CN112954101A - Radio frequency test assembly - Google Patents
Radio frequency test assembly Download PDFInfo
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- CN112954101A CN112954101A CN202110133792.XA CN202110133792A CN112954101A CN 112954101 A CN112954101 A CN 112954101A CN 202110133792 A CN202110133792 A CN 202110133792A CN 112954101 A CN112954101 A CN 112954101A
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- 238000012360 testing method Methods 0.000 title claims abstract description 240
- 238000001514 detection method Methods 0.000 claims description 5
- 230000005611 electricity Effects 0.000 claims description 5
- 230000006835 compression Effects 0.000 claims 1
- 238000007906 compression Methods 0.000 claims 1
- 238000009413 insulation Methods 0.000 claims 1
- 238000011056 performance test Methods 0.000 description 24
- 230000008878 coupling Effects 0.000 description 14
- 238000010168 coupling process Methods 0.000 description 14
- 238000005859 coupling reaction Methods 0.000 description 14
- 238000013461 design Methods 0.000 description 12
- 238000010586 diagram Methods 0.000 description 12
- 238000010295 mobile communication Methods 0.000 description 7
- 230000006378 damage Effects 0.000 description 6
- 238000012938 design process Methods 0.000 description 6
- 230000000670 limiting effect Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 3
- 238000003466 welding Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
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- 238000003825 pressing Methods 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/24—Arrangements for testing
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Abstract
The application discloses radio frequency test assembly, radio frequency test assembly includes: the radio frequency test base is provided with a first pin and a second pin, wherein the first end of the first pin is electrically connected with a radio frequency circuit of the terminal, and the first end of the second pin is electrically connected with an antenna circuit of the terminal; the testing thimble is provided with a conductive part and an insulating part, the second end of the first pin is electrically connected with the second end of the second pin under the condition that the testing thimble is in the first state, the second end of the first pin is electrically disconnected with the second end of the second pin under the condition that the testing thimble is in the second state, one of the second end of the first pin and the second end of the second pin is electrically connected with the conductive part, and the other of the second end of the first pin and the second end of the second pin is in insulating connection with the insulating part. This application makes radio frequency circuit and antenna circuit can both be connected to check out test set through testing the thimble and in order to carry out the conduction test through being equipped with conductive part and insulating part on testing the thimble.
Description
Technical Field
The application belongs to the technical field of radio frequency testing, and particularly relates to a radio frequency testing assembly.
Background
During the design and production process of the terminal, the mobile communication performance of the terminal is tested in two aspects, namely a conduction test and a coupling test. The performance of the local circuit can be detected through conduction testing, the performance of the whole mobile phone can be detected through coupling testing, and the performance of the whole mobile phone is determined by the performance of each local circuit.
The local circuit design of the mobile communication module of the terminal is mainly divided into two parts, namely, a radio frequency path design and an antenna path design, and the two parts are usually developed and designed simultaneously. Therefore, based on the requirements of development design and production line test, it is necessary to add an rf test socket design between the rf path and the antenna path to serve as a connecting bridge of the two-part path. The radio frequency path and the antenna path need to be separately conducted and tested in the design process, and also need to be connected to conduct the coupling test of the whole machine.
According to the existing radio frequency test socket connection design, only a video channel can be electrically connected with an instrument through a test connecting line for testing during conduction testing. During the antenna design process of the terminal, the antenna path must also be connected to the instrument for debugging. And analysis to solve the antenna problem also requires connecting the antenna path to the instrument for testing.
At present, a method of taking off a radio frequency test seat and manually welding a test wire to an antenna channel is generally adopted, so that damage to a prototype cannot be avoided. Meanwhile, in the design process of the 5G mobile phone, the design of the antenna is more and more inconvenient due to the fact that the number of the antennas is more and more.
Disclosure of Invention
The present application is directed to a radio frequency test assembly that solves at least one of the problems set forth in the background art.
In order to solve the technical problem, the present application is implemented as follows:
the embodiment of the application provides a radio frequency test assembly, which comprises: the radio frequency test socket is provided with a first pin and a second pin, wherein the first end of the first pin is electrically connected with a radio frequency circuit of a terminal, and the first end of the second pin is electrically connected with an antenna circuit of the terminal; the test thimble is electrically connected with the detection equipment, the test thimble is equipped with conductive part and insulating part, the test thimble is changeable between first state and second state, under the condition that the test thimble is in the first state, the second end of first pin with the second end electricity of second pin is connected, under the condition that the test thimble is in the second state, the second end of first pin with the second end disconnection electricity of second pin is connected, one of the second end of first pin with the second end of second pin with the conductive part electricity is connected, the second end of first pin with the second end of second pin another with the insulating part insulated connection.
