CN104236726B - Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system - Google Patents
Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system Download PDFInfo
- Publication number
- CN104236726B CN104236726B CN201310244775.9A CN201310244775A CN104236726B CN 104236726 B CN104236726 B CN 104236726B CN 201310244775 A CN201310244775 A CN 201310244775A CN 104236726 B CN104236726 B CN 104236726B
- Authority
- CN
- China
- Prior art keywords
- subpulse
- frequency
- pulse
- measured
- wave plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Abstract
The invention is applicable to the technical field of photoelectricity, and provides a spectrum phase interference device and an ultrashort light pulse electric field direct reconstruction system. A two-step phase-shifting technology is introduced into the spectrum phase interference device on the basis of an existing SPIDER device, in this way, two spectral interference patterns with complementary interference fringes can be obtained conveniently, the situation that a direct current quantity is filtered out through a time window is not needed for data processing, the effect on a measurement result by time overlapping between the direct current quantity and an alternating current quantity is eliminated, and the measurement accuracy is greatly improved. Accordingly, the spectrum phase interference device is widely applied to various ultrashort light pulse electric field direct reconstruction systems, in particular to measurement of time/spectral characteristics of ultrashort pulses complex in spectrum shape or narrow in spectrum.
Description
Technical field
The invention belongs to field of photoelectric technology, more particularly to a kind of spectrum phase interference device and ultrashort light pulse electric field it is straight
Connect reconfiguration system.
Background technology
It is each that ultrashort laser pulse is widely used at present physics, chemistry, material, biomedicine, national defence, industrial processes etc.
Individual field.From late nineteen eighties so far, research of the people to ultrashort light pulse did not just stop always.Including it is shorter,
The generation of higher ultrashort pulse and amplifying technique, the diagnostic techniques of ultrashort pulse and constantly open up various new application necks
Domain.In various ps Pulse Measurement technologies, autocorrelation measurement is a kind of the most commonly used technology, and its feature is simple, easy-to-use.
But it approx can only measure pulse width and can not measure the shape and phase place of pulse.Frequency discrimination optical shutter technology can be measured
The shape of light pulse, width and phase place, structure is also relatively easy, but the data processing of its complexity limits its operating efficiency
With real-time diagnosis ability.Using the SPIDER technologies of traditional spectrum shear interference also can measure the width of light pulse, shape and
Phase place.Its advantage is：Measurement is carried out in spectral domain, is not required to fast-response receiver；Any moving element is not contained in device, it is stable
It is reliable；Pass simple for algorithm, be conducive to high-repetition-rate real-time detection.Its weak point be for spectral shape is more complicated, or
The narrower ultrashort pulse of spectrum, the precision of measurement is just poor.
The content of the invention
The purpose of the embodiment of the present invention is to provide a kind of spectrum phase for the direct reconstruct of ultrashort light pulse electric field to do
Relate to device, it is intended to improve existing spectrum phase interference measurement device precision.
The embodiment of the present invention is achieved in that a kind of spectrum phase interference device, including：
For obtaining chirped pulse and the subpulse to be measured of characteristic identical first and the second subpulse to be measured, and make the Zhou
Pulse of singing is respectively acting on the first subpulse to be measured and the second subpulse to be measured, to produce first and frequency pulse and second and frequency arteries and veins
Rush and frequency crystal；
For described first and frequency pulse to be divided into into first and frequency subpulse and second and frequency subpulse, described second and frequency
Pulse be divided into the 3rd and frequency subpulse and the 4th and frequency subpulse the 3rd beam splitter；
For make described first and frequency subpulse be superimposed with the 3rd and frequency subpulse, to produce the first spectral interference pattern
First phase shift mechanism；
For make described second and frequency subpulse be superimposed with the 4th and frequency subpulse, to produce the second spectral interference pattern
Second phase shift mechanism；
For obtaining the spectrometer of first spectral interference pattern and the second spectral interference pattern；And
For processing first spectral interference pattern and the second spectral interference pattern, treated with obtaining described first
Survey the processor of subpulse or the second subpulse characteristic to be measured；
Wherein, first phase shift mechanism and the second phase shift mechanism have respectively makes first and frequency subpulse and second and frequency
Subpulse makes to produce second wave plate and the 3rd ripple of π or-π phase shifts between the 3rd and frequency subpulse and the 4th and frequency subpulse
Piece.
The another object of the embodiment of the present invention is to provide a kind of ultrashort laser arteries and veins using above-mentioned spectrum phase interference device
Rush the direct reconfiguration system of electric field.
The embodiment of the present invention introduces two step phase-shifting techniques on existing SPIDER device basics, so can easily obtain
The complementary spectral interference pattern of two width interference fringes, no longer needs to filter off DC quantity with time window, so as to disappear in data processing
Except the overlapping impact to measurement result of the time of DC quantity and of ac, so as to improve certainty of measurement and measurement range.Cause
This, this spectrum phase interference device is widely used in the direct reconfiguration system of various ultrashort light pulse electric fields, especially suitable for measuring light
Ultrashort pulse time/spectral characteristic that spectral shape is more complicated or spectrum is narrower.
Description of the drawings
Fig. 1 is the light channel structure figure of the spectrum phase interference device that the embodiment of the present invention one is provided；
Fig. 2 be linearly polarized light after half-wave plate, the modulated schematic diagram for deflecting in light beam polarization face；
Fig. 3 is the structural representation of the unrelated non-dispersive beam splitter of polarization；
Fig. 4 is the light channel structure figure of the spectrum phase interference device that the embodiment of the present invention two is provided；And
Fig. 5 is the light channel structure figure of the spectrum phase interference device that the embodiment of the present invention three is provided.
Specific embodiment
In order that the objects, technical solutions and advantages of the present invention become more apparent, it is right below in conjunction with drawings and Examples
The present invention is further elaborated.It should be appreciated that specific embodiment described herein is used only for explaining the present invention, and
It is not used in the restriction present invention.
The embodiment of the present invention introduces two step phase-shifting techniques on existing SPIDER device basics, so can easily obtain
The complementary spectral interference pattern of two width interference fringes, no longer needs to filter off DC quantity with time window, so as to disappear in data processing
Except the overlapping impact to measurement result of the time of DC quantity and of ac, certainty of measurement is improved.Therefore, this spectrum phase is done
Relate to device and be widely used in the direct reconfiguration system of various ultrashort light pulse electric fields, especially suitable for measure spectrum shape matching it is complicated or
The narrower ultrashort pulse time/spectral characteristic of spectrum.
Realization of some embodiments to the present invention is set forth below to be described in detail.
Embodiment one
As shown in figure 1, the spectrum phase interference device that the present embodiment is provided includes：For obtaining chirped pulse 10 and characteristic
The subpulse to be measured 12 of subpulse 11 and second to be measured of identical first, and it is to be measured to make the chirped pulse 1 be respectively acting on first
The subpulse to be measured 12 of subpulse 11 and second, with produce first and frequency pulse 13 and second and frequency pulse 14 and frequency crystal 5；With
In being first and frequency subpulse 15 and second and frequency subpulse 16, described second and frequency pulse by described first and 13 points of frequency pulse
14 points are the 3rd and the 3rd beam splitter 3 of frequency subpulse 17 and the 4th and frequency subpulse 18；For making described first and the sub- arteries and veins of frequency
Punching 15 is superimposed with the 3rd and frequency subpulse 17, to produce the first phase shift mechanism of the first spectral interference pattern；For making described
Two and frequency subpulse 16 be superimposed with the 4th and frequency subpulse 18, to produce the second phase shift mechanism of the second spectral interference pattern；With
In the spectrometer for obtaining first spectral interference pattern and the second spectral interference pattern；And for dry to first spectrum
Relate to pattern and the second spectral interference pattern is processed, to obtain the described first subpulse 11 or the second to be measured subpulse 12 to be measured
Characteristic processor 19；Wherein, first phase shift mechanism and the second phase shift mechanism have respectively makes first and frequency subpulse
15 and second and frequency subpulse 16 or make between the 3rd and frequency subpulse 17 and the 4th and frequency subpulse 18 produce π phase shifts second
The wave plate 23 of wave plate 22 and the 3rd.The complementary spectral interference pattern of two width interference fringes so can be easily obtained, at data
No longer need to filter off DC quantity with time window in reason, it is overlapping with the time of of ac to measurement result so as to eliminate DC quantity
Affect, greatly improve certainty of measurement.Therefore, this spectrum phase interference device is widely used in various ultrashort light pulse electric fields
Direct reconfiguration system, especially suitable for measure spectrum shape matching is complicated or spectrum is narrower ultrashort pulse time/spectral characteristic.
To obtain the chirped pulse 10 and the subpulse to be measured 12 of subpulse 11 and second to be measured of characteristic identical first, this
Spectrum phase interference device also includes：For receiving pulse to be measured 20 and being allowed to be divided into the of reflected impulse 24 and transmitted pulse 25
One beam splitter 1；For entering line broadening to the transmitted pulse 25 and making the dispersor 6 of chirped pulse 10；For by institute
State the second beam splitter 2 that 24 points of reflected impulse is the first subpulse to be measured 11 and the second subpulse to be measured 12；And for adjusting
First wave plate 21 of the polarization direction of the chirped pulse 10.Wherein, first wave plate 21 makes to be projected to arteries and veins of warbling thereon
The polarization direction of punching 10 is rotated by 90 ° rear outgoing.
The present embodiment is mainly used in single pulse measurement, and first wave plate 21, the second wave plate 22 and the 3rd wave plate 23 are equal
Using half-wave plate.It should be noted that half-wave plate（Phase delay device）Used as a kind of conventional polarizer, it can be by various
Artificial or natural birefringence crystal is made, and is often used to change the polarization state of incident beam.Half-wave plate enables to pass wherein
The o light broadcast and e light produce the relative phase shift of a π, and the plane of polarization of incident linearly polarized light can be rotated one specifically by it
Angle, in laser technology field Polarization Control device is often used as.If a branch of linearly polarized light is incident to half-wave plate, light beam is inclined
The angle of slow axis of face and half-wave plate of shaking is φ（Such as 45 °）, after the half waveplate modulation, light beam polarization face is by with half-wave plate
Slow axis is that symmetry axis rotates 2 φ（Such as 90 °）, as shown in Figure 2.In the present embodiment, it is incident to warbling for first wave plate 21
Pulsed light beam plane of polarization is 45 ° with the angle of the wave plate slow axis.Described first and 15 and second wave plate of frequency subpulse 22 slow axis
Angle is 0 ° or 90 °, described second and the angle of frequency subpulse 16 and the slow axis of the 3rd wave plate 23 be 90 ° or 0 °.
In addition, this spectrum phase interference device can further include：For adjusting the described first subpulse to be measured 11
With the first pulse delay unit 31 of the relative time-delay between the second subpulse to be measured 12 and for adjusting described first and frequency
Second pulse delay unit 32 of the relative time-delay between pulse 13 and second and frequency pulse 14.When the pulse to be measured 20 is 10
By 20 points of the pulse to be measured it is two beams by the beam splitting chip as first beam splitter 1 during femtosecond or so, wherein a branch of for anti-
Pulse 24 is penetrated, another beam is transmitted pulse 25.It is time width 300 that dispersor 6 described in the Jing of the transmitted pulse 25 is broadened
Femtosecond is to the chirped pulse 10 between 800 femtoseconds.Second beam splitter 2 is divided into two pulses described in the Jing of the reflected impulse 24,
One of pulse is the first subpulse to be measured 11, and another is the second subpulse to be measured 12, both width, shape and phase place etc.
Characteristic is identical.The subpulse to be measured 12 of first subpulse to be measured 11 and second incide together with chirped pulse 10 it is non-linear and
Frequency crystal 5, produces first and frequency pulse 13 and second and frequency pulse 14.Wherein, the non-linear and frequency crystal 5 be thickness about
For tens microns of β-bbocrystal, using the second type-Ⅱphase matching.During frequency, the chirped pulse 10 is e light, and institute
State the first subpulse to be measured 11 and the second subpulse to be measured 12 is o light.
In first and frequency pulse 13 and second and frequency pulse 14 being made here by regulation first pulse delay unit 31
Cardiac wave length differs about 2.5 nanometers.The two and frequency pulse are subsequently abreast projected to the 3rd beam splitter 3, are each divided into
Two beams；I.e. described first and the 3rd beam splitter 3 described in of frequency pulse 13 reflect, transmit after be divided into first and frequency subpulse 15 and
Two and frequency subpulse 16；Similarly, described second and the 3rd beam splitter 3 described in of frequency pulse 14 reflect, transmit after be divided into the 3rd
With frequency subpulse 17 and the 4th and frequency subpulse 18.Generally, the 3rd beam splitter 3 is preferably 50:50 unpolarized cube
Beam splitter.Wherein, described first and frequency subpulse 15 and second and frequency subpulse 16 distinguish the broadband of the nano wave length light of Jing 1
Half-wave plate（That is the second wave plate 22 and the 3rd wave plate 23）The first spectrometer 41 and the second spectrometer 42 are entered afterwards.And the 3rd and frequency
Pulse 17 and the 4th and frequency subpulse 18 are then directly received respectively by the first spectrometer 41 and the second spectrometer 42.Now, it is described
First and frequency subpulse 15 be superimposed with the 3rd and frequency subpulse 17, produce the first spectral interference pattern；Described second and the sub- arteries and veins of frequency
Punching 16 is superimposed with the 4th and frequency subpulse 18, produces the second spectral interference pattern.
Can be adjusted between described first and frequency pulse 13 and second and frequency pulse 14 by second pulse delay unit 32
Relative time-delay, so that the spectral interference ring density that each spectrometer is measured is appropriate.Wherein, first spectrometer 41 and second
The spectral resolution of spectrometer 42 needs sufficiently high（Such as 0.02 nanometer）.In addition, making the sum through second wave plate 22 herein
Frequency subpulse is o light, and it is e light to make through the 3rd wave plate 23 and frequency subpulse；Or make through second wave plate 22
And frequency subpulse be e light, make through the 3rd wave plate 23 and frequency subpulse be o light.Even described first and the sub- arteries and veins of frequency
It is e light that punching 15 is o light, then described second and frequency subpulse 16；If the described 3rd and frequency subpulse 17 be o light, the described 4th
It is e light with frequency subpulse 18；If described first and frequency subpulse 15 be e light, described second and frequency subpulse 16 be o light；If
Described 3rd and frequency subpulse 17 be e light, then the described 4th and frequency subpulse 18 be o light.
Assume that the spectral interference ring that first spectrometer 41 is measured is
D1=|E1A(ω)|2+|E2A(ω-Ω)|2+2|E1A(ω)E2A(ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω-Ω) (1)
Wherein E represents electric field, and τ is described first and the time delay between frequency pulse 13 and second and frequency pulse 14, and Ω is
Center frequency difference between described first and frequency pulse 13 and second and frequency pulse 14, and ψ represents phase place.Correspondingly, described second
The spectral interference ring that spectrometer 42 is measured is represented by
D2=|E1B(ω)|2+|E2B(ω-Ω)|2-2|E1B(ω)E2B(ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω-Ω) (2)
Because described first and frequency pulse 13 and second and frequency pulse 14 be abreast incident to 1:50 unpolarized cube
Beam splitter, therefore have
|E1B(ω)|2/|E1A(ω)|2=|E2B(ω)|2/|E2A(ω)|2=1 (3)
In fact, the splitting ratio of unpolarized cube splitter may be offset slightly from 1.Value revision is carried out to this, then
Following formula result can be obtained
D1-μD2=4|E1B(ω)E2B(ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω-Ω)] (4)
Obviously, correction factor μ meets
μ|E1B(ω)|2=|E1A(ω)|2,μ|E2B(ω-Ω)|2=|E2A(ω)|2 (5)
In can be that directly to obtain spectrum shearing phase from (4) formula poor.
First spectrometer 41 described in the present embodiment and the spectrometer that the second spectrometer 42 is same model same specification, to have
There are identical spectral response characteristic and noise characteristic etc..This two spectrometer synchronously obtains in time the first spectral interference ring and
On two spectral interference rings record data, and storage processed by corresponding data processing software in processor 19.With it is existing
Some SPIDER devices compare, and the present embodiment records two width spectral interference rings by two step phase-shifting techniques so that in data processing
On can easily eliminate the impact that DC quantity is intercepted to the of ac time in existing apparatus, this brings the benefit of two aspects：
1）When measure spectrum is complex-shaped or spectrum is narrower（Time is wider）Ultrashort pulse when, direct current can be effectively prevented from
Amount is overlap in time-domain with of ac.So as to effectively widen measurable range.
2）Choose AC compounent and do not rely on time window intercepting, but the spectrum measured by the spectrometer of two same performances is done
The weighted subtraction of ring is related to, the impact of noise is efficiently reduced.
If the pulse to be measured 20 is the light pulse of 100 femtoseconds or so, institute can be made by the adjustment dispersor 6
The time width for stating chirped pulse 10 is 1.5 picoseconds, and first beam splitter 1 adopts 50:50 width beam splitting chip is
Can.If the pulse to be measured 20 is the ultrashort pulse of photoperiod magnitude, second beam splitter 2 can adopt unrelated with polarization
Non-dispersive beam splitter, it is that girdle prism is waited in base angle less than 10 °, and plates 0 degree of width high-reflecting film, such as Fig. 3 in two waist planes
It is shown.Aforementioned reflected impulse 24 perpendicular to wait girdle prism bottom surface be projected to two waist planes by be classified as the first sub- arteries and veins to be measured
Punching 11 and second subpulse to be measured 12, can regulation institute along the grade girdle prism is translated perpendicular to the transmission direction of the reflected impulse 24
The power ratio of the first subpulse to be measured 11 and the second subpulse to be measured 12 is stated, it is easy to operate.
Embodiment two
As shown in figure 4, from unlike embodiment one, the spectrum phase interference device that the present embodiment is provided is applied to multiple
Impulsive measurement, it also includes：For make described first and frequency subpulse 15 and the 3rd and frequency subpulse 17 simultaneously transmission/reflection/angle,
Then superposition produces first spectral interference pattern, described second and frequency subpulse 16 and the 4th and frequency subpulse 18 instead simultaneously
Penetrate/transmit, be then superimposed the 4th beam splitter 4 for producing second spectral interference pattern；For making described first and the sub- arteries and veins of frequency
Punching 15 and the 3rd and frequency subpulse 17, described second and frequency subpulse 16 and the 4th and the timesharing of frequency subpulse 18 enter the described 4th
The optical chopper 7 of beam splitter 4.If described first and frequency subpulse 15 and the 3rd and the 4th beam splitter described in the Jing of frequency subpulse 17
4 transmit simultaneously, then and described second and the 4th reflection simultaneously of beam splitter 4 described in frequency subpulse 16 and the 4th and the Jing of frequency subpulse 18；
If the 4th beam splitter 4 reflects described in described first and frequency subpulse 15 and the 3rd and the Jing of frequency subpulse 17 simultaneously, described second
Transmit simultaneously with the 4th beam splitter 4 described in frequency subpulse 16 and the 4th and the Jing of frequency subpulse 18, and this and the 4th beam splitter 4
Putting position it is related.
Wherein, the spectrometer 40 is only one, and for timesharing first spectral interference pattern and the second spectrum are received
Interference pattern.Similarly, the 4th beam splitter is preferably 50：50 unpolarized cube splitter.It should be appreciated that the light
Spectrometer 40 works asynchronously with optical chopper 7, with up to more preferably effect.In addition, the optical chopper 7 is located at the 3rd beam splitter 3
Between the 4th beam splitter 4.Here eliminates a spectrometer, and the different spectral interferences received by same spectrometer 40 pairs
The noise characteristic that ring is introduced is identical, is more beneficial for improving measurement accuracy.
Embodiment three
As shown in figure 5, from unlike embodiment two, the spectrum phase interference device that the present embodiment is provided also includes：With
In make described first and frequency subpulse 15 and the 3rd and frequency subpulse 17 be back to the 3rd beam splitter 3 along original optical path, from institute
State and be superimposed after the transmission/reflection/angle of the 3rd beam splitter 3, to produce the first speculum 51 of first spectral interference pattern；For making
Described second and frequency subpulse 16 and the 4th and frequency subpulse 18 be back to the 3rd beam splitter 3 along original optical path, from described
It is superimposed after the reflection/transmission of three beam splitter 3, to produce the second speculum 52 of second spectral interference pattern；And for making
Described first and frequency subpulse 15 and the 3rd and frequency subpulse 17, described second and frequency subpulse 16 and the 4th and frequency subpulse 18
Timesharing is projected to the first speculum 51, the optical chopper 7 of the second speculum 52.Wherein, the optical chopper 7 is located at the 3rd
Between the speculum 51 of beam splitter 3 and first, the second speculum 52, and it is parallel to each other.Certainly, the ripple of second wave plate 22 and the 3rd
Piece 23 should be quarter-wave plate.Here eliminates the 4th beam splitter described in embodiment two, and simple structure, cost is lower.
Presently preferred embodiments of the present invention is the foregoing is only, the present invention, all essences in the present invention is not limited to
Any modification, equivalent and improvement made within god and principle etc., should be included within the scope of the present invention.
Claims (6)
1. a kind of spectrum phase interference device, it is characterised in that include：
For obtaining chirped pulse and the subpulse to be measured of characteristic identical first and the second subpulse to be measured, and make the arteries and veins of warbling
Punching is respectively acting on the first subpulse to be measured and the second subpulse to be measured, to produce first and frequency pulse and second and frequency pulse
With frequency crystal；
For described first and frequency pulse to be divided into into first and frequency subpulse and second and frequency subpulse, described second and frequency pulse
Be divided into the 3rd and frequency subpulse and the 4th and frequency subpulse the 3rd beam splitter；
For make described first and frequency subpulse be superimposed with the 3rd and frequency subpulse, to produce the first of the first spectral interference pattern
Phase shift mechanism；
For make described second and frequency subpulse be superimposed with the 4th and frequency subpulse, to produce the second of the second spectral interference pattern
Phase shift mechanism；
For obtaining the spectrometer of first spectral interference pattern and the second spectral interference pattern；
For processing first spectral interference pattern and the second spectral interference pattern, to obtain the described first son to be measured
The processor of the characteristic of pulse or the second subpulse to be measured；
For receiving pulse to be measured and being allowed to be divided into the first beam splitter of reflected impulse and transmitted pulse；
For entering line broadening to the transmitted pulse and making the dispersor of chirped pulse；
For the reflected impulse to be divided into the second beam splitter of the first subpulse to be measured and the second subpulse to be measured；
For adjusting the first wave plate of the chirped pulse polarization direction；
For adjusting the first pulse delay of the relative time-delay between the described first subpulse to be measured and the second subpulse to be measured
Device；And
For adjusting the second pulse delay unit of the relative time-delay between described first and frequency pulse and second and frequency pulse；
Wherein, first phase shift mechanism and the second phase shift mechanism have respectively makes first and frequency subpulse and second and the sub- arteries and veins of frequency
Punching makes to produce second wave plate and the 3rd wave plate of π or-π phase shifts between the 3rd and frequency subpulse and the 4th and frequency subpulse；
The pulse to be measured is the ultrashort pulse of photoperiod magnitude, and second beam splitter is the non-dispersive light beam unrelated with polarization
Beam splitter, it is that girdle prism is waited in base angle less than 10 °, and in two waist planes 0 degree of width high-reflecting film is plated；The reflected impulse perpendicular to
Bottom surface Deng girdle prism is projected to two waist planes, is split with this；
The chirped pulse for being incident to described and frequency crystal is e light, and first subpulse to be measured and the second subpulse to be measured are equal
For o light；
If through second wave plate and frequency subpulse be o light, make through the 3rd wave plate and frequency subpulse be e
Light；If or through second wave plate and frequency subpulse be e light, make through the 3rd wave plate and frequency subpulse be
O light.
2. spectrum phase interference device as claimed in claim 1, it is characterised in that when the pulse to be measured is single pulse,
First wave plate, the second wave plate and the 3rd wave plate are half-wave plate；The spectrometer is two, its model, specification all same,
It is respectively used to receive first spectral interference pattern and the second spectral interference pattern.
3. spectrum phase interference device as claimed in claim 1, it is characterised in that when the pulse to be measured is multiple pulses,
The spectrum phase interference device also includes：
For make described first and frequency subpulse with the 3rd and frequency subpulse simultaneously transmission/reflection/angle, then be superimposed and produces described the
One spectral interference pattern, described second and frequency subpulse with the 4th and frequency subpulse simultaneously reflection/transmission, then be superimposed and produces institute
State the 4th beam splitter of the second spectral interference pattern；And
For making described first and frequency subpulse and the 3rd and frequency subpulse, described second and frequency subpulse and the 4th and the sub- arteries and veins of frequency
Timesharing is rushed into the optical chopper of the 4th beam splitter；
Wherein described spectrometer is only one, and for timesharing first spectral interference pattern and the second spectral interference figure are received
Sample；The optical chopper is located between the 3rd beam splitter and the 4th beam splitter；First wave plate, the second wave plate and the 3rd ripple
Piece is half-wave plate.
4. spectrum phase interference device as claimed in claim 3, it is characterised in that the 3rd beam splitter and the 4th beam splitter
It is 50：50 unpolarized cube splitter.
5. spectrum phase interference device as claimed in claim 1, it is characterised in that when the pulse to be measured is multiple pulses,
The spectrum phase interference device also includes：
For make described first and frequency subpulse and the 3rd and frequency subpulse be back to the 3rd beam splitter along original optical path, from institute
State and be superimposed after the 3rd beam splitter transmission/reflection/angle, to produce the first speculum of first spectral interference pattern；
For make described second and frequency subpulse and the 4th and frequency subpulse be back to the 3rd beam splitter along original optical path, from institute
State and be superimposed after three beam splitter reflections/transmission, to produce the second speculum of second spectral interference pattern；
For making described first and frequency subpulse and the 3rd and frequency subpulse, described second and frequency subpulse and the 4th and the sub- arteries and veins of frequency
Rush timesharing and be projected to the first speculum, the optical chopper of the second speculum；
Wherein, the spectrometer is only one, and for timesharing first spectral interference pattern and the second spectral interference figure are received
Sample；The optical chopper is located between the 3rd beam splitter and first, second speculum, and first wave plate is half-wave plate, the
Two wave plates and the 3rd wave plate are quarter-wave plate.
6. a kind of ultrashort light pulse electric field of the spectrum phase interference device using as any one of Claims 1 to 5 is straight
Connect reconfiguration system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310244775.9A CN104236726B (en) | 2013-06-19 | 2013-06-19 | Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310244775.9A CN104236726B (en) | 2013-06-19 | 2013-06-19 | Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104236726A CN104236726A (en) | 2014-12-24 |
| CN104236726B true CN104236726B (en) | 2017-04-19 |
Family
ID=52225253
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310244775.9A Expired - Fee Related CN104236726B (en) | 2013-06-19 | 2013-06-19 | Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104236726B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106441583B (en) * | 2016-12-02 | 2018-03-27 | 深圳大学 | Spectrum phase interference device and the spectral interference measuring system for rebuilding ultrafast light field |
| CN107036714B (en) * | 2017-04-25 | 2019-02-12 | 深圳大学 | A kind of spectrum phase interference apparatus and system |
| CN110567595B (en) * | 2019-09-11 | 2021-03-19 | 华东师范大学重庆研究院 | Real-time measurement method and system for transient ultrashort pulse time width |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6611336B1 (en) * | 1997-08-01 | 2003-08-26 | The University Of Rochester | Pulse measurement using frequency shifting techniques |
| CN1936523A (en) * | 2006-09-29 | 2007-03-28 | 华东师范大学 | Super-short light impulse measuring apparatus based on SPIDER technology |
| CN101294850A (en) * | 2007-04-23 | 2008-10-29 | 中山大学 | Novel method and device for measuring ultra-short optical pulse spectrum phase |
| CN203432688U (en) * | 2013-06-19 | 2014-02-12 | 深圳大学 | Spectral phase interference device and ultra-short optical pulse electric field direct reconstruction system |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4280654B2 (en) * | 2004-02-17 | 2009-06-17 | アイシン精機株式会社 | Multi-channel terahertz spectrum measuring method and measuring apparatus |
-
2013
- 2013-06-19 CN CN201310244775.9A patent/CN104236726B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6611336B1 (en) * | 1997-08-01 | 2003-08-26 | The University Of Rochester | Pulse measurement using frequency shifting techniques |
| CN1936523A (en) * | 2006-09-29 | 2007-03-28 | 华东师范大学 | Super-short light impulse measuring apparatus based on SPIDER technology |
| CN101294850A (en) * | 2007-04-23 | 2008-10-29 | 中山大学 | Novel method and device for measuring ultra-short optical pulse spectrum phase |
| CN203432688U (en) * | 2013-06-19 | 2014-02-12 | 深圳大学 | Spectral phase interference device and ultra-short optical pulse electric field direct reconstruction system |
Non-Patent Citations (1)
| Title |
|---|
| SPIDER: A decade of measuring ultrashort pulses;M.E. Anderson et al.;《Laser Physics Letters》;20080110;1-8 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104236726A (en) | 2014-12-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9612153B2 (en) | Electric field vector detection method and electric field vector detection device | |
| CN100468021C (en) | Delayed controlled stripe-free spectrum phase interference pulse measuring method and its measuring device | |
| WO2018035833A1 (en) | Distributed fibre sensing system and vibration detection and positioning method therefor | |
| WO2006107795A1 (en) | Optical image processing using minimum phase functions | |
| US10048129B2 (en) | Total reflection spectroscopic measurement device and total reflection spectroscopic measurement method | |
| CN106441583B (en) | Spectrum phase interference device and the spectral interference measuring system for rebuilding ultrafast light field | |
| CN109238153B (en) | Dual-optical-frequency comb thickness measuring optical path structure, system, method, device and storage medium | |
| CN104236726B (en) | Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system | |
| CN103048053A (en) | Single laser signal-to-noise detection device | |
| CN110132851A (en) | A kind of instantaneous two-dimensional opto-acoustic wave measurement method based on the interference of femtosecond pulse | |
| CN103968960A (en) | Method for measuring synchronization precision of synchronous pulse laser | |
| CN203432688U (en) | Spectral phase interference device and ultra-short optical pulse electric field direct reconstruction system | |
| CN208780142U (en) | A kind of double frequency comb thickness measuring light channel structures and system | |
| Zhang et al. | Anti-noise frequency estimation performance of Hanning-windowed energy centrobaric method for optical coherence velocimeter | |
| CN1554931A (en) | Femot second level super short light pulse measuring method and device | |
| CN105181155A (en) | Terahertz pulse single-time detection system and detection method based on single-mode fiber | |
| CN101799332B (en) | Ultra-short pulse diagnostic method based on molecular arrangement and orientation | |
| CN107036714B (en) | A kind of spectrum phase interference apparatus and system | |
| EP1866615A1 (en) | Femtosecond spectroscopy using minimum phase functions | |
| CN106199623B (en) | A kind of femtosecond laser intermode beat frequency method range-measurement system | |
| Angeluts et al. | Reconstruction of the spectrum of the relative permittivity of the plane-parallel plate from the angular dependences of its transmission coefficients | |
| JP5366139B2 (en) | Optical signal waveform measuring device | |
| CN107014492B (en) | A kind of self-reference Terahertz electro-optic sampling spectrointerferometer and measuring system | |
| CN104075815B (en) | Signal-to-noise ratio measurement apparatus and method based on the single pulse for producing pulse train | |
| JP7041022B2 (en) | Optical analysis module and optical analysis device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170419 Termination date: 20190619 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |