CN111383902A - 分析装置及其控制方法 - Google Patents

分析装置及其控制方法 Download PDF

Info

Publication number
CN111383902A
CN111383902A CN202010249944.8A CN202010249944A CN111383902A CN 111383902 A CN111383902 A CN 111383902A CN 202010249944 A CN202010249944 A CN 202010249944A CN 111383902 A CN111383902 A CN 111383902A
Authority
CN
China
Prior art keywords
unit
drive circuit
ion
temperature
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010249944.8A
Other languages
English (en)
Chinese (zh)
Inventor
柏拉卡斯·斯里达尔·穆尔蒂
阿弩普·R·赫格德
佐藤武
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Atonarp Inc
Original Assignee
Atonarp Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atonarp Inc filed Critical Atonarp Inc
Publication of CN111383902A publication Critical patent/CN111383902A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/622—Ion mobility spectrometry
    • G01N27/623—Ion mobility spectrometry combined with mass spectrometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/24—Vacuum systems, e.g. maintaining desired pressures

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN202010249944.8A 2015-11-17 2016-11-17 分析装置及其控制方法 Pending CN111383902A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015225201 2015-11-17
JP2015-225201 2015-11-17
CN201680067410.5A CN108352290B (zh) 2015-11-17 2016-11-17 分析装置及其控制方法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201680067410.5A Division CN108352290B (zh) 2015-11-17 2016-11-17 分析装置及其控制方法

Publications (1)

Publication Number Publication Date
CN111383902A true CN111383902A (zh) 2020-07-07

Family

ID=58717424

Family Applications (4)

Application Number Title Priority Date Filing Date
CN202010249944.8A Pending CN111383902A (zh) 2015-11-17 2016-11-17 分析装置及其控制方法
CN202010249945.2A Pending CN111383903A (zh) 2015-11-17 2016-11-17 分析装置及其控制方法
CN202010249638.4A Pending CN111383904A (zh) 2015-11-17 2016-11-17 分析装置及其控制方法
CN201680067410.5A Active CN108352290B (zh) 2015-11-17 2016-11-17 分析装置及其控制方法

Family Applications After (3)

Application Number Title Priority Date Filing Date
CN202010249945.2A Pending CN111383903A (zh) 2015-11-17 2016-11-17 分析装置及其控制方法
CN202010249638.4A Pending CN111383904A (zh) 2015-11-17 2016-11-17 分析装置及其控制方法
CN201680067410.5A Active CN108352290B (zh) 2015-11-17 2016-11-17 分析装置及其控制方法

Country Status (5)

Country Link
US (3) US10847356B2 (cg-RX-API-DMAC7.html)
EP (3) EP3379562B1 (cg-RX-API-DMAC7.html)
JP (4) JP6386195B2 (cg-RX-API-DMAC7.html)
CN (4) CN111383902A (cg-RX-API-DMAC7.html)
WO (1) WO2017086393A1 (cg-RX-API-DMAC7.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3379562B1 (en) 2015-11-17 2021-06-09 Atonarp Inc. Analysis device and control method therefor
CN112154529B (zh) * 2018-05-23 2024-10-22 株式会社岛津制作所 飞行时间质谱分析装置
US10985002B2 (en) * 2019-06-11 2021-04-20 Perkinelmer Health Sciences, Inc. Ionization sources and methods and systems using them
JP7445507B2 (ja) * 2020-04-22 2024-03-07 シャープ株式会社 分析装置
JP7414146B2 (ja) * 2020-07-14 2024-01-16 株式会社島津製作所 ガスクロマトグラフ質量分析装置
CN116888465A (zh) * 2021-02-11 2023-10-13 维肯检测公司 漂移管场驱动系统及方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101405600A (zh) * 2006-03-17 2009-04-08 株式会社理光 气体分析装置
JP2012043672A (ja) * 2010-08-20 2012-03-01 Shimadzu Corp 質量分析装置
CN103222031A (zh) * 2010-11-19 2013-07-24 株式会社日立高新技术 质量分析装置及质量分析方法
CN103456596A (zh) * 2012-06-04 2013-12-18 株式会社日立高新技术 质量分析装置
JP2014022162A (ja) * 2012-07-18 2014-02-03 Hitachi High-Technologies Corp 質量分析装置
US20150318161A1 (en) * 2014-05-02 2015-11-05 908 Devices Inc. High pressure mass spectrometry systems and methods

