CN111370993A - Semiconductor laser device with constant temperature control function and manufacturing method thereof - Google Patents

Semiconductor laser device with constant temperature control function and manufacturing method thereof Download PDF

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CN111370993A
CN111370993A CN202010296030.7A CN202010296030A CN111370993A CN 111370993 A CN111370993 A CN 111370993A CN 202010296030 A CN202010296030 A CN 202010296030A CN 111370993 A CN111370993 A CN 111370993A
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semiconductor
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毛虎
蔡波
毛森
王彦孚
焦英豪
陆凯凯
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Guangdong Hongxin Technology Co ltd
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/024—Arrangements for thermal management
    • H01S5/02407—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling
    • H01S5/02415—Active cooling, e.g. the laser temperature is controlled by a thermo-electric cooler or water cooling by using a thermo-electric cooler [TEC], e.g. Peltier element
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/02—Structural details or components not essential to laser action
    • H01S5/026—Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
    • H01S5/0261—Non-optical elements, e.g. laser driver components, heaters

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  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Semiconductor Lasers (AREA)

Abstract

A method for manufacturing semiconductor laser device with constant temperature control function integrates semiconductor laser chip, semiconductor thermoelectric refrigerator and thermistor with negative temperature coefficient. The method comprises the following steps: the thermoelectric cooler comprises a semiconductor substrate, a first silicon dioxide layer, an n-type buffer layer, an n + ohm contact layer, an n electrode, an n-type cap layer, a P-type cap layer, a P electrode, a P + ohm contact layer, an integrated TEC thermoelectric cooler, a semiconductor laser active area, a second silicon dioxide layer, an NTC thin film resistor metal electrode and a thermoelectric cooler ball-type electrode. The purposes of accurate temperature control and high reliability are achieved, and accurate control of photoelectric performance parameters of the semiconductor laser is achieved. The method is widely applied to the fields of environmental atmosphere detection, communication, aerospace, aviation, ships, precision instruments, geological exploration, petroleum exploration, field operation, industrial control and the like, and has wide market prospect.

