CN104236726A - Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system - Google Patents
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Abstract
The invention is applicable to the technical field of photoelectricity, and provides a spectrum phase interference device and an ultrashort light pulse electric field direct reconstruction system. A two-step phase-shifting technology is introduced into the spectrum phase interference device on the basis of an existing SPIDER device, in this way, two spectral interference patterns with complementary interference fringes can be obtained conveniently, the situation that a direct current quantity is filtered out through a time window is not needed for data processing, the effect on a measurement result by time overlapping between the direct current quantity and an alternating current quantity is eliminated, and the measurement accuracy is greatly improved. Accordingly, the spectrum phase interference device is widely applied to various ultrashort light pulse electric field direct reconstruction systems, in particular to measurement of time/spectral characteristics of ultrashort pulses complex in spectrum shape or narrow in spectrum.
Description
Technical field
The invention belongs to field of photoelectric technology, particularly relate to a kind of spectrum phase interference device and the direct reconfiguration system of ultrashort light pulse electric field.
Background technology
Ultrashort laser pulse has been widely used in the every field such as physics, chemistry, material, biomedicine, national defence, industrial processes at present.From late nineteen eighties so far, people did not just stop the research of ultrashort light pulse always.Comprising diagnostic techniques and the continuous various new application of developing of the generation of shorter, stronger ultrashort pulse and amplifying technique, ultrashort pulse.In various ps Pulse Measurement technology, autocorrelation measurement is a kind of technology the most conventional, and its feature is simple, easy-to-use.But it can only ranging pulse width and can not the shape of ranging pulse and phase place approx.Frequency discrimination optical shutter technology can measure the shape of light pulse, width and phase place, and structure is also relatively simple, but the data processing of its complexity limits its work efficiency and real-time diagnosis ability.Utilize the SPIDER technology of traditional spectrum shear interference also can measure the width of light pulse, shape and phase place.Its advantage is: measure and carry out at spectral domain, does not need fast-response receiver; Not containing any moving meter in device, reliable and stable; Pass for algorithm simple, be conducive to high-repetition-rate and detect in real time.Its weak point is for spectral shape more complicated, or the ultrashort pulse that spectrum is narrower, and the precision of measurement is just poor.
Summary of the invention
The object of the embodiment of the present invention is to provide a kind of spectrum phase interference device directly reconstructed for ultrashort light pulse electric field, is intended to improve existing spectrum phase interference measurement device precision.
The embodiment of the present invention is achieved in that a kind of spectrum phase interference device, comprising:
For obtaining chirped pulse and identical the first subpulse to be measured of characteristic and the second subpulse to be measured, and make described chirped pulse act on the first subpulse to be measured and the second subpulse to be measured respectively, with produce first and frequently pulse and second and pulse frequently with frequency crystal;
For described first and frequently pulse are divided into first and frequently subpulse and second and frequently subpulse, described second and pulse be frequently divided into the 3rd and subpulse and the 4th and the 3rd beam splitter of subpulse frequently frequently;
Superpose with the 3rd and frequency subpulse, to produce the first-phase moving mechanism of the first spectral interference pattern with frequency subpulse for making described first;
Superpose with the 4th and frequency subpulse, to produce the second-phase moving mechanism of the second spectral interference pattern with frequency subpulse for making described second;
For obtaining the spectrometer of described first spectral interference pattern and the second spectral interference pattern; And
For processing described first spectral interference pattern and the second spectral interference pattern, to obtain the processor of described first subpulse to be measured or the second subpulse characteristic to be measured;
Wherein, described first-phase moving mechanism and second-phase moving mechanism have respectively and make first and frequently subpulse and second and subpulse or make the 3rd and subpulse and the 4th and frequently produce the second wave plate and the 3rd wave plate of π or-π phase shift between subpulse frequently frequently.
Another object of the embodiment of the present invention is to provide a kind of direct reconfiguration system of ultrashort light pulse electric field adopting above-mentioned spectrum phase interference device.
The embodiment of the present invention introduces two step phase-shifting techniques on existing SPIDER device basic, the spectral interference pattern of two width interference fringe complementations can be obtained so easily, data processing no longer need by time window elimination DC quantity, thus the time eliminating DC quantity and the of ac overlapping impact on measurement result, thus improve measuring accuracy and measurement range.Therefore, this spectrum phase interference device is widely used in the direct reconfiguration system of various ultrashort light pulse electric fields, be especially applicable to measure spectrum shape matching is complicated or spectrum is narrower ultrashort pulse time/spectral characteristic.
