CN109189621A - A kind of test method and system of NVMe SSD hot plug - Google Patents
A kind of test method and system of NVMe SSD hot plug Download PDFInfo
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- CN109189621A CN109189621A CN201810948353.2A CN201810948353A CN109189621A CN 109189621 A CN109189621 A CN 109189621A CN 201810948353 A CN201810948353 A CN 201810948353A CN 109189621 A CN109189621 A CN 109189621A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/362—Software debugging
- G06F11/3648—Software debugging using additional hardware
- G06F11/3652—Software debugging using additional hardware in-circuit-emulation [ICE] arrangements
Abstract
This application provides a kind of test methods of NVMe SSD hot plug, are applied to host, comprising: S1, the level for controlling pin on imitative interface pin device are high level, to simulate the NVMe SSD insertion, obtain insertion test data；S2, the control level are that low level is extracted with simulating the NVMe SSD, obtain and extract test data；S3, judge whether the corresponding number of the extraction test data is less than default test number；If so, returning to S1.This method can obtain the NVMe SSD hot plug test data of mass efficient within the identical working time, and then more accurately determine the reliability of hot plug system in host, and can be reduced the loss of NVMe SSD in hot plug test, improve the competitiveness of data center.The application also provides test macro, equipment and the computer readable storage medium of a kind of NVMe SSD hot plug, all has above-mentioned beneficial effect.
Description
Technical field
This application involves cloud computation data center technical field, in particular to a kind of test side of NVMe SSD hot plug
Method, system, equipment and computer readable storage medium.
Background technique
In cloud computing era, mass data needs to store and read, NVMe SSD (Non-Volatile Memory
Express Nonvolatile memory host controller interface specification, Solid State Disk solid state hard disk) introduce it is unrivaled
Output and input performance, and rapidly become the key component of storage.But NVMe SSD is directly connected to general PCIe
In (Peripheral Component Interconnect express high speed serialization computer expansion bus standard) bus,
The controller of NVMe SSD can be deleted in internal drive with the removal of SSD, and hot plug processing, which places one's entire reliance upon, operates system
The PCIe hot plug treatment mechanism of system.If bad to hot-swappable support ease for use, it is easy to lead to system abnormity, in business
It is disconnected.Therefore the hot-swappable system reliability of test host becomes a key business and technology for storage product test.
Current NVMe SSD hot plug test is substantially manually tested, and testing efficiency is low, and testing time is few, effectively
Test data is few, can not quickly obtain effective NVMe SSD hot plug test data on a large scale；Part is surveyed using mechanical plug
Method for testing early warning in time and can not record encountered relevant issues, can only obtain the wide in range test data such as probability of success, nothing
Method is that the hot plug reliability of product provides safeguard.
Therefore, the NVMe SSD hot plug test data of mass efficient how is obtained within the identical working time, in turn
More accurately determine that the reliability of host hot plug system is those skilled in the art's technical issues that need to address.
Apply for content
The purpose of the application is to provide the test method of NVMe SSD hot plug a kind of, system, equipment and computer-readable
Storage medium can obtain the NVMe SSD hot plug test data of mass efficient within the identical working time, and then more
The accurate reliability for determining host hot plug system.
In order to solve the above technical problems, the application provides a kind of test method of NVMe SSD hot plug, it is applied to host,
Include:
S1, the level for controlling pin on imitative interface pin device are high level, to simulate the NVMe SSD insertion, are obtained
It is inserted into test data；Wherein, the imitative interface pin device is inserted into the interface slot of the host；
S2, the control level are that low level is extracted with simulating the NVMe SSD, obtain and extract test data；
S3, judge whether the corresponding number of the extraction test data is less than default test number；If so, returning to S1.
It preferably, is high to control the level using the corresponding electric power starting of interface pin device is imitated described in Script controlling
Level；It is closed using power supply described in the Script controlling to control the level as low level.
Preferably, it is inserted between test data to simulate the NVMe SSD insertion and obtain, further includes:
It executes IO test program and obtains IO test data；
It executes default test script and obtains script test data.
