CN110487426B - Near-infrared femtosecond laser spectrum phase measuring device - Google Patents
Near-infrared femtosecond laser spectrum phase measuring device Download PDFInfo
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- CN110487426B CN110487426B CN201910857227.0A CN201910857227A CN110487426B CN 110487426 B CN110487426 B CN 110487426B CN 201910857227 A CN201910857227 A CN 201910857227A CN 110487426 B CN110487426 B CN 110487426B
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- 238000001228 spectrum Methods 0.000 title claims abstract description 17
- 230000003595 spectral effect Effects 0.000 claims abstract description 28
- 239000011521 glass Substances 0.000 claims abstract description 3
- 239000013078 crystal Substances 0.000 claims description 17
- 238000005259 measurement Methods 0.000 claims description 15
- 230000010287 polarization Effects 0.000 claims description 11
- 239000006185 dispersion Substances 0.000 claims description 8
- 230000003287 optical effect Effects 0.000 claims description 6
- 230000005540 biological transmission Effects 0.000 claims description 4
- 238000004458 analytical method Methods 0.000 claims description 2
- 230000001934 delay Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 2
- 230000010363 phase shift Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 230000005658 nuclear physics Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
- G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
Abstract
The invention relates to a near-infrared femtosecond laser spectrum phase measuring device, which comprises: a beam splitter, a frequency multiplier, a stretcher, a precision delay line, a delay compensator, a pulse pair delay generator, a Brewster reflector, a broadband 1/4 slide, a focusing mirror, a sum frequency device and a spectrometer; the laser beam to be measured is divided into a first laser beam and a second laser beam by a beam splitter, the first laser beam obtains chirped pulses by a frequency multiplier, a stretcher and a precise delay line, and the second laser beam passes through a delay compensator, a pulse pair delay generator, a broadband 1/4 glass slide and a Brewster reflector; then the chirp pulse and the chirp pulse are subjected to nonlinear sum frequency in a sum frequency device through a focusing mirror; the sum frequency signal is received by a spectrometer to obtain spectral interference fringes; the spectral phase of the ultrashort laser pulse can be obtained by carrying out numerical processing on the obtained spectral interference fringes, and further the time/spectral characteristics of the pulse can be obtained. The device has the advantages of high cost performance, compact structure, convenient adjustment and the like.
Description
Technical Field
The invention belongs to the technical field of femtosecond laser measurement, and particularly relates to a near-infrared femtosecond laser spectral phase measuring device.
Background
Since the femtosecond laser pulse is generated, the femtosecond laser pulse is widely applied to a plurality of advanced scientific and technical fields, such as ultrafast nonlinear optics, terahertz technology, strong field nuclear physics and the like. The characteristic of the femtosecond laser pulse is mainly the change rule of intensity and phase along with time, but since the femtosecond time magnitude exceeds the limit of the electronic response speed, the time domain characteristic cannot be directly measured by using a fast-response electronic instrument, so that a new measurement technology, namely an autocorrelation method, a frequency-resolved optical switching (FROG) method and a self-reference spectrum coherent electric field reconstruction (SPIDER), needs to be adopted. The autocorrelation method can measure the time characteristic of the intensity and can meet the requirements of general application occasions; and the FROG method and the SPIDER method can accurately measure the phase information of the femtosecond pulse and can be used for accurate pulse time/spectral characteristic measurement.
According to a traditional laser spectrum phase measuring device manufactured according to the principle of the SPIDER method, a pulse delay generating device adopts a Michelson interferometer, however, the Michelson interferometer is high in cost, and popularization and application of the femtosecond laser spectrum measuring device are limited.
Disclosure of Invention
The invention provides a near-infrared femtosecond laser spectrum phase measuring device, which is used for solving the technical problems that a Michelson interferometer is used for generating double delay pulses in the prior art, and the Michelson interferometer is high in cost and not beneficial to popularization and application of the femtosecond laser spectrum measuring device.
The invention provides a near-infrared femtosecond laser spectrum phase measuring device, which comprises: a beam splitter, a frequency multiplier, a stretcher, a precision delay line, a delay compensator, a pulse pair delay generator, a Brewster reflector, a broadband 1/4 slide, a focusing mirror, a sum frequency device and a spectrometer; the laser beam to be measured is divided into a first laser beam and a second laser beam through the beam splitter, the first laser beam obtains chirped pulses through the frequency multiplier, the stretcher and the precise delay line, the second laser beam is focused to the sum frequency device through the focusing mirror together with the chirped pulses after passing through the delay compensator, the pulse pair delay generator, the broadband 1/4 glass slide and the Brewster reflector, the sum frequency light is received by the spectrometer to obtain spectral interference fringes, and the spectral interference fringes are subjected to numerical processing to obtain the spectral phase of the ultrashort laser pulse.