Accompanying drawing explanation
Fig. 1 is the light channel structure figure of the spectrum phase interference device that the embodiment of the present invention one provides;
Fig. 2 be linearly polarized light by after half-wave plate, light beam polarization face is subject to modulating the schematic diagram deflected;
Fig. 3 is the structural representation of the non-dispersive beam splitter that polarization has nothing to do;
Fig. 4 is the light channel structure figure of the spectrum phase interference device that the embodiment of the present invention two provides; And
Fig. 5 is the light channel structure figure of the spectrum phase interference device that the embodiment of the present invention three provides.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only for explaining the present invention, being not intended to limit the present invention.
The embodiment of the present invention introduces two step phase-shifting techniques on existing SPIDER device basic, the spectral interference pattern of two width interference fringe complementations can be obtained so easily, data processing no longer need by time window elimination DC quantity, thus the time eliminating DC quantity and the of ac overlapping impact on measurement result, improve measuring accuracy.Therefore, this spectrum phase interference device is widely used in the direct reconfiguration system of various ultrashort light pulse electric fields, be especially applicable to measure spectrum shape matching is complicated or spectrum is narrower ultrashort pulse time/spectral characteristic.
Enumerate some embodiments to be below described in detail realization of the present invention.
embodiment one
As shown in Figure 1, the spectrum phase interference device that the present embodiment provides comprises: for obtaining chirped pulse 10 and identical the first subpulse 11 to be measured and the second subpulse 12 to be measured of characteristic, and make described chirped pulse 1 act on respectively the first subpulse 11 to be measured and the second subpulse 12 to be measured, with produce first and pulse frequently 13 and second and pulse 14 frequently with frequency crystal 5; For described first and frequently pulse 13 are divided into first and frequently subpulse 15 and second and frequently subpulse 16, described second and pulse 14 be frequently divided into the 3rd and subpulse 17 and the 4th and the 3rd beam splitter 3 of subpulse 18 frequently frequently; Superpose with the 3rd and frequency subpulse 17, to produce the first-phase moving mechanism of the first spectral interference pattern with frequency subpulse 15 for making described first; Superpose with the 4th and frequency subpulse 18, to produce the second-phase moving mechanism of the second spectral interference pattern with frequency subpulse 16 for making described second; For obtaining the spectrometer of described first spectral interference pattern and the second spectral interference pattern; And for processing described first spectral interference pattern and the second spectral interference pattern, to obtain the processor 19 of the characteristic of described first subpulse 11 or the second to be measured subpulse 12 to be measured; Wherein, described first-phase moving mechanism and second-phase moving mechanism have respectively and make first and frequently subpulse 15 and second and subpulse 16 or make the 3rd and subpulse 17 and the 4th and frequently produce the second wave plate 22 and the 3rd wave plate 23 of π phase shift between subpulse 18 frequently frequently.The spectral interference pattern of two width interference fringe complementations can be obtained so easily, data processing no longer need by time window elimination DC quantity, thus the time eliminating DC quantity and the of ac overlapping impact on measurement result, greatly improve measuring accuracy.Therefore, this spectrum phase interference device is widely used in the direct reconfiguration system of various ultrashort light pulse electric fields, be especially applicable to measure spectrum shape matching is complicated or spectrum is narrower ultrashort pulse time/spectral characteristic.
For obtaining described chirped pulse 10 and identical the first subpulse 11 to be measured and the second subpulse 12 to be measured of characteristic, this spectrum phase interference device also comprises: for receiving pulse 20 to be measured and making it to be divided into the first beam splitter 1 of reflected impulse 24 and transmitted pulse 25; For carrying out broadening to described transmitted pulse 25 and making it to become the dispersor 6 of chirped pulse 10; For described reflected impulse 24 being divided into the second beam splitter 2 of the first subpulse 11 to be measured and the second subpulse 12 to be measured; And for the first wave plate 21 of the polarization direction that adjusts described chirped pulse 10.Wherein, described first wave plate 21 makes outgoing after the polarization direction half-twist of the chirped pulse 10 be projected on it.