In the embodiment of the application, be equipped with conductive part and insulating part on the test thimble, through the position of adjustment conductive part and insulating part, make radio frequency circuit and antenna circuit can both be connected to check out test set through the test thimble in order to carry out the conduction test, radio frequency test seat need be taken off in carrying out antenna circuit capability test in having avoided prior art, and lead to causing the shortcoming of destruction to the model machine on will testing line manual welding to antenna circuit, can make antenna design process more convenient in the 5G technique simultaneously.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1 is a schematic diagram of a prior art RF test socket for coupling tests;
FIG. 2 is a schematic diagram of a prior art RF test socket for performing RF circuit performance testing;
FIG. 3 is a schematic diagram of the connection of a radio frequency test assembly to an antenna path and a radio frequency path according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a radio frequency test assembly performing a coupling test in accordance with one embodiment of the present invention;
FIG. 5 is a schematic diagram of an RF circuit performance test performed by the RF test assembly according to one embodiment of the invention;
FIG. 6 is a schematic diagram of a radio frequency test assembly performing antenna circuit performance testing in accordance with one embodiment of the present invention;
FIG. 7 is a schematic diagram of a radio frequency test assembly performing a coupling test in accordance with yet another embodiment of the present invention;
FIG. 8 is a schematic diagram of an antenna circuit performance test performed by a radio frequency test assembly according to yet another embodiment of the invention;
FIG. 9 is a schematic diagram of an RF circuit performance test performed by an RF test assembly according to yet another embodiment of the invention;
FIG. 10 is a schematic diagram of a radio frequency test assembly performing a coupling test in accordance with yet another embodiment of the present invention;
FIG. 11 is a schematic diagram of an antenna circuit performance test performed by the RF test assembly in accordance with yet another embodiment of the present invention;
FIG. 12 is a schematic diagram of an RF circuit performance test performed by the RF test assembly according to yet another embodiment of the invention.
Reference numerals:
a radio frequency test component 100;
a radio frequency test socket 10; a first lead 11; a second pin 12; a channel 13; a first boss portion 14; a second boss portion 15;
a test thimble 20; a conductive portion 21; an insulating section 22; a connecting portion 23; a limiting groove 24; a connection terminal 25;
a connecting member 30; a first elastic member 40; a second elastic member 50;
an antenna 211; an antenna circuit 212; a radio frequency circuit 213; a test line thimble 214; a first terminal 215; a second terminal 216.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The features of the terms first and second in the description and in the claims of the present application may explicitly or implicitly include one or more of such features. In the description of the present invention, "a plurality" means two or more unless otherwise specified. In addition, "and/or" in the specification and claims means at least one of connected objects, a character "/" generally means that a preceding and succeeding related objects are in an "or" relationship.
In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are therefore not to be considered limiting of the invention.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
The present application is an invention made by the inventors based on the following facts.
Fig. 1 and 2 show a prior art rf test socket.
As shown in fig. 1, when the rf test socket of the prior art performs a coupling test, the test wire thimble 214 is not inserted into the test socket, and the first terminal 215 and the second terminal 216 are in a connected state, i.e. the rf path is connected to the antenna path, so that the rf performance of the whole apparatus can be tested.
As shown in fig. 2, when the prior art rf test socket performs a conduction test, the test wire thimble 214 is inserted into the test socket, the first terminal 215 and the second terminal 216 are in an off state, that is, the rf path and the antenna path are disconnected, and the first terminal 215 is connected to the detection equipment through the test wire thimble 214, so as to test the conductive circuit performance of the rf path.
It can be seen that only the rf path in communication with the first terminal 215 can be tested in the conventional rf test socket. When the antenna path is tested, the test base needs to be taken down, and then the test wire thimble 214 is manually welded on the antenna path, which inevitably damages the prototype.
Based on this, the inventors of the present application have conducted long-term creative efforts to arrive at the following inventions.