Description

Semiconductor laser device with constant temperature control function and manufacturing method thereof
Technical Field
The present invention relates to a semiconductor laser device, and more particularly, to a semiconductor laser device having a constant temperature control function and a method for manufacturing the same.
Background
In the conventional semiconductor laser device, a semiconductor laser chip (LD), a semiconductor thermoelectric cooler (TEC), a negative temperature coefficient thermistor (NTC), a ceramic substrate carrier, and the like are separated and sealed in a housing in a clean environment by conventional assembly techniques such as mounting, bonding, and the like, as shown in fig. 1. The prior art adopts the discrete assembly technology, and is bulky, the assembly procedure is complicated, the yield is low, the process quality uniformity is difficult to guarantee, on the other hand, adopts the discrete assembly technology, and the heat conduction path is correspondingly too long, causes the great extension of heat signal feedback speed to influence the precision range of temperature control, further influence the occasion that semiconductor laser used at high accuracy, high stability, perhaps increase application system's the design degree of difficulty, complexity and use cost.
Therefore, the invention adopts an integrated integration technology, and organically integrates the semiconductor laser chip (LD), the semiconductor thermoelectric cooler (TEC) and the thermistor (NTC) with negative temperature coefficient on the basis of the structure of the original semiconductor laser chip (LD), thereby solving the problems.
Through retrieval, patents related to a temperature-controlled semiconductor laser in a Chinese patent database have a publication (announcement) number of CN 110707525A for a semiconductor laser temperature control device, a temperature control system and a control method thereof, a publication (announcement) number of CN 110600989A for a semiconductor laser and a preparation method thereof, a publication (announcement) number of CN110890691A for a semiconductor laser and a preparation method thereof, a publication (announcement) number of CN 110086084A for a constant-current source type semiconductor laser driving circuit with automatic temperature control, and a preparation method of a DFB semiconductor laser with wide temperature operation, and a publication (announcement) number of CN 110752508A. However, until now, there is no related application adopting the technical solution described in the present application.
Disclosure of Invention
The invention aims to provide a semiconductor laser device with a constant temperature control function, which organically integrates a semiconductor laser chip (LD), a semiconductor thermoelectric cooler (TEC) and a negative temperature coefficient thermistor (NTC) into a whole and solves the problems of large volume, poor process quality consistency and insensitive temperature control caused by adopting a discrete assembly technology, so that the photoelectric performance parameters of the semiconductor laser cannot be accurately controlled.
The technical scheme is as follows: on the basis of the structure of the original semiconductor laser chip (LD), an integrated integration technology is adopted, the back of the original semiconductor laser chip (LD) is integrated with a semiconductor thermoelectric cooler (TEC), and meanwhile, a thermistor (NTC) with a negative temperature coefficient is integrated on one electrode layer of the original semiconductor laser chip (LD). The integrated structure is schematically shown in fig. 2 and 3, and the specific structure is described as follows:
the invention provides a semiconductor laser device with constant temperature control function, comprising: the integrated TEC structure comprises a semiconductor substrate 6, a first silicon dioxide layer 7, an n-type buffer layer 8, an n + ohm contact layer 9, an n electrode 10, an n-type cap layer 11, a P-type cap layer 12, a P electrode 13, a P + ohm contact layer 14, an integrated TEC200, a semiconductor laser active region 300, a second silicon dioxide layer 15, an NTC thin-film resistor 3 and an NTC thin-film resistor metal electrode 4.
The integrated TEC200 includes: the integrated TEC device comprises an integrated TEC p-type semiconductor 201, an integrated TEC n-type semiconductor 202, an integrated TEC first layer refractory electrode 203, an integrated TEC ball-type negative electrode 204, an integrated TEC ball-type positive electrode 205, an integrated TEC second layer refractory electrode 207, an integrated TEC first layer insulating medium isolating layer 206 and an integrated TEC second layer insulating medium isolating layer 208.
The semiconductor laser active region 300 includes: an n-type lower cladding layer 301, an n-type lower cladding layer 302, an active layer 303, a p-type lower cladding layer 304, and a p-type upper cladding layer 305.
