includes:
storing the SIM card information received in the preset period to obtain an SIM card information set;
reading the current change time point of the current output level in the preset period according to the time sequence;
searching a current reporting time point matched with the current changing time point in the SIM information set according to a preset time interval;
acquiring a current hot plug state of the SIM card corresponding to the current reporting time point, and matching the current hot plug state of the SIM card with the current output level;
and when the matching is successful, obtaining the current test result of the communication module in the preset period as the passing of the test.
In one embodiment, after the current test result of the communication module in the preset period is obtained to be passed when the matching is successful, the method further includes:
counting the number of times that the test result passes in the preset period;
calculating to obtain the test times in the preset period according to the preset period and the preset frequency;
and calculating to obtain the test passing rate of the communication module in the preset period according to the test passing times and the test times in the preset period as the test results.
A communication module testing apparatus, the apparatus comprising:
the output level control module is used for controlling the output level of the test base plate through the serial port, and when the output level is changed, the level of the SIM card hot plug detection pin of the communication module connected with the test base plate is triggered to change, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin;
the SIM card information receiving module is used for receiving the SIM card information, wherein the SIM card information comprises a hot plug state of the SIM card;
and the SIM card information detection module is used for matching the hot plug state of the SIM card with the output level and obtaining the test result of the communication module according to the matching result.
A computer device comprising a memory storing a computer program and a processor implementing the steps of the method described above when the processor executes the computer program.
A computer readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of the method described above.
According to the communication module testing method, the device, the computer equipment and the storage medium, the output level of the testing bottom plate is controlled through the serial port, when the output level is changed, the level of the SIM card hot plug detection pin of the communication module connected with the testing bottom plate is triggered to change, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin; receiving SIM card information, wherein the SIM card information comprises a hot plug state of the SIM card; the method comprises the steps of matching the hot plug state of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result.
Drawings
FIG. 1 is an application environment diagram of a communication module testing method in one embodiment;
FIG. 2 is a flow chart of a method for testing a communication module according to an embodiment;
FIG. 3 is a flow chart of a method for detecting SIM card information in one embodiment;
fig. 4 is a flowchart of a method for detecting SIM card information in a preset period in one embodiment;
FIG. 5 is a flow chart of a method for testing a communication module according to another embodiment;
FIG. 6 is a block diagram of a communication module testing apparatus in one embodiment;
fig. 7 is an internal structural diagram of a computer device in one embodiment.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
The communication module testing method provided by the application can be applied to an application environment shown in figure 1. The terminal 102 is connected to the test backplane 104 through a serial port, and a DTR (Data Terminal Ready ) pin of the test backplane 104 is connected to a sim_det (sim_detector) pin of the communication module.
The terminal 102 communicates with the server 104 via a network. The terminal 102 may be, but not limited to, various personal computers, notebook computers, and tablet computers, and the test chassis 104 may be, but not limited to, various circuit boards.
Specifically, the terminal 102 controls the output level of the test backplane 104 through the serial port, and when the output level changes, the level of the SIM card hot plug detection pin of the communication module 106 connected to the test backplane 104 is triggered to change. And the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin. The terminal 102 receives SIM card information sent on the serial port, where the SIM card information includes a hot plug status of the SIM card. The terminal 102 matches the hot plug state of the SIM card with the output level, and obtains the test result of the communication module according to the matching result.
In one embodiment, as shown in fig. 2, a method for testing a communication module is provided, and the method is applied to the terminal in fig. 1 for illustration, and includes the following steps:
step 202, controlling the output level of the test base plate through the serial port, and when the output level is changed, triggering the level of the SIM card hot plug detection pin of the communication module connected with the test base plate to change, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin.
The test base board is a base board connected with the communication module when the communication module is tested, is used as a medium between the terminal and the communication module, and is used for controlling the communication module by the terminal, and can be a mobile phone circuit board. The communication module is used for providing a wireless communication function, and when the SIM card is correctly inserted in the communication module, wireless communication can be performed. The communication module includes a sim_det pin for detecting insertion and extraction of the SIM card.
Specifically, the terminal is connected to the test base plate through a serial port, such as a UART (Universal Asynchronous Receiver/Transmitter, universal asynchronous receiver Transmitter) serial port. After the connection is successful, the terminal can control the output level of the test base plate through the serial port, for example, the output level of the DTR pin of the test base plate. The DTR pin of the test base plate is connected with the SIM_DET pin of the communication module, and the power-on or power-off of the SIM_DET pin can be controlled by controlling the output level of the DTR pin, so that the terminal can control the SIM_DET pin.
