CN112673286B - 双传感器子像素辐射探测器 - Google Patents

双传感器子像素辐射探测器 Download PDF

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Publication number
CN112673286B
CN112673286B CN201980059041.9A CN201980059041A CN112673286B CN 112673286 B CN112673286 B CN 112673286B CN 201980059041 A CN201980059041 A CN 201980059041A CN 112673286 B CN112673286 B CN 112673286B
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China
Prior art keywords
pixels
sub
array
pixel
radiation
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CN201980059041.9A
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Chinese (zh)
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CN112673286A (zh
Inventor
J·W·M·雅各布斯
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Koninklijke Philips NV
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Koninklijke Philips NV
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Priority claimed from EP18193337.5A external-priority patent/EP3620826A1/en
Priority claimed from EP19154188.7A external-priority patent/EP3690489A1/en
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Publication of CN112673286A publication Critical patent/CN112673286A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN201980059041.9A 2018-09-10 2019-08-29 双传感器子像素辐射探测器 Active CN112673286B (zh)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
EP18193337.5A EP3620826A1 (en) 2018-09-10 2018-09-10 Multi-piece mono-layer radiation detector
EP18193337.5 2018-09-10
EP19154188.7A EP3690489A1 (en) 2019-01-29 2019-01-29 Dual-sensor subpixel radiation detector
EP19154188.7 2019-01-29
PCT/EP2019/073103 WO2020052987A1 (en) 2018-09-10 2019-08-29 Dual-sensor subpixel radiation detector

Publications (2)

Publication Number Publication Date
CN112673286A CN112673286A (zh) 2021-04-16
CN112673286B true CN112673286B (zh) 2024-11-01

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Application Number Title Priority Date Filing Date
CN201980059041.9A Active CN112673286B (zh) 2018-09-10 2019-08-29 双传感器子像素辐射探测器

Country Status (5)

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US (1) US20220050218A1 (https=)
EP (1) EP3850399A1 (https=)
JP (1) JP7309858B2 (https=)
CN (1) CN112673286B (https=)
WO (1) WO2020052987A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3521862A1 (en) * 2018-02-02 2019-08-07 Koninklijke Philips N.V. Multi-spectral x-ray detector
FR3119708B1 (fr) * 2021-02-11 2023-08-25 Trixell Détecteur numérique à étages de conversion superposés
CN119563125B (zh) * 2022-08-30 2025-11-21 深圳帧观德芯科技有限公司 具有突出的集成电路芯片的侧入射图像传感器

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10054678A1 (de) 2000-11-03 2002-05-16 Siemens Ag Verfahren zur Herstellung eines ein- oder mehrdimensionalen Detektorarrays
US20100282972A1 (en) * 2007-11-06 2010-11-11 Koninklijke Philips Electronics N.V. Indirect radiation detector
WO2009107045A2 (en) * 2008-02-25 2009-09-03 Philips Intellectual Property & Standards Gmbh Suppression of direct detection events in x-ray detectors
CN102066976A (zh) * 2008-06-16 2011-05-18 皇家飞利浦电子股份有限公司 辐射探测器和制造辐射探测器的方法
JP5744903B2 (ja) * 2009-12-21 2015-07-08 コーニンクレッカ フィリップス エヌ ヴェ 信号処理回路の電気的試験を行う装置及び方法
JP5844545B2 (ja) * 2010-05-31 2016-01-20 富士フイルム株式会社 放射線撮影装置
BR112014004344A2 (pt) * 2011-08-30 2017-05-30 Koninklijke Philips Nv matriz detectora e método de detecção de maiores taxas de fluxo de fóton
US10067239B2 (en) * 2012-05-31 2018-09-04 Minnesota Imaging And Engineering Llc Detector systems for radiation imaging
JP6445978B2 (ja) * 2012-12-03 2018-12-26 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． イメージング検出器
US9677931B2 (en) * 2013-04-24 2017-06-13 Koninklijke Philips N.V. Detection of radiation quanta using an optical detector pixel array and pixel cell trigger state sensing circuits
JP6559250B2 (ja) * 2014-12-21 2019-08-14 イオンビーム アプリケーションズ， エス．エー． 放射線センサおよび放射線イメージセンサを構成する方法
CN107850680B (zh) * 2015-07-21 2021-09-21 皇家飞利浦有限公司 用于相位对比和/或暗场成像的x射线探测器
US10483316B2 (en) * 2016-01-13 2019-11-19 mPower Technology, Inc. Fabrication and operation of multi-function flexible radiation detection systems
US20170212253A1 (en) * 2016-01-22 2017-07-27 General Electric Company Adaptive ct detector having integrated readout electronics
JP2018107343A (ja) * 2016-12-27 2018-07-05 キヤノン株式会社 放射線撮像装置、その製造方法および撮像システム

Also Published As

Publication number Publication date
JP7309858B2 (ja) 2023-07-18
CN112673286A (zh) 2021-04-16
WO2020052987A1 (en) 2020-03-19
US20220050218A1 (en) 2022-02-17
EP3850399A1 (en) 2021-07-21
JP2022506008A (ja) 2022-01-17

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