The lower floor of semiconductor substrate 6 is first layer silica layer 7, the upper strata of semiconductor substrate 6 does n type buffer layer 8, the upper strata of n type buffer layer 8 does n + ohm contact layer 9, the upper strata of n + ohm contact layer 9 does n type cap layer 11, n electrode 10, second layer silica layer 15, the upper strata of second layer silica layer 15 does NTC film resistance 3 and NTC film resistance metal electrode 4, the upper strata of n type cap layer 11 is semiconductor laser active area 300, the upper strata of semiconductor laser active area 300 is P type cap layer 12, the upper strata of P type cap layer 12 is P + ohm contact layer 14, the upper strata of P + ohm contact layer 14 is P electrode 13.
The upper layer of the n-type lower cladding layer 301 is the n-type lower cladding layer 302, the upper layer of the n-type lower cladding layer 302 is the active layer 303, the upper layer of the active layer 303 is the p-type lower cladding layer 304, and the upper layer of the p-type lower cladding layer 304 is the p-type upper cladding layer 305.
The lower layer of the first silicon dioxide layer 7 is the integrated TEC first refractory electrode 203 and the integrated TEC first insulating medium isolation layer 206, the lower layer of the integrated TEC first refractory electrode 203 is the integrated TEC p-type semiconductor 201 and the integrated TEC n-type semiconductor 202, the integrated TEC p-type semiconductor 201 and the integrated TEC n-type semiconductor 202 are isolated by the integrated TEC first insulating medium isolation layer 206, the upper layer of the integrated TEC second refractory electrode 207 is the integrated TEC p-type semiconductor 201, the integrated TEC n-type semiconductor 202 and the integrated TEC first insulating medium isolation layer 206, and the lower layer of the integrated TEC second refractory electrode 207 is the integrated TEC ball-type negative electrode 204, the integrated ball-type positive electrode 205 and the integrated TEC second insulating medium isolation layer 208.
The invention relates to a method for manufacturing a semiconductor laser device with a constant temperature control function, which organically integrates a semiconductor laser chip, a semiconductor thermoelectric refrigerator and a thermistor with a negative temperature coefficient on the basis of the existing semiconductor laser chip manufacturing technology, and the process flow is shown in figure 29. The method mainly comprises the following steps:
s1, the semiconductor substrate 6 is prepared. As shown in fig. 4.
S2, sputtering the first silicon dioxide layer 7, integrating the TEC first refractory electrode 203. As shown in fig. 5.
S3, lithographically integrating the TEC first layer refractory electrode 203. As shown in fig. 6.
And S4, sputtering the integrated TEC p-type semiconductor 201. As shown in fig. 7.
S5, the TEC p-type semiconductor 201 is integrated by photolithography. As shown in fig. 8.
S6, sputtering the integrated TEC first insulating dielectric isolation layer 206, and performing CMP polishing (chemical mechanical polishing, CMP for short, the same below). As shown in fig. 9.
S7, the first insulating dielectric isolation layer 206 is photo-etched. As shown in fig. 10.
S8, the integrated TEC n semiconductor 202 is sputtered and CMP polished. As shown in fig. 11.
S9, sputtering the integrated TEC second layer refractory electrode 207. As shown in fig. 12.
S10, lithographically integrating the TEC second layer refractory electrode 207. As shown in fig. 13.
S11, sputtering the integrated TEC second insulating dielectric isolation layer 208. As shown in fig. 14.
S12, the second insulating dielectric isolation layer 208 of the TEC is integrated by photolithography. As shown in fig. 15.
S13, MOCVD epitaxially grows the n-type buffer layer 8 (metal organic chemical vapor deposition, MOCVD for short). As shown in fig. 16.
S14, MOCVD epitaxially grows the n + euro contact layer 9. As shown in fig. 17.
S15, sputtering a second silicon dioxide layer 15. As shown in fig. 18.
And S16, sputtering the NTC film resistor 3 and the NTC film resistor metal electrode 4. As shown in fig. 19.
And S17, photoetching the NTC film resistor 3 and the NTC film resistor metal electrode 4. As shown in fig. 20.
S18, the second silicon dioxide layer 15 is photo-etched. As shown in fig. 21.
And S19, sputtering and photoetching the n electrode 10. As shown in fig. 22.
S20, MOCVD epitaxially grows the n-type cap layer 11. As shown in fig. 23.
S21, MOCVD epitaxially grows the semiconductor laser active region 300. As shown in fig. 24.
S22, MOCVD epitaxially grows the p-type cap layer 12. As shown in fig. 25.
S23, MOCVD epitaxially grows the p + euro contact layer 14. As shown in fig. 26.
S24, sputtering the p-electrode 13. As shown in fig. 27.
