JP6386195B2 - 分析装置及びその制御方法 - Google Patents

分析装置及びその制御方法 Download PDF

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Publication number
JP6386195B2
JP6386195B2 JP2017551925A JP2017551925A JP6386195B2 JP 6386195 B2 JP6386195 B2 JP 6386195B2 JP 2017551925 A JP2017551925 A JP 2017551925A JP 2017551925 A JP2017551925 A JP 2017551925A JP 6386195 B2 JP6386195 B2 JP 6386195B2
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unit
drive circuit
field
detector
ionization
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Japanese (ja)
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JPWO2017086393A1 (ja
Inventor
プラカッシ スリダラ ムルティ
プラカッシ スリダラ ムルティ
アヌープ アール． ヘッジ
アヌープ アール． ヘッジ
佐藤　武
武 佐藤
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Atonarp Inc
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Atonarp Inc
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G01N27/623—Ion mobility spectrometry combined with mass spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2017551925A 2015-11-17 2016-11-17 分析装置及びその制御方法 Active JP6386195B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015225201 2015-11-17
JP2015225201 2015-11-17
PCT/JP2016/084120 WO2017086393A1 (ja) 2015-11-17 2016-11-17 分析装置及びその制御方法

Related Child Applications (3)

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JP2018032017A Division JP6745536B2 (ja) 2015-11-17 2018-02-26 分析装置及びその制御方法
JP2018032016A Division JP6420007B2 (ja) 2015-11-17 2018-02-26 分析装置及びその制御方法
JP2018149245A Division JP6745538B2 (ja) 2015-11-17 2018-08-08 分析装置及びその制御方法

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JPWO2017086393A1 JPWO2017086393A1 (ja) 2018-04-19
JP6386195B2 true JP6386195B2 (ja) 2018-09-05

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JP2018032016A Active JP6420007B2 (ja) 2015-11-17 2018-02-26 分析装置及びその制御方法
JP2018032017A Active JP6745536B2 (ja) 2015-11-17 2018-02-26 分析装置及びその制御方法
JP2018149245A Active JP6745538B2 (ja) 2015-11-17 2018-08-08 分析装置及びその制御方法

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JP2018149245A Active JP6745538B2 (ja) 2015-11-17 2018-08-08 分析装置及びその制御方法

Country Status (5)

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US (3) US10847356B2 (enExample)
EP (3) EP3686918B1 (enExample)
JP (4) JP6386195B2 (enExample)
CN (4) CN111383903A (enExample)
WO (1) WO2017086393A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3686918B1 (en) 2015-11-17 2024-03-20 Atonarp Inc. Analyzer apparatus and control method
WO2019224948A1 (ja) * 2018-05-23 2019-11-28 株式会社島津製作所 飛行時間型質量分析装置
US10985002B2 (en) * 2019-06-11 2021-04-20 Perkinelmer Health Sciences, Inc. Ionization sources and methods and systems using them
JP7445507B2 (ja) * 2020-04-22 2024-03-07 シャープ株式会社 分析装置
US20230243787A1 (en) * 2020-07-14 2023-08-03 Shimadzu Corporation Gas chromatograph mass spectrometer
CA3206396A1 (en) 2021-02-11 2022-08-18 Adrian Delforge Drift tube field driving system and method