Further, the first laser beam is incident on a frequency multiplier to generate frequency-multiplied laser pulses.
Further, the frequency doubling laser pulse is widened by a stretcher, and the time width of the frequency doubling laser pulse is widened to become a chirped pulse.
Further, the delay compensator is composed of two groups of same reflectors; the openings of the two groups of reflectors are oppositely arranged, and the relative positions of the two groups of reflectors in the direction vertical to the incident light direction are adjustable; the reflector consists of two equal-waist right-angle prisms with inclined planes vertically arranged; the inclined plane of the isosceles right-angle prism is plated with a 45-degree broadband high-reflection film; the second laser beam enters one group of reflectors in parallel with the side edges of the reflectors and exits from the other group of reflectors.
Further, the stretcher is a hexagonal dispersion prism. The hexagonal dispersion prism is equivalent to a rectangular prism with the remaining part of two adjacent corners cut off, and the cut-off part is two isosceles right-angle prisms.
Furthermore, the pulse pair delay generator is a birefringent crystal, the polarization direction of incident light forms a 45-degree angle with the plane formed by the optical axis of the birefringent crystal and the transmission direction of the incident light, and the incident light generates collinear pulse pairs which have mutually perpendicular polarization directions and relative time delay after passing through the pulse pair delay generator.
Further, the collinear pulse pair is reflected by the Brewster reflector, and the collinear pulse pair with consistent polarization direction and relative time delay is obtained.
Further, the collinear pulse pair delayed relative to the time and the chirped pulse are focused to the sum frequency generator by the focusing mirror to generate a sum frequency pulse pair, the sum frequency pulse pair is received by the spectrometer to obtain a spectrum interference ring, and the near infrared femtosecond laser spectrum phase can be obtained through numerical analysis.
It can be known from the foregoing embodiments of the present invention that, in the near-infrared femtosecond laser spectral phase measurement apparatus provided by the present invention, the birefringent uniaxial crystal is used as the pulse pair delay generator, and compared with a conventional near-infrared femtosecond laser spectral phase measurement apparatus in which a michelson interferometer is used as the pulse pair delay generator, the birefringent uniaxial crystal occupies a smaller space and is low in cost.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
Fig. 1 is a schematic structural diagram of a near-infrared femtosecond laser spectral phase measurement device provided in an embodiment of the present application;
fig. 2 is a schematic structural diagram of a stretcher of a near-infrared femtosecond laser spectral phase measurement apparatus provided in an embodiment of the present application.
Detailed Description
In order to make the objects, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 is a schematic structural diagram of a near-infrared femtosecond laser spectral phase measurement apparatus provided in an embodiment of the present application. The device comprises: a beam splitter 101, a frequency multiplier 102, an expander 103, a fine delay line 104, a delay compensator 105, a pulse pair delay generator 106, a broadband 1/4 slide 107, a Brewster's reflector 108, a focusing mirror 109, a sum frequency 110, and a spectrometer 112; the laser beam to be measured is divided into a first laser beam and a second laser beam by a beam splitter 101, the first laser beam obtains chirped pulses by a frequency multiplier 102, a stretcher 103 and a precision delay line 104, the second laser beam obtains spectral interference fringes after passing through a delay compensator 105, a pulse pair delay generator 106, a broadband 1/4 slide 107 and a Brewster reflector 108 and reacting with the chirped pulses by a focusing mirror 109 and a frequency divider 110, and the spectral interference fringes are received by a spectrometer 112;
the pulse pair delay generator is a birefringent crystal, and the optical axis of the birefringent crystal is parallel to the incident plane of incident light.
