CN110487426A - A kind of near-infrared Femtosecond laser spectroscopy phase measurement device - Google Patents
A kind of near-infrared Femtosecond laser spectroscopy phase measurement device Download PDFInfo
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- CN110487426A CN110487426A CN201910857227.0A CN201910857227A CN110487426A CN 110487426 A CN110487426 A CN 110487426A CN 201910857227 A CN201910857227 A CN 201910857227A CN 110487426 A CN110487426 A CN 110487426A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
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Abstract
The present invention relates to a kind of near-infrared Femtosecond laser spectroscopy phase measurement device, device includes: beam splitter, frequency multiplier, stretcher, precision time delay line, compensation of delay device, pulse pair delay generator, Brewster reflector, 1/4 slide of broadband, focus lamp and frequency device and spectrometer;Testing laser beam is divided into first laser beam and second laser beam through beam splitter, first laser beam obtains chirped pulse through frequency multiplier, stretcher and precision time delay line, and second laser beam is through compensation of delay device, pulse pair delay generator, 1/4 slide of broadband and Brewster reflector;Then together with chirped pulse line focus mirror with occur in frequency device it is non-linear and frequency;It is received with frequency signal by spectrometer, obtains spectral interference striped;By carrying out numerical value processing to obtained spectral interference striped, the spectrum phase of ultrashort laser pulse can be obtained, and then obtain time/spectral characteristic of pulse.The device has many advantages, such as that cost performance is high, compact-sized, easy to adjust.
Description
Technical field
The invention belongs to femtosecond laser field of measuring technique more particularly to a kind of near-infrared Femtosecond laser spectroscopy phase measurements
Device.
Background technique
Femto-second laser pulse has been widely applied since generation in many front line science technical fields, such as ultrafast non-
Linear optics, Terahertz Technology and high field nuclear physics etc..The characteristic of femto-second laser pulse be mainly intensity and phase at any time
Changing rule, but since the limit that femtosecond time magnitude has had exceeded electronic response speed leads to not using quick response
Electronic instrument directly measure its time domain specification, therefore need to be opened using new measuring technique-correlation method, frequency resolution optical
Pass method (frequency resolved optical gating, FROG) and the relevant electric field reconstruction method of self-reference spectrum
(spectral phase interferometry for direct electrical reconstruction, SPIDER).
Wherein, correlation method can be able to satisfy general application with the time response of measurement intensity;And FROG method and SPIDER method energy
The phase information of precise measurement femtosecond pulse can be used for accurate burst length/spectrum measurement.
Tradition laser spectrum phase measurement device according to made of the principle of SPIDER method, pulse daley generation device use
Michelson's interferometer, however Michelson's interferometer limits pushing away for Femtosecond laser spectroscopy measuring device due to high costs
It is wide to use.
Summary of the invention
The present invention provides a kind of near-infrared Femtosecond laser spectroscopy phase measurement device, to solve in the prior art using advanced in years
Ke Erxun interferometer generates double delay pulses, and the Michelson's interferometer Femtosecond laser spectroscopy measuring device with high costs that is unfavorable for pushes away
Wide the technical issues of using.
The present invention provides a kind of near-infrared Femtosecond laser spectroscopy phase measurement device, and described device includes: beam splitter, frequency multiplication
Device, stretcher, precision time delay line, compensation of delay device, pulse pair delay generator, Brewster reflector, 1/4 slide of broadband,
Focus lamp and frequency device and spectrometer;Beam splitter described in testing laser Shu Jing is divided into first laser beam and second laser beam, described
First laser beam obtains chirped pulse, the second laser through the frequency multiplier, the stretcher and the precision time delay line
Compensation of delay device described in Shu Jing, pulse pair delay generator, 1/4 slide of the broadband and Brewster reflection
Described and frequency device is focused to by the focus lamp together with the chirped pulse after device and frequency light is received to obtain spectrum by spectrometer
Interference fringe, the spectral interference striped is numerically processed to obtain ultrashort laser pulse spectrum phase.
Further, the incident frequency multiplier of the first laser beam, generates double-frequency laser pulse.