Preferably, after obtaining extraction test data, further includes:
The insertion test data and the extraction test data are saved as into test document.
The application also provides a kind of test macro of NVMe SSD hot plug, comprising:
High level control module, the level for controlling pin on imitative interface pin device is high level, described in simulation
NVMe SSD insertion obtains insertion test data；Wherein, the imitative interface pin device is inserted into the interface slot of the host
In；
Low level control module is low level to simulate the NVMe SSD extraction for controlling the level, and acquisition is pulled out
Test data out；
Number judgment module, for judging whether the corresponding number of the extraction test data is less than default test number；
When the number judgment module judges that the number is less than the default test number, into the high level control module and
The low level control module.
Preferably, the high level control module includes electric power starting unit, for utilizing imitative interface described in Script controlling
The corresponding electric power starting of pin arrangement is to control the level as high level；
The low level control module includes power supply closing unit, for using power supply described in the Script controlling close with
Controlling the level is low level.
Preferably, the test macro of the NVMe SSD hot plug further include:
IO execution module obtains IO test data for executing IO test program；
Test script execution module obtains script test data for executing default test script.
Preferably, the test macro of the NVMe SSD hot plug further include:
Memory module, for the insertion test data and the extraction test data to be saved as test document.
The application also provides a kind of test equipment of NVMe SSD hot plug, comprising:
Host, imitative interface pin device, memory and processor；Wherein, the memory is used to store computer program,
The processor is used to realize the step of the test method of NVMe SSD hot plug described above when executing the computer program
Suddenly.
The application also provides a kind of computer readable storage medium, and computer journey is stored in the computer storage medium
The step of sequence, the computer program realizes the test method of NVMe SSD hot plug described above when being executed by processor.
A kind of test method of NVMe SSD hot plug provided herein is applied to host, comprising: S1, control are imitative
The level of pin is high level on interface pin device, to simulate the NVMe SSD insertion, obtains insertion test data；Its
In, the imitative interface pin device is inserted into the interface slot of the host；S2, the control level are low level to simulate
NVMe SSD extraction is stated, obtains and extracts test data；S3, to judge whether the corresponding number of the extraction test data is less than default
Test number；If so, returning to S1.
As it can be seen that the level that this method controls pin on imitative interface pin device is that high level and low level simulate NVMe respectively
SSD is into and out acquisition insertion test data and extraction test data are less than in the corresponding number of test data and preset test
When number, then continue to obtain test data.Due to not needing really to be repeatedly inserted into and extract host for NVMe SSD, compared to
The prior art can obtain the NVMe SSD hot plug test data of mass efficient within the identical working time, and then more quasi-
Really determine the reliability of hot plug system in host, and the loss of NVMe SSD in hot plug test can be effectively reduced, reduces
Test period improves the competitiveness of data center.The application also provide the test macro of NVMe SSD hot plug a kind of, equipment and
Computer readable storage medium all has above-mentioned beneficial effect, and details are not described herein.
Detailed description of the invention
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
The embodiment of application for those of ordinary skill in the art without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Fig. 1 is a kind of flow chart of the test method of NVMe SSD hot plug provided by the embodiment of the present application；
Fig. 2 is a kind of schematic structural diagram of testing device of NVMe SSD hot plug provided by the embodiment of the present application；
Fig. 3 is a kind of structural block diagram of the test macro of NVMe SSD hot plug provided by the embodiment of the present application.
Specific embodiment
The core of the application is to provide a kind of test method of NVMe SSD hot plug, can be within the identical working time
The NVMe SSD hot plug test data of mass efficient is obtained, and then more accurately determines the reliability of host hot plug system.
Another core of the application is to provide test macro, equipment and the computer readable storage medium of a kind of NVMe SSD hot plug.