Further, when the terminal changes the output level of the DTR pin of the test backplane, the level of the sim_det pin on the communication module may also change, which may be from power-up to power-down or from power-down to power-up. The serial port generates SIM card information according to the level of the changed SIM_DET pin.
Step 204, receiving SIM card information, where the SIM card information includes a hot plug status of the SIM card.
The SIM card information is information obtained by detecting a sim_det pin of the communication module, and includes a hot plug state of the SIM card, that is, a SIM card insertion state and a SIM card extraction state.
Specifically, after the serial port generates the SIM card information, the SIM card information is reported to the terminal in the form of an AT instruction. For example, "+SIM: inserted" indicates a SIM card Inserted state, and "+SIM: removed" indicates a SIM card extracted state. And the terminal receives the SIM card information and knows the hot plug state of the SIM card detected by the SIM_DET pin of the communication module.
And 206, matching the hot plug state of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result.
The hot plug state of the SIM card comprises an SIM card plug state and an SIM card plug state. The output levels include a high level and a low level.
Specifically, the terminal matches the hot plug state of the SIM card with the output level. The output level corresponding to the insertion state of the SIM card is a high level, and the output level corresponding to the extraction state of the SIM card is a low level. When the hot plug state of the SIM card is successfully matched with the output level, a test result is obtained to pass the test; and when the hot plug state of the SIM card fails to match with the output level, obtaining a test result that the test fails.
In one embodiment, the high level of the output level is 1.8V.
In the communication module testing method, the output level of the testing bottom plate is controlled through the serial port, and when the output level is changed, the level of the SIM card hot plug detection pin of the communication module connected with the testing bottom plate is triggered to change, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin; receiving SIM card information, wherein the SIM card information comprises a hot plug state of the SIM card; the method comprises the steps of matching the hot plug state of the SIM card with the output level, and obtaining the test result of the communication module according to the matching result.
In one embodiment, the SIM card information carries a reporting time point, as shown in fig. 3, and step 206 includes:
step 302, obtaining a change time point of an output level;
step 304, calculating the reporting time point and the changing time point to obtain response time;
step 306, when the response time is smaller than the preset time interval, matching the hot plug state of the SIM card with the output level;
and 308, when the matching is successful, obtaining a test result as a test passing.
The reporting time point is a time point corresponding to when the serial port reports the SIM card information to the terminal. The change time point is a corresponding time point when the terminal changes the output level. The response time is the time interval between the reporting time point and the changing time point.
Specifically, after receiving the SIM card information reported by the serial port, the terminal may obtain the hot plug state of the SIM card and the reporting time point. The terminal obtains the change time point of the output level, calculates the time interval between the reporting time point and the change time point, and obtains the response time. When the response time is smaller than or equal to the preset time interval, the communication module can normally perform data transmission with the terminal, and the terminal matches the hot plug state of the SIM card with the output level. When the output level is high level and the hot plug state of the SIM card is the SIM card insertion state, or when the output level is low level and the hot plug state of the SIM card is the SIM card extraction state, the hot plug state of the SIM card is successfully matched with the output level, and the test result of the communication module is test passing. Otherwise, the obtained test result is that the test fails.
Further, when the response time is greater than the preset time interval, it is indicated that the communication module cannot normally perform data transmission with the terminal, and the obtained test result is that the test fails.
In this embodiment, by setting the preset time interval, when the response time is greater than the preset time interval, the test result of the communication module is that the test fails, and when the response time is less than or equal to the preset time interval, the hot plug state of the SIM card is matched with the output level, so that the validity of the test can be ensured, and the accuracy of the test is improved.
In one embodiment, after step 308, the method further comprises: counting the change times of the output level, and taking the change times of the output level as the test times of the communication module; and when the test times are smaller than a preset threshold value, returning to the step of controlling the output level of the test base plate through the serial port until the test times are equal to the preset threshold value.
The preset threshold is a preset test frequency threshold. Because the test result obtained by one test is not accurate as the final test result of the communication module by only one test, the communication module needs to be tested for multiple times.
Specifically, the terminal counts the number of changes of the output level, and takes the number of changes of the output level as the number of tests of the communication module. When the test times are smaller than the preset threshold, the terminal continuously changes the output level of the test base plate through the serial port, and tests the communication module to obtain the test result of each time until the test times are equal to the preset threshold.