S25, sputtering and photoetching the integrated TEC pin metal layer, and performing high-temperature reflux to form an integrated TEC ball-type negative electrode 204 and an integrated TEC ball-type positive electrode 205. As shown in fig. 28.
The invention adopts the integrated technology, realizes gapless contact among the semiconductor laser chip (LD), the semiconductor thermoelectric cooler (TEC) and the thermistor with Negative Temperature Coefficient (NTC), belongs to interatomic contact, can furthest and fastest conduct the heat of the semiconductor laser chip (LD) to the thermistor, and quickly transmits signals to the semiconductor thermoelectric cooler (TEC) after signal processing so as to control the current direction of the semiconductor thermoelectric cooling unit and control the temperature rise or drop frequency, thereby achieving the accurate control of the temperature and solving the accurate control of the photoelectric property parameters of the semiconductor laser.
The invention has the advantages that ① adopts an integrated integration method of a semiconductor laser chip (LD), a semiconductor thermoelectric cooler (TEC) and a negative temperature coefficient thermistor (NTC), so that gapless contact between the film thermistor and the semiconductor laser chip (LD) is realized, the film thermistor and the semiconductor laser chip (LD) belong to interatomic contact, and heat of the semiconductor laser chip (LD) can be conducted to the thermistor to the greatest extent and the fastest extent so as to rapidly control the semiconductor thermoelectric cooler (TEC) to achieve the purpose of high-sensitivity temperature control, ② when the external working environment temperature of the temperature control device changes, the change range of the working environment temperature of the internal chip can be controlled within +/-1.5 ℃ of the set temperature, so that the temperature drift range of related performance parameter indexes of the semiconductor laser chip (LD) is reduced, ③ realizes direct contact between atoms, greatly reduces heat conduction impedance, accelerates heat dissipation speed, so that long-term reliability of the device can be improved, ④ saves the assembly space of the semiconductor laser chip (LD), the semiconductor thermoelectric cooler (TEC) and the thermistor with externally attached, greatly reduces the packaging volume of the surface-mounted semiconductor thermoelectric cooler, greatly improves the size of the thermoelectric cooler, the thermoelectric cooler (TEC) and the heat dissipation reliability of the semiconductor laser chip, and the thermoelectric cooler are greatly improved by the size of the heat dissipation of the thermoelectric product which is set by the thermoelectric cooler, and the thermoelectric package of the thermoelectric cooler, the thermoelectric product, the thermoelectric cooler, the thermoelectric package of the thermoelectric cooler, and the thermoelectric cooler.
The device produced by the invention is widely applied to occasions requiring high-precision and high-stability use of equipment when the external environment temperature changes, such as environmental atmosphere detection, communication, aerospace, aviation, ships, precision instruments, geological exploration, petroleum exploration, other field operations, industrial control and the like, and has wide market prospect.
Drawings
Fig. 1 is a schematic diagram of an assembly structure of a conventional semiconductor laser device.
In fig. 1: the semiconductor laser chip comprises a semiconductor laser chip 1, a semiconductor laser chip back electrode 2, an NTC film resistor 3, an NTC film resistor 4, an NTC film resistor metal electrode 5, a ceramic substrate 100, a discrete TEC thermoelectric cooler 101, a discrete TEC p-type semiconductor 102, a discrete TEC n-type semiconductor 103, a discrete TEC p-type semiconductor and n-type semiconductor interconnecting conductor 103, a discrete TEC negative electrode lead 104, a discrete TEC positive electrode lead 105, a discrete TEC bottom surface ceramic substrate 106, a discrete TEC bottom surface metal bonding layer 107, a discrete TEC top surface ceramic substrate 108 and a discrete TEC top surface metal bonding layer 109.
Fig. 2 is a schematic structural diagram of an integrated semiconductor laser device with a thermostatic control function according to the present invention.
In fig. 2: 3 is an NTC film resistor, 4 is an NTC film resistor metal electrode, 6 is a semiconductor substrate, 7 is a first silicon dioxide layer, 8 is an n-type buffer layer, 9 is an n + ohm contact layer, 10 is an n electrode, 11 is an n-type cap layer, 12 is a P-type cap layer, 13 is a P electrode, 14 is a P + ohm contact layer, 15 is a second silicon dioxide layer, 200 is an integrated TEC thermoelectric cooler, 201 is an integrated TEC P-type semiconductor, 202 is an integrated TEC n semiconductor, 203 is an integrated TEC first refractory electrode, 207 is an integrated TEC second refractory electrode, 204 is an integrated TEC ball negative electrode, 205 is an integrated TEC ball positive electrode, 206 is an integrated first insulating medium isolation layer, 208 is an integrated TEC second insulating medium isolation layer, and 300 is an active region of the semiconductor laser.
