CN111051863A - 用于x射线相衬和/或暗场成像的衍射光栅 - Google Patents

用于x射线相衬和/或暗场成像的衍射光栅 Download PDF

Info

Publication number
CN111051863A
CN111051863A CN201880057266.6A CN201880057266A CN111051863A CN 111051863 A CN111051863 A CN 111051863A CN 201880057266 A CN201880057266 A CN 201880057266A CN 111051863 A CN111051863 A CN 111051863A
Authority
CN
China
Prior art keywords
gold
grating
absorption energy
material layers
edge absorption
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201880057266.6A
Other languages
English (en)
Chinese (zh)
Inventor
T·克勒
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV filed Critical Koninklijke Philips NV
Publication of CN111051863A publication Critical patent/CN111051863A/zh
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/062Devices having a multilayer structure
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40Arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/4035Arrangements for generating radiation specially adapted for radiation diagnosis the source being combined with a filter or grating
    • A61B6/4042K-edge filters
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4291Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48Diagnostic techniques
    • A61B6/484Diagnostic techniques involving phase contrast X-ray imaging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041Phase-contrast imaging, e.g. using grating interferometers
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/09Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
    • G03F7/094Multilayer resist systems, e.g. planarising layers
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KHANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Animal Behavior & Ethology (AREA)
  • Surgery (AREA)
  • Molecular Biology (AREA)
  • Biomedical Technology (AREA)
  • Biophysics (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN201880057266.6A 2017-09-06 2018-08-24 用于x射线相衬和/或暗场成像的衍射光栅 Pending CN111051863A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP17189540.2 2017-09-06
EP17189540.2A EP3454051A1 (en) 2017-09-06 2017-09-06 Diffraction grating for x-ray phase contrast and/or dark-field imaging
PCT/EP2018/072833 WO2019048252A1 (en) 2017-09-06 2018-08-24 DIFFRACTION NETWORK FOR X-RAY IMAGING IN PHASE CONTRAST AND / OR ON BLACK BACKGROUND

Publications (1)

Publication Number Publication Date
CN111051863A true CN111051863A (zh) 2020-04-21

Family

ID=59811101

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201880057266.6A Pending CN111051863A (zh) 2017-09-06 2018-08-24 用于x射线相衬和/或暗场成像的衍射光栅

Country Status (5)

Country Link
US (1) US11107599B2 (https=)
EP (2) EP3454051A1 (https=)
JP (1) JP6828217B2 (https=)
CN (1) CN111051863A (https=)
WO (1) WO2019048252A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116577357A (zh) * 2023-05-15 2023-08-11 中国科学技术大学 基于x射线阵列靶光源的光栅相衬成像系统的调试方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3454051A1 (en) * 2017-09-06 2019-03-13 Koninklijke Philips N.V. Diffraction grating for x-ray phase contrast and/or dark-field imaging
EP3834731A1 (en) 2019-12-12 2021-06-16 Koninklijke Philips N.V. Combined k-edge filters for dose reduction in x-ray imaging
EP4407635A1 (en) * 2023-01-30 2024-07-31 Koninklijke Philips N.V. Microstructure for selective transmission of electromagnetic radiation

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101413905A (zh) * 2008-10-10 2009-04-22 深圳大学 X射线微分干涉相衬成像系统
JP2012093163A (ja) * 2010-10-26 2012-05-17 Canon Inc X線分光システム
CN102802529A (zh) * 2009-06-16 2012-11-28 皇家飞利浦电子股份有限公司 用于微分相衬成像的校正方法
CN104622492A (zh) * 2013-11-11 2015-05-20 中国科学技术大学 一种x射线光栅相位衬度成像装置和方法
US20150316494A1 (en) * 2014-04-30 2015-11-05 Canon Kabushiki Kaisha X-ray shield grating and x-ray talbot interferometer including x-ray shield grating
CN106290414A (zh) * 2016-07-29 2017-01-04 中国科学技术大学 一种x射线光栅相衬成像装置和成像方法
CN106535769A (zh) * 2014-05-01 2017-03-22 斯格瑞公司 X射线干涉成像系统
US20180268952A1 (en) * 2015-01-27 2018-09-20 Plansee Se Anti-scatter grid