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3665185A (en) * 1970-10-19 1972-05-23 Minnesota Mining & Mfg Ion scattering spectrometer with neutralization
JPS5831698B2 (ja) * 1980-01-18 1983-07-07 工業技術院長 電界蒸発型イオンビ−ム発生装置
JPS62223660A (ja) * 1986-03-26 1987-10-01 Toshiba Corp イオン励起オ−ジエ電子分光装置
US4808820A (en) * 1987-09-23 1989-02-28 Hewlett-Packard Company Electron-emission filament cutoff for gas chromatography + mass spectrometry systems
JP2672950B2 (ja) * 1987-10-20 1997-11-05 株式会社芝浦製作所 エミッションコントロール装置
JP2672949B2 (ja) * 1987-10-20 1997-11-05 株式会社芝浦製作所 エミッションコントロール装置
US5164593A (en) * 1991-02-28 1992-11-17 Kratos Analytical Limited Mass spectrometer system including an ion source operable under high pressure conditions, and a two-stage pumping arrangement
EP0730149A3 (en) * 1995-03-02 1997-05-21 Orion Research Linearized potentiometric electrode
JP2000067808A (ja) * 1998-08-25 2000-03-03 Shimadzu Corp イオン化装置
JP3750386B2 (ja) * 1998-12-09 2006-03-01 株式会社島津製作所 四重極質量分析装置
WO2007078573A2 (en) * 2005-12-22 2007-07-12 Thermo Finnigan Llc Apparatus and method for pumping in an ion optical device
JP4720536B2 (ja) * 2006-02-24 2011-07-13 株式会社島津製作所 電子線源装置
US8426805B2 (en) * 2008-02-05 2013-04-23 Thermo Finnigan Llc Method and apparatus for response and tune locking of a mass spectrometer
JP5055157B2 (ja) * 2008-02-08 2012-10-24 株式会社日立ハイテクノロジーズ 質量分析装置
US8253098B2 (en) 2008-06-27 2012-08-28 University Of Yamanashi Ionization analysis method and apparatus
JP5407616B2 (ja) * 2009-07-14 2014-02-05 株式会社島津製作所 イオントラップ装置
CN102280348A (zh) * 2010-06-08 2011-12-14 江苏天瑞仪器股份有限公司 电子轰击离子源控制系统
WO2012029315A1 (ja) * 2010-08-31 2012-03-08 アトナープ株式会社 イオン移動装置
CN102636555B (zh) * 2011-12-19 2014-04-02 中国科学院合肥物质科学研究院 一种适用于高场不对称波形离子迁移管的小型化测控系统
JP5568117B2 (ja) * 2012-09-21 2014-08-06 ファナック株式会社 放電加工機の加工液供給装置
US8704193B1 (en) * 2012-11-16 2014-04-22 Thermo Fisher Scientific (Bremen) Gmbh RF transformer
DE102013201499A1 (de) 2013-01-30 2014-07-31 Carl Zeiss Microscopy Gmbh Verfahren zur massenspektrometrischen Untersuchung von Gasgemischen sowie Massenspektrometer hierzu
WO2015029449A1 (ja) 2013-08-30 2015-03-05 アトナープ株式会社 分析装置
CN103702498B (zh) * 2013-12-12 2015-07-15 兰州空间技术物理研究所 一种用于磁偏转质谱计的在线可调灯丝电压源电路
JP5759036B2 (ja) 2014-03-06 2015-08-05 株式会社日立ハイテクノロジーズ 質量分析装置
EP3379562B1 (en) 2015-11-17 2021-06-09 Atonarp Inc. Analysis device and control method therefor
WO2017112938A1 (en) * 2015-12-23 2017-06-29 University Of Maryland, College Park Active stabilization of ion trap radiofrequency potentials
TWI721041B (zh) * 2016-08-17 2021-03-11 日商半導體能源研究所股份有限公司 驅動電路、顯示裝置及電子裝置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101405600A (zh) * 2006-03-17 2009-04-08 株式会社理光 气体分析装置
JP2012043672A (ja) * 2010-08-20 2012-03-01 Shimadzu Corp 質量分析装置
CN103222031A (zh) * 2010-11-19 2013-07-24 株式会社日立高新技术 质量分析装置及质量分析方法
CN103456596A (zh) * 2012-06-04 2013-12-18 株式会社日立高新技术 质量分析装置
JP2014022162A (ja) * 2012-07-18 2014-02-03 Hitachi High-Technologies Corp 質量分析装置
US20150318161A1 (en) * 2014-05-02 2015-11-05 908 Devices Inc. High pressure mass spectrometry systems and methods

Also Published As

Publication number Publication date
JP2018091863A (ja) 2018-06-14
EP3889996A1 (en) 2021-10-06
CN108352290B (zh) 2020-04-03
US11011360B2 (en) 2021-05-18
CN111383903A (zh) 2020-07-07
US10847356B2 (en) 2020-11-24
US20210265149A1 (en) 2021-08-26
EP3379562B1 (en) 2021-06-09
CN111383904A (zh) 2020-07-07
EP3686918B1 (en) 2024-03-20
JP2018139210A (ja) 2018-09-06
JP6745538B2 (ja) 2020-08-26
JP6745536B2 (ja) 2020-08-26
US20210035791A1 (en) 2021-02-04
EP3686918A1 (en) 2020-07-29
US20200251320A1 (en) 2020-08-06
CN108352290A (zh) 2018-07-31
EP3379562A1 (en) 2018-09-26
US11380533B2 (en) 2022-07-05
EP3379562A4 (en) 2019-10-23
JP6386195B2 (ja) 2018-09-05
JP6420007B2 (ja) 2018-11-07
JP2019009131A (ja) 2019-01-17
WO2017086393A1 (ja) 2017-05-26
JPWO2017086393A1 (ja) 2018-04-19

Similar Documents

Publication Publication Date Title
CN108352290B (zh) 分析装置及其控制方法
US8455815B2 (en) Radio frequency voltage temperature stabilization
US5051583A (en) Atmospheric pressure ionization type mass spectrometer
JP2019009131A5 (cg-RX-API-DMAC7.html)
JP2015173069A (ja) 三連四重極型質量分析装置及びプログラム
JP7347685B2 (ja) 質量分析装置及び質量分析方法
JP6976445B2 (ja) 質量分析装置および質量分析方法
JP7657089B2 (ja) 質量分析装置およびその制御方法
US11195707B2 (en) Time-of-flight mass spectrometry device
US11309171B2 (en) Analytical device, analytical method and program
JP2000315474A (ja) 質量分析計
US12033842B2 (en) Mass spectrometer and method of controlling the same

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20200707

WD01 Invention patent application deemed withdrawn after publication