Fig. 3 is a schematic diagram of the structure of the active region of the semiconductor laser device 300 shown in fig. 2.
In fig. 3, reference numeral 300 denotes an active region, 301 denotes an n-type lower cladding layer, 302 denotes an n-type lower cladding layer, 303 denotes an active layer, 304 denotes a p-type lower cladding layer, and 305 denotes a p-type upper cladding layer.
Fig. 4 is a schematic view of a semiconductor substrate 6.
Fig. 5 is a schematic diagram of the sputtering of the first silicon dioxide layer 7 and the patterned layer of the integrated TEC first refractory electrode 203.
Fig. 6 is a schematic view of photolithography of the integrated TEC first layer refractory electrode 203.
Fig. 7 is a schematic sputtering diagram of an integrated TEC p-type semiconductor 201.
Fig. 8 is a schematic view of photolithography of an integrated TEC p-type semiconductor 201.
Fig. 9 is a schematic view of the integrated TEC first insulating medium isolation layer 206 sputtered and CMP polished.
Fig. 10 is a schematic view of a first insulating dielectric isolation layer 206 by photolithography.
Fig. 11 is a schematic diagram of integrated TEC n semiconductor 202 sputtering and CMP polishing.
Fig. 12 is a schematic diagram of sputtering of the integrated TEC second layer refractory electrode 207.
Fig. 13 is a schematic view of integrated TEC second layer refractory electrode 207 lithography.
Fig. 14 is a schematic sputtering diagram of the integrated TEC second layer insulating medium isolation layer 208.
Fig. 15 is a schematic view of photolithography of the integrated TEC second layer insulating medium isolation layer 208.
Fig. 16 is a schematic view of MOCVD epitaxially growing n-type buffer layer 8.
Fig. 17 is a schematic diagram of MOCVD epitaxially growing n + euro contact layer 9.
Fig. 18 is a schematic view of the second silicon dioxide layer 15 being sputtered.
Fig. 19 is a schematic view of NTC thin film resistor 3 and NTC thin film resistor metal electrode 4 sputtering.
Fig. 20 is a schematic view of the NTC thin-film resistor 3 and the NTC thin-film resistor metal electrode 4 by photolithography.
Fig. 21 is a schematic view of the second silicon dioxide layer 15 lithography.
Fig. 22 is a schematic view of sputtering and photolithography of the n-electrode 10.
FIG. 23 is a schematic view of MOCVD epitaxial growth of an n-type cap layer 11.
Fig. 24 is a schematic view of an MOCVD epitaxially grown semiconductor laser active region 300.
FIG. 25 is a schematic view of MOCVD epitaxial growth of the p-type cap layer 12.
Fig. 26 is a schematic diagram of MOCVD epitaxially growing p + euro contact layer 14.
Fig. 27 is a schematic view of p-electrode sputtering 13.
Fig. 28 is a schematic diagram of integrated TEC pin metal layer sputtering, photolithography, and high temperature reflow to form an integrated TEC ball negative electrode 204 and an integrated TEC ball positive electrode 205.
FIG. 29 is a schematic process flow diagram of a manufacturing method of the present invention.
Detailed Description
Example (b):
1. the integrated TEC p-type semiconductor 201 is made of a p-type bismuth telluride semiconductor material.
2. The p-type bismuth telluride semiconductor material is Bi2Te3-Sb2Te3。
3. The thickness of the integrated TEC p-type semiconductor 201 is 0.2mm-0.6 mm.
4. The integrated TEC n-type semiconductor 202 is made of an n-type bismuth telluride semiconductor material.
5. The n-type bismuth telluride semiconductor material is Bi2Te3-Bi2Se3。
6. The thickness of the integrated TEC n-type semiconductor 202 is 0.2mm to 0.6 mm.
7. The material of the integrated TEC first layer refractory electrode 203 and the integrated TEC second layer refractory electrode 207 is chromium, titanium, tungsten or gold.
8. The semiconductor substrate 6 is made of silicon, and the n-type buffer layer 8 is made of gallium nitride.
9. The material of the semiconductor substrate 6 is indium phosphide.
By adopting the semiconductor laser device with the constant temperature control function integrated by the scheme, the temperature difference delta T between the cold end and the hot end can reach more than 70 ℃ at normal temperature, and the temperature control precision and stability are obviously superior to those of a separated TEC device in the working environment of-65-125 ℃.
The above description is only for the specific embodiments of the present invention and is not intended to limit the scope of the present invention. It will be apparent to those skilled in the art that any obvious modifications, equivalent substitutions, improvements, etc. can be made within the inventive concept of the present invention.