To keep the purposes, technical schemes and advantages of the embodiment of the present application clearer, below in conjunction with the embodiment of the present application
In attached drawing, the technical scheme in the embodiment of the application is clearly and completely described, it is clear that described embodiment is
Some embodiments of the present application, instead of all the embodiments.Based on the embodiment in the application, those of ordinary skill in the art
Every other embodiment obtained without making creative work, shall fall in the protection scope of this application.
Referring to FIG. 1, Fig. 1 is a kind of process of the test method of NVMe SSD hot plug provided by the embodiment of the present application
Figure, the test method of the NVMe SSD hot plug specifically include:
S1, the level for controlling pin on imitative interface pin device are high level, to simulate NVMe SSD insertion, acquisition insertion
Test data.
The executing subject of the embodiment of the present application is host, and the level that host controls pin on imitative interface pin device is high electricity
It is flat, to simulate NVMe SSD insertion, obtain insertion test data.Wherein, the interface of above-mentioned imitative interface pin device insertion host
In slot, it is typically connected in general PCIe bus.In the interface slot that imitative interface pin device is inserted into host this
Under the premise of a, the shape of imitative interface pin device is not especially limited, should be made according to the actual situation by those skilled in the art
Corresponding setting out imitates interface pin device herein and is used to simulate NVMe SSD, that is, do not need true NVMe SSD, compared to
NVMe SSD hot plug test mode in the prior art can effectively reduce the loss of NVMe SSD in hot plug test.
Type of interface is also not especially limited at this, such as can be U.2 interface (also known as SFF-8639 interface),
It can be M.2 interface (also known as ngff interface), being normally set up above-mentioned interface is U.2 interface, mainly since U.2 interface bandwidth reaches
32Gbps, transmission speed is fast, and NVMe agreement or even power supply capacity is supported to also improve, these each contribute to improve SSD
Energy.So-called pin is the wiring drawn from lsi internal circuit with peripheral circuit, and all pins just constitute above-mentioned connect
Mouthful, value volume and range of product of pin is not especially limited at this, phase should be made according to the actual situation by those skilled in the art
The setting answered.
The level that host controls pin is high level, and specific control mode is not limited thereto, should be by this field
Technical staff makes corresponding setting according to the actual situation, usually can use Script controlling and imitates the corresponding electricity of interface pin device
The unlatching in source provides pin high level.The level of control pin is high level for simulating NVMe SSD insertion, that is, is not needed true
Real NVMe SSD insertion can effectively reduce the damage of NVMe SSD in prior art NVMe SSD hot plug test insertion process
Consumption.After simulation NVMe SSD insertion, insertion test data is obtained, acquisition process of insertion test data is not made specifically at this
It limits, usually after simulation NVMe SSD is inserted into, successively reports to change to interrupt to change with data link layer in the presence of detection and interrupt extremely
Hot plug test macro in host.Wherein, having detection to change interruption is to imitate whether interface pin device is inserted into interface slot
This information, data link layer change interrupt as whether there is also this information with the data communication of imitative interface pin device.
Hot plug test macro is read out the operations such as register information, load NVMe driving after receiving information, and exports result.This
When, host executes insertion test data acquisition program and grabs test result in output result, obtains mass efficient insertion test
Data.
S2, control level are low level to simulate NVMe SSD extraction, obtain and extract test data.
After host obtains insertion test data, control level is low level to simulate NVMe SSD extraction, obtains to extract and survey
Try data.Level for host control pin is that low level control mode is also not construed as limiting herein, should be by art technology
Personnel make corresponding setting according to the actual situation, usually can use Script controlling and imitate the corresponding power supply of interface pin device
It closes and pin low level is provided.The level of control pin is low level for simulating NVMe SSD extraction, that is, is not needed true
NVMe SSD is extracted, and can effectively reduce the loss of NVMe SSD in prior art NVMe SSD hot plug test withdrawal process.