An rf test assembly 100 according to an embodiment of the invention is described below in conjunction with fig. 3-12.
As shown in fig. 3 to 12, the radio frequency test assembly 100 according to the embodiment of the present invention includes: a radio frequency test socket 10 and a test thimble 20.
Specifically, the rf test socket 10 has a first pin 11 and a second pin 12, a first end of the first pin 11 is electrically connected to the rf circuit 213 of the terminal, a first end of the second pin 12 is electrically connected to the antenna circuit 212 of the antenna 211 of the terminal, the test pin 20 is electrically connected to the testing device, the test pin 20 has a conductive portion 21 and an insulating portion 22, the test pin 20 is switchable between a first state and a second state, under the condition that the test thimble 20 is in the first state, the second end of the first pin 11 is electrically connected with the second end of the second pin 12, under the condition that the test thimble 20 is in the second state, the second end of the first pin 11 is electrically disconnected from the second end of the second pin 12, one of the second end of the first pin 11 and the second end of the second pin 12 is electrically connected with the conductive part 21, and the other of the second end of the first pin 11 and the second end of the second pin 12 is connected with the insulating part 22 in an insulating manner.
In other words, the rf test assembly 100 according to the embodiment of the invention mainly comprises the rf test socket 10 having the first pin 11 and the second pin 12, and the test thimble 20 selectively electrically connected to the first pin 11 or the second pin 12. The radio frequency test component 100 according to the embodiment of the invention can be used for mobile communication performance test of a terminal, such as mobile communication performance test of a mobile phone. As shown in fig. 3, the local circuit design of the mobile communication module of the terminal is mainly divided into two parts, namely, a radio frequency circuit 213 design and an antenna circuit 212 design, and the two parts are usually developed and designed simultaneously. The rf test assembly 100 is located between the rf circuit 213 and the antenna circuit 212, and may serve as a bridge for connecting the rf circuit 213 and the antenna circuit 212.
The first pin 11 of the rf test socket 10 is electrically connected to the rf circuit 213 of the terminal, and the second pin 12 of the rf test socket 10 is electrically connected to the antenna circuit 212 of the terminal. The test pin 20 is electrically connected to the inspection equipment, and as shown in fig. 4 to 12, a conductive portion 21 and an insulating portion 22 are provided on the test pin 20. As shown in fig. 4, 7 and 10, when the testing thimble 20 is in the first state, the testing thimble 20 is simultaneously connected or separated to or from the first pin 11 and the second pin 12 in an insulated manner, and the first pin 11 and the second pin 12 are directly or indirectly electrically connected, so as to implement a coupling test for mobile communication performance. As shown in fig. 5, 6, 8, 9, 11 and 12, when the testing thimble 20 is in the second state, the testing thimble 20 is electrically connected to one of the first pin 11 and the second pin 12, so as to implement a conduction test of the mobile communication performance.
The following describes in detail the testing process of the radio frequency test assembly 100 according to an embodiment of the present invention.
As shown in fig. 5, 9 and 12, when the performance test of the rf circuit 213 in the conduction test is performed, the first end of the first pin 11 is electrically connected to the rf circuit 213 at the terminal, and the second end of the first pin 11 is electrically connected to the conductive portion 21 on the test thimble 20. At this time, the second pin 12 may be connected to the insulating portion 22 of the testing thimble 20 in an insulating manner.
As shown in fig. 6, 8 and 11, when the performance test of the antenna circuit 212 in the conduction test is performed, the first end of the second pin 12 is electrically connected to the antenna circuit 212 of the terminal, and the second end of the second pin 12 is electrically connected to the conductive portion 21 on the test thimble 20. At this time, the first pin 11 may be connected to the insulating portion 22 of the testing thimble 20 in an insulating manner.
As shown in fig. 4, 7 and 10, when the coupling test is performed, the second end of the first pin 11 is electrically connected to the second end of the second pin 12.
Therefore, according to the radio frequency test assembly 100 of the embodiment of the present invention, the conductive portion 21 and the insulating portion 22 are disposed on the test thimble 20, and by adjusting the positions of the conductive portion 21 and the insulating portion 22, the radio frequency circuit 213 and the antenna circuit 212 can both be connected to the detection equipment through the test thimble 20 for conducting test, thereby avoiding the defect that the radio frequency test socket 10 needs to be removed and the test wire is manually soldered to the antenna circuit 212 to damage the prototype in the performance test process of the antenna circuit 212 in the prior art, and simultaneously enabling the antenna design process in the 5G technology to be more convenient.