Further, the double-frequency laser pulse is broadened through stretcher, and the time width of the double-frequency laser pulse is opened up
Width becomes chirped pulse.
Further, the compensation of delay device is made of two groups of identical reflectors;The opening phase of two groups of reflectors
To setting, and the two is adjustable in the relative position perpendicular to incident light direction;The reflector is vertically disposed by two pieces of inclined-planes
Isosceles right-angle prism group at;The inclined-plane of the isosceles right-angle prism is coated with 45 ° of broadband high-reflecting film;The second laser beam is parallel
One group of reflector is injected in reflector side, is projected from another group of reflector.
Further, the stretcher is a hexagon dispersing prism.The hexagon dispersing prism is equivalent to a rectangle
Prism is cut out the remaining part at two adjacent angles, and the part cut is two isosceles right-angle prisms.
Further, pulse pair delay generator is birefringece crystal, the polarization direction of incident light with it is described two-fold
The plane that the optical axis and incident light transmission direction for penetrating crystal are constituted is at 45 °, and incident light produces after the pulse pair postpones generator
Raw polarization direction is mutually perpendicular to, and the collinear pulse pair with relative time-delay.
Further, it is consistent to obtain polarization direction to the reflection by the Brewster reflector for the collinear pulse
, collinear pulse pair with relative time-delay.
Further, the collinear pulse pair of the relative time-delay is gathered together with the chirped pulse by the focus lamp
Coke is generated to described and frequency device and frequency pulse pair, and described and frequency pulse pair is received by spectrometer, spectral interference ring is obtained, through numerical value
Near-infrared Femtosecond laser spectroscopy phase can be obtained in analysis.
From the embodiments of the present invention it is found that near-infrared Femtosecond laser spectroscopy phase measurement device provided by the invention, is adopted
Double refraction single-shaft crystal is used to postpone generator as pulse pair, relative to traditional near-infrared Femtosecond laser spectroscopy phase measurement device
Middle that Michelson's interferometer is used to postpone generator as pulse pair, double refraction single-shaft crystal occupies smaller space and price is low
Honest and clean, near-infrared Femtosecond laser spectroscopy phase measurement device provided by the embodiments of the present application possesses higher cost performance and structure is tight
It gathers, more conducively near-infrared laser spectrum phase measuring device promotes the use.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those skilled in the art without any creative labor, can be with root
Other attached drawings are obtained according to these attached drawings.
Fig. 1 is the structural schematic diagram of near-infrared Femtosecond laser spectroscopy phase measurement device provided by the embodiments of the present application;
Fig. 2 is that the structure of the stretcher of near-infrared Femtosecond laser spectroscopy phase measurement device provided by the embodiments of the present application is shown
It is intended to.
Specific embodiment
In order to make the invention's purpose, features and advantages of the invention more obvious and easy to understand, below in conjunction with the present invention
Attached drawing in embodiment, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described reality
Applying example is only a part of the embodiment of the present invention, and not all embodiments.Based on the embodiments of the present invention, those skilled in the art
Member's every other embodiment obtained without making creative work, shall fall within the protection scope of the present invention.
As shown in Figure 1, the structure for near-infrared Femtosecond laser spectroscopy phase measurement device provided by the embodiments of the present application is shown
It is intended to.Device includes: beam splitter 101, frequency multiplier 102, stretcher 103, precision time delay line 104, compensation of delay device 105, pulse
To delay generator 106,1/4 slide 107 of broadband, Brewster reflector 108, focus lamp 109 and frequency device 110 and spectrum
Instrument 112;Testing laser beam divides through beam splitter 101 for first laser beam and second laser beam, first laser beam through frequency multiplier 102,
Stretcher 103 and precision time delay line 104 obtain chirped pulse, and second laser beam is produced through compensation of delay device 105, pulse pair delay
After raw device 106,1/4 slide 107 of broadband and Brewster reflector 108 with chirped pulse line focus mirror 109 and and frequency device
Spectral interference striped is obtained after 110 effects, spectral interference striped is received by spectrometer 112;
Pulse pair time-delay generator is birefringece crystal, and the optical axis of birefringece crystal and the plane of incidence of incident light are parallel.