The present embodiment is mainly used in single pulse and measures, and described first wave plate 21, second wave plate 22 and the 3rd wave plate 23 all adopt half-wave plate.It should be noted that half-wave plate (phase delay device) is as a kind of conventional polarizer, it can be made up of kinds of artificial or natural birefringence crystal, is often used to the polarization state changing incident beam.Half-wave plate can make the o light propagated and e light produce the relative phase shift of a π wherein, and the plane of polarization of the linearly polarized light of incidence can be rotated a specific angle by it, is often used as Polarization Control device at laser technology field.If a branch of linearly polarized light is incident to half-wave plate, the angle of the slow axis of light beam polarization face and half-wave plate is φ (as 45 °), after this half waveplate modulation, light beam polarization face by with the slow axis of half-wave plate for axis of symmetry rotates 2 φ (as 90 °), as shown in Figure 2.In the present embodiment, the described chirped pulse light beam plane of polarization of the first wave plate 21 is incident to and the angle of this wave plate slow axis is 45 °.Described first and frequently subpulse 15 be 0 ° or 90 ° with the angle of the second wave plate 22 slow axis, described second and the angle of frequency subpulse 16 and the 3rd wave plate 23 slow axis be 90 ° or 0 °.
In addition, this spectrum phase interference device can further include: for regulating the first pulse delay unit 31 of the relative time-delay between described first subpulse 11 to be measured and the second subpulse 12 to be measured and for regulating second pulse delay unit 32 of described first and frequently pulse 13 and the relative time-delay between second and pulse 14 frequently.When described pulse 20 to be measured is in 10 femtosecond left and right, by the beam splitting chip being used as described first beam splitter 1, described pulse 20 to be measured is divided into two bundles, wherein a branch of is reflected impulse 24, and another bundle is transmitted pulse 25.Described transmitted pulse 25 is broadened through described dispersor 6 is the chirped pulse 10 of time width between 300 femtosecond to 800 femtoseconds.Described reflected impulse 24 is divided into two pulses through described second beam splitter 2, and one of them pulse is the first subpulse 11 to be measured, and another is the second subpulse 12 to be measured, and both width, shape are identical with characteristics such as phase places.Described first subpulse 11 to be measured and the second subpulse 12 to be measured incide non-linear and frequently crystal 5 together with chirped pulse 10, produce first and pulse frequently 13 and second and pulse 14 frequently.Wherein, described non-linear and frequently crystal 5 be the β-bbocrystal that thickness is about tens microns, adopt Equations of The Second Kind phase matching.With in frequency process, described chirped pulse 10 is e light, and described first subpulse 11 to be measured and the second subpulse 12 to be measured are o light.
Herein by regulating described first pulse delay unit 31 to make first to differ about 2.5 nanometers with pulse 13 frequently with the centre wavelength of second and pulse 14 frequently.These two are projected to described 3rd beam splitter 3 subsequently abreast with pulse frequently, are divided into two bundles separately; Namely described first and frequently pulse 13 is reflected through described 3rd beam splitter 3, be divided into first and subpulse 15 and second and subpulse 16 frequently frequently after transmission; Similarly, described second and frequently pulse 14 is reflected through described 3rd beam splitter 3, be divided into the 3rd and subpulse 17 and the 4th and subpulse 18 frequently frequently after transmission.Usually, described 3rd beam splitter 3 is preferably the unpolarized cube splitter of 50:50.Wherein, described first after the broad band half wave sheet of one 400 nano wave length light (i.e. the second wave plate 22 and the 3rd wave plate 23), the first spectrometer 41 and the second spectrometer 42 is entered with frequency subpulse 15 and second respectively with frequency subpulse 16.3rd is then directly received by the first spectrometer 41 and the second spectrometer 42 with frequency subpulse 18 respectively with frequency subpulse 17 and the 4th.Now, described first superposes with the 3rd and frequency subpulse 17 with frequency subpulse 15, produces the first spectral interference pattern; Described second superposes with the 4th and frequency subpulse 18 with frequency subpulse 16, produces the second spectral interference pattern.
Regulate described first and frequently pulse 13 and the relative time-delay between second and pulse 14 frequently by described second pulse delay unit 32, the spectral interference ring density recorded to make each spectrometer is suitable.Wherein, the spectral resolution of described first spectrometer 41 and the second spectrometer 42 needs enough high (such as 0.02 nanometer).In addition, make to be o light through described second wave plate 22 with frequency subpulse herein, make to be e light through described 3rd wave plate 23 with frequency subpulse; Or make to be e light through described second wave plate 22 with frequency subpulse, make to be o light through described 3rd wave plate 23 with frequency subpulse.Even described first and frequently subpulse 15 be o light, then described second and frequency subpulse 16 be e light; If the described 3rd is o light with frequency subpulse 17, then the described 4th is e light with frequency subpulse 18; If described first is e light with frequency subpulse 15, then described second is o light with frequency subpulse 16; If the described 3rd is e light with frequency subpulse 17, then the described 4th is o light with frequency subpulse 18.