Claims (10)

1. A semiconductor laser device having a constant temperature control function, comprising: the integrated TEC structure comprises a semiconductor substrate (6), a first silicon dioxide layer (7), an n-type buffer layer (8), an n + ohm contact layer (9), an n electrode (10), an n-type cap layer (11), a P-type cap layer (12), a P electrode (13), a P + ohm contact layer (14), an integrated TEC (200), a semiconductor laser active region (300), a second silicon dioxide layer (15), an NTC thin-film resistor (3) and an NTC thin-film resistor metal electrode (4);
the integrated TEC (200) comprises: the integrated TEC device comprises an integrated TEC p-type semiconductor (201), an integrated TEC n-type semiconductor (202), an integrated TEC first layer refractory electrode (203), an integrated TEC ball-type negative electrode (204), an integrated TEC ball-type positive electrode (205), an integrated TEC second layer refractory electrode (207), an integrated TEC first layer insulating medium isolating layer (206) and an integrated TEC second layer insulating medium isolating layer (208);
the semiconductor laser active region (300) comprises: an n-type lower cladding layer (301), an n-type lower confinement layer (302), an active layer (303), a p-type lower confinement layer (304), and a p-type upper cladding layer (305);
the lower layer of the semiconductor substrate (6) is the first silicon dioxide layer (7), the upper layer of the semiconductor substrate (6) is the n-type buffer layer (8), the upper layer of the n-type buffer layer (8) is the n + ohm contact layer (9), the upper layers of the n + ohm contact layer (9) are the n-type cap layer (11), the n electrode (10) and the second silicon dioxide layer (15), the upper layer of the second silicon dioxide layer (15) is the NTC thin film resistor (3) and the NTC thin film resistor metal electrode (4), the upper layer of the n-type cap layer (11) is the active region (300) of the semiconductor laser, the upper layer of the active region (300) of the semiconductor laser is the p-type cap layer (12), the upper layer of the p-type cap layer (12) is the p + ohm contact layer (14), the upper layer of the P + ohm contact layer (14) is the P electrode (13);
the upper layer of the n-type lower cladding layer (301) is the n-type lower limiting layer (302), the upper layer of the n-type lower limiting layer (302) is the active layer (303), the upper layer of the active layer (303) is the p-type lower limiting layer (304), and the upper layer of the p-type lower limiting layer (304) is the p-type upper cladding layer (305);
the lower layer of the first silicon dioxide layer (7) is the integrated TEC first refractory electrode (203) and the integrated TEC first insulating medium isolation layer (206), the lower layer of the integrated TEC first refractory electrode (203) is the integrated TEC p-type semiconductor (201) and the integrated TEC n-type semiconductor (202), the integrated TEC p-type semiconductor (201) and the integrated TEC n-type semiconductor (202) are isolated by the integrated TEC first insulating medium isolation layer (206), the upper layer of the integrated TEC second refractory electrode (207) is the TEC p-type semiconductor (201), the TEC n-type semiconductor (202) and the integrated TEC first insulating medium isolation layer (206), the lower layer of the integrated TEC second refractory electrode (207) is the integrated ball type TEC (204), the integrated TEC ball type positive electrode (205) and the integrated TEC ball type negative electrode (205), The integrated TEC second layer insulating medium isolation layer (208).
2. A semiconductor laser device having a constant temperature control function as set forth in claim 1, wherein: the integrated TEC p-type semiconductor (201) is made of a p-type bismuth telluride semiconductor material.
3. A semiconductor laser device having a constant temperature control function as set forth in claim 2, wherein: said p isThe bismuth telluride semiconductor material is Bi2Te3-Sb2Te3。
4. A semiconductor laser device having a constant temperature control function as set forth in claim 1, wherein: the thickness of the integrated TEC p-type semiconductor (201) is 0.2mm-0.6 mm.
5. A semiconductor laser device having a constant temperature control function as set forth in claim 1, wherein: the integrated TEC n-type semiconductor (202) is made of n-type bismuth telluride semiconductor material.
6. A semiconductor laser device having a constant temperature control function as set forth in claim 5, wherein: the n-type bismuth telluride semiconductor material is Bi2Te3-Bi2Se3。
7. A semiconductor laser device having a constant temperature control function as set forth in claim 1, wherein: the thickness of the integrated TEC n-type semiconductor (202) is 0.2mm-0.6 mm.
8. A semiconductor laser device having a constant temperature control function as set forth in claim 1, wherein: the material of the integrated TEC first layer refractory electrode (203) and the integrated TEC second layer refractory electrode (207) is chromium, titanium, tungsten or gold.
9. A semiconductor laser device having a constant temperature control function as set forth in claim 1, wherein: the semiconductor substrate (6) is made of silicon, and the n-type buffer layer (8) is made of gallium nitride.
10. A method for manufacturing a semiconductor laser device with a constant temperature control function as claimed in claim 1, wherein the method is to organically integrate a semiconductor laser chip, a semiconductor thermoelectric cooler, and a thermistor with negative temperature coefficient based on the existing semiconductor laser chip manufacturing technology, by:
s1, preparing the semiconductor substrate (6);
s2, sputtering the first silicon dioxide layer (7), and integrating the TEC first refractory electrode (203);
s3, photoetching the integrated TEC first layer refractory electrode (203);
s4, sputtering the integrated TEC p-type semiconductor (201);
s5, photoetching the integrated TEC p-type semiconductor (201);
s6, sputtering the integrated TEC first layer of insulating medium isolation layer (206) and carrying out CMP polishing;
s7, photoetching the first insulating medium isolation layer (206);
s8, sputtering the integrated TEC n semiconductor (202) and performing CMP polishing;
s9, sputtering the integrated TEC second layer refractory electrode (207);
s10, photoetching the integrated TEC second layer refractory electrode (207);
s11, sputtering the second insulating medium isolation layer (208) of the integrated TEC;
s12, photoetching the integrated TEC second layer insulating medium isolation layer (208);
s13, MOCVD epitaxially growing the n-type buffer layer (8);
s14, MOCVD epitaxially growing the n + Ouquor contact layer (9);
s15, sputtering the second silicon dioxide layer (15);
s16, sputtering the NTC film resistor (3) and the NTC film resistor metal electrode (4);
s17, photoetching the NTC thin film resistor (3) and the NTC thin film resistor metal electrode (4);
s18, photoetching the second silicon dioxide layer (15);
s19, sputtering and photoetching the n electrode (10);
s20, MOCVD epitaxially growing the n-type cap layer (11);
s21, carrying out MOCVD epitaxial growth on the semiconductor laser active region (300);
s22, MOCVD epitaxially growing the p-type cap layer (12);
s23, MOCVD epitaxially growing the p + Oldham contact layer (14);
s24, sputtering the p electrode (13);
s25, sputtering and photoetching the integrated TEC pin metal layer, and performing high-temperature reflux to form the integrated TEC ball-type negative electrode (204) and the integrated TEC ball-type positive electrode (205).
CN202010296030.7A 2020-04-15 2020-04-15 Semiconductor laser device with constant temperature control function and manufacturing method thereof Pending CN111370993A (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112421377A (en) * 2020-11-18 2021-02-26 广东鸿芯科技有限公司 Anti-light-mixing semiconductor laser and preparation method thereof
CN114374145A (en) * 2022-01-12 2022-04-19 南京大学 REC semiconductor laser array wavelength control system