In the embodiment of the present application, the pulse pair delay generator 106 of the near-infrared femtosecond laser spectrum phase measuring device provided by the embodiment of the present application is a birefringent crystal, the optical axis of the birefringent uniaxial crystal is parallel to the incident plane of incident light, the polarization direction of the incident light and the plane formed by the optical axis of the birefringent crystal and the transmission direction of the incident light form 45 degrees, and the incident light passes through the pulse pair delay generator and then generates the polarization direction which is mutually perpendicular, and has a collinear pulse pair with relative time delay. The near-infrared femtosecond laser to be detected is divided into two beams of same laser by the beam splitter 101, and the beam splitter can be a beam splitting prism. One of the laser beams is frequency-doubled by a frequency doubler 102 to generate frequency-doubled laser pulses, and the frequency-doubled laser pulses are broadened by a stretcher 103 to obtain chirped pulses with broadened time widths. The frequency multiplier 102 may be a frequency multiplying crystal. The other laser beam passes through the delay compensator 105 and then passes through the pulse pair delay generator 106 to form a pair of pulse pairs with certain delay and mutually perpendicular polarization directions. The generated pulse pairs pass through a wide band 1/4 slide 107, and the fast and slow axes of the wide band 1/4 slide 107 are respectively parallel to the polarization direction of the incident pulse pairs. Rotating the slide 90 may cause the relative phase shift of the pulse pair to change by 180. The pulse pairs are then incident on Brewster's reflector 108, resulting in collinear pulse pairs with relative time delays that are uniform in polarization direction. The reflected light of the pulse pair and the chirped pulse passing through the precise delay line 104 are focused by the focusing mirror 109 to reach the sum frequency device 110, and the sum frequency pulse pair is obtained to form an interference ring, and is received by the spectrometer 112 after being acted by the diaphragm 111. The spectrometer may receive two spectral interference fringes with a phase shift of 180 ° by rotating the slide 107 by 90 °. And reducing to obtain the femtosecond laser spectrum phase after calculation. In the figure, 113, 114 and 115 are mirrors.
The near-infrared femtosecond laser spectrum phase measuring device that this application embodiment provided adopts the birefraction single-axis crystal as the pulse to delaying the generator, and for adopting michelson interferometer to produce delay pulse pair, the birefraction single-axis crystal low price and occupation space are little, and the measuring device who makes has the advantage of sexual valence relative altitude compact structure.
Further, the birefringent uniaxial crystal may be an α -BBO crystal.
Further, the stretcher is a hexagonal dispersion prism, the hexagonal dispersion prism is equivalent to a rectangular prism, the rest part of two adjacent corners is cut off, and the cut-off part is two isosceles right-angle prisms.
In the embodiment of the present application, as shown in fig. 1, the stretcher in the near-infrared femtosecond laser spectral phase measurement apparatus provided by the present invention is a dispersion prism with a hexagonal structure, and the structure of the dispersion prism can be obtained by cutting off an isosceles right triangle from two adjacent angles of a rectangle. Alternatively, as shown in fig. 2, a schematic structural diagram of a stretcher of the near-infrared femtosecond laser spectral phase measurement apparatus provided in the embodiment of the present application is shown. The structure of the prism can be seen as that two identical isosceles right triangles 201 and 202 with the right angle side length L are symmetrically placed along the superposition of the hypotenuses and then are relatively translated along the hypotenuses
And cutting off two small isosceles right triangles with the right angle side length of d and protruding from two ends to obtain a rectangle with the length of L + d and the width of L-d. Two adjacent angles of the rectangle are respectively cut off an isosceles right triangle with right angle side lengths of a and b, and the rest part is the structure of the stretcher provided by the embodiment of the application. The stretcher provided by the embodiment of the application has the advantages of convenience in adjustment and compact structure.
Furthermore, the time delay compensator is composed of two groups of same reflectors, the openings of the two groups of reflectors are oppositely arranged, the relative positions of the two groups of reflectors in the direction perpendicular to the incident light direction are adjustable, each reflector is composed of two isosceles right-angle prisms, inclined planes of the isosceles right-angle prisms are vertically arranged, and 45-degree broadband high-reflection films are plated on the inclined planes of the isosceles right-angle prisms; the second laser beam enters one set of reflectors parallel to the sides of the reflectors and exits the other set of reflectors.
In the embodiment of the present application, as shown in fig. 1, the retardation compensator 105 is composed of two identical sets of reflectors, and the heads of the two sets of reflectors are arranged to face each other so that the split light beams are folded back in the retardation compensator. The reflector is composed of two isosceles right-angle prisms with inclined planes vertically arranged so as to realize 180-degree turning back of the light beam in the delay generator. The laser beam is incident along the direction parallel to the right-angle side of the isosceles right-angle prism and is emitted from the other reflector. By adjusting the relative positions of the two groups of reflectors in the vertical direction of the incident light, the transmission path of the light beam in the delay compensator can be adjusted, and thus the delay time can be adjusted.
Further, the sum frequency device may be a class I BBO crystal.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In view of the above description of the technical solutions provided by the present invention, those skilled in the art will recognize that there may be variations in the technical solutions and the application ranges according to the concepts of the embodiments of the present invention, and in summary, the content of the present specification should not be construed as limiting the present invention.