In one embodiment, the method further comprises: counting the test results to obtain the passing times of the test; and calculating to obtain the test passing rate of the communication module according to the test passing times and the test times of the test results.
Specifically, after the number of times of testing is equal to a preset threshold, the terminal counts the number of times that the test result is that the test passes. The terminal calculates the test result as the ratio of the test passing times to the test passing times, so as to obtain the test passing rate of the communication module, and the test passing rate is used as the final test result of the communication module.
In this embodiment, the communication module is tested for multiple times by setting a preset threshold, that is, a preset test frequency threshold, and the test passing rate is calculated according to the test results of multiple tests, so that the accuracy of the test results can be ensured.
In one embodiment, prior to step 202, the method further comprises: a preset period and a preset frequency are obtained. Step 202 comprises: through the serial port, the output level is changed according to the preset frequency in a preset period.
Specifically, the terminal acquires a preset period and a preset frequency, and changes an output level according to the preset frequency in the preset period through the serial port. For example, if the preset period is 5 hours and the preset frequency is 1 minute, the terminal changes the output level every minute within 5 hours.
In one embodiment, when the SIM card information sent from the serial port is not received within a preset time interval, the terminal continues to change the output level according to the preset frequency.
In one embodiment, as shown in FIG. 4, step 206 includes:
step 402, storing the received SIM card information in a preset period to obtain an SIM card information set;
step 404, reading the current change time point of the current output level in a preset period according to the time sequence;
step 406, searching the current reporting time point matched with the current changing time point in the SIM information set according to the preset time interval;
step 408, obtaining the current hot plug state of the SIM card corresponding to the current reporting time point, and matching the current hot plug state of the SIM card with the current output level;
step 410, when the matching is successful, the current test result of the communication module in the preset period is obtained as the passing of the test.
Specifically, the terminal stores the received SIM card information in a preset period to obtain a SIM card information set. And according to the time sequence, the terminal reads the current change time point of the current output level in a preset period. And the terminal searches the current reporting time point matched with the current changing time point in the SIM information set according to the preset time interval. The matching conditions of the current changing time point and the current reporting time point are as follows: (1) The current reporting time point is after the current changing time point; (2) The time interval between the current reporting time point and the current changing time point is smaller than or equal to a preset time interval. In particular, the preset time interval is smaller than the inverse of the preset frequency. Thus, the current change time point has at most one matching current reporting time point.
In one embodiment, after the test of the preset period is completed, the terminal can read and output the current change time point one by one according to the time sequence to perform matching calculation, so as to obtain the test result of each time.
In one embodiment, the terminal may also read the current change time point for matching calculation every time the test is completed in a preset period, so as to obtain the current test result.
Further, after the terminal searches for the current reporting time point matched with the current changing time point, the terminal obtains the hot plug state of the current SIM card corresponding to the current reporting time point, and matches the hot plug state of the current SIM card with the current output level. When the matching is successful, the terminal obtains the current test result of the communication module in the preset period as the test passing.
In one embodiment, when the terminal fails to find the current reporting time point matching the current changing time point, the current test result is obtained as the test failed.
In one embodiment, after step 410, the method further comprises: counting the number of times that the test result passes in a preset period; calculating to obtain the test times in the preset period according to the preset period and the preset frequency; and calculating to obtain the test passing rate of the communication module in the preset period according to the test result, namely the test passing times and the test times in the preset period.
Specifically, the terminal counts the test results in a preset period as the number of times of test passing. The terminal calculates the product of the preset period and the preset frequency to obtain the test times in the preset period, and then calculates the test result as the ratio of the test passing times to the test times in the preset period to obtain the test passing rate of the communication module in the preset period.
In this embodiment, the communication module is tested multiple times in the preset period by setting the preset period and the preset frequency, and the test passing rate is calculated according to the test results of the multiple tests, so that the accuracy of the test results can be ensured.