Suppose that the spectral interference ring that described first spectrometer 41 measures is
D
1=|E
1A(ω)|
2+|E
2A(ω-Ω)|
2+2|E
1A(ω)E
2A(ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω-Ω) (1)
Wherein E represents electric field, and τ is described first and frequently pulse 13 and the time delay between second and pulse 14 frequently, and Ω is described first and pulse frequently 13 and the center frequency difference between second and pulse 14 frequently, and ψ represents phase place.Correspondingly, the spectral interference ring that described second spectrometer 42 measures can be expressed as
D
2=|E
1B(ω)|
2+|E
2B(ω-Ω)|
2-2|E
1B(ω)E
2B(ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω-Ω) (2)
Because described first and pulse frequently 13 and second are incident to the unpolarized cube splitter of a 50:50 abreast with pulse 14 frequently, therefore have
|E
1B(ω)|
2/|E
1A(ω)|
2=|E
2B(ω)|
2/|E
2A(ω)|
2=1 (3)
In fact, the splitting ratio of unpolarized cube splitter may depart from 1 slightly.Value revision is carried out to this, so following formula result can be obtained
D
1-μD
2=4|E
1B(ω)E
2B(ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω-Ω)] (4)
Obviously, correction factor μ meets
μ|E
1B(ω)|
2=|E
1A(ω)|
2,μ|E
2B(ω-Ω)|
2=|E
2A(ω)|
2 (5)
So it is poor directly can to obtain spectrum shearing phase from (4) formula.
Described in the present embodiment, the first spectrometer 41 and the second spectrometer 42 are the spectrometer of same model same specification, to have identical spectral response characteristic and noisiness etc.This two spectrometer synchronously obtains the data that the first spectral interference ring and the second spectral interference ring record in time, and is stored in processor 19 and is processed by corresponding data processing software.Compare with existing SPIDER device, the present embodiment is by two step phase-shifting technique record two width spectral interference rings, and make to eliminate the impact that in existing apparatus, DC quantity intercepted the of ac time easily in data processing, this brings the benefit of two aspects:
1) when measure spectrum is complex-shaped or the ultrashort pulse of spectrum narrower (time is wider) time, effectively can avoid overlapping in time domain of DC quantity and of ac.Thus effectively widen measurable range.
2) choose AC compounent and do not rely on time window intercepting, but the weighted subtraction of the spectral interference ring leaning on the spectrometer of two same performances to measure, effectively reduce the impact of noise.
If described pulse to be measured 20 is the light pulse about 100 femtoseconds, then the time width of described chirped pulse 10 can be made to be 1.5 picoseconds by the described dispersor 6 of adjustment, and described first beam splitter 1 adopt the width beam splitting chip of 50:50.If described pulse to be measured 20 is the ultrashort pulse of photoperiod magnitude, then described second beam splitter 2 can adopt polarization-independent non-dispersive beam splitter, and it is the girdle prism such as grade that base angle is less than 10 °, and in two waist planes platings, 0 degree of width high-reflecting film, as shown in Figure 3.Aforementioned reflected impulse 24 can be divided into the first subpulse 11 to be measured and the second subpulse 12 to be measured perpendicular to waiting bottom surface of girdle prism to be projected to two waist planes, along the power ratio perpendicular to described reflected impulse 24 transmission direction these girdle prisms of translation and adjustable described first subpulse 11 to be measured and the second subpulse 12 to be measured, easy and simple to handle.
embodiment two
As shown in Figure 4, with embodiment one unlike, the spectrum phase interference device that the present embodiment provides is applicable to multiple pulses and measures, it also comprises: for making described first and frequently subpulse 15 and the 3rd and subpulse 17 transmission/reflection simultaneously frequently, then superpose and produces described first spectral interference pattern, described second and frequency subpulse 16 and the 4th with reflection/transmission while of frequency subpulse 18, then superpose the 4th beam splitter 4 producing described second spectral interference pattern; For make described first and frequently subpulse 15 with the 3rd and frequently subpulse 17, described second and frequently subpulse 16 and the 4th and the timesharing of frequency subpulse 18 enter the optical chopper 7 of described 4th beam splitter 4.If described first and frequently subpulse 15 with the 3rd and frequently subpulse 17 through the transmission simultaneously of described 4th beam splitter 4, then described second and frequently subpulse 16 reflect through described 4th beam splitter 4 with the 4th and frequency subpulse 18 simultaneously; If described first reflects through described 4th beam splitter 4 with frequency subpulse 17 with frequency subpulse 15 and the 3rd simultaneously, then described second and frequently subpulse 16 with the 4th and frequently subpulse 18 through described 4th beam splitter 4 while transmission, and this is relevant to the putting position of described 4th beam splitter 4.