In the embodiment of the present application, a kind of near-infrared Femtosecond laser spectroscopy phase measurement dress provided by the embodiments of the present application
It sets, the pulse pair time-delay generator 106 of the device is birefringece crystal, the optical axis of the double refraction single-shaft crystal and entering for incident light
Penetrate that face is parallel, the plane that the optical axis and incident light transmission direction of the polarization direction of incident light and the birefringece crystal are constituted at
45 °, incident light generates polarization direction after the pulse pair postpones generator and is mutually perpendicular to, and being total to relative time-delay
Line pulse pair.Near-infrared femtosecond laser to be measured is divided into two bundles identical laser through beam splitter 101, and beam splitter can be a beam splitting rib
Mirror.Wherein beam of laser generates double-frequency laser pulse after 102 frequency multiplication of frequency multiplier, and double-frequency laser pulse passes through stretcher 103
It is broadened, obtains the chirped pulse that time width is broadened.Frequency multiplier 102 can be frequency-doubling crystal.Another beam of laser is passed through
Forming a pair after compensation of delay device 105 after pulse pair time-delay generator 106, there is the polarization direction centainly postponed to be mutually perpendicular to
Pulse pair.The pulse pair of generation by 1/4 slide 107 of broadband, the fast and slow axis of 1/4 slide 107 of broadband respectively with incident pulse
Pair polarization direction it is parallel.Rotating 90 ° of the slide may make the relative phase shift of pulse pair to change 180 °.The pulse pair is then incident
To Brewster reflector 108, obtain that polarization direction is consistent, collinear pulse pair with relative time-delay.Pulse pair
Reflected light and by the chirped pulse of precision time delay line 104 together line focus mirror 109 focusing after reach with frequency device 110, obtain and
Frequency pulse pair forms interference ring, and is received after the effect of diaphragm 111 by spectrometer 112.90 ° of rotation slides 107, spectrometer can connect
Receive the spectral interference striped that two width have 180 ° of phase shifts.It can restore to obtain Femtosecond laser spectroscopy phase after calculating.Figure
In 113,114 and 115 be reflecting mirror.
Near-infrared Femtosecond laser spectroscopy phase measurement device provided by the embodiments of the present application, is made using double refraction single-shaft crystal
Postpone generator for pulse pair, generates delay pulse pair, double refraction single-shaft crystal price relative to using Michelson's interferometer
Cheap and take up space small, measuring device obtained has the advantages that cost performance is high compact-sized.
Further, double refraction single-shaft crystal can be α-bbo crystal.
Further, stretcher is a hexagon dispersing prism, and hexagon dispersing prism is equivalent to a rectangular prism and is cut
The remaining part at two adjacent angles is gone to, the part cut is two isosceles right-angle prisms.
In the embodiment of the present application, as shown in Figure 1, near-infrared Femtosecond laser spectroscopy phase measurement device provided by the invention
In stretcher be dispersing prism that a structure is hexagon, the structure of the prism is considered as the adjacent two corners point an of rectangle
An isosceles right triangle is not cut and is obtained.Alternatively, as shown in Fig. 2, being near-infrared femtosecond provided by the embodiments of the present application
The structural schematic diagram of the stretcher of laser spectrum phase measurement device.The structure of the prism be considered as two it is identical straight
The a length of L isosceles right triangle 201 and 202 of the arm of angle is overlapped symmetrically placed along bevel edge, then makes it along bevel edge relative translation
Two small isosceles right triangles for cutting the both ends a length of d of right-angle side outstanding, obtain a length of L+d, and width is the rectangle of L-d.It will
The two neighboring angle of the rectangle cuts the isosceles right triangle of a length of a and b of a right-angle side respectively, and remaining part is this
Apply for the structure for the stretcher that embodiment provides.Stretcher provided by the embodiments of the present application have it is easy to adjust, it is compact-sized
Advantage.