It after simulation NVMe SSD is extracted, obtains and extracts test data, acquisition process for extracting test data is not made specifically at this yet
Restriction also can be reported successively and be existed in detection change interruption and data link layer change usually after simulating NVMe SSD and extracting
Break into host hot plug test macro.Hot plug test macro is read out register information, unloading after receiving interruption
The operations such as NVMe driving, and export result.It is surveyed at this point, host executes the crawl in output result of extraction test data acquisition program
Test result obtains mass efficient and extracts test data.
S3, judge to extract whether the corresponding number of test data is less than default test number.
After host obtains extraction test data, judge to extract whether the corresponding number of test data is less than default test part
Number.Default test number specific value is not construed as limiting at this, should be made according to the actual situation by those skilled in the art corresponding
Setting.If extracting the corresponding number of test data is less than default test number, S1 is returned to, until extracting part of test data
It is several equal with default test number.If extracting the corresponding number of test data not less than default test number, can terminate to test
Or there is prompting message, it is not limited thereto
The level that the present embodiment controls pin on imitative interface pin device is that high level and low level simulate NVMe respectively
SSD is into and out acquisition insertion test data and extraction test data are less than in the corresponding number of test data and preset test
When number, then continue to obtain test data.Due to not needing really to be repeatedly inserted into and extract host for NVMe SSD, compared to
The prior art can obtain the NVMe SSD hot plug test data of mass efficient within the identical working time, and then more quasi-
Really determine the reliability of host hot plug system, and the loss of NVMe SSD in hot plug test can be effectively reduced, reduces and survey
The period is tried, the competitiveness of data center is improved.
Based on the above embodiment, the present embodiment is usually opened using the imitative corresponding power supply of interface pin device described in Script controlling
It opens to control the level as high level；It is closed using power supply described in the Script controlling to control the level as low level.
Independent current source is generallyd use to imitative interface pin device power supply, so host computer Script controlling electric power starting or closing will not be right
Other devices impact, and realize that the switching of pin low and high level is more easier, and structure is also relatively easy.
Based on the above embodiment, the present embodiment is inserted between test data to simulate NVMe SSD insertion and obtain, and is led to
Often further include: execute IO test program and obtain IO test data；It executes default test script and obtains script test data.It is right at this
The type of default test script is not especially limited, and corresponding setting should be made according to the actual situation by those skilled in the art,
It such as can be Netlink test script.Usually before executing IO test program, the information that hot plug test needs need to be inserted into
Print routine opens Demsg information.Wherein, Demsg information is a system command in linux system, for obtaining system behaviour
The related type information for making result, the type information generated in meeting automatic printing operating process after unlatching.Journey is tested executing IO
After sequence, host successively executes the dependence tests script such as Netlink communication test, obtains insertion test data.It is inserted into obtaining
After test data, Demsg information monitoring is usually opened, is closed using Script controlling power supply, simulation NVMe SSD is extracted,
After Demsg type information is without output, obtains and extract test data.Wherein, printing is exactly function in system code, can will be related
As a result or prompt information is output on display screen, this process is referred to as information printing.Further, number usually is tested into insertion
Test document is saved as according to extraction test data.
Based on the above embodiment, the schematic structural diagram of testing device of available a kind of NVMe SSD hot plug, such as Fig. 2 institute
Show, Fig. 2 is a kind of schematic structural diagram of testing device of NVMe SSD hot plug provided by the embodiment of the present application.As seen from the figure,
Imitative U.2 interface pin device, which is connected using PCIe bus with host, is equivalent to connecing imitative U.2 interface pin device insertion host
In mouth slot, script, test script and insertion/extraction test data comprising control power supply in host obtain program and NVMe
SSD insertion/extraction is interrupted.Wherein, NVMe SSD insertion/extraction, which is interrupted, generally includes above-mentioned presence detection change interruption sum number
Change according to link layer and interrupts.
Below to a kind of test macro of NVMe SSD hot plug provided by the embodiments of the present application, equipment and computer-readable
Storage medium is introduced, test macro, equipment and the computer readable storage medium of NVMe SSD hot plug described below
Reference can be corresponded to each other with the test method of above-described NVMe SSD hot plug.