In one embodiment, as shown in fig. 5, another communication module testing method is provided, and the method is applied to the terminal in fig. 1 for illustration, and includes the following steps:
step 502, acquiring a preset period and a preset frequency;
step 504, changing the output level according to the preset frequency in a preset period through the serial port;
step 506, when the output level changes, triggering the level of the SIM card hot plug detection pin of the communication module connected with the testing bottom plate to change, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin;
step 508, receiving SIM card information, wherein the SIM card information comprises a hot plug state and a reporting time point of the SIM card;
step 510, storing the received SIM card information in a preset period to obtain an SIM card information set;
step 512, reading the current change time point of the current output level in a preset period according to the time sequence;
step 514, searching the current reporting time point matched with the current changing time point in the SIM information set according to the preset time interval;
step 516, obtaining the current hot plug state of the SIM card corresponding to the current reporting time point, and matching the current hot plug state of the SIM card with the current output level;
step 518, when the matching is successful, obtaining the current test result of the communication module in the preset period as the passing test;
step 520, counting the number of times that the test result passes in the preset period;
step 522, calculating to obtain the test times in the preset period according to the preset period and the preset frequency;
and step 524, calculating to obtain the test passing rate of the communication module in the preset period according to the test passing times and the test times in the preset period as the test results.
In the embodiment, the change of the level of the hot plug detection pin of the SIM card is triggered to simulate the hot plug state of the SIM card, so that the manual insertion and extraction of the SIM card are avoided, the time and energy of a tester are saved, the cost is reduced, the testing efficiency is improved, the jitter is not generated in the testing process, and the stability of a module device is ensured; and the preset period and the preset frequency are set, the communication module is tested for a plurality of times in the preset period, the test passing rate is calculated according to the test results of the plurality of times of tests, and the accuracy of the test results is ensured.
It should be understood that, although the steps in the flowcharts of fig. 2-5 are shown in order as indicated by the arrows, these steps are not necessarily performed in order as indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least some of the steps in fig. 2-5 may include multiple steps or stages that are not necessarily performed at the same time, but may be performed at different times, nor does the order in which the steps or stages are performed necessarily performed in sequence, but may be performed alternately or alternately with at least a portion of the steps or stages in other steps or other steps.
In one embodiment, as shown in fig. 6, there is provided a communication module testing apparatus 600 comprising: an output level control module 601, a SIM card information receiving module 602, and a SIM card information detecting module 603, wherein:
the output level control module 601 is configured to control an output level of the test base through the serial port, and when the output level changes, trigger a level of a SIM card hot plug detection pin of the communication module connected to the test base to change, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin;
the SIM card information receiving module 602 is configured to receive SIM card information, where the SIM card information includes a hot plug state of a SIM card;
the SIM card information detection module 603 is configured to match the hot plug state of the SIM card with the output level, and obtain a test result of the communication module according to the matching result.
In one embodiment, the SIM card information carries a reporting time point, and the SIM card information detecting module 603 is further configured to obtain a change time point of the output level; calculating the reporting time point and the changing time point to obtain response time; when the response time is smaller than the preset time interval, matching the hot plug state of the SIM card with the output level; and when the matching is successful, obtaining a test result as test passing.
In one embodiment, the communication module testing apparatus 600 further includes a test number counting module 604, configured to count the number of times the output level is changed, and take the number of times the output level is changed as the number of times the communication module is tested; and when the test times are smaller than a preset threshold value, returning to the step of controlling the output level of the test base plate through the serial port until the test times are equal to the preset threshold value.
In one embodiment, the communication module testing device 600 further includes a test passing rate calculating module 605, configured to count the number of times that the test result is passed; and calculating to obtain the test passing rate of the communication module according to the test passing times and the test times of the test results.
In one embodiment, the communication module testing apparatus 600 further includes an acquisition module 606 for acquiring a preset period and a preset frequency.
In one embodiment, the output level control module 601 is further configured to change the output level according to the preset frequency in a preset period through the serial port.
In one embodiment, the SIM card information detection module 603 is further configured to store SIM card information received in a preset period, to obtain a SIM card information set; reading the current change time point of the current output level in a preset period according to the time sequence; searching a current reporting time point matched with the current changing time point in the SIM information set according to a preset time interval; acquiring a current hot plug state of the SIM card corresponding to the current reporting time point, and matching the current hot plug state of the SIM card with a current output level; and when the matching is successful, obtaining the current test result of the communication module in the preset period as the passing of the test.
In one embodiment, the test passing rate calculation module 605 is further configured to count the test result as the number of times of passing the test in a preset period; calculating to obtain the test times in the preset period according to the preset period and the preset frequency; and calculating to obtain the test passing rate of the communication module in the preset period according to the test result, namely the test passing times and the test times in the preset period.