Wherein, described spectrometer 40 is only one, receives described first spectral interference pattern and the second spectral interference pattern for timesharing.Similarly, described 4th beam splitter is preferably the unpolarized cube splitter of 50:50.Should be appreciated that described spectrometer 40 is synchronoused working with optical chopper 7, with Da Gengjia effect.In addition, described optical chopper 7 is between the 3rd beam splitter 3 and the 4th beam splitter 4.Eliminate a spectrometer at this, and the noisiness that same spectrometer 40 is introduced received different spectral interference rings is identical, is more conducive to improving measurement accuracy.
embodiment three
As shown in Figure 5, with embodiment two unlike, the spectrum phase interference device that the present embodiment provides also comprises: be back to described three beam splitter 3 with frequency subpulse 17 along original optical path with frequency subpulse 15 and the 3rd for making described first, superposition after described 3rd beam splitter 3 transmission/reflection, to produce the first catoptron 51 of described first spectral interference pattern; For making described second to be back to described three beam splitter 3 with frequency subpulse 18 along original optical path with frequency subpulse 16 and the 4th, superpose after described 3rd beam splitter 3 reflection/transmission, to produce the second catoptron 52 of described second spectral interference pattern; And for make described first and frequently subpulse 15 with the 3rd and frequently subpulse 17, described second and frequently subpulse 16 and the 4th and the timesharing of frequency subpulse 18 be projected to the optical chopper 7 of the first catoptron 51, second catoptron 52.Wherein, described optical chopper 7 between the 3rd beam splitter 3 and the first catoptron 51, second catoptron 52, and is parallel to each other.Certainly, described second wave plate 22 and the 3rd wave plate 23 all should be quarter-wave plate.Eliminate the 4th beam splitter described in embodiment two at this, structure is simple, and cost is lower.
The foregoing is only preferred embodiment of the present invention, be not limited to the present invention, all any amendments done within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within protection scope of the present invention.
Claims (10)
1. a spectrum phase interference device, is characterized in that, comprising:
For obtaining chirped pulse and identical the first subpulse to be measured of characteristic and the second subpulse to be measured, and make described chirped pulse act on the first subpulse to be measured and the second subpulse to be measured respectively, with produce first and frequently pulse and second and pulse frequently with frequency crystal;
For described first and frequently pulse are divided into first and frequently subpulse and second and frequently subpulse, described second and pulse be frequently divided into the 3rd and subpulse and the 4th and the 3rd beam splitter of subpulse frequently frequently;
Superpose with the 3rd and frequency subpulse, to produce the first-phase moving mechanism of the first spectral interference pattern with frequency subpulse for making described first;
Superpose with the 4th and frequency subpulse, to produce the second-phase moving mechanism of the second spectral interference pattern with frequency subpulse for making described second;
For obtaining the spectrometer of described first spectral interference pattern and the second spectral interference pattern; And
For processing described first spectral interference pattern and the second spectral interference pattern, to obtain the processor of the characteristic of described first subpulse to be measured or the second subpulse to be measured;
Wherein, described first-phase moving mechanism and second-phase moving mechanism have respectively and make first and frequently subpulse and second and subpulse or make the 3rd and subpulse and the 4th and frequently produce the second wave plate and the 3rd wave plate of π or-π phase shift between subpulse frequently frequently.
2. spectrum phase interference device as claimed in claim 1, it is characterized in that, described spectrum phase interference device also comprises:
For receiving pulse to be measured and making it to be divided into the first beam splitter of reflected impulse and transmitted pulse;
For carrying out broadening to described transmitted pulse and making it to become the dispersor of chirped pulse;
For described reflected impulse being divided into the second beam splitter of the first subpulse to be measured and the second subpulse to be measured; And
For adjusting the first wave plate of described chirped pulse polarization direction.
3. spectrum phase interference device as claimed in claim 2, it is characterized in that, when described pulse to be measured is single pulse, described first wave plate, the second wave plate and the 3rd wave plate are half-wave plate; Described spectrometer is two, and its model, specification are all identical, is respectively used to receive described first spectral interference pattern and the second spectral interference pattern.
