CN110970338A - 输送单元及同时装载平行间隔一水平距离的处理管的方法 - Google Patents
输送单元及同时装载平行间隔一水平距离的处理管的方法 Download PDFInfo
- Publication number
- CN110970338A CN110970338A CN201910951071.2A CN201910951071A CN110970338A CN 110970338 A CN110970338 A CN 110970338A CN 201910951071 A CN201910951071 A CN 201910951071A CN 110970338 A CN110970338 A CN 110970338A
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Links
- 238000000034 method Methods 0.000 title claims abstract description 150
- 238000012545 processing Methods 0.000 title claims description 24
- 239000000758 substrate Substances 0.000 claims abstract description 69
- 239000000969 carrier Substances 0.000 claims description 22
- 239000004065 semiconductor Substances 0.000 claims description 5
- 239000007789 gas Substances 0.000 description 33
- 238000010438 heat treatment Methods 0.000 description 13
- 230000007246 mechanism Effects 0.000 description 10
- 235000012431 wafers Nutrition 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000000087 stabilizing effect Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 239000006096 absorbing agent Substances 0.000 description 1
- 230000004308 accommodation Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000004320 controlled atmosphere Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000007599 discharging Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 238000007669 thermal treatment Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67754—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a batch of workpieces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32733—Means for moving the material to be treated
- H01J37/32743—Means for moving the material to be treated for introducing the material into processing chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32733—Means for moving the material to be treated
- H01J37/32752—Means for moving the material to be treated for moving the material across the discharge
- H01J37/32761—Continuous moving
- H01J37/32779—Continuous moving of batches of workpieces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32733—Means for moving the material to be treated
- H01J37/32788—Means for moving the material to be treated for extracting the material from the process chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma & Fusion (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102018216878.4 | 2018-10-01 | ||
DE102018216878.4A DE102018216878A1 (de) | 2018-10-01 | 2018-10-01 | Transporteinheit für paralleles Einfahren oder Ausfahren von Substratträgern, in parallele Prozessrohre und Verfahren zum gleichzeitigen Beladen von parallelen, horizontal beabstandeten Prozessrohren |
Publications (1)
Publication Number | Publication Date |
---|---|
CN110970338A true CN110970338A (zh) | 2020-04-07 |
Family
ID=68172171
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910951071.2A Pending CN110970338A (zh) | 2018-10-01 | 2019-10-08 | 输送单元及同时装载平行间隔一水平距离的处理管的方法 |
Country Status (3)
Country | Link |
---|---|
CN (1) | CN110970338A (de) |
DE (1) | DE102018216878A1 (de) |
WO (1) | WO2020069989A1 (de) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040115032A1 (en) * | 2002-11-15 | 2004-06-17 | Rainer Ostermann | Apparatus for vacuum treating two dimensionally extended substrates and method for manufacturing such substrates |
CN101625963A (zh) * | 2008-07-07 | 2010-01-13 | 细美事有限公司 | 衬底处理设备以及用于为该设备转移衬底的方法 |
CN102171116A (zh) * | 2008-08-22 | 2011-08-31 | Otb太阳能有限公司 | 用于传送基板承载器的传送器组件和方法 |
CN102763210A (zh) * | 2010-02-19 | 2012-10-31 | 周星工程股份有限公司 | 基板处理系统及基板传送方法 |
TW201308482A (zh) * | 2011-05-12 | 2013-02-16 | Roth & Rau Ag | 基板加工設備中的基板傳輸模組、載入和卸載系統、以及基板傳輸方法 |
JP2018014427A (ja) * | 2016-07-21 | 2018-01-25 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法、プログラム |
CN107995998A (zh) * | 2015-04-02 | 2018-05-04 | 商先创国际股份有限公司 | 晶舟以及晶圆用等离子体处理装置 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4728246A (en) * | 1986-05-16 | 1988-03-01 | Thermco Systems, Inc. | Wafer boat transfer tool |
JPS63128710A (ja) * | 1986-11-19 | 1988-06-01 | Mitsubishi Electric Corp | 反応炉 |
US5248253A (en) * | 1992-01-28 | 1993-09-28 | Digital Equipment Corporation | Thermal processing furnace with improved plug flow |
US6565304B2 (en) * | 2001-04-24 | 2003-05-20 | Amtech Systems, Incorporated | Wafer boat elevator system and method |
KR101649299B1 (ko) * | 2010-05-31 | 2016-08-19 | (주) 엔피홀딩스 | 선형 기판이송장치를 갖는 기판처리시스템 |
DE102011109444A1 (de) | 2011-08-04 | 2013-02-07 | Centrotherm Photovoltaics Ag | Abstandselement für Platten eines Waferbootes |
NL2016334B1 (en) * | 2016-02-29 | 2017-09-11 | Tempress Ip B V | Horizontal furnace system and method for handling wafer boats, and wafer boat. |
-
2018
- 2018-10-01 DE DE102018216878.4A patent/DE102018216878A1/de not_active Withdrawn
-
2019
- 2019-09-27 WO PCT/EP2019/076147 patent/WO2020069989A1/de active Application Filing
- 2019-10-08 CN CN201910951071.2A patent/CN110970338A/zh active Pending
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040115032A1 (en) * | 2002-11-15 | 2004-06-17 | Rainer Ostermann | Apparatus for vacuum treating two dimensionally extended substrates and method for manufacturing such substrates |
CN101625963A (zh) * | 2008-07-07 | 2010-01-13 | 细美事有限公司 | 衬底处理设备以及用于为该设备转移衬底的方法 |
CN102171116A (zh) * | 2008-08-22 | 2011-08-31 | Otb太阳能有限公司 | 用于传送基板承载器的传送器组件和方法 |
CN102763210A (zh) * | 2010-02-19 | 2012-10-31 | 周星工程股份有限公司 | 基板处理系统及基板传送方法 |
TW201308482A (zh) * | 2011-05-12 | 2013-02-16 | Roth & Rau Ag | 基板加工設備中的基板傳輸模組、載入和卸載系統、以及基板傳輸方法 |
CN107995998A (zh) * | 2015-04-02 | 2018-05-04 | 商先创国际股份有限公司 | 晶舟以及晶圆用等离子体处理装置 |
JP2018014427A (ja) * | 2016-07-21 | 2018-01-25 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法、プログラム |
Also Published As
Publication number | Publication date |
---|---|
WO2020069989A1 (de) | 2020-04-09 |
DE102018216878A1 (de) | 2020-04-02 |
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