For specific limitations of the communication module testing apparatus, reference may be made to the above limitations of the communication module testing method, and no further description is given here. The respective modules in the above-described communication module testing apparatus may be implemented in whole or in part by software, hardware, and a combination thereof. The above modules may be embedded in hardware or may be independent of a processor in the computer device, or may be stored in software in a memory in the computer device, so that the processor may call and execute operations corresponding to the above modules.
In one embodiment, a computer device is provided, which may be a terminal, and the internal structure of which may be as shown in fig. 7. The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The communication interface of the computer device is used for carrying out wired or wireless communication with an external terminal, and the wireless mode can be realized through WIFI, an operator network, NFC (near field communication) or other technologies. The computer program, when executed by a processor, implements a communication module testing method. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, can also be keys, a track ball or a touch pad arranged on the shell of the computer equipment, and can also be an external keyboard, a touch pad or a mouse and the like.
It will be appreciated by those skilled in the art that the structure shown in FIG. 7 is merely a block diagram of some of the structures associated with the present inventive arrangements and is not limiting of the computer device to which the present inventive arrangements may be applied, and that a particular computer device may include more or fewer components than shown, or may combine some of the components, or have a different arrangement of components.
In one embodiment, a computer device is provided comprising a memory and a processor, the memory having stored therein a computer program, the processor when executing the computer program performing the steps of: the output level of the testing bottom plate is controlled through the serial port, when the output level is changed, the level of the SIM card hot plug detection pin of the communication module connected with the testing bottom plate is triggered to be changed, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin; receiving SIM card information, wherein the SIM card information comprises a hot plug state of the SIM card; and matching the hot plug state of the SIM card with the output level, and obtaining a test result of the communication module according to the matching result.
In one embodiment, the processor when executing the computer program further performs the steps of: acquiring a change time point of an output level; calculating the reporting time point and the changing time point to obtain response time; when the response time is smaller than the preset time interval, matching the hot plug state of the SIM card with the output level; and when the matching is successful, obtaining a test result as test passing.
In one embodiment, the processor when executing the computer program further performs the steps of: counting the change times of the output level, and taking the change times of the output level as the test times of the communication module; and when the test times are smaller than a preset threshold value, returning to the step of controlling the output level of the test base plate through the serial port until the test times are equal to the preset threshold value.
In one embodiment, the processor when executing the computer program further performs the steps of: counting the test results to obtain the passing times of the test; and calculating to obtain the test passing rate of the communication module according to the test passing times and the test times of the test results.
In one embodiment, the processor when executing the computer program further performs the steps of: acquiring a preset period and a preset frequency; through the serial port, the output level is changed according to the preset frequency in a preset period.
In one embodiment, the processor when executing the computer program further performs the steps of: storing SIM card information received in a preset period to obtain an SIM card information set; reading the current change time point of the current output level in a preset period according to the time sequence; searching a current reporting time point matched with the current changing time point in the SIM information set according to a preset time interval; acquiring a current hot plug state of the SIM card corresponding to the current reporting time point, and matching the current hot plug state of the SIM card with a current output level; and when the matching is successful, obtaining the current test result of the communication module in the preset period as the passing of the test.
In one embodiment, the processor when executing the computer program further performs the steps of: counting the test result as the test passing times in a preset period; calculating to obtain the test times in the preset period according to the preset period and the preset frequency; and calculating to obtain the test passing rate of the communication module in the preset period according to the test result, namely the test passing times and the test times in the preset period.
In one embodiment, a computer readable storage medium is provided having a computer program stored thereon, which when executed by a processor, performs the steps of: the output level of the testing bottom plate is controlled through the serial port, when the output level is changed, the level of the SIM card hot plug detection pin of the communication module connected with the testing bottom plate is triggered to be changed, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin; receiving SIM card information, wherein the SIM card information comprises a hot plug state of the SIM card; and matching the hot plug state of the SIM card with the output level, and obtaining a test result of the communication module according to the matching result.
In one embodiment, the computer program when executed by the processor further performs the steps of: acquiring a change time point of an output level; calculating the reporting time point and the changing time point to obtain response time; when the response time is smaller than the preset time interval, matching the hot plug state of the SIM card with the output level; and when the matching is successful, obtaining a test result as test passing.
In one embodiment, the computer program when executed by the processor further performs the steps of: counting the change times of the output level, and taking the change times of the output level as the test times of the communication module; and when the test times are smaller than a preset threshold value, returning to the step of controlling the output level of the test base plate through the serial port until the test times are equal to the preset threshold value.