4. spectrum phase interference device as claimed in claim 2, it is characterized in that, when described pulse to be measured is multiple pulses, described spectrum phase interference device also comprises:
For making described first and frequently subpulse and the 3rd and subpulse transmission/reflection simultaneously frequently, then superpose and produces described first spectral interference pattern, described second and frequency subpulse and the 4th with reflection/transmission while of frequency subpulse, then superpose the 4th beam splitter producing described second spectral interference pattern; And
For make described first and frequently subpulse with the 3rd and frequently subpulse, described second and frequently subpulse and the 4th and the timesharing of frequency subpulse enter the optical chopper of described 4th beam splitter;
Wherein said spectrometer is only one, receives described first spectral interference pattern and the second spectral interference pattern for timesharing; Described optical chopper is between the 3rd beam splitter and the 4th beam splitter; Described first wave plate, the second wave plate and the 3rd wave plate are half-wave plate.
5. spectrum phase interference device as claimed in claim 4, it is characterized in that, described 3rd beam splitter and the 4th beam splitter are the unpolarized cube splitter of 50:50.
6. spectrum phase interference device as claimed in claim 2, it is characterized in that, when described pulse to be measured is multiple pulses, described spectrum phase interference device also comprises:
For making described first to be back to described three beam splitter with frequency subpulse along original optical path with frequency subpulse and the 3rd, superpose after described 3rd beam splitter transmission/reflection, to produce the first catoptron of described first spectral interference pattern;
For making described second to be back to described three beam splitter with frequency subpulse along original optical path with frequency subpulse and the 4th, superpose after described three beam splitter reflection/transmission, to produce the second catoptron of described second spectral interference pattern;
For make described first and frequently subpulse with the 3rd and frequently subpulse, described second and frequently subpulse and the 4th and the timesharing of frequency subpulse be projected to the optical chopper of the first catoptron, the second catoptron;
Wherein, described spectrometer is only one, receives described first spectral interference pattern and the second spectral interference pattern for timesharing; Described optical chopper is between the 3rd beam splitter and first, second catoptron, and described first wave plate is half-wave plate, and the second wave plate and the 3rd wave plate are quarter-wave plate.
7. the spectrum phase interference device according to any one of claim 1 ~ 6, is characterized in that, described spectrum phase interference device comprises further:
For regulating the first pulse delay unit of the relative time-delay between described first subpulse to be measured and the second subpulse to be measured; And
For regulating described first and frequently pulse and second and the second pulse delay unit of the interpulse relative time-delay of frequency.
8. spectrum phase interference device as claimed in claim 7, it is characterized in that, when described pulse to be measured is the ultrashort pulse of photoperiod magnitude, described second beam splitter is polarization-independent non-dispersive beam splitter, it is the girdle prism such as grade that base angle is less than 10 °, in two waist planes platings, 0 degree of width high-reflecting film; Described reflected impulse is projected to two waist planes perpendicular to waiting bottom surface of girdle prism, carries out beam splitting with this.
9. spectrum phase interference device as claimed in claim 7, is characterized in that, being incident to chirped pulse that is described and crystal frequently is e light, and described first subpulse to be measured and the second subpulse to be measured are o light;
If is o light through described second wave plate with frequency subpulse, then make to be e light through described 3rd wave plate with frequency subpulse; If or be e light through described second wave plate with frequency subpulse, then make to be o light through described 3rd wave plate with frequency subpulse.
10. one kind adopts the direct reconfiguration system of ultrashort light pulse electric field of the spectrum phase interference device according to any one of claim 1 ~ 9.
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| CN107036714A (en) * | 2017-04-25 | 2017-08-11 | 深圳大学 | A kind of spectrum phase interference apparatus and system |
| WO2018196104A1 (en) * | 2017-04-25 | 2018-11-01 | 深圳大学 | Spectral phase interference apparatus and system |
| CN107036714B (en) * | 2017-04-25 | 2019-02-12 | 深圳大学 | A kind of spectrum phase interference apparatus and system |
| US11029209B2 (en) | 2017-04-25 | 2021-06-08 | Shenzhen University | Spectral phase interference device and system |
| CN110567595A (en) * | 2019-09-11 | 2019-12-13 | 华东师范大学重庆研究院 | Real-time measurement method and system for transient ultrashort pulse time width |
| CN110715734A (en) * | 2019-11-20 | 2020-01-21 | 深圳大学 | Single measurement device and method for terahertz polarization information and time domain waveform |
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