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JPS62223660A (ja) * 1986-03-26 1987-10-01 Toshiba Corp イオン励起オ−ジエ電子分光装置
US4808820A (en) * 1987-09-23 1989-02-28 Hewlett-Packard Company Electron-emission filament cutoff for gas chromatography + mass spectrometry systems
JP2672950B2 (ja) * 1987-10-20 1997-11-05 株式会社芝浦製作所 エミッションコントロール装置
JP2672949B2 (ja) * 1987-10-20 1997-11-05 株式会社芝浦製作所 エミッションコントロール装置
US5164593A (en) * 1991-02-28 1992-11-17 Kratos Analytical Limited Mass spectrometer system including an ion source operable under high pressure conditions, and a two-stage pumping arrangement
EP0730149A3 (en) * 1995-03-02 1997-05-21 Orion Research Linearized potentiometric electrode
JP2000067808A (ja) * 1998-08-25 2000-03-03 Shimadzu Corp イオン化装置
JP3750386B2 (ja) * 1998-12-09 2006-03-01 株式会社島津製作所 四重極質量分析装置
CA2632251C (en) * 2005-12-22 2011-06-21 Thermo Finnigan Llc Apparatus and method for pumping in an ion optical device
JP4720536B2 (ja) * 2006-02-24 2011-07-13 株式会社島津製作所 電子線源装置
JP4958258B2 (ja) * 2006-03-17 2012-06-20 株式会社リガク ガス分析装置
US8426805B2 (en) * 2008-02-05 2013-04-23 Thermo Finnigan Llc Method and apparatus for response and tune locking of a mass spectrometer
JP5055157B2 (ja) * 2008-02-08 2012-10-24 株式会社日立ハイテクノロジーズ 質量分析装置
US8253098B2 (en) 2008-06-27 2012-08-28 University Of Yamanashi Ionization analysis method and apparatus
JP5407616B2 (ja) 2009-07-14 2014-02-05 株式会社島津製作所 イオントラップ装置
CN102280348A (zh) * 2010-06-08 2011-12-14 江苏天瑞仪器股份有限公司 电子轰击离子源控制系统
JP5454416B2 (ja) * 2010-08-20 2014-03-26 株式会社島津製作所 質量分析装置
EP2613142A4 (en) * 2010-08-31 2016-12-21 Atonarp Inc ION TRANSFER DEVICE
JP5530531B2 (ja) * 2010-11-19 2014-06-25 株式会社日立ハイテクノロジーズ 質量分析装置および質量分析方法
CN102636555B (zh) * 2011-12-19 2014-04-02 中国科学院合肥物质科学研究院 一种适用于高场不对称波形离子迁移管的小型化测控系统
JP6025406B2 (ja) * 2012-06-04 2016-11-16 株式会社日立ハイテクノロジーズ 質量分析装置
JP5970274B2 (ja) * 2012-07-18 2016-08-17 株式会社日立ハイテクノロジーズ 質量分析装置
JP5568117B2 (ja) * 2012-09-21 2014-08-06 ファナック株式会社 放電加工機の加工液供給装置
US8704193B1 (en) * 2012-11-16 2014-04-22 Thermo Fisher Scientific (Bremen) Gmbh RF transformer
DE102013201499A1 (de) 2013-01-30 2014-07-31 Carl Zeiss Microscopy Gmbh Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu
US9666422B2 (en) 2013-08-30 2017-05-30 Atonarp Inc. Analyzer
CN103702498B (zh) * 2013-12-12 2015-07-15 兰州空间技术物理研究所 一种用于磁偏转质谱计的在线可调灯丝电压源电路
JP5759036B2 (ja) 2014-03-06 2015-08-05 株式会社日立ハイテクノロジーズ 質量分析装置
US8921774B1 (en) * 2014-05-02 2014-12-30 908 Devices Inc. High pressure mass spectrometry systems and methods
EP3686918B1 (en) 2015-11-17 2024-03-20 Atonarp Inc. Analyzer apparatus and control method
US9991105B2 (en) * 2015-12-23 2018-06-05 University Of Maryland, College Park Active stabilization of ion trap radiofrequency potentials
TWI721041B (zh) * 2016-08-17 2021-03-11 日商半導體能源研究所股份有限公司 驅動電路、顯示裝置及電子裝置

Also Published As

Publication number Publication date
JP6745538B2 (ja) 2020-08-26
JP2018091863A (ja) 2018-06-14
EP3379562A4 (en) 2019-10-23
US20200251320A1 (en) 2020-08-06
CN108352290B (zh) 2020-04-03
JP2019009131A (ja) 2019-01-17
EP3379562A1 (en) 2018-09-26
US11011360B2 (en) 2021-05-18
CN108352290A (zh) 2018-07-31
US20210265149A1 (en) 2021-08-26
US20210035791A1 (en) 2021-02-04
JP2018139210A (ja) 2018-09-06
JP6745536B2 (ja) 2020-08-26
EP3686918A1 (en) 2020-07-29
CN111383902A (zh) 2020-07-07
JP6420007B2 (ja) 2018-11-07
EP3379562B1 (en) 2021-06-09
CN111383904A (zh) 2020-07-07
US11380533B2 (en) 2022-07-05
EP3686918B1 (en) 2024-03-20
EP3889996A1 (en) 2021-10-06
CN111383903A (zh) 2020-07-07
JPWO2017086393A1 (ja) 2018-04-19
US10847356B2 (en) 2020-11-24
WO2017086393A1 (ja) 2017-05-26

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