Referring to FIG. 3, Fig. 3 is a kind of structure of the test macro of NVMe SSD hot plug provided by the embodiment of the present application
Block diagram；The test macro of the NVMe SSD hot plug includes:
High level control module 301, the level for controlling pin on imitative interface pin device is high level, with simulation
NVMe SSD insertion obtains insertion test data；Wherein, in the interface slot for imitating interface pin device insertion host；
Low level control module 302 is low level to simulate NVMe SSD extraction for controlling level, obtains and extract test
Data；
Number judgment module 303 extracts whether the corresponding number of test data is less than default test number for judging；
When number judgment module judges that number is less than default test number, into high level control module and low level control
Molding block.
Based on the above embodiment, high level control module 301 generally includes in the test macro of the NVMe SSD hot plug
Electric power starting unit, for being to control the level using the imitative corresponding electric power starting of interface pin device described in Script controlling
High level；Low level control module 302 generally includes power supply closing unit, for being closed using power supply described in the Script controlling
To control the level as low level.
Based on the above embodiment, the test macro of the NVMe SSD hot plug also typically includes:
IO execution module obtains IO test data for executing IO test program；
Test script execution module obtains script test data for executing default test script.
Based on the above embodiment, the test macro of the NVMe SSD hot plug also typically includes:
Memory module, for the insertion test data and the extraction test data to be saved as test document.
The application also provides a kind of test equipment of NVMe SSD hot plug, comprising:
Host, imitative interface pin device, memory and processor；Wherein, memory is handled for storing computer program
The step of device is for realizing the test method of NVMe SSD hot plug of above-mentioned any embodiment when executing computer program.
The application also provides a kind of computer readable storage medium, is stored with computer program in computer storage medium,
The step of test method of NVMe SSD hot plug of above-mentioned any embodiment is realized when computer program is executed by processor.
The computer readable storage medium may include: USB flash disk, mobile hard disk, read-only memory (Read-Only
Memory, ROM), random access memory (Random Access Memory, RAM), magnetic or disk etc. is various to deposit
Store up the medium of program code.
Each embodiment is described in a progressive manner in specification, the highlights of each of the examples are with other realities
The difference of example is applied, the same or similar parts in each embodiment may refer to each other.For embodiment provide system and
Speech, since it is corresponding with the method that embodiment provides, so being described relatively simple, related place is referring to method part illustration
?.
Professional further appreciates that, unit described in conjunction with the examples disclosed in the embodiments of the present disclosure
And algorithm steps, can be realized with electronic hardware, computer software, or a combination of the two, in order to clearly demonstrate hardware and
The interchangeability of software generally describes each exemplary composition and step according to function in the above description.These
Function is implemented in hardware or software actually, the specific application and design constraint depending on technical solution.Profession
Technical staff can use different methods to achieve the described function each specific application, but this realization is not answered
Think beyond the scope of this invention.
The step of method described in conjunction with the examples disclosed in this document or algorithm, can directly be held with hardware, processor
The combination of capable software module or the two is implemented.Software module can be placed in random access memory (RAM), memory, read-only deposit
Reservoir (ROM), electrically programmable ROM, electrically erasable ROM, register, hard disk, moveable magnetic disc, CD-ROM or technology
In any other form of storage medium well known in field.
Above to test method, system, equipment and the computer of a kind of NVMe SSD hot plug provided herein
Readable storage medium storing program for executing is described in detail.Specific case used herein carries out the principle and embodiment of the application
It illustrates, the description of the example is only used to help understand the method for the present application and its core ideas.It should be pointed out that for this
For the those of ordinary skill of technical field, under the premise of not departing from the application principle, the application can also be carried out several
Improvement and modification, these improvement and modification are also fallen into the protection scope of the claim of this application.