In one embodiment, the computer program when executed by the processor further performs the steps of: counting the test results to obtain the passing times of the test; and calculating to obtain the test passing rate of the communication module according to the test passing times and the test times of the test results.
In one embodiment, the computer program when executed by the processor further performs the steps of: acquiring a preset period and a preset frequency; through the serial port, the output level is changed according to the preset frequency in a preset period.
In one embodiment, the computer program when executed by the processor further performs the steps of: storing SIM card information received in a preset period to obtain an SIM card information set; reading the current change time point of the current output level in a preset period according to the time sequence; searching a current reporting time point matched with the current changing time point in the SIM information set according to a preset time interval; acquiring a current hot plug state of the SIM card corresponding to the current reporting time point, and matching the current hot plug state of the SIM card with a current output level; and when the matching is successful, obtaining the current test result of the communication module in the preset period as the passing of the test.
In one embodiment, the computer program when executed by the processor further performs the steps of: counting the test result as the test passing times in a preset period; calculating to obtain the test times in the preset period according to the preset period and the preset frequency; and calculating to obtain the test passing rate of the communication module in the preset period according to the test result, namely the test passing times and the test times in the preset period.
Those skilled in the art will appreciate that implementing all or part of the above described methods may be accomplished by way of a computer program stored on a non-transitory computer readable storage medium, which when executed, may comprise the steps of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, or the like. Volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory. By way of illustration, and not limitation, RAM can be in the form of a variety of forms, such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), and the like.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples illustrate only a few embodiments of the application, which are described in detail and are not to be construed as limiting the scope of the application. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of protection of the present application is to be determined by the appended claims.
Claims (10)
1. A method for testing a communication module, the method comprising:
acquiring a preset period and a preset frequency;
through a serial port, changing the output level of a testing bottom plate according to the preset frequency in the preset period, and triggering the level of a SIM card hot plug detection pin of a communication module connected with the testing bottom plate to change when the output level is changed, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin; the pins of the test bottom plate are connected with the SIM card hot plug detection pins of the communication module, and the power-on or power-off of the SIM card hot plug detection pins of the communication module is controlled by controlling the pins of the test bottom plate;
receiving the SIM card information, wherein the SIM card information comprises a hot plug state of the SIM card;
matching the hot plug state of the SIM card with the output level, and obtaining a test result of the communication module according to a matching result; the SIM card information carries the reporting time point, the hot plug state of the SIM card is matched with the output level, and the test result of the communication module according to the matching result comprises: acquiring a change time point of the output level;
calculating the reporting time point and the changing time point to obtain response time;
when the response time is smaller than a preset time interval, matching the hot plug state of the SIM card with the output level;
when the matching is successful, the test result is obtained to pass the test;
and when the response time is greater than a preset time interval, the communication module cannot normally transmit data, and the test result is that the test fails.
2. The method of claim 1, wherein after the test result is a test pass when the matching is successful, the method further comprises:
counting the change times of the output level, and taking the change times of the output level as the test times of the communication module;
and when the test times are smaller than a preset threshold value, returning to the step of controlling the output level of the test base plate through the serial port until the test times are equal to the preset threshold value.
3. The method of claim 2, wherein when the number of tests is less than a preset threshold, returning to the step of controlling the output level of the test backplane through the serial port until after the number of tests is equal to the preset threshold, the method further comprises:
counting the test result as the passing times of the test;
and calculating to obtain the test passing rate of the communication module according to the test passing times and the test passing times of the test results.
4. The method of claim 1, wherein the step of matching the hot plug state of the SIM card with the output level at a reporting time point carried by the SIM card information, and the step of obtaining a test result of the communication module according to the matching result includes:
storing the SIM card information received in the preset period to obtain an SIM card information set;
reading the current change time point of the current output level in the preset period according to the time sequence;
searching a current reporting time point matched with the current changing time point in the SIM information set according to a preset time interval;
acquiring a current hot plug state of the SIM card corresponding to the current reporting time point, and matching the current hot plug state of the SIM card with the current output level;
and when the matching is successful, obtaining the current test result of the communication module in the preset period as the passing of the test.
5. The method of claim 4, wherein after the current test result of the communication module in the preset period is obtained to be passed when the matching is successful, the method further comprises:
counting the number of times that the test result passes in the preset period;
calculating to obtain the test times in the preset period according to the preset period and the preset frequency;
and calculating to obtain the test passing rate of the communication module in the preset period according to the test passing times and the test times in the preset period as the test results.