Claims (7)
1. A near-infrared femtosecond laser spectral phase measurement device, characterized in that the device comprises: a beam splitter, a frequency multiplier, a stretcher, a precision delay line, a delay compensator, a pulse pair delay generator, a Brewster reflector, a broadband 1/4 slide, a focusing mirror, a sum frequency device and a spectrometer; the laser beam to be measured is divided into a first laser beam and a second laser beam by the beam splitter, the first laser beam obtains chirped pulses by the frequency multiplier, the stretcher and the precise delay line, the second laser beam is focused to the sum frequency device by the focusing mirror together with the chirped pulses after passing through the delay compensator, the pulse pair delay generator, the broadband 1/4 glass slide and the Brewster reflector, and frequency light is received by the spectrometer to obtain spectral interference fringes, the spectral interference fringes are subjected to numerical processing to obtain ultra-short laser pulse spectral phases, the stretcher is a hexagonal dispersion prism, the hexagonal dispersion prism is equivalent to a rectangular prism, the rest parts of two adjacent angles are cut off, and the cut-off parts are two isosceles right-angle prisms;
the remaining part also includes two right angles and four obtuse angles, the plane opposite to one of the right angles is used as the incident plane of the frequency-doubled laser pulse, the plane opposite to the other right angle is used as the emergent plane of the broadened chirped pulse, and the input light beam and the emergent light beam are respectively vertical to the incident plane and the emergent plane.
2. The near-infrared femtosecond laser spectral phase measurement device according to claim 1, wherein the first laser beam is incident to a frequency multiplier to generate frequency-multiplied laser pulses.
3. The nir femtosecond laser spectral phase measurement apparatus according to claim 2, wherein the frequency-doubled laser pulse is stretched by a stretcher, and the time width of the frequency-doubled laser pulse is stretched to become a chirped pulse.
4. The near-infrared femtosecond laser spectral phase measurement device according to claim 1, wherein the delay compensator is composed of two groups of identical reflectors; the openings of the two groups of reflectors are oppositely arranged, and the relative positions of the two groups of reflectors in the direction vertical to the incident light direction are adjustable; the reflector consists of two equal-waist right-angle prisms with inclined planes vertically arranged; the inclined plane of the isosceles right-angle prism is plated with a 45-degree broadband high-reflection film; the second laser beam enters one group of reflectors in parallel with the side edges of the reflectors and exits from the other group of reflectors.
5. The near-infrared femtosecond laser spectral phase measuring device according to claim 1, wherein the pulse pair delay generator is a birefringent crystal, the polarization direction of incident light forms 45 ° with the plane formed by the optical axis of the birefringent crystal and the transmission direction of the incident light, and the incident light passes through the pulse pair delay generator to generate collinear pulse pairs with the polarization directions perpendicular to each other and having relative time delays.
6. The near-infrared femtosecond laser spectral phase measurement device according to claim 5, wherein the collinear pulse pair is reflected by the Brewster reflector to obtain a collinear pulse pair with a consistent polarization direction and a relative time delay.
7. The near-infrared femtosecond laser spectrum phase measuring device according to claim 6, wherein the collinear pulse pair with relative time delay and the chirped pulse are focused by the focusing mirror to the sum frequency generator to generate a sum frequency pulse pair, the sum frequency pulse pair is received by a spectrometer to obtain a spectrum interference loop, and the near-infrared femtosecond laser spectrum phase can be obtained through numerical analysis.
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| US3944947A (en) * | 1974-11-01 | 1976-03-16 | Jersey Nuclear-Avco Isotopes, Inc. | Laser amplifier system |
| US7321605B2 (en) * | 2004-05-24 | 2008-01-22 | Asml Holding, N.V. | Helical optical pulse stretcher |
| CN104697649B (en) * | 2015-03-02 | 2022-07-12 | 中国科学院物理研究所 | Single-shot laser pulse detection device |
| CN106441583B (en) * | 2016-12-02 | 2018-03-27 | 深圳大学 | Spectrum phase interference device and the spectral interference measuring system for rebuilding ultrafast light field |
| CN107036714B (en) * | 2017-04-25 | 2019-02-12 | 深圳大学 | A kind of spectrum phase interference apparatus and system |
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|---|---|---|---|---|
| JP2005338851A (en) * | 2004-05-27 | 2005-12-08 | Asml Holding Nv | Compact pulse stretcher |
| CN1936523A (en) * | 2006-09-29 | 2007-03-28 | 华东师范大学 | Super-short light impulse measuring apparatus based on SPIDER technology |
| CN106872038A (en) * | 2017-03-10 | 2017-06-20 | 中国科学院西安光学精密机械研究所 | A kind of relevant dispersion spectrum imaging device of high flux high stable |
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