According to an embodiment of the present invention, as shown in fig. 4 to 9, the testing thimble 20 is a cylindrical structure, and the conductive portion 21 and the insulating portion 22 are disposed on two sides of the testing thimble 20 at a distance along a circumferential direction of the testing thimble 20. Under the condition that the test thimble 20 is in the second state, the first side of the test thimble 20 is electrically connected to the first pin 11, and the second side of the test thimble 20 is connected to the second pin 12, or the first side of the test thimble 20 is connected to the second pin 12, and the second side of the test thimble 20 is electrically connected to the first pin 11.
It should be noted that the first lead 11 and the second lead 12 may be metal pads, and the conductive portion 21 and the insulating portion 22 may be fixed to the testing thimble 20 or detachably mounted to the testing thimble 20. In the case where the conductive portion 21 and the insulating portion 22 are detachably mounted, when switching between the performance test of the radio frequency circuit 213 and the performance test of the antenna circuit 212 is required, the conductive portion 21 and the insulating portion 22 may be removed and remounted to exchange positions. In the case where the conductive portion 21 and the insulating portion 22 are fixedly mounted, when switching between the performance test of the rf circuit 213 and the performance test of the antenna circuit 212, the test pin 20 may be rotated to adjust the positions of the conductive portion 21 and the insulating portion 22.
Further, as shown in fig. 4 to 9, the test thimble 20 is rotatable around its axis, so as to switch between the performance test of the rf circuit 213 and the performance test of the antenna circuit 212. For example, after the rf circuit 213 is tested, the test pin 20 is rotated to adjust the positions of the conductive part 21 and the insulating part 22, so as to electrically connect the conductive part 21 and the second pin 12, thereby testing the antenna circuit 212 without removing the rf test socket 10.
In some embodiments of the present invention, as shown in fig. 4 to 6, the second end of the first pin 11 is spaced apart from the second end of the second pin 12, and the rf testing assembly 100 further includes: and a connector 30, the connector 30 being disposed between the second end of the first pin 11 and the second end of the second pin 12, the connector 30 being switchable between a third state and a fourth state.
As shown in fig. 4, in the case that the test thimble 20 is in the first state, the connector 30 is in the third state, and the second end of the first pin 11 and the second end of the second pin 12 are electrically connected to the connector 30, that is, when the coupling test is performed, the test thimble 20 is connected to or separated from the first pin 11 and the second pin 12 in an insulated manner, and the second end of the first pin 11 and the second end of the second pin 12 can be electrically connected through the connector 30.
As shown in fig. 5, when the test thimble 20 is in the second state, the connector 30 is in the fourth state, the connector 30 is disconnected from the second ends of the first pins 11 and the second ends of the second pins 12, and the second ends of the first pins 11 and the second ends of the second pins 12 are connected to the test thimble 20.
Further, as shown in fig. 4 to 6, the radio frequency test assembly 100 further includes: the first elastic member 40, and the first elastic member 40 may be a spring. The first elastic element 40 is disposed between the connecting element 30 and the rf test socket 10, a first end of the first elastic element 40 is connected to the connecting element 30, a second end of the first elastic element 40 is connected to the rf test socket 10, when the test pin 20 is in the second state, the test pin 20 compresses the first elastic element 40, and the connecting element 30 is separated from the first pin 11 and the second pin 12.
The operation of the connecting member 30 and the first elastic member 40 of the rf test assembly 100 according to the embodiment of the present invention will be described in detail with reference to the accompanying drawings.
As shown in fig. 4, when the coupling test is performed, the second end of the first pin 11 is connected to the left side of the connector 30, and the second end of the second pin 12 is connected to the right side of the connector 30. At this time, the first elastic member 40 located below the connection member 30 extends in the up-down direction and may be in a stretched state. The test ejector pins 20 located above the connector 30 are spaced apart from both the first pins 11 and the second pins 12.
As shown in fig. 5, when the performance test of the rf circuit 213 is performed, the second end of the first lead 11 is connected to the conductive part 21, and the second end of the second lead 12 is connected to the insulating part 22. At this time, the test thimble 20 extending in the up-down direction applies a downward pressing force to the connector 30 and the first elastic member 40, the first elastic member 40 is in a compressed state, and the connector 30 moves downward while being separated from the first lead 11 and the second lead 12.