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020150131A1 (en) * 2001-04-16 2002-10-17 The Furukawa Electric Co., Ltd. Semiconductor laser device and drive control method for a semiconductor laser device
CN101047300A (en) * 2006-03-29 2007-10-03 中国科学院半导体研究所 Asymmetric ridge gallium nitride base semiconductor laser and manufacturing method thereof
CN101091246A (en) * 2004-12-27 2007-12-19 英特尔公司 Microelectronic assembly with built-in thermoelectric cooler and method of fabricating same
CN102255244A (en) * 2011-05-25 2011-11-23 北京化工大学 GaN-based laser and method for measuring AlGaN/GaN superlattice resistivity
CN103094832A (en) * 2013-01-18 2013-05-08 中国科学院半导体研究所 Manufacture method for monolithic integration titanium film thermal resistor tunable distributed feed back (DFB) laser
CN106684213A (en) * 2015-11-06 2017-05-17 中国科学院苏州纳米技术与纳米仿生研究所 Gan-based semiconductor device and manufacturing method thereof

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020150131A1 (en) * 2001-04-16 2002-10-17 The Furukawa Electric Co., Ltd. Semiconductor laser device and drive control method for a semiconductor laser device
CN101091246A (en) * 2004-12-27 2007-12-19 英特尔公司 Microelectronic assembly with built-in thermoelectric cooler and method of fabricating same
CN101047300A (en) * 2006-03-29 2007-10-03 中国科学院半导体研究所 Asymmetric ridge gallium nitride base semiconductor laser and manufacturing method thereof
CN102255244A (en) * 2011-05-25 2011-11-23 北京化工大学 GaN-based laser and method for measuring AlGaN/GaN superlattice resistivity
CN103094832A (en) * 2013-01-18 2013-05-08 中国科学院半导体研究所 Manufacture method for monolithic integration titanium film thermal resistor tunable distributed feed back (DFB) laser
CN106684213A (en) * 2015-11-06 2017-05-17 中国科学院苏州纳米技术与纳米仿生研究所 Gan-based semiconductor device and manufacturing method thereof

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112421377A (en) * 2020-11-18 2021-02-26 广东鸿芯科技有限公司 Anti-light-mixing semiconductor laser and preparation method thereof
CN112421377B (en) * 2020-11-18 2021-09-28 广东鸿芯科技有限公司 Anti-light-mixing semiconductor laser and preparation method thereof
CN114374145A (en) * 2022-01-12 2022-04-19 南京大学 REC semiconductor laser array wavelength control system
CN114374145B (en) * 2022-01-12 2023-09-29 南京大学 REC semiconductor laser array wavelength control system

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