Further, compensation of delay device is made of two groups of identical reflectors, and the opening of two groups of reflectors is oppositely arranged, and
The two is adjustable in the relative position perpendicular to incident light direction, and reflector is by two pieces of vertically disposed isosceles right-angle prism groups in inclined-plane
At the inclined-plane of isosceles right-angle prism is coated with 45 ° of broadband high-reflecting film;It is anti-that second laser beam is parallel to one group of reflector side injection
Emitter is projected from another group of reflector.
In the embodiment of the present application, as shown in Figure 1, delay compensator 105 is made of two groups of identical reflectors, two groups anti-
The beginning of emitter is oppositely arranged so that the light beam after beam splitting is turned back in delay compensator.Reflector is vertical by two pieces of inclined-planes
The isosceles right-angle prism group of setting is to realize that light beam is turned back for 180 ° in delay generator.Laser beam is straight along isosceles are parallel to
The direction of angle prism right-angle side is incident, projects from another reflector.By adjusting two groups of reflectors in incident light vertical direction
Relative position, transmission path of the adjustable light beam in delay compensator, so as to adjust delay time.
It can be further I class bbo crystal with frequency device.
In the above-described embodiments, it all emphasizes particularly on different fields to the description of each embodiment, there is no the portion being described in detail in some embodiment
Point, it may refer to the associated description of other embodiments.
The above are the descriptions to technical solution provided by the present invention, for those skilled in the art, according to the present invention
The thought of embodiment, there will be changes in the specific implementation manner and application range, and to sum up, the content of the present specification should not manage
Solution is limitation of the present invention.
Claims (8)
1. a kind of near-infrared Femtosecond laser spectroscopy phase measurement device, which is characterized in that described device includes: beam splitter, frequency multiplication
Device, stretcher, precision time delay line, compensation of delay device, pulse pair delay generator, Brewster reflector, 1/4 slide of broadband,
Focus lamp and frequency device and spectrometer;Beam splitter described in testing laser Shu Jing is divided into first laser beam and second laser beam, described
First laser beam obtains chirped pulse, the second laser through the frequency multiplier, the stretcher and the precision time delay line
Compensation of delay device described in Shu Jing, pulse pair delay generator, 1/4 slide of the broadband and Brewster reflection
Described and frequency device is focused to by the focus lamp together with the chirped pulse after device and frequency light is received to obtain spectrum by spectrometer
Interference fringe, the spectral interference striped is numerically processed to obtain ultrashort laser pulse spectrum phase.
2. near-infrared Femtosecond laser spectroscopy phase measurement device according to claim 1, which is characterized in that described first swashs
Light beam one frequency multiplier of incidence, generates double-frequency laser pulse.
3. near-infrared Femtosecond laser spectroscopy phase measurement device according to claim 2, which is characterized in that the frequency multiplication swashs
Light pulse is broadened through stretcher, and the time width of the double-frequency laser pulse is broadened, and becomes chirped pulse.
4. near-infrared Femtosecond laser spectroscopy phase measurement device according to claim 1, which is characterized in that the delay is mended
Device is repaid to be made of two groups of identical reflectors;The opening of two groups of reflectors is oppositely arranged, and the two is perpendicular to incident light
The relative position in direction is adjustable;The reflector by two pieces of vertically disposed isosceles right-angle prism groups in inclined-plane at;The isosceles are straight
The inclined-plane of angle prism is coated with 45 ° of broadband high-reflecting film;The second laser beam is parallel to reflector side and injects one group of reflector,
It is projected from another group of reflector.
5. near-infrared Femtosecond laser spectroscopy phase measurement device according to claim 1, which is characterized in that the stretcher
For a hexagon dispersing prism, the hexagon dispersing prism is equivalent to the remaining part that a rectangular prism is cut out two adjacent angles,
The part cut is two isosceles right-angle prisms.
6. near-infrared Femtosecond laser spectroscopy phase measurement device according to claim 1, which is characterized in that the pulse pair
Delay generator is birefringece crystal, the optical axis and incident light transmission direction of the polarization direction of incident light and the birefringece crystal
The plane of composition is at 45 °, and incident light generates polarization direction after the pulse pair postpones generator and is mutually perpendicular to, and has opposite
The collinear pulse pair of time delay.
