CN111383903A - 分析装置及其控制方法 - Google Patents

分析装置及其控制方法 Download PDF

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Publication number
CN111383903A
CN111383903A CN202010249945.2A CN202010249945A CN111383903A CN 111383903 A CN111383903 A CN 111383903A CN 202010249945 A CN202010249945 A CN 202010249945A CN 111383903 A CN111383903 A CN 111383903A
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CN
China
Prior art keywords
unit
drive circuit
ion
temperature
circuit
Prior art date
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Pending
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CN202010249945.2A
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English (en)
Chinese (zh)
Inventor
柏拉卡斯·斯里达尔·穆尔蒂
阿弩普·R·赫格德
佐藤武
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Atonarp Inc
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Atonarp Inc
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Publication date
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Publication of CN111383903A publication Critical patent/CN111383903A/zh
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G01N27/623—Ion mobility spectrometry combined with mass spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN202010249945.2A 2015-11-17 2016-11-17 分析装置及其控制方法 Pending CN111383903A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015-225201 2015-11-17
JP2015225201 2015-11-17
CN201680067410.5A CN108352290B (zh) 2015-11-17 2016-11-17 分析装置及其控制方法

Related Parent Applications (1)

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CN201680067410.5A Division CN108352290B (zh) 2015-11-17 2016-11-17 分析装置及其控制方法

Publications (1)

Publication Number Publication Date
CN111383903A true CN111383903A (zh) 2020-07-07

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Family Applications (4)

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CN202010249638.4A Pending CN111383904A (zh) 2015-11-17 2016-11-17 分析装置及其控制方法
CN202010249944.8A Pending CN111383902A (zh) 2015-11-17 2016-11-17 分析装置及其控制方法
CN202010249945.2A Pending CN111383903A (zh) 2015-11-17 2016-11-17 分析装置及其控制方法
CN201680067410.5A Active CN108352290B (zh) 2015-11-17 2016-11-17 分析装置及其控制方法

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CN202010249638.4A Pending CN111383904A (zh) 2015-11-17 2016-11-17 分析装置及其控制方法
CN202010249944.8A Pending CN111383902A (zh) 2015-11-17 2016-11-17 分析装置及其控制方法

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US (3) US10847356B2 (enExample)
EP (3) EP3686918B1 (enExample)
JP (4) JP6386195B2 (enExample)
CN (4) CN111383904A (enExample)
WO (1) WO2017086393A1 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111383904A (zh) 2015-11-17 2020-07-07 Atonarp株式会社 分析装置及其控制方法
WO2019224948A1 (ja) * 2018-05-23 2019-11-28 株式会社島津製作所 飛行時間型質量分析装置
US10985002B2 (en) * 2019-06-11 2021-04-20 Perkinelmer Health Sciences, Inc. Ionization sources and methods and systems using them
JP7445507B2 (ja) * 2020-04-22 2024-03-07 シャープ株式会社 分析装置
CN115836220B (zh) * 2020-07-14 2025-01-17 株式会社岛津制作所 气相色谱质量分析装置
EP4291882A1 (en) * 2021-02-11 2023-12-20 Viken Detection Corporation Drift tube field driving system and method

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JPS62223660A (ja) * 1986-03-26 1987-10-01 Toshiba Corp イオン励起オ−ジエ電子分光装置
US4808820A (en) * 1987-09-23 1989-02-28 Hewlett-Packard Company Electron-emission filament cutoff for gas chromatography + mass spectrometry systems
US20090194681A1 (en) * 2008-02-05 2009-08-06 Mccauley Edward B Method and Apparatus for Response and Tune Locking of a Mass Spectrometer
CN103702498A (zh) * 2013-12-12 2014-04-02 兰州空间技术物理研究所 一种用于磁偏转质谱计的在线可调灯丝电压源电路
WO2015029449A1 (ja) * 2013-08-30 2015-03-05 アトナープ株式会社 分析装置