As shown in fig. 6, when the performance of the antenna circuit 212 is tested, the test pin 20 may be rotated. At this time, the second end of the second lead 12 is connected to the conductive part 21, the second end of the first lead 11 is connected to the insulating part 22, and the connector 30 is simultaneously separated from the first lead 11 and the second lead 12.
According to an embodiment of the present invention, as shown in fig. 7 to 9, the second end of the first lead 11 is spaced apart from the second end of the second lead 12 to define a channel 13, the second end of the first lead 11 is provided with a first protrusion 14 protruding toward the second lead 12, and the second end of the second lead 12 is provided with a second protrusion 15 protruding toward the first lead 11.
Specifically, as shown in fig. 7, when the test thimble 20 is in the first state, the first protruding portion 14 is electrically connected to the second protruding portion 15, and at this time, the first pin 11 is electrically connected to the second pin 12, so that the coupling test can be performed. As shown in fig. 8 and 9, in the second state of the test thimble 20, the test thimble 20 is located in the channel 13, and the first boss 14 and the second boss 15 are located on both sides of the test thimble 20. When the conductive portion 21 is electrically connected to the first bump 14 and the insulating portion 22 is connected to the second bump 15, the performance test of the rf circuit 213 can be performed. Alternatively, the performance test of the antenna circuit 212 may be performed by electrically connecting the conductive portion 21 to the second bump 15 and connecting the insulating portion 22 to the first bump 14. That is, the first convex portion 14 and the second convex portion 15 can be always in an electrically connected state without applying an external force. Upon insertion of the test spike 20 into the channel 13 between the first and second bosses 14, 15, the first and second bosses 14, 15 may be separated in the presence of the test spike 20.
In some embodiments of the present invention, as shown in fig. 4 to 9, the testing spike 20 is composed of a conductive portion 21 and an insulating portion 22, and the conductive portion 21 and the insulating portion 22 are respectively of a columnar structure extending along respective axial directions. That is, the columnar test thimble 20 may be divided into two parts along its extending direction, one part being the conductive part 21 and the other part being the insulating part 22, so that the area of the effective contact area between the first and second leads 11 and 12 and the test thimble 20 can be enlarged.
Further, a first side of the conductive portion 21 is connected to the insulating portion 22, and a second side of the conductive portion 21 is provided with a connecting terminal 25 protruding outward, where the protruding connecting terminal 25 can play a guiding role, so that an operator can quickly determine the conductive portion 21 in the testing thimble 20.
According to an embodiment of the present invention, as shown in fig. 10 to 12, the testing thimble 20 is a cylindrical structure, the conductive portion 21 and the insulating portion 22 are distributed at intervals along an axial direction of the testing thimble 20, the second end of the first pin 11 is spaced apart from the second end of the second pin 12 to define the channel 13, the second end of the first pin 11 is provided with a first protruding portion 14 protruding toward the second pin 12, the second end of the second pin 12 is provided with a second protruding portion 15 protruding toward the first pin 11, the first protruding portion 14 and the second protruding portion 15 are staggered along the axial direction of the testing thimble 20, and when the first protruding portion 14 is electrically connected with the conductive portion 21, the second protruding portion 15 is electrically connected with the insulating portion 22. The testing thimble 20 is movable along the axial direction thereof to electrically connect the first protruding portion 14 or the second protruding portion 15 with the conductive portion 21, so as to switch between the performance test of the antenna circuit 212 and the performance test of the radio frequency circuit 213.
The operation of the test thimble 20 of the radio frequency test assembly 100 according to another embodiment of the present invention will be described in detail with reference to the accompanying drawings.
As shown in fig. 10, the first pin 11 and the second pin 12 are electrically connected when the coupling test is performed. At this time, the test thimble 20 is located above the first lead 11 and the second lead 12, and is separated from the first lead 11 and the second lead 12, respectively.
As shown in fig. 11, when performing a performance test of the rf circuit 213, the testing pin 20 is driven to move downward along the channel 13, the first protruding portion 14 of the first pin 11 is electrically connected to the conductive portion 21, and the second protruding portion 15 of the second pin 12 is located below the testing pin 20 and spaced apart from the testing pin 20.