7. near-infrared Femtosecond laser spectroscopy phase measurement device according to claim 6, which is characterized in that the conllinear arteries and veins
It rushes to the reflection by the Brewster reflector, obtains the consistent conllinear arteries and veins with relative time-delay in polarization direction
Punching pair.
8. near-infrared Femtosecond laser spectroscopy phase measurement device according to claim 7, which is characterized in that when described opposite
Between the collinear pulse pair that postpones described and frequency device focused on by the focus lamp together with the chirped pulse generate and frequency pulse
Right, described and frequency pulse pair is received by spectrometer, obtains spectral interference ring, near-infrared femtosecond laser can be obtained through numerical analysis
Spectrum phase.
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CN118315902A (en) * | 2024-03-25 | 2024-07-09 | 华南理工大学 | Ultrafast time delay wavelength scanning ultraviolet femtosecond laser pulse train generating device |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3944947A (en) * | 1974-11-01 | 1976-03-16 | Jersey Nuclear-Avco Isotopes, Inc. | Laser amplifier system |
US20050259701A1 (en) * | 2004-05-24 | 2005-11-24 | Asml Holding N.V. | Helical optical pulse stretcher |
JP2005338851A (en) * | 2004-05-27 | 2005-12-08 | Asml Holding Nv | Compact pulse stretcher |
CN1936523A (en) * | 2006-09-29 | 2007-03-28 | 华东师范大学 | Super-short light impulse measuring apparatus based on SPIDER technology |
CN104697649A (en) * | 2015-03-02 | 2015-06-10 | 中国科学院物理研究所 | Single-shot laser pulse detection device |
CN106441583A (en) * | 2016-12-02 | 2017-02-22 | 深圳大学 | Spectral phase interference device and spectral interferometry system for reconstruction of ultrafast optical field |
CN106872038A (en) * | 2017-03-10 | 2017-06-20 | 中国科学院西安光学精密机械研究所 | High-flux high-stability coherent dispersion spectral imaging device |
CN107036714A (en) * | 2017-04-25 | 2017-08-11 | 深圳大学 | A kind of spectrum phase interference apparatus and system |
-
2019
- 2019-09-11 CN CN201910857227.0A patent/CN110487426B/en active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3944947A (en) * | 1974-11-01 | 1976-03-16 | Jersey Nuclear-Avco Isotopes, Inc. | Laser amplifier system |
US20050259701A1 (en) * | 2004-05-24 | 2005-11-24 | Asml Holding N.V. | Helical optical pulse stretcher |
JP2005338851A (en) * | 2004-05-27 | 2005-12-08 | Asml Holding Nv | Compact pulse stretcher |
CN1936523A (en) * | 2006-09-29 | 2007-03-28 | 华东师范大学 | Super-short light impulse measuring apparatus based on SPIDER technology |
CN104697649A (en) * | 2015-03-02 | 2015-06-10 | 中国科学院物理研究所 | Single-shot laser pulse detection device |
CN106441583A (en) * | 2016-12-02 | 2017-02-22 | 深圳大学 | Spectral phase interference device and spectral interferometry system for reconstruction of ultrafast optical field |
CN106872038A (en) * | 2017-03-10 | 2017-06-20 | 中国科学院西安光学精密机械研究所 | High-flux high-stability coherent dispersion spectral imaging device |
CN107036714A (en) * | 2017-04-25 | 2017-08-11 | 深圳大学 | A kind of spectrum phase interference apparatus and system |
Non-Patent Citations (1)
Title |
---|
YUPENG FAN ER AL.: "A compact SPIDER system based on a pair of 180", 《OPTICAL AND QUANTUM ELECTRONIC》 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN118315902A (en) * | 2024-03-25 | 2024-07-09 | 华南理工大学 | Ultrafast time delay wavelength scanning ultraviolet femtosecond laser pulse train generating device |
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