6. A communication module testing apparatus, the apparatus comprising:
the acquisition module is used for acquiring a preset period and a preset frequency;
the output level control module is used for changing the output level of the testing bottom plate according to the preset frequency in the preset period through the serial port, and triggering the level of the SIM card hot plug detection pin of the communication module connected with the testing bottom plate to change when the output level is changed, so that the serial port generates SIM card information according to the level of the changed SIM card hot plug detection pin; the pins of the test bottom plate are connected with the SIM card hot plug detection pins of the communication module, and the power-on or power-off of the SIM card hot plug detection pins of the communication module is controlled by controlling the pins of the test bottom plate;
the SIM card information receiving module is used for receiving the SIM card information, wherein the SIM card information comprises a hot plug state of the SIM card;
the SIM card information detection module is used for matching the hot plug state of the SIM card with the output level and obtaining a test result of the communication module according to the matching result; the SIM card information carries a reporting time point and is also used for calculating the reporting time point and the changing time point to obtain response time;
when the response time is smaller than a preset time interval, matching the hot plug state of the SIM card with the output level;
when the matching is successful, the test result is obtained to pass the test;
and when the response time is greater than a preset time interval, the communication module cannot normally transmit data, and the test result is that the test fails.
7. The apparatus of claim 6, further comprising a test count module for counting a number of changes in the output level, the number of changes in the output level being a number of tests of the communication module; and when the test times are smaller than a preset threshold value, returning to the step of controlling the output level of the test base plate through the serial port until the test times are equal to the preset threshold value.
8. The apparatus of claim 7, further comprising a test passing rate calculation module for counting the number of times the test passes as a result of the test; and calculating to obtain the test passing rate of the communication module according to the test passing times and the test times of the test results.
9. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor implements the steps of the method of any one of claims 1 to 5 when the computer program is executed.
10. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the steps of the method of any of claims 1 to 5.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010344895.6A CN111638439B (en) | 2020-04-27 | 2020-04-27 | Communication module testing method, device, computer equipment and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010344895.6A CN111638439B (en) | 2020-04-27 | 2020-04-27 | Communication module testing method, device, computer equipment and storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111638439A CN111638439A (en) | 2020-09-08 |
| CN111638439B true CN111638439B (en) | 2023-09-15 |
Family
ID=72326623
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010344895.6A Active CN111638439B (en) | 2020-04-27 | 2020-04-27 | Communication module testing method, device, computer equipment and storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111638439B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112422204B (en) * | 2020-10-30 | 2023-04-07 | 重庆芯讯通无线科技有限公司 | Testing device of communication module |
| CN114302434A (en) * | 2021-12-29 | 2022-04-08 | 广东电网有限责任公司 | Electric energy metering terminal communication module testing device and testing method |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101615152A (en) * | 2009-07-13 | 2009-12-30 | 中兴通讯股份有限公司 | The detection method of hot plug fault of storage card and device |
| CN101782884A (en) * | 2009-12-25 | 2010-07-21 | 福建星网锐捷网络有限公司 | Hot plugging realization method and system of high-speed signal circuit and hot plugging circuit board card |
| CN101783822A (en) * | 2009-12-24 | 2010-07-21 | 华为终端有限公司 | Method for inserting and drawing user identification card and wireless communication module |
| CN104702784A (en) * | 2015-03-05 | 2015-06-10 | 惠州Tcl移动通信有限公司 | Method and system for detecting multi-SIM hot plug of mobile terminal |
| CN105208192A (en) * | 2015-08-17 | 2015-12-30 | 广东欧珀移动通信有限公司 | Storage card state control method of terminal and device |
| CN107656842A (en) * | 2017-09-20 | 2018-02-02 | 惠州Tcl移动通信有限公司 | A kind of SIM card hot plug method for testing performance, storage device and mobile terminal |