As shown in fig. 12, when the performance test of the antenna circuit 212 is performed, the test thimble 20 is driven to move in the channel 13 until the first protruding portion 14 of the first lead 11 is electrically connected to the insulating portion 22, and the second protruding portion 15 of the second lead 12 is electrically connected to the conductive portion 21.
Further, as shown in fig. 10 to 12, the dimension of the first projecting portion 14 of the first lead 11 in the width direction of the channel 13 is larger than the dimension of the second projecting portion 15 of the second lead 12 in the width direction of the channel 13. That is, the first protruding portion 14 of the first pin 11 exceeds the center line of the channel 13, when the testing thimble 20 is driven to move downward along the center line of the channel 13, the left side of the testing thimble 20 can press the first protruding portion 14 of the first pin 11 leftward, and the right side of the testing thimble 20 can be spaced apart from the second pin 12 within a certain range.
Alternatively, the number of the conductive portions 21 is at least two, for example, the number of the conductive portions 21 in fig. 10 to 12 is two. The number of the conductive portions 21 may be an odd number or an even number, and is not limited herein. Two adjacent conductive portions 21 are distributed at intervals along the axial direction of the test thimble 20, and the test thimble 20 further includes: and a connecting portion 23, wherein the connecting portion 23 is provided between two adjacent conductive portions 21 to electrically connect the two conductive portions 21, and an insulating portion 22 is provided on the outer periphery of the connecting portion 23. Thus, by providing a plurality of conductive portions 21, the first lead 11 and the second lead 12 can be switched between a plurality of positions on the test thimble 20.
In some embodiments of the present invention, the conductive portion 21 and the insulating portion 22 are provided with a limiting groove 24 that is matched with the first protruding portion 14 and/or the second protruding portion 15, as shown in fig. 11 and 12, by providing the limiting groove 24, not only a limiting effect can be achieved, but also the reliability of the electrical connection and the insulating connection between the first pin 11 and the second pin 12 and the testing thimble 20 during the testing process can be improved, and the distance between the first pin 11 and the second pin 12 can be reduced, and the size of the rf test socket 10 can be reduced.
Optionally, as shown in fig. 7 to 12, the radio frequency test assembly 100 further includes: the second elastic element 50 is configured such that when the test thimble 20 is located in the channel 13 and presses the first pin 11 and/or the second pin 12, the first protrusion 14 and/or the second protrusion 15 will press the corresponding second elastic element 50, and when the test thimble 20 is separated from the channel 13, the first pin 11 and the second pin 12 can return to the initial positions under the action of the second elastic element 50. As shown in fig. 7 to 12, second elastic members 50 may be respectively provided on the left side of the second lead 12 and the right side of the first lead 11, and the positions of the first lead 11 and the second lead 12 may be reset by the second elastic members 50.
In summary, according to the radio frequency testing assembly 100 of the embodiment of the present invention, the conductive portion and the insulating portion 22 are disposed on the testing thimble 20, on one hand, the design and the test of the antenna circuit 212 can be more convenient and accurate; in another aspect, by improving the connection manner of the first pin 11 and the second pin 12 of the radio frequency test socket 10 and correspondingly modifying the design of the test thimble 20, both the radio frequency circuit 213 and the antenna circuit 212 can be connected to the detection equipment through the test thimble 20 for conducting test, which not only avoids the damage to a prototype when the performance test of the antenna circuit 212 is performed by using the prior art, such as the damage to a PCB, but also saves errors caused by manually welding the test thimble 20, and improves the test accuracy.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an illustrative embodiment," "an example," "a specific example," or "some examples" or the like mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While embodiments of the invention have been shown and described, it will be understood by those of ordinary skill in the art that: various changes, modifications, substitutions and alterations can be made to the embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the claims and their equivalents.
Claims (11)
1. A radio frequency test assembly, comprising:
the radio frequency test socket is provided with a first pin and a second pin, wherein the first end of the first pin is electrically connected with a radio frequency circuit of a terminal, and the first end of the second pin is electrically connected with an antenna circuit of the terminal;
the test thimble is electrically connected with the detection equipment, the test thimble is provided with a conductive part and an insulating part, the test thimble can be switched between a first state and a second state,
under the condition that the test thimble is in the first state, the second end of the first pin is electrically connected with the second end of the second pin,
under the condition that the test thimble is in the second state, the second end of the first pin is electrically disconnected from the second end of the second pin, one of the second end of the first pin and the second end of the second pin is electrically connected with the conductive part, and the other of the second end of the first pin and the second end of the second pin is in insulation connection with the insulating part.