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JP2672950B2 (ja) * 1987-10-20 1997-11-05 株式会社芝浦製作所 エミッションコントロール装置
US5164593A (en) * 1991-02-28 1992-11-17 Kratos Analytical Limited Mass spectrometer system including an ion source operable under high pressure conditions, and a two-stage pumping arrangement
EP0730149A3 (en) * 1995-03-02 1997-05-21 Orion Research Linearized potentiometric electrode
JP2000067808A (ja) * 1998-08-25 2000-03-03 Shimadzu Corp イオン化装置
JP3750386B2 (ja) * 1998-12-09 2006-03-01 株式会社島津製作所 四重極質量分析装置
CA2632251C (en) * 2005-12-22 2011-06-21 Thermo Finnigan Llc Apparatus and method for pumping in an ion optical device
JP4720536B2 (ja) * 2006-02-24 2011-07-13 株式会社島津製作所 電子線源装置
JP4958258B2 (ja) * 2006-03-17 2012-06-20 株式会社リガク ガス分析装置
JP5055157B2 (ja) * 2008-02-08 2012-10-24 株式会社日立ハイテクノロジーズ 質量分析装置
JP5098079B2 (ja) 2008-06-27 2012-12-12 国立大学法人山梨大学 イオン化分析方法および装置
JP5407616B2 (ja) * 2009-07-14 2014-02-05 株式会社島津製作所 イオントラップ装置
CN102280348A (zh) * 2010-06-08 2011-12-14 江苏天瑞仪器股份有限公司 电子轰击离子源控制系统
JP5454416B2 (ja) * 2010-08-20 2014-03-26 株式会社島津製作所 質量分析装置
WO2012029315A1 (ja) * 2010-08-31 2012-03-08 アトナープ株式会社 イオン移動装置
US8829434B2 (en) * 2010-11-19 2014-09-09 Hitachi High-Technologies Corporation Mass spectrometer and mass spectrometry method
CN102636555B (zh) * 2011-12-19 2014-04-02 中国科学院合肥物质科学研究院 一种适用于高场不对称波形离子迁移管的小型化测控系统
JP6025406B2 (ja) * 2012-06-04 2016-11-16 株式会社日立ハイテクノロジーズ 質量分析装置
JP5970274B2 (ja) * 2012-07-18 2016-08-17 株式会社日立ハイテクノロジーズ 質量分析装置
JP5568117B2 (ja) * 2012-09-21 2014-08-06 ファナック株式会社 放電加工機の加工液供給装置
US8704193B1 (en) * 2012-11-16 2014-04-22 Thermo Fisher Scientific (Bremen) Gmbh RF transformer
DE102013201499A1 (de) 2013-01-30 2014-07-31 Carl Zeiss Microscopy Gmbh Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu
JP5759036B2 (ja) 2014-03-06 2015-08-05 株式会社日立ハイテクノロジーズ 質量分析装置
US8921774B1 (en) * 2014-05-02 2014-12-30 908 Devices Inc. High pressure mass spectrometry systems and methods
CN111383904A (zh) 2015-11-17 2020-07-07 Atonarp株式会社 分析装置及其控制方法
WO2017112938A1 (en) * 2015-12-23 2017-06-29 University Of Maryland, College Park Active stabilization of ion trap radiofrequency potentials
TWI721041B (zh) * 2016-08-17 2021-03-11 日商半導體能源研究所股份有限公司 驅動電路、顯示裝置及電子裝置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62223660A (ja) * 1986-03-26 1987-10-01 Toshiba Corp イオン励起オ−ジエ電子分光装置
US4808820A (en) * 1987-09-23 1989-02-28 Hewlett-Packard Company Electron-emission filament cutoff for gas chromatography + mass spectrometry systems
US20090194681A1 (en) * 2008-02-05 2009-08-06 Mccauley Edward B Method and Apparatus for Response and Tune Locking of a Mass Spectrometer
WO2015029449A1 (ja) * 2013-08-30 2015-03-05 アトナープ株式会社 分析装置
CN103702498A (zh) * 2013-12-12 2014-04-02 兰州空间技术物理研究所 一种用于磁偏转质谱计的在线可调灯丝电压源电路

Also Published As

Publication number Publication date
EP3379562B1 (en) 2021-06-09
JPWO2017086393A1 (ja) 2018-04-19
US11011360B2 (en) 2021-05-18
CN111383904A (zh) 2020-07-07
EP3686918A1 (en) 2020-07-29
EP3379562A4 (en) 2019-10-23
JP2018091863A (ja) 2018-06-14
US20210265149A1 (en) 2021-08-26
JP6745538B2 (ja) 2020-08-26
CN108352290A (zh) 2018-07-31
US10847356B2 (en) 2020-11-24
JP6745536B2 (ja) 2020-08-26
US20200251320A1 (en) 2020-08-06
JP6420007B2 (ja) 2018-11-07
JP2018139210A (ja) 2018-09-06
EP3889996A1 (en) 2021-10-06
EP3379562A1 (en) 2018-09-26
EP3686918B1 (en) 2024-03-20
US11380533B2 (en) 2022-07-05
CN108352290B (zh) 2020-04-03
JP2019009131A (ja) 2019-01-17
JP6386195B2 (ja) 2018-09-05
US20210035791A1 (en) 2021-02-04
WO2017086393A1 (ja) 2017-05-26
CN111383902A (zh) 2020-07-07

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Application publication date: 20200707