CN111886493A - 放射线检查装置和行李检查装置 - Google Patents

放射线检查装置和行李检查装置 Download PDF

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Publication number
CN111886493A
CN111886493A CN201980018398.2A CN201980018398A CN111886493A CN 111886493 A CN111886493 A CN 111886493A CN 201980018398 A CN201980018398 A CN 201980018398A CN 111886493 A CN111886493 A CN 111886493A
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CN
China
Prior art keywords
radiation
inspection apparatus
shielding
ray
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201980018398.2A
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English (en)
Chinese (zh)
Inventor
高山和朗
高桥真起
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Signal Co Ltd
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Nippon Signal Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Signal Co Ltd filed Critical Nippon Signal Co Ltd
Publication of CN111886493A publication Critical patent/CN111886493A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
    • G21F1/00—Shielding characterised by the composition of the materials
    • G21F1/02—Selection of uniform shielding materials
    • G21F1/08—Metals; Alloys; Cermets, i.e. sintered mixtures of ceramics and metals
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
    • G21F1/00—Shielding characterised by the composition of the materials
    • G21F1/12—Laminated shielding materials
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
    • G21F3/00—Shielding characterised by its physical form, e.g. granules, or shape of the material
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G21K5/10—Irradiation devices with provision for relative movement of beam source and object to be irradiated

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Ceramic Engineering (AREA)
  • Metallurgy (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201980018398.2A 2018-03-15 2019-03-13 放射线检查装置和行李检查装置 Pending CN111886493A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018047458A JP6629372B2 (ja) 2018-03-15 2018-03-15 放射線検査装置及び手荷物検査装置
JP2018-047458 2018-03-15
PCT/JP2019/010329 WO2019177041A1 (fr) 2018-03-15 2019-03-13 Dispositif d'inspection par rayonnement et procédé d'inspection de bagages

Publications (1)

Publication Number Publication Date
CN111886493A true CN111886493A (zh) 2020-11-03

Family

ID=67908369

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201980018398.2A Pending CN111886493A (zh) 2018-03-15 2019-03-13 放射线检查装置和行李检查装置

Country Status (3)

Country Link
JP (1) JP6629372B2 (fr)
CN (1) CN111886493A (fr)
WO (1) WO2019177041A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7287880B2 (ja) * 2019-10-30 2023-06-06 日本信号株式会社 Ｘ線検査装置

Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003083913A (ja) * 2001-09-11 2003-03-19 Ishida Co Ltd Ｘ線検査装置
JP2004166923A (ja) * 2002-11-19 2004-06-17 Canon Inc Ｘ線コンピューター断層撮影装置
JP2005172486A (ja) * 2003-12-09 2005-06-30 Ishida Co Ltd 放射線検査装置
JP2008002940A (ja) * 2006-06-22 2008-01-10 Ihi Corp 遠隔ｘ線透視装置および方法
US20080037707A1 (en) * 2006-08-11 2008-02-14 American Science And Engineering, Inc. X-Ray Inspection With Contemporaneous and Proximal Transmission and Backscatter Imaging
JP2008275451A (ja) * 2007-04-27 2008-11-13 Anritsu Sanki System Co Ltd Ｘ線異物検出装置
CN201622251U (zh) * 2010-03-23 2010-11-03 东莞市善时电子科技有限公司 一种x射线安检装置
JP2011099697A (ja) * 2009-11-04 2011-05-19 Ihi Corp 高エネルギーｘ線のエネルギー弁別検査装置と検出方法
JP2012005839A (ja) * 2010-06-28 2012-01-12 General Electric Co <Ge> 散乱防止ｘ線グリッド装置及びその製造方法
JP2012078254A (ja) * 2010-10-04 2012-04-19 Ishida Co Ltd Ｘ線検査装置
US20140126694A1 (en) * 2011-06-14 2014-05-08 Daniel Abenaim Security Scanner
CN103826961A (zh) * 2011-09-30 2014-05-28 日本信号株式会社 列车控制系统的地面装置
JP2016210501A (ja) * 2014-07-03 2016-12-15 サイエナジー株式会社 包装機における被包装物の位置ずれ検知機構および不良品処理機構
WO2017057735A1 (fr) * 2015-10-01 2017-04-06 株式会社イシダ Dispositif d'inspection de matériau étranger
WO2017110508A1 (fr) * 2015-12-21 2017-06-29 浜松ホトニクス株式会社 Dispositif de détection de rayonnement, système de test de rayonnement, et procédé de réglage de dispositif de détection de rayonnement

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4723752B2 (ja) * 2001-05-01 2011-07-13 株式会社イシダ Ｘ線検査装置

Patent Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003083913A (ja) * 2001-09-11 2003-03-19 Ishida Co Ltd Ｘ線検査装置
JP2004166923A (ja) * 2002-11-19 2004-06-17 Canon Inc Ｘ線コンピューター断層撮影装置
JP2005172486A (ja) * 2003-12-09 2005-06-30 Ishida Co Ltd 放射線検査装置
JP2008002940A (ja) * 2006-06-22 2008-01-10 Ihi Corp 遠隔ｘ線透視装置および方法
US20080037707A1 (en) * 2006-08-11 2008-02-14 American Science And Engineering, Inc. X-Ray Inspection With Contemporaneous and Proximal Transmission and Backscatter Imaging
JP2008275451A (ja) * 2007-04-27 2008-11-13 Anritsu Sanki System Co Ltd Ｘ線異物検出装置
JP2011099697A (ja) * 2009-11-04 2011-05-19 Ihi Corp 高エネルギーｘ線のエネルギー弁別検査装置と検出方法
CN201622251U (zh) * 2010-03-23 2010-11-03 东莞市善时电子科技有限公司 一种x射线安检装置
JP2012005839A (ja) * 2010-06-28 2012-01-12 General Electric Co <Ge> 散乱防止ｘ線グリッド装置及びその製造方法
JP2012078254A (ja) * 2010-10-04 2012-04-19 Ishida Co Ltd Ｘ線検査装置
US20140126694A1 (en) * 2011-06-14 2014-05-08 Daniel Abenaim Security Scanner
JP2014517319A (ja) * 2011-06-14 2014-07-17 アナロジック コーポレイション セキュリティースキャナー
CN103826961A (zh) * 2011-09-30 2014-05-28 日本信号株式会社 列车控制系统的地面装置
JP2016210501A (ja) * 2014-07-03 2016-12-15 サイエナジー株式会社 包装機における被包装物の位置ずれ検知機構および不良品処理機構
WO2017057735A1 (fr) * 2015-10-01 2017-04-06 株式会社イシダ Dispositif d'inspection de matériau étranger
WO2017110508A1 (fr) * 2015-12-21 2017-06-29 浜松ホトニクス株式会社 Dispositif de détection de rayonnement, système de test de rayonnement, et procédé de réglage de dispositif de détection de rayonnement

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
王晨等: "螺旋埋弧焊钢管拍片检测中散射线的屏蔽", 《焊管》, vol. 32, no. 4, 28 April 2009 (2009-04-28), pages 55 - 57 *

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JP6629372B2 (ja) 2020-01-15
JP2019158695A (ja) 2019-09-19
WO2019177041A1 (fr) 2019-09-19

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