2. The RF testing assembly of claim 1, wherein the testing pin is a cylindrical structure, the conductive portion and the insulating portion are spaced apart from each other at two sides of the testing pin along a circumferential direction of the testing pin,
and under the condition that the test thimble is in the second state, the first side of the test thimble is electrically connected with the first pin, and the second side of the test thimble is connected with the second pin, or the first side of the test thimble is connected with the second pin, and the second side of the test thimble is electrically connected with the first pin.
3. The radio frequency test assembly of claim 2, wherein the test pin is rotatable about its axis.
4. The radio frequency test assembly of claim 2, wherein the second end of the first pin is spaced apart from the second end of the second pin, the radio frequency test assembly further comprising:
a connector disposed between the second end of the first pin and the second end of the second pin, the connector being switchable between a third state and a fourth state,
under the condition that the test thimble is in the first state, the connecting piece is in the third state, and the second end of the first pin and the second end of the second pin are electrically connected with the connecting piece;
and under the condition that the test thimble is in the second state, the connecting piece is in the fourth state, and the connecting piece is disconnected from the second ends of the first pin and the second pin.
5. The radio frequency testing assembly of claim 4, further comprising:
the elastic piece, the elastic piece is located the connecting piece with between the radio frequency test seat, the first end of elastic piece with the connecting piece is connected, the second end of elastic piece with the radio frequency test seat is connected the test thimble is in under the condition of second state, the compression of test thimble the elastic piece.
6. The radio frequency test assembly of claim 2, wherein the second end of the first pin is spaced apart from the second end of the second pin to define a channel, the second end of the first pin is provided with a first protrusion protruding toward the second pin, the second end of the second pin is provided with a second protrusion protruding toward the first pin,
under the condition that the test thimble is in the first state, the first boss part is electrically connected with the second boss part,
under the condition that the test thimble is in the second state, the test thimble is located in the channel, just first bellying and second bellying are located the both sides of test thimble, the conductive part with first bellying electricity is connected, the insulating part with the second bellying is connected, or, the conductive part with the second bellying electricity is connected, the insulating part with first bellying is connected.
7. The radio frequency test assembly of claim 2, wherein the test pin is formed of the conductive portion and the insulating portion, the conductive portion and the insulating portion each having a cylindrical structure extending in respective axial directions.
8. The radio frequency test assembly of claim 7, wherein a first side of the conductive portion is coupled to the insulating portion and a second side of the conductive portion is provided with an outwardly protruding terminal.
9. The RF test assembly of claim 1, wherein the test pin is a cylindrical structure, the conductive portion and the insulating portion are spaced apart along an axial direction of the test pin,
the second end of the first pin and the second end of the second pin are spaced to define a channel, the second end of the first pin is provided with a first bulge portion protruding towards the second pin, the second end of the second pin is provided with a second bulge portion protruding towards the first pin, and the first bulge portion and the second bulge portion are staggered along the axial direction of the test thimble,
the testing thimble can move along the axial direction of the testing thimble so as to enable the first protruding part or the second protruding part to be electrically connected with the conductive part.
10. The rf test assembly according to claim 9, wherein the number of the conductive portions is at least two, two adjacent conductive portions are spaced apart from each other in an axial direction of the test pin, and the test pin further includes:
the connecting part is arranged between two adjacent conductive parts to electrically connect the two conductive parts, and the insulating part is arranged on the periphery of the connecting part.
11. The radio frequency test assembly according to claim 9, wherein the conductive portion and the insulating portion are provided with a stopper groove for engaging with the first protruding portion and/or the second protruding portion.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202110133792.XA CN112954101B (en) | 2021-01-29 | 2021-01-29 | Radio frequency test assembly |
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| CN202110133792.XA CN112954101B (en) | 2021-01-29 | 2021-01-29 | Radio frequency test assembly |
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| CN112954101B CN112954101B (en) | 2024-03-26 |
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| CN112954101B (en) | 2024-03-26 |
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