Claims (10)
1. a kind of test method of NVMe SSD hot plug is applied to host characterized by comprising
S1, the level for controlling pin on imitative interface pin device are high level, to simulate the NVMe SSD insertion, obtain insertion
Test data；Wherein, the imitative interface pin device is inserted into the interface slot of the host；
S2, the control level are that low level is extracted with simulating the NVMe SSD, obtain and extract test data；
S3, judge whether the corresponding number of the extraction test data is less than default test number；If so, returning to S1.
2. the test method of NVMe SSD hot plug according to claim 1, which is characterized in that using described in Script controlling
The corresponding electric power starting of interface pin device is imitated to control the level as high level；It is closed using power supply described in the Script controlling
It closes to control the level as low level.
3. the test method of NVMe SSD hot plug according to claim 1, which is characterized in that to simulate the NVMe
Between SSD insertion and acquisition insertion test data, further includes:
It executes IO test program and obtains IO test data；
It executes default test script and obtains script test data.
4. the test method of NVMe SSD hot plug according to claim 1, which is characterized in that extract test number obtaining
According to later, further includes:
The insertion test data and the extraction test data are saved as into test document.
5. a kind of test macro of NVMe SSD hot plug characterized by comprising
High level control module, the level for controlling pin on imitative interface pin device is high level, to simulate the NVMe
SSD insertion obtains insertion test data；Wherein, the imitative interface pin device is inserted into the interface slot of the host；
Low level control module is low level to simulate the NVMe SSD extraction for controlling the level, obtains to extract and survey
Try data；
Number judgment module, for judging whether the corresponding number of the extraction test data is less than default test number；Work as institute
When stating number judgment module and judging that the number is less than the default test number, into the high level control module and described
Low level control module.
6. the test macro of NVMe SSD hot plug according to claim 5, which is characterized in that
The high level control module includes electric power starting unit, for corresponding using interface pin device is imitated described in Script controlling
Electric power starting to control the level as high level；
The low level control module includes power supply closing unit, for being closed using power supply described in the Script controlling to control
The level is low level.
7. the test macro of NVMe SSD hot plug according to claim 5, which is characterized in that further include:
IO execution module obtains IO test data for executing IO test program；
Test script execution module obtains script test data for executing default test script.
8. the test macro of NVMe SSD hot plug according to claim 5, which is characterized in that further include:
Memory module, for the insertion test data and the extraction test data to be saved as test document.
9. a kind of test equipment of NVMe SSD hot plug characterized by comprising
Host, imitative interface pin device, memory and processor；Wherein, the memory is described for storing computer program
It realizes when processor is for executing the computer program such as the described in any item NVMe SSD hot plugs of Claims 1-4
The step of test method.
10. a kind of computer readable storage medium, which is characterized in that be stored with computer journey in the computer storage medium
Sequence is realized when the computer program is executed by processor such as the described in any item NVMe SSD hot plugs of Claims 1-4
The step of test method.
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Cited By (7)
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| CN111552600A (en) * | 2020-04-27 | 2020-08-18 | 苏州浪潮智能科技有限公司 | Signal testing method, system, device and readable storage medium |
| CN111581035A (en) * | 2019-02-19 | 2020-08-25 | 睿宽智能科技有限公司 | Abnormal power-off test method and equipment for storage device |
| CN111638439A (en) * | 2020-04-27 | 2020-09-08 | 西安广和通无线软件有限公司 | Communication module testing method, device, computer equipment and storage medium |
| CN112015609A (en) * | 2020-08-28 | 2020-12-01 | 北京浪潮数据技术有限公司 | Hot plug test method, device and equipment |
| CN113656224A (en) * | 2021-07-22 | 2021-11-16 | 浪潮商用机器有限公司 | NVMe SSD hot plug test method, system, device and readable storage medium |
| CN114356677A (en) * | 2022-03-16 | 2022-04-15 | 北京得瑞领新科技有限公司 | NVMe SSD hot plug test method, device, equipment and storage medium |
| CN116483764A (en) * | 2023-04-06 | 2023-07-25 | 珠海妙存科技有限公司 | Hot plug method of chip test equipment, test equipment and storage medium |
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Application publication date: 20190111 |