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5200327B2 (ja) * 2006-03-31 2013-06-05 凸版印刷株式会社 反射型フォトマスクブランク及びその製造方法、反射型フォトマスク及びその製造方法、並びに、極端紫外光の露光方法
DE102008049200B4 (de) 2008-09-26 2010-11-11 Paul Scherrer Institut Verfahren zur Herstellung von röntgenoptischen Gittern, röntgenoptisches Gitter und Röntgen-System
US9315663B2 (en) * 2008-09-26 2016-04-19 Mikro Systems, Inc. Systems, devices, and/or methods for manufacturing castings
EP2168488B1 (de) 2008-09-30 2013-02-13 Siemens Aktiengesellschaft Röntgen-CT-System zur Röntgen-Phasenkontrast-und/oder Röntgen-Dunkelfeld-Bildgebung
US8999435B2 (en) * 2009-08-31 2015-04-07 Canon Kabushiki Kaisha Process of producing grating for X-ray image pickup apparatus
JP5627247B2 (ja) 2010-02-10 2014-11-19 キヤノン株式会社 マイクロ構造体の製造方法および放射線吸収格子
JP5660910B2 (ja) * 2010-03-30 2015-01-28 富士フイルム株式会社 放射線画像撮影用グリッドの製造方法
DE102010017426A1 (de) * 2010-06-17 2011-12-22 Karlsruher Institut für Technologie Gitter aus mindestens zwei Materialien für die Röntgenbildgebung
JP2012047688A (ja) * 2010-08-30 2012-03-08 Fujifilm Corp 放射線画像撮影用グリッド及びその製造方法、並びに放射線画像撮影システム
JP2012047687A (ja) * 2010-08-30 2012-03-08 Fujifilm Corp 放射線画像撮影用グリッド及びその製造方法、並びに放射線画像撮影システム
JP2012132793A (ja) * 2010-12-22 2012-07-12 Fujifilm Corp 放射線画像撮影用グリッド及びその製造方法、並びに放射線画像撮影システム
JP5714968B2 (ja) * 2011-04-15 2015-05-07 株式会社日立ハイテクサイエンス X線タルボ干渉計用回折格子及びその製造方法、並びにx線タルボ干渉計
US20150117599A1 (en) * 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
JP2013116270A (ja) * 2011-12-05 2013-06-13 Canon Inc X線撮像装置
JP2014006194A (ja) * 2012-06-26 2014-01-16 Canon Inc 構造体の製造方法
WO2017036729A1 (en) * 2015-09-01 2017-03-09 Paul Scherrer Institut Method for fabricating high aspect ratio gratings for phase contrast imaging
JPWO2018066198A1 (ja) * 2016-10-06 2019-06-24 株式会社島津製作所 回折格子ユニット、格子ユニットの製造方法およびx線位相イメージ撮影装置
EP3454051A1 (en) * 2017-09-06 2019-03-13 Koninklijke Philips N.V. Diffraction grating for x-ray phase contrast and/or dark-field imaging

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101413905A (zh) * 2008-10-10 2009-04-22 深圳大学 X射线微分干涉相衬成像系统
CN102802529A (zh) * 2009-06-16 2012-11-28 皇家飞利浦电子股份有限公司 用于微分相衬成像的校正方法
JP2012093163A (ja) * 2010-10-26 2012-05-17 Canon Inc X線分光システム
CN104622492A (zh) * 2013-11-11 2015-05-20 中国科学技术大学 一种x射线光栅相位衬度成像装置和方法
US20150316494A1 (en) * 2014-04-30 2015-11-05 Canon Kabushiki Kaisha X-ray shield grating and x-ray talbot interferometer including x-ray shield grating
CN106535769A (zh) * 2014-05-01 2017-03-22 斯格瑞公司 X射线干涉成像系统
US20180268952A1 (en) * 2015-01-27 2018-09-20 Plansee Se Anti-scatter grid
CN106290414A (zh) * 2016-07-29 2017-01-04 中国科学技术大学 一种x射线光栅相衬成像装置和成像方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
YAOHU LEI 等: "Fabrication of x-ray absorption gratings via micro-casting for grating-based phase contrast imaging", 《JOURNAL OF MICROMECHANICS AND MICROENGINEERING》 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116577357A (zh) * 2023-05-15 2023-08-11 中国科学技术大学 基于x射线阵列靶光源的光栅相衬成像系统的调试方法

Also Published As

Publication number Publication date
JP2020534514A (ja) 2020-11-26
WO2019048252A1 (en) 2019-03-14
EP3679359A1 (en) 2020-07-15
US11107599B2 (en) 2021-08-31
US20210065923A1 (en) 2021-03-04
EP3454051A1 (en) 2019-03-13
JP6828217B2 (ja) 2021-02-10
EP3679359B1 (en) 2021-01-13

Similar Documents

Publication Publication Date Title
JP5777360B2 (ja) X線撮像装置
JP5759474B2 (ja) 移動可能x線検出器要素を有する位相コントラスト画像化装置及び方法
US8855265B2 (en) Correction method for differential phase contrast imaging
CN102047344B (zh) 用于x射线的源光栅、用于x射线相衬图像的成像装置和x射线计算层析成像系统
CN101013613B (zh) X射线设备的焦点-检测器装置的x射线光学透射光栅
JP5459659B2 (ja) X線位相コントラスト像の撮像に用いられる位相格子、該位相格子を用いた撮像装置、x線コンピューター断層撮影システム
US7564941B2 (en) Focus-detector arrangement for generating projective or tomographic phase contrast recordings with X-ray optical gratings
RU2545319C2 (ru) Формирование фазово-контрастных изображений
US10559393B2 (en) X-ray detector for phase contrast and/or dark-field imaging
CN111051863A (zh) 用于x射线相衬和/或暗场成像的衍射光栅
EP2601516A1 (en) X-ray phase contrast imaging using a grating with unequal slit widths
KR20110079722A (ko) X선 촬상장치 및 x선 촬상방법
JP6106809B2 (ja) 可動式格子を含む微分位相コントラスト撮像装置
JP2013536403A (ja) 少なくとも二つの材料から成るx線撮像用の格子
JP2010253157A (ja) X線干渉計撮影装置及びx線干渉計撮影方法
WO2016083182A1 (en) Detector and imaging system for x-ray phase contrast tomo-synthesis imaging
US11000249B2 (en) X-ray detector for grating-based phase-contrast imaging
WO2019171920A1 (ja) 放射線位相撮像装置
CN115715169A (zh) 用于dax成像中的缺陷补偿的步进策略
US20200011812A1 (en) Radiographic image generating device
Viermetz et al. Dark-Field for Human CT–Realization of a Talbot-Lau Interferometer in a Clinical CT Gantry
JP2014113192A (ja) 放射線撮影方法及び装置

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20200421

WD01 Invention patent application deemed withdrawn after publication