| CN109032864A (en) * | 2018-07-20 | 2018-12-18 | 郑州云海信息技术有限公司 | A kind of method and system of NVMe SSD hot plug test |
| CN109189621A (en) * | 2018-08-20 | 2019-01-11 | 郑州云海信息技术有限公司 | A kind of test method and system of NVMe SSD hot plug |
| CN109308236A (en) * | 2018-09-17 | 2019-02-05 | 郑州云海信息技术有限公司 | A kind of warm connection function test method, device and relevant device |
| CN110752857A (en) * | 2019-10-11 | 2020-02-04 | 深圳震有科技股份有限公司 | Method and device for supporting hot plug of SIM card, wireless internet access equipment and medium |
| CN112485934A (en) * | 2020-11-26 | 2021-03-12 | 深圳市艾比森光电股份有限公司 | Hot plug detection method for LED display screen and related device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101679430B1 (en) * | 2010-09-30 | 2016-11-25 | 삼성전자주식회사 | Method and apparatus for detecting of sim card inserting in a portable terminal |
-
2020
- 2020-04-27 CN CN202010344895.6A patent/CN111638439B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101615152A (en) * | 2009-07-13 | 2009-12-30 | 中兴通讯股份有限公司 | The detection method of hot plug fault of storage card and device |
| CN101783822A (en) * | 2009-12-24 | 2010-07-21 | 华为终端有限公司 | Method for inserting and drawing user identification card and wireless communication module |
| CN101782884A (en) * | 2009-12-25 | 2010-07-21 | 福建星网锐捷网络有限公司 | Hot plugging realization method and system of high-speed signal circuit and hot plugging circuit board card |
| CN104702784A (en) * | 2015-03-05 | 2015-06-10 | 惠州Tcl移动通信有限公司 | Method and system for detecting multi-SIM hot plug of mobile terminal |
| CN105208192A (en) * | 2015-08-17 | 2015-12-30 | 广东欧珀移动通信有限公司 | Storage card state control method of terminal and device |
| CN107656842A (en) * | 2017-09-20 | 2018-02-02 | 惠州Tcl移动通信有限公司 | A kind of SIM card hot plug method for testing performance, storage device and mobile terminal |
| CN109032864A (en) * | 2018-07-20 | 2018-12-18 | 郑州云海信息技术有限公司 | A kind of method and system of NVMe SSD hot plug test |
| CN109189621A (en) * | 2018-08-20 | 2019-01-11 | 郑州云海信息技术有限公司 | A kind of test method and system of NVMe SSD hot plug |
| CN109308236A (en) * | 2018-09-17 | 2019-02-05 | 郑州云海信息技术有限公司 | A kind of warm connection function test method, device and relevant device |
| CN110752857A (en) * | 2019-10-11 | 2020-02-04 | 深圳震有科技股份有限公司 | Method and device for supporting hot plug of SIM card, wireless internet access equipment and medium |
| CN112485934A (en) * | 2020-11-26 | 2021-03-12 | 深圳市艾比森光电股份有限公司 | Hot plug detection method for LED display screen and related device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN111638439A (en) | 2020-09-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN111638439B (en) | Communication module testing method, device, computer equipment and storage medium | |
| CN102841831A (en) | System and method for testing server memory | |
| CN110632498A (en) | Test method and system | |
| CN107402720B (en) | Hard disk processing method and device and terminal | |
| CN112133357A (en) | eMMC testing method and device | |
| CN110297764B (en) | Vulnerability test model training method and device | |
| CN108509348A (en) | A kind of test method and mobile terminal of system aging | |
| CN115686961A (en) | Processor testing method and device and electronic equipment | |
| US8391162B2 (en) | Apparatus and method for testing SMNP cards | |
| EP3240309A1 (en) | Information processing device, information processing program, and information processing method | |
| CN113190437B (en) | Time sequence analysis method and device for wireless module, computer equipment and storage medium | |
| CN110261758A (en) | Device under test verifies device and Related product | |
| CN115713962A (en) | Memory test method, system and computer readable storage medium | |
| CN104679625A (en) | Computer system and method for testing computer system | |
| CN110377477B (en) | Electronic equipment, functional module, main board of electronic equipment and detection method | |
| CN110737593B (en) | Intelligent capacity management method, device and storage medium | |
| CN107390063B (en) | Power failure test method and device | |
| CN103870368A (en) | SAS (Serial Attached SCSI (small computer system interface)) expander testing system and method | |
| KR20140030803A (en) | Device and method for acquiring chip information | |
| CN106201930A (en) | A kind of device port determines device, terminal and method | |
| CN114461479A (en) | Method and device for debugging multimedia processing chip, storage medium and electronic equipment | |
| CN112445669A (en) | Storage performance testing method and device and electronic equipment | |
| CN113408845B (en) | Processing method and device of production flow, computer equipment and storage medium | |
| CN117555813B (en) | Method, device, equipment and medium for determining common test case | |
| CN116482509B (en) | Radio frequency circuit testing method and device and related equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |